3749 results about "Test fixture" patented technology

The invention relates to the technical field of chip aging tests, and discloses a chip aging test fixture control method and device and a storage medium, and the method comprises the steps: carrying out the parameter collection of a test fixture, and obtaining original test data; performing control signal analysis and signal fusion, and inputting a fused temperature control instruction into a temperature control unit of the test fixture to obtain steady-state test data; performing multi-dimensional analysis and data screening to obtain effective test data; performing performance feature extraction to obtain performance feature data; grouping is carried out, the weight coefficient of each test channel is calculated, weighting processing is carried out in combination with a failure mode standard, and aging characteristic data is obtained; and inputting the aging characteristic data into the life prediction model to calculate a performance prediction value and a life prediction value to obtain a chip aging test result, the chip performance degradation characteristics can be accurately captured, the performance prediction value and the life prediction value are output at the same time, and a comprehensive aging evaluation result is provided.

The invention belongs to the technical field of semiconductor testing, and discloses a novel automatic detection system and method for the electrostatic protection performance of a power device. A distributed parasitic parameter network model is constructed by acquiring packaging structure parameters of a to-be-tested power device and physical layout data of a test fixture, key parasitic parameter distribution is identified in combination with a time domain reflection measurement technology, a waveform distortion coefficient is calculated, and a spatio-temporal evolution model of electrostatic pulse propagation is constructed. Based on the model, a compensatory predistortion waveform is generated to counteract the parasitic effect of a transmission path, a device port response signal is collected in real time, an energy dissipation characteristic spectrum is extracted through wavelet packet decomposition, and quantitative evaluation of the electrostatic protection performance is achieved. According to the invention, the test precision and repeatability are improved, and the method is suitable for electrostatic protection tests of various novel power devices, especially high-frequency wide-band gap devices.

The invention belongs to the technical field of aerodynamic tests, and particularly provides a wind tunnel static pressure test fixing device and a wind tunnel. The wind tunnel static pressure measurement test fixing device comprises two rotary driving parts, two first frames, two inclination angle adjusting assemblies and two fixing assemblies, and the two rotary driving parts are fixed to the top wall and the bottom wall of a wind tunnel body respectively and can drive the two first frames to rotate around the same axis respectively. The two inclination angle adjusting assemblies are arranged on the two first frames correspondingly, and the inclination angle adjusting assemblies can move along the first sliding grooves in the first frames and can adjust the height of the second frame. By changing the horizontal and height positions of the second frame, the posture adjustment of the model from the horizontal position to the inclined position and then to the vertical position can be realized. When the inclination angle of the model is not changed, the wind load condition of the model at different wind attack angles can be simulated by controlling the two rotary driving parts to rotate synchronously, so that the accuracy of a test result is improved, and a theoretical basis is provided for engineering structure design.

The invention discloses a board card testing method, electronic equipment and a storage medium, and relates to the technical field of servers, and the method comprises the steps: obtaining parameter information of a to-be-tested board card, and calculating a matching degree value of an interface of the to-be-tested board card and a board card interface in a first preset rule base; the characteristics of the to-be-tested board card are accurately identified, the target control script of the board card test fixture suitable for the to-be-tested board card is determined, it is ensured that the matched script is used when the board card test fixture is connected with the to-be-tested board card, and the damage risk caused by version mismatching is avoided to a certain extent; meanwhile, the board card testing jig determines the target testing task according to the parameter information of the board card to be tested and executes testing, and automation and precision of the testing process are achieved. Therefore, the problems that the test accuracy is reduced and the security risk is increased due to the fact that the version change information is not transmitted in time or inaccurately are effectively solved, the dependence on manual checking of engineers is reduced, the working efficiency is improved, and the test accuracy and security are remarkably improved.

The invention, which relates to the technical field of the probe test fixture, discloses a multidirectional self-adaptive adjustment chip probe test fixture comprising a base, and the top end of the base is provided with a probe test assembly. According to the invention, the self-adaptive adjustment of the direction and inclination angle of the chip is realized through the adjusting mechanism, so that the clamping test of various types of chips can be supported, the replacement frequency of the clamp is reduced, the cost and maintenance time are reduced, the debugging time is shortened, the adjustment precision is ensured, and meanwhile, the signal loss is reduced. Mechanical self-locking and unlocking of the fixed gear A and the fixed gear B are achieved through the locking mechanism, so that the stability of the chip after inclination angle adjustment and direction adjustment is guaranteed, manual operation is not needed, and the automation degree is high; the chip is stably clamped through the clamping mechanism, and the chip can be accurately rotated by 90 degrees when clamping is released, so that test edges are automatically switched, the test efficiency is remarkably improved, and manual operation errors are reduced.

The invention discloses a crane slewing bearing test tool which comprises a base and a frame plate arranged on the base, a supporting plate is horizontally arranged on the frame plate, tool bases are arranged at the two ends of the supporting plate, a mandrel is movably arranged between the two tool bases, a tool sleeve is arranged on the mandrel in a sleeving mode, and a mounting cavity is formed between the tool sleeve and the mandrel. The base is provided with a first loading piece used for applying radial loading acting force to the tool sleeve and a regulation and control piece used for being in linkage fit with the first loading piece to enable the loading direction of the first loading piece to be changed, and the frame plate is provided with a second loading piece used for applying radial loading acting force to the tool sleeve. The supporting plate is provided with a driving part used for driving the mandrel to operate so as to simulate the actual operation condition of the bearing. The problems that a traditional crane slewing bearing test tool is single in test loading direction, the actual operation working condition of the bearing is difficult to simulate, and the loading working conditions of loads in different directions during actual operation of the bearing cannot be simulated are solved.

The utility model provides a chip rapid testing device, which comprises a chip testing module, a charging tray, a charging tray moving mechanism and a chip grabbing module, and is characterized in that the chip testing module comprises a testing jig and a pressing mechanism, the testing jig is used for placing and testing chips, the pressing mechanism is used for pressing the chips, and the charging tray is used for accommodating a plurality of chips; the tray moving mechanism is used for synchronously moving the test fixture and the tray in a first direction, and the chip grabbing module is used for enabling the chip to move between the tray and the test fixture. According to the chip rapid testing device provided by the utility model, the charging tray and the testing jig can be moved at the same time through the charging tray moving mechanism, the charging tray is always kept at a position adjacent to the testing jig, and the distance between the charging tray and the testing jig is relatively short, so that the testing period of a single chip is relatively short, the chip testing time is relatively short, and the chip testing efficiency is relatively high. In addition, the chip rapid testing device can be compatible with a manual testing jig, and the chip testing module can adopt an original manual testing jig.

The invention discloses a computer board card testing method and system, and relates to the technical field of computer board card testing, the system comprises a central server and at least one intelligent test fixture, the model of a to-be-tested board card is identified through the intelligent test fixture to obtain test information, and the test information is sent to the central server; and the central server determines a parallel test program corresponding to each to-be-tested board card according to the test information, and performs a synchronous test on each to-be-tested board card by running the parallel test program to obtain a test result corresponding to each to-be-tested board card. In the process, the model of the to-be-tested board card is automatically identified through the intelligent test fixture, the test program is automatically determined through the central server, automation of the test process is achieved, the problem of low efficiency caused by manual operation is avoided, and meanwhile, the test efficiency of the computer board card is improved by synchronously testing multiple to-be-tested board cards.

The embodiment of the invention discloses a single board test fixture. The single board test fixture comprises a fixture base, a positive insertion module, a side insertion module and a mechanical fool-proof mechanism, an interlocking assembly and a fool-proof auxiliary part of the mechanical fool-proof mechanism can be adaptively switched between a first locking state and a second locking state, the first locking state is used for limiting the positive insertion module to be switched from a plug-in position to a disengagement position, and the second locking state is used for limiting the side insertion module to be switched from a plug-in position to a disengagement position. The second locking state is used for limiting the side insertion module to be switched to the opposite insertion position from the separation position; according to the mechanical fool-proof mechanism, linkage between the insertion module and the positive insertion module is established through the flexible traction piece, and the flexible traction piece is positioned and guided through the reversing pulley arranged on the arrangement path of the flexible traction piece. According to the arrangement, a reliable interlocking relation can be formed through the two locking pieces, the possibility of misoperation of the positive insertion module and the side insertion module can be completely avoided, fool-proof is effectively achieved, and product damage is prevented. In addition, based on the mechanical fool-proof mechanism, the electrical influence can be completely avoided, and the mechanical fool-proof mechanism has high operation reliability.

The invention relates to an electrified vibration test clamp for a pin-containing surface-mounted integrated circuit, belonging to the technical field of integrated circuit test. Comprising a road board part and a structural member part, and the structural member part comprises a limiting base, a fixing buckle and a silica gel sheet for pressing the fixing buckle. The test circuit and peripheral elements thereof are arranged on one side of the circuit board, and the package of the device to be tested is independently arranged on the other side of the circuit board. The limiting base is used for being installed and fixed on a functional circuit board, a positioning groove for containing a device is formed in the limiting base, the position of a notch is just consistent with the packaging layout position of the device on the circuit board, and after the device is placed in the notch, pins can be matched with bonding pads in a one-to-one correspondence mode. The fixing buckle is installed and fixed on the notch of the limiting base for placing the device and reliably presses the pin of the device. The problems that the reliability of surface pressing type and pin locking type testing technologies is poor and a testing device is easily damaged during an electrified vibration test of an existing pin-mounted surface-mounted integrated circuit are solved. The device can be widely applied to electrified vibration and related environment tests of surface-mounted integrated circuits with pins.

The utility model relates to a peeling test fixture and a testing machine for aluminum foil heat sealing strength test, which belong to the technical field of test equipment and comprise a fixed fixture and a movable fixture, the fixed fixture comprises a fixed support plate, a movable pressure plate I, a guide pillar I and a pressing mechanism I, and the movable fixture comprises a movable support plate, a movable pressure plate II, a guide pillar II and a pressing mechanism II. A first positioning block is installed in the middle of the fixed supporting plate and provided with a first positioning groove, a first positioning pressing block is arranged above the first positioning block, and a first positioning protrusion is arranged at the bottom of the first positioning pressing block. A second positioning block is installed in the middle of the movable supporting plate, and a second positioning groove is formed in the top of the second positioning block. A second positioning pressing block installed on the second movable pressing plate is arranged above the second positioning block, and a second positioning protrusion is arranged at the bottom of the second positioning pressing block. According to the utility model, the two ends of the sample can be quickly and accurately positioned, the axis of the sample is more accurately overlapped with the center line of the clamp, the stripping integrity of the sample is improved, and the measurement result is more accurate.

According to the automatic test error-proofing detection method and detection system disclosed by the invention, after a test instruction is received, verification requests generated by bar codes of a needle bed upper mold and a needle bed lower mold are received; sending to a selected product test program to judge whether the needle bed upper die and the needle bed lower die and whether the needle bed name is matched with the current product test program or not; if not, stopping the test, otherwise, after the to-be-tested product is placed in place, receiving a serial number of the to-be-tested product generated by the bar code of the to-be-tested product, and querying and obtaining internal card binding information of the corresponding to-be-tested product; controlling the test tool to start and electrify the to-be-tested product, acquiring identity information of an internal clamping piece actually mounted in the to-be-tested product, comparing the identity information with inquired binding information of the internal clamping piece, if the identity information is consistent with the binding information of the internal clamping piece, carrying out subsequent function test, otherwise, sending error information of the internal clamping piece, and controlling the test tool to pull open an upper die and a lower die of the needle bed; therefore, automatic error-proofing detection of each module test of the industrial control system is realized.

The invention provides a wallboard impact test device and test method for simulating a dampening load, and belongs to the field of bearing performance tests. Comprising a dampening wave impact load simulation loading module, a test wall plate is fixed through a test clamp tool module, and in the test impact process, obtained real-time monitoring data are sent to a controller of the dampening wave impact load simulation loading module through a test measurement module so as to complete closed-loop control of dynamic loads when dampening wave impact is simulated; the dampening wave impact load simulation loading module comprises a controller, a hydraulic power unit and a loading unit, and the controller compares experimental data of a dampening wave impact load real experiment with real-time simulation data obtained by the test measurement module, converts an obtained difference value into an electric signal and sends the electric signal to the hydraulic power unit; electric signals are converted into pressure loads through the hydraulic power unit, and actions are executed by the loading unit. According to the invention, the simulation effect of a real dampening wave-colliding service scene can be achieved.

The invention provides a test device and a test method for off-line testing of a chip and self-inspection of a test fixture, and relates to the technical field of chip testing. The function integration device is installed above the testing machine and comprises a gas detection part connected with the gas inlet channel and the gas outlet channel, and the gas detection part is used for conveying protective gas to the testing cavity and detecting the gas inlet amount and the gas outlet amount of the testing jig so as to judge whether the gas leakage amount of the testing jig is qualified or not. According to the technical scheme, the function integration device is additionally arranged on the testing machine of the existing chip off-line testing equipment, which is equivalent to integrating the functions of off-line detection of the electrical performance of the chip and detection of the quality of the testing jig on the same equipment; therefore, the testing equipment for off-line testing of the chip and self-inspection of the testing jig can not only provide protective gas for the testing jig and prevent oxidation fire during testing of the chip, but also detect whether gas leakage of the testing jig is normal or not, so that the functions of the testing equipment are more complete.

The invention discloses a flat cable test fixture and test equipment, the flat cable test fixture comprises a base, a probe flip cover and a quick-change clamp, the probe flip cover comprises a cover plate, a floating plate, a bearing plate and a probe module, and the quick-change clamp comprises a bottom plate, a shaping plate, a pressing piece and a fool-proof sliding block. The position of the probe module can be adjusted through floating connection between the floating plate and the cover plate, and positioning guide is performed through the positioning guide hole of the quick-change clamp and the positioning guide column of the probe flip cover, so that the position of the probe module is adaptive to the quick-change clamp, and the alignment accuracy of the probe and a test point is improved; the fool-proof matching part of the cover plate and the fool-proof sliding block are matched to form a fool-proof structure, the probability that the probe module is damaged due to operation errors can be reduced, the fool-proof sliding block can be clamped to the clamping flange so that the quick-change clamp can be fixed, the occurrence probability of misoperation can be reduced, and the fool-proof sliding block can be matched with the shaping plate to form a second product limiting structure, so that the detection accuracy is improved. Therefore, the product is limited and fixed, the structure is simple, and functions are diversified.

The invention discloses a clamping method for wafer test, which is used for loading a wafer into a test fixture, the test fixture comprises an upper cover plate, a lower substrate, a PCB (printed circuit board) mounted on the lower surface of the upper cover plate and a needle plate mounted in the center of the lower surface of the PCB and electrically connected with the PCB, and the upper surface of the lower substrate is provided with a groove for embedding the needle plate. A plurality of locking sleeves distributed at intervals in the circumferential direction are installed on the upper surface of the lower base plate and located on the outer side of the groove, a plurality of locking shells are correspondingly installed on the upper cover plate and located over the locking sleeves, and a first installation hole is formed in the upper surface of each locking shell. And a cap body part at the upper end of a lock rod capable of moving up and down is in sliding fit with the inner wall of the first mounting hole. On the basis that clamping, electric conduction, heating aging and inflation testing are carried out on the wafer in the sealing cavity, wafer installation is facilitated, synchronous locking and unlocking are achieved, pollution to the wafer is reduced, and the stability of locking force is kept all the time.

The invention relates to a wide-temperature-range ion exchange membrane conductivity testing device and a control method. The wide-temperature-range ion exchange membrane conductivity testing device comprises a box body, a testing clamp assembly, a heating part, a humidifying part, a pressure regulating part and a control assembly, in the test clamp assembly, an ion exchange membrane and a probe electrode are fixed between a lower clamping plate and an upper clamping plate, second through holes are formed in the two sides of the lower clamping plate respectively, and a temperature sensor and a humidity sensor penetrate through the second through holes respectively, abut against the ion exchange membrane and are used for detecting the temperature and the humidity. And the control assembly controls the heating piece, the humidifying piece and the pressure regulating piece to respectively regulate the temperature, humidity and pressure in the box body so as to measure the conductivity of the ion exchange membrane under the working conditions of normal temperature, normal pressure, low-pressure boiling and high temperature without interference. The temperature sensor and the humidity sensor are closer to the ion exchange membrane through the second through holes, so that the accuracy of data measurement is effectively improved; the ion exchange membrane is located in different working conditions through pressure regulation of the pressure regulating piece, and conductivity measurement under the complex working conditions of wide temperature range and temperature and humidity fluctuation is achieved.

The invention discloses a metal material low-temperature fracture toughness testing device for a fatigue testing machine, relates to the technical field of material mechanical property testing, and solves the problem that room-temperature and low-temperature material testing cannot be performed on the same testing device. The device comprises a test barrel, an inner container, an extensometer, an upper joint and a lower joint, wherein the inner container is arranged in the test barrel; the extensometer is in contact with the sample and returns a real-time mechanical signal; the upper end of the upper connector is connected with a hydraulic chuck above the fatigue testing machine, and the lower end of the lower connector penetrates through the inner container and the testing barrel to be connected with a hydraulic chuck below the fatigue testing machine; the upper joint and the lower joint are opposite to each other and are used for clamping a sample; a sealing structure is arranged between the lower connector and the inner container. According to the invention, a testing machine does not need to be transformed, testing conditions for samples with different sizes are obtained by replacing different accessories, and meanwhile, a testing clamp can be replaced to test the mechanical properties of materials under different environmental conditions.

The invention relates to the field of material performance evaluation, in particular to a resistance testing system and method in the slurry injection process, the testing system comprises a stress loading part and a testing clamp, and the testing clamp comprises an upper clamp, a lower clamp and an injector clamp; the upper clamp comprises a first connecting part and a first clamping assembly, and the position of the first clamping assembly relative to the first connecting part is adjustable up and down; the lower clamp comprises a second connecting part, an object carrying platform and a second clamping assembly, the position of the second clamping assembly relative to the object carrying platform is vertically adjustable, and the rotation angle of the lower clamp relative to the base is adjustable. According to the method, the mechanical property change in the injection process can be monitored in real time, the mechanical property of the slurry in the carbon fiber preform injection process can be accurately evaluated, the test accuracy and reliability are improved, an evaluation standard is provided for the applicability of a ceramic matrix composite prepared by an injection impregnation process, and the method is suitable for popularization and application. And an optimization basis is provided for improving the distribution uniformity of the components in the composite material.

The utility model provides a test tool for a random vibration experiment, which comprises a support and a vibration elastic sheet, the top of the support is provided with an installation position of the vibration elastic sheet, and the periphery of the installation position is provided with a longitudinal pressing device and a transverse pressing device which correspond to each other; wherein the vibration elastic sheet comprises a short part and a long part, the short part is used for being installed at the installation position, the short part is longitudinally pressed by the longitudinal pressing device in the vertical direction and clamped by the two transverse pressing devices in the horizontal direction, and the long part horizontally extends forwards and is used for installing a sensor for transmitting vibration signals. The problem that in the prior art, in the vibration testing process, a vibration elastic piece is inconvenient to fix is solved.

The utility model discloses an automatic test fixture for wireless router firmware, which belongs to the technical field of router testing and comprises a base, a rotating motor is fixedly mounted at the top of the base, an output end of the rotating motor is fixedly connected with a rotating table, four mounting tables are uniformly and fixedly connected to the top of the rotating table, and the mounting tables are fixedly connected with the rotating table. A clamping assembly used for fixing a router is arranged on each mounting table, a test table fixedly connected with the base is arranged on one side of the rotating table, a test assembly is arranged on the test table, the multiple mounting tables are arranged, the rotating motor drives the rotating table to intermittently rotate, each time the rotating table rotates, one mounting table is driven to be away from the test table, and the test assembly is arranged on the test table. One mounting table is aligned with the test table, the other mounting table is aligned with the test table, and then the router is subjected to a plugging test through the test assembly, so that the test work can be continuously carried out, the empty time of loading and unloading is saved, the overall working efficiency is greatly improved, and the use requirements on the existing market are met.

The invention provides a height-adaptive double-sided radio frequency chip performance test fixture. The height-adaptive double-sided radio frequency chip performance test fixture comprises an upper test assembly and a lower test assembly, the upper test assembly comprises an upper seat, an upper mounting groove, an upper connecting groove and an upper limiting frame. Through unique upper and lower test assembly structures, such as cooperative operation of each part in a groove and assistance of an elastic gasket, accurate alignment and stable compression of front and back test probes during double-sided chip test are ensured, the problems of alignment precision and compression strength are solved, and meanwhile, the test efficiency is improved for poor chip flatness, inclination and substrate height difference. Slidable conductor connecting blocks and elastic gaskets in the upper test assembly and the lower test assembly can be adjusted in a self-adaptive mode, good contact is guaranteed, the error test rate is reduced, and the test consistency and accuracy are improved. Through the principles of thread transmission and the like in the height adjusting assembly and in cooperation with various limiting and buffering structures, accurate and stable height adjustment is achieved, the clamp is adaptive to chip specifications of different thicknesses, the universality and the use flexibility of the clamp are enhanced, and the cost is reduced.

The invention discloses a turbine blade double-layer wall air cooling structure simulation piece, a test fixture and a test system, and belongs to the technical field of test. The turbine blade double-layer wall air cooling structure simulation part is designed for a turbine blade based on a double-layer wall air cooling structure, an inner-layer and outer-layer double-wall structural arrangement is adopted, cooling airflow enters an overflowing clamping cavity from an impact hole and then firstly impacts on the inner wall face of an outer-layer wall, jet flow impact cooling is formed, and the cooling effect is achieved. Then the cooling airflow bypasses the turbulent flow columns and then flows out from air film holes distributed in the outer layer wall, and a thin air film is formed on the outer surface of the outer layer wall; the air cooling flow mode is combined with external fuel gas impact, so that a simulation test of the double-wall air cooling structure under an approximate service condition can be realized. The test fixture and the test system are matched with the turbine blade double-layer wall air cooling structure simulation piece, and can meet the service test requirement of the turbine blade double-layer wall air cooling structure simulation piece close to the actual working condition on the basis of stably clamping the simulation piece.

The invention provides a vehicle sensor test tool, a test device and a test method. The test device comprises a test box, a cover plate, a mounting plate, a display screen, a control unit and the like. The test method comprises the following steps: firstly, mounting the gear sensor, the rotating speed sensor, the electromagnetic valve plate and the plug in corresponding mounting grooves of the test box; turning on a power supply, and checking a circuit conduction state and initial data of each sensor through a display screen; the shifting part of the gear sensor is manually shifted to verify the gear detection accuracy; controlling the motor to drive the gear at different rotating speeds, and comparing the rotating speed of the motor with detection data of the rotating speed sensor to judge performance; and disassembling the components after the test is completed. According to the method, an integrated device is utilized, joint testing can be carried out on various vehicle sensors and plugs at the same time, whether all parts are qualified or not is rapidly detected by simulating actual working conditions, the detection process is simplified, the detection efficiency and accuracy are remarkably improved, and the testing cost is reduced.

The invention discloses a pressure air tightness test fixture for a rectification bearing casing and a use method, the test fixture comprises a bottom plate and a cover plate connected to the upper space of the bottom plate through a B-level equal-length double-end stud, the bottom plate and the cover plate are respectively provided with a first sealing ring and a second sealing ring in a matched manner, and the cover plate is provided with a plurality of screw holes; a first pressing plate and a second pressing plate are fixed between the bottom plate and the cover plate through an arch-shaped frame and a C-shaped hexagonal head compression screw, a first sealing gasket and a second sealing gasket are arranged on the first pressing plate and the second pressing plate in an attached mode respectively, and an adapter nozzle is connected to the first pressing plate. The fixture realizes the pressure airtightness test of the whole part welding seam, solves the prominent problem of low efficiency of single support plate welding seam one-by-one test, and improves the pressure airtightness test quality and the part processing efficiency.

A method is provided to measure the complex sensitivity of hydrophone data channels across a range of frequencies by using a water-filled tank with proximate boundaries. A hydrophone array and reference hydrophone are helically affixed to a test fixture resting on a rotation platform. When the test fixture is submerged in the tank; the platform rotates about a contour of the platform in intervals for a predetermined time interval before indexing to the next angle. Signals transmitted by an acoustic projector in the tank are received on the hydrophones of the line array and the calibrated reference hydrophone. Electrical signals from the reference hydrophone are transmitted over an electrical cable and received by the acoustic data processor for use in calibrating the hydrophone line array. Electrical signals from the hydrophones of the hydrophone line array are also transmitted to the data processor.

The invention relates to the technical field of optical communication, and discloses a universal optical module full-temperature test board, which comprises a test assembly, a temperature environment cavity, an optical module, an optical module, a temperature sensor and a control module, and is characterized in that the test assembly provides a module test jig and a temperature environment cavity; according to the optical module testing device, the testing assembly, the preheating assembly, the box body assembly and the heating stage assembly are combined, seamless connection from preheating to testing of the optical module is achieved, the testing efficiency and the temperature control precision are improved, the testing assembly is combined with a water cooling head, a refrigeration sheet, a first heating pipe, a second heating pipe, a third heating pipe and other key components, and the testing efficiency is improved. The temperature in the test fixture can be accurately controlled in cooperation with PID algorithms of the first temperature sensor, the second temperature sensor and the third temperature sensor, so that a stable test environment is provided for the optical module, meanwhile, the preheating assembly ensures that the optical module reaches the required target temperature in the preheating stage through linkage control of the second heating pipe and the second temperature sensor, and the test efficiency is improved. And interference on a test result due to too high or too low temperature is avoided.

The invention discloses a chip testing jig, relates to the technical field of chip testing, and can realize the downward pressing stroke adjustment of the jig, improve the application range of the jig and reduce the production cost. The chip testing process of the chip testing jig comprises the steps that a chip is placed in the connecting frame, then the chip pressing base and the connecting frame are fastened, then the pressing driving assembly is used for driving the pressing block to press downwards, after chip pressing and testing work is completed, the pressing driving assembly is reset, the chip pressing base is opened, and the chip is taken out. And the next chip to be tested is put in. If the size of the chip to be tested is not changed, but the thickness of the chip is changed, the downward pressing stroke of the downward pressing block can be adjusted through the stroke adjusting assembly, the situation that the chip is crushed or cannot be pressed tightly is avoided, and then the purpose that one set of jig adapts to testing of chips of various thicknesses is achieved.

The invention provides a display panel, and a test system and a test method of the display panel, and relates to the technical field of display. In the display panel, a first bonding pad is connected with a display driving signal line, and a second bonding pad is not connected with the display driving signal line. The relative position relation between the first bonding pad and the second bonding pad is fixed after the first bonding pad and the second bonding pad are prepared, and the alignment relation between the probe at the first bonding pad and the first bonding pad can be reflected based on the alignment relation between the probe at the second bonding pad and the second bonding pad. By inputting the first voltage signal to the second bonding pad, the purpose of detecting whether the probe on the test fixture and the bonding pad on the display panel are misplaced or not can be achieved based on the feedback signal. The first voltage signal is not transmitted to the display driving signal line, so that the normal lightening detection of the display panel is not influenced under the condition of detecting whether the probe on the test fixture and the bonding pad on the display panel are misplaced.

The invention provides a low-temperature vibration test fixture for a space pipeline. The low-temperature vibration test fixture comprises a spherical base, a spherical base connecting oblong hole, a spherical base threaded hole, a spherical upper cover and spherical base connecting through hole, a spherical upper cover, a spherical pipeline, a trapezoidal base upper connecting panel oblong hole, a trapezoidal base and a trapezoidal base lower connecting panel oblong hole, the spherical pipeline is arranged in the spherical groove of the spherical base, and the spherical pipeline can rotate, pitch and yaw in the spherical groove of the spherical base so as to be in butt joint with a space pipeline test piece, and conversion of the test piece from the space angle to the orthogonal direction is achieved. The space pipeline vibration test fixture is adaptive to a vibration table mounting hole site, has a space angle adjusting function, is simple in structure, simple and convenient to mount and reusable, shortens the time of a vibration test part in a development test period, and saves development and production cost.