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3119 results about "Spectrograph" patented technology

An optical spectrometer (spectrophotometer, spectrograph or spectroscope) is an instrument used to measure properties of light over a specific portion of the electromagnetic spectrum, typically used in spectroscopic analysis to identify materials. The variable measured is most often the light's intensity but could also, for instance, be the polarization state. The independent variable is usually the wavelength of the light or a unit directly proportional to the photon energy, such as reciprocal centimeters or electron volts, which has a reciprocal relationship to wavelength.

LED optical parameter comprehensive testing device

The invention discloses an LED optical parameter comprehensive testing device, belonging to the technical field of optical parameter measurement. The LED optical parameter comprehensive testing device is technically characterized in that one end of a horizontal base provided with a one-dimensional mobile platform is fixedly provided with an arc-shaped clamp provided with a fiber-optic probe and astandard luminosity probe, the other end of the horizontal base is fixedly provided with an arc-shaped light collector consisting of an arc fiber-optic array and a linear array CCD (Charge Coupled Device), and a rotary clamping table for holding an LED to be tested is arranged on the one-dimensional mobile platform; light information acquired by the fiber-optic probe is converted into a spectrum band by a spectrograph and then is sent into a computer, outputs of the standard luminosity probe and the linear array CCD are sent to the computer through the data acquisition unit, the computer performs corresponding processing and operation on measurement data through measurement software to finally obtain the luminescence characteristics of the LED to be tested. According to the invention, theproblem on comprehensively measuring the LED on a single measurement instrument is solved; and the LED optical parameter comprehensive testing device has the characteristics of simplicity for operation, compact structure, fastness for measurement, easiness for realization and the like.
Owner:CHINA NORTH IND NO 205 RES INST

Transmission type Mueller matrix spectrum ellipsometer and measuring method thereof

The invention discloses a transmission type Mueller matrix spectrum ellipsometer and a measuring method thereof. The transmission type Mueller matrix spectrum ellipsometer measuring method comprises the following steps: projecting modulation rays produced by a partial arm on the surface of a to-be-tested sample, a check partial arm demodulates and receives the rays reflected (or transmitted) by the to-be-tested sample, by proceeding harmonic wave analysis to a tested spectrum, computing and acquiring the full Mueller matrix information of the to-be-tested sample, further through arithmetic of nonlinear regression, liberty matching, and the like, and fitting and extracting information of an optical constant, characteristic, morphology, size and the like of the to-be-tested sample. An ellipsometer comprises the partial arm (comprises light source, a lens group, a polarizer, and a compensator driven by a servo motor),the to-be-tested sample and the check partial arm (comprises the compensator driven by a servo motor, an analyzer the lens group and a spectrograph. The transmission type Mueller matrix spectrum ellipsometer and the measuring method thereof can achieve all kinds of materials and components with information phoelectron functions, and online measurement of all kinds of nano-structures in nano-fabrication, so that transmission type Mueller matrix spectrum ellipsometer and the measuring method thereof have the advantages of being capable of possessing non-destructive property, fast, and low in cost.
Owner:WUHAN EOPTICS TECH CO LTD

Device for testing life of semiconductor laser

The invention discloses a device for testing life of a semiconductor laser, comprising an optical platform, wherein the optical platform is provided with parallel guide rails and a laser water cooling array; the parallel guide rails are provided with electric translation tables; an integrating sphere and a PD (Power Detector) are fixed on the electric translation tables; the integrating sphere isconnected with a spectrograph through an optical fiber; the spectrograph is connected to an industrial personal computer; the PD is connected with the industrial personal computer through a collecting card; a temperature collecting module is arranged at the side of the laser water cooling array and connected with the industrial personal computer; the electric translation tables are connected witha translation table controller through controlling a cable; and the translation table controller is connected to the industrial personal computer. By the system, automatic parameter tests can be carried out on laser products with different packaging types, powers and numbers. The power and the spectral information of the laser products are automatically collected and recorded in the processing ofworking, the report printing data can be automatically carried out to form a test report, and therefore, the basis for failure analysis and research of the laser products is provided.
Owner:FOCUSLIGHT TECH

Multifunctional environment-friendly electronic machine intelligent recycling recognition system

The invention relates to a multifunctional environment-friendly electronic machine intelligent recycling recognition system. The multifunctional environment-friendly electronic machine intelligent recycling recognition system comprises a recycling cabinet body, wherein the recycling cabinet body comprises a detection room and two element boxes. The detection room is provided with a cabinet door, and the bottom of the detection room is provided with a containing door. The internal room wall of the detection room and the inner side of the cabinet door are provided with a plurality of webcams. A spectrograph signal projector (namely light source) is arranged inside the detection room, and a spectrograph signal receiver is arranged on the top of the detection room or one face, opposite to the spectrograph signal projector (namely light source), of the detection room. The top of the detection room is provided with an expansion link, and the tail end of the expansion link is provided with a holding device. The multifunctional environment-friendly electronic machine intelligent recycling recognition system has the advantages of being low in cost, high in recognition rate, high in response speed, low in energy consumption, high in anti-interference and weather ability and high in automaticity, can be placed in public places such as a community, a school and a market, can conveniently and rapidly recognize daily-use plastic products such as plastic bags, beverage bottle and daily use chemical product packages, and fully stimulates environmental protection positivity of people by means of conducting credit accumulating to recycled articles.
Owner:李敏

Automatic vehicle-mounted soil nutrient detection and sampling device based on near infrared spectrum technology

The invention provides an automatic vehicle-mounted soil nutrient detection and sampling device based on a near infrared spectrum technology. The automatic vehicle-mounted soil nutrient detection and sampling device comprises a movable platform, a control box, a soil collecting device, a soil storage device, a soil breaking device, an optical system, a GPS, a spectrograph, an industrial personal computer and a controller, wherein the movable platform is provided with traveling wheels, the control box is arranged on the movable platform, the soil collecting device and the soil storage device are arranged on the movable platform, the soil breaking device and the optical system are arranged on the bottom of the movable platform, the GPS is arranged on the top of the control box, and the spectrograph, the industrial personal computer and the controller are arranged in the control box. The automatic vehicle-mounted soil nutrient detection and sampling device is simple to operate; a plurality of processes such as spectrum collection, recording, clustering analysis, and collection of representative soil samples are controllable and continuous, the entire test process is environmentally-friendly and free of pollution, the test system is not damaged, and the continuous monitoring on a large-sized field can be realized; not only can the detection cost be reduced, but also the prediction precision of a model can be improved.
Owner:HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI

Spectrum polarization detection device and method for synchronous polarization modulation interference imaging

The invention discloses a spectrum polarization detection device and a method for synchronous polarization modulation interference imaging. The spectrum polarization detection device comprises a preposed polarization imaging system, an image plane interference imaging spectrometer and a signal processing system which are arranged on the same optical axis in sequence. Incident light forms four groups of light beams with different polarization state information through a polarization element and the light beams are separated on a space of a back focal plane of a microlens array. The separated light beams shoot into a lateral cutting beam splitter after passing through a collimator objective lens and are divided into two crosswise, and optical path difference information is brought in. Two branches of emergent light passes through a postpositional imaging objective lens, a target image with interference information and polarization state information is obtained on a target face of a detector, and the target image is transformed into an electrical signal and enters a signal processing system. Fourier transform is carried out, and light intensity information, spectral information and complete Stokes polarization information of a two-dimensional space of each target point are obtained. The spectrum polarization detection device for synchronous polarization modulation interference imaging has the advantages of being high spectral resolution, high in signal to noise ratio and simultaneous in complete Stokes polarization information and can be used for spectrum detection of a narrow band or a wide band.
Owner:NANJING UNIV OF SCI & TECH

Low-voltage powerline carrier communication experiment method and its experiment system

The invention relates to a low-voltage electric wire carrier communication test method and a testing system thereof. The testing method comprises the following testing methods: I, a carrier transmitting PWL online testing method; II, a carrier receiving sensitivity online testing method; III, a carrier communication anti-interference online testing method; IV, a low-voltage circuit impedance change online testing method. The testing system comprises a carrier transmitting device, a program control attenuating device, a tested carrier receiving device, a manual power network, a frequency spectrograph receiver, a computer, a frequency spectrograph, a noise simulator, an impedance simulator and a purifying power. The invention has the advantages of adopting a manual power network parameter model regulated in GB/T 6113 F2, thus having a high standardization degree and comparable testing data; avoiding the testing problems brought by adopting different carrier communication schemes; realizing the online sensitivity testing; carrying out the test at any time and being not affected by the external environment factors like the weather; besides, the invention can simulate the impedance change environment of a real circuit, thus leading the analyzing of the carrier communication on the impedance change of the circuit to be feasible.
Owner:NANJING XINLIAN ELECTRONICS

Miniature spectrograph with diffraction hole array structure and high resolution spectrum reconstruction method thereof

InactiveCN102564586AStrong anti-vibration interference abilityImprove performanceRadiation pyrometrySpectrum investigationOptical spectrometerSpectrograph
The invention provides a miniature spectrometer with a diffraction hole array structure and a high resolution spectrum reconstruction method thereof. The diffraction hole array structure miniature spectrometer basically comprises a miniature diffraction hole two-dimensional array, a base, a detecting array chip, a glare shield, and light transmitting holes, wherein the miniature diffraction hole two-dimensional array is constructed on a light blocking layer on the base surface and different in hole size. The base is made of transparent materials. The detecting array chip which corresponds to the base is arranged below the base, and one diffraction hole corresponds to one pixel member of the detecting array chip. The glare shield is arranged between the base and the detecting array chip and covers most area of each charge coupled device (CCD) pixel member. A series of light transmitting holes with the same hole size are arranged on the glare shield, each diffraction hole directly aligns to each light transmitting hole, and each CCD pixel member is below each diffraction hole. Due to the fact that diffraction phenomena occurs after incident light passes through the diffraction holesabove the base, the corresponding CCD pixel members below the diffraction holes can detect a certain diffraction light power. The hole size of each diffraction hole on the array is different, the diffraction light power detected by the corresponding CCD pixel members below is also different, and the spectral information of the incident light can be obtained only by inverting the data detected by each CCD pixel member.
Owner:NANJING FANGYUAN GLOBAL DISPLAY TECH

Calibration of a radiometric optical monitoring system used for fault detection and process monitoring

The present invention is directed to a system and method for radiometric calibration of spectroscopy equipment utilized in fault detection and process monitoring. Initially, a reference spectrograph is calibrated to a local primary standard (a calibrated light source with known spectral intensities and traceable to a reference standard). Other spectrographs are then calibrated from the reference spectrograph rather than the local primary calibration standard. This is accomplished by viewing a light source with both the reference spectrograph and the spectrograph to be calibrated. The output from the spectrograph to be calibrated is compared to the output of the reference spectrograph and then adjusted to match that output. The present calibration process can be performed in two stages, the first with the spectrographs calibrated to the reference spectrograph and then are fine tuned to a narrow band light source at the plasma chamber. Alternatively, the reference spectrograph can be calibrated to the local primary standard while optically coupled to the plasma chamber. There, the local primary standard calibration light source is temporarily positioned within the plasma chamber, or in a light chamber disposed along the interior of the chamber for calibrating the reference spectrograph. Other spectrographs can be calibrated to the reference spectrograph while coupled to the plasma chamber with the local primary standard calibration light source, thereby calibrating every component in the entire optical path to the reference spectrograph.
Owner:VERITY INSTR
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