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637 results about "Counting rate" patented technology

Counting rate. [′kau̇nt·iŋ ‚rāt] (physics) The average rate of occurrence of events as observed by means of a counting system.

Density detection using real time discrete photon counting for fast moving targets

A system for detecting and graphically displaying a contents of a fast-moving target object comprises: a radiation source, having a position such that at least a portion of radiation emitted from the radiation source passes through the fast-moving target object, the fast-moving target object having a variable velocity and acceleration while maintaining a substantially constant distance from the radiation source and being selected from the group consisting of: a vehicle, a cargo container and a railroad car; a velocity measuring device configured to measure the variable velocity of the fast-moving target object; a detector array comprising a plurality of photon detectors, having a position such that at least some of the at least a portion of the radiation passing through the target object is received thereby, the detector array having a variable count time according to the variable velocity and a grid unit size; a counter circuit coupled to the detector array for discretely counting a number of photons entering individual photon detectors, the counter circuit measuring a count rate according to a contents within the fast-moving target object; a high baud-rate interface coupled to the counter circuit for sending count information from the counter circuit at a rate fast enough to support real-time data transfer therethrough; and a processor coupled to the velocity measuring device and to the high-baud-rate interface, receiving count information from the high baud-rate interface and generating distortion-free image data in real time as a function of the count information and the variable velocity. A method for using the system is also disclosed.
Owner:LEIDOS

Integrated gating active quenching/restoring circuit

The invention discloses an integrated gating active quenching/restoring circuit. The integrated gating active quenching/restoring circuit comprises a quick detection circuit, a pulse generation circuit, a pixel control circuit, a quenching circuit and a restoring circuit, wherein the quick detection circuit is used for processing a detected anode current signal of an SPAD (Single Photon Avalanche Diode) into a pulse signal, the pulse signal can be output through the pulse generation circuit, the pixel control circuit is controlled by an output signal and a gating signal of the pulse generation circuit, the restoring circuit and the quenching circuit are respectively controlled by outputs of the pixel generation circuit, outputs of the restoring circuit and the quenching circuit can be fed back to an anode of the SPAD, and the restoring and the quenching of the SPAD can be controlled. According to the integrated gating active quenching/restoring circuit disclosed by the invention, by adopting a gating control method, the dark counting rate of the SPAD can be effectively reduced, the quenching time can be controlled by the pulse generation circuit, and the integrated gating active quenching/restoring circuit has the advantages of compact area and low power consumption.
Owner:THE 44TH INST OF CHINA ELECTRONICS TECH GROUP CORP

Depth profile metrology using grazing incidence X-ray fluorescence

For small angles that are near critical angle, a primary incident X-ray beam has excellent depth resolution. A series of X-ray fluorescence measurements are performed at varying small angles and analyzed for depth profiling of elements within a substrate. One highly useful application of the X-ray fluorescence measurements is depth profiling of a dopant used in semiconductor manufacturing such as arsenic, phosphorus, and boron. In one example, angles are be varied from 0.01° to 0.20° and measurements made to profile arsenic distribution within a semiconductor wafer. In one embodiment, measurements are acquired using a total reflection X-ray fluorescence (TXRF) type system for both known and unknown profile distribution samples. The fluorescence measurements are denominated in counts/second terms and formed as ratios comparing the known and unknown sample results. The count ratios are compared to ratios of known to unknown samples that are acquired using a control analytical measurement technique. In one example the control technique is secondary ion mass spectroscopy (SIMS) so that the count ratios from the TXRF-type measurements are compared to ratios of integrals of SIMS profiles. In another example, the TXRF-type measurement ratios are compared to simulation profiles of known samples. Integrals of the SIMS profile that vary as a function of depth into the substrate correspond to the grazing incidence angles of the TXRF-like measurement and respective count rates.
Owner:ADVANCED MICRO DEVICES INC

Semi-chromatography gamma scanning method for low-medium radioactive waste barrel measurement

The invention provides a semi-chromatography gamma scanning method for low-medium radioactive waste barrel measurement. A rotary platform, a detector platform, a detector with a collimator, a transmission source platform, a transmission source, a shielding part of the transmission source and an analysis module are adopted in the method. A waste barrel is divided into multiple section layers in the height direction, the waste barrel is rotated, surface distribution of radioactive point sources on the section layers is changed into linear distribution of ring sources in the radius direction, the detector conducts measurement at different section layer heights and different eccentric positions in the section layers, an equation set reflecting the mutual relation between the detector counting rate and the activity of nuclide in annular grids is established, the equation set is solved, distribution of the activity of the radioactive nuclide in the waste barrel in the diameter direction and the height direction of the barrel is acquired, and the total activity of the radioactive nuclide in the waste barrel is acquired through summation. The method is high in measurement accuracy, short in measurement time and high in practical value and application prospect.
Owner:SHANGHAI JIAO TONG UNIV

Gamma energy spectrum-based method for identifying clay shale reservoir and uranium ore occurrence on spot

The invention relates to a gamma energy spectrum-based method for identifying clay shale reservoir and uranium ore occurrence on the spot, which comprises the following steps that: rock debris in corresponding depth of drilling fluid is continuously sampled or a core acquired through the core drilling is sampled according to corresponding depths; the rock debris sample or the core sample is placed into a matched lead tank, and a gamma energy spectrum probe is used for measuring the rock debris sample or the core sample inside the lead tank; then counting rates and activity of uranium (U), radium (Ra), thorium (Th) and kalium (K) and a total gamma value are acquired according to the measurement result, so that the real content of U(Ra), Th and K in the rock can be calculated; and finally, a variation curve of the contents of U(Ra), Th and K is drawn according to the calculation results, and the clay shale reservoir and the uranium ore occurrence are identified according to variation characteristics of the curve. Gamma energy spectrum measurement and analysis on rock debris or the core which are acquired from the drilling are directly performed, so that the clay shale reservoir and the uranium ore occurrence can be rapidly identified and evaluated. The method is an economical and efficient method. The gamma energy spectrum measurement is performed on the drilling site, so that influence of an external environment on the rock sample can be avoided, and the accuracy of the measurement result can be guaranteed.
Owner:CHINA PETROLEUM & CHEM CORP +1

High-speed superconducting nanowire single-photon detector (SNSPD) with strong absorption structure and preparation method of high-speed SNSPD

The invention discloses a high-speed superconducting nanowire single-photon detector (SNSPD) with a strong absorption structure and a preparation method of the high-speed SNSPD with the strong absorption structure. The SNSPD is capable of further improving the photon absorptivity of superconducting nanowires based on an incident medium with a high refractive index and an air cavity structure. Compared with the prior art and according to the high-speed SNSPD, under the condition that the nanowires are made of superconducting ultrathin membranes with the same material and the same thickness, nearly 100% of absorptivity can be realized through a lower duty ratio, and the difficulty of electron beams in the exposure steps is reduced greatly, thereby particularly being more beneficial to the preparation of the ultrathin nanowires; and meanwhile, by adopting a silicon on insulator (SOI) substrate, the high-quality growth of the superconducting ultrathin membranes can be ensured simultaneously without affecting the intrinsic quantum efficiency of the detector. In addition, under the condition that the large effective detection area is ensured equally, as the total length of the required nanowires is reduced obviously, the maximum counting rate of the detector can be improved, and the probability of occurring defects during preparation process is decreased notably.
Owner:TSINGHUA UNIV

Quantum secret key distribution privacy amplification method supporting large-scale dynamic changes

The invention discloses a quantum secret key distribution privacy amplification method supporting large-scale dynamic changes. The method includes the steps of firstly, conducting initialization, wherein the optimal operation scale m of an FFT module is calculated according to the actual running parameters of a quantum secret key distribution system when the privacy amplification method is started, and the initialization scale is an FFT operation and inverse FFT operation module of m; secondly, normalizing data, wherein the final security secret key length r is calculated according to the detector counting rate Q mu of the quantum secret key distribution system, the quantum bit error rate E mu, the corrected weak security secret key length n and the security parameter s of the quantum secret key distribution system, and normalizing an initial secret key string and a Toeplitz matrix according to the parameter m, the parameter n and the parameter r; thirdly, conducting data operation, wherein the operation process of the Toeplitz matrix and the initial secret key string is operated through the FFT technology, the first r items of the calculation result are taken to form a result vector, namely, the final security secrete key. The method has the advantages of being high in flexibility, better in processing performance, and the like.
Owner:NAT UNIV OF DEFENSE TECH

Ultra-low background gas-filled alpha counter

A method and counter for reducing the background counting rate in gas-filled alpha particle counters wherein the counter is constructed in such a manner as to exaggerate the differences in the features in preamplifier pulses generated by collecting the charges in ionization tracks produced by alpha particles emanating from different regions within the counter and then using pulse feature analysis to recognize these differences and so discriminate between different regions of emanation. Thus alpha particles emitted from the sample can then be counted while those emitted from the counter components can be rejected, resulting in very low background counting rates even from large samples. In one embodiment, a multi-wire ionization chamber, different electric fields are created in different regions of the counter and the resultant difference in electron velocities during charge collection allow alpha particles from the sample and counter backwall to be distinguished. In a second embodiment, a parallel-plate ionization chamber, the counter dimensions are adjusted so that charge collection times are much longer for ionization tracks caused by sample source alpha particles than for those caused by anode source alpha particles. In both embodiments a guard electrode can be placed about the anode's perimeter and secondary pulse feature analysis performed on signal pulses output from a preamplifier attached to this guard electrode to further identify and reject alpha particles emanating from the counter's sidewalls in order to further lower the counter's background.
Owner:WARBURTON WILLIAM K

Novel system and method of measuring concentration of radon in water

The invention discloses a novel system and method of measuring concentration of radon in water. The novel system of measuring concentration of radon in water includes successively connected first Gamma detector, first linear amplifier, first single-channel pulse-height analyzer, first delay shaping circuit and first scaler, and successively connected second Gamma detector, second linear amplifier,second single-channel pulse-height analyzer, second delay shaping circuit and second scaler, wherein the output terminal of the first delay shaping circuit and the output terminal of the second delayshaping circuit are connected to the input terminal of a coincidence circuit; the coincidence output terminal of the coincidence circuit is connected with a third scaler; the novel system of measuring concentration of radon in water also includes a calculation module which is used for calculating the activity concentration C<222><Rn>: C<222><Rn>=n<Gamma Gamma 1> - n) / V<Elipson> <Gamma Gamma>of 222Rn in a sample to be measured, wherein n<Gamma Gamma 1> is the counting rate of the third scaler during the process of measuring the sample to be measured; n is the background counting rateof the third scaler; V is the volume of the sample to be measured; and Epsilon <Gamma Gamma> is the detection efficiency of a coincidence channel. The novel system and method of measuring concentration of radon in water can quickly reduce the measurement background and can achieve the effect of quickly and accurately measuring the concentration of radon in water.
Owner:NANHUA UNIV
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