365 results about "Surface emission" patented technology

A lighting device for a motor vehicle, in particular a high-definition headlamp, includes an imaging component that has an active surface on which light-emitting diodes or laser diodes are arranged in a matrix to generate pixels in a light distribution in a targeted manner, and a projection lens with which the light emitted from the active surface is projected outward from the motor vehicle when the lighting device is in operation. The lighting device is designed to switch the projection lens from a first setting to a second and from the second setting to the first. The projection lens has a first focal length in the first setting, and a second focal length in the second setting, which is greater than the first focal length.

The invention relates to an integrated component group comprising: a carrier, in particular a submount, with a first main surface and an opposing second main surface; a laser arranged on the carrier on the first main surface and having a first light-emitting surface and an opposing second light-emitting surface, wherein the laser is configured to emit more laser light via the first light-emitting surface than via the second light-emitting surface during its intended use; and a photodiode integrated into the carrier and configured to detect laser light emitted by the laser from the second light-emitting surface.

The invention belongs to the technical field of defect detection, and particularly relates to a mirror surface type surface defect detection method and system, a laser device is used for emitting a laser beam to a detected mirror surface type surface, the laser beam is reflected on a receiving plate through the detected mirror surface type surface to form an elliptic arc scanning path, and the elliptic arc scanning path is discretized into a plurality of continuous path points; obtaining a theoretical reflection light spot track of the roi area to be detected on the receiving plate, dividing the theoretical reflection light spot track into multiple equal parts, and establishing a mapping relation with each path point; the method comprises the following steps: controlling a laser to scan a detected mirror surface type surface along an elliptic arc scanning path, identifying path points corresponding to defects, recording actual position coordinates on a receiving plate, and obtaining equal division point positions on a theoretical reflection light spot track; acquiring an optical path offset, and determining normal vector deflection information of the defect at the surface of the detected mirror surface; obtaining a three-dimensional space coordinate of the defect; and constructing a three-dimensional model of the detected mirror surface type surface, and marking defect positions.

A surface-emitting laser element includes: a first guide layer including a photonic crystal layer that is formed on a c plane of a group-3 nitride semiconductor and includes air holes arranged with two-dimensional periodicity in a plane parallel to the photonic crystal layer, and an embedding layer that is formed on the photonic crystal layer and closes the air holes; an active layer formed on the first guide layer; and a second guide layer formed on the active layer, wherein an air hole set including at least a main air hole and a sub-air hole smaller in size than the main air hole is arranged at each square lattice point in the plane parallel to the photonic crystal layer, and wherein the main air hole has a regular-hexagonal prism shape, a long-hexagonal prism shape, or an elliptic cylindrical shape with a major axis parallel to a <11-20> axis.

The invention discloses a temperature control method, device and equipment for semiconductor equipment and a storage medium, and relates to the technical field of temperature control, and the method comprises the steps: calculating the equivalent radiation temperature of the brightness of a slit cavity observation band based on the brightness of the slit cavity observation band in an edge infrared observation annular region of a rapid heat treatment furnace and the surface emissivity of a wafer; solving the equivalent temperature of the inner edge of the quartz clock cover; on the basis of the equivalent radiation temperature and the equivalent temperature of the inner edge of the quartz clock cover, net radiation heat incoming power transmitted to a wafer edge belt of the wafer by an annular slit radiation cavity in the rapid heat treatment furnace is calculated; and solving a target lamp area power replacement vector of the rapid heat treatment furnace based on the net radiation heat incoming power. According to the invention, the initiative and accuracy of wafer edge temperature control can be improved.

A vertical cavity surface emitting laser includes an oxide substrate having a first face and a second face at an opposite side from the first face; a semiconductor section disposed on the first face; a dielectric filter layer disposed between the semiconductor section and the first face and having a reflective spectrum configured to provide an optical window; a first DBR mirror; and a second DBR mirror disposed at a curved surface of the second face. The first DBR mirror, the semiconductor section, the dielectric filter layer, the oxide substrate, and the second DBR mirror are arranged in a first axial direction to form an extended cavity. The semiconductor section is disposed between the dielectric filter layer and the first DBR mirror, and includes a p-type III nitride region, an n-type III nitride region, and a III nitride active region between the p-type and n-type III nitride regions.

A LiDAR performance test system according to the present invention comprises a target that can rotate vertically or horizontally and a LiDAR device disposed to be spaced a predetermined distance apart from the target. The LiDAR device comprises: a transmitter for emitting light toward the surface of the target; and a receiver for receiving the light reflected from the surface of the target, wherein the target is disposed such that the path of light emitted from the transmitter toward the surface of the target and the path of reflected light received from the surface of the target by the receiver do not match or overlap. According to the present invention, the system for testing the performance of LiDAR by considering the surface reflection characteristics of the target is provided, and thus can contribute to improving the accuracy and reliability of LiDAR performance.

The invention relates to the field of yarn nondestructive testing, and provides a nondestructive testing system and method for ring spinning 300 or more extra-high count yarns, and the system comprises infrared photoelectric sensing modules which are used for transmitting infrared rays with a preset wavelength to the surface of a steel collar ring at a preset elevation angle by using each gated infrared photoelectric module, receiving infrared light reflected by the steel collar ring when the steel wire ring rotates along the steel collar ring, and converting the light intensity of the infrared light into an electric signal; the multi-channel parallel capture module is used for carrying out spindle speed parallel estimation by combining ADC sampling through a multi-channel capture strategy and a low-power-consumption optimization strategy, and judging the current yarn state; the comparator threshold value self-adaption module is used for dynamically adjusting the threshold value of the comparator through a self-adaption threshold value strategy; and the light intensity self-adaptive regulation and control module is used for adjusting the emission light intensity of the infrared photoelectric module through a light intensity self-adaptive regulation and control strategy in combination with PWM output. According to the invention, real-time accurate identification and early warning of yarn abnormity can be realized.

The invention provides an on-chip integrated laser light source and an optical coupling integration method thereof.The on-chip integrated laser light source comprises a silicon optical substrate and a light source chip assembly integrated on the silicon optical substrate, and the silicon optical substrate comprises an optical signal transmission waveguide; the light source chip assembly comprises a surface-emitting distributed feedback laser chip so as to generate laser beams emitted in the direction perpendicular to the surface of the chip. The on-chip integrated laser light source further comprises a grating coupling structure arranged between the surface emission distributed feedback laser chip and the optical signal transmission waveguide. The light-emitting surface of the surface-emitting distributed feedback laser chip is arranged towards the silicon light substrate, and a laser beam generated by the surface-emitting distributed feedback laser chip is directly projected and coupled into the light signal transmission waveguide through the grating coupling structure; the surface-emitting distributed feedback laser chip is fixedly combined on the silicon optical substrate through a flip chip technology, so that the high-precision end face alignment requirement of the heterogeneous integrated waveguide is converted into high-efficiency grating coupling based on a surface light emitting mode. In this way, harsh end face coupling is converted into efficient grating coupling.

The invention discloses a surface-emitting laser and a surface-emitting laser preparation method, which are applied to the field of lasers, and the surface-emitting laser comprises a signal area, an amplification area and a surface-emitting area, each of the signal region, the amplification region and the surface emission region comprises a substrate, an epitaxial layer grown and prepared on the surface of the substrate, and a post-process layer prepared and formed on the surface of the epitaxial layer and the surface of the substrate; the epitaxial layer in the surface emission region comprises a passive second-order grating layer; and the volume of the active region in the epitaxial layer in the signal region is smaller than that of the active region in the epitaxial layer in the amplification region. According to the surface emitting laser, the signal area, the amplification area and the surface emitting area in the surface emitting laser are separately prepared, function separation of the signal area, the amplification area and the surface emitting area is achieved, the surface emitting area internally provided with the passive second-order grating layer is matched, and the surface emitting laser capable of improving the output power and the modulation rate at the same time is achieved.

According to an aspect, a detection device includes: an optical sensor comprising a plurality of light-receiving elements configured to receive light; and a front light that is located on an object to be detected side of the optical sensor and comprises a light guide film and a plurality of light sources configured to emit light to a first side surface of the light guide film. A wire-grid polarizer configured to separate the light incident from the light source into first polarized light and second polarized light is located between the optical sensor and the front light.

The invention belongs to the technical field of quantitative remote sensing, and relates to a mid-infrared hyperspectral emission and reflection characteristic integrated inversion method, which comprises the following steps: acquiring mid-infrared hyperspectral satellite remote sensing data, and optimizing sensing entrance pupil radiance data to obtain optimized entrance pupil radiance data; the intermediate infrared hyperspectral satellite remote sensing data comprises sensing entrance pupil radiance data; performing atmospheric correction on the optimized entrance pupil radiance data by using a radiation transfer model to obtain surface brightness temperature and atmospheric downward radiation, and calculating solar irradiance reaching the surface; constructing a mid-infrared hyperspectral earth surface bi-directional reflectivity inversion framework, and performing earth surface bi-directional reflectivity inversion based on the mid-infrared hyperspectral earth surface bi-directional reflectivity inversion framework to obtain earth surface bi-directional reflectivity and earth surface equivalent radiance; constructing a scene self-adaptive framework, and performing inversion based on the scene self-adaptive framework to obtain the surface temperature and the surface emissivity; therefore, accurate separation of surface emission radiation and surface reflection radiation is completed.

To provide a surface emitting module capable of improving the accuracy of the distance between a microlens and the upper surface of a light emitting element and condensing light emitted from the light emitting element with high precision by the microlens.SOLUTION: A through hole is provided in a sealing lid, and a lens holder is provided on the inner wall of the through hole. A microlens is placed in the through hole and fixed to the upper surface of the lens holder by a first joint. The upper surface of a light emitting element is fixed to the lower surface of the lens holder by a second joint. A concave portion is provided in the mounting portion, and the edge thereof and the lower surface of the sealing lid are joined by a third joint. Both the first joint and the second joint are joined by metal joints that do not contain flux. The third joint is joined with solder or adhesive.SELECTED DRAWING: Figure 1

An optical system including a self-emitting display and an optical element is provided. The self-emitting display emits a collimated light from a surface. The optical element is disposed on a moving path of the collimated light. A head-up display is further provided.

The invention relates to an optoelectronic device including a transmitter designed to emit electromagnetic radiation and to be operated with an input voltage, and a receiver designed to receive the electromagnetic radiation and to provide an output voltage, the transmitter including at least one surface emitter, and the receiver comprising at least one photodiode.

A surface emitter (VCSEL) comprises a stack of semiconductor layers including: a lower Bragg mirror (DBR); a cavity layer; a current-limiting layer; and an upper DBR. The upper DBR comprises multiple pairs of alternating layers with different refractive indices, a subset of which includes alternating layers with decreasing concentration of the at least one metal from the lower layers of the upper DBR, located closer to the cavity layer, to the upper layers of the upper DBR, located farther from the cavity layer. This subset of alternating layers with decreasing concentration of the at least one metal from the lower layers of the upper DBR to the upper layers of the upper DBR exhibits decreasing oxidation depths from one side face of the upper DBR.A method for forming the VCSEL is also disclosed.

The present invention relates to an emitter having at least one light source and a lens for shaping a beam for illuminating a target area. According to the invention, the lens has a through opening for allowing passage of an unreflected and undeflected direct light beam, on the input side of which the light source is positioned, wherein an inner circumferential surface enclosing said through opening at least partially forms a light entrance surface of the lens, at which some of the light rays emitted by the light source enter the lens, and are deflected by the lens by way of total internal reflection and are emitted as an indirect light beam from a light exit surface, wherein said inner circumferential surface is contoured in such a way that Fresnel reflections occurring at said inner circumferential surface are emitted through said through opening and illuminate the target area as part of the direct light beam and / or of the indirect light beam.

A surface-emitting laser device and a method for manufacturing and operating the same are disclosed. The surface-emitting laser device comprises an active layer, a semiconductor layer optically coupled to the active layer, and a photonic crystal structure disposed within the semiconductor layer. The device further comprises a laser region and a detector region. The laser region includes a first set of electrical contacts located on opposite sides of the active layer and the semiconductor layer, and generates the output field of the device. The detector region includes a second set of electrical contacts located on opposite sides of the active layer and the semiconductor layer, and located outside the first laser region. The detector region is configured to generate an output current proportional to the output field. The presence of the detector region within the device improves the structure and power monitoring techniques compared to the prior art.

Provided in the present application is a battery processing device. The battery processing device comprises a box, an inspection component and a processor, wherein the box has an accommodating cavity, which is configured to accommodate a film to be processed; the inspection component is connected to the box and comprises a light source and a receiving member, the light source being used for emitting light to a first surface of said film, so as to excite said film to generate fluorescence, an emergent light path of the light source being substantially perpendicular to the first surface, and the receiving member being used for receiving the fluorescence and configured to receive the fluorescence emitted substantially perpendicular to the first surface; and the processor is connected to the receiving member and is used for generating processing information on the basis of the fluorescence received by the receiving member.

The application provides a substrate carrier, a conveying system, a vacuum system and a method for operating the substrate carrier, the substrate carrier comprising a bearing frame, a substrate bearing surface, a groove and a heat absorbing sheet, the substrate bearing surface is used for placing a substrate, a groove is arranged on the bottom side of each substrate bearing surface, a heat absorbing sheet is arranged on the bottom surface of the groove, the emissivity of the first surface of the heat absorbing sheet is greater than the emissivity of the second surface of the groove bottom surface and / or the heat absorbing sheet, in this case, the low emissivity surface can inhibit heat dissipation, and the high emissivity surface can allow heat to pass through efficiently, therefore the first surface of the heat absorbing sheet can reabsorb the thermal radiation of the substrate and transmit to the second surface or the groove bottom surface, and good heat dissipation effect is achieved. This technology is simple and low in cost, meanwhile, the coating speed does not need to be reduced, and the problem of temperature rise of the substrate can be effectively solved without reducing the processing efficiency.

Provided is a technology capable of improving uniformity of irradiation intensity at a relative position with respect to surface-emitting faces (122a, 123a). Lighting devices (122, 123) are provided with: a plurality of light sources (122e, 123e) provided with the surface-emitting faces (122a, 123a); and optical path control plates (122b, 123b) that are provided on the surface-emitting faces (122a, 123a) of the plurality of light sources (122e, 123e) and that control the optical paths of irradiation light from the surface-emitting faces (122a, 123a). The irradiation light controlled by the optical path control plates (122b, 123b) is irradiated.

The application relates to a bus duct connector internal bus temperature detection method and device and electronic equipment. An infrared temperature measurement module is installed in the bus duct connector, the infrared temperature measurement module is used to obtain thermal distribution images of each phase bus, a main circuit where the bus duct is located is provided with a smart meter, and the smart meter is used to obtain phase currents of each phase bus. The method comprises the following steps: obtaining the thermal distribution images and the phase currents respectively; determining an initial surface temperature of a target bus according to the thermal distribution images; determining a surface emissivity of the target bus according to material properties and an operation time of the target bus, determining a real surface temperature of the target bus according to the surface emissivity and the initial surface temperature; determining a temperature deviation amount between the surface and the interior of the target bus according to the phase current and a preset temperature deviation function, and determining an internal temperature of the target bus according to the temperature deviation amount and the real surface temperature. The bus duct connector internal bus temperature detection method can effectively improve the detection precision of the bus temperature.

The invention provides a printed fabric surface flaw automatic detection method and system based on computer signal processing, and relates to the technical field of data processing.The method comprises the steps that an ultrasonic transducer array is arranged above a fabric advancing path, and the starting end and the tail end of the path are each fixedly provided with a photoelectric position sensor; determining a virtual reference direction based on fabric edge position information detected by two photoelectric position sensors in real time; analyzing the virtual reference direction into a plurality of continuous analysis intervals; evaluating tension and flatness attributes of the fabric in each analysis interval to obtain a dynamic adjustment value; and performing real-time adjustment on emission parameters of the ultrasonic transducer array based on the dynamic adjustment value, emitting regulated specific-frequency ultrasonic waves to the surface of the fabric, and receiving reflection echoes to obtain original acoustic signal data of the fabric. According to the invention, high-adaptability automatic detection of printed fabric surface and near-surface flaws is realized.

An ultra-thin microtome (100, 1202) chuck includes a mounting portion (204) having mating surfaces (1406, 1606) operable to removably attach the mounting portion (204) to a sample (116, 126) slicing device (1100), and electrical contacts operable to electrically connect the mounting portion (204) to a power source; a sample receiving portion (202, 204, 210) coupled to the mounting portion (204), the sample receiving portion (202, 204, 210) having a sample receiving surface (206) sized to receive a sample (116, 126); a light source (1120, 116) coupled to the sample receiving portion (202, 204, 210), the light source (1120, 116) being operable to emit light from the sample receiving surface (206) and through a sample (116, 126) positioned along the sample receiving surface (206); and a circuit (516, 616) that electrically connects the light source (1120, 116) to the electrical contacts of the mounting portion (204).

The present application belongs to the technical field of image processing, and particularly relates to a forging process temperature field real-time monitoring method based on infrared images, which comprises the following steps: firstly, a temperature prediction model is established based on Newton's cooling law; secondly, a spectral selectivity distortion factor is constructed to quantify environmental interference by comparing the measured and expected radiation intensity ratios of multi-band infrared images; at the same time, a surface emissivity mutation index is constructed to identify surface changes by calculating the space-time gradient of radiation intensity; finally, the reliability score of colorimetric temperature is calculated by comprehensively considering the two indexes, and the predicted temperature and the colorimetric temperature are dynamically weighted and fused according to the score, so as to output an accurate, continuous and strong anti-interference optimal temperature estimation value. The present application can realize accurate temperature measurement by constructing environmental interference and surface state change indexes, evaluating the reliability of colorimetric temperature, and dynamically weighting and fusing the colorimetric temperature and the predicted temperature based on a physical model.

The developing roller comprises a conductive shaft core, a heat dissipation transition layer, a conductive elastic layer and a surface heat dissipation developing layer, the conductive shaft core is of a hollow structure, and a main heat dissipation channel penetrating in the axial direction is formed in the conductive shaft core; according to the developing roller facilitating heat dissipation for the laser printer, the heat dissipation efficiency is extremely high, overheating aging is avoided, a complete heat dissipation system of surface dissipation, middle transmission and internal export is constructed, the heat dissipation area is increased through a surface net-shaped heat dissipation structure, the heat dissipation efficiency is improved, and the heat dissipation efficiency is improved. The heat dissipation transition layer rapidly transfers heat, and the hollow conductive shaft core and the heat dissipation fins at the two ends accelerate export of internal heat, so that friction heat and Joule heat generated in the working process of the developing roller can be rapidly dissipated, aging and deformation of parts caused by heat accumulation are avoided, and the service life of the developing roller is prolonged.

The embodiment of the invention relates to a surface emitting laser and a light emitting unit. The surface emitting laser includes: a substrate; the bottom reflector structure, the active layer and the top reflector structure are arranged on the substrate; the at least two surface grating units are formed on the surface of the top reflecting mirror structure and located in a lasing area of the surface emitting laser, and each surface grating unit is configured to enable the polarization selection mode of at least one surface grating unit to be different from the polarization selection modes of the other surface grating units. According to the scheme, emission and polarization control of non-fundamental mode laser can be restrained in a targeted mode, selective single / multi-mode stable output is achieved, and the mode hopping phenomenon is reduced.

There is provided an optical system having a viewing window. The optical system comprises a display device arranged to spatially modulated light in accordance with a hologram displayed thereon to form a holographic wavefront. The holographic wavefront forms a holographic reconstruction of an image downstream of the display device. The optical system further comprises a waveguide arranged to receive the holographic wavefront and waveguide the holographic wavefront between a pair of reflective surfaces thereof. One surface of the pair of reflective surfaces is partially transmissive such that a plurality of replicas of the holographic wavefront are emitted therefrom. The optical system further comprises an optical component between the holographic reconstruction and the waveguide, wherein the optical component is arranged to (a) form a virtual image of the holographic reconstruction upstream of the display device and (b) form an image of the displayed hologram at infinity or downstream of the waveguide.

To provide a device capable of detecting abnormality of a mounting state of a tire wheel such as looseness of a nut during traveling of a vehicle.SOLUTION: In one embodiment, a device for detecting an abnormality in a mounted state of a tire wheel (16) includes a light emitting device (20) configured to emit light toward an inner side surface (17) of the tire wheel (16), a light receiving device (20) configured to receive reflected light from the inner side surface (17) of the tire wheel (16), and a processing device (30) connected to the light emitting device (20) and the light receiving device (20). The processing device (30) is configured to acquire a distance (22) to an inner surface (17) of the tire wheel (16) based on the reflected light received by the light receiving device (20) during rotation of the tire wheel (16), and determine that the tire wheel (16) is mounted in an abnormal state when a representative value (24) of the distance (22) exceeds a predetermined value (26).SELECTED DRAWING: Figure 1