313 results about "Optical detector" patented technology

Embodiments herein relate to an optical chemical sensor system that is wearable and includes a microneedle array. In one embodiment, the invention includes a chemical sensing device having a set of microneedles and sensor elements. The sensor element may include a first low refractive index gel layer, a second low refractive index gel layer, and a chromogenic ionophore sensing film disposed between the first low refractive index gel layer and the second low refractive index gel layer. In one embodiment, a retardation layer may be disposed between the sensor element and a set of microneedles. An optical emitter may be configured to emit light into the sensor element. An optical detector may be configured to receive light from the sensor element. Other embodiments are also included herein.

A system for monitoring a petrochemical installation is disclosed. The system can include an optical imaging system comprising an array of optical detectors. The system can comprise processing electronics configured to process image data detected by the optical imaging system. The processing electronics can be configured to detect a target species based at least in part on the processed image data. The processing electronics can further be configured to, based on a detected amount of the target species, transmit an alarm notification to an external computing device over a communications network indicating that the target species has been detected at the petrochemical installation.

To provide an optical transport device that enable the strengths of optical signals to be recovered when the strengths of the optical signals vary, an optical transmission device comprises: a wavelength selection switch that attenuates, in accordance with an attenuation amount, each of a plurality of optical signals outputted from a plurality of optical transmitter, multiplexes and outputs the attenuated optical signals; and an optical detector that detects and compares the strength of at least one of the plurality of optical signals with a first threshold value and a second threshold value higher than the first threshold value. On the basis of the result of said comparison, the wavelength selection switch controls the attenuation amount such that the optical signal the strength of which has been detected has a strength value between the first threshold value and the second threshold value.

An optical detector for detecting a coolant leak from a liquid cooling system within an information handling system includes a light source and a sensor configured to absorb light emitted from objects illuminated by the light source. A first flexible waveguide is communicatively coupled to the light source, and a second flexible waveguide is communicatively coupled to the sensor. The optical detector is configured to detect a potential coolant leak in response to the sensor absorbing light having a predetermined characteristic. The light is reflected from an object illuminated by the first flexible waveguide. The reflected light is transmitted to the sensor via the second flexible waveguide.

A pressure measurement system includes a pressure pod with two chambers separated by a diaphragm such that a deformation / movement of the diaphragm is indicative of a difference between the pressures of the two chambers. Such deformation / movement is detected by a device that has no physical contact with the diaphragm, for example, by an optical detector that detects a change in the shape of the diaphragm or a movement of a protrusion on the diaphragm.

The invention relates to the technical field of crystal growth control, in particular to a multi-sensor-based crystal growth furnace temperature control system, which comprises a crystal unit, a heating unit, a stirring unit, a gas conveying unit, a lifting unit, a temperature acquisition unit, a saturation accounting unit, an identification unit and an analysis unit, wherein the crystal unit is provided with a sublimation area and a seed crystal area; the temperature acquisition unit detects temperature distribution and gradient through multiple sensors; the saturation accounting unit and the recognition unit are used for calculating the solution supersaturation degree and monitoring crystal contour features through an optical detector respectively; the analysis unit is used for determining the growth rate according to the contour characteristics, judging the crystal quality by comparing the overlap ratio of an actual growth curve and an expected growth curve, intelligently diagnosing reasons when the crystal quality is unqualified, adjusting the gas phase conveying rate aiming at the impurity enrichment problem to improve stirring, correcting the temperature ratio between regions aiming at the heat dissipation problem, and realizing multi-parameter linkage regulation and control.

The apparatus (10) for measuring the performance of an optical detector (20) comprises: - Cryostat (17) - a holder (19) capable of receiving a detector (20), fixed inside the cryostat (17); - means for measuring the performance of the detector (20); a shield (12a-12b) arranged around the holder (19) capable of limiting radiation that may reach the holder in the wavelength range of the detector (20); - a single-mode optical fiber (16) in the wavelength range of the detector (20), inserted into the opening (15) of the cryostat (17); at least one light flux generating module (50) incorporating a fiber light source (23) capable of generating a light flux in an optical fiber (16); Equipped with.

A microscopy system (1) is provided for imaging a sample. The microscopy system comprises a light source system (10) configured for providing a first train of optical pulses (T1) at first optical center wavelengths (l1) and a second train of optical pulses (T2) at second optical center wavelengths (l2), both at a first repetition frequency (f1). A repetition rate multiplier (30) is configured to receive the first train of optical pulses (T1) and to output a third train of optical pulses (T3) at a second repetition frequency (f2) different from the first repetition frequency (f1), focusing optics (40) configured to direct the second train of optical pulses (T2) and the third train of optical pulses (T3) to a sample in a focal volume (5). The microscopy system comprises an optical detector (60) configured to detect a transmitted or reflected third train of optical pulses (T31) after interaction in the sample in the focal volume, and a processor (80) configured to process signal components at the first repetition frequency (f1) from the detected transmitted or reflected third train of optical pulses (T31) and to output a signal or a pixel representative of the interaction in the sample.

An X-ray detector comprising a semiconductor detector layer coupled with a light-emitting diode (LED) layer on the optical side. The detector features an X-ray-side electrode layer deposited on one side of the semiconductor detector layer and an optical-side electrode layer, such as transparent Indium Tin Oxide (ITO), on the opposite side. The semiconductor detector layer is composed of a high atomic number (Z) material with high density and electrical resistivity (around or larger than 106Q·cm) to effectively absorb X-ray radiation while minimizing dark current. A fiber optic plate is used to guide the light generated in the LED layer to an optical detector.

The invention belongs to the technical field of optical detectors. The invention provides a preparation method of a broadband optical detector for dynamic encryption communication. The preparation method comprises the following steps: S1, providing a SiO2 / Si substrate; s2, sequentially transferring a first transition metal sulfide and a second transition metal sulfide on the SiO2 / Si substrate in a directional transfer manner to form a transition metal sulfide layer; s3, spin-coating a PbSe QDs solution or a PbS QDs solution on the transition metal sulfide layer to form a quantum dot film with uniform quantum dots; s4, an EDT acetonitrile solution is dropwise added to the surface of the quantum dot thin film, standing reaction is conducted for preset time, and then spin coating is conducted to remove redundant ligands and reaction by-products; and S5, placing the mixed dimension quantum dot / transition metal sulfide heterostructure optical detector on a heating table for annealing treatment to complete the preparation of the mixed dimension quantum dot / transition metal sulfide heterostructure optical detector. Wherein the energy barrier at the quantum dot / transition metal sulfide heterostructure can be independently and cooperatively regulated and controlled through the drain-source voltage and the gate-source voltage, and the confidentiality of the photoelectric detector can be improved.

Provided in the present disclosure is an optical detector, comprising: N detectors, the detectors being configured to receive optical signals and output electrical signals, and N being an integer greater than 1; a signal processing circuit, which is connected to the N detectors in a direct-current coupling manner, and is configured to acquire the electrical signals; and a switching group, which is connected to the N detectors and the signal processing circuit, and is configured to connect a target detector to the signal processing circuit, the target detector comprising one or more of the N detectors. The optical detector and a LiDAR provided in the present disclosure can realize gating of target detectors, thereby avoiding crosstalk, and having good detection performance for low-frequency signals.

An optical wear sensor (1) for identifying the extent of wear of mining or similar equipment. The sensor (1) includes a probe (5) having one or more optical element (10), a deflector (4), and a transmitter / detector, and a base (6) which includes a processor (81) and wireless transmitter (33). The optical element (1) is provided within a body of a wear part (11) and has a first end and a second end defining a bi-directional optical signal transmission pathway (3). The optical deflector (1) is formed of deflective material and positioned at said second end of said optical element (10) to reflect the optical signal. The optical transmitter (18) / detector (19) is configured to transmit said optical signal from the first end of said optical element (1), and detect whether or not said optical signal is returned via said optical pathway to said first end of said optical element (10). The processor converts any optical signal received by said optical detector to an electrical response signal, and the wireless signal transmitter (33) transmits the electrical response signal indicative of the wear condition of said body (11) to an output device. A plurality of optical elements (10a - 10e), of differing lengths may be provided to identify the depth or extent of wear.

A method for imaging an object illuminated with natural light including arranging an optical filter in an optical path of at least a portion of the natural light that is reflected and / or refracted or scattered from the object; arranging an optical detector in an optical path of light at least one of reflected from and / or transmitted through the optical filter; detecting, using the detector, individual photons for a time period to provide a times series of individual photon events; segmenting the time series into a plurality of bins; determining a number of detected photons within each bin to provide a time series of photon counts per bin; replacing and / or reconfiguring the optical filter a plurality of times followed by detecting, segmenting and determining to obtain a plurality of times series of photon counts per bin; and forming an image of the object based on the plurality of times series.

The optical gas sensor comprises a light detector and a circuit board, the light detector comprises a light detection part, a light filtering part, an integrated circuit chip and a packaging part, and the integrated circuit chip is electrically connected with the light detection part. The optical gas sensor provided by the invention comprises the optical detector, the optical detector comprises the optical detection part and the integrated circuit chip capable of processing the electric signal, and the optical detection part and the integrated circuit chip are both located in the packaging part, so that the influence of the outside on the electric signal processing of the optical gas sensor is reduced. The invention further provides an optical detector capable of reducing the influence of the outside on electric signal processing.

An apparatus monitoring semiconductor manufacturing equipment includes an optical detector, a light generator generating light along an optical path towards a semiconductor substrate, a first grating reticle between the light generator and the semiconductor substrate and including first slits having a first pitch and second slits having a second pitch different from the first pitch, a second grating reticle between the semiconductor substrate and the optical detector and including third slits having a third pitch different from the first pitch and the second pitch, in which the optical detector determines a positional attribute of the semiconductor substrate in relation to a first pattern and a second pattern, the first pattern corresponds to a first portion of light sequentially passing through the first slits and the third slits, and the second pattern corresponds to a second portion of light sequentially passing through the second slits and the third slits.

The application discloses a kind of semiconductor laser system and return light protection method.It includes laser, transmission fiber, processing head and drive control system, drive control system includes drive module and control module.Laser chip emits laser, and after shaping mirror group is shaped, it is coupled into transmission fiber, and from transmission fiber to processing head;Drive module provides operating current to laser chip;Control module monitors the operating voltage of laser chip in real time, when the operating voltage monitored exceeds preset safety threshold, sends off signal to drive module;Drive module receives off signal and cuts off the drive current output to laser chip.The application does not need additional optical detector and expensive magneto-optical isolator, directly monitors laser chip voltage parameter, only realizes return light protection by circuit module, simple structure, easy to integrate, low in cost, response is fast, can identify return light in time and execute protection, avoid laser chip to suffer persistent damage.

Optical frequency reference apparatus (10) comprising - an atomic vapor cell (1), containing a vapor of reference atoms, said atomic vapor cell (1) comprising a first end (41) having a first window (4) and a second end (61), - a laser source (11) for generating a laser probe beam (3) adapted to excite a two-photon optical transition of said reference atoms, - an optical detector (14), adapted to detect a fluorescence signal emitted by said reference atoms, and - at least one reflective element (5, 15) wherein the laser source (11), the atomic vapor cell (1) and the at least one reflective element (5, 15) are configured such that, in operation, the probe beam (3) enters the atomic vapor cell (1) through said first window (4) at said first end (41) and crosses said vapor of reference atoms until said second end (61) through a defined optical path in a first forward direction (3a), the probe beam (3) is reflected backwards by said at least one reflective element (5, 15) and crosses said vapor of reference atoms a second time through the same defined optical path, in a second direction (3b) opposite to the first forward direction (3a), characterized in that the optical frequency reference apparatus (10) further comprises means (7, 9) for absorbing the reflected laser probe beam (3) exiting from the atomic vapor cell (1) according to the second direction (3b).

The application discloses an automatic real-time calibration method for a laser radar (LiDAR) system. The LiDAR system comprises a light source, an optical rotating mirror, an optical detector, a processing unit and a calibration reflector plate with spatially varying reflectivity characteristics. The calibration reflector plate is indexed as a grid of reflecting surfaces. A light calibration signal is emitted and spatially distributed in the grid, and a corresponding echo signal is received and converted into an electrical signal. The processing unit derives an index of time-of-flight data and an index of rise time data for each grid location, constructs an error-rise time relationship in real time, and compensates measured point cloud data based on the relationship, thereby improving ranging accuracy under conditions of surface reflectivity variation. The real-time calibration method can automatically compensate measurement errors to improve ranging stability and measurement accuracy, thereby supporting reliable and consistent three-dimensional data acquisition.

The application belongs to the technical field of semiconductor optoelectronic devices, and particularly relates to a light computing array based on a reverse bias germanium modulator, which comprises a cross matrix formed by multiple rows of parallel input light waveguides and multiple columns of parallel output light waveguides; an optical detector is arranged at the output end of each column of the output light waveguides; multiple light splitters; multiple germanium modulators, each corresponding to one cross waveguide, and the first input end of the germanium modulator being connected with the output end of the light splitter through a transmission light waveguide; and multiple light combiners, each being connected with the output end of the germanium modulator and the output light waveguide. Through the above structure, the application comprehensively provides a high-response computing array with a thermal compensation mechanism and capable of reducing light reflection, so as to realize a scheme of a large-scale integrated computing array with low power consumption under the condition of meeting frequent switching.

The application belongs to the technical field of laser detection, and specifically discloses a multi-component gas distributed laser detection system based on dynamic wavelength regulation, which comprises a plurality of lasers, a multi-channel optical switch matrix connected to the output ends of the lasers, optical fiber gas chamber detection units connected to each output channel of the multi-channel optical switch matrix through optical fibers, and corresponding optical detectors connected to the output ends of the optical fiber gas chamber detection units through optical fibers; a control module is electrically connected to the lasers, the optical switch matrix and the optical detectors, and is used for controlling the switching and light-emitting timing of the lasers, controlling the switching path of the optical switch matrix, and synchronously reading and processing the data of all the optical detectors to calculate the gas concentration. The application realizes the dynamic switching and scheduling of different laser wavelengths through the multi-channel optical switch matrix, supports the multi-component gas detection of multiple detection points with a single laser array, and realizes the passive deployment of the detection points by using the distributed optical fiber gas chamber detection units, thereby meeting the intrinsic safety detection requirements in flammable and explosive hazardous environments.

An apparatus for measuring the temperature of a component inside a process chamber. The apparatus can include a light pipe positioned between a lamp radiation filter window and the component, the light pipe having a first end portion with a beveled surface and having a second end portion distal from the first end portion, the beveled surface configured to redirect infrared radiation emitted from the component through the light pipe; an optical assembly configured to collimate, filter, and focus the infrared radiation from the second end portion of the light pipe; an optical detector configured to receive an output from the optical assembly and generate at least one signal representative of the infrared radiation; a temperature circuit to convert the at least one signal to a temperature value; and a controller configured to receive the temperature value and make adjustments to other process parameters of the process chamber based on the temperature value.

The invention relates to a multi-spectral optical probe with integrated testing, comprising a housing having a window. The first channel is disposed within the housing adjacent the window and is sensitive to electromagnetic radiation within a first frequency range. The second channel is disposed within the housing adjacent the window and is sensitive to electromagnetic radiation within a second frequency range different from the first frequency range. The digitizer is operably coupled to the first channel and the second channel and is configured to provide a digital indication of the electromagnetic radiation received by the first channel and the second channel. A processor is coupled to the digitizer to receive the digital indication and generate an output signal based thereon. At least one transmitter is disposed within the housing and operably coupled to the processor. The at least one transmitter is configured to inject a test signal into at least one of the first channel and the second channel to test operation of the at least one first channel and the second channel. A method of operating a multi-channel optical detector is also provided.

The utility model provides a full-automatic optical screening machine relates to optical screening machine technical field, including support box, the top of support box is equipped with the turnover subassembly, the turnover subassembly includes mounting plate, locating magnetic plate, protective shell, turnover handle, mounting plate is mounted on one side top of support box, locating magnetic plate is mounted on one side of mounting plate, protective shell is mounted on one side of mounting plate, and turnover handle is mounted on one side of mounting plate. The protective shell is installed at the top of the supporting box through hinges, the overturning handle is installed on one side of the protective shell, and a fixed magnetic plate is installed on the inner wall of one side of the protective shell and connected with a positioning magnetic plate. According to the utility model, the protective shell is mounted through the hinge, and a worker exerts force on the protective shell from one side through the turnover handle to separate the fixed magnetic plate from the positioning magnetic plate, so that the protective shell is turned over and opened through the hinge, and the worker can conveniently maintain mechanisms such as an optical detector and a rotary screening disc which are protected by the protective shell.

A system comprises a particle sensor for a vehicle comprising a light source that directs a beam to an interrogation region outside the vehicle; and an optical detector that receives scattered or reflected light from an aerosol particle in the interrogation region. A processor performs a method for particle classification comprising measuring an optical response from a single particle in the interrogation region by identifying an optical response peak for scattered or reflected light from the interrogation region; measuring an amplitude and duration of the optical response peak; correcting the duration of the optical response peak based on a vehicle airspeed; based on the measured amplitude of the optical response peak, generating an expected optical response duration for water droplet using a calibration table; analyzing the measured optical response duration and the expected optical response duration to determine particle classification; and generating classification probabilities for one or more particle types.

Light source systems comprising light-emitting diodes, instruments comprising such light sources, and associated methods are generally described. In some embodiments, a light source system described herein has one or more features that facilitate the use of light-emitting diodes therein. In some embodiments, a light source system described herein has one or more features that allow for light supplied by the light source system to serve as an internal standard that may be employed to normalize the intensity of light received by an optical detector during an optical measurement. Some light source systems described herein may be particularly suitable for supplying light to employed in an interferometry measurement.

The invention discloses a strain monitoring system and an optical cable construction technology, and belongs to the technical field of pipelines. According to the system, pump light and detection light are respectively emitted from two ends of a sensing optical cable, the pump light and the detection light generate Brillouin scattering, Brillouin scattering light is emitted from the sensing optical cable and enters an optical detector, the optical detector converts an optical signal into an electric signal and sends the electric signal to electronic equipment, and the electronic equipment sends the electric signal based on the electric signal. And determining the strain conditions of the pipeline body and the nearby soil body. Since one part of the sensing optical cable is laid on the surface of the pipeline and the other part of the sensing optical cable is located in the soil body near the pipeline, the optical signal received by the optical detector can reflect the stress condition of the pipeline body and the soil body near the pipeline body. The electronic equipment not only can determine the strain condition of the pipeline body, but also can determine the strain condition of the soil body near the pipeline based on the electric signal converted from the optical signal, so that the pipeline body and the soil body near the pipeline are jointly monitored, and the monitoring comprehensiveness is improved.

The application relates to a kind of detection method, device, system and storage medium of LED lamp bead, comprising the following steps, the electrode of the LED lamp bead is tested, and the initial current value of the LED lamp bead is obtained;Based on the initial current value, the LED lamp bead is applied to step voltage, and voltage-current curve is obtained;The LED lamp bead corresponding to the rated operating point in the voltage-current curve is detected by optical detector, and the light spot image is obtained;Based on the light spot image, the LED lamp bead is tested by reverse voltage, and the reverse leakage current value is obtained;Based on the voltage-current curve, light spot image and reverse leakage current value, the quality of the LED lamp bead is evaluated, and the quality evaluation result of the LED lamp bead is obtained, which solves the technical problem that the traditional detection method is mainly concentrated on simple on-off test or single parameter measurement, and it is difficult to comprehensively reflect the comprehensive performance of LED lamp bead.

An opto-electronic assembly includes a substrate, an optical emitter coupled to the substrate, an optical detector coupled to the substrate, an optical seal at least partially surrounding the optical emitter and / or the optical detector and arranged to confine light emitted by the optical emitter. An optical fill material can be at least partially arranged within the optical seal.