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32 results about "Electronic imaging" patented technology

Synchrotron radiation hard X-ray electron coupling nanoscale high spatial resolution detection method

The invention discloses a synchrotron radiation hard X-ray electron coupling nanoscale high spatial resolution detection method. The method comprises the following steps: 1) selecting synchrotron radiation hard X-rays as a light source; selecting a matched light source energy interval according to the material and thickness of the sample; 2) according to the selected synchrotron radiation hard X-ray energy, selecting a point spread function with high quantum efficiency, a small point spread function and a narrow emission electron spectrum, and calculating a corresponding photocathode material and thickness; 3) detecting the sample by using the light source and the photocathode determined in the above step to obtain a synchrotron radiation hard X-ray transmission image carrying sample structure information, and incidence the synchrotron radiation hard X-ray transmission image on the photocathode; the photocathode emits electrons under the action of incident photons, converts an X-ray transmission signal into an electronic signal, inputs the electronic signal into the electronic imaging system for focusing, amplifying and imaging, and inputs the electronic signal into the imaging recording system; and 4) obtaining a detection result of the sample according to the image recorded by the imaging recording system.
Owner:INST OF HIGH ENERGY PHYSICS CHINESE ACAD OF SCI

Space target detection system and method based on time-of-flight dual-mode integrated photoelectronic imaging

The invention provides a space target detection system and method based on time-of-flight dual-mode integrated photoelectric imaging, and the system employs a time-of-flight dual-mode integrated photoelectric detection scheme to detect a space target, and collects the gray image data and depth image data of the space target. And after data acquisition is completed, the spaceborne computer is matched with a space target detection algorithm to obtain relative motion information of the target. According to the invention, the three-dimensional relative motion information of the target can be synchronously and directly measured in the two-dimensional gray domain and the three-dimensional space domain, and favorable conditions are provided for accurate measurement of the space target in a space environment.
Owner:BEIJING INST OF CONTROL ENG

Drum assembly

The embodiment of the utility model relates to the technical field of electronic imaging, and discloses a drum assembly, the drum assembly is used for detachably mounting a developing box, and the drum assembly comprises a drum frame, a photosensitive drum, a drum identification assembly and a lifting assembly; the photosensitive drum extends along the first direction, is rotatably supported at two ends of the drum frame in the first direction, and is positioned in front of the drum assembly in the second direction; the drum identification assembly comprises an electric contact surface, the electric contact surface is arranged at one end of the drum frame in the first direction, and the electric contact surface is fixedly arranged relative to the drum frame; the lifting assembly can lift the drum assembly and the electrical contact surface. According to the embodiment of the invention, the electric contact of the electric contact surface of the storage medium and the identification contact of the image forming device is realized.
Owner:ZHUHAI NINESTAR INFORMATION TECH CO LTD

A fixed pattern noise removal method based on a coding-decoding network

This invention provides a fixed-pattern noise reduction method based on an encoder-decoder network, comprising: S1. Acquiring RAW images using an electronic imaging device equipped with a target image sensor, and creating a paired dataset for training a denoising model; S2. Performing necessary preprocessing on the dataset, expanding the dataset size and increasing its diversity through data augmentation; S3. Designing a lightweight encoder-decoder network, which consists of an encoder, connection layers, a decoder, and an output layer; S4. Training the encoder-decoder network based on the preprocessed paired dataset; S5. After the model training reaches convergence, loading the preprocessed, uncropped complete image into the model, and obtaining the denoised image through post-processing. This method utilizes the powerful fitting ability of the encoder-decoder network to eliminate prominent fixed-pattern noise in low-light images, and is applicable to different types of image sensors; the designed encoder-decoder network has low computational cost, making it suitable for resource-constrained edge devices.
Owner:HEFEI JUNZHENG TECH CO LTD

Double-energy-point double-magnification imaging device and method based on time-broadening framing camera

PendingCN121541408APhotographyPinhole cameraImage calibration
The invention belongs to the field of X-ray imaging, and provides a double-energy-point double-magnification imaging device and method based on a time broadening type framing camera, and the device comprises a pinhole sheet and the time broadening type framing camera; the method comprises the steps of pinhole piece and time broadening type framing camera imaging, geometric mapping model construction, distortion correction function fitting and image calibration. According to the invention, photoelectron imaging and transmission light imaging are realized at the same time by using the time-broadening framing camera, so that two spatially corresponding images are formed; the difference between electron acceleration and focusing characteristics in the time-broadening framing camera can be reflected by comparing the size and distortion difference of the straight-through light image and the photoelectron image, and dual-channel response mutual calibration is achieved.
Owner:SHANGHAI JIAOTONG UNIV +1

A multi-view backscattered electron imaging device and method for a low-voltage scanning electron microscope

This invention belongs to the field of scanning electron microscopy and discloses a multi-view backscattered electron imaging device and method for low-voltage scanning electron microscopy. It employs a design where a ring-shaped microchannel plate is placed between the objective lens and the sample, aligned with the optical axis. A central through-hole allows the primary electron beam to pass through. The input surface faces the sample, and the output surface is close to the readout anode unit. The readout anode unit is divided into multiple concentric rings to distinguish polar angle signals, and each ring is further uniformly divided into multiple independent fan-shaped surfaces to capture azimuth information. This device significantly improves the signal-to-noise ratio and image quality of low-voltage imaging. It is compatible with large, flat samples without requiring sample tilting, avoiding the geometric defects of traditional side-mounted detectors. Multi-view signal separation provides rich angular information, enhances image stereoscopicity and shadow effects, supports simple 3D reconstruction to infer surface morphology features, and reduces information waste, meeting the high-precision analysis needs of surface-sensitive materials and non-conductive samples.
Owner:NANJING UNIV

A method for determining the thickness of an electrochemically deposited gold, silver, palladium noble metal overlayer

This invention discloses a method for determining the thickness of electrochemically deposited gold, silver, and palladium noble metal capping layers, comprising the following steps: 1) preparing standard samples by electrochemically depositing nickel of different thicknesses onto a pure copper substrate, followed by gold, silver, and palladium plating; 2) testing the capping layer thickness of the standard samples using scanning electron microscopy (SEM) backscattered electron imaging technology; 3) testing the intensity of X-ray characteristic spectral lines of different capping layer thicknesses using SEM energy dispersive spectroscopy (EDS) technology, and determining optimized test conditions; constructing a surface capping layer thickness calibration curve based on SEM EDS technology; 4) detecting the electrochemically deposited capping layer thickness of different types of samples. This method can accurately determine the thickness of bonding lines or thin films of noble metal capping layers prepared by electrochemical deposition processes in the integrated circuit field, filling the technical gap of rapid measurement for such products. The detection process is convenient and fast, and the detection results are accurate and consistent.
Owner:NANJING PRODUCT QUALITY SUPERVISION & INSPECTION INSTITUTE (NANJING QUALITY DEVELOPMENT & ADVANCED TECHNOLOGY APPLICATION RESEARCH INSTITUTE) +1

Surgical needle type electronic imaging visual puncture system

The invention relates to a medical instrument, in particular to a surgical needle type electronic imaging visual puncture system. Which comprises a holmium laser channel, a needle type electronic imaging mirror channel, a water inlet channel, a connecting puncture needle body, an inclined plane puncture inner needle, a plane outer needle and a needle type electronic imaging mirror, and is characterized in that the holmium laser channel, the needle type electronic imaging mirror channel and the water inlet channel are fixedly connected above the connecting puncture needle body; the three channels are converged into one channel at the middle lower part of the connecting puncture needle body, the lower part of the connecting puncture needle body is movably connected with the inclined plane puncture inner needle and the plane outer needle in sequence, and the needle type electronic imaging mirror can pass through the channel of the needle type electronic imaging mirror.
Owner:丰超

Multi-view back scattering electron imaging device and method of low-voltage scanning electron microscope

The invention belongs to the field of scanning electron microscopes, and discloses a multi-view backscattering electron imaging device and method for a low-voltage scanning electron microscope, which adopts the design that an annular micro-channel plate is arranged between an objective lens and a sample and optical axes are aligned, a central through hole allows a primary electron beam to pass through, an input surface faces the sample, and an output surface is tightly attached to a reading anode unit. The read-out anode unit is divided into a plurality of concentric girdles to distinguish polar angle interval signals, and each girdle is uniformly divided into a plurality of independent sectors to capture azimuth angle information. By adopting the device, the signal-to-noise ratio and the image quality of low-voltage imaging are remarkably improved, a large flat sample can be compatible without inclining the sample, and geometric defects of a traditional side detector are avoided; the multi-view signal separation can provide abundant angle information, enhance the stereoscopic impression and shadow effect of the image, support simple three-dimensional reconstruction to deduce the surface topography characteristics, reduce information waste and meet the high-precision analysis requirements of surface sensitive materials and non-conductive samples.
Owner:NANJING UNIV

Developing box

The utility model relates to the technical field of electronic imaging, in particular to a developing box, comprising: a box body having a first end and a second end opposite to each other in a first direction; a developing roller that rotates about an axis extending in a first direction; the driving part receives external power to rotate and is positioned at the first end; the light-emitting part emits a light source capable of being detected by the image forming device and is positioned at the second end; the power supply part provides electric energy for light emitting for the light emitting part; the abutting piece is located at the second end and abuts against a component in the image forming device; the utility model aims to provide the developing box which is stable in operation.
Owner:ZHUHAI NINESTAR INFORMATION TECH CO LTD

System and method of obtaining fit and fabrication measurements for eyeglasses using combined camera imaging and depth map scanning

PCT designated stageWO2026112085A1Image enhancementSpectales/goggles3d imageRadiology
A system and method for determining measurements to correctly fit prescription lenses (44) to eyeglass frames (24). The eyeglass frames (24) are selected and worn on the face. The individual wearing the eyeglass frames (24) is imaged with a camera (32) and scanned with a 3D imaging system (34) in at least two orientations. The relative displacement of the eyeglass frames (24) relative the electronic imaging device (30) between the first orientation and the second orientation is measured using one or more internal measurement units (15, 35). The internal measurement units (15, 35) collect displacement data (43). Measurement points (48) are identified on the eyeglass frames (24) and / or the individual wearing the eyeglass frames (24). Data is stereoscopically analyzed using the displacement data (43) to determine 3D coordinates for the measurement points (48). Distances between coordinates are calculated. The distances correspond to fabrication measurements needed to fabricate prescription lenses (44).
Owner:OPTIKAM TECH INC

Semiconductor electron detector with junction barrier wide energy detection range and imaging method

PendingCN122180159ANanosecondHemt circuits
The application provides a junction barrier wide energy detection range semiconductor electron detector and an imaging method, and belongs to the technical field of semiconductor detectors and electronic imaging. The device is a vertical stacked structure, and sequentially comprises, from bottom to top, a first electrode, a semiconductor substrate layer, a semiconductor epitaxial layer and a second electrode. The first electrode is used for forming electrical interconnection with an external circuit. The semiconductor substrate layer is arranged on the first electrode and is used as a support layer and a back contact layer of the device. The semiconductor epitaxial layer is grown on the semiconductor substrate layer, and the semiconductor epitaxial layer is composed of at least one layer of non-intentionally doped high-purity epitaxial layer. The second electrode is deposited on the surface of the semiconductor epitaxial layer and forms a Schottky contact. The semiconductor electron detector can realize ultra-low dark current at an extremely low working bias, nanosecond-level fast response, and can realize the separation imaging of SE and BSE signals flexibly by adjusting the bias.
Owner:NANJING UNIV +1

Processing cartridge

To be detachably accommodated in an electronic imaging device including a braking force applying assembly and a drive force transmission member, a processing cartridge includes: a drum frame; a photosensitive drum rotatably supported on the drum frame; a drum coupling, configured at one end of the photosensitive drum, to engage with the drum drive transmission unit and receive drive force to rotate in rotation direction A, where the drum coupling includes a compression portion acting on a braking force applying assembly, and during engagement of the drum coupling with the drum drive transmission unit, the drum coupling abuts against the braking force applying assembly, causing the braking force applying assembly to move in the retraction direction, thereby reducing or eliminating abnormal noise during rotation of the drive transmission unit.
Owner:ZHUHAI NINESTAR INFORMATION TECH CO LTD

An x-ray and electron beam combined testing apparatus

ActiveCN116754593BEasy to installRealize the function of X-ray absorption fine structure spectrum testingMaterial analysis by transmitting radiationCombined testFluorescence
The application discloses an X-ray and electron beam combined test device, and belongs to the field of test devices. The X-ray and electron beam combined test device comprises a transmission electron microscope device, an X-ray intensity detection device, an X-ray emission device and an X-ray fluorescence receiving device. The transmission electron microscope device comprises a device main body and a sample support assembly, a part of the sample support assembly is arranged in the inner cavity through a first through hole, the X-ray intensity detection device is arranged outside the device main body and faces a second through hole, the X-ray emitted by the X-ray emission device passes through a gas ionization chamber and the second through hole in sequence and is shot towards a sample, and a part of the X-ray fluorescence receiving device is arranged in the inner cavity through a third through hole and faces the sample. The X-ray and electron beam combined test device provided by the application can simultaneously perform X-ray absorption fine structure spectrum test and transmission electron imaging test on a sample, so that a real and corresponding two-dimensional topographic image and local coordination structure information of the sample can be obtained.
Owner:SHENZHEN ADVANCED LIGHT SOURCE RESEARCH INSTITUTE (HIGH-END SCIENTIFIC INSTRUMENT SHENZHEN BRANCH OF THE UNIVERSITY REGIONAL TECHNOLOGY TRANSFER & TRANSFORMATION CENTER)

toner cartridge

This invention relates to a toner cartridge, comprising a cylindrical body, a base, a slide, and a rotating member; the cylindrical body has an opening, the base has a cover portion fitted onto the opening, a toner outlet disposed on the cover portion, and at least one abutment top disposed on the outer wall of the cover portion; the slide has a body slidably disposed on the base, a through groove disposed on the body, and a first through hole disposed on the body, the body being movable from a first position toward the cylindrical body to a second position; the rotating member has a pivot portion pivotally connected to the slide, a receiving portion extending from the pivot portion and for the abutment top of the base to abut against, a push-door portion extending from the pivot portion, and a second through hole disposed on the push-door portion; when the slide moves from the first position to the second position, the rotating member is abutted and rotates due to the abutment top, and when the slide is in the second position, the toner outlet, the first through hole, and the second through hole are interconnected. In this way, when the toner cartridge is assembled into the electronic imaging device, the originally closed toner outlet can be opened and connected to the toner inlet of the electronic imaging device to input toner into the electronic imaging device, and toner leakage can be avoided during the assembly process.
Owner:GENERAL PLASTIC INDUSTRIAL CO LTD

Systems and methods for depth map sampling

An electronic imaging device and method for image capture are described. The imaging device includes a camera configured to obtain image information of a scene and that may be focused on a region of interest in the scene. The imaging device also includes a LIDAR unit configured to obtain depth information of at least a portion of the scene at specified scan locations of the scene. The imaging device is configured to detect an object in the scene and provides specified scan locations to the LIDAR unit. The camera is configured to capture an image with an adjusted focus based on depth information, obtained by the LIDAR unit, associated with the detected object.
Owner:QUALCOMM INC

Input device restriction management for safe remote operation of medical devices

An assistive system (1) including an assistor electronic device (12) including an assistor display (24), and at least a pointing device (22), the assistor electronic device programmed to perform a controller minor task including receiving and displaying a mirror of the controller video on the assistor display and receiving remote inputs directed to the electronic imaging device controller via the at least one user input device of the assistor electronic device; and assistor electronic device interfacing hardware (40) configured to transmit the controller video from the electronic imaging device controller to the assistor electronic device and including a human interface device (HID) restriction processor (46) configured to receive the remote inputs from the assistor electronic device; transmit those remote inputs that satisfy an access criterion (51) to the electronic imaging device controller; and block those remote inputs that do not satisfy the access criterion from the electronic imaging device controller.
Owner:KONINKLIJKE PHILIPS NV

Device and method for monitoring surface topography in multi-electron-beam selective melting forming process

The invention provides a device and a method for monitoring surface topography in a multi-electron beam selective melting forming process. The device comprises a quadrupole plate group, a double-differential output multi-electron beam back scattering electronic imaging device and a partition time-sharing point-by-point scanning imaging and high-precision splicing method. Four electron gun back scattering electron receiving sensors are divided into a left electrode, a right electrode, a front electrode and a rear electrode which are symmetrical, the electrodes at the same positions of the four electron gun back scattering electron receiving sensors are connected to form a polar plate group, and then four groups of signal sampling, conditioning and amplifying circuits and a high-speed data acquisition channel are adopted, so that the circuit structure and connecting wires are simplified, the cost is reduced, and the reliability is improved. The system reliability is improved; according to the multi-electron-beam large-breadth image splicing method, partition and time-sharing point-by-point scanning imaging is adopted, data are synchronously collected according to point-by-point scanning and high-speed point scanning, direct fusion, 1 / 2 fusion and 1 / 4 fusion algorithms are adopted for single-time imaging, two-time imaging and four-time imaging areas, high-precision splicing of multi-electron-beam scanning imaging is completed, and multi-electron-beam large-breadth image output is achieved.
Owner:BEIHANG UNIV

Integrated telescopic microscopic imaging equipment

The utility model discloses an integrated telescopic microscopic imaging device, comprising a housing, the housing comprises a housing 1 and a housing 2, and the housing 1 and the housing 2 are assembled through screws; the telescopic device is fixedly installed in the shell, a single-tube telescope is selected as the telescopic device, an installation through hole is formed in one side of a lens cone of the telescopic device, and a base is connected into the installation through hole in a sliding mode; the amplification equipment is detachably connected to the bottom of the telescopic equipment, and a single-tube magnifier is selected as the amplification equipment; the pushing assembly is arranged on one side, far away from the mounting through hole, of the base, and is used for pushing the base to move so as to push the camera on the base into a lens cone of the telescopic equipment; through the assembly of the telescopic device and the amplification device, a user can independently use a telescope to carry out long-distance observation according to requirements, or connect the amplification device to realize microscopic observation, and can also carry out digital image observation in combination with an electronic imaging assembly, so that the application scene of the device is greatly expanded.
Owner:何昀晓

Photodiode-based electronic detector and ultrafast CMOS electronic imaging sensor

PendingCN121398167AHemt circuitsImage detection
The invention relates to an electronic detector based on a photodiode and an ultrafast CMOS electronic imaging sensor. The ultrafast CMOS electronic imaging sensor comprises a pixel array; the pixel array comprises a plurality of basic detection units, and each basic detection unit is of a longitudinal distribution structure; each basic detection unit comprises a detection layer and a pixel circuit layer; the detection layer and the pixel circuit layer are connected in a hybrid bonding mode; the detection layer comprises a photodiode array, and each basic detection unit comprises a photodiode and four signal storage paths; the photodiode in each basic detection unit cooperates with the four signal storage paths to convert optical signals in the exposure period into voltage signals so as to realize framing imaging detection. The electron detector has high time resolution and good signal response capability, can provide effective technical support for ultrafast imaging and diagnosis in high-energy physical experiments, and can realize zero dead time detection in a single pixel.
Owner:SHENZHEN UNIV

Tdiccd module, electronic imaging assembly and method for eliminating inter-module crosstalk of tdiccd module

PendingCN122349069AComputer hardwareCrosstalk cancellation
The application provides a TDICCD module, an electronic imaging assembly and a crosstalk elimination method between TDICCD modules. The TDICCD module comprises a marking module which adds stage marks to output pixel data; a crosstalk elimination module which acquires over-scan pixel data and effective pixel data of a current TDICCD module, determines over-scan pixel data with the same stage mark as first pixel groups, and determines effective pixel data with the same stage mark as second pixel groups; acquires average pixel gray values of the first pixel groups; matches the stage marks of the first pixel groups with the stage marks of the second pixel groups, and if the stages of any two stage marks in which interference modules are located are the same, it is determined that the matching is successful; determines the first pixel groups matched with the second pixel groups successfully as reference pixel groups, and subtracts the corresponding average pixel gray values from the effective pixel data in the second pixel groups to obtain final effective pixel data; and the TDICCD module can effectively eliminate the interference of interference modules on itself.
Owner:THE 44TH INST OF CHINA ELECTRONICS TECH GROUP CORP

Umbilical line interface and disposable umbilical line

ActiveCN309731306SUmbilical lineUmbilical cord
1. The name of the design product: umbilical cord line interface and disposable umbilical cord line. 2. The use of the design product: the design product is a disposable electronic imaging catheter, used to connect electronic endoscope image processor, and plays a signal transmission role. 3. The design points of the design product: in shape. 4. The picture or photo that best shows the design points: perspective view 1.
Owner:DAICHUAN MEDICAL (SHENZHEN) CO LTD

Device and method for adjusting spatial position of CCD (Charge Coupled Device) image sensor

The invention relates to the technical field of optical instrument adjustment and detection, in particular to a device and a method for adjusting the spatial position of a CCD (Charge Coupled Device) image sensor. The device comprises a base, a target system, a product mounting seat and a horizontal adjusting system. The base provides horizontal reference and guidance; the target system provides a reference target capable of being vertically and precisely adjusted; and the product mounting seat can horizontally and precisely move to adapt to products with different focal lengths. The adjustment method comprises the steps of firstly establishing a horizontal reference, then respectively adjusting a product and a target to design positions, and finally guiding fine adjustment of the position of the image sensor by comparing the deviation between an electronic imaging center and a physical target center until the deviation enters a permissible range. According to the invention, standardization and quantification of image center adjustment are realized, and the method has the advantages of high precision, strong versatility and convenient operation.
Owner:XIAN NORTH ELECTRO OPTIC TECH DEFENSE

Ultra-thin imaging lens

The utility model discloses an ultra-thin imaging lens, and belongs to the technical field of imaging lenses. An ultra-thin imaging lens comprises a first lens, a second lens and a third lens, object side surfaces and image side surfaces of the first lens, the second lens and the third lens are aspheric surfaces, and the ultra-thin imaging lens further comprises a diaphragm arranged between the second lens and the third lens; according to the utility model, a three-lens type design composed of the first lens, the second lens, the third lens and the diaphragm is adopted, and the surface shape structure of each lens is combined with the optimization range of optical parameters, so that the whole lens is lighter and thinner; according to the lens, the overall size of the lens can be effectively shortened and the visual angle of the lens can be effectively improved under the condition of maintaining high imaging quality, so that the lens has the characteristics of high resolution, wide visual angle and large aperture, and can be better adapted to small or thin portable electronic imaging devices.
Owner:GUANGDONG XUYE OPTOELECTRONICS TECH

Powder cylinder and developing device

The invention discloses a powder barrel and a developing device. The toner cartridge of the embodiment can form a developing device together with a developing cartridge provided with a developing roller, the developing device is mounted on the electronic imaging equipment, and the electronic imaging equipment comprises a detection part for detecting the toner amount in a developing chamber of the developing device; the developing cartridge includes a housing having a developing chamber; wherein the powder cylinder comprises a powder cylinder body which is mounted on the shell; the toner cartridge body comprises a toner containing chamber and a detected part, the toner containing chamber is used for containing toner, and the detected part is matched with the detection part so that the detection result of the detection part can be in a full toner state or a toner lacking state all the time. The toner in the toner accommodating chamber can be continuously supplied to the developing chamber, and the phenomenon that the toner cannot be timely supplied to the developing chamber due to misjudgment of the detection part is effectively eliminated.
Owner:ZHUHAI DINGHUI TECH CO LTD

Electron beam forming for energy analyzers

PCT designated stageWO2026139283A1Energy analyserControl signal
The invention relates to an electron imaging apparatus (23) configured to be connected to an energy analyzer apparatus. The electron imaging apparatus comprises a receiving aperture (22), a control unit, and a field generating unit (65). The receiving aperture is configured for receiving electrons from a focal volume (200) which form an electron beam (25). The control unit is configured for providing a control signal to the field generating unit based on a desired height of the electron beam in an energy dispersive direction (y) of the energy analyzer apparatus at a proximal end (90) of the electron imaging apparatus and a desired angular distribution (α p ) in the energy dispersive direction at the proximal end. The field generating unit is configured for generating at least one electrostatic, magnetic, or electrostatic and magnetic field based on the at least one control signal such that the at least one electrostatic, magnetic, or electrostatic and magnetic field is configured for exerting a force on the electrons of the electron beam in the energy dispersive direction such that a height of the electron beam in the energy dispersive direction at the proximal end corresponds to the desired height in the energy dispersive direction at the proximal end and an angular distribution in the energy dispersive direction at the proximal end corresponds to the desired angular distribution in the energy dispersive direction at the proximal end.
Owner:SPECS SURFACE NANO ANALYSIS GMBH

Powder storage device and powder supply system

The invention relates to the technical field of printing equipment, and provides a powder storage device and a powder supply system.The powder storage device comprises a device body, the device body is provided with a powder storage cavity and a powder feeding port, and the powder feeding port is located in the first direction of the powder storage cavity; the developing component is rotationally arranged at the powder feeding port; the information carrying assembly comprises a connecting seat arranged on the device body; the first movable part moves in the first direction; the second moving part moves along a straight line in the second direction, and the second moving part is in linkage with the first moving part; an information carrying member including an electrical connection portion; the first movable part is provided with a non-shielding part exposed out of the device body; when the powder storage device is assembled on the electronic imaging equipment, the first movable part is linked with the second movable part and drives the second movable part to carry the electric connecting part to move from a non-contact position with the electronic imaging equipment to a contact position. According to the invention, the chip can be better protected, and the connection between the chip and the corresponding communication interface on the equipment is tighter.
Owner:珠海市颂洋科技有限公司

A photovoltaic panel defect detection apparatus

This invention relates to the field of photovoltaic panel production and testing technology, specifically disclosing a photovoltaic panel defect detection device, including a testing platform; a concave seat is provided on the bottom surface of the testing platform; multiple rotating rollers are horizontally rotatably arranged on the inner wall of the concave seat; a first cylinder is installed on the top surface of the testing platform; a pair of energized copper pressure needles are installed at the output end of the first cylinder; an electronic imaging detection unit, a visual monitoring screen, and a human-machine interaction control system are arranged outside the testing platform; a first support frame is arranged on one side of the testing platform; a feeding mechanism is arranged on the first support frame; by causing the energized copper pressure needles to contact the photovoltaic panel electrodes, a stable current is applied to excite electroluminescence, the electronic imaging detection unit simultaneously acquires appearance images and EL images, the detection data is transmitted to the visual monitoring screen in real time, and the data is simultaneously uploaded to the human-machine interaction control system, thereby improving the yield and reliability of photovoltaic panels.
Owner:SUZHOU HUGANG TECH CO LTD