Flight time based mass microscope system for ultra high-speed multi mode mass analysis
a multi-mode, mass microscope technology, applied in mass spectrometers, separation processes, dispersed particle separation, etc., can solve the problem that the above-mentioned technologies still have the equipment has a low-throughput measurement speed limitation, and the limitation of measuring speed cannot be overcome. the limitation of measuring speed, the effect of increasing the measuring speed
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Benefits of technology
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0041]100: Mass Microscope System[0042]110: laser input[0043]120: ion gun assembly[0044]130: sample inlet chamber[0045]131: sample inlet part[0046]140: sample plate[0047]150: sample plate manipulator[0048]160: charge-coupled device (CCD) camera[0049]170: source lens assembly[0050]180: linear mode position sensitive TOF detector[0051]190: reflectron mode position sensitive TOF detector[0052]50: ion optics assembly[0053]51: ion optics[0054]52: source assembly support[0055]53: mounting plate[0056]54: ground electric field shielding tube[0057]55: ion gate[0058]56: reflectron support[0059]57: reflectron[0060]511: outer extractor[0061]512: first inner extractor[0062]513: insulating spacer[0063]514: second inner extractor[0064]515: insulating spacer[0065]516: first ground electrode[0066]517: einzel lens[0067]518: second ground electrode
BEST MODE
[0068]Hereinafter, a time-of-flight based mass microscope system 100 for ultra-high speed multi-mode mass analysis according to the present inventi...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com