The invention relates to the technical field of optical detection, in particular to a nano material detection method based on
surface enhanced Raman spectroscopy, which comprises the following steps: acquiring
spectral data at different acquisition moments based on a nano material, generating a
spectral curve, and preprocessing; analyzing the preprocessed spectrum curve to obtain an initial shape feature as a
crest factor, and constructing a particle set; calculating a fluctuation
influence factor through the particle set, obtaining an overlapping parameter of the particle according to the preprocessed spectrum curve, and combining the fluctuation
influence factor with the overlapping parameter to determine a final shape feature of the particle; carrying out clustering analysis on the ultimate shape features of the particles to obtain a plurality of clusters, calculating the feature change degree of each cluster, carrying out screening and redundant peak
elimination according to the feature change degree, and correcting the spectrum curve after
elimination; quantitative analysis is carried out based on the corrected spectrum curve, so that the method has higher adaptability to
data noise, redundant information and external environment change, and the result has higher robustness.