99results about How to "Improve quality resolution" patented technology

Rapid characterization and screening of polymer samples to determine average molecular weight, molecular weight distribution and other properties is disclosed. Rapid flow characterization systems and methods, including liquid chromatography and flow-injection analysis systems and methods are preferably employed. High throughput, automated sampling systems and methods, high-temperature characterization systems and methods, and rapid, indirect calibration compositions and methods are also disclosed. In preferred high-temperature embodiments, the polymer sample is maintained at a temperature of not less than about 75° C. during sample preparation, loading into a liquid chromatography or flow-injection analysis system, injection into a mobile phase of a liquid chromatography or flow-injection analysis system, and/or elution from chromatographic column. The described methods, systems, and device have primary applications in combinatorial polymer research and in industrial process control.

Rapid characterization and screening of polymer samples to determine average molecular weight, molecular weight distribution and other properties is disclosed. Rapid flow characterization systems and methods, including liquid chromatography and flow-injection analysis systems and methods are preferably employed. High throughput, automated sampling systems and methods, high-temperature characterization systems and methods, and rapid, indirect calibration compositions and methods are also disclosed. The described methods, systems, and devices have primary applications in combinatorial polymer research and in industrial process control.

Rapid characterization and screening of polymer samples to determine average molecular weight, molecular weight distribution and other properties is disclosed. Rapid flow characterization systems and methods, including liquid chromatography and flow-injection analysis systems and methods are preferably employed. High throughput, automated sampling systems and methods, high-temperature characterization systems and methods, and rapid, indirect calibration compositions and methods are also disclosed. The described methods, systems, and devices have primary applications in combinatorial polymer research and in industrial process control.

A novel apparatus for and a method of noise and spurious tones suppression in a digital RF processor (DRP). The invention is well suited for use in highly integrated system on a chip (SoC) radio solutions that incorporate a very large amount of digital logic circuitry. The noise suppression scheme eliminates the noise caused by various on chip interference sources transmitted through electromagnetic, power, ground and substrate paths. The noise suppression scheme permits an all digital PLL (ADPLL) to operate in such a way to avoid generating the spurs that would normally be generated from the injection pulling effect of interfering sources on the chip. The frequency reference clock is retimed to be synchronous to the RF oscillator clock and used to drive the entire digital logic circuitry of the DRP. This ensures that the different clock edges throughout the system will not exhibit mutual drift. A method of improving the resolution quality of a time to digital converter within the ADPLL is also taught. The method dithers the reference clock by passing it through a delay circuit that is controlled by a sigma-delta modulator. The dithered reference clock reduces the affect on the phase noise at the output of the ADPLL due to ill-behaved quantization of the TDC timing estimation.

In the mass spectrometer of the present invention, a flight space is provided before the mass analyzer, and the flight space includes a loop orbit on which ions fly repeatedly. While ions fly on the loop orbit repeatedly, ion selecting electrodes placed on the loop orbit selects object ions having a specific mass to charge ratio in such a manner that, for a limited time period when the object ions are flying through the ion selecting electrodes, an appropriate voltage is applied to the ion selecting electrodes to make them continue to fly on the loop orbit, but otherwise to make or let other ions deflect from the loop orbit. If ions having various mass to charge ratios are introduced in the loop orbit almost at the same time, the object ions having the same mass to charge ratio continue to fly on the loop orbit in a band, but ions having mass to charge ratios different from that are separated from the object ions while flying on the loop orbit repeatedly. Even if the difference in the mass to charge ratio is small, the separation becomes large when the number of turns of the flight becomes large. After such a separation is adequately achieved, the ion selecting electrodes can select the object ions with high selectivity, or at high mass resolution. By adding dissociating means, fragment ions originated only from the selected object ions can be analyzed, which enables the identification and structural analysis of the sample at high accuracy.

An image processing method obtains a glassless image from a color frontal facial image bearing glasses by using a recursive principal component analysis (PCA) reconstruction. The image processing method comprises the steps of a) receiving an RGB color frontal facial image; b) extracting candidates of eye regions from the received RGB color frontal facial image; c) determining an exact eye region out of the candidates and normalizing the received RGB color frontal facial image; d) extracting a glasses frame region by using color information contained in the received RGB color frontal facial image and edge information of a glasses frame; e) performing an RGB-HSI transformation on the normalized frontal facial image; f) generating H′, S′, and I′ glassless compensated images; g) obtaining R′, G′, and B′ compensated images by performing an HSI-RGB transformation on the H′, S′, and I′ glassless compensated images; and h) creating a glassless final color facial image on the basis of the R′, G′, and B′ compensated images.

The computer-controlled optical scanning high magnification microscope imaging system with a large field of view disclosed herein overcomes a previous inability to achieve simultaneous high magnification and large field of view in microscopes. The subject imaging system includes galvanometer scanners, a CCD camera and high brightness LED sources at different wavelengths for rapid acquisition of a large number of high-resolution segmented tile images with a magnification of 800× each. The numerous segmented tiles combine to form a larger viewing field of the target, resulting in a compound image with an effective enlarged viewing area of 1.6×1.2 mm². The speed and sensitivity of the system make it suitable for high resolution image monitoring of a small segmented area of dimensions 320×240 μm² with a 4 μm resolution. The microscope can zoom in on each segment of the target without lost of resolution to attain a great degree of spatial detail. With its special capacities, this microscope would be beneficial to medicine, biology, semiconductor inspection, device analysis and quality control, as well as with multiphoton and fluorescence microscopes to image large fields with high resolution.

The invention relates to the implantation field of broadband ion beams, and discloses a mass analyzing magnet for broadband ion beams. The mass analyzing magnet comprises a magnet and a coil connected with a power supply. The magnet comprises magnetic poles, a magnet yoke and magnetic shielding plates, the magnetic poles comprise an upper magnetic pole and a lower magnetic pole, the magnetic shielding plates comprise an upper magnetic shielding plate and a lower magnetic shielding plate, and a magnetic field space for the broadband ion beams to pass in a certain route is arranged between the upper magnetic pole and the lower magnetic pole. The invention further discloses an implanter system, which comprises an ion source, an extraction electrode unit, a deflection speed-reducing unit, a mass analyzing magnet, a target workpiece and workpiece transmitting unit, a beam flux measuring and diagnosing unit and a control unit. The invention has the beneficial effect of high quality resolution and nearly zero system aberration, and can generate pure broadband ion beams of 300mm, 450mm and even 1000mm, thereby improving the quality of ultra-low energy ion beams generated by a speed reducer and decreasing the angular dispersion of the ultra-low energy ion beams.

A time-of-flight measuring device for performing a hardware-based high-speed data compression process before transferring the data from a signal recorder to a data processor is provided. A time-series digital signal recorded by a signal recorder is converted to a plurality of time-series digital signals by being divided into a bit string including baseline information and a bit string not including the baseline information. Then, the time-series digital signal consisting of a bit string not including the baseline information is compressed by run-length encoding, such as zero length encoding or switched run-length encoding. Subsequently, static Huffman coding is performed on each of the time-series digital signals to reduce the data amount.

A telephoto lens system of a four-lens-group arrangement includes a negative first lens group, a positive or negative second lens group, a negative third lens group and a positive fourth lens group. The telephoto lens system of the four-lens-group arrangement is constituted by less than six lens elements in total. The positive or negative second lens group is constituted by a positive lens element and a negative lens element which are cemented to each other, in this order from the object. The positive lens element has a convex surface with a larger curvature facing toward the object. The positive or negative second lens group satisfies the following condition:

0.8<f2p/|f2n|<1.4  (1)

wherein f2p designates the focal length of the positive lens element in the second lens group; and f2n designates the focal length of the negative lens element in the second lens group.

The present invention aims at creating an accurate mass spectrum with a high resolving power based on a plurality of multi-turn time-of-flight (TOF) spectra, while reducing the amount of computation to assure the real-time processing. First, a plurality of TOF spectra each obtained for a different timing when ions are ejected from the loop orbit are measured (S2 and S3). At this point, the concept of the coincidence detection method is utilized to determine what mass-to-charge ratio a peak appearing on the TOF spectra originates from. From the information on the peak of interest in one TOF spectrum and other data, the time range in which a corresponding peak appears on other TOF spectra is set, and the existence or nonexistence of the peak in that range is determined (S5). In the case where the corresponding peak is found on most of the other TOF spectra, the m/z is deduced from the peak on the TOF spectrum with the highest resolving power and a mass spectrum is created (S6 and S7). At the same time, from the density of the peaks around the peak of interest, the reliability of the deduction is computed. For a peak with a low reliability, the ion ejection time is optimized and the TOF spectrum is measured again (S8).

The invention provides a lens group of an imaging system, which comprises a first lens, a second lens, a third lens, a fourth lens, a fifth lens and a sixth lens, wherein the first lens, the second lens, the third lens, the fourth lens, the fifth lens and the sixth lens are sequentially arranged from an object side to an image side; the third lens and the fourth lens form a glued assembly; and thefifth lens and the sixth lens form a glued assembly. The lens group can provide an imaging quality with high resolution and low aberration.

A mass spectrometer is provided for identifying mass and velocity distributions in a continuous ion beam is configured with a circular dispersive system creating a rotating electromagnetic field, which is capable of deflecting the ion beam from an initial direction, and a circular position-sensitive detector intercepting the deflected ion beam and providing information from which the ion mass-per-charge ratio is determined

A time-of-flight type mass spectrometer in which, at the time when ions are generated by irradiating a sample with a laser beam, an extraction electric field having a potential gradient that decreases gradually from a sample plate toward an extraction electrode is formed. Ions are roughly separated in accordance with the m/z in the extraction region due to the effect of this electric field, and ions with a large m/z remain near the sample. The voltages applied to the sample plate and an auxiliary electrode are increased after a delay time has passed so as to form an acceleration electric field having a potential gradient with a polygonal line pattern. Since this electric field is similar to an ideal potential gradient curve, it is possible to provide the ions with appropriate potential energy changes for each m/z, improving resolution by appropriately realizing energy convergence over a wide m/z range.

The invention belongs to the mass analysis field, and relates to an analysis method of a quadrupole rod mass analyzer. The analysis method of a quadrupole rod mass analyzer uses the working voltage technology loaded on a quadrupole rod to realize a higher quadrupole mass spectrum mass distinguishing capability, that is, two AC excitation voltages are applied to the quadrupole rod, except for a DC (Direct Current) voltage and an RF (Radio Frequency) voltage on a traditional quadrupole rod, so that an unstable band is generated at the top point of a stable area correspondingly. Therefore, the peak form is effectively optimized and the reliability of mass distinguishing and measurement can be improved. As the stable band is scanned according to the analysis method of a quadrupole rod mass analyzer, the mass distinguishing of the quadrupole rod can exceed 10000 and has no substantial ion transmission loss.