10 results about "Test beam" patented technology

This invention belongs to the field of photodetector technology, specifically disclosing an automatic testing system and method for a four-quadrant APD component. The system includes: a temperature-controlled chamber providing a controllable temperature testing environment; an optical unit generating a stable test beam with adjustable intensity; a fixing fixture installed inside the temperature-controlled chamber, where the device under test (DUT) is installed during testing, and the fixture can be adjusted to switch between different quadrants, allowing the light source to switch between different photosensitive surfaces of the DUT; and a measurement and control unit including a bias power supply, an oscilloscope, a picoammeter, a temperature control and acquisition module, and a host computer. This system, by integrating a temperature control unit, a precision mechanical alignment structure, multi-parameter measurement hardware, and host computer control software, achieves automated, high-precision, multi-parameter testing of APD four-quadrant components across the entire temperature range, significantly improving testing efficiency and reliability.

The application provides a joint bending stiffness calculation method, an electronic device and a storage medium. The method comprises the following steps: when a test beam is subjected to graded loading, the joint opening amount of the node area of the test beam and the actual strain of the anchorage reinforcement in the non-node area of the test beam under different load states are measured respectively; the structure parameters of the test beam are obtained, and the bond slip amount of the non-node area under different load states is calculated respectively according to the structure parameters and the actual strain; and the joint bending stiffness is calculated according to the bond slip amount and the joint opening amount. The application can improve the calculation accuracy of the joint bending stiffness of the anchorage joint.

A device and method for measuring the decentration of optics under test is provided. The device comprises a rotational spindle for loading and rotating the optics under test, a light source module for providing incident light beam to the optics under test, and a wavefront sensor for receiving testing light beams with different exposures from the optics under test at a plurality of azimuthal directions.

A precision dual-beam parallelism detection device is disclosed for detecting the parallelism of a first test beam and a second test beam arranged parallel to each other with a distance L between them. The device includes an autocollimation angle measurement unit comprising a focusing lens and a photoelectric position detector located on the same optical axis. The photosensitive surface of the photoelectric position detector is located at the focal plane of the focusing lens. The focusing lens and the photoelectric position detector are mounted on a multi-degree-of-freedom attitude adjustment mechanism. The beam steering unit is a cornerstone prism used to deflect either the first or second test beam by 180° before it enters the focusing lens. The cornerstone prism has a first mounting point and a second mounting point, the center of which is located on the optical axis of the focusing lens. This invention features a simple optical path, wide applicability, and utilizes differential measurement to eliminate zero-position errors, achieving high-precision dual-beam parallelism measurement.

This invention relates to the field of materials testing technology and discloses an apparatus and method for testing the photothermal performance of photothermal agents. The apparatus includes a chamber, an ambient temperature control module, a sample carrying and temperature measurement module, a light source access module, a main control drive module, and a power detection module. The main control drive module is connected to a temperature sensor, a temperature control device, a thermocouple, and the power detection module, and is connected to an external laser light source through a light source control port. The main control drive module controls the ambient temperature inside the chamber to be at a set temperature through the temperature sensor and the temperature control device. After the ambient temperature meets the temperature stability criterion, it controls the external laser light source to output a test beam. The photothermal performance of the photothermal agent is evaluated based on the incident power of the test beam and the sample temperature collected at different times by the thermocouple. This invention can achieve photothermal conversion efficiency and stability testing with low sample consumption.

The invention relates to a device (15) for determining a transmission and / or reflection behavior of at least one optical element, in particular of mirrors (M1-M10) of a lens (7), in particular an EUV lens, having a plurality of optical elements, an image plane (9) and an object plane (5), the device having at least one light source (2) and having at least one sensor (16, 17), and having a used beam path (N). According to the invention, at least one optical test element (18, 19) of the device (15) is arranged or can be arranged in the object plane (5) or in the image plane (8), and the test element (18, 19) is designed such that it generates a test beam path (T1, T2) in the object plane (5) or the image plane (9), with light emitted by the light source (2) and influenced by the at least one optical element being guided along said test beam path to the at least one sensor (16, 17), which is located outside the used beam path (N).

This invention relates to the field of optical testing, and in particular to a directional coupler tester, its testing method, and apparatus, comprising an input coupler, an output coupler, a first waveguide, a second waveguide, a multimode interferometer, and a waveguide switching component; the multimode interferometer is used to split the test beam into a first test beam splitter and a second test beam splitter; the first waveguide and the second waveguide have different lengths; the waveguide switching component is disposed on the first waveguide and the second waveguide. This invention achieves a combination of direct measurement and interferometric measurement within the same directional coupler testing structure, avoiding the upper limit of accuracy that can result from fabricating multiple test structures with slightly different structures and performing direct and interferometric measurements separately, thus further improving the accuracy of the directional coupler splitting ratio test results.

The application relates to the technical field of optical communication testing, and discloses an inter-satellite laser communication terminal processor parallel testing method, a device, equipment and a medium, which are applied to a parallel testing system and comprise a first measured processor, a second measured processor, multiple testing devices and an optical switch matrix; the testing requirements of the measured processors are acquired, the testing path of the optical switch matrix is adjusted, and a parallel testing path is obtained; through the parallel testing path, multiple first testing light beams are transmitted to the first testing device, and multiple second testing light beams are transmitted to the second testing device, so that the first measured processor and the second measured processor are tested in parallel; after testing is completed at any two testing devices, the working mode of the optical switch matrix is switched, and the testing light beams that have completed testing are transmitted to other testing devices for subsequent testing. The method has the beneficial effect that multiple measured processors are tested in parallel by using the optical switch matrix, and the testing efficiency of the measured processors is effectively improved.

An optical coherence tomography (OCT) system comprises an interferometer configured to interfere a test beam reflected from a specimen with a reference beam to produce an interference pattern. The OCT system also comprises a spectrometer configured to measure a spectrum of the interference pattern to produce measurements of intensities of the interference pattern corresponding to different wavelengths. The OCT system further comprises a processor configured to determine noise statistics of the intensities of the interference pattern and use the noise statistics to set a threshold for detecting a number of layers of the specimen penetrated by the test beam at the location based on a pre-specified probability of false acceptance of noise as a signal. The processor is further configured to determine the profilometry measurements as an estimate of depths of the layers of the specimen causing the intensities of the interference pattern above the threshold.

The present application relates to the technical field of optical element detection, and discloses an optical element damage threshold detection system, which comprises a first light source, a switching device, a sample stage, an imaging device and a main controller. The main controller is used to control the switching device to switch the focused optical assembly on any optical mounting position to be located on the main light path of a test light beam. The focused optical assembly on different optical mounting positions comprises a single-lens focusing assembly and a beam-reducing mirror focusing assembly. The light beam shaped by the focused optical assembly is output to a specific point of the measured optical element for damage testing. The damage threshold detection result can be obtained by analyzing the detection images before and after the action of the test light beam using the imaging device. The optical element damage threshold detection system can adapt to the testing requirements of thin film and long crystal optical elements, thereby suppressing the self-focusing of the long crystal and improving the accuracy of the test result.