433results about How to "Fast measurement speed" patented technology

Methods, systems, and apparatuses are provided for estimating a location on an object in a three-dimensional scene. Multiple radiation patterns are produced by spatially modulating each of multiple first radiations with a distinct combination of one or more modulating structures, each first radiation having at least one of a distinct radiation path, a distinct source, a distinct source spectrum, or a distinct source polarization with respect to the other first radiations. The location on the object is illuminated with a portion of each of two or more of the radiation patterns, the location producing multiple object radiations, each object radiation produced in response to one of the multiple radiation patterns. Multiple measured values are produced by detecting the object radiations from the location on the object due to each pattern separately using one or more detector elements. The location on the object is estimated based on the multiple measured values.

The present invention provides a slit-scan multi-wavelength confocal lens module, which utilizes at least two lenses having chromatic aberration for splitting a broadband light into continuously linear spectral lights having different focal length respectively. The present invention utilizes the confocal lens module employing slit-scan confocal principle and chromatic dispersion techniques and the confocal microscopy with optical sectioning ability and high resolution in spectral dispersion to establish a confocal microscopy method and system with long DOF and high resolution, capable of modulating a broadband light to produce the axial chromatic dispersion and focus on different depths toward an object's surface for obtaining the reflected light spectrum from the surface. Thereafter, the spectrum is spatially filtered by a slit and then a peak position with respect to the filtered spectrum along the scanning line is detected by a spectral image sensing unit for generating the sectional profile of the measured surface.

The photonic mixer comprises a couple of an injecting contact region (3,4) for injecting the majority carrier current into the semiconductor substrate (1) and a detector region (7,8) for collecting the photocurrent. The injecting contact region (3,4) is doped with a dopant of the first conductivity type (p+) at a higher dopant concentration than the semiconductor substrate (1). The detector region (7,8) is doped with a dopant of a second conductivity type (n+) opposite the first conductivity type and has a junction (11,12) with the semiconductor substrate (1), a zone of the semiconductor substrate (1) around said junction (11,12) being a depleted substrate zone (101, 102). The couple further comprises a field shaping zone (13, 14) of the first conductivity type (p−) defining a lateral edge of the couple and having a dopant concentration higher than the dopant concentration of the semiconductor substrate (1), for example between the dopant concentrations of the semiconductor substrate (1) and the injecting contact region (3,4), which field shaping zone (13, 14) is designed to limit said depleted substrate zone (101, 102) laterally.

Methods, systems, and apparatuses are provided for estimating a location on an object in a three-dimensional scene. Multiple radiation patterns are produced by spatially modulating each of multiple first radiations with a distinct combination of one or more modulating structures, each first radiation having at least one of a distinct radiation path, a distinct source, a distinct source spectrum, or a distinct source polarization with respect to the other first radiations. The location on the object is illuminated with a portion of each of two or more of the radiation patterns, the location producing multiple object radiations, each object radiation produced in response to one of the multiple radiation patterns. Multiple measured values are produced by detecting the object radiations from the location on the object due to each pattern separately using one or more detector elements. The location on the object is estimated based on the multiple measured values.

An apparatus and method for measuring and mapping thermal conductivity and thermal diffusivity at micrometer scale resolution. The apparatus and method utilize a mode-locked femtosecond pulsed laser in a pump-probe configuration to analyze time-domain thermoreflectance of a specimen to evaluate its thermal conductivity in micro-scale, so that, if desired, an image of thermal conductivity distribution of micro-scale regions may be obtained therefrom. A multi-layer, complete three-dimensional model that takes into account the entire three-dimensional heat flow in cylindrical coordinates enables micro-scale measurements to be made at an accuracy of about 90% of well-accepted values.

Temperature measuring equipment and method thereof are disclosed, wherein the positions of privileged sites of a target to be measured are positioned; the thermo-detector is moved to aim at the positions of the determined privileged sites mentioned above; measuring the temperature of said privileged sites; correcting the measured temperature by the thermo-detector, according to the position relation between the target to be measured and the thermo-detector. The present invention can obtain positioning information of accurate sites, with improved temperature measurement accuracy.

The present invention relates to the field of optical precision measurement technologies, and in particular, to a method and a device of differential confocal (confocal) and interference measurement for multiple parameters of an element. The core concept of the invention lies in that: the concurrent high-precision measurement of multiple parameters of an element may be realized by measuring the surface curvature radius of an element with spherical surface, the back focal length of a lens, the refractive index of a lens, the thickness of a lens and the axial spaces of an assembled lenses by using a differential confocal (confocal) measuring system and measuring the surface profile of the element by using a figure interference measuring system. In the invention, a differential confocal (confocal) detection system and a figure interference measuring system are combined for the first time, the method covers more measured parameters, and during the measurement of multiple parameters of an element, it is not essential to readjust the optical path or disassemble the test element, thus no damage will be caused on the test element, and the measurement speed will be fast.

The invention discloses different system measuring method and equipment. The method comprises the following steps: a network side informs the up and down conversion information of a terminal different system neighbor cell and / or the network side informs whether the terminal different system neighbor cell is synchronous with the cell; a terminal acquires the data of a time slot or subframe to be measured in a different system according to the up and down conversion configuration information; and measurement is carried out and / or the terminal determines whether synchronous search is required when a neighbor cell is measured according to the synchronous condition of the different system neighbor cell. The invention can reduce the calculation amount of terminal measurement, decrease complexity and improve measuring speed and accuracy when the terminal carries out different system neighbor cell measurement, and also can avoid blindness on operating the terminal.

The invention relates to a Fabry-Perot interference absolute distance measurement method based on a femtosecond optical frequency comb and a device thereof. Two tunable lasers with frequency capable of being tuned within a large range and free of mode skip are simultaneously adopted, the optical wavelengths of the two lasers are respectively locked on two transmission peaks at a distance of N free spectral ranges of a to-be-detected Fabry-Perot cavity with the cavity length located in a vacuum vibration isolation cavity by utilizing the Pound-Drever-Hall (PDH) method, a wavemeter and an optical frequency comb system are used to respectively measure absolute frequency of two beams of laser, and then the free spectral ranges of the to-be-detected Fabry-Perot cavity are obtained. The cavity length of the to-be-detected Fabry-Perot cavity is obtained by means of the relationship between the to-be-detected cavity length and the free spectral ranges, frequency of the two tunable lasers can be tuned within a large range and free of mode skip, and measurement range is increased. Meanwhile, frequency of the two lasers is locked, and measurement speed can be increased. The optical frequencycomb system for measuring the frequency of the two lasers enables recurrence frequency and off-set frequency to be traced to the source of microwave frequency standard so that measurement results canhave traceability.

The invention discloses a photoetching machine projection objective wave aberration on-line detector and a method. A diffuser is integrated on an object space mask plate which is arranged on the object plane of a projection objective, fixed, supported and driven by an object space work piece table in the photoetching machine; an image space mask plate is arranged on the image plane of the projection objective, supported and driven by an image plane work piece table. A collimator objective is arranged after the image surface of the projection objective; and the focal plane of the object space of the collimator objective is coincided with the image plane of the projection objective. Shearing mechanism is arranged between the projection objective and a photoelectric detector. The invention can realize the continuous tunableness of the shear ratio and increases the measuring sensitivity and measuring accuracy; secondly, a square hole is used for expanding the light source, thus increasing the utilization factor of the light intensity of the exposure light source, the measuring speed and measuring accuracy; and finally, the system error self-calibration technology can rapidly obtain the wave aberration of the projection objective with high precision.

An inspection apparatus comprises an illumination system (12) for illuminating a target structure with illuminating radiation and a collection system for collecting the illuminating radiation after it has been scattered by the target structure. A programmable spatial light modulator (713) comprises an array of movable mirror elements (742) in a conjugate pupil plane (P″) of the illumination system. Between the array of mirror elements and the target a common optical path is defined forming part of the illumination system and the collection system. Each mirror element is movable between a first position where it reflects illuminating radiation into the common optical path and a second position where it reflects radiation from the common optical path toward a detector (19, 23). Various combinations of illumination aperture and collection aperture can be defined without the light losses associated with beam splitters and transmissive spatial light modulators.

The invention discloses a space locating method that is based on a network of planar dual-rotation laser transmitters, the rotation of three or more than three rotating transmitters are driven by an alternate current servo motor, the rotating transmitters that have two linear laser devices arranged on the head part transmit laser signals continuously to the surrounding space, the time distance of OZ pulse between a laser peak position that is sampled by a receiver module that takes a photocell as a sensor and a time origin is converted into a rotating angle of a laser plane, and consequently, the equation of the laser plane where measured points are positioned is deduced, an equation of a straight line that runs through the measured points is further obtained, an equation set is built according to the intersection method of multiple lines, and finally the equation set is solved by the least square method, thus obtaining the coordinate positions of the measured points. The space locating method avoids object aiming when measuring, and improves measuring speed and efficiency.

The invention discloses an optical hybrid detection method for 3D contours, comprising the following steps: S1, laser cutter and grating projection is implemented through an MEMS laser projector; and S2, matching is carried out, the parallax is calculated, and reconstruction is carried out based on the parallax and binocular stereo vision. Laser cutter-based and grating-based hybrid measurement is completed in the same measurement system through an MEMS projection technology, and the 3D contours of objects with different surface characteristics can be measured quickly. A laser cutter-based measurement method and a grating-based measurement method are implemented in the same measurement system without adding any hardware equipment. The projection device adopted can project multiple laser cutters quickly. The accuracy and speed of measurement are improved.

A near infrared (NIR) semiconductor laser system is shown for gas sensing. An embodiment is centered on the use of a system with a much wider tunable laser, which today has a scan band of more than 150 nanometers (nm) to as much as 250 nm or more. In some cases the scan band is about 400 nm or more. This is achieved in the current embodiment through the use of a widely tunable microelectromechanical system (MEMS) based Fabry-Perot filter as an integral part of the laser cavity. Using this technology, these systems are capable of capturing a variety of gases in the any of the well-known spectroscopic scan bands, such as the OH, NH or CH. For example, a single laser with a 250 nm scan band window between 1550-1800 nm can capture ten or as many as twenty hydrocarbon-based gases simultaneously.

The invention provides an automatic test system for a millimeter wave receiver. The system realizes automatic test for a noise coefficient, an amplitude-frequency characteristic, a multi-channel phase consistency index of the millimeter wave receiver in a mode of frequency scanning. The system comprises a noise coefficient test sub-system, an amplitude-frequency characteristic test sub-system anda phase consistency test sub-system. Each of the three sub-systems comprises a main control computer for automatic control, and a GPIB data card. The amplitude-frequency characteristic test sub-system and the phase consistency test sub-system also comprise a millimeter wave frequency multiplication module for performing frequency multiplication on signals to an operating frequency of a test device. The automatic test system can completely realize the automatic test for the radio frequency index of the millimeter wave receiver by utilizing the conventional test device, solves the problem that the conventional millimeter wave test method and test device in China are absent, and overcomes the defects that a manual test wastes much time and energy, data points are less and the accuracy is low.

The present invention aims to provide a time-of-flight based mass microscope system for an ultra-high speed multi-mode mass analysis, for using a laser beam or an ion beam simultaneously to enable both a low molecular weight analysis such as for drugs / metabolome / lipids / peptides and a high molecular weight analysis such as for genes / proteins, without being limited by the molecular weight of the object being analyzed, and for significantly increasing the measuring speed by using a microscope method instead of a microprobe method.

The invention discloses an imaging ellipsometer based on magneto-optical effect, which relates to a film thickness measurement method and a device, particularly to a method and a device for observing the thickness distribution of a nano film on the surface of a sample. The ellipsometer is characterized in that a polarizer, a compensator and an analyzer capable of rotating in the direction of a transmission axis are adopted to correct a system, a magneto-optical modulation technology is adopted to change the polarization direction of the received light, a plane array detector is adopted to record the ellipsometry images of the film on the surface of the sample, iterative algorithm is adopted to process the data, and the shape parameters of the film on the surface of the sample are precisely measured. The imaging ellipsometer based on magneto-optical effect solves the defects of the prior art, improves the precision in detecting the polarization of the received light, and improves the measurement speed.

In order to reproduce a three-dimensional shape of an object accurately while maintaining measuring accuracy and high speed, in a three-dimensional measuring method of projecting a stripe pattern having colored stripes on the object and measuring the three-dimensional shape of the object based on stripe positions on the imaged image corresponding to the stripes on the stripe pattern, colors of the stripes on the stripe pattern are set according to a predetermined rule, and a plurality of stripes having a predetermined positional relationship are extracted from the image, and correspondence with stripes on the stripe pattern based on the color arrangement of the extracted plural stripes.

The invention discloses an OCT (Optical Coherence Tomography) system for measuring the optical path value of an axis oculi and a method. The system comprises an OCT system light source, an optical fiber coupler, a detection system, a control system, a sample arm component, a reference arm component, a cornea before-and-back position alignment component and an outer eye camera component, wherein the outer eye camera component is used for monitoring an iris of eyes under test, and an operator controls the sample arm component to adjust a corneal vertex to the main optical axis of the OCT system according to the iris; the control system is used for judging the distance from the corneal vertex to an eye objective lens, and the distance from the corneal vertex to the eye objective lens is adjusted to meet the requirement on work of the system by means of the before-and-back adjustment of the sample arm component controlled by the control system; an optical path adjusting component adjusts the optical path of the sample arm component, and thus fundi of different human eyes are matched with the optical path of a reflector of a reference arm of the system to realize the OCT imaging of the fundi; the optical path value LEye of the axis oculi of the human eye can be measured according to the formula: LEye=LRDK1toEc+S+hRetinal. According to the OCT system for measuring the optical path value of the axis oculi and the method, the corneal vertex is accurately positioned, and by combining with the fundus OCT imaging technology, the test result of the optical path value of the axis oculi of the human eye is more accurate.

The invention discloses a device for determining a border of a target region of a medical image, which is used for differentiating the border of the target region according to corresponding physical quantitative properties reflected by tissue distribution in the medical image. The device comprises: an interactive unit, by which an operator can select the target region on the medical image; a threshold setting unit, which determines threshold values of the physical quantitative properties in the target region selected; and a thresholding segmentation unit, which divides the region to be analyzed or the region of interest into sub-regions, or fills image cells (pixels) in the region to be analyzed, wherein the region to be analyzed contains the target region, and the sub-regions are the sub-regions which are segmented in the image. The thresholding segmentation unit compares average parameter values of the physical quantitative properties of each sub-region with the threshold values and marks all the cells according to comparison results. The present invention provides a calculating and processing method and a device with clear physical significance and a simple and effective algorithm, and the method and the device are particularly suitable for processing special situations of various hearts with pathological changes in clinical art.

An electrically conductive nanoscale pore may be employed as an antenna to provide precise localized measurements of the impedance-altering characteristics of a molecule such as DNA or RNA or the like passing through the pore. The use of radiofrequency measurements promises high-speed analysis of long molecules (polymers).

An amount of pattern position displacement between observation images acquired by irradiating from two different directions is changed depending on beam deflection for moving an image acquisition position. In a pattern evaluation method that measures astigmatic difference or focus position displacement having a small amount of dose at a high speed using parallax caused by the tilted beam, a correction value obtained in advance by measurement is reflected in an amount of pattern position displacement between observation images obtained by irradiating from at least two different directions and generated in accordance with the amount of beam deflection for moving an image acquisition position. A processing unit calculates an amount of correction of an amount of pattern position displacement depending on beam deflection of a beam deflecting unit for moving an image acquisition position on the sample at a high speed.

The present invention provides a slit-scan multi-wavelength confocal lens module, utilizing at least two lenses having chromatic aberration for splitting a broadband light into continuously linear spectral lights having different focal length respectively. The present invention utilizes the confocal lens module employing slit-scan confocal principle and chromatic dispersion techniques and the confocal microscopy with optical sectioning ability and high resolution in spectral dispersion to establish a confocal microscopy method and system with long DOF and high resolution, capable of modulating a broadband light to produce the axial chromatic dispersion and focus on different depths toward an object's surface for obtaining the reflected light spectrum from the surface. Thereafter, the spectrum is spatially filtered by a slit and then a peak position with respect to the filtered spectrum along the scanning line is detected by a spectral image sensing unit for generating the sectional profile of the measured surface.

The invention provides a method and a system for measuring parameters of round holes in a plate. The method comprises the following steps: obtaining inner and outer parameters of a multi-view camera; performing image acquisition on the plate by utilizing the multi-view camera to obtain a local plane grey image of the plate; obtaining pixel values of characteristic parameters of linear segment end points and the round holes in the plate according to the local plane grey image; determining local space parameters of the round holes in each pair of binocular camera coordinate systems according to the pixel values of the characteristic parameters of the round holes in the local plane grey image and the inner and outer parameters of the multi-view camera; switching and concatenating the local space parameters of the round holes in each pair of binocular camera coordinate systems through the inner and outer parameters of the multi-view camera, and determining overall space information of the round holes in the plate. According to the scheme, the measurement precision and the completeness of the holes in the plate are improved, the measurement speed of the holes in the plate is increased, and the measurement cost of the holes in the plate is reduced.

The invention relates to a device for measuring parallelism of sight axis and reception axis of a laser range finder based on liquid crystal modulation, which belongs to the technical field of optical precision measurement. The device comprises an off-axis parabolic mirror, a liquid crystal spatial light modulator, an integrating sphere, a visible light source, an optical fiber A, a laser delay module, an optical fiber B and a coupler, wherein the liquid crystal spatial light modulator is disposed on the focal plane of the off-axis parabolic mirror; the liquid crystal spatial light modulator, the integrating sphere, the optical fiber A, the laser delay module, the optical fiber B and the coupler are sequentially disposed behind the focal plane, and the coupler is connected with a laser emitter; and the visible light source is connected with the integrating sphere. The detection device uses the liquid crystal to perform electro-optical modulation to generate surface target for optoelectronic scanning. The invention can be used for rapid detection of the parallelism of sight axis and reception axis of the laser range finder in both indoor and outdoor environments; and has the advantages of high measurement success ratio, high precision and portability.

The invention discloses an optical measuring method and device for the spatial distribution of liquid droplets of a fuel nozzle. By using a characteristic that aromatic compounds in aviation kerosene can emit red-shift fluorescence signals under the excitation of ultraviolet light with a wavelength of 266 nm, a correction scheme for solving the problem that the measurement errors of spatial distribution of fuel are caused due to the attenuation of laser energy in a droplet cone is designed. The method and device disclosed by the invention are characterized in that the spatial distribution of the liquid droplets in the fuel droplet cone can be quickly and accurately measured, and have an advantage of flow field noninterference, transient and time average results can be obtained, and a deficiency that only an average result can be obtained by a fuel accumulation method is solved. The optical measuring method for the spatial distribution of liquid droplets of a fuel nozzle disclosed by the invention can be used for measuring the spatial distribution characteristics of the liquid droplets in the droplet cone of the fuel nozzle of an aero-engine or an internal combustion engine, and for fuel which does not contain fluorescent components, a tracer agent is required to be added.

The invention discloses a device and method used for on-line optical measurement of two-dimensional large size of roof battenwall materials, and belongs to the field of optical measurement on large-size geometric quantities. The measuring device comprises an optical sensing system, a data acquisition circuit system, a computer information processing system, a record display system, a warning system and a sorting control system, wherein the optical sensing system is composed of a high-resolution surface-array CCD (charge coupled device) camera, a low-distortion small-viewing-field standard lens matched with the camera, a quadrangular pyramid secondary reflection plane mirror, a high-transmittivity glass cover and four primary reflection plane mirrors, and is used for detecting the image information of four corners of a measured piece; and after calibration, the measuring device processes and computes the image information, so that the actual sizes of the measured piece are obtained and displayed. With the adoption of he device and the method provided by the invention, the problems of calibration and synchronous acquisition by a plurality of cameras are solved; and the device has high measurement speed and large-size measurement precision, and is widely applied for measuring sizes of ceramic piles, floor boards, marble tiles and the like.