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92 results about "Spectral variation" patented technology

Abstract: Spectral variation is profound in remotely sensed images due to variable imaging conditions. The wide presence of such spectral variation degrades the performance of hyperspectral analysis, such as classification and spectral unmixing.

Full spectrum endpoint detection

A method of endpoint detection during plasma processing of a semiconductor wafer comprises processing a semiconductor wafer using a plasma, detecting radiation emission from the plasma during the semiconductor processing, and tracking data points representing changes in spectra of the radiation as a function of time during the semiconductor processing. At any point prior to or during processing a plurality of profiles are provided, each profile representing a different processing condition affecting detection of the desired plasma processing endpoint of the semiconductor wafer. After selecting a desired profile, a first set of parameters are input, representing simplified values for determining when changes in spectra of the radiation indicate that plasma processing of the semiconductor wafer reaches a desired endpoint. The selected profile converts the input first set of parameters into a larger, second set of parameters, and then applies the second set of parameters to an algorithm that converts data points from the spectra of the radiation as a function of time into an endpoint curve. The method then uses the algorithm to track changes in spectra of the radiation as a function of time and determine when plasma processing of the semiconductor wafer reaches a desired endpoint.
Owner:NOVELLUS SYSTEMS

Augmented classical least squares multivariate spectral analysis

InactiveUS6842702B2Accurate and precise prediction modelAccurate and precise predictionInvestigating moving fluids/granular solidsScattering properties measurementsAlternating least squaresSpectral analysis
A method of multivariate spectral analysis, termed augmented classical least squares (ACLS), provides an improved CLS calibration model when unmodeled sources of spectral variation are contained in a calibration sample set. The ACLS methods use information derived from component or spectral residuals during the CLS calibration to provide an improved calibration-augmented CLS model. The ACLS methods are based on CLS so that they retain the qualitative benefits of CLS, yet they have the flexibility of PLS and other hybrid techniques in that they can define a prediction model even with unmodeled sources of spectral variation that are not explicitly included in the calibration model. The unmodeled sources of spectral variation may be unknown constituents, constituents with unknown concentrations, nonlinear responses, non-uniform and correlated errors, or other sources of spectral variation that are present in the calibration sample spectra. Also, since the various ACLS methods are based on CLS, they can incorporate the new prediction-augmented CLS (PACLS) method of updating the prediction model for new sources of spectral variation contained in the prediction sample set without having to return to the calibration process. The ACLS methods can also be applied to alternating least squares models. The ACLS methods can be applied to all types of multivariate data.
Owner:NAT TECH & ENG SOLUTIONS OF SANDIA LLC

Augmented classical least squares multivariate spectral analysis

InactiveUS20050043902A1Accurate and precise predictionSpectral/fourier analysisRaman scatteringAlternating least squaresModel method
A method of multivariate spectral analysis, termed augmented classical least squares (ACLS), provides an improved CLS calibration model when unmodeled sources of spectral variation are contained in a calibration sample set. The ACLS methods use information derived from component or spectral residuals during the CLS calibration to provide an improved calibration-augmented CLS model. The ACLS methods are based on CLS so that they retain the qualitative benefits of CLS, yet they have the flexibility of PLS and other hybrid techniques in that they can define a prediction model even with unmodeled sources of spectral variation that are not explicitly included in the calibration model. The unmodeled sources of spectral variation may be unknown constituents, constituents with unknown concentrations, nonlinear responses, non-uniform and correlated errors, or other sources of spectral variation that are present in the calibration sample spectra. Also, since the various ACLS methods are based on CLS, they can incorporate the new prediction-augmented CLS (PACLS) method of updating the prediction model for new sources of spectral variation contained in the prediction sample set without having to return to the calibration process. The ACLS methods can also be applied to alternating least squares models. The ACLS methods can be applied to all types of multivariate data.
Owner:NAT TECH & ENG SOLUTIONS OF SANDIA LLC

Method for determining the temperature of semiconductor substrates from bandgap spectra

An optical method for measuring the temperature of a substrate material with a temperature dependent band edge. In this method both the position and the width of the knee of the band edge spectrum of the substrate are used to determine temperature. The width of the knee is used to correct for the spurious shifts in the position of the knee caused by: (i) thin film interference in a deposited layer on the substrate; (ii) anisotropic scattering at the back of the substrate; (iii) the spectral variation in the absorptance of deposited layers that absorb in the vicinity of the band edge of the substrate; and (iv) the spectral dependence in the optical response of the wavelength selective detection system used to obtain the band edge spectrum of the substrate. The adjusted position of the knee is used to calculate the substrate temperature from a predetermined calibration curve. This algorithm is suitable for real-time applications as the information needed to correct the knee position is obtained from the spectrum itself. Using a model for the temperature dependent shape of the absorption edge in GaAs and InP, the effect of substrate thickness and the optical geometry of the method used to determine the band edge spectrum, are incorporated into the calibration curve.
Owner:JOHNSON SHANE R +1

Method for performing automated in-scene based atmospheric compensation for multi-and hyperspectral imaging sensors in the solar reflective spectral region

A method of automatically compensating a multi- or hyper-spectral, multi-pixel image for atmospheric effects, comprising resolving a plurality of spectrally-diverse pixels from the image, determining a spectral baseline from the spectrally-diverse pixels, determining a statistical spectral deviation of the spectrally-diverse pixels, normalizing the statistical spectral deviation by applying a scale factor, and compensating image pixels with both the spectral baseline and the normalized spectral deviation. Another embodiment features a method of automatically determining a measure of atmospheric aerosol optical properties using a multi- or hyper-spectral, multi-pixel image, comprising resolving a plurality of spectrally-diverse pixels from the image, determining a statistical spectral deviation of the spectrally-diverse pixels, correcting the statistical spectral deviation for non-aerosol transmittance losses, and deriving from the statistical spectral deviation one or more wavelength-dependent aerosol optical depths. A final embodiment features a method of automatically determining a measure of atmospheric gaseous optical properties using a multi- or hyper-spectral, multi-pixel image, comprising resolving a plurality of spectrally-diverse pixels from the image, determining a statistical spectral deviation of the spectrally-diverse pixels, and deriving from the statistical spectral deviation wavelength-dependent gaseous optical depths.
Owner:SPECTRAL SCI

Method and system for dual domain discrimination of vulnerable plaque

A method for optically analyzing blood vessel walls comprises receiving optical signals from the vessel walls and resolving a spectrum of optical signals in wavelength to generate spectral data. The spectral data is then transformed into the frequency domain. In the preferred embodiment, this transformation is achieved by applying wavelet decomposition. In other embodiments other transform techniques such as Fourier analysis is applied. The spectral data in the frequency domain are then used to analyze the vessel walls. In the typical embodiment, the spectral data are used to analyze a disease state of blood vessels walls such as the presence of atherosclerotic plaques, and their state. Dual domain method enables the spectral signals from blood vessels to be analyzed simultaneously according to frequency and wavelength (time). Dual-Domain Regression Analysis (DRDA) and Dual-Domain Discrimination Analysis (DDDA) in combination with wavelet transform (WT) enable the modeling of signals simultaneously in both domains. This provides a mechanism for isolating the non-interesting variation in spectra, making the system and analysis method more robust against variations in instrument and environmental conditions, e.g., broad-band spectral variation contributed from water, heart motion, and other non-interesting interferences. This provides higher sensitivity and specificity when compared with other models currently being used.
Owner:INFRAREDX INC
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