1634 results about "Test board" patented technology

The invention specifically discloses a method for evaluating the health state of a cigarette comprehensive test board, and the method comprises the steps: obtaining the fault type of the cigarette comprehensive test board, and carrying out the analysis of the fault type, so as to obtain the self degradation of equipment and the influence factors of the fault; carrying out fault influence factor analysis on influence factors of equipment degradation and faults, and carrying out numeralization on the influence factors; carrying out fault data acquisition and processing on the cigarette comprehensive test bench, structuring data of equipment faults, and further carrying out fault data expansion through a generative model GAN network; and a DNN deep neural network is constructed, training is performed by using the expanded fault data, and then fault probability evaluation is performed on the cigarette comprehensive test bench through the DNN deep neural network. According to the invention, the convenience and accuracy of health assessment of the cigarette comprehensive test board can be improved.

The invention discloses a test board and a test system, the test board comprises multiple types of board card interfaces, a test module, a switching module and a test controller, each board card interface comprises a clock pin, a data pin and a management pin, and a target board card to be tested is connected with at least one board card interface; the test module is connected with data pins of the board card interfaces; the switching module is connected with the test module and the clock pin of each board card interface; the test controller is connected with management pins of the board card interfaces, and the test controller is used for determining target board card interfaces connected with target board cards based on the management pins and controlling the switching module, so that a clock pin of one target board card interface is communicated with the test module, and a clock pin of the other target board card interface is communicated with the test module; and the test module is used for testing the interface function of the target board card based on the connected clock pin and the data pin of the target board card interface. And multiple types of board card interfaces are arranged, so that multiple types of to-be-tested target board cards can be compatible, and the test universality is improved.

The invention provides a chip aging test system and method based on a field programmable gate array, and the system is characterized in that a drive control panel comprises a processor module, a communication interface module, and an external connector module; the external connector module comprises a first connector and a second connector; the processor module is used for receiving a test instruction sent by the upper computer through the communication interface module, generating a test signal and a control signal, and receiving a test result acquisition instruction sent by the upper computer after the communication interface module sends response information to the upper computer; the first end of the processor module is also used for sending the interrupt information to an upper computer through the communication interface module and displaying the interrupt information; and the third end of the processor module is connected with the second connector and is used for outputting the control signal to the test board. Test signals are output to multiple groups of tested chips of the test board in parallel through the first connector, the second connector controls the test sequence of the to-be-tested chips on the test board, and hundreds of chips are driven by a single drive board and used for aging test.

The invention relates to an SOC chip performance test device, method and equipment and a readable storage medium. In the device, an upper computer is used for sending an excitation instruction to a voltage simulator and sending a test instruction to a signal generator according to a test requirement; the voltage simulator is used for inputting a voltage excitation signal to the test board according to the excitation instruction; the signal generator is used for inputting a test signal to the test board according to the test instruction; the test board is used for conditioning the voltage excitation signal and the test signal and sending a first conditioning signal to the SOC chip to be tested so as to indicate the SOC chip to be tested to respond to the first conditioning signal; the test board is also used for acquiring a response signal returned by the SOC chip to be tested, conditioning the response signal, and returning a second conditioning signal to the upper computer; and the upper computer is also used for analyzing the second conditioning signal to obtain a performance test result. The SOC chip performance test efficiency can be improved.

A lower plunger of a pogo pin according to the present disclosure includes a metal pin and an electro-conductive rubber, and the electro-conductive rubber having a configuration in which a plurality of electro-conductive particles are contained in an elastic insulating material is attached to a lower end of the metal pin to increase a contact area between the lower plunger and a pad of a test board through a surface contact, thereby preventing the occurrence of inductive spikes and thus improving signal quality in a high-speed signal transmission environment.

The utility model discloses a temperature control water nozzle service life testing machine, and relates to the technical field of temperature control water nozzle service life detection. The temperature control water nozzle service life testing machine comprises a testing stand and a constant temperature water nozzle body, a fixing frame is fixed to the rear side of the top of the testing stand, a water supply pipe is embedded in the fixing frame, a water outlet pipe is arranged on the front side of the water supply pipe, a threaded sleeve is rotationally connected to the front end of the water outlet pipe and is in threaded fit with the constant temperature water nozzle body, and a hose is connected between the water supply pipe and the water outlet pipe. A screw rod is obliquely arranged on the inner side of the fixing frame, a movable block is arranged on the screw rod in a threaded mode, an elastic assembly is connected to the bottom of the movable block, a U-shaped frame is connected to the lower end of the elastic assembly, a pressing wheel is rotationally installed on the inner side of the U-shaped frame through a rotating shaft, and the pressing wheel is matched with a hose. By combining the elastic effect of the elastic assembly, the pressing wheel extrudes the hose, the size of the drift diameter of the hose is changed, the purpose of adjusting the water flow speed is achieved, the structure is simple, and use is convenient.

The invention provides a semiconductor chip on-line test device, and particularly relates to the technical field of chip performance test.The semiconductor chip on-line test device comprises a test box, a main controller is installed at the top of one side of the test box, and a vertical heat insulation plate is fixedly arranged in the middle of an inner cavity of the test box; a test space is divided into a low-temperature test area and a high-temperature test area which are independent through a vertical heat insulation plate and a horizontal heat insulation plate, an annular groove is formed in the position, corresponding to the permanent magnet ring, of the top face of the horizontal heat insulation plate, two symmetrically-arranged permanent magnet blocks are arranged in the annular groove in a sliding mode, and the positions of the two permanent magnet blocks correspond to the position of the permanent magnet ring in an up-and-down mode. The test board can enter different temperature zones at the same time for synchronous test under the driving of the circular ring plate, the problem of temperature fluctuation caused by environment exposure during environment switching in the prior art is avoided, the temperature of the temperature zones does not need to be frequently adjusted, the stability of the test environment is ensured, and the test efficiency of the semiconductor chip is improved.

Disclosed is a test board which includes a substrate that includes a device under test (DUT) placement area where a first DUT and a second DUT are disposed, a first load switch connected in series with the first DUT and configured to be set to a switch on state or a switch off state based on a first enable signal, a second load switch connected in series with the second DUT and configured to be set to the switch on state or the switch off state depending on a second enable signal, and a test controller. The test controller may be configured to perform a test operation in a (1-1)-th mode by activating the first enable signal and deactivating the second enable signal and then perform the test operation in a (1-2)-th mode by deactivating the first enable signal and activating the second enable signal.

A heating element test board and a heating element test system are applied to the technical field of heating element test, and the heating element test board comprises a processor, a communication unit and a heating element test unit. The heating body test unit is used for being connected with a to-be-tested heating body and realizing a preset test function on the to-be-tested heating body; the communication unit is provided with a communication access end and a communication cascade end, and the communication access end is connected with the communication cascade end; the communication access end is used for being connected with a communication end of an upper computer or being connected with a communication end of a heating element test board of a previous cascade, and the communication cascade end is used for being connected with a communication end of a heating element test board of a next cascade; and the processor is respectively connected with the heating body testing unit and the communication unit. The plurality of heating element test boards can be cascaded based on the communication unit, and the plurality of cascaded heating element test boards can be connected and communicated with the upper computer, so that the test efficiency is improved.

The utility model relates to a lateral touch spring type touch button circuit board testing machine, which comprises a test board, a positioning jig, a test board, a lifting assembly and a touch test assembly, a plurality of test probes are arranged on the test board, the test probes extend towards the direction of the positioning jig, the positioning jig is used for placing a circuit board to be tested, and the lifting assembly is arranged on the test board. The positioning jig is arranged on the test board and arranged on the test board in a floating mode, the test board is movably arranged over the positioning jig through the lifting assembly, and the test board presses the circuit board to be tested downwards through the lifting assembly so as to enable the circuit board to be tested to be in contact conduction with the plurality of test probes; the touch test assembly comprises a touch pen and a lateral driving piece, the touch pen is movably arranged on the side edge of the positioning jig through the lateral driving piece, and the touch pen cooperates with the pressed circuit board to be tested so as to laterally touch the spring type touch key. According to the utility model, the spring type touch key is automatically touched through the touch test assembly, and the touch pen touches the spring type touch key in the side direction, so that the circuit board can be better compatible with other electrical tests of the circuit board.

The invention belongs to the technical field of ultra-high voltage direct current power transmission, and discloses a test system and method of a converter valve thyristor voltage detection board card, and the test system comprises a test cabinet and a test tool. An industrial control system is integrated in the test cabinet to set test parameters and criteria, an electric control unit loads an excitation source, an acquisition display unit acquires test data and presents the test data in an oscillogram, and a test tool fixes a tested board card. The industrial control system outputs a control instruction to drive the electric control unit to apply system test excitation, the actual working condition of the thyristor is simulated, and meanwhile, the acquisition and display unit automatically captures multichannel signal data; data are transmitted to the industrial control system through the electric control unit, and the board card performance is automatically analyzed and a test report is generated in combination with a preset criterion. By adopting the system, the problems of insufficient function verification, low test efficiency, vulnerable equipment, poor data accuracy and large manpower occupation are solved, efficient and lossless automatic test is realized, the test reliability is improved, and the operation process is simplified.

The invention provides an optical module test system and method, electronic equipment and a readable storage medium, and is suitable for the technical field of optical communication. The test system comprises at least two test boards, wherein each test board is used for installing a to-be-tested optical module; the testing unit is used for testing the performance of each to-be-tested optical module; the optical switch unit is connected with each to-be-tested optical module and the test unit and is used for controlling the to-be-tested optical module to be communicated with the light source and the test unit to form a test channel; and the control unit is connected with the optical switch unit and the test unit, and is used for controlling the optical switch unit to communicate each to-be-tested optical module with the light source and the test unit to form a test channel based on the acquired test scheme information, so as to test the performance of each to-be-tested optical module and acquire test information corresponding to each to-be-tested optical module. According to the embodiment of the invention, at least two optical modules can be automatically tested, the test efficiency is improved, the labor cost is reduced, and the accuracy of a test result can be ensured.

The invention relates to the technical field of air bearing testing, in particular to an air bearing rigidity testing device and method, and the device comprises a test board, an air bearing installation mechanism, an air film gap adjustment mechanism, a levelness adjustment mechanism and a measurement system. The air bearing mounting mechanism is inversely mounted at the top of the test bench, and a gap detection assembly is arranged on the air bearing mounting mechanism; the air film gap adjusting mechanism is arranged in the test bench and right faces the lower portion of the air bearing installation mechanism. The levelness adjusting mechanism comprises at least three flexible hinges, and the flexible hinges are distributed between the fixing base and the bearing table top in a three-point supporting mode. The measuring system comprises a control unit, and the control unit is integrated with a closed-loop control algorithm and is in communication connection with the gap detection assembly and the gas film gap adjusting mechanism. Through the innovative air film gap adjustment mode, the levelness guarantee structure and the inverted design of the air bearing installation mechanism, micron-sized air film gap control is achieved, and the rigidity testing precision is remarkably improved.

The invention provides a broadcast type multi-board card parallel test method and system, a medium and a product, and relates to the technical field of electronic manufacturing board card testing, and the method comprises the steps: enabling a plurality of to-be-tested board cards to start to execute a target test item at the same time through a broadcast test instruction; the to-be-collected address list of the initial token frame establishes an ordered mechanism of board card access, and the first data segment provides a unified data collection space. In the token frame transmission operation, the first to-be-tested board card executes differentiated token frame processing operation according to the test state of the first to-be-tested board card; the token frame is directly forwarded in an uncompleted state; and in the completion state, writing test completion result data into the first data segment and updating the to-be-collected address list. And when the to-be-collected address list is empty, the tested board cards automatically exit the circulation, the unfinished board cards continue to participate in token transmission until the to-be-collected address list is empty, and the test results of all the board cards are collected into the first token frame. Therefore, a technical problem of low time utilization efficiency in a multi-board-card parallel test process in the prior art is solved.

The embodiment of the invention provides a test method and device, a storage medium and electronic equipment, and relates to the technical field of computers.The method comprises the steps that a test parameter set is obtained, and the test parameter set comprises test parameters of at least one temperature condition; loss test is carried out by using the test parameter set and a first test board to obtain a limit value of link loss, and the limit value of link loss is at least used for reflecting the driving capability of a sending end chip; carrying out loss test by using the test parameter set and a first test board, comprising the following steps: adjusting the temperature of the first PCB, and determining the target temperature of the adjusted first PCB; and determining test parameters matched with the target temperature, and performing loss test by using the matched test parameters. Therefore, the link loss characteristic is changed by adopting the test parameters matched with each temperature and controlling the measurement temperature, and then the limit value of the link loss is obtained to reflect the driving capability of the sending end chip.

The embodiment of the utility model provides a test board for a touch drive circuit, and the test board comprises a development board which is connected with a mainboard of a mobile terminal and the touch drive circuit; the development board comprises a downlink interface communication module used for receiving and transmitting the touch signal and obtaining touch point data based on the touch signal, and an uplink interface communication module connected with the mobile terminal mainboard. The downlink data conversion module is used for converting the touch point data into touch point data which can be identified by a mobile terminal mainboard and / or a PC tool; and the uplink data conversion module is used for converting a command or data received from the mobile terminal mainboard and / or the PC tool into an operation time sequence communicated with the touch driving circuit. By means of the test board, the touch signal and the display signal can be separated, and the effect of collecting interference data from the display screen is achieved under the condition that a TPIC driver in the mobile terminal is not updated.

The invention relates to the technical field of chip testing, in particular to a chip aging test board and an intelligent heat dissipation method and system thereof, and the chip aging test board comprises a substrate which is provided with a socket for installing a plurality of chips to be tested; the supporting plate is fixedly mounted on the bottom surface of the base plate; the plurality of screws penetrate through the supporting plate and the substrate and are locked into the threaded holes in the four corners of the socket; according to the invention, the supporting plate is arranged on the bottom surface of the substrate, and the screws penetrate through the supporting plate and the substrate and are locked to the threaded holes of the socket, so that stable mechanical connection is formed, and therefore, downward pressing impact force during chip loading and unloading and thermal stress generated by high and low temperature circulation can be resisted; and a plurality of air guide inclined planes are arranged on the supporting plate, so that the heat exchange between air and the chip is improved, and the problems of response lag and insufficient temperature regulation and control capability of a traditional scheme are solved through an intelligent scheme of considering temperature control and vibration management.

The invention relates to a display screen testing method and device, computer equipment, a storage medium and a computer program product. The method comprises the following steps: receiving a test instruction for a touch channel of a display screen; determining a test channel of at least one test board card corresponding to the touch channel of the display screen; wherein an information mapping relationship exists between a touch channel of the display screen and a test channel of at least one test board card, the information mapping relationship is determined based on board card combination information, and the board card combination information comprises information of at least one test board card corresponding to the display screen; and based on the test channel of the at least one test board card, converting the test instruction into a test signal, and sending the test signal to a corresponding touch channel. The expansion capability of the test board card can be improved.

The invention relates to a laser radar rotating mirror testing device and method, and the device employs a double-light-path design: a testing light source is subjected to beam splitting through a spectroscope, is reflected by a reflector I and a rotating mirror to form a testing light spot, is reflected by a reflector II to form a reference light spot, and is synchronously projected to a testing plate; a high-precision camera is used for capturing light spot displacement, a reference mark is combined to calibrate a coordinate system, and sub-milliradian level detection of rotating mirror angle drift is achieved. A sealed heat preservation cover is linked with temperature control equipment, so that the temperature control precision of + / -0.1 DEG C is realized; the integrated clamp synchronously fixes the rotating mirror and the reflecting mirror II to eliminate relative displacement errors of parts; the damping optical platform thoroughly isolates ground vibration; the same test light source reduces test errors. According to the testing method, a drift curve is automatically generated through temperature circulation (-40 DEG C to 85 DEG C), the angle drift amount is calculated according to a formula, a temperature compensation model is output, and rotating mirror temperature drift characteristic evaluation and compensation parameters are provided for the high-precision laser radar.

The invention relates to the technical field of oil and gas resource drilling tools, in particular to a variable-diameter intelligent underground turbine generator test board which comprises a generator fixing module, a magnetic ring clamping module and a driving digital display module. The generator fixing module comprises a generator, a fixing support, a pushing and clamping sliding block, a lead screw motor and a pushing and clamping lead screw nut. The magnetic ring clamping module comprises a magnetic ring, a clamping sliding block, a clamping lead screw nut, a clamping lead screw, a large bevel gear, a small bevel gear, a bevel gear transmission shaft, a transmission gear, a driving gear ring, a hexagonal stud, a hollow gear motor, a hollow connecting shaft, a tapered roller bearing set, a bearing upper base, a large nut, a bearing lower base, a hollow belt wheel, a rear bearing, a front bearing and a middle shell. The device comprises a thin bearing pack, a clamping base body, an outer bearing, an outer bearing base body, an inner bearing and a rack, and the driving digital display module comprises a belt wheel motor, a controller, a power supply and a power analyzer. Through the intelligent variable-diameter clamping device, underground turbine generators of different sizes and powers can be tested, the application range is wider, and the working performance is more stable.

The utility model provides a rotary joint testboard, and belongs to the technical field of rotary joints. Comprising a lifting assembly, the lifting assembly is arranged in a detection box, the lifting assembly comprises a sliding rod fixed in the detection box, stop blocks are fixed to the two ends of the sliding rod, first driving motors are arranged on the outer sides of the stop blocks, a sliding block is slidably connected to the sliding rod, a lifting rod is fixed to the top of the sliding block, and a sliding open groove is formed in the lifting rod; the top of the lifting rod is provided with a second driving motor, the lifting rod is slidably connected with a lifting plate, the sliding rod is fixed in the detection box, the stop blocks at the two ends can prevent the sliding block from slipping and guarantee operation safety, and the first driving motor on the outer side can provide power for the sliding block so that the sliding block can slide smoothly along the sliding rod. And a sliding open groove in the lifting rod is in sliding connection with the lifting plate, and the lifting plate can be accurately controlled to ascend and descend in cooperation with a second driving motor at the top.

The invention relates to the technical field of memory bank testing, in particular to a memory bank aging testing device and method.The memory bank aging testing device comprises a testing box, a testing cavity is formed in the testing box, a testing plate is arranged in the testing cavity, and a memory bank is inserted into the testing plate. A double-shaft motor is matched with an electromagnetic clutch to respectively drive a soaking mechanism and a heat recovery mechanism, a reciprocating screw rod drives an extension box to move up and down in a reciprocating manner, a toothed plate and a driving gear are in meshing transmission, so that a rotating pipe rotates while moving, and a spray pipe forms composite sweeping airflow; dehumidification and regeneration are synchronized through cooperation with continuous rotation of the rotary box, closed-loop air treatment is formed, dynamic and uniform distribution of hot air in the test cavity is achieved, temperature stratification is effectively eliminated, meanwhile, energy consumption is remarkably reduced through waste heat recovery and medium regeneration, and the test efficiency is improved. And high uniformity, high cleanliness and low-energy-consumption operation of a high-temperature aging test environment are guaranteed.

The utility model provides a rapid positioning precision detection device, which comprises a calibration seat, a test board and a pointer, the center of the calibration seat is provided with a mounting hole, a horizontal mounting part and a vertical mounting part are arranged in the mounting hole, the test board is arranged on the horizontal mounting part or the vertical mounting part, and the pointer is arranged on the test board. The pointer penetrates through the center of the test plate, the pointer is perpendicular to the test plate, and two ends of the pointer respectively extend out of the test plate. The calibration device has the advantages that the calibration seat is matched with the test plate to be directly placed on the treatment head, the center of the test plate is ensured to be overlapped with the actual focus of the treatment head through processing precision, and the calibration accuracy is improved; the positioning precision result can be obtained only by measuring the distance between the center of the test board and the theoretical focus on the software treatment interface through the measurement function of the treatment software, and the operation is simple and convenient.

The utility model discloses a wear resistance testing device for protective gloves, which comprises a test board, a test frame and a sample frame, the test frame and the sample frame are respectively and vertically mounted on two sides of the test board, the bottom of the test frame is mounted on the test board through a first adjusting component in a front-back sliding manner, and a grinding wheel is arranged in the test frame in a lifting manner. The bottom of the sample frame is installed on the test bench in a left-right sliding mode through a second adjusting assembly, a hand mold is rotatably installed on the sample frame through a third adjusting assembly, the surface of the hand mold is covered with an air inflation film layer, and the outer side of the air inflation film layer is sleeved with a protective glove. The device has the advantages that comprehensive wear resistance detection can be carried out on all positions of the protective glove, including the finger face, the first web, the palm and the back of the hand.

The utility model relates to a signal generation device, an analog-digital hybrid test board card and a test machine, a read-write control module reads an original waveform from a storage device according to a received read request instruction, and returns the read original waveform to an arbitrary waveform generator; the arbitrary waveform generator receives the original waveform and outputs a reconstructed waveform matched with the frequency of a sampling clock of the digital-to-analog conversion device to the first communication module. And the second communication module is connected with the first communication module, and the reconstructed waveform is received by the second communication module and then is transmitted to the digital-to-analog conversion device. According to the technical scheme, the reconstructed waveform can be generated by resampling the original waveform, the external clock chip outputs the sampling clock with the fixed frequency to the digital-to-analog conversion device, digital-to-analog conversion can be completed, the external clock chip does not need to adjust the frequency of the sampling clock, the hardware requirement for the external clock chip and the digital-to-analog conversion device is low, and the design cost is reduced.

The utility model discloses a photodiode dark current testing device, comprising an LED lamp, a light shield, a dual-channel power supply, a desk type universal meter, a one-chip microcomputer control board and a multi-channel test board, the light shield is covered on the multi-channel test board, the multi-channel test board is provided with PD sockets having the same number as the channels of the multi-channel test board, and the PD sockets are connected with the desk type universal meter. The PD socket is composed of a 4P socket and Y-shaped sockets arranged side by side. After the scheme is adopted, the efficiency is greatly improved through multi-channel testing, and the vertical pins can be automatically tested through the design of the Y-shaped socket.