56 results about "Thin-film interference" patented technology

The invention relates to the technical field of optical detection, and discloses an object surface three-dimensional topography measurement method based on optical interference, which comprises the following steps: acquiring a mixed time domain interference signal sequence in an axial scanning process; extracting seed pixels and constructing a spatial topology connectivity feature matrix; introducing fractional Fourier transform, and constructing a joint decoupling objective function containing a frequency domain nonlinear phase distortion evaluation index and a time domain physical invariant evaluation index; executing multi-stage optimization for the seed pixels, and locking a global optimal rotation angle; array self-adaptive decoupling is executed in combination with the spatial topology connectivity feature matrix, and an optimal rotation angle matrix is generated; and performing signal decoupling and reconstruction on the mixed signal, and extracting the absolute surface height of each pixel point to generate three-dimensional shape data. According to the invention, through multi-dimensional joint decoupling and spatial prior constraint, the problem of phase decoupling caused by film interference aliasing is solved, and the calculation overhead of a large-pixel array is reduced while the measurement precision is improved.

An article including a thin film interference pigment; and a coating including a selectively absorbing nanoparticle is disclosed. The article can exhibit increased chromaticity as compared to the thin film interference pigment alone. A method of making the article is also disclosed. The method comprises providing a thin film interference pigment and coating the thin film interference pigment with a selectively absorbing nanoparticle.

The invention relates to the field of cable detection, and discloses a cable oil film uniformity detection system based on machine vision, and the system comprises an active photoelectric illumination module which is used for generating a modulation optical signal of which the polarization state changes under a preset time sequence, and projecting the modulation optical signal to the surface of a cable; the synchronous photoelectric sensing and conversion module is used for receiving the modulated optical signal reflected by the surface of the cable and synchronously converting the modulated optical signal into a first electrical signal flow and a second electrical signal flow; wherein the first electrical signal flow represents multi-spectral intensity information of the reflected modulated optical signal, and the second electrical signal flow represents multi-polarization intensity information of the reflected modulated optical signal. By utilizing the sensitivity difference of the thin film interference model and the elliptical polarization model to the optical parameter change of the oil product, the systematic measurement error caused by batch replacement of the oil product or temperature fluctuation can be actively corrected, and the accuracy and long-term stability of the detection result are improved.

The invention relates to the technical field of space functional coatings, and discloses a magnesium alloy with a composite low-absorption coating and a preparation method of the magnesium alloy. The magnesium alloy comprises a magnesium alloy matrix, a micro-arc oxidation layer serving as a bottom coating and a magnetron sputtering deposition reflecting film serving as a surface coating. The phase of the micro-arc oxidation layer comprises SiO2, ZrO2, ZnO and MgO, and the phase of the magnetron sputtering deposition reflecting film comprises Si and SiO2. The invention provides a magnesium alloy with a multi-layer gradient composite low-absorption coating, which comprises a progressive gradient distribution multi-layer stacked strong-reflection micro-arc oxidation layer and a magnetron sputtering deposition reflecting film, and according to the stacking synergistic effect of the multifunctional coating and the thin film interference principle, the multi-layer gradient composite low-absorption coating is prepared. The magnesium alloy composite coating with multiple functional film layers connected in series for collaborative optimization is formed, excellent comprehensive performance is shown in the aspects of low absorption and corrosion resistance, and in addition, the coating also has excellent stability and space environment adaptability.

A head-mounted device may have left-eye and right-eye optical modules that may have a display that creates an image and a corresponding lens that provides the image to an eye box for viewing by a user. The optical modules each include a lens barrel to which the display and lens of that optical module are mounted and a head-mounted optical module gaze tracking system. The gaze tracking system may have light-emitting devices such as light-emitting diodes that emit light at a given near infrared wavelength and may operate through the lens and a removable supplemental lens. The supplemental lens may be a prescription lens and may have an antireflection portion that reduces the reflectance of the lens across visible and near infrared wavelengths. The antireflection portion may be a thin-film interference coating or a moth-eye portion. In this way, the gaze tracking system may operate through the removable supplemental lens.

A system may include a broadband light source emitting polarized light that is polarized to two orthogonal polarization states, multiple beam splitters for combining and splitting the polarization states, and interferometric cell for creation of interference patterns with respect to a sample surface, lenses of appropriate design that focus the polarized light at predefined locations, and sensors that analyze the polarized light as a function of angle and wavelength. The system may also include a controller configured to modulate the reference arm through operation of an optical chopper and allow for different data analysis modes to be used on the system produced data.

Asymmetric interferometry is used with various embodiments of an optical photo-thermal infrared (OPTIR) system to suppress thin film interference effects. Systems and methods for operating a photo-thermal infrared microscope to achieve these purposes are described herein. These may include illuminating a sample region with an infrared pump beam, splitting a probe beam into two paths (one towards the sample and the other towards a reference reflector), directing the probe beam towards the sample to produce interference radiation, collecting the interference radiation as collected probe light, recombining the collected probe light with the reflected probe radiation, and recombining the recombined probe light with the reflected probe radiation. The recombined light is separated between the two detectors, and the signals from the detectors are used to generate a composite photo-thermal signal that suppresses thin film interference effects caused by interference radiation.

A method for acquiring a complex refractive index distribution morphology of a film, and a device. The method comprises: S101, collecting interferograms of a reference area and a sample under test; S102, on the basis of the obtained interferograms, by means of a recovery algorithm, determining a normalized light intensity image and an optical path difference image of said sample relative to the reference area; S103, establishing a measurement model on the basis of a reflective film transmission equation; S104, determining a relationship between a measured reflection coefficient and optical path difference of an area under test of said sample relative to the reference area and the measurement model; and S105, on the basis of the measured reflection coefficient and optical path difference of the area under test of the film relative to the reference area and the relationship, calculating a complex refractive index distribution morphology of the film under test. The method is used for solving the problem in the prior art of limitation of film interference and an extinction coefficient of an absorption material.

The utility model discloses an LED lamp bead capable of preventing blue light harm, which relates to the technical field of LED lamp beads and comprises a lamp bead body, a group of pins are fixedly connected to the lower surface of the lamp bead body, a protective cover used for protection is arranged on the annular side face of the lamp bead body, and a group of protective sleeves used for limiting are arranged below the protective cover. Two first magnetic attraction blocks are fixedly connected between one set of protective sleeves, two sets of arc-shaped sleeves used for protection are arranged below one set of protective sleeves, the protective covers are made of polymethyl methacrylate materials and are excellent in transparency, high in surface hardness and good in abrasion resistance, the surfaces of the protective covers are plated with multiple layers of optical thin films for preventing blue light, the blue light is reflected according to the thin film interference principle, and the anti-blue-light effect is achieved. And a group of grooves are formed in the inner wall of the protective cover, so that the inner wall of the protective cover is uneven, light beams emitted by the lamp bead body are reflected and refracted, light rays are propagated and mixed for multiple times in the protective cover, direct emission of blue light is reduced, and the uniformity and the spectral quality of the light are improved.

Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to suppress thin film interference effects.

Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to suppress thin film interference effects.

The application discloses a transparent electrostatic ultrasonic transducer and a display device, wherein the transducer increases the surface roughness of the vibrating diaphragm surface and / or the insulating layer surface, so that the phase relationship of the light waves reflected from the two interfaces changes rapidly in space when superimposed, or the light waves are diffusely reflected, so that a large-area and bright color coherent interference pattern cannot be formed. Through the scheme, the conditions for thin film interference can be effectively destroyed, the transparent electrostatic ultrasonic transducer no longer presents obvious rainbow stripes under white light, the visual appearance is improved, so that when the transparent electrostatic ultrasonic transducer is integrated with a display screen, visual interference on the display content is avoided, the user experience is improved, and the application is particularly suitable for applications with high requirements on visual quality, such as smart phones, tablet computers, vehicle-mounted displays and the like.

The invention discloses a device and a method for measuring the depth of an ultrathin scratch on an airplane windshield. The device comprises a 45-degree right-angle prism (1), a coupling film medium (2), airplane glass (3), a laser (4), a beam expanding collimating mirror (5) and a projection screen (6). According to the invention, the ultrathin scratch depth of the airplane windshield is measured through a thin film interference principle. The device takes water as a film medium and has no influence on the glass. The device obtains interference fringes projected to a screen, and the scratch depth with the visible light wavelength magnitude can be accurately obtained according to the fringe bending degree in combination with the thin film interference principle. The device is simple, the measurement is accurate, the device is very suitable for measuring the ultrathin scratch depth of the airplane windshield with multiple layers of media, and an important basis is provided for civil aviation maintenance personnel to evaluate the scratch depth.

The invention provides a multilayer film saturable absorption mirror based on interference and an optimization method. The multilayer film saturable absorption mirror comprises a saturable absorption material film, a middle interference layer, a gold film and a silicon substrate, the thin film is a flat thin film with a saturable absorption characteristic; the middle interference layer is a ZnS thin film layer deposited on the gold reflector substrate; and the gold film and the silicon substrate jointly form a gold reflector substrate. The thin film interference cancellation condition is achieved by adjusting the thicknesses of the thin film and the middle interference layer, so that the linear reflectivity is extremely low when the light intensity is low; as the light intensity is enhanced, the refractive index of the material is changed and the absorption coefficient is reduced until the material is bleached by strong light, the optical lengths of the thin film and the middle interference layer do not meet destructive interference any more, so that the upper limit of the modulation depth cannot be greatly reduced due to the introduction of the middle interference layer. According to the invention, the linear reflectivity or transmittance of the thin film type saturable absorption mirror at low light intensity can be effectively reduced to enlarge the modulation range, the effect of improving the modulation depth is achieved, and the method is simple to operate, high in flexibility and universal.

The utility model discloses an infrared ray cut-off filter which comprises a substrate, a hard protective film, a multilayer interference film and an anti-reflection coating are sequentially deposited on one surface of the substrate according to the direction from the air side to the substrate, the multilayer interference film is composed of at least five high refractive index material layers and at least five low refractive index material layers, and the high-refractive-index material layers and the low-refractive-index material layers are alternately stacked. According to the utility model, a plurality of layers of dielectric films are deposited on the surface of the substrate, selective transmission and reflection characteristics for light in a specific wavelength range are formed based on a thin film interference principle, and a strong reflection band is formed in a near-infrared region while high transmittance is effectively kept in a visible light range, so that the purpose of cutting off infrared rays is achieved.

The application relates to a carbon-containing thin film interference microsphere with non-iridescent structural color and a preparation method, and belongs to the field of new materials. The carbon-containing thin film interference microsphere with non-iridescent structural color is prepared by high-temperature calcination of polymer-inorganic hybrid microspheres; the polymer-inorganic hybrid microspheres are prepared by uniformly coating an inorganic thin film interference layer on the surface of polymer microspheres, and the average particle size is 300-1800 nm, and is further preferably 500-1000 nm. The non-iridescent submicron thin film interference microsphere structural color pigment has the advantages of bright color, small particle size and simple preparation method, and can be used as a novel structural color pigment.

Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to suppress thin film interference effects. Systems and methods are described herein for operating a photothermal infrared microscope to accomplish these objectives. These can include illuminating a sample region with an infrared pump beam, splitting a probe beam into two paths (one towards the sample and the other towards a reference reflector), directing the probe beam towards the sample to create interfering radiation, collecting the interfering radiation as collected probe light, recombining the collected probe light with reflected probe radiation, dividing the recombined light between two detectors, and using signals from the detectors to generate a composite photothermal signal that suppresses the effects of thin film interference caused by the interfering radiation.

The invention relates to the technical field of film uniformity detection, in particular to a PETG film uniformity detection device based on optical interference, which is used for film uniformity detection and comprises a workbench, and the workbench is provided with a micrometer, a light emitting module, an acquisition module, a processing module, a storage module and a control module. By means of the film interference phenomenon that light beams can be reflected after passing through the upper surface and the lower surface of a film, an imaging plate and an area-array camera are adopted to record graphic data of an upper light reflecting area, a lower light reflecting area and a highlight area, and comparison data are formed by combining manual and mechanical detection thickness values of a ten-thousand-minute ruler. A plurality of contrast data meeting the uniformity requirement are selected for pattern contour integration to form a highlight range region, when the thin film is continuously detected, the detection part of the thin film meets the uniformity requirement as long as the highlight region formed by irradiating the thin film is in the highlight range region, and rapid and continuous detection can be realized.

A method for quality assessment in imprint lithography which is based on analyzing the quality of an imprintable layer based on indirect detection of its viscosity. The method comprises imprinting a dedicated test pattern comprising multiple pattern sections, comprising pattern indentations of differing widths and / or depths. The viscosity of the imprintable layer affects how it flows to fill the lithographic imprint pattern, and higher viscosity results in uneven (at a micro or nano scale) layer geometry (i.e. curved or bowed) in each groove or on each ridge of the indentation pattern. This unevenness is detectable upon optical inspection, due to a thin-film interference pattern caused by the passage of light through the uneven imprintable layer surface, and back-reflection from an underlying substrate, this being detectable in captured optical image data. Thus, the viscosity of the imprintable layer is indirectly detectable via capturing optical image data of the test pattern. By using multiple different pattern sections of differing width and depth, a precise quantitative measure of viscosity-related quality can be identified.

The invention discloses an ultra-wide-angle antireflection film based on thin film interference and a sub-wavelength effect and a preparation method of the ultra-wide-angle antireflection film. The antireflection film comprises a transparent base material, a gradient refractive index structure layer, a micro-nano structure layer and a protective layer which are sequentially stacked. According to the invention, a micro-nano composite layered structure broadband wide-angle antireflection film with a laminated optical medium-three-dimensional periodic microstructure is prepared by using a roll-to-roll magnetron sputtering and nanoimprint technology, and compared with a single multi-layer medium antireflection film, the wide-angle antireflection film provided by the invention widens the visual angle; compared with an antireflection film with a single micro-nano structure, under the condition of ensuring antireflection of a large visual angle (0-60 degrees) and a wide wave band (380-1100 nm), the high aspect ratio characteristic of the micro-nano structure is reduced, the anti-damage effect can be improved, the micro-nano structure is not limited by the harsh requirement of the precision of a nanoscale micro-nano machining technology any more, and the anti-reflection film is more suitable for large-area and batch roll-to-roll type production.

The present invention discloses a WDM demultiplexer based on a thin-film interference filter, which includes a pre-stage demultiplexer and a post-stage demultiplexer. The pre-stage demultiplexer is arranged in front of the light beam incident port of the post-stage demultiplexer. The pre-stage demultiplexer divides the incident light beam into two beams, the upper beam and the lower beam, each carrying the first half of each wavelength and the second half of each wavelength of light waves. When the upper and lower light waves are emitted in parallel, there is a vertical distance between them. The post-stage demultiplexer further demultiplexes the incident upper and lower light waves, making full use of the extensibility in all directions of the three-dimensional space. The optical demultiplexer (DeMUX) can be made more compact, and at the same time, the optical path of some channels is relatively shortened, making the device easy to couple, which is beneficial to the production of an optical demultiplexer (DeMUX) with more wavelength channels.

An electronic device may be provided with conductive structures such as conductive housing structures. A visible-light-reflecting coating may be formed on the conductive structures. The coating may have adhesion and transition layers and a thin-film interference filter on the adhesion and transition layers. The thin-film interference filter may be a four-layer interference filter stacked directly onto the adhesion and transition layers and having an uppermost SiCrN layer, a lowermost SiN layer, and interleaved SiH and SiN layers. If desired, an opaque coloring layer such as a Cr layer may be disposed between the interference filter and the adhesion and transition layers. The coating may exhibit a deep red or orange color that has a relatively uniform visual response even when the underlying conductive structures have a three-dimensional shape.

The invention discloses a full-spectrum water quality detection method with transient interference self-consistent compensation. The method comprises the following steps: acquiring absorbance; performing transient interference separation processing on the absorbance to generate absorbance after stripping scattering; performing film interference decurl processing on the absorbance after stripping and scattering to generate decurl absorbance; and quantitatively calculating the concentration vector of the target object based on the decurl absorbance. According to the invention, two key interferences of transient scattering and film interference can be compensated in a cascade manner, a self-consistent closed loop is realized through uncertainty propagation and self-cleaning triggering, and the accuracy and robustness of online water quality detection are improved.

The invention discloses a spectrum calibration method and system based on thin film interference multi-peak characteristics, and relates to the technical field of spectrum calibration, and the spectrum calibration method based on the thin film interference multi-peak characteristics comprises the following steps: S1, designing a thin film interference device according to target calibration parameters; s2, obtaining a reflection or transmission spectrum collected by the spectrum camera to be calibrated; s3, based on the theoretical extreme wavelength position calculated by the thin film interference device model, matching the actually measured extreme wavelength position with the theoretical extreme wavelength position to obtain a corresponding matching relationship; s4, establishing a pixel-wavelength response function according to the matching relationship; and S5, performing spectrum calibration based on the pixel-wavelength response function. The complexity of a spectrum calibration system is reduced, the economic and space cost is saved, and the problems that a traditional spectrum calibration method is low in overall efficiency, the accuracy and precision of spectrum measurement are affected, and the dynamic environment adaptability of the traditional spectrum calibration method is poor are solved.

The invention discloses a perforated multi-layer current collector and a preparation method thereof, a pole piece and a battery, and the method comprises the following steps: S1, preparing a polymer base film, and doping a coloring agent in a forming process of the polymer base film to reduce the light transmittance of the prepared polymer base film to 15% or below; s2, performing metal coating on the surface of one side of the macromolecular base film to prepare a first metal layer; s3, laser drilling is carried out on the first metal layer and the whole macromolecule base film from the side with the first metal layer; and S4, performing metal coating on the surface of the other side of the macromolecular base film to prepare a second metal layer, thereby obtaining the perforated multi-layer current collector. The strength of the polymer base film can be improved, the problems that pores of the polymer base film are prone to deformation and belt breakage are solved, the processing efficiency is improved, the coloring agent is added, the film interference phenomenon generated in the laser drilling process due to the fact that the film has the upper interface and the lower interface is reduced, and the laser drilling stability is improved.

The application discloses a kind of six-degree-of-freedom error correction three-dimensional motion measurement system and measurement method, including optical air floatation platform, six-degree-of-freedom error correction three-dimensional motion measurement system, two-dimensional motion machine table, reference optical flat, color confocal measurement bridge component, camera measurement bridge component and thin film interference component;Camera measurement bridge frame module in the application acquires the image of concentric circle in the image grid sensor system, the concentric circle image is based on subpixel processing and concentric circle identification to obtain high-precision transverse displacement, based on linear interpolation calculation mode forms two virtual measurement lines in X, Y two directions, the intersection of measurement line is the placement position of color confocal head, the thin film interference component is placed directly below the head, the thin film interference component uses super-precision optical flat as measurement reference, so that the application satisfies three-dimensional zero Abbe error, three-axis zero coupling error, improve the measurement accuracy of three-dimensional motion measurement platform.

The invention relates to a thin film interference filter color coating. An electronic device may be provided with a conductive structure, such as a conductive housing structure. A visible light reflective coating may be formed on the conductive structure. The coating may have an adhesive and transition layer, and a thin film interference filter on the adhesive and transition layer. The thin film interference filter may be a four-layer interference filter directly stacked on the adhesion and transition layers and having an uppermost SiCrN layer, a lowermost SiN layer, and interleaved SiH and SiN layers. If desired, an opaque colored layer, such as a Cr layer, may be disposed between the interference filter and the adhesion and transition layer. The coating may exhibit a dark red or orange color that has a relatively uniform visual response even when the underlying conductive structure has a three-dimensional shape.

The utility model provides a three-section laminated solar cell, which comprises a crystal silicon bottom cell, a perovskite middle cell and a perovskite top cell, the perovskite top cell comprises a top cell hole transport layer, a top cell perovskite absorption layer, a top cell passivation layer, a top cell electron transport layer, a top cell buffer layer, a second transparent electrode layer, a third transparent electrode layer, a second metal electrode layer and an antireflection layer. According to the perovskite top cell, the transparent electrode layers comprise the second transparent electrode layer and the third transparent electrode layer arranged on the top surface of the second transparent electrode layer, namely, a double-layer transparent electrode structure is used, the thin film interference principle is utilized, and the thickness of the third transparent electrode layer is adjusted, so that the light transmissivity of the perovskite top cell at the wave band of 600-800nm is improved, and the light transmittance of the perovskite top cell at the wave band of 600-800nm is improved. Therefore, the current matching among the perovskite top cell, the perovskite middle cell and the crystalline silicon bottom cell is improved, and the photoelectric conversion efficiency of the three-section laminated solar cell is improved.

A full-field or line-field swept-source optical coherence tomography (OCT) system that uses a tilt-tuned cat's-eye laser whose semiconductor gain chip is dimensioned to lase in multiple spatial modes. The multimode output is preserved by free-space or multimode-fiber coupling from the laser to the interferometer, and is shaped by cylindrical line-forming optics to illuminate the sample with a long aspect-ratio line or across the field. The multimode operation produces a super-Gaussian, near flat-top intensity profile along the line or field and reduces spatial coherence, improving detector uniformity and lowering pixel cross-talk. Example implementations use a single-angled-facet gain chip with ridge width >3 μm and / or active-layer ridge height >2 μm, a thin-film interference filter tilt-scanned by a servoed galvanometer with encoder, and a line-scan camera to acquire parallel A-scans for B-scan formation. The approach maintains OCT advantages while relaxing single-mode constraints on the swept source and improving line-field and full-field image quality.