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1422 results about "Radiance" patented technology

In radiometry, radiance is the radiant flux emitted, reflected, transmitted or received by a given surface, per unit solid angle per unit projected area. Spectral radiance is the radiance of a surface per unit frequency or wavelength, depending on whether the spectrum is taken as a function of frequency or of wavelength. These are directional quantities. The SI unit of radiance is the watt per steradian per square metre (W·sr⁻¹·m⁻²), while that of spectral radiance in frequency is the watt per steradian per square metre per hertz (W·sr⁻¹·m⁻²·Hz⁻¹) and that of spectral radiance in wavelength is the watt per steradian per square metre, per metre (W·sr⁻¹·m⁻³)—commonly the watt per steradian per square metre per nanometre (W·sr⁻¹·m⁻²·nm⁻¹). The microflick is also used to measure spectral radiance in some fields. Radiance is used to characterize diffuse emission and reflection of electromagnetic radiation, or to quantify emission of neutrinos and other particles. Historically, radiance is called "intensity" and spectral radiance is called "specific intensity". Many fields still use this nomenclature. It is especially dominant in heat transfer, astrophysics and astronomy. "Intensity" has many other meanings in physics, with the most common being power per unit area.

Temperature measuring system, heating device using it and production method for semiconductor wafer, heat ray insulating translucent member, visible light reflection membner, exposure system-use reflection mirror and exposure system, and semiconductor device produced by using them and vetical heat treating device

Oppositely of a temperature measuring surface of an object-to-be-measured 16, a reflecting member 28 is disposed while being spaced by a reflection gap 35 from the temperature measuring surface. The reflecting member 28 is composed of a heat ray reflecting material capable of reflecting heat ray in a specific wavelength band, in a portion including a reflection surface 35a. A heat ray extraction pathway section 30 is disposed through the reflecting member 28 so that one end thereof faces the temperature measuring surface. Heat ray extracted through the heat ray extraction pathway section from the reflection gap is detected by a temperature detection section 34. The heat ray reflecting material is configured in a form of a stack comprising a plurality of element reflecting layers composed of a material having transparent properties to the heat ray, in which every adjacent two element reflecting layers are composed of a combination of materials having refractive indices which differ from each other by 1.1 or more. This makes the measurement be hardly affected by radiation ratio of the object-to-be-measured when temperature of the object-to-be-measured is measured by a radiation thermometer, enables to measure its temperature more correctly irrespective of the surface state thereof, and can simplify configuration of a measurement system.
Owner:SHIN-ETSU HANDOTAI CO LTD
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