169results about "Interferometric spectrometry" patented technology

The invention discloses a spectral interference system resolution improving method and system, and the method comprises the steps: building an ISE-Net end-to-end deep neural network model, enabling the convolution kernel size of an efficient channel attention module of the ISE-Net end-to-end deep neural network model to be adaptively determined according to the number of input channels, and constructing a mapping relation between narrowband and broadband interference signals; and generating an ideal narrowband signal and a double-bandwidth target signal according to a spectral interference physical formula, defining a loss function by minimizing deviation between model output and the target signal, updating parameters and dynamically adjusting a learning rate by using an AdamW optimizer until model loss is converged, and completing data generation and training. An input narrowband signal horizontal axis is converted to a corresponding frequency domain axis, and is subjected to time shifting and intensity scaling preprocessing to adapt to the model. A signal processing flow suitable for a single / multi-layer structure is constructed, a bandwidth expansion signal is obtained through decomposition, expansion and reconstruction, and the resolution of a spectrum interference system is improved. The method has the advantages of high calculation efficiency, high generalization and flexible deployment.

An optical device includes: an incident optical system; an analysis optical system; and a length measurement optical system. The incident optical system includes a laser light source, and an incident light dividing element that divides the laser light. The analysis optical system includes a first light dividing element that divides the first divided light and then mixes the light, a first mirror that adds a first modulation signal to the one first divided light by movement and reflection, a second mirror, and a first light receiving element that receives the first divided light including a sample-derived signal and the first modulation signal. The length measurement optical system includes a second light dividing element that divides the second divided light and then mixes the light, an optical feedback unit that feeds back the one second divided light to the second light dividing element, and a second light receiving element that receives the second divided light including a displacement signal generated by the first mirror.

The utility model relates to the technical field of optical communication, in particular to a spectrum detector and optical communication equipment. The spectrum detector comprises a double-fiber collimator used for inputting a detection light signal; the beam splitter prism is positioned on the light emitting side of the double-fiber collimator, and the light incident surface of the beam splitter prism is over against the light emitting side of the double-fiber collimator; the fixed spectroscope is positioned on one side, far away from the double-fiber collimator, of the beam splitter prism; the movable spectroscope is positioned on the reflected light emergent side of the beam splitter prism and can be close to or far away from the beam splitter prism along the light emergent direction of the beam splitter prism; the first photoelectric detector is located on the side, away from the movable spectroscope, of the beam splitter prism; the second photoelectric detector is located on the side, away from the beam splitter prism, of the fixed beam splitter. The volume of the spectrum detector can be effectively reduced.

The present disclosure provides a contact-less detection using a cross-cavity device where a small dielectric sample is placed at its center. The optical properties of the sample, such as the Kerr and Faraday rotation, or polarizability, manifest in the coupling between the cavities' electromagnetic modes and in the shift of their resonant frequencies. By calculating the dynamics of what are referred to herein as geometrical photonic states, a measuring protocol is formulated based on the quantum metric that maximizes the Fisher information and isolates the individual components of the complex dielectric function.

The invention provides an F-P spectral imaging system and method, and belongs to the technical field of spectral component measurement, and the system comprises a front lens which is used for collecting light energy and converting the light energy into emergent light meeting the limitation of the clear aperture of an F-P interferometer; the annular band optical filter comprises a central area and a plurality of concentric annular areas surrounding the central area, the bandwidth of each area is the same as the free spectral range of the F-P interferometer, and the annular band optical filter is used for eliminating level aliasing in emergent light of the front lens; the F-P interferometer is used for carrying out wavelength selection on emergent light of the annular band optical filter and outputting an interference field; the imaging mirror is used for projecting the interference field to the detector; and the detector is used for converting the projected optical signal into a digital electric signal. The F-P spectral imaging system which can maintain high spectral resolution and also can realize wide spectrum coverage is constructed by introducing the annular band optical filter which is accurately matched with the FSR of the F-P interferometer.

A method comprising at least one light source configured to generate a light of at least one wavelength and project the light over an optical path, a sample device, the device containing a sample obtained from exhalation of a person, a vortex mask configured to receive the light after the light passes through at least a portion of the sample device, the vortex mask including a series of concentric circles etched in a substrate, the vortex mask configured to provide destructive interference of coherent light received from the at least one light source, a detector configured to detect and measure wavelength intensities from the light in the optical path, the wavelength intensities being impacted by the light passing through the sample, the detector receiving the light that remained after passing through the vortex mask, and a processor configured to provide measurement results based on the wavelength intensities.

The invention discloses an extreme ultraviolet spectrograph calibration method based on extreme ultraviolet diffraction, and relates to the technical field of spectrograph calibration, and the technical scheme is characterized in that a desktop type XUV light source generation device is used for generating XUV light beams; a diffraction device is arranged on the propagation path of the XUV light beam, so that the XUV light beam is diffracted; taking the FID spectral line of the helium atom 2p-1s as an energy reference point, and deducing part of unknown parameters of the diffraction device and the spectrometer according to the separation distance of + / -1 level diffraction beams measured at the position corresponding to the energy; in combination with a Gaussian fitting method, the positions of 0-level light beams and + / -1-level diffraction light beams at other positions on the detector are obtained, and according to a diffraction formula, energy corresponding to all positions on the XUV spectrometer is inverted; calibration precision is ensured by correcting copper mesh placement angle deviation and CCD image angle deviation. According to the invention, XUV light is diffracted by using the copper net, and global continuous calibration of the energy axis of the spectrometer is realized by combining with a characteristic spectral line with a known wavelength.

To provide a terahertz wave interferometry device that can shorten measurement time. [Solution] The terahertz wave interference measuring device 1A comprises an optical pulse train output unit 10A, a first conversion unit 21, a second conversion unit 22, a multiplexing optical system 23, and a detection unit 40A. The optical pulse train output unit 10A outputs a periodic first optical pulse train P1 having a first repetition frequency, and a periodic second optical pulse train P2 having a second repetition frequency smaller than the first repetition frequency. The first conversion unit 21 converts the first optical pulse train P1 into a first terahertz wave T1. The second conversion unit 22 converts the second optical pulse train P2 into a second terahertz wave T2. The multiplexing optical system 23 combines the first terahertz wave T1 with the second terahertz wave T2 to generate a third terahertz wave T3. The detection unit 40A detects the third terahertz wave T3.

The present application relates to the technical field of spectral analysis, and particularly relates to a Fourier spectrometer and a control method thereof. The Fourier spectrometer provided by the present application comprises a control unit, a light receiving unit, a first detection unit, a second detection unit, an interference unit and a delay unit with a rotating structure. The second detection unit is used for sequentially inputting a laser signal to the interference unit and the delay unit to obtain a laser interference signal, and outputting the laser interference signal to the control unit to obtain a sampling clock signal, which is used for controlling the sampling frequency of the interference signal. The present application introduces the second detection unit and the delay unit with the rotating structure, so that the sampling process of the spectrometer can be more flexibly controlled, and the accuracy and efficiency of the sampling are improved. By accurately controlling the change of the optical path difference, the resolution of the spectral data is improved, which is helpful for more accurately analyzing the spectral characteristics of the sampling light.

The provided is an adjustable single-channel time-domain sampling filter, a spectrometer, and a detection method. The filter includes N stages of cascaded asymmetric interference units, where each asymmetric interference unit includes: a first waveguide splitting element, arranged at the input end, for splitting input light into two output paths; two interference arms, which respectively receive the light output from the two paths of the first waveguide splitting element and have different arm lengths; and a second waveguide splitting element, for combining the output light of the two interference arms to generate optical interference. Among the N cascaded asymmetric interference units, at least three are provided with phase modulators on their interference arms. When in use, the adjustable single-channel time-domain sampling filter tunes the phase modulators located in different cascaded asymmetric interference units to form optical channels with different spectral responses in the time sequence.

The application discloses a double-waveband Fourier transform spectrometer, and relates to the technical field of spectrometers. The spectrometer comprises a first Michelson interference optical path assembly and a second Michelson interference optical path assembly. The first Michelson interference optical path and the second Michelson optical path use the front and back surfaces of a same moving mirror as phase modulators. The coating materials of the front and back surfaces of the moving mirror are different. The reflected light beams of the front and back surfaces of the moving mirror have different wavebands. The application improves the signal quality of the spectrometer when detecting wavebands or measuring across wavebands through the double-path Michelson interference optical path assembly of the shared moving mirror.

The invention provides a high-resolution broadband integrated spectrometer based on thin film lead zirconate titanate and a preparation method, and relates to the technical field of integrated optics. The structure of the spectrometer comprises a substrate; the silicon dioxide lower cladding layer is arranged on the substrate; the lead zirconate titanate thin film waveguide layer is arranged on the silicon dioxide lower cladding, a plurality of micro-ring resonators and a plurality of array waveguide gratings are arranged in the lead zirconate titanate thin film waveguide layer, and each array waveguide grating is connected with each micro-ring resonator through a waveguide; the sectional periodic metal electrode arrangement system is arranged in each section of straight waveguide area in the micro-ring resonator; wherein the plurality of micro-ring resonators are configured with resonant wavelengths which are distributed in a staggered manner, and the interval between the adjacent resonant wavelengths is 1 / n of the interval between the array waveguide grating channels; the spectrometer is configured to change the local waveguide refractive index by using the residual polarization effect of the lead zirconate titanate thin film through a segmented polarization method so as to realize alignment of the resonant wavelength and the center of the array waveguide grating channel.

To provide a sensitivity measuring device and a sensitivity measuring method capable of measuring spectral sensitivity distribution of a light receiving element to be measured in a short time.SOLUTION: The sensitivity measurement device includes a light source, an optical system, a light collection mechanism, a position adjustment mechanism, a measurement unit, and an analysis unit. The optical system is configured to generate an interference wave by splitting light from a light source into two beams and causing the two beams to interfere with each other, and includes an optical path length difference changing mechanism configured to change an optical path length difference. The condensing mechanism condenses the interference wave at an irradiation position on the light receiving surface of the measured light receiving element. The position adjustment mechanism changes an irradiation position of the interference wave in a direction along the light receiving surface. The measurement unit controls the irradiation position and acquires a signal obtained by converting the interference wave from the light receiving element to be measured. The analysis unit calculates a component of the signal of each wavelength by Fourier transform of an interferogram obtained from the optical path length difference changed by the optical path length difference changing mechanism and the intensity of the signal measured by the measurement unit.SELECTED DRAWING: Figure 1

The invention discloses a Fourier transform spectrometer system of a multiband light source structure, which comprises a multiband light source conveying unit used for transmitting light of multiple bands; the collimation unit is used for collimating the light transmitted by the multiband light source conveying unit; the light beam combining unit is used for forming a combined light beam; the light splitting unit is used for respectively transmitting and reflecting the plurality of beams of light; the reflector unit is used for receiving the multiple beams of light transmitted or reflected by the light splitting unit and retroreflecting the multiple beams of light in the incident direction of the multiple beams of light; and the detection unit is used for converging the multiple beams of light reflected by the reflector unit and receiving and detecting the converged multiple beams of light. According to the invention, input wavebands can be selected and multiple wavebands can be measured simultaneously, and near-infrared light and far-infrared light can be measured simultaneously, so that the detection efficiency is improved.

To enable an oscillation line width of a coherent light source being wavelength swept to be easily measured.SOLUTION: Light to be measured which is coherent light having been frequency swept so that an oscillation wavelength changes cyclically is generated from a frequency swept light source, and is split into a measurement part and a reference part differing in an optical path length and then multiplexed by an interference unit to obtain an interference light, which is detected by a light detection unit to obtain an interference signal. The interference signal, with a difference in optical path length of which between the measurement part and the reference part being changed, is Fourier transformed by an analysis unit, and the measured value of a noise floor value of a point image spread function for each difference in the optical path length is acquired. A measured amplitude value of a noise floor value that changes in accordance with the difference in the optical path length is calculated, an estimate coherence time is specified so that the measured amplitude value and the calculated amplitude value agree, and an oscillation line width of a coherent light source is measured on the basis of the estimate coherent time.SELECTED DRAWING: Figure 1

The invention provides a method and system for calibrating a frequency spectrum generator of drinking water equipment, and relates to the technical field of intelligent management of the drinking water equipment, and the method comprises the steps: obtaining an initial spectrum signal outputted by a to-be-calibrated frequency spectrum generator in the drinking water equipment, and a simulation spectrum signal transmitted through a spectrum transmission path in the drinking water equipment; utilizing a Fourier transform infrared spectrum technology to obtain an intermediate processing signal and carrying out suppression processing to obtain a target spectrum component, and combining a characteristic comparison result of the target spectrum component and the initial spectrum signal to calculate a spectrum attenuation amount; obtaining a digital spectral signal by using a high-speed analog-to-digital conversion technology, and calculating an actual spectrum attenuation coefficient of the to-be-calibrated spectrum generator in combination with a spectral intensity change value of the digital spectral signal and the initial spectral signal and an optical path parameter of a spectrum transmission path; and obtaining the calibrated frequency spectrum generator according to a deviation value between the attenuation characteristic and a preset standard frequency spectrum attenuation coefficient, thereby realizing accurate evaluation and dynamic calibration of the attenuation characteristic of the frequency spectrum generator of the drinking water equipment in a complex light path environment.

The light detector (10) of the present application is provided with a semiconductor substrate (11), a mesa portion (12) formed on a main surface (11a) of the semiconductor substrate (11) in a manner extending along a light waveguide direction (A), a first contact layer (13), a second contact layer (14), a first electrode (15), and an air-bridge wiring (16) electrically connected to the first contact layer (13) and the first electrode (15). When viewed from a direction perpendicular to the main surface (11a) of the semiconductor substrate (11), a length (L1) of the mesa portion (12) in the light waveguide direction (A) is longer than a length (L2) of the mesa portion in a direction perpendicular to the light waveguide direction (A). The air-bridge wiring (16) is drawn out from the first contact layer (13) to one side in the direction perpendicular to the light waveguide direction (A) and is erected between the first contact layer (13) and the first electrode (15).

Disclosed is a method and corresponding apparatus for determining an absolute optical distance between two reflecting surfaces that make up an interferometric cavity, the method comprising: moving an illumination spot in a back focal plane of an interferometer along a trajectory that has a nonzero radial component relative to an optical axis to cause different radial positions for the illumination spot along the trajectory while synchronously acquiring images of interferograms of the interferometric cavity; and using one or more electronic processors to analyze the images to determine a functional dependence of an optical path difference (OPD) for the interferometric cavity versus radial position for the illumination spot and extract the absolute optical distance between the two reflecting surfaces based on the determined functional dependence.

An optical device includes: a base; a movable portion which includes an optical function portion; an elastic support portion which supports the movable portion so that the movable portion is movable along a first direction; a first comb electrode which is provided to the base; and a second comb electrode which includes a plurality of second comb fingers provided to at least one of the movable portion and the elastic support portion. The elastic support portion includes a torsion bar extending along a second direction perpendicular to the first direction and a lever connected to the torsion bar. The second comb electrode is provided to a portion of at least one of the movable portion and the elastic support portion, the portion being located on the optical function portion side with respect to the torsion bar. The first comb finger and the second comb finger which are adjacent to each other face each other in a direction in which the movable portion has higher external force resistance, of the second direction and a third direction perpendicular to the first direction and the second direction.

Disclosed herein are hyperspectral acquisition systems for generating and recording hyperspectral profiles of nanoparticles and methods of using the systems. The hyperspectral acquisition systems include two systems: (1) a hyperspectral acquisition system (e.g., hyperspectral imaging system) for generating and recording the hyperspectral profiles and (2) a hyperspectral analysis system for assigning identifications using spectral features.

The quantum optical system changes a phase of quantum interference occurring between a plurality of physical processes, in each of which a quantum entangled photon pair of a signal photon and an idler photon is generated. Each of a plurality of pixels outputs a detection signal of the signal photon in a state where a sample is arranged in an optical path of the idler photon. A processor calculates an absorption spectroscopy characteristic based on an interferogram indicating a variation in a signal intensity acquired from each of the plurality of pixels in accordance with the change in the phase of the quantum interference. The processor: applies a processing to reduce phase difference of the interferogram among the plurality of pixels; spatially integrates, over the plurality of pixels, the interferogram having gone through the processing to reduce phase differences; and calculates the absorption spectroscopy characteristic based on the integrated interferogram.

An interferometric near infrared spectroscopy, iNIRS, system comprising: a light emitting arrangement comprising a light source configured to provide wavelength swept emission of light; and a light detecting arrangement comprising an interferometric optical detector; the iNIRS system comprising a plurality of optical channels arranged to define; a first optical channel path arranged to extend: (i) between the light source and the object for delivering first sample light from the light source to the object, and (ii) between the object and the detector for delivering first sample light received from the object to the detector; a second optical channel path arranged to extend: (i) between the light source and the object for delivering second sample light from the light source to the object, and (ii) between the object and the detector for delivering second sample light received from the object to the detector; and a reference optical channel path arranged to extend between the light source and the detector for delivering reference light from the light source to the detector along a reference channel.

The application discloses an equal-wavenumber division waveband noise reduction method for an infrared Fourier transform spectrometer, and is applied to fine spectral detection with wide spectral range and ultrahigh resolution. When designing a low-temperature infrared Fourier transform spectrometer, a low-temperature filter wheel is arranged in an optical path in front of a detector, and the low-temperature filter wheel is driven by a low-temperature motor. A plurality of filters are arranged on the filter wheel, the central wavelengths of the filters are different, the central wavelength intervals are different, the central wavelengths and the bandwidths of the filters are designed according to equal central spectral intervals, each filter has a narrow bandwidth, and according to a spectral range of a required detection target, a corresponding filter is selected to realize spectral detection with ultrahigh spectral resolution of a concerned spectral range. For the infrared Fourier transform spectrometer with high spectral resolution and wide spectral bandwidth, the measurement brings the advantage of reducing noise caused by out-of-band photons on the detector, and low temperature of the filter reduces infrared background and photon noise caused by the filter body.

Spectrofilometers are provided. The spectrofilometer includes a profilometer, an enclosure, one or more interferometer beam-splitting elements, and / or one or more spectrometer beam-dispersing elements. The one or more interferometer beam-splitting elements and the one or more spectrometer beam-dispersing elements are housed in the enclosure, share one or more radiation sensitive elements with the profilometer, which are arranged to generate a signal in response to incident electromagnetic radiation, and each generate one or more optical outputs. The one or more optical outputs are arranged such that respective optical axes intersect substantially in a plane of the one or more radiation sensitive elements.

To achieve Ramsey spectroscopy while effectively suppressing the Doppler effect.SOLUTION: A Ramsey spectroscopic device 1 includes: an optical path 10; an optical path length stabilizing circuit 30 that stabilizes the length of the optical path 10; a modulator 20 that is optically connected to the optical path 10, generates, in a pulse shape multiple times, a resonant laser beam at a first frequency f1 that causes resonance of atoms, molecules, or ions, which are a spectroscopic target, and generates a non-resonant laser beam at a second frequency f2 that does not cause resonance; and a spectroscopic unit 200 that spectroscopically disperses the spectroscopic target. The spectroscopic unit detects a state change of the spectroscopic target according to the frequency f1 by irradiating the spectroscopic target with the resonant laser beam.SELECTED DRAWING: Figure 1

Introduced here is an approach to mitigating (e.g., lessening or eliminating) the high-frequency interference pattern that is caused by uneven surfaces along the coupling interface formed between the waveguide and probe of an interferometric sensing system. The approach is to reduce the high-frequency interference pattern caused by the interference when a waveguide – for example, in the form of an optical fiber – and a probe are directly coupled to one another. Specifically, the coupling surface of the waveguide can be treated, for example, with sandpaper, sandblasting, or acid etching, to create a frosted surface texture. In operation, the frosted surface scatters the light transmitted through the waveguide, preventing the high-frequency interference pattern from occurring.

The system may include an imaging subsystem, a focusing subsystem, and a processor. The imaging subsystem includes a light source configured to emit light, a main objective lens configured to focus the light onto a sample, and a camera configured to generate one or more images of the sample based on the light emitted from the light source reflected by the sample. The focusing subsystem includes a reference objective lens configured to focus a portion of the light onto a reference mirror that is reflected and collocated with the light reflected by the sample, and a spectrometer configured to generate an interference signal based on the collocated light reflected by the sample and the reference mirror. The processor is configured to transform the interference signal from a time-domain signal to a frequency-domain signal and determine a defocus condition of the imaging subsystem based on the frequency-domain signal.

The invention relates to the technical field of spliced telescopes, and particularly provides a spliced mirror surface seamless spectral measurement method, which comprises the following steps: irradiating a spliced mirror surface by using incident light, selecting two sub-mirrors by using an aperture masking method, opening aperture channels of the two selected sub-mirrors, closing aperture channels of other sub-mirrors, and carrying out spectral measurement on the spliced mirror surface. Performing dispersion on two beams of reflected light reflected by the two selected sub-mirrors to obtain two beams of spectral dispersion light, performing interference on the two beams of spectral dispersion light, expanding interference fringes with different wavelengths in a direction perpendicular to dispersion, performing detection to obtain a two-dimensional interference spectrum, performing pose adjustment on the two selected sub-mirrors to realize spectrum alignment, and performing spectrum alignment. The spectrums of all the sub-mirrors of the spliced mirror surface are aligned through iteration, aperture channels of all the sub-mirrors are opened, and the seamless spectrum of the spliced mirror surface can be measured. According to the invention, the seamless spectrum of the spliced mirror surface with high signal-to-noise ratio, good continuity and resolution close to diffraction limit can be obtained.

The utility model provides a kind of spectrum domain OCT structure of enhanced sample arm signal, including the output end of light source emitter is connected with the first end of circulator, the second end of circulator is connected with the input end of coupler, the first output end of coupler is connected with the input end of reference arm, the second output end of coupler is connected with the input end of sample arm;The second end of circulator is connected with the input end of spectrometer.The utility model can prevent the weakening of interference signal.