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7 results about "Decay time" patented technology

Method for measuring fluorescent decay in phosphors

Disclosed herein is a methodology which quickly provides for the analysis of multiple luminescence decays from individual phosphor samples. The disclosed method utilizes a Trust-Region method to provide non-physical solutions when the fitting application was not provided with bounds for the respective intensities and decay times. Results from Double Decay were found to be statistically similar to data analyzed in methodologies known in the art.
Owner:UNIVERSITY OF LOUISIANA AT LAFAYETTE

A method and apparatus for determining cold and hot data, and a medium

The application discloses a cold and hot data determination method and device and medium, and is suitable for the technical field of data storage. The method obtains service request data in a service layer, adds a decay time label to the service request data according to a current decay time matrix, and optimizes the decay time through an iterative algorithm to determine the state switching frequency of the service request data. When a preset condition is met, the cold and hot data of the service request data is determined according to the average state switching frequency. When the preset condition is not met, the next iteration frequency is taken as a new current iteration frequency. Compared with the cold and hot data determined by a simple time threshold and an LRU algorithm, the application reasonably allocates storage resources according to the decay time of different services in the service layer, so that the determined cold and hot data reflects the personalization of requests of different business departments, and the processing efficiency of the system is improved.
Owner:JINAN INSPUR DATA TECH CO LTD

Reference measurement

A method and apparatus for determining a decay time of a luminescence of a sample, comprising the following steps:excitation of a light source by means of an excitation current from a current source;irradiating the sample with a light of a wavelength suitable for exciting luminescence in the sample, periodically varying the irradiation intensity;measuring a light emitted from the sample, generating a first electrical signal in response to the light emitted from the sample, and amplifying the first electrical signal;detecting a first phase difference between the excitation current and the amplified first electrical signal;generating a second electrical signal, wherein the second electrical signal is generated directly from the excitation current of the current source and is subsequently amplified;detecting a second phase difference between the excitation current and the amplified second electrical signal; anddetermination of the decay time of the sample's luminescence based on a phase difference between the excitation current and the sample's light emission.
Owner:PYROSCIENCE GMBH

Scintillation material with low decay time and preparation method

PendingCN120737843AX/gamma/cosmic radiation measurmentLuminescent compositionsQuartzThermal neutron detection
The invention discloses a scintillating material with low decay time and a preparation method, the molecular formula of the scintillating material is Li (Cax, Sr1-x) 2I5: zEu < 2 + > (wherein the value range of x is greater than or equal to 0.2 and less than or equal to 0.4, and the value range of z is 2-4mol%). The preparation method comprises the following steps: weighing the raw materials LiI powder, CaI2 powder, SrI2 powder and EuI2 powder in proportion, uniformly mixing, putting into a quartz tube, vacuumizing and sealing the quartz tube, heating and synthesizing at high temperature, and cooling to obtain the Li (Cax, Sr1-x) 2I5: zEu < 2 + > scintillating material with low decay time. The Li (Cax, Sr1-x) 2I5: zEu < 2 + > scintillating material prepared by the invention has low decay time (lt; 300ns), and can be used in the fields of thermal neutron detection, safety inspection and the like.
Owner:TIANJIN UNIVERSITY OF TECHNOLOGY

Ring-down time signal-to-noise ratio improving method based on beat frequency demodulation

The invention discloses a ring-down time signal-to-noise ratio improving method based on beat frequency demodulation, and belongs to the technical field of laser spectrum. In order to solve the problems of inaccurate measurement and long-term instability of ring-down time caused by errors caused by various noises in a ring-down signal measurement process, the method disclosed by the invention simultaneously utilizes ring-down signals of a front cavity mirror and a rear cavity mirror, and a beam-combining beat frequency demodulation method is used for improving the detection sensitivity of the ring-down signals and reducing relative errors. Compared with the prior art, the method has the advantages that the cavity front mirror ring-down signal abandoned by other methods is utilized, so that the energy utilization rate is improved; signals are amplified through beat frequency demodulation, so that the sensitivity is improved, and high-frequency noise is filtered through a low-pass filter during demodulation; frequency locking and optical feedback are not needed, and the system is simple.
Owner:SHANXI UNIV

Automatic fitting method for decay time constant of exponential decay pulse

The invention belongs to the technical field of photon counting imaging, and particularly relates to an automatic fitting method for decay time constants of exponential decay pulses. The method comprises the following steps: S1, acquiring a pulse signal output by a charge sensitive amplifier, and carrying out baseline return-to-zero and pole-zero cancellation preprocessing on each pulse event sample contained in the pulse signal to obtain a pole-zero cancellation signal corresponding to each pulse event sample; s2, based on the characteristics of the polar zero cancellation signal, screening a pulse event sample to be fitted; and S3, setting fitting parameters, fitting the pulse event sample to be fitted by using a least square method, and screening and processing a fitting result to obtain an exponential decay time constant. According to the method, individual sample differences caused by measurement conditions are fully considered, the samples can be flexibly screened, and the fitting condition of the samples can be visually evaluated.
Owner:CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI