Patents
Literature
Patsnap Eureka AI that helps you search prior art, draft patents, and assess FTO risks, powered by patent and scientific literature data.

27 results about "Length measurement" patented technology

Length measurement is implemented in practice in many ways. The most commonly used approaches are the transit-time methods and the interferometer methods based upon the speed of light. For objects such as crystals and diffraction gratings, diffraction is used with X-rays and electron beams. Measurement techniques for three-dimensional structures very small in every dimension use specialized instruments such as ion microscopy coupled with intensive computer modeling.