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9775 results about "Tester device" patented technology

Method, system, and apparatus for managing, monitoring, auditing, cataloging, scoring, and improving vulnerability assessment tests, as well as automating retesting efforts and elements of tests

A scalable method, system, and apparatus for non-intrusively auditing and improving security assessments includes capturing, storing, presenting, displaying, inspecting, monitoring, and analyzing data flow in client-server security assessments and/or network/infrastructure security assessments. The invention provides interested parties with a mechanism to non-intrusively audit in real-time the vulnerability test effort, as well as review, replay, and analyze all aspects of the security assessment during and after the test. For web application assessments, the data capture includes one of the following or some combination: an intermediary with all data passing through the intermediary; a sniffer that can passively extract all data being communicated between the application and tester; and a plurality of computing modules (e.g., software, appliances, etc.) installed in the tester environment or within the application system environment (e.g., software installed on the tester's computer, or on the computer where the intermediary is running, or software installed on the application systems proxy or web server, or an appliance in either environment) for storing, processing, analyzing, reporting, and displaying the data.
Owner:STYSLINGER BRIAN

System and method of controlling power consumption in an electronic system

A method and apparatus for adaptively adjusting the operating voltage of an integrated circuit in response to tester-to-system variations, worst-case testing techniques, process variations, temperature variations, or reliability wearout mechanisms. The minimum operating voltage of an integrated circuit is determined either during external testing of the integrated circuit or during built-in-self-testing. The minimum operating voltage is transmitted to a variable voltage regulator where it is used to set the output of the regulator. The output of the regulator supplies the integrated circuit with its operating voltage. This technique enables tailoring of the operating voltage of integrated circuits on a part-by-part basis which results in power consumption optimization by adapting operating voltage in response to tester-to-system variations, worst-case testing techniques, process variations, temperature variations or reliability wearout mechanisms. Alternatively, the invention enables adaptive adjustment of the operating frequency of an integrated circuit. The invention enables system designers to adaptively optimize either system performance or power consumption on a part-by-part basis in response to tester-to-system variations, worst-case testing techniques, process variations, temperature variations or reliability wearout mechanisms.
Owner:IBM CORP
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