2627 results about "Test fixture" patented technology

The invention belongs to the technical field of semiconductor testing, and discloses a novel automatic detection system and method for the electrostatic protection performance of a power device. A distributed parasitic parameter network model is constructed by acquiring packaging structure parameters of a to-be-tested power device and physical layout data of a test fixture, key parasitic parameter distribution is identified in combination with a time domain reflection measurement technology, a waveform distortion coefficient is calculated, and a spatio-temporal evolution model of electrostatic pulse propagation is constructed. Based on the model, a compensatory predistortion waveform is generated to counteract the parasitic effect of a transmission path, a device port response signal is collected in real time, an energy dissipation characteristic spectrum is extracted through wavelet packet decomposition, and quantitative evaluation of the electrostatic protection performance is achieved. According to the invention, the test precision and repeatability are improved, and the method is suitable for electrostatic protection tests of various novel power devices, especially high-frequency wide-band gap devices.

The invention discloses a board card testing method, electronic equipment and a storage medium, and relates to the technical field of servers, and the method comprises the steps: obtaining parameter information of a to-be-tested board card, and calculating a matching degree value of an interface of the to-be-tested board card and a board card interface in a first preset rule base; the characteristics of the to-be-tested board card are accurately identified, the target control script of the board card test fixture suitable for the to-be-tested board card is determined, it is ensured that the matched script is used when the board card test fixture is connected with the to-be-tested board card, and the damage risk caused by version mismatching is avoided to a certain extent; meanwhile, the board card testing jig determines the target testing task according to the parameter information of the board card to be tested and executes testing, and automation and precision of the testing process are achieved. Therefore, the problems that the test accuracy is reduced and the security risk is increased due to the fact that the version change information is not transmitted in time or inaccurately are effectively solved, the dependence on manual checking of engineers is reduced, the working efficiency is improved, and the test accuracy and security are remarkably improved.

The invention, which relates to the technical field of the probe test fixture, discloses a multidirectional self-adaptive adjustment chip probe test fixture comprising a base, and the top end of the base is provided with a probe test assembly. According to the invention, the self-adaptive adjustment of the direction and inclination angle of the chip is realized through the adjusting mechanism, so that the clamping test of various types of chips can be supported, the replacement frequency of the clamp is reduced, the cost and maintenance time are reduced, the debugging time is shortened, the adjustment precision is ensured, and meanwhile, the signal loss is reduced. Mechanical self-locking and unlocking of the fixed gear A and the fixed gear B are achieved through the locking mechanism, so that the stability of the chip after inclination angle adjustment and direction adjustment is guaranteed, manual operation is not needed, and the automation degree is high; the chip is stably clamped through the clamping mechanism, and the chip can be accurately rotated by 90 degrees when clamping is released, so that test edges are automatically switched, the test efficiency is remarkably improved, and manual operation errors are reduced.

The invention discloses a crane slewing bearing test tool which comprises a base and a frame plate arranged on the base, a supporting plate is horizontally arranged on the frame plate, tool bases are arranged at the two ends of the supporting plate, a mandrel is movably arranged between the two tool bases, a tool sleeve is arranged on the mandrel in a sleeving mode, and a mounting cavity is formed between the tool sleeve and the mandrel. The base is provided with a first loading piece used for applying radial loading acting force to the tool sleeve and a regulation and control piece used for being in linkage fit with the first loading piece to enable the loading direction of the first loading piece to be changed, and the frame plate is provided with a second loading piece used for applying radial loading acting force to the tool sleeve. The supporting plate is provided with a driving part used for driving the mandrel to operate so as to simulate the actual operation condition of the bearing. The problems that a traditional crane slewing bearing test tool is single in test loading direction, the actual operation working condition of the bearing is difficult to simulate, and the loading working conditions of loads in different directions during actual operation of the bearing cannot be simulated are solved.

The invention discloses a computer board card testing method and system, and relates to the technical field of computer board card testing, the system comprises a central server and at least one intelligent test fixture, the model of a to-be-tested board card is identified through the intelligent test fixture to obtain test information, and the test information is sent to the central server; and the central server determines a parallel test program corresponding to each to-be-tested board card according to the test information, and performs a synchronous test on each to-be-tested board card by running the parallel test program to obtain a test result corresponding to each to-be-tested board card. In the process, the model of the to-be-tested board card is automatically identified through the intelligent test fixture, the test program is automatically determined through the central server, automation of the test process is achieved, the problem of low efficiency caused by manual operation is avoided, and meanwhile, the test efficiency of the computer board card is improved by synchronously testing multiple to-be-tested board cards.

The invention relates to an electrified vibration test clamp for a pin-containing surface-mounted integrated circuit, belonging to the technical field of integrated circuit test. Comprising a road board part and a structural member part, and the structural member part comprises a limiting base, a fixing buckle and a silica gel sheet for pressing the fixing buckle. The test circuit and peripheral elements thereof are arranged on one side of the circuit board, and the package of the device to be tested is independently arranged on the other side of the circuit board. The limiting base is used for being installed and fixed on a functional circuit board, a positioning groove for containing a device is formed in the limiting base, the position of a notch is just consistent with the packaging layout position of the device on the circuit board, and after the device is placed in the notch, pins can be matched with bonding pads in a one-to-one correspondence mode. The fixing buckle is installed and fixed on the notch of the limiting base for placing the device and reliably presses the pin of the device. The problems that the reliability of surface pressing type and pin locking type testing technologies is poor and a testing device is easily damaged during an electrified vibration test of an existing pin-mounted surface-mounted integrated circuit are solved. The device can be widely applied to electrified vibration and related environment tests of surface-mounted integrated circuits with pins.

According to the automatic test error-proofing detection method and detection system disclosed by the invention, after a test instruction is received, verification requests generated by bar codes of a needle bed upper mold and a needle bed lower mold are received; sending to a selected product test program to judge whether the needle bed upper die and the needle bed lower die and whether the needle bed name is matched with the current product test program or not; if not, stopping the test, otherwise, after the to-be-tested product is placed in place, receiving a serial number of the to-be-tested product generated by the bar code of the to-be-tested product, and querying and obtaining internal card binding information of the corresponding to-be-tested product; controlling the test tool to start and electrify the to-be-tested product, acquiring identity information of an internal clamping piece actually mounted in the to-be-tested product, comparing the identity information with inquired binding information of the internal clamping piece, if the identity information is consistent with the binding information of the internal clamping piece, carrying out subsequent function test, otherwise, sending error information of the internal clamping piece, and controlling the test tool to pull open an upper die and a lower die of the needle bed; therefore, automatic error-proofing detection of each module test of the industrial control system is realized.

The invention provides a wallboard impact test device and test method for simulating a dampening load, and belongs to the field of bearing performance tests. Comprising a dampening wave impact load simulation loading module, a test wall plate is fixed through a test clamp tool module, and in the test impact process, obtained real-time monitoring data are sent to a controller of the dampening wave impact load simulation loading module through a test measurement module so as to complete closed-loop control of dynamic loads when dampening wave impact is simulated; the dampening wave impact load simulation loading module comprises a controller, a hydraulic power unit and a loading unit, and the controller compares experimental data of a dampening wave impact load real experiment with real-time simulation data obtained by the test measurement module, converts an obtained difference value into an electric signal and sends the electric signal to the hydraulic power unit; electric signals are converted into pressure loads through the hydraulic power unit, and actions are executed by the loading unit. According to the invention, the simulation effect of a real dampening wave-colliding service scene can be achieved.

The invention relates to a wide-temperature-range ion exchange membrane conductivity testing device and a control method. The wide-temperature-range ion exchange membrane conductivity testing device comprises a box body, a testing clamp assembly, a heating part, a humidifying part, a pressure regulating part and a control assembly, in the test clamp assembly, an ion exchange membrane and a probe electrode are fixed between a lower clamping plate and an upper clamping plate, second through holes are formed in the two sides of the lower clamping plate respectively, and a temperature sensor and a humidity sensor penetrate through the second through holes respectively, abut against the ion exchange membrane and are used for detecting the temperature and the humidity. And the control assembly controls the heating piece, the humidifying piece and the pressure regulating piece to respectively regulate the temperature, humidity and pressure in the box body so as to measure the conductivity of the ion exchange membrane under the working conditions of normal temperature, normal pressure, low-pressure boiling and high temperature without interference. The temperature sensor and the humidity sensor are closer to the ion exchange membrane through the second through holes, so that the accuracy of data measurement is effectively improved; the ion exchange membrane is located in different working conditions through pressure regulation of the pressure regulating piece, and conductivity measurement under the complex working conditions of wide temperature range and temperature and humidity fluctuation is achieved.

The utility model provides a test tool for a random vibration experiment, which comprises a support and a vibration elastic sheet, the top of the support is provided with an installation position of the vibration elastic sheet, and the periphery of the installation position is provided with a longitudinal pressing device and a transverse pressing device which correspond to each other; wherein the vibration elastic sheet comprises a short part and a long part, the short part is used for being installed at the installation position, the short part is longitudinally pressed by the longitudinal pressing device in the vertical direction and clamped by the two transverse pressing devices in the horizontal direction, and the long part horizontally extends forwards and is used for installing a sensor for transmitting vibration signals. The problem that in the prior art, in the vibration testing process, a vibration elastic piece is inconvenient to fix is solved.

The utility model discloses an automatic test fixture for wireless router firmware, which belongs to the technical field of router testing and comprises a base, a rotating motor is fixedly mounted at the top of the base, an output end of the rotating motor is fixedly connected with a rotating table, four mounting tables are uniformly and fixedly connected to the top of the rotating table, and the mounting tables are fixedly connected with the rotating table. A clamping assembly used for fixing a router is arranged on each mounting table, a test table fixedly connected with the base is arranged on one side of the rotating table, a test assembly is arranged on the test table, the multiple mounting tables are arranged, the rotating motor drives the rotating table to intermittently rotate, each time the rotating table rotates, one mounting table is driven to be away from the test table, and the test assembly is arranged on the test table. One mounting table is aligned with the test table, the other mounting table is aligned with the test table, and then the router is subjected to a plugging test through the test assembly, so that the test work can be continuously carried out, the empty time of loading and unloading is saved, the overall working efficiency is greatly improved, and the use requirements on the existing market are met.

The invention provides a vehicle sensor test tool, a test device and a test method. The test device comprises a test box, a cover plate, a mounting plate, a display screen, a control unit and the like. The test method comprises the following steps: firstly, mounting the gear sensor, the rotating speed sensor, the electromagnetic valve plate and the plug in corresponding mounting grooves of the test box; turning on a power supply, and checking a circuit conduction state and initial data of each sensor through a display screen; the shifting part of the gear sensor is manually shifted to verify the gear detection accuracy; controlling the motor to drive the gear at different rotating speeds, and comparing the rotating speed of the motor with detection data of the rotating speed sensor to judge performance; and disassembling the components after the test is completed. According to the method, an integrated device is utilized, joint testing can be carried out on various vehicle sensors and plugs at the same time, whether all parts are qualified or not is rapidly detected by simulating actual working conditions, the detection process is simplified, the detection efficiency and accuracy are remarkably improved, and the testing cost is reduced.

A method is provided to measure the complex sensitivity of hydrophone data channels across a range of frequencies by using a water-filled tank with proximate boundaries. A hydrophone array and reference hydrophone are helically affixed to a test fixture resting on a rotation platform. When the test fixture is submerged in the tank; the platform rotates about a contour of the platform in intervals for a predetermined time interval before indexing to the next angle. Signals transmitted by an acoustic projector in the tank are received on the hydrophones of the line array and the calibrated reference hydrophone. Electrical signals from the reference hydrophone are transmitted over an electrical cable and received by the acoustic data processor for use in calibrating the hydrophone line array. Electrical signals from the hydrophones of the hydrophone line array are also transmitted to the data processor.

The invention provides a low-temperature vibration test fixture for a space pipeline. The low-temperature vibration test fixture comprises a spherical base, a spherical base connecting oblong hole, a spherical base threaded hole, a spherical upper cover and spherical base connecting through hole, a spherical upper cover, a spherical pipeline, a trapezoidal base upper connecting panel oblong hole, a trapezoidal base and a trapezoidal base lower connecting panel oblong hole, the spherical pipeline is arranged in the spherical groove of the spherical base, and the spherical pipeline can rotate, pitch and yaw in the spherical groove of the spherical base so as to be in butt joint with a space pipeline test piece, and conversion of the test piece from the space angle to the orthogonal direction is achieved. The space pipeline vibration test fixture is adaptive to a vibration table mounting hole site, has a space angle adjusting function, is simple in structure, simple and convenient to mount and reusable, shortens the time of a vibration test part in a development test period, and saves development and production cost.

The invention discloses a battery thermal runaway test fixture and a test method. The test fixture comprises a first clamping plate, a second clamping plate, a first heat preservation pad, a second heat preservation pad and a heating plate, wherein the second clamping plate and the first clamping plate are oppositely arranged at an interval to form a test space; the first heat preservation pad is arranged in the test space and is attached to the first clamping plate; the second heat preservation pad is arranged in the test space and is attached to the second clamping plate; the heating plate is arranged in the testing space and is attached to the first heat preservation pad, and a gap used for containing the battery exists between the heating plate and the second heat preservation pad. Through the heat insulation effect of the first heat preservation pad and the second heat preservation pad, effective heat accumulation can be achieved through low-power heating, the local overheating risk caused by high power is avoided, it is ensured that thermal runaway can be stably triggered, and the heat preservation pad is particularly suitable for the characteristics that a blade battery and other thin batteries are thin in shell and small in heat capacity.

The utility model discloses a film tensile strength detection stationary fixture, relates to film stationary fixture technical field, including tensile testing machine, moving plate and clamping subassembly, the clamping subassembly includes crossbeam and two chuck, the opposite side of two chuck is equipped with the groove, the bottom end center of crossbeam is fixedly equipped with the magnet block A, the magnet block A is equipped with the magnet block B, and the magnet block B is equipped with the magnet block B; a magnetic attraction block B is attracted to the bottom end of the magnetic attraction block A through magnetic force, and the bottom end of the magnetic attraction block B is fixedly connected with a fixing frame. The clamping positions of the upper end and the lower end of the thin film are fixed and aligned, the accuracy and repeatability of tensile strength detection are improved, the next thin film is rapidly fixed when multiple groups of thin films are tested, the operation convenience is improved, and the time for replacing thin film samples when the multiple groups of thin films are tested is shortened. The problems that the centering performance is poor when the thin film samples are clamped, and the accuracy and repeatability of sample inspection are poor due to the fact that clamping positions possibly have deviation when multiple thin film samples are detected are solved.

The invention provides a method and device for determining scattering parameters based on deep learning, a medium and a product, and the method comprises the following steps: obtaining to-be-processed scattering parameters obtained through the overall measurement of a to-be-tested device and a test fixture; the scattering parameters to be processed are input into a pre-trained parameter optimization model, a physical constraint framework is introduced when the parameter optimization model is trained to ensure that a prediction result conforms to physical laws such as causality, stability and passivity, and a physical constraint loss function and a frequency adaptive weighting strategy are adopted; obtaining an equivalent model which is output by the parameter optimization model and corresponds to the scattering parameter to be processed; and obtaining a target scattering parameter corresponding to the to-be-processed scattering parameter according to the equivalent model. According to the method, a physical constraint framework is introduced, so that the problem that a traditional 2xthru de-embedding method is in a high-frequency region (especially S11gt; s21), and physical rationality and stability of the result are ensured at the same time.

The invention relates to the technical field of sensors, and discloses an automatic testing method and device for an inductance proximity sensor, electronic equipment and a storage medium. The method comprises the following steps: acquiring test configuration data of a tested inductance proximity sensor, and analyzing the test configuration data to obtain a first test distance; moving the tested inductance proximity sensor to a first test position through the test clamp, wherein the distance between the tested inductance proximity sensor and the target at the first test position is a first test distance; acquiring inductance change data and sensor output data of the detected inductance proximity sensor in the moving process; sending the first test distance, the inductance change data and the sensor output data as first test result data to a target machine learning model; and performing correction and optimization processing on the first test result data through the target machine learning model to obtain target test result data corresponding to the tested inductance proximity sensor. Through the method, the test efficiency is improved, and the test error is reduced.

The invention provides a helicopter propeller hub test fixing device and method. The device comprises a propeller hub rotor shaft; the propeller hub rotor wing shaft can be sleeved with the propeller hub center piece; one end of the transition shaft is connected with the propeller hub rotor wing shaft; a settlement type foundation pit; the steel frame concrete platform is arranged in the settlement type foundation pit; wherein the other end of the transition shaft is connected with the steel frame concrete platform; by adopting the design of the settlement type foundation, the height of the whole test device can be reduced, and the loading stability and rigidity of the test device are improved.

The utility model relates to the field of chip production test, and discloses a chip test fixture, which comprises a test bench, a chip test circuit board and a chip limiting mechanism, the chip test circuit board is fixed in the test bench, the upper end face of the test bench is provided with a limiting concave table structure, and the chip limiting mechanism is arranged on the limiting concave table structure. The bottom of the limiting concave platform structure is provided with a test butt joint module which is in butt joint with the chip test circuit board, and the chip limiting mechanism comprises a chip limiting frame which is arranged in the limiting concave platform structure and a chip upper limiting part which is arranged on the upper surface of the test bench and is used for limiting the upper surface of a chip. The limiting concave table structure and the chip limiting frame are correspondingly provided with a first magnetic piece and a second magnetic piece which attract each other, taking and placing receding grooves are formed in the two corresponding sides of the limiting concave table structure, and taking and placing receding concave tables are arranged at the positions, corresponding to the taking and placing receding grooves, of the lower end of the outer side wall of the chip limiting frame. The chip limiting frame is simple, convenient and fast to replace, and the detection efficiency of small-batch products or samples is effectively improved.

The utility model discloses a PCB multi-linkage test fixture, which belongs to the technical field of PCB testing, and comprises a workbench, the top end of the workbench is fixedly connected with four fixing blocks and a mounting seat, the mounting seat is located among the four fixing blocks, fixing rod assemblies are fixedly connected between the four fixing blocks and the outer surface of the mounting seat respectively, and the fixing rod assemblies are fixedly connected with the mounting seat. The circumferential surfaces of the four fixing rod assemblies are slidably connected with sliding plates, the circumferential surfaces of the four fixing rod assemblies are sleeved with spring assemblies, the four spring assemblies are located between the four sliding plates and the mounting base, the top ends of the four sliding plates are fixedly connected with probe assemblies, and the four probe assemblies correspond to the mounting base. A linkage mechanism is arranged on the workbench; according to the utility model, through one-time pushing of the linkage mechanism, the test fixture is linked with the four probe assemblies to simultaneously contact the PCB from four directions for testing, conduction of the PCB needing to be tested from multiple directions is more convenient, the structure is simple, and the production cost is low.

The invention discloses a cable defect early warning method and device, terminal equipment and a storage medium, and belongs to the technical field of cable defect early warning, and the method comprises the steps: carrying out the frequency sweeping test of an equivalent circuit model, generating a reflection coefficient spectrum, separating a low-frequency component from the reflection coefficient spectrum, and taking the low-frequency component as a head-end reflection coefficient, through combination of the head end reflection coefficient, the internal resistance of the test equipment and the cable impedance, equivalent impedance at the joint of the test fixture and the head end of the cable is obtained through quantification, and an original reflection coefficient spectrum is corrected according to the equivalent impedance, so that impedance mismatch of the test fixture in the test process is eliminated. The corrected reflection coefficient spectrum can reflect the impedance of the cable body more accurately, so that the subsequently obtained time domain response can reflect the defect condition of the cable body more truly, and the accuracy of cable defect early warning is improved. The problem that the accuracy of cable defect early warning is low due to the fact that the original reflection coefficient spectrum cannot be corrected in the prior art can be solved.

The utility model discloses a capacitance method dielectric constant test system, which comprises a reaction kettle, a constant temperature oil bath pan, a data acquisition unit, a computer, a capacitance tester, a temperature transmitter, a pressure sensor and a capacitance test clamp assembly, and is characterized in that the reaction kettle is arranged in the constant temperature oil bath pan and is provided with a sealing cover; the measuring ends of the temperature transmitter, the pressure sensor and the capacitance tester are all arranged in the reaction kettle, the signal output ends of the temperature transmitter and the pressure sensor penetrate through the sealing cover to the outside of the constant-temperature oil bath pan and are connected with the input end of a data collector, the output end of the data collector is connected with a computer, and the computer is connected with the constant-temperature oil bath pan. The input end of the capacitance tester is connected with the capacitance test clamp assembly, and the output end of the capacitance tester is connected with the computer. The test system provided by the utility model simplifies test equipment, is accurate and reliable in measurement result, and can be used for measurement under high-temperature and high-pressure conditions.

The embodiment of the invention relates to the technical field of pipe testing, and discloses a pipe oxidation resistance testing system which comprises an oxidation resistance testing device. The oxidation resistance testing device comprises a first box body, a second box body, a water pump device and a testing assembly, the water pump device is arranged in the first box body, the testing assembly is arranged in the second box body, and the first box body and the second box body are arranged in a split mode. The testing assembly comprises a liquid storage tank, a heat preservation unit and a sample tube testing unit, the heat preservation unit is used for conducting heat preservation on the sample tube testing unit, and the sample tube testing unit comprises a connecting pipeline and testing clamps arranged at all testing points on the connecting pipeline; the test fixture is used for clamping the corresponding sample test tube and enabling the sample test tube to be communicated with the connecting pipeline. The test system provided by the embodiment of the invention adopts a module combination box type damping design, and is simple in overall structure, high in integration level and small in single occupied area. The split type design can effectively avoid the influence of motor vibration on the service life of the pipe in the testing process.

The testing tool comprises a high-pressure end positioning plate and a low-pressure end positioning plate, the high-pressure end positioning plate is provided with a convex plane, the low-pressure end positioning plate is provided with a concave plane, and the convex plane is matched with the side surface of the concave plane; the convex plane is hermetically connected with the sensor core upper base, and the concave plane is hermetically connected with the sensor core lower base; the high-pressure end and low-pressure end positioning plate internal oil paths are connected with the high-pressure end and low-pressure end pressure leading ends; the sensor core upper base and the sensor core lower base are provided with a high-pressure end and a low-pressure end of the differential pressure sensor core; at each stable temperature point, different static pressure values are applied to the differential pressure type piston pressure gauge, meanwhile, corresponding differential pressure values are applied to the differential pressure type piston pressure gauge, and a measured value of a differential pressure sensor core is taken to obtain a temperature-static pressure-differential pressure ternary test data matrix; the testing tool is simple in structure, can adapt to testing work under the high static pressure condition, and completes multi-parameter synchronous measurement of the multiple differential pressure sensors under the high static pressure.

The invention provides chip testing equipment and a control method, and relates to the technical field of chip testing. According to the invention, the target first adsorption part is firstly controlled to adsorb the tested chip, then the first rotating tower is controlled to rotate so as to drive the target first adsorption part to rotate to the feeding station of the annular linear motor, and the tested chip is placed on the target test fixture. And then the annular linear motor is controlled to drive the target test fixture to move to the test station, after the tested chip is tested, the annular linear motor is controlled to drive the target test fixture to move to the blanking station, and the tested chip is blanked. According to the technical scheme, the rotating tower is used for feeding the tested chip, the multiple first adsorption pieces synchronously take and place materials, and the feeding speed is increased. The mode that the annular linear motor drives the testing jigs to move is adopted, the feeding speed can be matched with the feeding speed of the turret, therefore, the testing efficiency is overall improved, the multiple testing jigs on the annular linear motor can be independently controlled, and flexibility is good.

The present invention belongs to the field of manufacturing engineering / digital information, and provides a method for acquiring circumferential mechanical property parameters of a pipe material. In order to obtain a more accurate and comprehensive description of a strain hardening behavior of a material, it is required to use a true stress-strain curve, such that the present invention uses a flexible tensile test fixture to perform a tensile test on a circumferential tensile pipe material sample. The tensile test process comprises: using a non-contact video extensometer and a universal tensile testing machine to obtain tensile measurement data of the pipe material; then preprocessing the tensile measurement data of the pipe material; using the preprocessed data for calculating true stress-true strain data of the circumferential tensile pipe material sample; and setting initial and end strains of a plastic section, and using a linear regression fitting method for calculating a strength coefficient and a strain hardening exponent in the plastic section. The strength coefficient and the strain hardening exponent in the plastic section and the true stress-true strain data of the circumferential tensile sample are used for finite element analysis of pipe systems.

The invention discloses a power supply test method and system, a test fixture and a storage medium, and relates to the technical field of testing, and the method comprises the steps: responding to a received test instruction, generating a test control signal corresponding to the test instruction through a main controller, generating a load simulation signal according to the test power and the input voltage of the test fixture, and transmitting the load simulation signal to a test module; and in response to the load analog signal, adjusting the load of the power controller through a load analog module according to the load analog signal and a feedback signal of the load of the power controller so as to update the feedback signal until the voltage difference between the voltage value indicated by the load analog signal and the voltage value indicated by the feedback signal is within a specified voltage difference range, the problem of low accuracy of the test result of the power supply test in the prior art is solved, and the accuracy and reliability of the power supply test are improved.

The invention relates to a multi-path power supply parallel automatic test system and a test method. The multi-path power supply parallel automatic test system comprises a main control module, an instruction scheduling module, a test instrument group and a plurality of test fixtures, each test fixture is used as an independent test channel with self-defined configuration; a request signal input end of the main control module is connected with a request signal output end of the independent test channel, a test signal input end of the main control module is connected with a test signal output end of the test instrument group, and a control signal output end of the main control module is connected with a control signal input end of the instruction scheduling module; the signal output end of the instruction scheduling module is connected with the signal input end of the test instrument group, and the test instrument group is used for executing corresponding test operation on the to-be-tested power supply according to the control signal; the testing efficiency is remarkably improved, manual operation is reduced, and the basic capability of automatic parallel testing of multiple power supplies is achieved.