The invention discloses a middle/high-temperature infrared emissivity testing device. The middle/high-temperature infrared emissivity testing device comprises an infrared reflectivity testing system, a sample heating control system and a microcomputer data processing system. The infrared reflectivity testing system comprises an infrared source, an interferometer, an intermediate infrared integrating sphere, an infrared detector, an A/D convertor and a liquid nitrogen cooling device. The sample heating control system comprises a sample heating table, a communication convertor, a temperature controller, a silicon-controlled voltage regulator, a sample heater and an indicator light, wherein the communication convertor, the temperature controller, the silicon-controlled voltage regulator, the sample heater and the indicator light are orderly connected. The temperature controller is connected to a precision thermocouple. The microcomputer data processing system is used for inputting preset parameters and acquiring and treating data. The middle/high-temperature infrared emissivity testing device is simple, can be used conveniently, can realize fast and accurate measurement of infrared emissivity of a material in a middle/high-temperature range of 20 to 600 DEG C, and can be used for the field of key development of middle/high-temperature solar photo-thermal coatings.