3066 results about "Test board" patented technology

The invention provides a method and system for preparing a high-temperature anti-aging test board for chip testing, and relates to the technical field of data energy storage and resource scheduling, and the method comprises the steps: designing a schematic circuit diagram and a PCB wiring scheme; a test plate is made of a high-temperature resistant material; bare board verification, electrical performance verification, program setting verification, high temperature verification and junction temperature measurement verification are carried out; using data is recorded, ultrasonic cleaning and drying are carried out, and a performance evaluation model is established through a hardware management system to judge whether maintenance or replacement is needed. According to the invention, the accuracy of chip testing in a high-temperature environment is improved, and the service life of the test board is prolonged.

The invention discloses a high-voltage cable test detection device, and belongs to the technical field of cable detection, the high-voltage cable test detection device comprises a test board, a clamping guide assembly is arranged in the center of the top of the test board, fixing rings capable of freely moving are arranged on the two sides of the clamping guide assembly, and a feed assembly is arranged on one side of each fixing ring. According to the device, by arranging a conversion cutter collecting assembly, a trigger ball can move under the pressure of an insulating layer, the trigger ball drives a clamping groove to move through a moving rod, a laminating wheel and a sliding block, so that the clamping groove is separated from a sliding disc, then the sliding disc is driven by a third spring to move upwards, and the sliding disc drives a mounting frame to move; the mounting frame drives the connecting rod to move, the connecting rod drives the cutter to retract, and the cutter is prevented from cutting an internal metal piece, so that the safety and accuracy of insulating layer stripping are improved, damage to a high-voltage cable is avoided, and the accuracy of a test result is improved.

An open and short circuit testing device and method. The device comprises a base (1), a support frame (2), a test board (5) and a placement frame (4). The test board (5) is slidably connected to the side opposite to the support frame (2), and the test board (5) moves downwards to drive a gear (14) to rotate; a limiting plate (17) is used for limiting reverse rotation of the gear (14); and a probe (26) is used for connecting to a circuit board to achieve testing. Under normal conditions, the friction force when the probe (26) is inserted into a wiring terminal (29) is less than the minimum elastic force of a second spring (25), when the probe (26) fails to be normally connected to the wiring terminal (29), the probe (26) is pressed downwards when a movable plate (23) moves downwards, the probe (26) is adjusted by means of the second spring (25) at the top of the probe (26), so that the probe (26) returns to normal, the pressure sensor (31) detects whether there is an abnormality, and when the second spring (25) at the top of the probe (26) is compressed, the pressure sensor (31) at the top of the second spring (25) measures an excessively large pressure value, i.e., indicating that a device abnormality occurs during the testing process rather than representing that there is necessarily a problem with the circuit board to be tested itself, thereby improving the accuracy of the testing result.

The invention belongs to the technical field of float flowmeter detection, and particularly relates to a float flowmeter detection device for a visual imaging small oxygenerator, which comprises a detection bin, a test board is fixed on the left side of the interior of the detection bin, a float flowmeter is arranged above the test board, a pressing cylinder is fixed on one side of the test board, and the pressing cylinder is fixed on the other side of the test board. The output end of the pressing air cylinder makes contact with the upper end of the float flowmeter and presses the float flowmeter. An air pressure valve is fixed to the left side of the upper portion of the detection bin, the lower portion of the float flowmeter is connected with an air inlet pipe, the air inlet pipe is connected with an external air source pipeline, the external air source pipeline is connected with the air pressure valve, the upper portion of the float flowmeter is connected with an exhaust pipe, and the air pressure valve is manually adjusted. In the prior art, the position of the floater is manually identified by naked eyes, the precision is poor, and the pressure on the upper side and the lower side of the floater cannot be kept constant, so that the test quality is greatly reduced.

The invention relates to a full-automatic test system and method compatible with multi-type component irradiation tests, and the system comprises an irradiation main control board, an irradiation test board and an irradiation load board which are disposed in an irradiation room and are connected through a cable, and an electronic load, a programmable power supply, an upper computer and a digital oscilloscope which are disposed in a test preparation room. The system can compatibly support the irradiation test of the total dose effect and the single event effect, is suitable for the rapid assessment demand of multiple types of COTS components on a large scale, and can meet the urgent demand of the commercial spaceflight field for the evaluation of the radiation resistance of the COTS components.

The invention discloses a mechanical property testing method for an inflatable wing, and belongs to the technical field of aerospace testing. The method comprises the following steps: S1, wing installation: clamping an inflatable wing on a test board, and enabling a chord plane of the inflatable wing to be perpendicular to a loading direction; s2, applying a load: driving a loading mechanism to apply a vertical load to the inflatable wing through an external universal tester; s3, data acquisition: synchronously acquiring a deflection curve and stress distribution data by using a displacement measurement unit and a strain detection unit; and S4, failure judgment: when monitoring that the shape of the deflection curve suddenly changes or the strain data exceeds a threshold value, judging that the inflatable wing is subjected to buckling failure, stopping loading and recording the maximum load. The test bench serves as an expansion platform of a universal tester, can be adapted to a large-size inflatable wing, does not need special equipment, reduces the cost, realizes cooperative monitoring of displacement and strain data, realizes closed-loop control of inflation air pressure-deformation-load, and remarkably improves the test precision and the data reliability.

The invention relates to a power device online test system and a power device test control method. The system comprises an upper computer, a test board and a digital signal generator, the test board and the digital signal generator are connected with the upper computer, n aging circuits, driving circuits and measuring circuits are integrated on the test board, and the upper computer is used for determining test parameters of periodic tests of at least one to-be-tested power device and determining the test parameters of the to-be-tested power device for each test. Determining a performance test type of the to-be-tested power device according to the test parameters, generating a performance test instruction corresponding to the performance test type, and sending the performance test instruction to a digital signal generator; generating a corresponding pulse test signal, and transmitting the pulse test signal to the driving circuit; a relay in a test channel is controlled to be switched on and / or switched off according to the pulse test signal, a performance test corresponding to the performance test type is achieved for the to-be-tested power device through the test channel, and the test channel comprises an aging circuit and a measuring circuit.

The embodiment of the invention provides a hot plug test board, a hot plug test system, a hot plug test method, hot plug test equipment and a medium, and relates to the field of internet big data. The hot plug test board comprises a logic module, a signal switch switching unit and a power supply detection unit, the logic module is connected with the signal switch switching unit and used for transmitting an NVME signal and controlling gating and cutting off of the signal switch switching unit so as to achieve hot removal or hot addition of the NVME hard disk, and the signal switch switching unit responds to control of the logic module and controls the power supply detection unit to detect the power supply of the NVME hard disk. And the NVME signal transmission to the NVME hard disk is gated or cut off, and the power supply detection unit is connected with the NVME hard disk and is used for detecting whether the NVME hard disk is normally powered off or powered on after hot plugging. Through the mode, the NVME hard disk hot plug test can be efficiently and conveniently carried out on the premise of not influencing the overall structure and the hardware and software logic of the original server.

The invention discloses automatic testing and sorting equipment and method for inductors, and belongs to the technical field of inductor testing. The automatic testing and sorting equipment comprises a base station, and the base station is sequentially provided with a first conveyor, a transferring mechanism and a sorting assembly from left to right; a feeding mechanism is mounted at the moving end of the transferring mechanism; a supporting table is mounted on the base table; a second air cylinder linear sliding table and a fixed table are installed on the supporting table, and a movable plate is fixedly installed at the movable end of the second air cylinder linear sliding table. The test mechanism comprises a first test board, a second test board and a size detection assembly; the right side of the moving plate is provided with two groups of first test benches, the fixed bench is provided with a second test bench, and the first transfer assembly and the second transfer assembly are respectively provided with a group of size detection assemblies. By means of the mode, the transferring mechanism drives the feeding mechanism to sequentially convey the magnetic ring inductors from left to right, the magnetic ring inductors are tested after being subjected to pin carding, and size detection is conducted through the size detection assembly in the conveying process.

The invention relates to the technical field of ICT testing, in particular to an efficient online ICT intelligent testing device which comprises a machine table, a tester is fixedly mounted at the top of the machine table, an air cylinder is fixedly mounted at the top of the tester, a mounting seat is fixedly mounted at the output end of the air cylinder, and limiting rods which are symmetrically arranged in pairs are mounted in the tester. A limiting rod is arranged at the top end of the mounting seat, a test board slides on the outer wall of the limiting rod, an air pump is fixedly mounted at the bottom end of the test board, a clamping mechanism for fixing a circuit board is arranged at the top end of the test board, and a pressure detection mechanism for detecting the circuit board is arranged at the bottom end of the mounting seat. The air inlet speed is automatically adjusted through the thickness of the circuit board, the circuit board is protected, pseudo soldering spots are accurately positioned through the air cylinder, the probe and the displacement sensor, the air cylinder is used for driving components to move, the welding spots with cracks are detected through vibration, and the detection efficiency and reliability are improved.

The invention relates to a large current tester for charging pile chip detection, which comprises a base and a cover body, and is characterized in that the top of the base is provided with a positioning mechanism for positioning a chip; a testing mechanism for detecting a chip is mounted at the bottom of the base, the testing mechanism comprises a testing plate and a plurality of probe modules electrically connected with the testing plate, each probe module comprises a heat conduction block, a connecting piece and probe elastic pieces distributed in an array, the connecting piece is sequentially connected with the heat conduction block and the probe elastic pieces in series, and the probe elastic pieces are electrically connected with the testing plate. The probe elastic sheet is arranged on the inner side of the heat conduction block to form a probe module; a pressing assembly for fixing the chip is arranged on the inner side of the cover body, and a control assembly for driving the pressing assembly to be close to the base is arranged at the top of the cover body. During testing, the probe elastic sheets are elastically deformed, stable contact between each probe elastic sheet and the corresponding pin can be guaranteed, the probe elastic sheets are distributed independently, it is guaranteed that the probe elastic sheets have high conduction efficiency in the detection process, and the stability and precision of large-current testing are guaranteed.

The invention relates to the technical field of bearing detection, in particular to bearing detection equipment for bearing production and processing. The speed measurement sensor is arranged on the top surface of one side of the test bench, is matched with the layout of the ball cylinder and is used for monitoring the rotating speed of the inner ring and the outer ring of the bearing; the clamping parts are arranged on the two sides of the partition of the test board respectively and used for fixing the positions of inner and outer rings of the bearing; and the switching parts are symmetrically arranged in the test board and are matched with the rotation of the turntable and are quickly switched so as to push the inner ring or the outer ring of the bearing to rotate for rotating speed test. Through the clamping part and the switching part which are operated together, the movement of the inner clamping plate and the outer clamping plate is controlled by utilizing different rotating directions of the turntable, so that the bearing is accurately clamped and fixed at different ring positions according to the detection condition, and then the turntable rotates to synchronously push the air pipe to change the position, so that the inner and outer ring detection of the bearing can be independently operated; therefore, more comprehensive bearing detection is achieved, and double improvement of simple and convenient operation and detection precision is realized.

The invention specifically discloses a method for evaluating the health state of a cigarette comprehensive test board, and the method comprises the steps: obtaining the fault type of the cigarette comprehensive test board, and carrying out the analysis of the fault type, so as to obtain the self degradation of equipment and the influence factors of the fault; carrying out fault influence factor analysis on influence factors of equipment degradation and faults, and carrying out numeralization on the influence factors; carrying out fault data acquisition and processing on the cigarette comprehensive test bench, structuring data of equipment faults, and further carrying out fault data expansion through a generative model GAN network; and a DNN deep neural network is constructed, training is performed by using the expanded fault data, and then fault probability evaluation is performed on the cigarette comprehensive test bench through the DNN deep neural network. According to the invention, the convenience and accuracy of health assessment of the cigarette comprehensive test board can be improved.

The utility model relates to an omni-directional impact performance test device for a backrest and a headrest of an automobile seat, which belongs to the technical field of automobile seat test devices and comprises a test board, an impact head, a height adjusting mechanism and an angle adjusting mechanism. The impact head exerts impact force on a backrest and a headrest of an automobile seat, the height adjusting mechanism drives the impact head to move up and down in a vertical plane so as to adjust the installation height of the impact head, the angle adjusting mechanism drives the impact head to rotate in the horizontal plane and the vertical plane, and all-directional impact resistance testing is conducted on the backrest and the headrest of the automobile seat. According to the utility model, the technical problems in the prior art that the application range of seat backrests at different inclination angles is limited, the test positions of the seat backrests and headrests are not comprehensive, and rapid and continuous tests cannot be carried out can be solved.

The invention discloses a test board and a test system, the test board comprises multiple types of board card interfaces, a test module, a switching module and a test controller, each board card interface comprises a clock pin, a data pin and a management pin, and a target board card to be tested is connected with at least one board card interface; the test module is connected with data pins of the board card interfaces; the switching module is connected with the test module and the clock pin of each board card interface; the test controller is connected with management pins of the board card interfaces, and the test controller is used for determining target board card interfaces connected with target board cards based on the management pins and controlling the switching module, so that a clock pin of one target board card interface is communicated with the test module, and a clock pin of the other target board card interface is communicated with the test module; and the test module is used for testing the interface function of the target board card based on the connected clock pin and the data pin of the target board card interface. And multiple types of board card interfaces are arranged, so that multiple types of to-be-tested target board cards can be compatible, and the test universality is improved.

The invention provides a diffuse reflection target plate. The diffuse reflection target plate comprises a substrate; a plurality of microstructures; wherein the plurality of microstructures are distributed on the substrate; the substrate has a first reflectivity, and the microstructure has a second reflectivity; the first reflectivity is different from the second reflectivity; the target reflectivity of the diffuse reflection target plate is related to the first reflectivity and the second reflectivity. According to the diffuse reflection target plate, reliable large-range reflectivity can be achieved, and the test requirement is met. By changing the specification and / or distribution mode of the microstructure, the duty ratio of the substrate can be adjusted, then the target reflectivity of the diffuse reflection target plate is adjusted, the reflectivity range from 0% to 100% is covered, and flexibility and reliability are achieved.

The invention provides a chip power consumption measurement system and method.The chip power consumption measurement system comprises a test board, a power consumption collection module and a control module, the control module sends task instructions to a chip to be tested, and the task instructions comprise any one or more of a voltage instruction, a frequency instruction and an operation core instruction; when the chip to be tested executes a task instruction, the power consumption acquisition module acquires voltage information of each test resistor and transmits the voltage information to the control module; the control module determines the test power consumption of the to-be-tested chip according to the voltage information. According to the technical scheme, the task instruction can be sent to the to-be-tested chip, any one or more of the working frequency, the working voltage and the number of the running cores of the to-be-tested chip can be changed, different use scenes can be simulated, power consumption measurement of the to-be-tested chip can be completed in different scenes, and the test power consumption of the to-be-tested chip can be accurately and rapidly obtained.

The invention provides a chip aging test system and method based on a field programmable gate array, and the system is characterized in that a drive control panel comprises a processor module, a communication interface module, and an external connector module; the external connector module comprises a first connector and a second connector; the processor module is used for receiving a test instruction sent by the upper computer through the communication interface module, generating a test signal and a control signal, and receiving a test result acquisition instruction sent by the upper computer after the communication interface module sends response information to the upper computer; the first end of the processor module is also used for sending the interrupt information to an upper computer through the communication interface module and displaying the interrupt information; and the third end of the processor module is connected with the second connector and is used for outputting the control signal to the test board. Test signals are output to multiple groups of tested chips of the test board in parallel through the first connector, the second connector controls the test sequence of the to-be-tested chips on the test board, and hundreds of chips are driven by a single drive board and used for aging test.

The invention relates to an SOC chip performance test device, method and equipment and a readable storage medium. In the device, an upper computer is used for sending an excitation instruction to a voltage simulator and sending a test instruction to a signal generator according to a test requirement; the voltage simulator is used for inputting a voltage excitation signal to the test board according to the excitation instruction; the signal generator is used for inputting a test signal to the test board according to the test instruction; the test board is used for conditioning the voltage excitation signal and the test signal and sending a first conditioning signal to the SOC chip to be tested so as to indicate the SOC chip to be tested to respond to the first conditioning signal; the test board is also used for acquiring a response signal returned by the SOC chip to be tested, conditioning the response signal, and returning a second conditioning signal to the upper computer; and the upper computer is also used for analyzing the second conditioning signal to obtain a performance test result. The SOC chip performance test efficiency can be improved.

The invention provides a test method for a CAF test module of a printed circuit board. The module test method comprises the following steps: S1, forming a test hole matrix on the printed circuit test board; s2, bonding pads are connected to the test holes, and the bonding pads are connected in an inclined mode through wires; s3, conducting wires are led out from each group of obliquely-arranged bonding pads at intervals, the conducting wires in the adjacent directions are connected in series, and the two testing wires are connected through an intersection point; s4, connecting the two test lines with test equipment respectively; the test module is not only suitable for a conventional through hole printed board, but also suitable for a high-density HDI board, the CAF-resistant test requirements of different hole wall distances are met by adjusting different hole diameters due to the fact that multiple groups of different hole center distances are covered, the distances are large enough, the selectable space is large for the test condition requirements of 500V and 1000V, and due to the fact that the number of test holes is increased, the test efficiency is greatly improved. And an inclined test combination is more harsh than a standard test, and is more persuasive for the reliability test of the high-performance printed circuit board.

The invention discloses an automobile shock absorber and a buffer test device thereof, and relates to the technical field of automobile shock absorbers, the automobile shock absorber comprises a shock absorber main body, one end of the shock absorber main body is provided with a mounting hole, and a position, close to the mounting hole, of the shock absorber main body is provided with a test positioning member; and the other end of the shock absorber main body is provided with a detachable detection top piece. The buffer test device of the automobile shock absorber comprises a test board, a sensing detection mechanism, a telescopic installation clamping piece and a simulation turntable mechanism. The simulation turntable mechanism drives the reciprocating screw rod to synchronously rotate in the rotating process, the reciprocating screw rod enables the matched screw rod sleeve to reciprocate, and the screw rod sleeve drives the linkage ring to transversely reciprocate, so that the linkage ring drives the distributed sliding bumps to slide relative to the simulation turntable mechanism through the first linkage rod to adjust the projection height; therefore, different-degree bumpy road surfaces can be automatically adjusted and simulated.

The invention relates to the field of instrument testing, and discloses pulse controller testing equipment, which comprises a signal simulation unit, a parameter acquisition unit, a gas circuit control unit, a main control unit and a test board, the signal simulation unit generates simulated dust concentration and pressure difference signals; the parameter acquisition unit is used for acquiring blowing interval time, duration time and output voltage signals in real time; the air path control unit provides compressed air with adjustable pressure through an air storage tank, a pressure regulating valve and a pulse valve driving module, and a pressure sensor and a flow sensor feed back signals in real time so as to adjust air path parameters. The main control unit controls the test process and judges whether the pulse controller is abnormal based on the collected data; the test bench realizes equipment fixation and connection through a clamp and an electrical / pneumatic port. The device calculates a comprehensive abnormal index through standardized parameters, supports multi-stage early warning and fault determination, and is suitable for automatic testing of the pulse controller.

A lower plunger of a pogo pin according to the present disclosure includes a metal pin and an electro-conductive rubber, and the electro-conductive rubber having a configuration in which a plurality of electro-conductive particles are contained in an elastic insulating material is attached to a lower end of the metal pin to increase a contact area between the lower plunger and a pad of a test board through a surface contact, thereby preventing the occurrence of inductive spikes and thus improving signal quality in a high-speed signal transmission environment.

The invention relates to the field of detection devices, and discloses a high-precision gas bearing static characteristic test board, which comprises an optical base, a gas bearing static characteristic test board and a gas bearing static characteristic test board, the detection table is arranged on the optical base; the suspension bracket is arranged on the optical base; the detection air cylinder is arranged on the suspension bracket, and the detection air cylinder is located right above the detection table; the air floating ball hinge is arranged at the driving end of the detection air cylinder; the pressure sensor is arranged at the bottom of the air floating ball hinge; the upper floating bearing plate is arranged at the bottom of the pressure sensor, and the upper floating bearing plate is used for being pressed on the detection table; and the laser interference measurement assembly is arranged between the lower surface of the floating bearing plate and the upper surface of the optical base and is used for measuring the displacement and inclination of the lower surface of the floating bearing plate. According to the invention, the partial static characteristics of the gas bearing can be accurately evaluated.

A chip testing device and a method of operating thereof is provided herein. According to at least one embodiment, the chip testing device comprises: a test board having at least one mounting surface; at least one chip socket located on one of the at least one mounting surface, wherein each of the at least one chip socket comprises: a positioning fixture mounted to the at least one mounting surface, the positioning fixture defining a mounting area for mounting a chip; a sliding cover that is slidably moveable between an open position and a closed position, wherein, in the open position, the mounting area is at least partially exposed to allow for mounting of the chip, and in the closed position, the cover overlays at least a portion of the chip and the positioning fixture.

The utility model discloses a temperature control water nozzle service life testing machine, and relates to the technical field of temperature control water nozzle service life detection. The temperature control water nozzle service life testing machine comprises a testing stand and a constant temperature water nozzle body, a fixing frame is fixed to the rear side of the top of the testing stand, a water supply pipe is embedded in the fixing frame, a water outlet pipe is arranged on the front side of the water supply pipe, a threaded sleeve is rotationally connected to the front end of the water outlet pipe and is in threaded fit with the constant temperature water nozzle body, and a hose is connected between the water supply pipe and the water outlet pipe. A screw rod is obliquely arranged on the inner side of the fixing frame, a movable block is arranged on the screw rod in a threaded mode, an elastic assembly is connected to the bottom of the movable block, a U-shaped frame is connected to the lower end of the elastic assembly, a pressing wheel is rotationally installed on the inner side of the U-shaped frame through a rotating shaft, and the pressing wheel is matched with a hose. By combining the elastic effect of the elastic assembly, the pressing wheel extrudes the hose, the size of the drift diameter of the hose is changed, the purpose of adjusting the water flow speed is achieved, the structure is simple, and use is convenient.

The utility model relates to the technical field of automatic assembling, and particularly discloses a test board assembling device which comprises a rack, an assembling mechanism, a storage mechanism and a mechanical arm, the assembling mechanism is provided with an assembling table, a ballast assembly and an assembling assembly, the assembling table can contain a main board and a test board, the ballast assembly is arranged on the assembling table, the storage mechanism is arranged on the assembling table, and the mechanical arm is arranged on the assembling table. The ballast end of the assembly component can ballast the mainboard, and the output end of the assembly component can push the test board to be installed in the mainboard so as to form a finished product; the storage mechanism is arranged on the rack, and the storage mechanism is used for supplying a carrier carrying a main board and storing a carrier carrying a finished product; the mechanical arm is arranged on the rack and used for moving the main board to the assembling table from the storage mechanism and moving the finished product to the storage mechanism from the assembling table. Through the arrangement, the labor intensity of workers is reduced; the damage probability of the test board and the mainboard is reduced; and waste caused by mistaken scrapping can be reduced.

The invention provides a semiconductor chip on-line test device, and particularly relates to the technical field of chip performance test.The semiconductor chip on-line test device comprises a test box, a main controller is installed at the top of one side of the test box, and a vertical heat insulation plate is fixedly arranged in the middle of an inner cavity of the test box; a test space is divided into a low-temperature test area and a high-temperature test area which are independent through a vertical heat insulation plate and a horizontal heat insulation plate, an annular groove is formed in the position, corresponding to the permanent magnet ring, of the top face of the horizontal heat insulation plate, two symmetrically-arranged permanent magnet blocks are arranged in the annular groove in a sliding mode, and the positions of the two permanent magnet blocks correspond to the position of the permanent magnet ring in an up-and-down mode. The test board can enter different temperature zones at the same time for synchronous test under the driving of the circular ring plate, the problem of temperature fluctuation caused by environment exposure during environment switching in the prior art is avoided, the temperature of the temperature zones does not need to be frequently adjusted, the stability of the test environment is ensured, and the test efficiency of the semiconductor chip is improved.

Disclosed is a test board which includes a substrate that includes a device under test (DUT) placement area where a first DUT and a second DUT are disposed, a first load switch connected in series with the first DUT and configured to be set to a switch on state or a switch off state based on a first enable signal, a second load switch connected in series with the second DUT and configured to be set to the switch on state or the switch off state depending on a second enable signal, and a test controller. The test controller may be configured to perform a test operation in a (1-1)-th mode by activating the first enable signal and deactivating the second enable signal and then perform the test operation in a (1-2)-th mode by deactivating the first enable signal and activating the second enable signal.

The invention discloses a switching power supply performance test device, which comprises a test board, an inner cavity is arranged in the test board, a driving device is fixedly arranged in the inner cavity, the upper end of the driving device penetrates through the inner cavity and extends to the upper end of the test board, and the driving device is located at the upper end of the test board and is connected with an adjustable test mechanism. An electric telescopic rod is fixedly installed at the upper end of the test table, the output end of the electric telescopic rod is close to the test mechanism, the output end of the electric telescopic rod is fixedly connected with a placement table, and the placement table is connected with an adjustable clamping mechanism. The invention solves the problems that the combination of the switching power supply and a connecting probe needs to be manually pushed to test each switching power supply, the connection probe is fixed and is difficult to adjust in height, and a base plate needs to be arranged below different switching power supplies to meet the combination of the probe and a switching power supply port; the input voltage, the output voltage and the current of the tested product cannot be visually displayed, and the test efficiency is low.