112results about "Emission spectroscopy" patented technology

Disclosed herein are scientific instrument support systems, related methods, computing devices and computer-readable media. A method of mitigating distortion of an optical emission spectrum obtained from an optical emission spectrometer is provided. The method may comprise a step of obtaining a spectrum recorded with the spectrometer and a respective one or more condition parameters indicative of an operating condition at a time of recording the spectrum. The method may further comprise a step of providing a model configured to output, in response to the one or more condition parameters, one or more transform parameters of a transformation to be applied to the obtained spectrum. A transformation may be applied in accordance with the obtained one or more transform parameters to the obtained spectrum to mitigate distortion of the spectrum due to a discrepancy between the operating condition and a baseline operating condition.

Compositions, articles, systems, and methods for sensing and / or authentication using luminescence imaging are generally provided. In some embodiments, the article is associated with an emissive material comprising an emissive species. In some embodiments, the emissive species has a radiative lifetime of at least 10 nanoseconds. A characteristic of the article may be determined by acquiring an image comprising time-dependent information related to the emissive species. In certain cases, the radiative lifetime of the emissive species may be determined from the image. Because the radiative lifetime of an emissive species may be modified by numerous factors, including, but not limited to, binding to or proximity to other molecules, temperature, pH, and radiation exposure, the measured length of the radiative lifetime may provide information regarding a characteristic of the associated article. In some cases, the emissive material comprising one or more emissive species may be used to identify and / or authenticate the associated article.

Method (100) of optical spectroscopy for analyzing a sample using an optical spectrometer (10), comprising: Obtaining a sample spectrum (101) of the sample using the optical spectrometer; Obtaining a blank spectrum (102) using the optical spectrometer, wherein the blank spectrum includes structured background radiation that correlates with the sample spectrum; Determining a cross-correlation (103) of the sample spectrum and the blank spectrum; Generating a mapped blind spectrum (105) by mapping the blind spectrum onto the sample spectrum based on cross-correlation; and Subtracting the imaged blank spectrum from the sample spectrum to produce a background-corrected sample spectrum (106).

The invention relates to a sample analysis system. The sample analysis system is provided with a lens demisting device. The sample analysis system includes a plasma torch device (200) including a body defining a plasma chamber (202) and a plasma torch (201) supported by the body in the plasma chamber (202). The plasma torch (201) is electrically coupled to a power source and is operable to form a plasma from the sample fluid in the plasma chamber (202) when energized. The sample analysis system also includes a spectrometer (300) configured to analyze the plasma to measure an analyte of interest in the sample fluid by light emitted by the plasma. The spectrometer (300) comprises a collector tube (301) in visual communication with the plasma chamber (202), the collector tube (301) comprising a proximal end and a distal end, the distal end being equipped with a lens (302) configured to collect light emitted by the plasma. The light collecting tube (301) is at least partially inserted into the central passage (616) of the gas hood (610) such that the distal end of the light collecting tube (301) with the lens (302) is at least partially enclosed by the gas hood (610). A distal end (612) of the gas hood (610) includes a gas outlet port (619) and a gas inlet port (618) fluidly coupled with a source of pressurized gas, the gas hood configured to discharge a stream of gas across an exposed surface of the lens (302) to at least minimize fogging of the lens (302).

A circuit, such as that of a CMOS sensor, is described, having individually addressable transfer transistors and individually addressable reset transistors. Through these individually addressable transistors, pixels of the same or different sizes and / or the same or different exposure times within different regions of interest can be efficiently processed. Different regions of interest can be exposed simultaneously and read out independently.

A device for analyzing the material composition of a sample via plasma spectrum analysis includes a laser assembly configured to emit a beam for plasma spectrum analysis and an optical assembly configured to direct the beam towards a target for plasma spectrum analysis of the target. The optical assembly is configured to collect a plasma emitted light emitted from a plasma and provide the plasma emitted light to a dispersion module. The dispersion module includes a first and second diffraction gratings. The first diffraction grating and second diffraction grating are positioned within the dispersion module such that light received from the optical assembly contacts the first diffraction grating at least two times before being directed out of the dispersion module.

A method for allowing reproducible, precise, and substantially temperature independent quantitative measurements of one or more high vapor pressure elements in a liquid metal or alloy sample using Laser Induced Breakdown Spectroscopy (LIBS). The method introduces one or more selectively reactive species and a substantially inert carrier gas to modify the local environment at and around the LIBS sampling point of the liquid metal or alloy. This results in a significant and immediate reduction of the vapor effects on LIBS signals of high vapor pressure species in metal or alloy melts, partially eliminating the temperature-dependence of the high vapor pressure elements and their dependence on spurious environmental factors, reducing the associated uncertainty in the LIBS measurements.

A spectroscopic device includes: an analysis optical system; a length measurement optical system; and a calculation device. The analysis optical system includes a moving mirror and a first light receiving element. The length measurement optical system includes a second light source configured to emit laser light, a gas cell with a gas that absorbs light of a predetermined wavelength sealed therein and configured to cause the laser light to be incident thereon, an emitted light amount detection unit configured to detect an amount of light emitted from the gas cell and output an emitted light amount detection signal, a light source control unit configured to control a wavelength of the laser light based on the emitted light amount detection signal, and a length measurement unit configured to use the laser light to obtain a displacement signal corresponding to a position of the moving mirror, and the calculation device includes a moving mirror position calculation unit, a light intensity calculation unit, and a Fourier transform unit configured to generate a spectral pattern.

Microscopic imaging devices, systems and methods are provided. A microscopic imaging device includes a lens assembly, a first light source assembly, and one or more detection assemblies. The lens assembly has relatively short working distance, a relatively light weight, and / or multiple optical elements. The first light source assembly is configured to illuminate and / or excite a sample disposed at the working distance of the lens assembly. The one or more detection assemblies are configured to detect the light from the sample. The lens assembly, the first light source assembly, and at least one detection assembly are positioned to form an epiconfiguration.

Calibration device for calibrating the sensitivity of an optical sensor arrangement, wherein the calibration device comprisesa reflecting element with a reflecting region, said reflecting region comprising a multiplicity of reflecting faces varying in their orientation,a light source able to provide light and arranged such that said divergent light from the light source is able to illuminate said reflecting region,the optical sensor arrangement to be calibrated, wherein the optical sensor arrangement has an entrance opening for receiving incoming light and has at least a sensor for detecting light received through the entrance opening, and wherein said entrance opening is oriented towards said reflecting region, anda light tight casing preventing light of origin outside the calibration device from entering said entrance opening. The invention is further directed to a method.

To provide a spectroscopic analyzer capable of improving light utilization efficiency (S / N) of a light source with a relatively simple configuration.SOLUTION: A light source that emits light, a collection-optical-system unit that collects the light from the light source, a first slit that extracts light of a predetermined region from the light collected by the collection-optical-system unit, an excitation-side diffraction element that disperses the light from the collection-optical-system unit, a second slit that extracts monochromatic light of a predetermined wavelength from the light dispersed by the excitation-side diffraction element, and a detector that detects light from a sample irradiated with the monochromatic light, the collection-optical-system unit is disposed between the light source and the excitation-side diffraction element, and includes a mirror having a reflection surface of a non-axisymmetric free-form surface shape.SELECTED DRAWING: Figure 3C

The invention relates to a method for mapping and analysing at least one element of interest included in a sample (150) by means of laser-produced plasma optical emission spectrometry (160), the method comprising: - a step of producing a plasma (160) by focusing a laser beam (120) onto a surface of the sample (150); - a step of collecting an optical emission from the plasma (160) that defines an intensity signal; - a step of processing and analysing the optical emission; and - characterised in that, during the processing and analysing step, the intensity signal is studied over its entire duration in order to identify a maximum intensity value.

The application relates to a ratio type radiation sensing device with nonlinear response to dose rate and a use method thereof, and relates to a scintillator radiation measuring device with nonlinear change of luminous intensity and use method, and aims to solve the technical problems of low measuring precision, complex structure, poor reliability, poor real-time performance and poor applicability of existing radiation sensors. The ratio type radiation sensing device with nonlinear response to dose rate comprises an X-ray excitation module, a mixed sensing probe and a light signal collection module; wherein the mixed sensing probe is a round piece pressed by uniformly mixing NaLuF4:3Pr,5Er nanocrystals and NaLuF4:3Ce nanocrystals. The use method of the device is a standard curve method. The device can realize accurate detection in a wide range of 1.86-14.95 mGy / s, and can be used in the fields of environmental monitoring, biomedical imaging and public security inspection.

The present invention relates to a method of determining the elemental inhomogeneity of a continuously cast metal by laser-induced breakdown spectroscopy.

This invention discloses a method for measuring one-dimensional transient imaging spectra. Utilizing a high-precision optical plane mirror, a high-precision optical concave coated mirror, a multi-channel oscilloscope, a spectrometer, an ICCD camera, electronic sensors, and a multi-channel digital delay pulse generator, the one-dimensionally distributed light signal is collimated, spatially redirected, and compressed to a specific ratio before being transmitted to a spatial array of detectors. This ensures a one-to-one correspondence between the spatial distribution of the measured light signal and the spatial distribution of the detectors, allowing transient radiation spectral information of different spatial locations of the light source to be obtained through a single detection. This invention is highly practical and functional, and can be widely applied in the field of spectral measurement technology.

Scientific instrument support systems and related methods, computing devices, and computer readable media are disclosed herein. For example, in some embodiments, a computer-implemented method of acquiring a digital image of a spectrum from a time series of image frames of the spectrum imaged onto an image sensor by an optical system of a spectrometer is provided. The method comprises: acquiring a time sequence of image frames of a corresponding spectrum recorded when an imaging spectrum moves relative to an image sensor; transforming the image frame to align the recorded spectrum; and combining the transformed image frames to generate a digital image. In some embodiments, the method may further include upsampling each image frame to generate a corresponding upsampled image frame, and transforming the upsampled image frame to align the recorded spectrum. Upsampling each image frame may include generating an array of interpolated pixels by interpolating the array of pixels, thereby calculating additional pixels between the sensor pixels.

The disclosure provides multimode configurable spectrometers, a method of operating a multimode configurable spectrometer, and an optical monitoring system. In one embodiment the multimode configurable spectrometer includes: (1) an optical sensor configured to receive an optical input and convert the optical input to electrical signals, wherein the optical sensor includes multiple active pixel regions for converting the optical input to the electrical signals, (2) conversion circuitry, having multiple selectable converting circuits, that is configured to receive and convert the electrical signals to a digital output according to a selected one of the selectable converting circuits, and (3) a sensor controller configured to set a synchronized operating mode to direct operation of the optical sensor and select, based on the synchronized operating mode, at least one of the selectable converting circuits to provide the digital output.

The disclosure provides an optical signal detection system with improved spectral resolution and signal-to-noise that can be used for improved monitoring of semiconductor processes. The improved spectral resolution may be associated with improved spectral discrimination where narrow portions of spectral bandwidth are individually monitored. In one example, an optical signal detection system is provided that includes: (1) an optical interface configured to receive an optical signal, (2) a narrow bandpass filter configured to transmit a portion of the received optical signal, (3) an optical etalon in series with the narrow bandpass filter, configured to further filter the received optical signal, wherein the combination of a passband of the bandpass filter and a passband of the optical etalon is configured to provide an optical bandwidth of less than 1.0 nm for the optical signal, and (4) a multipixel optical sensor configured to essentially simultaneously collect the filtered optical signal.

To provide a spectroscopic device and a sample analysis system that continuously change a wavelength of excitation light while irradiating a sample with the excitation light.SOLUTION: A sample analysis system includes: a spectroscopic device 30 including a light source 32, a scattering part 36 for excitation which scatters the light from the light source 32, a passage part 38 for excitation through which the excitation light scattered by the scattering part 36 for excitation passes; a scan part 40 which reflects the excitation light and irradiates a sample 90 applied with a reagent with the reflected light to generate fluorescence light; a scattering part 48 for fluorescence light which scatters the fluorescence light; a passage part 50 for fluorescence light through which fluorescent light for analysis scattered by the scattering part 48 for fluorescence light passes; a light reception element 52 which outputs a signal depending on intensity of the fluorescent light for analysis; and a change part for excitation which changes a wavelength of the excitation light reflected by the scan part 40 by changing the excitation light that passes through the passage part 38 for excitation by driving the scattering part 36 for excitation; and an analysis unit which identifies a type of sample on the basis of the intensity of the fluorescent light for analysis.SELECTED DRAWING: Figure 2

The invention relates to an online adjustment method and system for a spectrometer grating and a spectrometer. The on-line adjusting method comprises the following steps: pre-installing a grating in a spectrograph, and connecting the grating with a driving mechanism; acquiring a first theoretical pixel position and a second theoretical pixel position respectively corresponding to the first optical signal and the second optical signal with different wavelengths; the first optical signal is controlled to be incident to the grating, first calibration is carried out, and the fixed position of the grating is determined; controlling the driving mechanism to drive the grating to be positioned at a fixed position of the grating, performing secondary calibration, namely controlling a second optical signal to be incident to the grating, identifying a second real-time pixel position corresponding to an intensity peak value of the second optical signal by the control system, and judging whether the second real-time pixel position meets a preset requirement or not; if yes, fixing operation of the grating is executed; and if the judgment is not satisfied, executing the replacement operation of the grating. The position of the grating can be automatically adjusted, and the consistency of spectrograph production is improved.

The present invention provides a device for obtaining data from a sample. This device comprises an external equipment with a laser source, a Raman spectrometer and an external LIBS spectrometer and a handheld probe. An excitation barrel (1) is configured to produce a collimated laser beam, the first folding mirror (2) is arranged to reflect the collimated laser beam and the first dichroic (3) is configured to project the reflected collimated laser beam into a first direction. A LIBS excitation source (6) is configured to produce a pulsed laser beam, a focusable beam expander (7) is configured to produce an expanded laser beam with a modified divergence, so that it focalizes on the same reference plane as the reflected collimated laser beam, the second folding mirror (8) is arranged to reflect the expanded laser beam and the second dichroic (9) is configured to project the reflected expanded laser beam into the first direction. A focuser (4) is arranged in the first direction and is arranged to receive the reflected collimated laser light and the reflected expanded laser beam and focus them on a focusing point contained in the reference plane. The device further comprises a Raman collection barrel (5) and a LIBS collection barrel (10). Finally, an optical component (12) is configured to reflect part of the sample light coming from the focuser (4), a diaphragm (13) is configured to receive the light reflected by the optical component (12) and a camera system is configured to receive the light which passes through the diaphragm (13).

An emission stand (201) for an optical emission spectrometer, comprising a discharge box (210) and at least one auxiliary gas conduit (209a, 209b) for supplying an auxiliary gas flow into the discharge box (210), the at least one auxiliary gas conduit (209a, 209b) being configured to supply an auxiliary gas flow (214) into the discharge box (210) for a period of time after a spark action, but not during a spark action during which an analysis of a sample is performed. The auxiliary gas flow (214) into the discharge box (210) improves dust flushing from the discharge box (210) after the spark action.

A method of optical spectroscopy for analysing a sample using an optical spectrometer is provided. The method comprises obtaining a sample spectrum of the sample using the optical spectrometer and obtaining a blank spectrum using the optical spectrometer. The blank spectrum comprises structured background radiation which is correlated with the sample spectrum. A cross-correlation of the sample spectrum and the blank spectrum is determined. A mapped blank spectrum is generated by mapping the blank spectrum to the sample spectrum based on the cross-correlation, and the mapped blank spectrum is subtracted from the sample spectrum to generate a background corrected sample spectrum.

An optical emission spectrometer is provided. The optical emission spectrometer includes a plasma source, an optical assembly, a reference light source, and a first mirror. The plasma source is arranged to emit light. The optical assembly includes a plurality of optical components arranged to direct light traveling in a first direction from the plasma source along a first optical path to an entrance slit of the optical emission spectrometer. The reference light source is used for calibrating the spectrometer, wherein the reference light source is arranged to output reference light along a reference light path. The first reflector is arranged to selectively switch the reference light to the first light path, thereby guiding the reference light to the entrance slit for calibrating the optical emission spectrometer.

A method allows for reproducible, precise and substantially temperature-independent quantitative measurement of one or more high vapor pressure elements in a liquid metal or alloy sample using laser-induced breakdown spectroscopy (LIBS) or other similar methods. The method introduces one or more selectively reactive substances and a substantially inert carrier gas to alter the local environment at and around the sampling point of the liquid metal or alloy. This results in a significant and rapid reduction in the vapor effect of the LIBS signal on the high vapor pressure species in the metal or alloy melt, partially eliminating the temperature dependency of the high vapor pressure elements and their dependency on false environmental factors, thereby reducing the associated uncertainty in LIBS measurements.

Apparatus and methods for monitoring emissions from a borehole to determine the composition of earthen material removed from the borehole are described. Monitoring can be done in real time as the borehole is being deepened with a millimeter-wave drilling beam.

A device for determining the chemical composition of a liquid metallurgical product emitting electromagnetic radiations. The device comprising a collection probe configured to acquire the electromagnetic radiations emitted by the metallurgical product in a predetermined wavelength range Δλ, spectroscopic means connected to the collection probe and configured to generate a spectral signal of the acquired electromagnetic radiations and processing means including a database of reference radiances. The invention is also related to a method using said device.

Provided are methods, apparatus and systems for stabilisation of a glow discharge from a plasma. Also provided are methods, apparatus and systems for processing optical signals from a stabilised glow plasma with enhanced signal to noise recovery. A first method comprises: generating an electric field within a plasma cell using an alternating excitation voltage to excite particles within the cell, to produce a glow discharge from a plasma in the plasma cell in a resonant condition; monitoring, in each excitation cycle of the alternating excitation voltage, one or more signals that correlate with glow discharge optical emissions from the plasma in the plasma cell; and, in response to said monitoring, controlling one or more operating conditions for the plasma cell to maintain the glow discharge emissions from the plasma within a desired operating range in each excitation cycle of the alternating excitation voltage. A relatively stable glow discharge optical emission is maintained via dynamic resonant feedback control of operating conditions such as the electric field that is used to excite particles within the plasma cell. The stabilisation of the glow plasma can be used in glow discharge optical emission spectroscopy (GD-OES) for gas analysis and in other applications.