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1972 results about "Reference beam" patented technology

A reference beam is a laser beam used to read and write holograms. It is one of two laser beams used to create a hologram. In order to read a hologram out, some aspects of the reference beam (namely its angle of incidence, beam profile and wavelength) must be reproduced exactly as when it was used to write the hologram. As a result, usually reference beams are Gaussian beams or spherical wave beams (beams that radiate from a single point) which are fairly easy to reproduce.

Diffraction grating based interferometric systems and methods

Diffraction grating based fiber optic interferometric systems for use in optical coherence tomography, wherein sample and reference light beams are formed by a first beam splitter and the sample light beam received from a sample and a reference light beam are combined on a second beam splitter. In one embodiment, the first beam splitter is an approximately 50 / 50 beam splitter, and the second beam splitter is a non 50 / 50 beam splitter. More than half of the energy of the sample light beam is directed into the combined beam and less than half of the energy of the reference light beam are directed into the combined beam by the second beam splitter. In another embodiment, the first beam splitter is a non 50 / 50 beam splitter and the second beam splitter is an approximately 50 / 50 beam splitter. An optical circulator is provided to enable the sample light beam to bypass the first beam splitter after interaction with a sample. Two combined beams are formed by the second beam splitter for detection by two respective detectors. More than half of the energy of the light source provided to the first beam splitter is directed into the sample light beam and less than half of the energy is directed into the reference light beam. The energy distribution between the sample and reference light beams can be controlled by selection of the characteristics of the beam splitters.
Owner:BOSTON SCI SCIMED INC

Method and apparatus using interferometric metrology for high aspect ratio inspection

In one embodiment, the present invention provides an interferometric inspection system for inspecting semiconductor samples. The system includes at least one illumination source for generating an illumination beam and an interferometric microscope module for splitting the illumination beam into a test beam directed to the semiconductor sample and a reference beam directed to a tilted reference mirror. The beams are combined to generate an interference image at an image sensor. The tilted reference mirror is tilted at a non-normal angle with respect to the reference beam that is incident on the mirror to thereby generate fringes in the interference image. The system also includes an image sensor for acquiring the interference image from the interferometric microscope module and generates an inherence signal. The system further includes a processing module configured to generate complex field information corresponding to the sample from the interference image signal and an alignment module located in the optical path between the interferometric module and the image sensor. In another embodiment, the processing module is configured to generate complex field information from either spatial fringe analysis or temporal fringe analysis performed on the interference image signal.
Owner:KLA TENCOR TECH CORP

Synthetic aperture ladar system and method using real-time holography

This invention uses a real-time holographic medium to record the amplitude and phase information collected from a moving platform at the aperture plane of a side-looking optical sensor over the collection time. A back-scan mirror is used to compensate platform motion during the synthetic aperture integration time. Phase errors caused by a nonlinear platform motion are compensated by controlling the phase offset between the illumination beam and the reference beam used to write the hologram based on inertial measurements of the flight path and the sensor line-of-sight pointing angles. In the illustrative embodiment, a synthetic aperture ladar (SAL) imaging system is mounted on a mobile platform. The system is adapted to receive a beam of electromagnetic energy; record the intensity and phase pattern carried by the beam; and store the pattern to compensate for motion of the platform relative to an external reference. In the illustrative embodiment, the image is stored as a holographic image. The system includes a back-scan mirror, which compensates the stored holographic pattern for motion of the platform. The medium and back-scan mirror may be replaced with a digital camera and one-dimensional and two-dimensional arrays may be used. In a specific embodiment, a two-dimensional array is used with a time delay and integration (TDI) scheme, which compensates for motion of the platform in the storage of the optical signals. In an alternative embodiment, a back-scanning mirror is used to compensate for motion of the platform. Consequently, the interference pattern between a relayed image of the aperture plane and a reference beam is continuously stored. In this embodiment, the instantaneous location of the received beam on the recording medium is controlled to compensate for motion of the platform.
Owner:RAYTHEON CO

Match filters for a real time fingerprint sensor and verification system

A real time fingerprint verification system includes a recording device and a verification device each having a fingerprint scanner for generating a flat, dimensionally undistorted, high contrast, fingerprint image, and an intensity sensitive, spatial light modulator (SLM) for receiving and transforming the flat fingerprint image into a planar, coherent light image. In the recording device, the planar coherent light image beam of the fingerprint from the SLM is Fourier transformed, and input into a microscope objective lens system which expands the Fourier transformed beam image sufficiently to allow mechanical blocking of its central portion or order, whereupon it is directed to interact as an object beam with a reference beam from the particular coherent light source to record a holographic matched filter. In the verification device, the planar coherent light image beam of the fingerprint is Fourier transformed and input into a microscope objective lens system to allow similar mechanical blocking of its central portion or order whereupon it is directed to interrogates a previously recorded holographic matched filter of a fingerprint image as an object beam for determining a match or not between the respective recorded and interrogating images. The spatial light modulator (SLM) in both the respective recording and verification devices enables phase correlation (optical path length determination) of one device to another device. X-Y alignment and rotational orinentation of the respective real time image and holographic matched filter image is accomplished by jittering (orbiting and angularly oscillating) either the interrogating object beam, real time, relative to the matched filter or visa versa.
Owner:ADVANCED PRECISION TECH

Two-dimensional photoelectric auto-collimation method and device for polarized light pyramid target common-path compensation

The invention discloses a two-dimensional photoelectric auto-collimation method and device for polarized light pyramid target common-path compensation, belonging to the technical field of precision instrument manufacture and precision measurement. According to the invention, high-precision photoelectric autocollimation angle measurement is realized for solving the defects in the existing method and device. The method comprises: a common-path shift quantity monitoring separating device based on a pyramid combined target can be used for curing a polarizing light splitter, a pyramid reflector and a measurement reflector to form the pyramid combined target, and separating a reference light beam which has a feature identical to that of a measurement light beam and is in common-path transmission with the measurement light beam while obtaining a two-dimensional angle variation by using the linear polarization feature of the laser; a controller is used for controlling a two-dimensional light beam deflection device in real time according to the shift quantity reflected by the reference light beam so as to inhibit the shift quantity coupled in the measurement light beam, thus the precision measurement on the two-dimensional angle variation is realized. The device for realizing the method comprises a two-dimensional photoelectric auto-collimation tube, the common-path shift quantity monitoring separating device based on the pyramid combined target, the controller and the two-dimensional light beam deflection device.
Owner:HARBIN INST OF TECH
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