588 results about "Short-circuit test" patented technology

The invention relates to a liquid crystal display capable of eliminating residual image after shutdown, which comprises a liquid crystal display panel, a scanning driving circuit and a data driving circuit. The liquid crystal display panel includes a pixel array, a short circuit test circuit and a control unit. The scanning driving circuit is used to scan the liquid crystal display panel, and the data driving circuit is used to provide gray scale voltage to the liquid crystal display panel when the liquid crystal display panel is scanned. The control unit and the short-circuit test circuit constitute a discharge circuit. When the liquid crystal display is powered off, the charges stored in the liquid crystal display panel are quickly released through the discharge circuit.

The invention relates to a method for recognizing parameters of asynchronous motor. The stator resistance of motor is measured by a method of DC volt-ampere. The rotor resistances as well as leakage inductance of stator and rotor of motor is obtained by short circuit test. Mutual inductance of stator and rotor of motor can be taken from method of no-load test. Compensating voltage drop in on state, switch time delay and dead time raises the accuracy and stability of recognized parameter. The resistance values of rotor at frequency of rating sliding difference are calculated by method of two points through test of locked rotor at two frequencies. Since skin effect is overcome, the resistance values of rotor are accurate enough so as to meet the requirement of vector control system completely.

The invention relates to a test sorting machine for a battery product and a sorting method for the test sorting machine. The test sorting machine comprises a feeding device, a short circuit test sorting device, a station turntable, a leakage test device, a leakage test sorting device, a weighing device, a weighing taking device and a weighing sorting device, wherein the leakage test device is arranged on a table-board of one side of a leakage test station; the short circuit test sorting device is arranged on a working table-board of one side of a short circuit test qualified product placement station; the feeding device and a short circuit placement region are arranged in front of the short circuit test sorting device; the leakage test sorting device is arranged on one side of a leakage test taking station; a leakage test unqualified product placement region and a leakage test qualified product conveying chute are formed on a working table-board of the front side of the leakage test sorting device; the weighing device is arranged at the outlet end of the leakage test qualified product conveying chute; the weighing taking device is arranged on the front side or the rear side of the weighing device; and the weighing sorting device is arranged on one side between the weighing device and a conveying device. The test sorting machine can perform multi-detection and sort batteries of different standards at the same time, so the working efficiency is high.

The invention provides an open circuit short circuit test device and an open circuit short circuit test method of a chip base pin. The test device comprises at least one test board card, wherein a main control chip group and a base pin measuring unit array are arranged on each test board card, the base pin measuring unit array receives control signals output by the main control chip group and comprises a plurality of base pin measuring units, a channel switching switch array is also arranged on the test board card, the channel switching switch array comprises a plurality of channel switching switch units, a channel interface is also formed in the test board card, the channel interface comprises a plurality of test passages, each channel switching switch unit can be used for switching more than two test passages for testing, and the test passages of one base pin measuring unit are switched by each channel switching switch unit. The test method belongs to a method for testing the base pin of a chip by adopting the method. The device and the method provided by the invention have the advantages that the base pin of the chip can be fast tested, in addition, the size of the test device is small, and the test cost is low.

This invention relates to chip pin switch or short circuit test machine, which comprise the following: chip socket; positive or negative current generator circuit to provide positive or negative current to the chip pin; multi-path switch control circuit to control the rest chip pin ground connection; voltage extraction circuit to extract the output voltage from the chip pin; threshold voltage generation circuit to generate positive or negative threshold voltage; voltage comparer to compare the pin output voltage and threshold voltage and to output comparison results; control circuit to whole control the above circuit; display device to receive the signals of the above control circuit and to display the output signals.

The invention discloses a synthesis loop for the running test of a converter valve for a direct current power transmission project. The loop comprises a high-voltage power distribution system, a current source subsystem, a voltages source subsystem, an impact test subsystem, a short-circuit test subsystem, an alternating current filtering subsystem, a control protection system and an auxiliary system, wherein the auxiliary system comprises a low-voltage power distribution system, a water cooling system and a test parameter measuring system. The subsystems are integrated into one loop through reasonable circuit design, so the subsystems can be matched with one another to perform the running test of the converter valve; the loop has a simple structure and runs stably; and due to the control protection system, the running safety of the whole synthesis loop can be ensured, the service life of equipment is prolonged and failure rate is reduced. The synthesis loop can meet the requirement of the running test of the converter valve for the direct current power transmission project of + / -800kV / 5000A and below; and tests prove that the synthesis loop can completely meet the requirement of all running test projects of a high-voltage direct current power transmission thyristor valve in the IEC60700-1:1998 / GB / T 20990.1-2007 standard.

Disclosed is a matrix type printed circuit board (PCB) for semiconductor packages having a structure including a plurality of PCB units arranged in a matrix array having at least two rows in such a fashion that the mold runner gates of adjacent PCB units respectively arranged in adjacent rows while being arranged in the same column communicate with each other by an integrate mold runner, thereby being capable of allowing an increased number of PCB units to be simultaneously processed in each process involved in the fabrication of semiconductor packages, so that a great improvement in productivity is achieved. In particular, it is possible to allow an increased number of PCB units to be simultaneously molded in a resin encapsulate molding process, thereby achieving a great improvement in the efficiency of the resin encapsulate molding process. Furthermore, surplus encapsulating resin materials cured in the mold runner gates and integrate mold runners can be easily and reliably removed in accordance with a degating and / or deculling process without a surface damage of the PCB. It is also possible to achieve an easy open / short circuit test for individual PCBs.

The invention relates to a method for on-line detecting the faults of photovoltaic cells in a solar photovoltaic power station. Two controllable switches are respectively connected in series and parallel with the output ends of each cell module in a photovoltaic cell module matrix. A short-circuit current sampling resistor is connected in series with the branch of the parallel controllable switch, and a remote control system controls the two controllable switches of each solar photovoltaic cell, carries out short-circuit test and detection on each cell module needing to be tested, acquires the short-circuit current of the photovoltaic cells by means of the short-circuit current sampling resistors, and judges whether the cell modules have faults according to the short-circuit current. The method can diagnose the faults of one or more photovoltaic cells already mounted in the photovoltaic power station, and also can carry out timed tour inspection, the detection time is short, and the safety of the solar photovoltaic power station system is greatly enhanced.

The invention provides a method and a device for testing an HDMI (High Definition Multimedia Interface). The testing method includes the steps of connecting the testing device to a to-be-tested HDMI, wherein a plurality of control ports of a controller of the testing device are in tandem connection with a resistor through a drive circuit and then respectively connect to all differential signal pins in the HDMI, and an analog-digital converter is connected between the differential signal pins and the controller; outputting high level by each control port, detecting voltage values of every differential signal pin by the analog-digital converter and outputting the voltage values to the controller, and determining whether poor soldering or continuous soldering exists on each differential signal pin by the controller according to the voltage value of each differential signal pin. In the invention, the shortcomings of functional testing method can be made up by an open short circuit testingmethod and reading data from an EDID memory. The method and the device in the invention have advantages of convenient implementation and wide application.

An inventive method in an integrated circuit (IC) manufacturing process for using data regarding repair procedures conducted on IC's at probe to determine whether any further repairs will be conducted later in the manufacturing process includes storing the data in association with a fuse ID of each of the IC's. The ID codes of the IC's are automatically read, for example, at an opens / shorts test during the manufacturing process. The data stored in association with the ID codes of the IC's is then accessed, and additional repair procedures the IC's may undergo are selected in accordance with the accessed data. Thus, for example, the accessed data may indicate that an IC is unrepairable, so the IC can proceed directly to a scrap bin without having to be queried to determine whether it is repairable, as is necessary in traditional IC manufacturing processes.

A technique for determining inductive and resistive components of power line impedance. A measurement circuit switches a burden or drain resistor between power line conductors to cause a droop or sag in a voltage waveform. The voltage waveform is sampled prior to inclusion of the resistor in the circuit, as well as after to identify the droop. The short circuit between the power lines is then removed by opening the circuit and a capacitor in the test circuitry causes a resonant ring due to the inductive component of the power line impedance. Based upon the period or frequency of the resonant ring, and upon the voltage measurements with and without the resistor in the circuit, the inductive and resistive components of power line impedance can be computed.

The invention provides an on-line monitoring method of distribution transformer turn-to turn short circuit. The on-line monitoring method includes the following steps: under the no-load condition, voltage and currents of the high-pressure side of a transformer are obtained, and voltage and currents of the low-pressure side of the transformer are obtained; real-time power losses are obtained according to the voltage and the currents of the high-pressure side and the voltage and the currents of the low-pressure side; the real-time power losses are judged whether to be larger than power losses or not when the transformer works normally; if so, a first alarm signal is sent out, and if not, the first alarm signal is not sent out; and the first alarm signal is uploaded to a control center. The invention provides an on-line monitoring device of the distribution transformer turn-to-turn short circuits. The on-line monitoring device of the distribution transformer turn-to turn short circuit can carry out on-line monitoring in real time and detect failures of the transformer turn-to-turn short circuit timely. Engineering practices are relatively simple, and obvious influences on an original system and structure can not occur.

The invention provides a method for testing capacitive touch screens, comprising a novel method for integrated circuit (IC) function test, power consumption test, short circuit test and open test. The invention also provides testing equipment for capacitive touch screens, comprising a screen testing plate and a circuit detecting plate. The screen testing plate comprises a metal cylinder and a screen positioning groove; the metal cylinder is closely pressed against the screen testing plate and two ends of the metal cylinder are respectively placed at two sides of the screen positioning groove; the circuit detecting plate comprises a power supply module, a liquid crystal display (LCD) display module, a power consumption detecting module, a testing plate connecting terminal, a microprogrammed control unit (MCU) control module and an IC chip module. The testing plate connecting terminal is connected with a testing interface of the screen testing plate. The method and the equipment which integrate the short circuit test, the open test, the IC function test and the power consumption test can be used for detection of multiple performances and lines of capacitive touch screens; and the metal cylinder is used for simultaneous one-time detection for a row of sensors, which greatly enhances detection efficiency.

A battery internal short circuit test device comprises a battery, at least one deformation component and a heating device. The deformation component is arranged inside the battery and comprises at least one deformation portion, wherein the deformation portion has at least one tip end. The deformation component has a trigger temperature, and when the temperature of the deformation component is equal to or higher than the trigger temperature, the deformation portion deforms to the direction where a diaphragm of the battery locates and the at least one tip end is allowed to pierce through the diaphragm, and thus the battery internal short circuit is triggered. The heating device is arranged outside the battery at the position corresponding to the deformation component. The heating device is used for carrying out fixed point local heating on the battery to enable the temperature of the deformation component to reach the trigger temperature. The invention also provides a trigger method of the battery internal short circuit.

The invention proposes an electric vehicle battery short circuit test bench with a remote control function, and a method, and belongs to the technical field of new energy automobile safety. The test bench comprises an upper computer, a short-circuit triggering controller, a temperature measurement circuit, a voltage measurement circuit, a current measurement circuit, a temperature control box, a battery protection box, an electromagnetic relay, a current sensor, a temperature sensor, a battery pack, and an electronic load. The test bench has functions of multipoint temperature measurement and remote control, and the upper computer monitoring system is remotely connected with the short-circuit triggering controller through a CAN bus, and controls the electromagnetic relay to trigger a battery short circuit fault. The test bench can achieve the short-circuit testing of a power battery pack under different working environment temperatures, and records the changes of all electric characteristics and temperature characteristics. An infrared temperature measurement instrument carries out real-time monitoring of thermal distribution, and provides a good basis for the research of the electric characteristics of a power battery in a short-circuit process.

Various systems and methods for device configuration are disclosed herein. For example, some embodiments of the present invention provide high speed pin continuity and pin-to-pin short tester circuits. Such circuits include a threshold driver, a test driver, and a comparator. An input of the threshold driver is electrically coupled to a voltage threshold, and an output of the threshold driver is electrically coupled to a test pin node via a current limiting resistor. An input of the test driver is electrically coupled to a drive data input, and an output of the test driver is electrically coupled to the test pin node. One input of the comparator is electrically coupled to the test pin node, and the other input of the comparator is electrically coupled to a threshold comparator input.

The invention provides a circuit breaker breaking capacity evaluation method based on a full current equivalence principle, which belongs to the field of power grid safety stability and control. A concept of a full current effective value is introduced to evaluate the energy released by arcs of the circuit breaker during an arc extinguishing process; when short circuit happens to the power system, the short circuit current contains a periodic component and a DC component, a short circuit point DC component decay time constant in an actual operation working condition is solved; if the constant exceeds a circuit breaker standard decay time constant, evaluation on the circuit breaker short circuit current breaking capacity is carried out through a full current effective value equivalence principle in the circuit breaker actual operation working condition and a standard operation working condition; and finally, through comparing the circuit breaker breaking capacity and the short circuit current in the actual working condition, risk points existing in operation of the power grid are found out. The short circuit current actual breaking capacity of each type of circuit breakers can be effectively evaluated, and basis is provided for short circuit current suppression measure making and circuit breaker model selection in the power grid.

The invention relates to a test system for a central processing unit (CPU) module. The system comprises a computer test host and a test device of the CPU module, wherein the computer test host accesses a CPU state register on the to-be-tested CPU module and executes test programs due to the fact that a universal serial bus (USB) data line penetrates through the test device of the CPU module. The test device of the CPU module comprises a test interface of the CPU module, USB debugging sub-interface, a power control circuit, a USB main interface test circuit, an external expansion bus test circuit, an input / output (IO) test circuit, an Ethernet interface test circuit, and a clock backup power test circuit. The test system not only achieves a test for quality of the CPU module, but also can locate specific faulty lines and chips. By means of the power control circuit, delayed electrifying protection of the to-be-tested CUP module and a power short circuit test can be achieved, and therefore hot plugging in the test process is achieved. The whole test system is simple in structure and convenient to operate.

The invention discloses a portable aviation cable fault test system comprising a host and an adapter cable, an intelligent shorting module and a remote control work station which are connected with the host. The host is provided with a main control panel, a touch control human-computer interaction module, a test mode switching and A / D acquisition board, an open circuit / short circuit test module, a high-precision TDR fault locating module, an element parameter test module and a digital channel switching module. The main control panel receives the operation instruction of the user and the remote control work station to control all the modules to perform measurement operation. The human-computer interaction module and the test mode switching and A / D acquisition board are connected with the main control panel. The open circuit / short circuit test module, the fault locating module and the element parameter test module are connected with the test mode switching and A / D acquisition board. The channel switching module is connected with the open circuit / short circuit test module, the fault locating module and the element parameter test module. The adapter cable is connected with the digital channel switching module of the host.

The invention discloses a generator terminal potential transformer inter-turn short circuit on-line identification method. The generator terminal potential transformer inter-turn short circuit on-line identification method includes the following steps that: main transformer high-voltage side zero sequence voltage, factory transformer low-voltage side zero sequence voltage and generator neutral point zero sequence voltage are measured, fundamental wave effective values of the main transformer high-voltage side zero sequence voltage, factory transformer low-voltage side zero sequence voltage and generator neutral point zero sequence voltage are calculated respectively; the value of insulation resistance against ground of a stator winding is calculated through utilizing an injection type stator grounding protection principle; and when the fundamental wave effective value of the generator neutral point zero sequence voltage is larger than a stator grounding protection action constant value, and the fundamental wave effective values of the main transformer high-voltage side zero sequence voltage and the factory transformer low-voltage side zero sequence voltage are both lower than the constant value, and the value of the insulation resistance against ground of the stator winding is not decreased, it judges that a generator terminal potential transformer inter-turn short circuit occurs, and warning is performed after time delay, and a fundamental wave zero sequence voltage stator grounding protection sensitive section is blocked. The generator terminal potential transformer inter-turn short circuit on-line identification method of the invention can accurately judge generator terminal potential transformer (PT) inter-turn short circuit faults, and therefore, misoperation of stator grounding protection when the short circuits occur can be effectively prevented, and troubleshooting time can be greatly reduced.

The invention discloses a high-voltage electric debugging method for power generation projects. The high-voltage electric debugging method comprises of the steps of debugging preparing, high-voltage equipment static testing and debugging, generator static testing and debugging, potential transformer (PT) nuclear phasing, starting testing, dynamic orientating and power generation grid connecting. Compared with the conventional debugging method, the debugging method is adopted, so that the speed of a high-voltage cabinet static test is high; the accuracy and the efficiency of the test are improved; the destroy to the cable in the conventional test is reduced; proper short circuits are selected for the test, and a differential test of a generator is carried out while a short-circuit test is carried out. In addition, a dynamic orientation method is adopted, so that the reliability and the security of the grid connecting are further improved; the working efficiency is high; the working period can be obviously saved; the manpower cost is saved; the debugging efficiency and the debugging quality are improved; and a whole process of the debugging work is in a safe, quick and excellent controlled state, so that the method is stable in operation, and high in accuracy, and safe and reliable.

The invention provides a short circuit current exceeding auxiliary decision method based on node impedance sensitivity which includes the following steps: obtaining on-line data or off-line data, obtaining connecting relation with a physical bus, arranging power grid and breaking current and short circuit current reducing measure at a priority level; calculating open circuit voltage and short circuit current of a fault point, determining and warning a short circuit current exceeding point within the scope of power grid; as to an exceeding bus, searching measures of reducing the short circuit current; calculating the node impedance sensitivity of each measure of reducing the short circuit current and sorting measures of reducing the short circuit current; forming and verifying the short circuit current exceeding auxiliary decision method. The short circuit current exceeding auxiliary decision method based on the node impedance sensitivity is achieved based on current limiting measures capable of changing the electric power network structure. If short circuit current exceeding exists under the current operation mode, factory stand connection mode, lines and running state of a unit are automatically analyzed, and auxiliary decision and advice are provided.

The invention relates to a lithium ion battery technology field, in particular to a safe lithium ion battery, improvement method and the manufacturing method of its anode strip. The inventive method of improving the lithium ion battery safety is to raise the facial resistance of the anode strip, and to reduce the thermal conductivity of the anode strip, namely to cover a metal oxide material membrane layer on the anode strip surface of the lithium ion battery for raising the facial resistance of the anode strip and reducing the thermal conductivity of the anode strip. Use of the invention can raise the facial resistance of the anode strip, so after of the cathode current collector is in short circuit with the anode diaphragm, the resistance is greater, its current is smaller, resulting in a reduction of the produced, thereby the manufactured battery may easily pass through the short-circuit test, and the safety factor reaches the standard. At the same time the film layer formed by adopting the metal oxide, has a better hole for passing through lithium ions in its material interior structure, without any influence on the electrochemistry performance of the battery. The lithium ion battery that adopts this invention has a higher safety than the safety performance of the ordinary lithium ion battery.

A DC-DC converter is compose of an overcurrent cut-off means connected in series to a direct power source, primary windings of a plurality of transformers connected in series to the overcurrent cut-off means, a switching element connected in series to the overcurrent cut-off means and secondary windings of a plurality of transformers connected in parallel with each other. According to the DC-DC converter, a voltage induced on the secondary windings are rectified and smoothed by a first rectifying and smoothing circuit to output the smooth direct voltage to a load. When a short-circuit test is carried out for one of the primary windings, the overcurrent cut-off means cuts off an overcurrent flow.

The invention provides a flexible direct current power transmission converter performance testing platform and a control method thereof. The direct current side of a first modularized multi-level converter and the direct current side of a second modularized multi-level converter are connected in a back-to-back mode, and three phases of the alternating current side of the first modularized multi-level converter are connected with three phases of the alternating current side of the second modularized multi-level converter correspondingly, so that a power circulation pathway is formed; a test power source is in parallel connection with the direct current side of the first modularized multi-level converter and the direct current side of the second modularized multi-level converter and provides loss power for steady-state operation testing; a short circuit generator is in parallel connection with the direct current side of the first modularized multi-level converter and the direct current side of the second modularized multi-level converter. According to the testing platform and the control method thereof, the requirement for power grid capacity is low; meanwhile, the direct current side power supply mode is adopted in the testing platform, and therefore the single test power source is adopted for the whole platform. With regard to test items of the short circuit and over-current turn-off required by IEC standards, due to the fact that the basic structure of the platform is basically the same with that of practical engineering, the short circuit test and the over-current turn-off test can be set through the platform according to double-pole short-circuit faults in a practical flexible direct current power transmission system.

A display device includes a substrate, one line on the substrate, the one line extending from a peripheral region through a display region, pixels on the display region, the pixels being connected to the one line, an outer line on the peripheral region, the outer line being connected to the one line during a short circuit test process that detects a position of a short circuit defect, an electrostatic protection resistor on the peripheral region, the electrostatic protection resistor being connected to the outer line, a pad on the peripheral region, the pad being connected to the outer line through the electrostatic protection resistor, a short circuit test signal being applied to the pad during the short circuit test process, and a bypass line connecting a node between the pad and the electrostatic protection resistor to the outer line.

This invention puts forward a boosting converter for driving semiconductor devices such as LED including: a supply end for receiving DC supply, a driving output end for providing driving supply to the semiconductor light emitting device, a switch component and a synchronous component, the switch states of which are opposite and matched to each other to adjust the driving supply and a short circuit test device to test if the light emitting device is at the short circuit state, if so, the synchronous switch component and the switch component are closed at the same time.

The invention discloses a failure analysis system, and relates to the technical field of integrated circuit failure analysis. According to the failure analysis system, a testing process and testing conditions are written in a single-chip microcomputer, and then the single-chip microcomputer is used for controlling and realizing dynamic hotspot analysis of a chip, wherein the dynamic hotspot analysis process comprises various loop tests including a power source short circuit test, various electric leakage tests, a functional test and the like. In this way, a testing machine does not need to be moved frequently, and the performance of the testing machine will not be affected.

The present invention relates to an apparatus, unit and method for testing image sensor packages, which can automatically test whether the image sensor packages are defective before they are assembled into camera modules. An apparatus for testing image sensor packages according to the present invention comprises a seating unit on which image sensor packages are seated for tests; a testing section having a lens and a light source above the image sensor packages to perform an open and short test and an image test for the image sensor packages; and a controlling and processing unit having a tester module for performing the open and short test and the image test for the image sensor packages. A method for testing image sensor packages according to the present invention comprises the steps of connecting the image sensor packages to a tester module for performing tests for checking whether the image sensor packages are defective; and carrying out an open and short test and an image test for the image sensor packages while irradiating light on the image sensor packages through a lens or blocking the light.