20 results about "Reflectron" patented technology

The mass spectrometer includes a storage device and an analyzer. The analyzer includes a mirror, an accelerator that receives ions from the storage device and pulses them onto one of the mirrors, causing the ions to reflect back and forth in a first dimension between the mirrors as the ions drift in the drift dimension, a reflector that reflects the ions in the drift dimension, a detector, and control circuitry that activates the reflector to make multiple passes along the drift dimension and deactivates one of the reflectors so that the ions pass to the detector and can be detected, the timing of the reflector activation and deactivation being such that only ions within a first range of mass-to-charge ratios undergo the same number of passes in the drift dimension at any one time that they are detected by the detector. The control circuitry synchronizes the time of pulses from the storage device with the time of pulses from the ion accelerator so that only ions having a mass-to-charge ratio within the first range are pulsed onto one of the mirrors by the accelerator.

The application relates to a high-performance small ion liquid antenna, which comprises a floor, a resonator arranged on the floor and a radiator arranged on the top of the resonator; the resonator and the radiator are both in a cylindrical structure and are internally communicated to form a containing cavity; ion liquid is arranged in the containing cavity to serve as a radiation source of the liquid antenna; the resonator is in a cylindrical structure or a hollow and inverted circular truncated cone structure; the radiator is multiple, and the multiple radiators are vertically stacked and distributed; the radiator is in an inverted circular truncated cone structure; further comprising a reflector; the reflector is in a cylindrical structure arranged on the floor, and the reflector is arranged outside the resonator and the radiator; further comprising a reflecting film; the reflecting film is arranged on the inner wall of the reflector to reflect electromagnetic waves radiated by the radiator. The application can expand the bandwidth of the antenna in a high frequency band, enhance the radiation performance, and is stable in dielectric performance, large in liquid working range, easy to install and integrate.

The application discloses a high-orbit LS dual-frequency full-polarization SAR system based on a ring-shaped reflector antenna, which comprises a dual-frequency radar central control processor, an LS dual-frequency common-aperture full-polarization feed array, a ring-shaped antenna reflector, an L-band full-polarization receiver and an S-band full-polarization receiver. The application has L and S dual-frequency bands and full-polarization ground imaging capability, and dual-frequency band data can be used for ionosphere measurement and ground surface deformation monitoring, thereby improving the application efficiency and competitiveness of the high-orbit SAR system.

The invention relates to a small-signal free radical infrared spectrum detection method. The method comprises the following steps: 1, acting photolysis laser on a precursor molecular beam source to obtain a free radical and precursor mixed beam source; 2, infrared laser and free electron laser act on the free radical and precursor mixed beam source to obtain a semi-excitation mixed ion beam source; 3, after the semi-excitation mixed ion beam source passes through an accelerator, a flight time difference T is formed between precursor ions and free ions in the semi-excitation mixed ion beam source; 4, the ion beam source enters a deflection electric field, a first electrode of the deflection electric field applies a voltage pulse signal set according to the flight time difference T, precursor ions deflect, move and are discharged when the voltage pulse signal exists, and the ion beam source enters a detector after passing through a reflector when the voltage pulse signal does not exist. Deflection, movement and discharge of precursor ions are realized in the deflection electric field, free radical ion signals can be increased, and measurement of small-signal free radical infrared spectrum is realized.

The patent proposes a method for improving the interval resolution of a reflective time-of-flight mass spectrometer. The principle of the invention is to apply a square wave pulse voltage on the reflector bottom plate during the spectrum acquisition process of the reflective time-of-flight mass spectrometer, and change the electric field intensity of the reflection area in the reflector, which can be used to improve the local resolution of the target ion mass range in the reflective time-of-flight mass spectrometer.

Provided is a three-dimensional shaped carbon structure having a nanocarbon structure, the nanocarbon structure including at least one of a petal-shaped structure with flaky carbons fixed into a petal shape, each of the flaky carbons having a graphene skeleton and a thickness of less than 20 nm; and a projected-and-recessed structure formed by an assembly of seed-shaped structures, each of the seed-shaped structures having a size of 1 to 100 nm. The carbon structure has a good formability and an excellent durability in high radiation fields, and is further useful as a reflector of a cold neutron or an extremely cold neutron that can achieve high strengths of the cold neutron and the extremely cold neutron through coherent scattering.

The invention relates to different variants of reflectors (220), which alone or together with a light unit (210) also described form a space-saving high-luminosity system.

Aspects of the present disclosure describe techniques for using a parabolic Cassegrain-type reflector for ablation. For example, a system for ablation loading of a trap is described that includes a reflector having a hole aligned with a loading aperture of the trap, and an atomic source positioned at a focal point of the reflector, where one or more laser beams are reflected from a reflective front side of the reflector and focused on a surface of the atomic source to produce an atomic plume, and the atomic plume once produced passing through the hole in the reflector and through a loading aperture of the trap for loading the trap. A method for ablation loading of a trap within a chamber in a trapped ion system is also described.

The application discloses a miniaturized compact vertical polarization end-fire microstrip antenna, which comprises an upper layer radiation patch structure, a middle layer dielectric substrate and a lower layer metal ground plate; the upper layer radiation patch structure is composed of a first patch serving as a driver and a second patch serving as a director; the first patch and the second patch are linearly arranged on the upper surface of the dielectric substrate along the end-fire direction and work at the fundamental TM 10 mode or TM 01 mode; the relative dielectric constant of the middle layer dielectric substrate is greater than or equal to 8, so as to shorten the distance between the first patch and the second patch working at the fundamental TM 10 mode or TM 01 mode; the equivalent magnetic current interval distance between the two radiation edges of the respective patches of the first patch and the second patch; the end-fire direction radiation is realized by adjusting the length of the circumscribed rectangle of the first and second patches in the end-fire direction and the coupling gap between the two patches; the application can be directly attached to a metal platform for use without an additional reflector and multiple directors, and has the advantages of compact structure, low profile, easy processing and adaptation to high-speed mobile carrier communication.

To efficiently operate a reflection plate capable of changing a reflection pattern.SOLUTION: A base station device receives, from a control device that controls a reflection plate that reflects a radio wave transmitted from one of a base station device and a terminal device, information indicating a time length from when setting a reflection pattern of the reflection plate is started to when the setting is completed, determines a specific reflection pattern to be set at the reflection plate and a first timing at which setting of the specific reflection pattern should be completed, specifies a second timing that is before the first timing by the time length or second timing that is timing before the timing, and transmits an instruction signal for instructing the control device to set the specific reflection pattern at the second timing.SELECTED DRAWING: Figure 5

To provide infrared reflectors with reduced off-axis color, which may be useful in laminated glass construction, particularly for applications where the glass may be exposed to water.SOLUTION: An infrared reflector 330 including a visible absorbing layer 370 is laminated between a first glass layer 310 and a second glass layer 312 via a first optically clear adhesive layer 320 and a second optically clear adhesive layer 322.SELECTED DRAWING: Figure 3

A substrate treating apparatus includes a support configured to support a substrate, a plasma source configured to excite a process gas and generate plasma, a grid assembly disposed to be spaced apart from the support in a first direction perpendicular to a surface of the support, the grid assembly being configured to extract and accelerate ions included in the plasma and generate ion beams, and a reflector disposed to be spaced apart from the grid assembly in the first direction, the reflector having a plurality of reflector holes configured to reflect and convert the ion beams into neutral beams, and a diameter of each of the plurality of reflector holes varies along the first direction.

An exemplary embodiment of the invention relates to a radiation emitter (100) comprising an upper contact layer (41), an upper layer stack (40) below the upper contact layer, an intermediate layer stack (30) below the upper layer stack (40), a lower layer stack (20) below the intermediate layer stack (30), and a lower contact layer (21) below the lower layer stack (20), wherein the upper layer stack (40) is electrically conductive and comprises at least one upper reflector (42), wherein the intermediate layer stack (30) comprises at least one active layer (31) and an aperture layer (32) that defines an aperture (32a), wherein the lower layer stack (20) is electrically conductive and subjected to electrical current during operation and comprises at least one lower reflector (22), wherein a mesa (50) extends from top of the radiation emitter downwards and includes the upper contact layer (41), the upper layer stack (40), the intermediate layer stack (30) and the lower layer stack (20), wherein a ring-shaped trench (60) is located within the mesa (50), extends from top of the radiation emitter downwards, and severs the upper contact layer (41) and the at least one upper reflector (42) of the upper layer stack (40), and wherein the ring-shaped trench (60) is at least partly filled with an electrically conductive material (70) that provides a ring-shaped electrical current path surrounding an inner electrical current path that passes through the upper layer stack (40).

Provided is a quadrupole acceleration time-of-flight mass spectrometer (1) capable of improving mass resolution without sacrificing signal intensity, mass accuracy, or manufacturing cost, the mass spectrometer comprising: an ion ejection section (123) configured to eject measurement target ions in a predetermined direction; a quadrupole acceleration section (132) configured to accelerate the ions in a direction orthogonal to the ion ejection direction; a ring electrode (131) disposed between the ion ejection section and the quadrupole acceleration section, the ring electrode forming an opening through which the ions pass, the center axis (C2) of the opening being disposed offset with respect to the center axis (C1) of the ion ejection section in a direction along the acceleration axis of the ions of the quadrupole acceleration section; a reflector electrode (134) configured to form a turnaround electric field that reverses the direction of the ions accelerated by the quadrupole acceleration section; and an ion detector (135) configured to detect the ions whose flight direction is reversed by the reflector electrode.

A method of operating a time-of-flight (TOF) mass analyser is disclosed, comprising injecting first and second ions into an ion path, causing the first ions to travel from an ion reflector 42b to a de

The present invention discloses a determination method, a system, a reflector, a standing tank external measurement type liquid level gauge and its installation method, and the standing tank external measurement type liquid level gauge, during operation, its ultrasonic emission probe is installed on the outer wall of the standing tank to be measured, the ultrasonic wave emitted from the ultrasonic emission probe penetrates the side wall of the standing tank and generates an ultrasonic emission source on the inner wall of the standing tank to be measured, the position point of the ultrasonic emission source is the focus of the reflector at the same time, the sound wave signal emitted by the ultrasonic emission source is emitted to the reflector, and after being reflected by the reflector, it is emitted parallel to the preset direction, and after being reflected by the liquid level of the standing tank to be measured, it can return to the ultrasonic emission source position according to the original road, and then penetrate the side wall of the standing tank and be received by the measuring head of the external measurement type liquid level gauge installed outside the side wall of the standing tank, and the external measurement type liquid level gauge determines the liquid level position of the standing tank to be measured according to the emitted ultrasonic signal and the received ultrasonic signal. Obviously, this application achieves the purpose of reducing the amount of calculation work and improving the work efficiency.