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8861 results about "Test fixture" patented technology

A test fixture is something used to consistently test some item, device, or piece of software. Test fixtures can be found when testing electronics, software and physical devices.

Method of correcting measurement error and electronic component characteristic measurement apparatus

A high-precision, multi-port compatible, relative correction method and apparatus for correcting measurement errors covering an increase in the number of ports of a non-coaxial electronic component, in which a relative correction adapter 31 is provided that is formed of a two-port network connected to each port of a production test fixture 5B adjacent to a measurement apparatus. The relative correction adapter has a characteristic that modifies the electrical characteristics generated by the production test fixture 5B having an electronic component under test mounted thereon into electrical characteristics generated by a standard test fixture 5A having the electronic component under test mounted thereon. An error factor of the relative correction adapter 31 is identified from a standard test fixture measurement value and a production test fixture measurement value of a correction data acquisition specimen 11B. A production test fixture measurement value of the electronic component under test 11A is corrected with the error factor of the relative correction adapter 31 to thereby obtain the standard test fixture measurement value of the electronic component under test 11A which is assumed to be obtained when the electronic component under test 11A.
Owner:MURATA MFG CO LTD

Apparatus and methods for testing a microprocessor chip using dedicated scan strings

A test apparatus and method for design verification of at least one microprocessor chip includes a compatible Joint Task Action Group (JTAG) terminal for access to a plurality of computer functional units contained in the chip. A test input terminal included in the JTAG terminal receives a scan string, the string being coupled to each computer functional unit through a first multiplexer. The scan input string is separated by the JTAG terminal under program control into a series of dedicated scan strings, each dedicated scan string being supplied to a selected functional unit through the first multiplexer. Each functional unit includes start and stop scan clocks for testing the functional under program control using the dedicated scan train for the functional unit. A test output terminal included in the JTAG terminal is coupled to each functional unit through a second multiplexer. The test results of the dedicated scan string under control of the scan clock are supplied to the output terminal through the second multiplexer. The compatible JTAG terminal includes further elements for controlling the scan clocks to select a targeted functional unit for testing purposes while the scan strings for non-targeted functional units remain in an inactive state.
Owner:GOOGLE LLC

Fluid sample distriution system for test device

Diagnostic products having multiple test strips within a unitary diagnostic test device, or test icon, are described herein. In the preferred embodiments of the diagnostic test device of this invention, a fluid sample distribution system is provided wherein a sample collection and distribution port is provided in the housing for receipt of a biologic fluid sample and the channeling of such sample onto a sample receiving web. The sample receiving web, which is located within the test device, is in fluid communication with an array of test strips, and is configured to deliver an aliquot of biologic fluid sample to the test site of each such test strip at essentially the same rate. In the preferred embodiments of this invention, the sample receiving web comprises at least one base segment and at least one branched segment. Each of the base and branched segments can be formed or cut from a common sheet of material or from separate sheet material and thereafter placed in contiguous relationship one another. The relative placement of the sample receiving web within the test device is coincident with a portion of each test strip and designed to effect the balanced distribution and delivery of an aliquot of the biologic fluid sample to the test site of each of the test strips within the test device.
Owner:BIONIKE

Scalable wideband probes, fixtures, and sockets for high speed IC testing and interconnects

We introduce a new Periodic micro coaxial transmission line (PMTL) that is capable of sustaining a TEM propagation mode up to THz band. The PMTL can be manufactured using the current photolithographic processes. This transmission line can be embedded in microscopic layers that allow many new applications. We use the PMTL to develop a wideband highly scalable connector that is then used in a Probe that can be used for connecting to microscopic scale Integrated Circuits with picoseconds High Speed Digital and near THz Analogue performance in various stages of development from R&D to production testing. These probes, in one embodiment, provide a thin pen-like vertical probe tip that matches the die pad pattern precisely that can be as agile as a high speed plotter pen, connecting on the fly to any die pattern on a wafer. This approach allows the most valuable part of the test, namely the wafer to remain stationary and safe, and the least costly part of the test, namely the probe to take most of the wear and tear. We further use the embedded PMTL to develop a modular, scaleable and fully automated Universal Test Fixture for testing chips in various stages of development mainly for digital IC chips that can be utilized in production lines with pick and place of chips on tape to test every chip before insertion into circuits. One embodiment includes a low profile wideband Signal Launcher and an alligator type RF Clip that can be used at the edge of PCB's directly for validation broads. The Signal Launcher is used to develop a new versatile Flush Top Test Fixtures for individual device testing in various stages of development from die, to packaged, to Module, to Circuit Boards. The PMTL can also provide Confined Field Interconnects (CFI) between various elements on semiconductor wafers to reduce parasitic and radiation losses and practically eliminating cross talk, thus, increasing the speed of digital IC's. The PMTL is also used to develop a Universal Test Socket, and a Hand Probe with performance up to 220 GHz.
Owner:WAYMO LLC

Test system and test method

The invention provides a test system and a test method. The testing system comprises a test fixture, a test device and a differential tunable matching network, wherein the test fixture is provided with a bearing structure for loading a chip to be tested and a test port electrically connected to the chip to be tested; the test device comprises a radio frequency signal source, a receiving unit and a processing and display unit; the radio frequency signal source is provided with at least one radio frequency test port; the receiving unit is used for at least receiving a reflected signal and a transmitted signal which are generated after a radio frequency signal passes through the chip to be tested; the processing and display unit is used for processing the received radio frequency signal and displaying the processed signal; and the differential tunable matching network is provided with an input port and a differential output port and is used for tuning the impedance of a load end including the chip to be tested to make the impedance of the load end matched with the internal resistance of the test device and providing the test device to measure the characteristic of the chip to be detected in the test fixture. Compared with the prior art, the invention has the advantages that: the differential tunable matching network is provided for realizing impedance matching, the test system and the test method are easy and convenient to operate, and a more accurate test result can be acquired.
Owner:SEMICON MFG INT (SHANGHAI) CORP +1

Thermo-mechanical-environmental coupling effect testing device and application from room temperature to ultrahigh temperature

The invention relates to the field of test of mechanical properties of materials and in particular relates to a thermo-mechanical-environmental coupling effect testing device and application from room temperature to ultrahigh temperature. The device comprises an electronic universal testing machine, a loading control system, a power supply control system, an induction heater, a strain measurement system, a sample clamp, a temperature measuring system, a pressure control system, a display and analysis system and a vacuum system, wherein a vacuum cavity in the electronic universal testing machine is in a fully water-cooled design, and various functional windows, such as a sensor connector of the clamp and the electronic universal testing machine, an infrared or thermocouple temperature measuring opening of the temperature measuring system, a pressure control opening of the pressure control system, an induction power supply introduction opening of the power supply control system, an extensometer introduction opening of the strain measurement system and a connector of the vacuum system and the vacuum cavity, are reserved in different parts of the vacuum cavity. The device disclosed by the invention can quantitatively research the thermo-mechanical-environmental coupling effect and has the advantages of diversified tested mechanical property parameters, high sample heating and cooling speed and the like.
Owner:INST OF METAL RESEARCH - CHINESE ACAD OF SCI
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