466 results about "Reference beam" patented technology

The invention provides an optical image encryption method and system based on a partially coherent non-diffracting light beam, and belongs to the technical field of optical encryption and information transmission. Encoding to-be-encrypted image information into the light field cross-spectral density function; the method specifically comprises the following steps: discretizing an image as an expansion coefficient of a power spectral density function at a light source under a pseudo-mode substrate, and constructing a cross spectral density function; a complex amplitude modulation algorithm is adopted to convert light field complex amplitude distribution into a pure phase hologram, the pure phase hologram is loaded to a spatial light modulator, a multi-mode incoherent superposition partially coherent non-diffraction light beam is generated, and the multi-mode incoherent superposition partially coherent non-diffraction light beam interferes with a reference light beam to obtain a light field image; performing coordinate transformation and frequency domain filtering on the light field image to extract a complex coherence degree function; and reconstructing and restoring the original image information in combination with a preset key and a digital inversion algorithm. According to the method, the light beams are constructed based on pseudo-mode superposition, image hidden coding, transmission and decryption are realized by utilizing the characteristics of partially coherent light and non-diffraction light beams, and the method is suitable for optical communication and security information transmission.

The invention relates to the cross technical field of atmospheric science and communication technology, in particular to an atmospheric refraction and waveguide environmental parameter detection and prediction method and device, and the method comprises the following steps: carrying out the power distribution of a light beam of a broadband light source through employing a light splitting element based on the emission of the broadband light source, and forming a detection light beam and a reference light beam, and guiding the detection light beam to pass through a preset open atmosphere optical path, and guiding the reference light beam to pass through a known refractive index stabilizing medium or a vacuum pipeline. The detection light beam and the reference light beam are formed through light splitting of the broadband light source, the detection light beam penetrates through the open atmosphere path, the reference light beam passes through the stable medium, Fourier transform is carried out on interference signals of the two light beams to extract wavelength phase difference mapping data, and tiny optical path change caused by atmospheric refractive index disturbance can be captured. Compared with the traditional single-point or single-path measurement, the sensing sensitivity and the measurement dimension of the atmospheric refractive index spatial nonuniformity are improved by using the broadband spectral information.

The invention discloses an automatic calibration method and system for a mining laser gas detector, and relates to the technical field of instrument calibration. The method comprises the following steps: dividing detection beam parameters into measurement beam parameters and reference beam parameters; enabling the measurement light beam parameter to penetrate through the to-be-measured gas area to obtain a measurement signal, and enabling the reference light beam parameter to penetrate through the reference gas chamber to obtain a reference signal; performing photoelectric conversion calculation on the reference signal to obtain a gas concentration detection value; the gas concentration detection value is compared and analyzed with a reference data value according to the central wavelength position of the mining laser gas detector, and a calibration unit is activated according to a comparison result; and automatically correcting the mining laser gas detector, generating a correction parameter set, calculating a measurement signal, and generating a concentration value of the gas to be detected. The technical problems of low calibration efficiency and unstable calibration precision of the mining laser gas detector in the prior art are solved, and the technical effects of realizing automatic calibration of the mining laser gas detector and improving the calibration efficiency and precision are achieved.

The invention provides an optical measurement method and device, and belongs to the technical field of optical measurement, and the method comprises the steps: starting a light source with the wavelength changing dynamically to generate a sweep frequency optical signal; dividing the light into a measuring beam and a reference beam by using a light splitting component, guiding the measuring beam to irradiate a target to be measured and then return along the same path, and guiding the reference beam to enter an optical component of which the optical path changes along with the wavelength and then return; based on the low-coherence characteristic of the light source, when the optical paths of the two light beams meet the interference condition, detecting an interference signal by using a sensing component; the optical path difference is determined according to time information in the interference signal, and the thickness of each reflection interface is calculated by combining refractive index data of a target to be measured. Different from the traditional low-coherence interference measurement which depends on a motor and the like to control the movement of a reflector, the method avoids the limitation of mechanical driving on the measurement frequency, and achieves the high-speed optical thickness measurement.

The invention relates to an optical fiber coupling dynamic interferometer based on arrayed waveguide grating light splitting. A luminous source and an arrayed waveguide grating of the optical fiber coupling dynamic interferometer are arranged on a motion module. The light emitting source is connected to the input port of the array waveguide grating through an optical fiber, and through the movement module, any one of the multiple output ports of the array waveguide grating is in butt joint with the optical fiber connected to the incident end of the collimation structure. A half-wave plate and a beam splitter prism of the imaging element group are sequentially arranged on an emergent light path of the emergent end of the collimation structure, and the beam splitter prism is used for splitting a light beam passing through the half-wave plate into a reference light beam transmitted along a first light path and a measurement light beam transmitted along a second light path. And the reflecting mirror of the imaging element group reflects the reference light beam back to the beam splitting prism. And the to-be-measured surface reflects the measurement light beam back to the beam splitter prism. The reference beam and the measurement beam reflected back to the beam splitter prism interfere with each other and are imaged on the target surface of the camera. Accurate measurement of the wavefront image of the surface to be measured is realized.

The invention provides a cavity adjusting method and device for a laser gyroscope resonant cavity, and the method comprises the following steps: building a light beam loop: horizontally placing a resonant cavity substrate on a supporting seat, and forming the light beam loop with two plane reflectors and two spherical reflectors; light beam introduction: starting a sweep frequency laser assembly, and enabling the reference light beam to enter a resonant cavity light path after passing through a light beam collimation system; light spot form monitoring and coarse adjustment: after a light beam emitted by the resonant cavity is collected by an image collector, the main control computer analyzes the light spot form and judges the imbalance state, evaluation information is fed back to the control system, the control system adjusts the inclination amount of the horizontal dimension and the pitching dimension of the light beam in the light beam collimation system according to the feedback information, and the light spot form is obtained. And the light spot is located at the center of the cavity mirror to finish coarse adjustment of the cavity. According to the method, coarse cavity adjustment can be completed without depending on a complex optical cavity technology, the cavity adjustment time is greatly shortened, the overall operation is simple, and the cavity adjustment efficiency is improved.

The invention discloses a displacement measurement system. The device comprises a laser, an integrated chip and a control module, the integrated chip comprises an optical waveguide structure, a beam splitting module and an optical signal modulation module; the laser is used for emitting a detection beam to the optical waveguide structure; the beam splitting module is arranged in the optical waveguide structure and on a propagation path of the detection light beam; the optical signal modulation module is arranged in the optical waveguide structure and on a propagation path of the reference light beam; the control module is in communication connection with the optical signal modulation module. According to the technical scheme, the optical waveguide structure, the beam splitting module and the optical signal modulation module are arranged in the integrated chip, the detection light beam enters the integrated chip for optical signal processing, then the control module is matched, a low-cost and small-sized displacement measurement system is formed, meanwhile, due to the fact that optical transmission is conducted in the optical waveguide structure, the measurement accuracy is improved, and the measurement precision is improved. And the reliability and the precision of the displacement measurement system are improved.

A device for interface shape of an optical element including at least one low-coherence light source, at least one optical sensor, an interferometric device illuminated by the light source and configured for shaping at least one measurement beam and at least two reference beams, directing one measurement beam to the element to pass through the interfaces, and directing the light from at least two interfaces to the sensor or sensors, each sensor globally configured for detecting at least two interference signals resulting respectively from interferences between the measurement beam reflected by one of the at least two interfaces and one of the reference beams; the measurement device also including a positioner for positioning a coherence area at the level of each interface and a digital processor for producing, from the interference signals, an item of information of the shape of each interface according to a field of view.

A method for calibrating an optical sensor and / or a camera for a motor vehicle, wherein the optical sensor and / or the camera detects ambient light through a first pane (10) for the motor vehicle, the method comprising the following steps: receiving a first attenuation value of a first reference light beam reflected in a second pane (50) for a motor vehicle; receiving a second attenuation value of a second reference light beam passed through the second pane (50); transmitting a measuring light beam from a first side (12) of the first pane (10) into the first pane (10); receiving the measuring light beam reflected in the first pane (10) on the first side (12) of the first pane (10); determining a third attenuation value of the measuring light beam in the first pane (10) based on the transmitted measuring light beam and the received measuring light beam;and calibrating the optical sensor and / or the camera based on the first attenuation value of the second disc (50), the second attenuation value of the second disc (50) and the third attenuation value of the first disc (10);

The invention provides a preparation method of a volume holographic element, the volume holographic element and an augmented reality 3D display device. The preparation method comprises the following steps: providing a pixelated diffractive lens array and a volume holographic material arranged adjacent to or adjacent to the pixelated diffractive lens array; wherein the pixelated diffraction lens array comprises target diffraction lens sub-units which are distributed in an array; at least one recording step is implemented, and the recording step comprises the steps that a recording light beam is projected to the pixelated diffractive lens array, and the recording light beam is irradiated to one side of the volume holographic material after being emitted by the pixelated diffractive lens array; and projecting a reference light beam to the other side of the volume holographic material, irradiating the reference light beam to the volume holographic material and interfering with the recording light beam to form holographic pixel units in one-to-one correspondence with the target diffraction lens sub-units. The volume holographic element prepared by the preparation method has high diffraction efficiency and high transmittance, and the presented 3D image also has the advantages of low crosstalk, no depth flipping, no self-repetition image and the like.

Certain aspects of the present disclosure provide a method for wireless communications by a user equipment (UE), generally including receiving a configuration indicating, for one or more reference signals (RSs), at least one bitmap indicating beam shape information and a reference beam direction corresponding to the bitmap, receiving dynamic signaling indicating that the UE is to update at least one of the bitmap or corresponding reference beam direction for at least one of the RSs, and updating the one of the bitmap or corresponding reference beam direction for at least one of the RSs based on the dynamic signaling.

The invention relates to the technical field of optical element surface shape dynamic measurement scheme design, in particular to an element surface shape dynamic measurement system based on a metasurface. According to the scheme, polarized light emitted by a laser is split into reference light and test light, the test light passes through a quarter-wave plate twice to realize polarization orthogonalization, and the test light is combined with the reference light to form elliptically polarized light; synchronously capturing component intensities of left-handed / right-handed circular polarized light and orthogonal line polarized light by using a detector, and resolving a phase difference delta in real time by combining a Stokes parameter; environmental interference is eliminated based on a common-path design, a polarization beam-splitting element is omitted, and the architecture is simplified; accurate dynamic measurement of the surface shape of the measured piece is realized by deducting the inherent surface shape error of the system. The system provided by the invention has the advantages of strong anti-interference performance, high measurement efficiency, remarkable cost reduction and the like, and is suitable for precise optical manufacturing and on-line detection scenes.

The invention relates to the technical field of optics, in particular to blade front and tail edge polishing and correcting equipment which comprises a clamp for loading a to-be-detected guide vane, a polishing system is arranged beside the clamp, and the to-be-detected guide vane is vertically placed on the clamp; the system also comprises a laser interferometer system. The laser interferometer system comprises a laser and a beam splitter, and the beam splitter splits a measuring light beam and a reference light beam; linear collimating lenses are respectively arranged on light paths of the measuring light beam and the reference light beam, and the measuring light beam and the reference light beam respectively penetrate through the collimating lenses to form horizontal linear light beams. On-line real-time detection is achieved through the laser interferometer system, the defect portions of the front edge and the tail edge of the guide vane are accurately positioned, the polishing head can conveniently move to the defect portions to conduct fine polishing, the production period is shortened, and the production cost is reduced.

An optical coherence tomography (OCT) system comprises an interferometer configured to split incident light into a reference beam and a test beam, and to interfere the test beam reflected from the specimen with the reference beam reflected from a reference mirror to produce an interference pattern. The OCT system also comprises a spectrometer configured to analyze spectral components of the interference pattern at non-uniformly sampled wavenumbers. A computer-readable memory of the OCT system is configured to store a measurement model with elements connecting different depth values with different non-uniformly sampled wavenumbers and weighted with weights derived from a power spectral density (PSD) of the incident light for corresponding wavenumbers. The OCT system further comprises a processor configured to determine the profilometry measurements of the specimen as a maximum likelihood estimate of the specimen surface depth by back-projection of the measured intensities with the measurement model.

The invention discloses a pattern wafer multi-parameter synchronous detection system and method based on double optical combs, and belongs to the field of wafer quality detection. The system comprises a signal light path, a reference light path, a detection light path and a synchronous detection module. After interference, the detection light beam and the reference light beam are decomposed into an H path and a V path through the polarization beam splitter, and are synchronously detected by the first camera and the second camera. The invention also provides a method which comprises the following steps: synchronously acquiring two paths of time domain interference data; fourier transform is carried out on each pixel point to obtain a plurality of spectrum pairs; the processing unit decodes in parallel based on the spectrum pair, and synchronously inverts multi-dimensional physical parameters such as three-dimensional morphology, stress and film parameters of the pattern wafer; and finally, comparing and identifying defects. According to the method, the problems of low detection efficiency and single information dimension in the prior art are solved, and wide-field, high-speed, high-precision and multi-parameter synchronous comprehensive characterization is realized.

The invention relates to the technical field of interferometers, in particular to an interferometer light path calibration method and method.The interferometer light path calibration method comprises the steps that an interferometer is started, a measurement light beam and a reference light beam generated by the interferometer are combined through a polarization splitting prism and then are emitted towards an observation screen, and a measurement light spot and a reference light spot are formed on the observation screen; adjusting a reflector group of the interferometer to enable the measurement light spot to coincide with the reference light spot; the observation screen is removed, an optical fiber is connected, and the combined light beams are coupled into the optical fiber; the output end of the optical fiber is connected to detection equipment, a light current signal is obtained through detection of the detection equipment, and the ratio of an alternating-current voltage component to a direct-current voltage component is shown; and a lambda / 4 wave plate in the interferometer is adjusted until the ratio reaches a preset condition, and calibration is completed. The method is accurate and reliable, is simple and convenient to operate, has repeatability, can give consideration to space alignment and polarization matching, and facilitates the improvement of the stability and measurement precision of an interference system.

The invention relates to a reflectivity spectrum obtaining method, an end point detection method and device and a polishing device.The reflectivity spectrum obtaining method comprises the steps that an influence factor distribution curve representing light intensity measured value volatility under different light intensity light source conditions is obtained, a critical light intensity value corresponding to the dominant light source factor is determined based on the influence factor distribution curve, and the critical light intensity value is calculated according to the critical light intensity value. The source light beam is split according to a preset proportion beta to obtain a required measurement light beam and a reference light beam, and the measurement light beam enters a sample to form a reflection light beam; the reflected light intensity is calibrated based on the reference light intensity to generate a target reflected light intensity. And calculating the reflectivity spectrum of the sample based on the target reflection light intensity. Wherein the measuring light beam and the reference light beam have the same light intensity volatility, so that when the reflected light intensity is calibrated based on the reference light intensity, the accuracy and the stability of reflectivity spectrum measurement are effectively improved.

The invention discloses a two-degree-of-freedom displacement simultaneous measurement system and method based on an orbital angular momentum beam interferometer. The system comprises a laser; the light field regulation and control module is used for converting the linearly polarized light into a light beam with orbital angular momentum; an optical isolator; a first beam splitter; a second beam splitter; the third beam splitter is used for combining the first reference light beam and the first measurement light beam to generate conjugate interference; a fourth beam splitter; a fifth beam splitter; the sixth beam splitter is used for combining the second reference light beam and the second measurement light beam to generate conjugate interference; a seventh beam splitter; a first reflector; a second reflector; a third reflector; a first Weive prism; a second Weive prism; a reflection grating; and the image acquisition and processing module is used for acquiring a petal-shaped interference pattern formed by conjugate interference. The system is compact in structure and high in demodulation sensitivity, and can realize non-contact and high-resolution synchronous two-degree-of-freedom measurement.

The invention discloses a light off-axis structured light digital holographic microscopy super-resolution imaging method based on a Kramers-Kronig relation. In a light off-axis structured light digital holographic microscopy system, structural illumination patterns with different angle directions and phase shift amounts are loaded on an object light beam to acquire a structural illumination hologram, and an unloaded reference light beam is acquired to acquire a reference light intensity graph; the structure illumination hologram is combined with the reference light intensity graph to calculate complex amplitude by utilizing a KK relation, phase distortion of the complex amplitude is compensated to obtain distortion-removed complex amplitude, a frequency spectrum separation matrix is constructed by combining information during acquisition to perform frequency spectrum separation on high and low frequency components in the complex amplitude, and finally frequency spectrum synthesis is performed to realize super-resolution object light reconstruction. According to the invention, high resolution improvement can be realized, the interference problem of zero-order item frequency spectrum of the hologram under the light off-axis condition is effectively solved, the noise is obviously reduced, the imaging quality is improved, and the method has important application value in the fields of biological tissue observation, microstructure measurement and the like.

The invention relates to a reflective double-beam interference exposure system reticle density and aberration considered adjustment method, which comprises the following steps: constructing a reticle density standard module, and generating a standard reference beam for adjusting the reticle density of an exposure system; a reflection type double-beam interference exposure system is built, points formed after + / -1-level standard reference beams are focused through an off-axis parabolic mirror serve as nominal focuses of all off-axis mirrors in a double-beam light path, the spatial position of the off-axis parabolic mirror is continuously adjusted, wavefront measurement is combined with a spherical interferometer, and the reflection type double-beam interference exposure system is obtained. And enabling the nominal focus of the off-axis mirror to coincide with the spatial position of the real focus, thereby completing the construction of the double-beam interference exposure system. According to the invention, the problem that the aberration and the scribed line density are difficult to accurately control at the same time in the adjustment process of the reflective double-beam interference exposure system is solved, and a new idea is provided for the high-precision adjustment of the meter-scale large-aperture reflective interference exposure system.

The invention provides an ultrafast scanning interferometer. The interferometer comprises an ultrafast laser system, an interference module, a coupling module and a spectral measurement module which are sequentially arranged along a light path. The ultrafast laser system emits a laser beam, the interference module splits the laser beam into a reference beam and a detection beam, and the detection beam carries information of a detected optical element. The coupling module is connected with the spectral measurement module through an optical fiber, the coupling module couples the detection light beam into the optical fiber, and the spectral measurement module demodulates the detection light beam which is output by the optical fiber and carries the information of the detected optical element in real time and calculates the peak-valley value of the detected optical element. The interference module adopts a Michelson interferometer structure, and the spectral measurement module comprises a dispersion module, a high-speed photoelectric detector and a high-speed photoelectric signal acquisition and analysis module. According to the invention, continuous single-frame detection is carried out on the measured optical element in the form of the optical pulse string, and high-precision and high-efficiency measurement of the surface topography of the optical element is realized.

Provided are a method for operating a device in a wireless communication system, and a device using the method. The method comprises: measuring a plurality of reference beams; selecting at least one beam from among the plurality of reference beams; and communicating with a base station using the at least one selected beam, wherein the plurality of reference beams are beams transmitted according to a first scheme or a second scheme. In the first scheme, N (N is a natural number greater than or equal to two) reference beams are transmitted at a first transmission time, and an offset is applied to the N reference beams at a second transmission time. In the second scheme, 2N reference beams are transmitted, wherein a second frequency interval between adjacent beams of the 2N reference beams is half a first frequency interval between adjacent beams of the N reference beams.

The invention provides a nonlinear refractive index measurement system and method based on dual-optical-path interference, and relates to the technical field of nonlinear optical measurement, the system comprises a first laser emission unit, a first light splitting device, a second light splitting device, an interference device, a to-be-measured sample, a second laser emission unit and a measurement unit; the first laser emission unit generates a Gaussian beam; the first light splitting device splits the Gaussian beam into a sample beam and a reference beam which are parallel to each other; the second light splitting device splits the sample light beam and the reference light beam which are parallel to each other into two paths; the first sample light beam and the reference light beam enter a to-be-tested sample; the second laser emission unit generates a pumping light beam, and the pumping light beam is emitted to the sample to be measured along the light path of the first sample light beam; the interference device generates interference between the two sample light beams and interference between the two reference light beams; the measuring unit is used for collecting interference images, analyzing the interference images and calculating the nonlinear refractive index of the to-be-measured sample. The system is not easily influenced by the environment.

A method and a system for determining relative position of an element of an optical system of an assembly for processing or measuring an object along a measurement line, involve generating a measurement beam and a reference beam of low coherence optical radiation. The measurement and reference beams, alternately or in combination, have a main beam and a multiplexed additional beam. The measurement beam, led toward the element of the optical system, and back-reflected, is superimposed on the reference beam in a region of common incidence of an interferometric optical sensor arrangement. Position or frequency of a main interference fringe pattern and an additional interference fringe pattern is detected.

Example embodiments relate to phase difference detection systems and method for detecting phase difference. One embodiment includes a phase difference detection system for a single target location. The system includes a laser source to generate a laser beam. The system also includes a phase difference detector coupled to the laser source and having a multi-layer structure. The phase difference detector includes a planar waveguide for guiding the laser beam. The phase difference detector also includes a grating coupler to split the laser beam into a reference beam and a measurement beam. Additionally, the phase detector includes a planar imager array forming a second layer of the multi-layer structure. Further, the phase difference detector includes an optical system configured to focus the measurement beam output from the phase difference detector on the single target location and to focus signals reflected at the target location to the phase difference detector.

The invention discloses a focus tracking control system and method applied to laser processing. The system comprises a laser, a focus detection module, a tracking control module and a light path adjusting module. The method comprises the steps that S1, a laser beam is emitted into a light path adjusting module to be split into reference light and sample light, and a focus detection module detects the reference light to obtain focus information before machining and outputs the focus information to a tracking control module; s2, the tracking control module sends a first control signal to an optical path adjusting module; s3, the light path adjusting module adjusts the sample light to enable the sample light to be emitted into the processing object to process the processing object; s4, the tracking control module detects the processing object and sends a second control signal to the light path adjusting module; s5, the light path adjusting module adjusts the reference light and the sample light, and the adjusted sample light continues to be emitted into the processing object to process the processing object; returning to the step S4, and entering the step S6 until the processing of the processing object is completed; and S6, the focus detection module records the obtained focus information in processing. The machining process of the laser beam can be accurately corrected.

The invention provides a light field resolution method and system, and relates to the technical field of ultrafast light field imaging. The light field resolution method comprises the following steps: carrying out delay processing on a reference light beam to obtain a delayed reference light beam; delaying the probe light beam to obtain a delayed probe light beam; enabling the delayed probe light beam to pass through an ultrafast event scene to obtain a modulated probe light beam; performing interference on the modulation probe light beam and the delay reference light beam to obtain an image formed by interference; and based on the image formed by interference, obtaining three-dimensional space distribution at different times in the ultrafast event scene. And under the condition that the three-dimensional space distribution is obtained, analyzing the physical characteristics of the ultrafast event scene. Through three-dimensional space distribution, the morphology and characteristics of an ultrafast event scene are analyzed from multiple dimensions of time, space and the like, and a specific relation between a laser parameter and a laser propulsion coupling coefficient can be established.

The invention discloses a displacement measurement method and system based on orbital angular momentum light beam conjugate interference, and the method comprises the steps: enabling linearly polarized light emitted by a laser to pass through an optical attenuator, a light beam expander, a quarter-wave plate and a vortex wave plate to form a light beam with orbital angular momentum, and enabling the light beam to pass through a beam splitter to be divided into a reference light beam and a measurement light beam. A measurement light beam is vertically incident on a reflection grating, and the mth-order diffraction light is incident on a first cube-corner prism and is reflected back to a diffraction grating to be subjected to secondary diffraction. And after the reference beam passes through the second cube-corner prism, the topological charge symbol of the reference beam is changed by the Dove prism. The reference light beam and the measurement light beam generate conjugate interference at the beam splitter prism, a petal-shaped interference pattern collected by the CCD is demodulated, and in-plane and out-of-plane two-dimensional displacement of the grating is calculated. The system has the characteristics of simple and compact structure, strong anti-interference capability, high precision and the like, and can be widely applied to the fields of high-end equipment manufacturing, semiconductor industry, precision metering and the like.

A method includes illuminating a first optical element with an illumination beam to generate a beam of interest and noise from the first optical element. The first optical element is a master copy to be replicated. The method also includes recording in a first recording medium an interference pattern between the beam of interest and a reference beam. The first recording medium is positioned in an optical path of the beam of interest and outside an optical path of the noise. The method further includes illuminating the recorded interference pattern in the first recording medium with a conjugate of the reference beam to generate a conjugate of the beam of interest. The method additionally includes replicating the first optical element in a second recording medium by recording in the second recording medium an interference pattern between the conjugate of the beam of interest and a conjugate of the illumination beam.

The invention relates to a quasi-differential wavefront segmentation double-beam interference device with a planar light path structural design, which has the structural characteristic of a non-closed optical path for transmitting a measurement light beam in a one-way manner. Space coherent light of a transverse mode vector filtering mechanism based on the Huygens principle / phased array principle instead of homologous transmission time coherent light is used as each light source, and a non-closed optical path is realized under the cooperation of a one-way transmission mode on a divided measuring light beam. The problem that the sum of the loop wavelength increment or the frequency increment of a closed path interference device is zero is solved, so that the purpose of measuring the first-level effect of anisotropic physical parameters of a measured object in a linear system is achieved, and the device is particularly suitable for immersion type online measurement. The optical elements have stable performance and sound self-adaptive mechanism and self-diagnosis capability through careful layout of the optical elements; and the method also has wide application prospects in basic physical research and novel navigation / positioning systems. The invention also provides a differential wavefront segmentation and semi-transparent and semi-reflective mirror beam combination interferometer device based on the planar light path structure design, and a wavefront segmentation interferometer device based on the planar light path structure design and provided with a pre-crossing area and a bending type one-way-two-way-common mode combination light path structure. The invention relates to a wavefront segmentation interferometer device of a one-way-two-way combined light path structure which is designed based on a planar light path structure and adopts polarization light splitting-beam combination, optical rotation processing of a reference light beam and original path returning, and a use method of an interference device.