102results about How to "Improve quality resolution" patented technology

Rapid characterization and screening of polymer samples to determine average molecular weight, molecular weight distribution and other properties is disclosed. Rapid flow characterization systems and methods, including liquid chromatography and flow-injection analysis systems and methods are preferably employed. High throughput, automated sampling systems and methods, high-temperature characterization systems and methods, and rapid, indirect calibration compositions and methods are also disclosed. In preferred high-temperature embodiments, the polymer sample is maintained at a temperature of not less than about 75° C. during sample preparation, loading into a liquid chromatography or flow-injection analysis system, injection into a mobile phase of a liquid chromatography or flow-injection analysis system, and / or elution from chromatographic column. The described methods, systems, and device have primary applications in combinatorial polymer research and in industrial process control.

Rapid characterization and screening of polymer samples to determine average molecular weight, molecular weight distribution and other properties is disclosed. Rapid flow characterization systems and methods, including liquid chromatography and flow-injection analysis systems and methods are preferably employed. High throughput, automated sampling systems and methods, high-temperature characterization systems and methods, and rapid, indirect calibration compositions and methods are also disclosed. The described methods, systems, and devices have primary applications in combinatorial polymer research and in industrial process control.

Rapid characterization and screening of polymer samples to determine average molecular weight, molecular weight distribution and other properties is disclosed. Rapid flow characterization systems and methods, including liquid chromatography and flow-injection analysis systems and methods are preferably employed. High throughput, automated sampling systems and methods, high-temperature characterization systems and methods, and rapid, indirect calibration compositions and methods are also disclosed. The described methods, systems, and devices have primary applications in combinatorial polymer research and in industrial process control.

A novel apparatus for and a method of noise and spurious tones suppression in a digital RF processor (DRP). The invention is well suited for use in highly integrated system on a chip (SoC) radio solutions that incorporate a very large amount of digital logic circuitry. The noise suppression scheme eliminates the noise caused by various on chip interference sources transmitted through electromagnetic, power, ground and substrate paths. The noise suppression scheme permits an all digital PLL (ADPLL) to operate in such a way to avoid generating the spurs that would normally be generated from the injection pulling effect of interfering sources on the chip. The frequency reference clock is retimed to be synchronous to the RF oscillator clock and used to drive the entire digital logic circuitry of the DRP. This ensures that the different clock edges throughout the system will not exhibit mutual drift. A method of improving the resolution quality of a time to digital converter within the ADPLL is also taught. The method dithers the reference clock by passing it through a delay circuit that is controlled by a sigma-delta modulator. The dithered reference clock reduces the affect on the phase noise at the output of the ADPLL due to ill-behaved quantization of the TDC timing estimation.

In the mass spectrometer of the present invention, a flight space is provided before the mass analyzer, and the flight space includes a loop orbit on which ions fly repeatedly. While ions fly on the loop orbit repeatedly, ion selecting electrodes placed on the loop orbit selects object ions having a specific mass to charge ratio in such a manner that, for a limited time period when the object ions are flying through the ion selecting electrodes, an appropriate voltage is applied to the ion selecting electrodes to make them continue to fly on the loop orbit, but otherwise to make or let other ions deflect from the loop orbit. If ions having various mass to charge ratios are introduced in the loop orbit almost at the same time, the object ions having the same mass to charge ratio continue to fly on the loop orbit in a band, but ions having mass to charge ratios different from that are separated from the object ions while flying on the loop orbit repeatedly. Even if the difference in the mass to charge ratio is small, the separation becomes large when the number of turns of the flight becomes large. After such a separation is adequately achieved, the ion selecting electrodes can select the object ions with high selectivity, or at high mass resolution. By adding dissociating means, fragment ions originated only from the selected object ions can be analyzed, which enables the identification and structural analysis of the sample at high accuracy.

An image processing method obtains a glassless image from a color frontal facial image bearing glasses by using a recursive principal component analysis (PCA) reconstruction. The image processing method comprises the steps of a) receiving an RGB color frontal facial image; b) extracting candidates of eye regions from the received RGB color frontal facial image; c) determining an exact eye region out of the candidates and normalizing the received RGB color frontal facial image; d) extracting a glasses frame region by using color information contained in the received RGB color frontal facial image and edge information of a glasses frame; e) performing an RGB-HSI transformation on the normalized frontal facial image; f) generating H′, S′, and I′ glassless compensated images; g) obtaining R′, G′, and B′ compensated images by performing an HSI-RGB transformation on the H′, S′, and I′ glassless compensated images; and h) creating a glassless final color facial image on the basis of the R′, G′, and B′ compensated images.

The computer-controlled optical scanning high magnification microscope imaging system with a large field of view disclosed herein overcomes a previous inability to achieve simultaneous high magnification and large field of view in microscopes. The subject imaging system includes galvanometer scanners, a CCD camera and high brightness LED sources at different wavelengths for rapid acquisition of a large number of high-resolution segmented tile images with a magnification of 800× each. The numerous segmented tiles combine to form a larger viewing field of the target, resulting in a compound image with an effective enlarged viewing area of 1.6×1.2 mm2. The speed and sensitivity of the system make it suitable for high resolution image monitoring of a small segmented area of dimensions 320×240 μm2 with a 4 μm resolution. The microscope can zoom in on each segment of the target without lost of resolution to attain a great degree of spatial detail. With its special capacities, this microscope would be beneficial to medicine, biology, semiconductor inspection, device analysis and quality control, as well as with multiphoton and fluorescence microscopes to image large fields with high resolution.

A time-of-flight measuring device for performing a hardware-based high-speed data compression process before transferring the data from a signal recorder to a data processor is provided. A time-series digital signal recorded by a signal recorder is converted to a plurality of time-series digital signals by being divided into a bit string including baseline information and a bit string not including the baseline information. Then, the time-series digital signal consisting of a bit string not including the baseline information is compressed by run-length encoding, such as zero length encoding or switched run-length encoding. Subsequently, static Huffman coding is performed on each of the time-series digital signals to reduce the data amount.

In the mass spectrometer of the present invention, a flight space is provided before the mass analyzer, and the flight space includes a loop orbit on which ions fly repeatedly. While ions fly on the loop orbit repeatedly, ion selecting electrodes placed on the loop orbit selects object ions having a specific mass to charge ratio in such a manner that, for a limited time period when the object ions are flying through the ion selecting electrodes, an appropriate voltage is applied to the ion selecting electrodes to make them continue to fly on the loop orbit, but otherwise to make or let other ions deflect from the loop orbit. If ions having various mass to charge ratios are introduced in the loop orbit almost at the same time, the object ions having the same mass to charge ratio continue to fly on the loop orbit in a band, but ions having mass to charge ratios different from that are separated from the object ions while flying on the loop orbit repeatedly. Even if the difference in the mass to charge ratio is small, the separation becomes large when the number of turns of the flight becomes large. After such a separation is adequately achieved, the ion selecting electrodes can select the object ions with high selectivity, or at high mass resolution. By adding dissociating means, fragment ions originated only from the selected object ions can be analyzed, which enables the identification and structural analysis of the sample at high accuracy.

The invention relates to the implantation field of broadband ion beams, and discloses a mass analyzing magnet for broadband ion beams. The mass analyzing magnet comprises a magnet and a coil connected with a power supply. The magnet comprises magnetic poles, a magnet yoke and magnetic shielding plates, the magnetic poles comprise an upper magnetic pole and a lower magnetic pole, the magnetic shielding plates comprise an upper magnetic shielding plate and a lower magnetic shielding plate, and a magnetic field space for the broadband ion beams to pass in a certain route is arranged between the upper magnetic pole and the lower magnetic pole. The invention further discloses an implanter system, which comprises an ion source, an extraction electrode unit, a deflection speed-reducing unit, a mass analyzing magnet, a target workpiece and workpiece transmitting unit, a beam flux measuring and diagnosing unit and a control unit. The invention has the beneficial effect of high quality resolution and nearly zero system aberration, and can generate pure broadband ion beams of 300mm, 450mm and even 1000mm, thereby improving the quality of ultra-low energy ion beams generated by a speed reducer and decreasing the angular dispersion of the ultra-low energy ion beams.

A method for obtaining a glassless image is disclosed. The image processing method comprises the steps of (a) receiving an RGB color frontal facial image; (b) extracting candidates of eye regions from the received RGB color frontal facial image; (c) determining an exact eye region out of the candidates and normalizing the received RGB color frontal facial image; (d) extracting a glasses frame region by using color information contained in the received RGB color frontal facial image and edge information of a glasses frame; (e) performing an RGB-HSI transformation on the normalized frontal facial image; (f) generating H′, S′, and I′ glassless compensated images; (g) obtaining R′, G′, and B′ compensated images by performing an HSI-RGB transformation on the H′, S′, and I′ glassless compensated images; and (h) creating a glassless final color facial image on the basis of the R′, G′, and B′ compensated images.

A method and structure for an integrated circuit comprising a first transistor and an embedded carbon nanotube field effect transistor (CNT FET) proximate to the first transistor, wherein the CNT FET is dimensioned smaller than the first transistor. The CNT FET is adapted to sense signals from the first transistor, wherein the signals comprise any of temperature, voltage, current, electric field, and magnetic field signals. Moreover, the CNT FET is adapted to measure stress and strain in the integrated circuit, wherein the stress and strain comprise any of mechanical and thermal stress and strain. Additionally, the CNT FET is adapted to detect defective circuits within the integrated circuit.

Systems and methods are for implementing a NSV2SV converter that converts a non-scalable video signal to a scalable video signal. In an implementation, a non-scalable video signal encoded in H.264 / AVC standard is decoded and segmented into spatial data and motion data. The spatial data is resized into a desired resolution by down-sampling the spatial data. The motion data is also resized in every layer, except in the top layer, of a scalable video coding (SVC) encoder by using an appropriate measure. Further, the motion data is refined based on the resized spatial data in every layer of the SVC encoder. The refined motion data and the down-sampled spatial data are then transformed and entropy encoded in the SVC standard in every layer. The SVC encoded output from every layer is multiplexed to produce a scalable video signal.

A method and structure for an integrated circuit comprising a first transistor and an embedded carbon nanotube field effect transistor (CNT FET) proximate to the first transistor, wherein the CNT FET is dimensioned smaller than the first transistor. The CNT FET is adapted to sense signals from the first transistor, wherein the signals comprise any of temperature, voltage, current, electric field, and magnetic field signals. Moreover, the CNT FET is adapted to measure stress and strain in the integrated circuit, wherein the stress and strain comprise any of mechanical and thermal stress and strain. Additionally, the CNT FET is adapted to detect defective circuits within the integrated circuit.

A time-of-flight mass analyzer having improved mass resolution without mandating a corresponding increase in instrument size is disclosed. The analyzer includes an ionizer that generates the ions that are to be analyzed. These ions are introduced to an ion flight path, at least a portion of which is aligned with a linear axis. The portion of the ion path that is aligned with the linear axis includes a region having a substantially static electric field with non-linear equipotential field lines that circumvent the linear axis. Ions either enter the substantially static electric field with a velocity component that is directed along the linear axis or have such a velocity component imparted to them once they have been trapped in the substantially static electric field. As a result of the combined effects of the linear velocity component and the non-linear field, the ions make multiple circumnavigating trips about the linear axis as they concurrently travel in the direction of the linear axis. Consequently, the ions travel along a significantly longer flight path when compared to a flight path in which the ions solely travel linearly along the axis. In one embodiment, the concurrent motions of the ions in the direction of the linear axis and along the equipotential field lines about the linear axis define a substantially helical ion trajectory. This provides a larger distance along which ions having close, but different, m / z may be separated in time thereby providing an instrument having higher resolution.

A time-of-flight measuring device for performing a hardware-based high-speed data compression process before transferring the data from a signal recorder to a data processor is provided. A time-series digital signal recorded by a signal recorder is converted to a plurality of time-series digital signals by being divided into a bit string including baseline information and a bit string not including the baseline information. Then, the time-series digital signal consisting of a bit string not including the baseline information is compressed by run-length encoding, such as zero length encoding or switched run-length encoding. Subsequently, static Huffman coding is performed on each of the time-series digital signals to reduce the data amount.

A telephoto lens system of a four-lens-group arrangement includes a negative first lens group, a positive or negative second lens group, a negative third lens group and a positive fourth lens group. The telephoto lens system of the four-lens-group arrangement is constituted by less than six lens elements in total. The positive or negative second lens group is constituted by a positive lens element and a negative lens element which are cemented to each other, in this order from the object. The positive lens element has a convex surface with a larger curvature facing toward the object. The positive or negative second lens group satisfies the following condition: 0.8<f2p / |f2n|<1.4  (1) wherein f2p designates the focal length of the positive lens element in the second lens group; and f2n designates the focal length of the negative lens element in the second lens group.

In the mass spectrometer of the present invention, the controller controls the time of changing the voltage applied to the electrode or electrodes of the ion trap from the ion trapping voltage to the ion ejecting voltage according to the polarity of the electric charge of ions to be ejected from the ion trap. Since positively charged ions and negatively charged ions move in the same direction if the phases of the RF voltage for generating the ion trapping electric field in the ion trap are reversed, the controller may reverse the phase of the RF voltage for trapping ions according to the polarity of the electric charge of ions when the ion ejecting time is fixed, irrespective of the polarity of the electric charge of ions to be ejected. Alternatively, the controller may change the ion ejecting time by half a cycle of the RF voltage depending on the polarity of the electric charge of ions when the ion trapping RF voltage is maintained the same. Owing to such a control, the ions are ejected when they are converging or are converged in the ion trap irrespective of the polarity of the electric charge of the ions. This minimizes the variation in the starting point of ions ejected from the ion trap, and reduces errors in their flight time in the subsequent TOF-MS, whereby the accuracy of the mass analysis is improved and the mass resolution is enhanced.

An electrostatic lens (3), in which, as an ion incident optical system for sending ions into an orthogonal acceleration unit, five cylindrical electrodes (31-35) are arranged along an ion optical axis (C), and an aperture plate (38) is disposed on a common focal plane of two virtual convex lenses (L1, L2) formed under an afocal condition, is used. The diameter of an aperture opening (39) formed in the aperture plate (38) determines the angular spread of the exiting ion beam. When an applied voltage is set such that the electrostatic lens (3) becomes an afocal system, measurement with a high mass resolution can be performed though the sensitivity is sacrificed slightly, and when an applied voltage is set such that the electrostatic lens (3) becomes a non-afocal system in which an ion passing rate is maximized, measurement with a high sensitivity can be performed though the resolution is sacrificed slightly. Thus, in an orthogonal acceleration-type TOFMS, a mass-resolution priority mode and a measurement sensitivity priority mode can be switched readily.

The present invention aims at creating an accurate mass spectrum with a high resolving power based on a plurality of multi-turn time-of-flight (TOF) spectra, while reducing the amount of computation to assure the real-time processing. First, a plurality of TOF spectra each obtained for a different timing when ions are ejected from the loop orbit are measured (S2 and S3). At this point, the concept of the coincidence detection method is utilized to determine what mass-to-charge ratio a peak appearing on the TOF spectra originates from. From the information on the peak of interest in one TOF spectrum and other data, the time range in which a corresponding peak appears on other TOF spectra is set, and the existence or nonexistence of the peak in that range is determined (S5). In the case where the corresponding peak is found on most of the other TOF spectra, the m / z is deduced from the peak on the TOF spectrum with the highest resolving power and a mass spectrum is created (S6 and S7). At the same time, from the density of the peaks around the peak of interest, the reliability of the deduction is computed. For a peak with a low reliability, the ion ejection time is optimized and the TOF spectrum is measured again (S8).

This invention provides a article aerosol on-line ionization power, which is arranged outside the speeding area of the flying time quality analysis device, which includes ionization laser, low pressure radio frequency four poles, and the laser beam sent from the ionization laser is eradiated into the incenter of the low pressure radio frequency four poles vertically. The ionization power applying method has the following steps: measuring diameter of the single grain aerosol by aerodynamics, then before the flight time quality analyzer enters, iorizating the single grain into plasma, and the positive-negtive ions produced is focalized into ion beam which has very little spcace and then is sent into the flight time quality analyzer. And this invenktion also combining the ionization zone with the aerodynamics diameter measuring zone together, when diameter measuring is done, aerosol inoizates, which reduces the excursion distance of the aerosol, an improves transmission efficient greatly;and low-voltage radio-frequency quadrupole pole's concentrating effect improves the differentiate rate of the flight time quality analyzer.

A time of flight analyzer that comprises a pulsed ion source; a non-linear ion mirror having a turn-around point; and a detector. The pulsed ion source is configured to produce an ion pulse travelling along an ion flight axis, the ion pulse comprising an ion group consisting of ions of a single m / z value, the ion group having a lateral spread. The non-linear ion mirror is configured to reflect the ion group, at the turn-around point, along the ion flight axis towards the detector, the passage of the ion group through the non-linear ion mirror causing a spatial spread of the ion group. The time of flight mass analyzer has at least one lens positioned between the ion source and the ion mirror, wherein the or each lens is configured to reduce said lateral spread so as to provide a local minimum of lateral spread within the ion mirror.

A method and system for producing an ion beam from an ion guide. In the method, ions are introduced into the ion guide, a radio frequency trapping field is generated in the ion guide to confine ions in a direction transverse to a longitudinal axis of the ion guide, a DC potential is generated along the longitudinal axis to direct ion motion along the longitudinal axis, a strength of the radio frequency trapping field is reduced toward an ion guide exit of the ion guide, and the ions are transmitted from the ion guide exit to form the ion beam. In the system, an ion guide is configured to transmit ions in a longitudinal axis of the ion guide and configured to trap ions in a direction transverse to the longitudinal axis via a radio frequency trapping field. The ion guide includes a segmented set of electrodes spaced along the longitudinal axis and an ion guide exit at the last of the segmented set of electrodes. A radio frequency device is configured to supply the radio frequency trapping field such that a strength of the radio frequency trapping field is reduced toward the ion guide exit.

The invention provides a lens group of an imaging system, which comprises a first lens, a second lens, a third lens, a fourth lens, a fifth lens and a sixth lens, wherein the first lens, the second lens, the third lens, the fourth lens, the fifth lens and the sixth lens are sequentially arranged from an object side to an image side; the third lens and the fourth lens form a glued assembly; and thefifth lens and the sixth lens form a glued assembly. The lens group can provide an imaging quality with high resolution and low aberration.

A mass spectrometer that is switchable to operate as a linear trap or as a mass filter, and attaining both high ejection efficiency when operated as a linear trap and high mass resolving power when operated as a mass filter. A mass spectrometer includes an ion source for ionizing a sample, a linear trap quadrupole rod lens supplied with ionized ions, a trap electrode for forming a potential to trap the supplied ions between one end of the quadrupole lens and the other end, a control unit to regulate the trap lens voltage, and a mass analyzer or detector to detect ions ejected from the linear trap, and characterized in switching between an operation where the supplied ions are trapped in a section quadrupole rod lens and ejected by the controller unit regulating the trap electrode voltage; and an operation where ions are selective passed through according to their mass. The ejection efficiency when operated as an ion trap, and the mass resolving power when operated as a quadrupole mass filter are vastly improved compared to conventional methods.

A mass spectrometer is provided for identifying mass and velocity distributions in a continuous ion beam is configured with a circular dispersive system creating a rotating electromagnetic field, which is capable of deflecting the ion beam from an initial direction, and a circular position-sensitive detector intercepting the deflected ion beam and providing information from which the ion mass-per-charge ratio is determined

A time-of-flight type mass spectrometer in which, at the time when ions are generated by irradiating a sample with a laser beam, an extraction electric field having a potential gradient that decreases gradually from a sample plate toward an extraction electrode is formed. Ions are roughly separated in accordance with the m / z in the extraction region due to the effect of this electric field, and ions with a large m / z remain near the sample. The voltages applied to the sample plate and an auxiliary electrode are increased after a delay time has passed so as to form an acceleration electric field having a potential gradient with a polygonal line pattern. Since this electric field is similar to an ideal potential gradient curve, it is possible to provide the ions with appropriate potential energy changes for each m / z, improving resolution by appropriately realizing energy convergence over a wide m / z range.

In a time-of-flight spectrum obtained when the overtaking of ions of different kinds has occurred, mass-to-charge ratios M1, M2, and M3 are computed with a predetermined conversion formula by using a plurality of assumed numbers of turns for one peak. Then, the flight times Tf1, Tf2, and Tf3 for an overtakingless measurement are computed by using an inverse conversion formula. If peaks respectively corresponding to the flight times Tf1, Tf2, and Tf3 for an overtakingless measurement exist on an overtakingless time-of-flight spectrum, their intensities i1, i2, and i3 are obtained. Then, the intensity Ia of the original peak is distributed to the mass-to-charge ratios M1, M2, and M3 in accordance with the intensity ratio. The same intensity distribution processing is performed for all or selected plural peaks. The intensities assigned to the same mass-to-charge ratio are integrated. A mass spectrum is created for each of a plurality of overtaking time-of-flight spectra obtained by changing the timing of deviation of ions from a loop orbit, and the plurality of mass spectra are displayed in a window of a display unit so that they can be compared. Thereby, the probability of missing an ion due to the ion deviation timing can be reduced.

The invention belongs to the mass analysis field, and relates to an analysis method of a quadrupole rod mass analyzer. The analysis method of a quadrupole rod mass analyzer uses the working voltage technology loaded on a quadrupole rod to realize a higher quadrupole mass spectrum mass distinguishing capability, that is, two AC excitation voltages are applied to the quadrupole rod, except for a DC (Direct Current) voltage and an RF (Radio Frequency) voltage on a traditional quadrupole rod, so that an unstable band is generated at the top point of a stable area correspondingly. Therefore, the peak form is effectively optimized and the reliability of mass distinguishing and measurement can be improved. As the stable band is scanned according to the analysis method of a quadrupole rod mass analyzer, the mass distinguishing of the quadrupole rod can exceed 10000 and has no substantial ion transmission loss.

The invention provides a device and a method for detecting the mass concentration of a particulate matter, and relates to the technical field of concentration detection. The device for detecting the mass concentration of the particulate matter comprises a gas channel to be measured, a gas flow driver, and a light scattering measurement unit, a flow metering unit and a matched control processor which are arranged on the gas channel to be measured, and also comprises a micro-resonance measurement unit arranged on the same gas channel to be measured together with the light scattering measurementunit, the micro-resonance measurement unit includes a choked flow filter membrane arranged on the gas channel to be measured, and a frequency detector and a control circuit which are connected with the choked flow filter membrane, and the signal output end of the frequency detector is connected with the control processor. The device and the method, which adopt a micro-resonance process and a lightscattering measurement process to carry out fusion calculation, have the advantages of high mass resolution, fast response speed, suitableness for various gas channels, overcoming of the influences of the physical, chemical and flow characteristics of particles on the simple light scattering measurement process, and accuracy and reliability in the measurement result.