171 results about "Test beam" patented technology

The invention discloses an inclined wave surface sub-aperture stitching interference detection method based on a spatial light modulator, and relates to the field of optical detection. Light emitted by the laser is collimated and expanded and then enters the polarizing beam splitter; the reflected light is used as a reference light beam, and the transmitted light is used as a test light beam; a test light beam enters the spatial light modulator, is subjected to phase modulation by the spatial light modulator, passes through the lens and then forms standard spherical waves with different inclination angles, and zero detection is carried out on sub-apertures divided in different regions. The spatial light modulator is used as an ideal point source array generator to be matched with the imaging lens, so that required ideal inclined spherical waves can be generated according to different parameters of a measured piece, and compared with a traditional point source generator, the device has high universality. And for a large-aperture complex curved surface, sub-aperture splicing can be realized without moving an interference device, and errors caused by mechanical movement are reduced.

The invention relates to a polarization correlation imaging scheme for extracting a target from objects which are made of the same material and have different roughness. The laser generates a Gaussian beam, and random speckles are generated through the rotary ground glass. A polarizer is placed behind the ground glass to control the polarization direction, and a beam splitter divides speckles into a test beam and a reference beam. The reference light beam is received by the CCD, and the test light beam is reflected after irradiating an object and is separated by the beam splitter. One beam of light is received by the barrel detector after passing through the + 45-degree polarizer, and the other beam of light is collected by the other two barrel detectors after passing through the polarization beam splitter. And the computer performs correlated imaging on the signals acquired by the barrel detector and the preset speckles. By modulating the polarization state of the light field and designing the receiving end, additional object surface polarization information is introduced, so that the system can extract a target from objects which are made of the same material and have different roughness, and the system has application value in a complex confrontation environment.

An optical metrology device characterizes a test object using a phase shift interferometer with synchronous time varying optical frequency shifts. A light source generates a beam having a time varying frequency, which is divided into two collinear, orthogonally polarized beams that differ by a first frequency shift. One or more optical cavities receive the beams and produce a pair of reference beams that differ from each other in frequency by the first frequency shift and a pair of test beams with a second frequency shift induced by the one or more optical cavities. The test beams differ from each other by the first frequency shift and differ from the reference beams by the second frequency shift. The first frequency shift has a pre-defined relationship with respect to the second frequency shift to generate interference between a reference beam and test beam that have frequency shift magnitudes with the pre-defined relationship.

The invention relates to the technical field of optical element surface shape dynamic measurement scheme design, in particular to an element surface shape dynamic measurement system based on a metasurface. According to the scheme, polarized light emitted by a laser is split into reference light and test light, the test light passes through a quarter-wave plate twice to realize polarization orthogonalization, and the test light is combined with the reference light to form elliptically polarized light; synchronously capturing component intensities of left-handed / right-handed circular polarized light and orthogonal line polarized light by using a detector, and resolving a phase difference delta in real time by combining a Stokes parameter; environmental interference is eliminated based on a common-path design, a polarization beam-splitting element is omitted, and the architecture is simplified; accurate dynamic measurement of the surface shape of the measured piece is realized by deducting the inherent surface shape error of the system. The system provided by the invention has the advantages of strong anti-interference performance, high measurement efficiency, remarkable cost reduction and the like, and is suitable for precise optical manufacturing and on-line detection scenes.

An optical coherence tomography (OCT) system comprises an interferometer configured to split incident light into a reference beam and a test beam, and to interfere the test beam reflected from the specimen with the reference beam reflected from a reference mirror to produce an interference pattern. The OCT system also comprises a spectrometer configured to analyze spectral components of the interference pattern at non-uniformly sampled wavenumbers. A computer-readable memory of the OCT system is configured to store a measurement model with elements connecting different depth values with different non-uniformly sampled wavenumbers and weighted with weights derived from a power spectral density (PSD) of the incident light for corresponding wavenumbers. The OCT system further comprises a processor configured to determine the profilometry measurements of the specimen as a maximum likelihood estimate of the specimen surface depth by back-projection of the measured intensities with the measurement model.

The invention discloses an integrated optical chip, a preparation method and an optical gyroscope, the integrated optical chip comprises a first device layer and a second device layer, the first device layer is provided with a phase modulator, the phase modulator comprises two fourth waveguides used for being connected with an interference ring, the second device layer is provided with a detection unit, and the detection unit comprises two fourth waveguides used for being connected with the interference ring. The detection unit comprises a first coupler and a detector, the first coupler comprises a first waveguide, a second waveguide and a third waveguide, the first waveguide is used for connecting a light source, the first waveguide is connected with the third waveguide, the second waveguide is connected with the third waveguide, and the third waveguide is connected with the phase modulator; the detector is connected with the second waveguide; wherein a light beam is transmitted to the phase modulator through the first waveguide and the third waveguide and is transmitted to the interference ring through the phase modulator, and a test light beam transmitted back by the interference ring is transmitted to the detector through the third waveguide and the second waveguide.

The invention relates to an in-orbit calibration method for an uplink phased-array antenna of a low-orbit communication satellite, and belongs to the technical field of satellite testing. According to the method, pointing measurement and calibration of an uplink phased-array antenna of a low-orbit communication satellite are taken as input, and measurement and calibration of beam pointing of the uplink phased-array antenna are realized through test and data processing of G / T values of multiple beams of the uplink phased-array antenna. The method has the functions of calibration signal generation, beam G / T test, beam stereo directional diagram reconstruction, pointing deviation measurement and beam pointing adjustment. Simulation experiments show that the calibration method designed by the invention can effectively reduce the beam pointing deviation of the uplink phased-array antenna of the low-orbit communication satellite.

The invention provides a method and a device for testing optical fiber coupling efficiency in space optical communication, and belongs to the field of space optical communication. Comprising a light source generation module used for generating a test light beam; the turbulence simulation module is used for simulating the influence of external field turbulence on light beam transmission; the phase difference correction module is used for correcting a low-order phase difference caused by system installation and adjustment or platform vibration and the like and compensating other phase differences caused by phase differences of optical devices; the optical fiber coupling module is used for coupling the spatial light to an optical fiber and determining optical power; and the control module is used for controlling the turbulence simulation module and the phase difference correction module and determining the optical fiber coupling efficiency according to the optical power of the test light beam. By means of the device, a quantitative relation model between the single influence factor and the optical fiber coupling efficiency can be determined with high precision.

The invention belongs to the technical field of structural health monitoring, and particularly relates to an uncertainty reduction method based on seismic interference mode recognition and global measurement. The method comprises the following steps of: erecting high-speed image recording equipment in front of a tested beam body by adopting a three-axis holder, acquiring a lateral deformation time sequence image when the tested beam body is subjected to transverse excitation, constructing a structure global displacement field based on the time sequence image, and realizing accurate conversion from pixel coordinates to engineering data; the method comprises the following steps: obtaining an impulse response function of a tested beam body based on an earthquake interference method, determining a time domain theoretical model of the earthquake interference method, and solving modal parameters of the time domain theoretical model of the earthquake interference method by using a least square method, thereby improving the accuracy of modal parameter identification, reducing the uncertainty in modal parameter identification, and improving the accuracy of modal parameter identification. The spatial resolution of structural modal identification is improved, and dense measurement of vibration modes is realized.

The present invention relates to an optical modulation system based on the interaction of two collinear light beams having different wavelengths passing through a cuvette containing a solution of Cs2SnI6, comprising a pumping laser emitter emitting a modulated pumping beam with a wavelength between 355 nm and 1550 nm and with a variable frequency; a test laser emitter emitting a continuous wave test beam at 633 nm and with a power limited to 10 mW; a beam splitter where the pumping and test beams are combined to strike on the cuvette; a pass filter that removes the signal from the pumping beam; a spatial analysis camera; a time / frequency analysis equipment with a photodetector, a commercial lock-in amplifier and an oscilloscope; and a signal generator.

This invention discloses a laser beam identification device and method for identifying whether a test beam is a first laser beam or a second laser beam, wherein the spectral widths of the first and second laser beams are different. The laser beam identification device includes a beam expander, an aperture, and a detector. The beam expander allows the output beam formed after the test beam passes through to be incident on a first and a second slit in the aperture. The output light from the first and second slits interferes. The detector is located on the light-emitting side of the aperture and is used to detect the light intensity at at least two positions, which are different positions along the direction of the interference fringes. Based on the light intensity at these at least two positions, the detector determines whether the light field distribution at these positions is a fringe distribution or a uniform field distribution, thereby determining whether the test beam is the first or the second laser beam. This invention has low cost, relatively small size, and low power consumption.

A method for improving OCT imaging accuracy. The present invention relates to the field of processing detection technology, and specifically to the field of a method for improving OCT imaging accuracy. The present invention introduces an electrically controlled crystal in the propagation direction of a reference beam, and controls the electrically controlled crystal by applying an external electric field to change its refractive index, thereby changing the light intensity of the reference beam, making its light intensity equal to the light intensity of a test beam reflected from the surface of the inspected material, thereby improving the OCT imaging accuracy. The method for improving OCT imaging accuracy comprises: a reference beam and a test beam; an electrically controlled crystal is provided in the propagation direction of the reference beam; the electrically controlled crystal is used to adjust the light intensity of the reference beam to obtain a reference beam with adjusted light intensity; the test beam is reflected from the surface of the inspected material to obtain a returned test beam; when the light intensity of the reference beam with adjusted light intensity is equal to the light intensity of the returned test beam, the OCT imaging accuracy is improved.

The invention discloses an array optical waveguide detection system and method, and the system comprises a light source which is used for transmitting a test light beam, transmitting the test light beam to a waveguide substrate, enabling the test light beam to enter an array optical waveguide through a first surface and then to be transmitted to an array spectroscope, the light is emitted to the second surface after passing through the array spectroscope; the detection assembly is used for receiving the test light beam emitted from the second surface so as to detect the parallelism of the array spectroscope; the incident angle of the test light beam emitted to the waveguide substrate is theta, theta = arcsin (n.sint), t meets: t is the refraction angle of the test light beam entering the waveguide substrate through the first surface, n is the refractive index of the waveguide substrate, and alpha is the included angle between the array spectroscope and the first surface. According to the array optical waveguide detection system, the measurement precision of the detection system can be improved.

The application discloses a kind of ultra-long curvature radius convex spherical surface shape measurement systems, the surface shape measurement system includes interferometer, spherical standard mirror, aberration compensation lens and the convex spherical mirror to be measured in same optical axis, the aberration compensation lens is concave on the side of the convex spherical mirror to be measured;Light beam emitted by interferometer, part is reflected back to interferometer by spherical standard mirror, forms reference beam, another part passes through spherical standard mirror, aberration compensation lens, is irradiated on the convex spherical mirror to be measured, is reflected twice by the convex spherical mirror to be measured, finally, it is back to interferometer by aberration compensation lens, spherical standard mirror, forms test beam;Reference beam and test beam interfere, form interference fringe, obtain the surface shape error of measured surface by analyzing interference fringe.The application solves the problem that the size of detection equipment is large, the cost is high and difficult to realize in prior art for detecting ultra-long curvature radius convex spherical mirror surface shape.

The present application discloses a performance test system and method for an intersatellite network optical terminal, which relates to the field of satellite optical communication technology. The test system is applied to the aiming, capturing and tracking test of the network optical terminal to be tested. The test system includes: an optical path switching module, which is used to switch the optical path according to the optical path switching instruction; an intersatellite beam dynamic simulation module is used to receive the test beam emitted by the network optical terminal to be tested through the switched optical path, and simulate and monitor the intersatellite transmission of the test beam; the ground inspection optical terminal is used to generate an auxiliary beam according to the test needs, and send it to the optical terminal through the intersatellite beam dynamic simulation module; the host computer is used to test the network optical terminal to be tested through the intersatellite beam dynamic simulation module, and generate the test results of the network optical terminal to be tested based on the optical axis calibration results, optical path trajectory, and time data. The above test system is used to realize the performance test of the network optical terminal in different scenarios, reduce the difficulty of optical path installation and adjustment of the test system, and improve the test efficiency.

According to an exemplary embodiment, a secondary battery manufacturing apparatus is provided, the apparatus including a first beam source configured to generate a welding beam, a second beam source configured to generate an inspection beam, a scanner head configured to direct the welding beam and the inspection beam to a module frame, a servo motor configured to move the scanner head, a detector configured to sense a reflected beam that is a portion of the inspection beam reflected from the module frame, a processor configured to collect assembly line data of the module frame based on an inspection signal generated by the detector, and a controller configured to control the servo motor based on the assembly line data of the module frame.

A method and an apparatus for calibrating an array path of a beam forming test equipment for a base station, includes enabling a beam forming-related interlocking test of a base station and a test equipment by compensating for distortion of the beam forming characteristics of the base station incidentally caused by the connection between the base station and the test equipment by using a specific signal transmitted from the base station, when test equipment such as a channel simulator is used to test beam forming of a base station.

The invention discloses a performance test system and method of an inter-satellite networking optical transmitter and receiver, and relates to the technical field of satellite optical communication, the test system is applied to aiming, capturing and tracking test of a networking optical transmitter and receiver to be tested, and the test system comprises an optical path switching module used for switching optical paths according to an optical path switching instruction; the inter-satellite light beam dynamic simulation module is used for receiving a to-be-measured light beam emitted by the to-be-measured networking optical transceiver through the switched light path, and performing inter-satellite transmission simulation and monitoring on the to-be-measured light beam; the ground detection optical transceiver is used for generating an auxiliary light beam according to a test requirement and sending the auxiliary light beam to the optical transceiver through the inter-satellite light beam dynamic simulation module; and the upper computer is used for testing the networking optical transmitter and receiver to be tested through the inter-satellite light beam dynamic simulation module, and generating a test result of the networking optical transmitter and receiver to be tested based on the optical axis calibration result, the optical path track and the time data. Through the test system, the performance test of the networking optical transceiver in different scenes is realized, the optical path installation and adjustment difficulty of the test system is reduced, and the test efficiency is improved.

A system and method for measuring refractive index inhomogeneity between plates of a light-guiding optical element (LOE) using an innovative measurement technique based on shearing interferometry techniques commonly used to observe interference and collimation of test beams. Another feature of the current implementation is an innovative method for analyzing features of the generated interferogram to characterize differences between adjacent plates in a LOE.

The invention discloses a spectrum confocal displacement measuring device and method based on a random structure mask dispersion probe, and relates to the technical field of optical precision measurement, and the device comprises a broadband spectrum light source, an optical fiber, a random structure mask, a dispersion objective lens, a spectrometer and an upper computer; the wide-spectrum light source emits a wide-spectrum light beam, and the wide-spectrum light beam is transmitted to the random structure mask through the optical fiber; the random structure mask converts the wide-spectrum light beam into a multi-aperture emergent light beam; the dispersion objective lens performs axial dispersion on the multi-aperture emergent light beam to obtain a test light beam; the test light beam is reflected on the surface of the tested object to form reflected light; the dispersion objective lens is also used for collimating the reflected light; the spectrograph receives and processes the collimated reflected light to obtain a test spectrum curve; and the upper computer determines the displacement value of the measured object according to the test spectrum curve. According to the invention, the luminous flux injected into the optical fiber from the light source can be effectively improved, the spectrum peak value is better extracted, and the measurement precision is further improved.

A detection system includes: at least one light source that outputs a plurality of test beams input to a proximal end portion side of an optical fiber and having different wavelengths and providing different bending losses of the optical fiber; at least one reflector that reflects each of the test beams propagating through the optical fiber, on a distal end portion side of the optical fiber; a plurality of light receiving units that receive a plurality of reflected beams each being a beam reflected by the at least one reflector, on the proximal end portion side; and a determination unit that, based on information about the reflected beams at the plurality of light receiving units, compares the information about the reflected beams with reference set values.

The invention discloses an optical axis registration system and method for a large-scale optical system with limited installation and adjustment space. The system comprises a front optical machine system of which emergent light is parallel light and a rear optical machine system of which incident light is parallel light, the front optical machine system comprises a front optical machine system optical axis marking mirror, and the rear optical machine system comprises an electric control reflex mirror and a rear optical machine system optical axis marking mirror; an auxiliary optical calibration component is placed in a butt joint optical path of the front optical machine system and the rear optical machine system, and an autocollimator is further arranged, wherein the optical axis of a test light beam emitted by the autocollimator is perpendicular to the butt joint optical path of the front optical machine system and the rear optical machine system; the auxiliary light correction component comprises a first parallel plate, a first 45-degree reflector, a second 45-degree reflector and a second parallel plate. A first 45-degree reflecting mirror and a second 45-degree reflecting mirror which form an included angle of 90 degrees are arranged between the first parallel flat plate and the second parallel flat plate which are arranged in parallel. According to the invention, high-precision registration of the optical axes of two large-size and large-mass large optical systems can be realized under the condition that the installation and adjustment space is limited.

The present invention belongs to the technical field of mechanical property testing and discloses a test method for composite bending and shear loading of beam webs. S1: Calculate the width of the upper and lower edge reinforcement plates at any position in the length direction of the test beam, and design and manufacture the upper and lower edge reinforcement plates based on the calculated widths; S2: Fix the upper and lower edge reinforcement plates to the upper and lower edge plates of the test beam respectively; S3: Fix the first end of the test beam, the upper and lower edge reinforcement plates on the same side to the fixed end; S4: Calculate the load force required to be applied by the loading assembly at the second end of the test beam; S5: Apply the load force to the second end of the test beam through the loading assembly. In the present invention, the upper and lower edge reinforcement plates are used to ensure uniform loading of the beam web of the test beam, accurately simulate the actual force of the beam web, accurately test and verify the beam web, and ensure the stability of the test beam in actual use.

The present invention discloses a loading method suitable for static and dynamic load tests in old bridge sites. Before the static and dynamic load tests are carried out, a pedestal foundation and a reaction frame foundation are set at the test site to locate the test area, and then a track and a mobile pedestal are set to carry the test beam to the test area. After the beam is carried to the test area, a jack is installed using the reaction frame. The overall test site has fewer installation structures, fewer reaction frames, a high degree of prefabrication, and convenient transportation of small-volume components. The assembly process is simple and safe, the operation space is large, and repeated test operations are convenient. The mobile pedestal simultaneously has the functions of carrying the test beam and limiting and supporting the beam in static and dynamic load tests. The method has strong applicability and can meet the static and dynamic load test requirements of beams with various cross-sections such as T-shaped, I-shaped, and box-shaped by changing the positions of the mobile pedestal, the reaction frame, the jack, and the distribution beam.

This invention discloses a tilted wavefront sub-aperture stitching interferometric detection method based on a spatial light modulator, relating to the field of optical detection. Light emitted from a laser is collimated and expanded before being incident on a polarizing beam splitter; the reflected light serves as a reference beam, and the transmitted light as a test beam; the test beam is incident on a spatial light modulator, and after phase modulation by the spatial light modulator and passing through a lens, it forms standard spherical waves with different tilt angles, allowing for zero-position detection of sub-apertures divided into different regions. Using a spatial light modulator as an ideal point source array generator in conjunction with an imaging lens can generate the required ideal tilted spherical waves for different test parameters, offering strong versatility compared to traditional point source generators. Furthermore, for large-aperture complex curved surfaces, sub-aperture stitching can be achieved without moving the interferometric device, reducing errors introduced by mechanical movement.

The present invention belongs to the technical field of semiconductor lasers; in the study of traditional catastrophic optical damage of the cavity surface, the change in reflectivity is used to monitor the development of cavity surface damage and the detection of temperature changes. There is a lack of direct measurement of the change in reflectivity, and the temperature change cannot be accurately measured. The present invention provides a method for measuring the cavity surface temperature of a semiconductor laser, which introduces a polarization beam splitter, a differential detector, and a lock-in amplifier to achieve direct measurement of the change in reflectivity. The test beam is separated into a reference beam and a test beam. After reflection, the test beam and the reference beam are jointly focused on the differential detector through a second polarization beam splitter. The obtained differential signal is measured by the lock-in amplifier to measure the change in reflectivity and calculate the change value of the cavity surface temperature. The present invention uses a differential detector to avoid possible input saturation of the lock-in amplifier and eliminate experimental noise sources that may affect the reference and reflected beams, achieving higher measurement accuracy.

The utility model discloses a testing device for an infrastructure high-performance anti-crack sealing layer, which comprises a testing beam, a reinforcing mesh is arranged in the testing beam, a testing groove is arranged in the middle of the upper end of the testing beam, an anti-crack sealing layer is arranged at the top end of the testing beam, and part of the anti-crack sealing layer covers the testing groove. A test groove is formed in the test beam, detection liquid is arranged in the test groove, a pressure applying device is arranged above the test beam, the test groove is positioned between two pressure points of the pressure applying device, and a support frame is arranged below the test beam. Compared with the prior art, the device has the advantages that downward pressure is applied to the test beam through the pressure applying device, when the test beam at the test groove is cracked, whether water seepage occurs or not is observed, if not, the performance of the anti-crack sealing layer reaches the standard, and otherwise, the anti-crack sealing layer fails. The whole structure is simple, and the real stress of cracking of the anti-crack sealing layer of the bridge floor can be simulated. Secondly, whether the crack-resistant seal coat is damaged or not is judged by observing whether the test beam has a water seepage phenomenon or not, the operation is simple, and the judgment is clear.

The application provides a kind of beam spot test method and device, the beam spot test method includes: the corresponding relationship curve between the gray scale of radiation color film and the radiation dose of accelerating tube is established;Radiation color film is placed on test table, the distance between radiation color film and the beam end of accelerating tube is adjusted to measurement distance;Accelerating tube is controlled to be in working condition, to output the preset dose of electron beam irradiation on radiation color film;Remove the color change after radiation color film and scan to obtain gray scale image;According to corresponding relationship curve and gray scale image, dose contour map is obtained;According to dose contour map, the beam spot size of electron beam at measurement distance is obtained.In the process of testing beam spot size, the distance between radiation color film and the beam end of accelerating tube can be adjusted, and then the shape of beam spot can be corrected to the preset shape, to improve the accuracy of beam spot size measurement.

The invention relates to an alignment device for aligning an optoelectronic sensor, comprising at least one transmitting channel for emitting a test light beam and at least one receiving channel for receiving a test light beam emitted by an associated transmitting channel. The at least one transmitting channel includes a light source for generating the test light beam. The at least one receiving channel includes a light receiver and a receiving optics arrangement for focusing the received test light beam onto the light receiver. In at least one receiving channel, a receiving filter is provided upstream of the light receiver, which has a transmission profile with a transmission gradient and is arranged such that the received test light beam passes through different sub-regions of the receiving filter depending on its angle of incidence into the receiving channel.The invention further relates to a corresponding alignment device with a transmitting filter, a method for aligning an optoelectronic sensor and an optoelectronic sensor with an alignment device according to the invention.

The invention relates to the technical field of optical precision measurement, and discloses an angle measurement method and device based on micro-wavelength-difference dual-wavelength interference, and the method comprises the following steps: employing a micro-wavelength-difference dual-wavelength extended light source, and generating equal-inclination interference fringes through a Michelson interferometer; a linear moving mechanism capable of adjusting the inclination direction is utilized to enable the plane mirror of the test light beam to move along the inclination direction; the inclination angle is indirectly measured through the fringe change characteristics of micro-wavelength difference dual-wavelength interference. The interference method and device for angle measurement are simple and easy to implement and convenient to install and debug; the method is suitable for high-precision measurement of tiny angles and angles near 180 degrees; fuzzy or clear interference fringes are used as judgment and positioning basis, response is sensitive, accuracy is good, and the method is also suitable for computer automatic analysis and processing; high-precision angle measurement is obtained through a low-precision linear displacement mechanism, and the second order-of-magnitude precision can be obtained.