98 results about "Short-circuit test" patented technology

The invention provides a biphase composite magnetic material magnetically controlled reactor electromagnetic transient simulation method, device and equipment and a medium, and relates to the technical field of power equipment magnetic material testing and electromagnetic transient simulation. According to the invention, the test winding is arranged on the excitation winding of the magnetically controlled reactor, and multi-dimensional means of obtaining total iron loss through an open circuit test, obtaining magnetic hysteresis loss through a frequency reduction test, obtaining copper loss and leakage reactance through a short circuit test and the like are combined, so that separation of magnetic hysteresis loss, eddy current loss and additional loss can be realized; a high-fidelity hysteresis loop and a magnetic conductivity change rule are obtained, and the nonlinear characteristic and hysteresis response of the magnetic core can be accurately captured, so that the predictive capability of equipment performance and the sensing capability of an operation state are improved.

The utility model relates to the technical field of electronic testing, in particular to a test probe. The test probe is used for detecting a tested product, the test probe comprises a plurality of contact parts, the plurality of contact parts are located at one end of the test probe, and the plurality of contact parts can be contacted with the tested product at the same time. The contact area between the test probe and the tested product during the open and short circuit test is increased, and the good contact between the test probe and the tested product (such as an FPC extension socket) is realized, so that the high misjudgment rate of the open and short circuit test is improved, and the production efficiency of equipment is improved.

The invention relates to a quick open and short circuit test dichotomy between any points of an IC wafer disc. A wafer bonding pad test channel is established based on a case board card framework, a test point TP corresponding to a wafer bonding pad is connected to N test unit board cards through a switch matrix, a connector and a carrier, and a power supply and communication link is formed by a backboard and a core control board. Each test unit board card executes an in-board dichotomy test and uploads an in-board open / short circuit initial determination result; the core control board executes an inter-board dichotomy grouping test on each slot position to determine a target board card set; and the test points TP of any two target board cards are divided into blocks and are positioned to the minimum block, point-to-point scanning is executed in the minimum block, and an open-short circuit positioning result is output. The method gives consideration to the configurable number of board cards and the multi-layer bipartite convergence path, and is suitable for the rapid open-short circuit positioning scene of the high-order-of-magnitude wafer bonding pad.

The utility model relates to a conveying line square battery short circuit automatic detection device which is composed of a blocking and jacking positioning mechanism, a short circuit detection mechanism, a defective product removing mechanism and a classification caching mechanism, in the working process, a tray carries a square battery to a detection station, and after being blocked, the square battery is triggered to be jacked and positioned through photoelectric induction; the short-circuit detection mechanism is in contact with a battery through a probe, a PLC controls a short-circuit tester to complete detection, if a short circuit is found, the collaborative robot grabs defective products and places the defective products to the classification caching mechanism, and the tray is released after detection, the automation degree is high, safety accidents caused by the short circuit can be effectively prevented, the detection efficiency is greatly improved, the labor cost is reduced, and the reliability is high. An efficient and reliable solution is provided for short circuit detection of the square battery in the production, transportation and storage processes, and the method is suitable for the field of square battery production and logistics automation.

The present application belongs to the technical field of lithium ion battery detection, and particularly relates to a winding core short circuit test parameter optimization method, device and computer equipment. The winding core short circuit test parameter optimization method comprises the following steps: constructing a defect winding core sample library; taking voltage, plane pressure and test time as cooperative optimization parameters, performing full-factor experiments on the defect winding core sample library and normal control samples under different parameter combinations, obtaining a defect detection rate data set and a normal winding core damage rate data set; taking a defect detection rate not lower than a first threshold value and a normal winding core damage rate not higher than a second threshold value as an optimization target, determining an optimal parameter combination; and introducing the optimal parameter combination into a production line for trial operation verification, and determining final target test parameters according to a verification result. The present application solves the technical problems in the prior art, such as test parameter setting depending on experience, lacking systematic verification, not considering the key role of pressure parameters and being unable to balance high detection rate and zero damage rate.

In secondary batteries, this method efficiently performs short-circuit testing at locations with a high probability of short circuits. [Solution] The method includes the steps of: measuring a first surface temperature, which is the temperature of the end face of the electrode stack; connecting charge / discharge probes to the positive and negative terminals of the electrode stack and applying a current; measuring a second surface temperature, which is the temperature of the end face of the electrode stack when the current is applied; and determining whether or not a short circuit has occurred based on the difference between the first surface temperature and the second surface temperature.

An overhead line system short circuit test system comprises a short circuit connecting line, an installation device and an electric control device. The two ends of the short-circuit connecting line are connected with a contact line connecting mechanism used for being connected with a contact line and a rail connecting mechanism used for being connected with a rail respectively, the contact line connecting mechanism comprises a U-shaped line clamp and an insulation pressing block used for pressing the contact line on the inner side of the line clamp, and the insulation pressing block is connected with a power cylinder used for driving the insulation pressing block to move. The rail connecting mechanism comprises a clamping jaw used for clamping a rail, and the wire clamp and the clamping jaw are electrically connected with the short-circuit connecting wire. The installation device comprises a rail car used for transporting the short-circuit connecting line, and the rail car is provided with a lifting machine used for driving the contact line connecting mechanism to move and a medium supply mechanism used for providing a power medium for the power cylinder. The electric control device is used for supplying power to the test loop and monitoring electrical parameters. In the whole installation process of the short-circuit connecting line, a worker does not need to climb a line pole and a cantilever, the installation efficiency can be greatly improved, and danger is also avoided.

The utility model discloses a cylindrical battery external short circuit testing device, which comprises clamping plates (2) arranged at two ends of a battery (1), the inner sides of the clamping plates (2) are provided with fixing sleeves (3), the battery (1) is inserted in the fixing sleeves (3), the clamping plates (2) are provided with stabilizing pieces (8) for clamping the battery (1), the fixing sleeves (3) are internally provided with contact terminals (4), and the contact terminals (4) are connected with the fixing sleeves (3). One side, far away from the fixing sleeve (3), of the clamping plate (2) is provided with a power line (5) and a voltage temperature sensing measuring line (6) which are connected with the contact terminal (4); the position of the cylindrical battery (1) is limited through the fixing sleeve (3), the battery (1) can be stabilized and positioned through the stabilizing piece (8) and the fixing sleeve (3), the voltage and temperature sensing measuring line (6) can be directly connected with a multi-path thermodetector, voltage and temperature at the two ends of the cylindrical battery (1) can be effectively monitored, and failure analysis and research of the battery (1) are facilitated.

The utility model discloses a short circuit testing device for a patch aluminum electrolytic capacitor seat plate, which relates to the technical field of capacitor processing, and comprises a seat plate and a capacitor, the upper end face of the seat plate is fixedly connected with a testing needle, the lower end of the seat plate is fixedly connected with a charging wire, a detection wire and a discharging wire, and is electrically connected with the testing needle. The charging wires, the detection wires and the discharging wire are arranged in sequence, the number of the charging wires is two, the number of the detection wires is five, the number of the discharging wire is one, a detection group is arranged at the upper end of the base plate, a data detector is fixed at the end part of the base plate, and a material distribution mechanism is arranged on the base plate on the outer side of the discharging wire; the utility model discloses a short-circuit testing device for a patch aluminum electrolytic capacitor seat plate. By arranging the detection group, charging, detection and discharging processes can be carried out on the capacitor, defective capacitors are removed, and then the process is added in the processing procedure, so that the yield of capacitor products is higher.

The utility model provides a locomotive signal integrated lamp box short circuit testing device, which is characterized in that a first socket is provided with n wiring terminals, and the ith wiring terminal of the first socket is electrically connected to a first testing terminal of a resistance meter through a switch normally-open terminal of an ith relay of a first relay unit in a multi-path relay control module; a switch normally-open end of an ith relay of a second relay unit in the multi-path relay control module is electrically connected to a second test end of the resistance meter; the control end of the ith relay in the first relay unit is electrically connected to the ith control end in the first group of control ends of the MCU controller; the control end of the ith relay in the second relay unit is electrically connected to the ith control end in the second group of control ends of the MCU controller; and the control input end of the MCU controller is electrically connected with the output end of the key input module. Therefore, the technical scheme specially used for the short-circuit test of the locomotive signal integrated lamp box is provided.

An electronic device has a molded package (e.g., a quad flat no leads package) with attached connectors. The molded package includes one or more semiconductor dies and is pretested prior to attachment of the connectors. Along these lines, such molded packages may be pretested in parallel at high volume due to their relatively small form factor (e.g., at numbers several times greater than those for testing leaded socket assemblies). Following such pretesting, the connectors are attached to the pretested molded package (e.g., by directly fusing the connectors to metallic pads on surfaces of the packaged integrated circuit via laser welding or soldering). Such electronic devices may be further tested if desired (e.g., opens / shorts tested) and encased within housings to form larger modules (e.g., accelerometers, pressure sensors, etc.).

The invention discloses a packaging machine electric control box and junction box testing device and method, and belongs to the technical field of packaging machine testing. The device comprises a short circuit testing module, an external power supply module, a signal testing module and a man-machine interface industrial personal computer module; substation hot plugging, independent testing and multi-specification equipment compatibility are realized. The test method comprises the following steps: sequentially executing short-circuit test, signal test preparation, system initialization and to-be-tested specification selection, and then completing automatic self-diagnosis, parallel test and manual auxiliary test of digital quantity and analog quantity; the human-computer interface integrates the functions of progress marking, remote control screen switching and one-key testing. In order to solve the problems that a tested object is complex and multiple test points exist, high test efficiency is achieved through multiple means and functions such as signal self-diagnosis, test progress marking, multi-path parallel test and one-key test.

The invention provides a driving method and device for a short-circuit test of a power semiconductor device, and belongs to the technical field of semiconductor testing. The driving circuit is electrically connected with the secondary side of the isolated power supply circuit and is configured to trigger the device to be tested to execute a short-circuit test based on an external control signal; the isolated power supply circuit is configured to enter a stop working state during a short circuit test based on the external control signal; and providing a working power supply for the driving circuit during the short-circuit test by using the energy stored by the isolation power supply circuit before entering the working stop state. According to the technical scheme, the low-voltage side device in the driving device can be prevented from being damaged due to exposure to high-voltage and large-current conditions in the short-circuit testing process of the to-be-tested device.

The application relates to the technical field of measuring instruments, in particular to a megohmmeter with a protection function and a control method thereof. The megohmmeter with the protection function comprises a first control switch connected with an industrial control board and used for sending an open-circuit control signal to the industrial control board, a second control switch connected with the industrial control board, the industrial control board connected with a motor and a first controlled switch, the first controlled switch connected with two binding posts of a mechanical megohmmeter body, a power output end of the motor connected with a generator rotor of the mechanical megohmmeter body, and a power module connected with the industrial control board. The megohmmeter with the protection function can realize open-circuit and short-circuit tests without rotating the megohmmeter and operating a meter pen, so that the operation of the staff is simpler, the staff does not need to continuously shake and pay attention to the rotation speed, and the test safety is improved.

The invention relates to the technical field of sensing product testing, in particular to a super-large array packaging conductivity testing device which comprises a wafer testing table, an open circuit testing plate and a short circuit testing plate, an objective table is installed at the top of the wafer testing table, and a swing arm positioning seat is installed at the top of the wafer testing table and on the back face of the objective table. The outer wall of the swing arm positioning seat is provided with a test probe, the top of the wafer test bench and the back surface of the swing arm positioning seat are provided with a main control unit, and the outer wall of the main control unit is connected with the swing arm positioning seat through a test line. According to the super-large array packaging conductivity testing device, the open circuit testing plate and the short circuit testing plate in the device are used for testing the to-be-tested product, and the problems that an existing testing device and an existing testing method cannot directly point-contact the two ends for measurement, the accuracy of a testing result is poor, the efficiency is low, and the product is prone to being damaged are solved.

The invention belongs to the technical field of power devices, and provides a silicon carbide trench gate power device with a floating P-type ring and a preparation method thereof, and a chip, a P-type shielding region is formed at the bottom of a groove of an N-type drift region, and a gate dielectric layer is formed on the inner wall of the groove on the P-type shielding region. A plurality of P-type floating ring regions with the same width are arranged in regions on two sides of an N-type drift region, and the plurality of P-type floating ring regions on the same side are sequentially arranged towards a silicon carbide substrate along a P-type shielding region, so that a floating PN junction is formed, an electric field extends downwards towards two sides, the distribution range of a high electric field in the drift region can be expanded, the area of a space charge region is increased, and the performance of the device is improved. The saturation current of the device is effectively reduced, the endurance capability of the device under a short-circuit test is improved, and the reliability of the device is improved.

The invention relates to the technical field of new energy batteries, in particular to a battery short circuit degree calibration method and device, terminal equipment and a storage medium, and the method comprises the steps: carrying out the controllable external short circuit test of a plurality of preset resistance values on a target battery sample in a heat insulation environment, synchronously collecting the test data under each preset resistance value, establishing a calibration database according to the test data; in the same adiabatic environment, performing an acupuncture test on the target battery sample, and synchronously collecting battery voltage and adiabatic temperature rise data in the acupuncture process; calculating the real-time heat production power of the battery in the needling process based on the adiabatic temperature rise data; performing matching and inversion on the real-time heat production power and the calibration database to obtain equivalent external short-circuit resistance values corresponding to the same heat production power generated at each moment in the acupuncture process, and generating a time-varying curve of the equivalent resistance according to the moments and the corresponding equivalent external short-circuit resistance values. And quantitative evaluation of the short circuit degree in the battery is realized.

This invention provides a method and system for testing high-frequency transformer winding coils, relating to the field of high-frequency transformer technology. The method includes the following steps: generating a standard calibration signal matching the target test frequency range, connecting it to an unloaded test link, a short-circuit test link, and a standard impedance load link respectively; collecting noise signal characteristics of each link; and establishing a noise database and calibration coefficient table. Through sensing units deployed around the winding coil, the method non-contactly collects electromagnetic field change data during coil operation in real time. This invention addresses interference problems caused by cable parasitic inductance, environmental electromagnetic noise, and instrument noise in high-frequency scenarios through pre-calibration and adaptive anti-interference compensation mechanisms. By establishing a noise database, it achieves accurate noise matching. Combined with adaptive filtering algorithms and dynamic adjustment of the excitation signal, it significantly improves the testing accuracy of sensitive parameters such as leakage inductance and distributed capacitance, ensuring test reliability.

This application discloses a display panel, a short-circuit testing method for the display panel, and a display device, relating to the field of display technology. The display panel includes: multiple first data lines located in a first display area and electrically connected to first pixel units in the first display area; multiple second data lines located in a second display area and electrically connected to second pixel units in the second display area; multiple first pads and multiple second pads located in a non-display area, with the multiple second pads distributed among the multiple first pads in a first direction; a first fan-out line electrically connected between the first data lines and the first pads; a second fan-out line electrically connected between the second data lines and the second pads; a first type of test terminal electrically connected to the first data lines via a first test control module; and a second type of test terminal electrically connected to the second data lines via a second test control module. According to the embodiments of this application, short circuits in the fan-out lines of the conventional display area in a reverse-order FIAA display panel can be detected.

The application provides a test device, comprising a plurality of card slots, the plurality of card slots comprising a first card slot, a second card slot and a third card slot; each card slot has an interface electrically connected with a corresponding pin of a storage card to be tested; the first card slot is provided with a first detection circuit for detecting whether an upper clamping diode of a signal pin of the storage card is normally turned on; the second card slot is provided with a second detection circuit for detecting whether a lower clamping diode of the signal pin of the storage card is normally turned on; the third card slot is provided with a third detection circuit for detecting whether the signal pin of the storage card is internally short-circuited to the ground; the circuit topologies of the first detection circuit, the second detection circuit and the third detection circuit are different from each other. Each defective storage card only needs to be respectively inserted into the card slots with different test functions, so that whether the storage card is damaged can be judged. The open circuit and short circuit test of the defective storage card is performed through the test device provided by the application, and the test efficiency is greatly improved.

A test socket for integrated circuit (IC) testing and a method of manufacturing the test socket are provided. The test socket includes an insulating support structure having a plurality of through holes and a plurality of elastic conductive columns. These conductive columns are partially embedded in the support structure and extend through the through holes to accommodate variations caused by IC package warpage and tolerances in BGA solder ball dimensions. The insulating support structure further includes grooves located adjacent to the through holes, which enhance the compressibility and heat dissipation capability of the test socket. The conductive columns themselves have an elastic structure, with at least a portion of their surfaces covered by an insulating material layer to prevent short circuits. The test socket also features a rigid support frame—made of polyimide, PCB material, or ceramic—and a soft support frame made of silicone, offering both durability and flexibility.

This invention discloses a semiconductor open / short circuit tester. The invention utilizes two multiplexers. One multiplexer's multiplexing terminal is connected to the Force signal of a parameter measurement unit channel, and the other multiplexer's multiplexing terminal is connected to the Sense signal of the same channel. The multiplexing terminals of the two multiplexers are connected sequentially to the corresponding test channels. The two multiplexers can be controlled independently or used in pairs. When controlled independently, each multiplexer can select different test channels. When used in pairs, both multiplexers simultaneously select the same test channel, effectively short-circuiting the Force and Sense signals of the selected channel. This enables remote SENSE, compensating for errors caused by cable and line voltage drops, resulting in more accurate voltage output and measurement. This improves the performance of the tester when test channel resources are plentiful and high voltage measurement accuracy is required.

The utility model discloses a short -circuit test mechanism belongs to electric core processing technical field. It includes: frame, rotating arm, middle part rotation installation is in frame, first fixed plate, slidingly arranged in frame, and first fixed plate is installed with first probe, first connecting rod, one end rotation connection with first fixed plate, and the other end rotation connection with one end of rotating arm, second fixed plate, slidingly arranged in frame, and second fixed plate is installed with second probe, second connecting rod, one end rotation connection with second fixed plate, and the other end rotation connection with the other end of rotating arm. Through drive rotating arm rotation, make first probe and second probe synchronous each other close and contact electric core both ends, carry out short -circuit detection to electric core. The movement of two probes is not easy to interfere, thereby shortening the time of short -circuit test mechanism movement, and the time and intensity that electric core both ends are contacted by probe can not exist difference because of the non -uniform of power source, prevent electric core to appear damage or short -circuit detection inaccurate situation.

The utility model relates to transformer short circuit technical field, concretely relates to a portable transformer short circuit release equipment including mounting panel, the lower end fixedly connected with a plurality of electric cylinders of mounting panel, the piston end of a plurality of electric cylinders all movably penetrates the upper end of mounting panel, and the piston end of a plurality of electric cylinders all is fixedly connected with pressure sensor, when needing to carry out short circuit test, start electric cylinder and make its piston end move upwards, synchronously drive pressure sensor, insulating isolation plate, a plurality of insulators, copper bar, mounting bracket and abutting block move upwards, abutting block and electrically conductive rod are pressed down, make electrically conductive rod finally with copper bar contact, subsequent current passes through abutting block, electrically conductive rod and copper bar contact and forms the passage, completes the short circuit test of transformer. After short circuit test, through control electric cylinder resets downwards can realize quick release process. Through above -mentioned design, improve the security, convenience and the degree of automation of entire short circuit, release process of test, reduce the hidden danger that test brings to test personnel.

The utility model relates to cylindrical lithium ion battery, specifically relates to a cylindrical battery of improving external short circuit performance, including cylindrical pole group, positive current collecting piece, steel case and cap, and the middle part of the positive pole end of cylindrical pole group is convex and forms the connecting portion, and the positive current collecting piece includes the current collecting disc setting in the positive pole end of cylindrical pole group, and the connecting portion is inserted into the connecting groove of the lower end surface setting of current collecting disc, and the cylindrical pole group and current collecting disc set up in the steel case and are fixed by the rolling groove of steel case, and the insulating spacer is arranged between the rolling groove lower side of steel case and current collecting disc, and the cap sets up in the positive pole end of steel case, and the cap has the explosion -proof structure and the sealing ring of cap extends to the rolling groove department of steel case, the cylindrical battery of the utility model, through optimizing the structure design and assembly mode of each part of electric core, effectively reduce the heat generation of battery external short circuit, increase the heat dissipation area, thereby the performance of battery in external short circuit test is improved significantly, and the security of battery use is improved.

The utility model relates to the technical field of battery testing, and discloses a battery short circuit testing device which comprises a testing box, a dust collection mechanism and a driving mechanism. The test box comprises a box body and a box door, the box body is provided with an accommodating cavity for accommodating a battery, the box body is rotatably connected to the box body, and the box body is provided with an air inlet hole and a pressure relief hole which are communicated with the accommodating cavity; the dust collection mechanism comprises a dust collection cover and a dust collection pipe; the driving mechanism is connected to the dust collection cover and can drive the dust collection cover to move, so that the dust collection cover covers the pressure relief hole; according to the battery short circuit testing device provided by the utility model, through the cooperation of the dust collection cover, the dust collection pipe and the air inlet hole, the rapid replacement of air in the accommodating cavity can be realized, the smoke dust in the accommodating cavity can be rapidly and thoroughly exhausted, the recording and observation of the testing process are facilitated, and the accurate acquisition of key data is facilitated.

The application provides a kind of SOC platform-based image sensor pin open short test method and system, host computer sets the output parameter of the output channel of excitation module and corresponding image sensor to be measured and is issued to control module;Control module identifies each pin of image sensor to be measured through switch module;Control module controls each output channel of excitation module respectively polls corresponding image sensor pin to be measured and executes open short test: control module configures the excitation source of excitation module, so that excitation module outputs positive excitation and reverse excitation;Control module connects test pin with excitation source or ground through switch module, controls non-test pin to be grounded or suspended or connected with excitation source;Voltage detection module real-time acquisition voltage signal of test pin and feedback to host computer through control module;Host computer judges whether open short circuit or not.The application effectively improves the detection efficiency and precision of image sensor pin open short test.

The utility model discloses a full-automatic shell entering machine which comprises a rack, a turntable device, a shell feeding device, a battery cell feeding device, a battery cell pressing-in device, a guide pin shaping device, a short circuit testing device, a defective product discharging device, a defective product material box and a non-defective product discharging device, the rotating disc device, the shell feeding device, the battery cell feeding device, the short circuit testing device, the defective product discharging device, the defective product material box and the non-defective product discharging device are all arranged on the rack, and the shell feeding device, the battery cell feeding device, the short circuit testing device, the defective product discharging device and the non-defective product discharging device are sequentially arranged around the rotating disc device. The battery cell press-in device and the guide pin shaping device are both arranged on the turntable device and located between the shell feeding device and the short circuit testing device, a battery mounting seat is arranged on the turntable device, and a mounting groove is formed in the top end of the battery mounting seat. According to the utility model, the labor intensity of workers is reduced, the production efficiency is improved, and the production cost is reduced.

This application discloses a method, system, and photovoltaic inverter for locating photovoltaic string grounding faults. The method includes the following steps: installing protection circuits to cut off faulty circuits in each MPPT; detecting the ground insulation impedance of the common-side DC bus of the inverter system; if the ground insulation impedance of the common-side DC bus is less than a preset insulation impedance threshold, a photovoltaic string grounding fault is determined to have occurred; when a photovoltaic string grounding fault is determined to have occurred in the inverter system, the inverter system is first shut down, and then short-circuit tests are sequentially performed on each MPPT to locate the faulty photovoltaic string. The system is used to implement the above method. The photovoltaic inverter includes the above system. Beneficial effects: When a short-circuit test is performed on one MPPT, the photovoltaic strings of other MPPTs are isolated by their respective protection circuits, preventing shunting interference to the MPPT branch currently performing the short-circuit test, thus ensuring accurate location.

The utility model relates to the technical field of power supply chip testing, in particular to a test fixture for verifying short circuit and overcurrent of a power supply chip. Comprising a PCB which is provided with a power supply chip seat used for installing a power supply chip to be tested; the power supply chip seat is provided with six pins, one pin is a power supply input pin, is connected with the first terminal J1, and is connected with filter capacitors C1 and C2 in a circuit, and the other ends of the filter capacitors C1 and C2 are grounded and are used for providing a stable input power supply. The utility model provides a rapid and simple power supply chip overcurrent and short circuit test scheme, materials can be verified in advance, and the risk of damage to an equipment board caused by the fact that the power supply chip needs to bear overcurrent and short circuit current when the performance of the power supply chip needs to be verified after the power supply chip is loaded on the board in the research and development design stage is avoided.