379results about "Emission spectroscopy" patented technology

Apparatus and methods for monitoring emissions from a borehole to determine the composition of earthen material removed from the borehole are described. Monitoring can be done in real time as the borehole is being deepened with a millimeter-wave drilling beam. The present technology can monitor in real-time the elemental composition of the earthen materials (e.g., rock, minerals, crystals, metals, etc.) in a borehole created by a directed-energy beam that melts and vaporizes the earthen material materials in its path. Using a continuous emissions monitor (CEM) in combination with directed-energy excavation of a borehole enables rapid surveying of the subsurface for precious and commercial metals.

Methods, systems, and apparatus for distributed ledger for physical material. In one aspect, a method includes obtaining a first set of information regarding a physical material to be verified, the first set of information including hundreds of values for channels of a spectrum of electromagnetic radiation emitted by the physical material in response to an irradiation of the physical material; obtaining a second set of information regarding the physical material to be verified; sending the first and second sets of information over the communication network to a verification computer system; receiving verification information; initiating addition of information usable to identify the first set of information and the digital signature to a distributed digital ledger; receiving confirmation of the addition of the information useable to identify the first set of information and the digital signature to the distributed digital ledger; and reporting that the physical material has been verified.

Disclosed is a linear array scanning Brillouin scattering elastic imaging device. In the device, a signal generating system consists of a narrow linewidth continuous wave laser, a half-wave plate, a beam expander, a Y-direction scanning galvanometer, a microlens array, a pinhole array filter, a first plano-convex lens, a polarization beam splitter, a quarter-wave plate and a microscope objective. A signal receiving system consists of a microscope objective, a quarter-wave plate, a polarization beam splitter and an eight-channel optical collimator array. Each channel of an eight-channel spectrometer consists of an optical collimator, a convex lens, a scanning Fabry-Perot interferometer, a photomultiplier tube and an eight-channel photon collection card.

A method of operating a spectrometer controller is provided. The method comprises obtaining an interfered peak using a detector of a spectrometer, wherein the interfered peak is produced by a plurality of spectral emissions of different wavelengths, each of the plurality of spectral emissions in the interfered peak incident on the detector at an associated detector location. For one or more of the spectral emissions of the interfered peak, an associated curve is generated using a neural network, wherein the neural network is trained to output data indicative of a shape of the associated curve based on data representative of the associated detector location. For one or more of the spectral emissions of the interfered peak, the associated curve is output.

The invention provides a method for plasma bombardment energy distribution detection and life prediction of a silicon carbide part, and belongs to the technical field of semiconductor processing based on deep learning. The method comprises the following steps: firstly, arranging a magnetic probe array to obtain local electromagnetic parameters, and obtaining plasma luminescence characteristics by using optical imaging and spectrum acquisition equipment; preprocessing the acquired data to obtain multi-source fusion features; designing an energy distribution reconstruction framework based on a generative adversarial network, wherein a generator is used for deducing a three-dimensional energy distribution field of plasma; and inputting the three-dimensional energy distribution field time sequence characteristics into a bombardment dynamic characteristic modeling time sequence depth network, establishing a nonlinear mapping relation between energy distribution and material aging, further obtaining life prediction parameters, and finally obtaining the remaining service life of the silicon carbide part. According to the method, a complex degradation mechanism can be reflected more accurately, and the precision and robustness of life prediction are remarkably improved.

A solution is proposed for testing a luminescence imaging apparatus (105). A corresponding testing device (110) comprises one or more seats (320) and one or more containers (325), each filled with a liquid comprising at least one luminescence substance and accommodated in a corresponding seat (320); the seats (320) have corresponding windows (330) for imaging the luminescence substance of the containers (325) accommodated therein. The seats (320) are slanted with respect to a resting surface (310) of the testing device (110). A holder (305) for use in the testing device (100) is further provided. A luminescence imaging apparatus (105) for use with the testing device (110) is also proposed. Moreover, a system (100) comprising a luminescence imaging apparatus (105) and this testing device (110) is proposed.

A plasma processing apparatus includes a chamber in which plasma is generated, a support portion configured to support an object to be processed within the chamber, a head portion within the chamber and opposite to the support portion in a first direction, and a plasma analyzer including: a plurality of light collectors in the head portion, the plurality of light collectors configured to receive light emitted from plasma at a plurality of positions, a spectrometer outside the chamber nd connected to the plurality of light collectors, and a multiplexer connected between the plurality of light collectors and the spectrometer, the multiplexer configured to select one of a plurality of lights transmitted from the plurality of light collectors and transmit the selected one of the plurality of lights to the spectrometer.

The present disclosure relates to a system (1) for determining at least one of the character, composition and reactivity of dissolved organic matter, DOM in water comprising: an ultraviolet, UV light source (2) configured to excite a water under examination (3) with a light beam (2′) having an excitation wavelength in the range of 250-500 nm. Further, the system comprises a first detector device (4) and a second detector device (5), wherein the system (1) further comprises control circuitry (6) configured to predict at least one of the composition, character and reactivity of DOM in the water under examination (3) based on said first and second fluorescence intensity.

Disclosed herein are scientific instrument support systems, related methods, computing devices and computer-readable media. A method of mitigating distortion of an optical emission spectrum obtained from an optical emission spectrometer is provided. The method may comprise a step of obtaining a spectrum recorded with the spectrometer and a respective one or more condition parameters indicative of an operating condition at a time of recording the spectrum. The method may further comprise a step of providing a model configured to output, in response to the one or more condition parameters, one or more transform parameters of a transformation to be applied to the obtained spectrum. A transformation may be applied in accordance with the obtained one or more transform parameters to the obtained spectrum to mitigate distortion of the spectrum due to a discrepancy between the operating condition and a baseline operating condition.

Disclosed is a wearable device configured to perform standardised time domain diffuse optical spectroscopy, comprising an illumination system with a light source configured to illuminate a target region of the body, a photodetection system configured to detect scattered light exiting the target region and provide a measurement signal, and a processing circuit for time of flight (ToF) data acquisition. At least a portion of the beam is coupled to the photodetection system via a first reference optical path comprising a tissue mimicking phantom with one or more known optical properties to provide a first reference signal. The processing circuit measures a ToF distribution for photons detected from the target region and determines one or more optical properties of the target region from measured ToF distribution; measures a ToF distribution for photons detected from the phantom and determines one or more calibration factors for use in determining the one or more optical properties of the target region; and determines one or more optical biomarker values based, at least in part, on the one or more optical properties of the target region.

The disclosure provides an optical system, a semiconductor processing system, and a method for processing a semiconductor wafer. In one example, the optical system includes: (1) a light source configured to provide source light to a source plane to form a plurality of first subbeams, (2) optical elements configured to modify each of the plurality of first subbeams to form a plurality of interrogation spots on a wafer according to a predetermined pattern, wherein the optical elements are further configured to modify each of the plurality of first subbeams upon reflection from the wafer to form a plurality of second subbeams upon an image plane, and (3) a spectrometer configured to receive collected light from the plurality of second subbeams.

The invention is suitable for the field of electrochemical luminescence detection equipment, and provides a dispersion device suitable for electrochemical luminescence detection, which comprises a monochromator body, the monochromator body is composed of a monochromator housing, a reflector assembly, a grating assembly, a collimating mirror assembly, a focus lens assembly, a slit, a flange snap ring and a flange; an M-shaped light path is arranged in the monochromator body, and a slit, a reflector assembly, a collimating mirror M1 in the collimating mirror assembly, a customized blazed grating G1 in the grating assembly and a focusing mirror M2 in the focusing mirror assembly are sequentially arranged in the light propagation direction. The customized blazed grating G1 is designed by adopting specific parameters including the scribed line density, the blazed wavelength, the notch groove depth and the groove width ratio, and primary light energy enhancement and secondary light intensity suppression can be realized; according to the invention, an optical filter is not needed, the diffraction efficiency of a monochromator is improved to 60-86%, the intensity ratio of luminol secondary light to primary light is less than or equal to 1.6%, the detection limit of ruthenium bipyridine is reduced from 100pmol / L to 50pmol / L, and the electrochemical luminescence detection device is suitable for various electrochemical luminescence detection scenes.

A spectrometer system is provided for laser-induced plasma spectral analysis having a laser beam source for emitting a laser beam and a focusing optical unit for focusing the laser beam on a sample. A plasma generation region is formed such that a surface of the sample located in the plasma generation region leads to the formation of a laser-induced plasma. The spectrometer system also comprises a detection unit for capturing plasma light. The detection unit comprises a plurality of objectives. Each of the objectives is associated with a detection cone which, in a region of overlap with the laser beam, forms a plasma detection region, such that, when the laser induced plasma is formed in one of the plasma detection regions, a measurement component of the plasma light can be captured by the corresponding objective. The plasma detection regions jointly form a field of vision of the detection unit.

The invention discloses a femtosecond laser sum frequency spectrum detection device based on dispersion and bandwidth compression, which is characterized in that femtosecond infrared laser generated by a laser is split into first split light and second split light, and the first split light is converted into femtosecond mid-infrared light; the second beam splitting light is converted into picosecond green light, the picosecond green light passes through a first diaphragm and then is focused to one point of a y-cut quartz crystal together with wavelength-tunable femtosecond mid-infrared light generated by the frequency doubling / difference frequency module through a stroke adjusting reflection unit, and the y-cut quartz crystal generates an intrinsic sum frequency signal; after passing through the quartz glass sheet, the intrinsic sum frequency signal, picosecond green light and femtosecond mid-infrared light emitted by the y-cut quartz crystal are jointly focused on one point on the surface of a sample to be detected, a sample sum frequency signal is generated, and the intrinsic sum frequency signal and the sample sum frequency signal are collinearly transmitted into a spectrograph. According to the method, a simple and direct spectral bandwidth compression method is adopted, the complexity is remarkably reduced, the spectral bandwidth of green light is compressed, and the sum frequency spectrum is detected.

Compositions, articles, systems, and methods for sensing and / or authentication using luminescence imaging are generally provided. In some embodiments, the article is associated with an emissive material comprising an emissive species. In some embodiments, the emissive species has a radiative lifetime of at least 10 nanoseconds. A characteristic of the article may be determined by acquiring an image comprising time-dependent information related to the emissive species. In certain cases, the radiative lifetime of the emissive species may be determined from the image. Because the radiative lifetime of an emissive species may be modified by numerous factors, including, but not limited to, binding to or proximity to other molecules, temperature, pH, and radiation exposure, the measured length of the radiative lifetime may provide information regarding a characteristic of the associated article. In some cases, the emissive material comprising one or more emissive species may be used to identify and / or authenticate the associated article.

A plasma source chamber (10) for use in a spectrometer comprises an inner housing (11) for accommodating a plasma source (31) and an outer housing (12) accommodating the inner housing. The outer housing (12) comprises at least one outer air inlet opening (21) in a first wall and at least one outer air outlet opening (22) in a second wall. Walls of the inner housing and walls of the outer housing define a spacing (25) so as to allow a first air flow (1) from the at least one outer air inlet opening (21) to the at least one outer air outlet opening (22) through the spacing (25) between the inner housing and the outer housing. The inner housing (11) comprises at least one inner air inlet opening (23) in a first wall and at least one inner air outlet opening (24) in a second wall to allow a second air flow (2) from the at least one inner air inlet opening to the at least one inner air outlet opening through the inner housing. Thus, an improved cooling of the outer surfaces of the plasma source chamber is achieved.

The present application relates to the field of spectral measurement, in particular to a kind of ultraviolet spectrum measurement method, comprising: fluorescence gradual conversion device is converted into visible light by the ultraviolet light to be measured obtained, and is transmitted to image sensing device;Image sensing device converts the visible light into visible light intensity image, and is transmitted to data processing device;According to the visible light intensity image obtained by data processing device, and according to the preset reconstruction algorithm, the spectrum of the ultraviolet light to be measured is calculated.The present application does not need to use the slit, grating and complex collimating focusing light path of existing spectrometer, the present application uses black and white surface array CCD to receive incident light in large area, and converts the ultraviolet light insensitive to CCD into sensitive visible light, greatly improves the intensity and utilization of optical signal, greatly reduces cost, reduces volume, and can very conveniently improve resolution and conversion measurement range.

The invention provides a multi-size sample emissivity measuring system and measuring method based on a co-heating mechanism, the system comprises the co-heating mechanism, a heating chamber is arranged in the co-heating mechanism, a blackbody cavity and a sample cavity are arranged in the heating chamber in parallel, and the internal temperature of the blackbody cavity and the sample cavity is controlled through the same electric heating assembly; the replaceable positioning assembly is arranged in the sample cavity and is used for adapting to the to-be-tested samples with different sizes; a light path of the spectrograph is switchably aligned with an outlet of the blackbody cavity or the sample cavity; and the positioning adjusting mechanism is used for adjusting the relative position of the co-heating mechanism and the spectrograph, so that the optical axes of the blackbody cavity and the sample cavity coincide with the optical axis of the spectrograph. According to the measuring system, the blackbody cavity and the sample cavity can be heated simultaneously through the co-heating system, temperature consistency is guaranteed, the replaceable positioning assembly is adopted to adapt to samples of different sizes, and high-precision spectral emissivity measurement of the samples of multiple sizes is achieved.

Method (100) of optical spectroscopy for analyzing a sample using an optical spectrometer (10), comprising: Obtaining a sample spectrum (101) of the sample using the optical spectrometer; Obtaining a blank spectrum (102) using the optical spectrometer, wherein the blank spectrum includes structured background radiation that correlates with the sample spectrum; Determining a cross-correlation (103) of the sample spectrum and the blank spectrum; Generating a mapped blind spectrum (105) by mapping the blind spectrum onto the sample spectrum based on cross-correlation; and Subtracting the imaged blank spectrum from the sample spectrum to produce a background-corrected sample spectrum (106).

The invention relates to a sample analysis system. The sample analysis system is provided with a lens demisting device. The sample analysis system includes a plasma torch device (200) including a body defining a plasma chamber (202) and a plasma torch (201) supported by the body in the plasma chamber (202). The plasma torch (201) is electrically coupled to a power source and is operable to form a plasma from the sample fluid in the plasma chamber (202) when energized. The sample analysis system also includes a spectrometer (300) configured to analyze the plasma to measure an analyte of interest in the sample fluid by light emitted by the plasma. The spectrometer (300) comprises a collector tube (301) in visual communication with the plasma chamber (202), the collector tube (301) comprising a proximal end and a distal end, the distal end being equipped with a lens (302) configured to collect light emitted by the plasma. The light collecting tube (301) is at least partially inserted into the central passage (616) of the gas hood (610) such that the distal end of the light collecting tube (301) with the lens (302) is at least partially enclosed by the gas hood (610). A distal end (612) of the gas hood (610) includes a gas outlet port (619) and a gas inlet port (618) fluidly coupled with a source of pressurized gas, the gas hood configured to discharge a stream of gas across an exposed surface of the lens (302) to at least minimize fogging of the lens (302).

The invention relates to an easily adjustable optical emission spectrometer (1), and a method (100) for establishing and operating such a spectrometer (1), the spectrometer (1) comprising a plasma holder (2) for establishing a luminescent plasma from a sample material, and an optical system (3) for measuring the spectrum of light (L) emitted by the plasma, the spectrum being characteristic of the sample material, wherein the optical system (3) comprises at least one light entrance aperture (31), at least one diffraction grating (32) for separating the light (L) coming from the plasma (A) and a method (100) for measuring the spectrum of the light (L). One or more detectors (33) of the optical emission spectrometer (1), wherein the plasma support (2) and the optical system (3) are directly and fixedly mounted on a plasma support flange (2B) and an optical system flange (3B) respectively, which are directly and fixedly connected to each other, and wherein the optical emission spectrometer (1) further comprises an analysis unit (34), which is suitable for analyzing the measured spectrum and compensating for a drift of the spectrum relative to the detector (33) that may be caused by heat transferred from the plasma support (2) to the optical system (3) taking into account thermal expansion of the optical system (3).

A circuit, such as that of a CMOS sensor, is described, having individually addressable transfer transistors and individually addressable reset transistors. Through these individually addressable transistors, pixels of the same or different sizes and / or the same or different exposure times within different regions of interest can be efficiently processed. Different regions of interest can be exposed simultaneously and read out independently.

A device for analyzing the material composition of a sample via plasma spectrum analysis includes a laser assembly configured to emit a beam for plasma spectrum analysis and an optical assembly configured to direct the beam towards a target for plasma spectrum analysis of the target. The optical assembly is configured to collect a plasma emitted light emitted from a plasma and provide the plasma emitted light to a dispersion module. The dispersion module includes a first and second diffraction gratings. The first diffraction grating and second diffraction grating are positioned within the dispersion module such that light received from the optical assembly contacts the first diffraction grating at least two times before being directed out of the dispersion module.

A method of analyzing spectral peaks obtained by an optical spectrometer is provided. The method includes imaging a spectral peak using an optics assembly and a detector of the optical spectrometer to generate a detected image of the spectral peak. An image correction function is applied to the detected image of the spectral peak to obtain a corrected image of the spectral peak, wherein the image correction function increases the spectral power density of the spectral peak in the corrected image of the spectral peak. Information representing the spectral peak is extracted from the corrected image of the spectral peak.

A method for allowing reproducible, precise, and substantially temperature independent quantitative measurements of one or more high vapor pressure elements in a liquid metal or alloy sample using Laser Induced Breakdown Spectroscopy (LIBS). The method introduces one or more selectively reactive species and a substantially inert carrier gas to modify the local environment at and around the LIBS sampling point of the liquid metal or alloy. This results in a significant and immediate reduction of the vapor effects on LIBS signals of high vapor pressure species in metal or alloy melts, partially eliminating the temperature-dependence of the high vapor pressure elements and their dependence on spurious environmental factors, reducing the associated uncertainty in the LIBS measurements.

A light source device (100) according to the present disclosure comprises an optical input system (120) containing a first optical element (OP1) configured to irradiate a target material (112) with excitation light (LR), an optical output system (130) containing a second optical element (OP2) configured to extract light (LO) generated by irradiating the target material (112) with the excitation light (LR), a target holding unit (110) configured to hold the target material (112), a detection unit (140) configured to detect a surface position of the target material (112), a drive unit (150) configured to effect a change in the position of a focusing point of at least one of the first optical element (OP1) and the second optical element (OP2), and a control unit (160) configured toto drive the drive unit (150) based on the surface position.

A dedicated link assembly for a laser-induced breakdown spectroscopy ("LIBS") system, as well as a laser-induced breakdown spectroscopy system and a method of operating the same, is provided. The link assembly may facilitate attachment of a laser housing of an LIBS system to an existing sample supply chamber, such as a volume or weight feeder. Generally, the link assembly may include a dedicated purge head and an inert gas assembly that facilitate attachment of the laser housing and may enhance functionality of the LIBS system.

A method for predicting quality of a workpiece includes: obtaining optical emission spectroscopy (OES) raw data of the workpiece, the OES raw data having a time dimension and a wavelength dimension; selecting, in the wavelength dimension, a first portion of the OES raw data that falls within wavelength ranges selected based on a material used in a process of producing the workpiece; selecting, in the time dimension, a second port of the OES raw data that falls within a time range corresponding to a specific step of the process, where the specific step is to be analyzed; generating tokens by grouping the selected portions of the OES raw data; and training a model with the tokens.