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1241 results about "Integrating sphere" patented technology

An integrating sphere (also known as an Ulbricht sphere) is an optical component consisting of a hollow spherical cavity with its interior covered with a diffuse white reflective coating, with small holes for entrance and exit ports. Its relevant property is a uniform scattering or diffusing effect. Light rays incident on any point on the inner surface are, by multiple scattering reflections, distributed equally to all other points. The effects of the original direction of light are minimized. An integrating sphere may be thought of as a diffuser which preserves power but destroys spatial information. It is typically used with some light source and a detector for optical power measurement. A similar device is the focusing or Coblentz sphere, which differs in that it has a mirror-like (specular) inner surface rather than a diffuse inner surface.

Image pickup device-equipped rear-view mirror

The present invention is intended to provide an image pickup device-equipped rear view mirror with improved image pickup performance, glare prevention and appearance (design) in addition to improved performance as a vehicle mirror. A mirror element is formed by forming a reflecting film consisting of high refractive index material films and a low refractive index material film on a back surface of a transparent glass substrate. The integrating sphere reflectance of the mirror element in the visible range is 40% to 60% and the near-infrared transmittance is no less than 70% for the whole or part of the band belonging to the near-infrared range within the entire sensitive wavelength range of the near-infrared camera. A black mask member is attached to an entire back surface of the reflecting film. The near-infrared camera is arranged behind the black mask member. The region corresponding to the area for the image-pickup by the near-infrared camera within the entire region of the black mask member is formed of a visible-light absorption and near-infrared transmission filter. The near-infrared transmittance of the visible-light absorption and near-infrared transmission filter is no less than 70% for the whole or part of the band belonging to the near-infrared range within the entire sensitive wavelength range of the near-infrared camera.
Owner:MURAKAMI CORP

Image pickup device-equipped rear-view mirror

The present invention is intended to provide an image pickup device-equipped rear view mirror with improved image pickup performance, glare prevention and appearance (design) in addition to improved performance as a vehicle mirror. A mirror element is formed by forming a reflecting film consisting of high refractive index material films and a low refractive index material film on a back surface of a transparent glass substrate. The integrating sphere reflectance of the mirror element in the visible range is 40% to 60% and the near-infrared transmittance is no less than 70% for the whole or part of the band belonging to the near-infrared range within the entire sensitive wavelength range of the near-infrared camera. A black mask member is attached to an entire back surface of the reflecting film. The near-infrared camera is arranged behind the black mask member. The region corresponding to the area for the image-pickup by the near-infrared camera within the entire region of the black mask member is formed of a visible-light absorption and near-infrared transmission filter. The near-infrared transmittance of the visible-light absorption and near-infrared transmission filter is no less than 70% for the whole or part of the band belonging to the near-infrared range within the entire sensitive wavelength range of the near-infrared camera.
Owner:MURAKAMI CORP

Apparatus and method for color measurement and color grading of diamonds, gemstones and the like

The present invention discloses an apparatus and method for color measurement and color grading of faceted gemstones, diamonds and the like. The apparatus comprises a spectrometer, a computer, and a dual integrating sphere measurement arrangement comprising a measurement integrating sphere, a sample integrating sphere, a sample platform, a filter, a lens system, a baffle and a light source. The measurement geometry of the dual integrating sphere measurement arrangement is diffuse illumination and 8 degree viewing with the specular component excluded, plus diffuse white background provided by the sample integrating sphere. The sample integrating sphere encloses a sample to provide a constant environment for simulating the visual color grading environment. A novel three-step calibration insures an accurate spectral measurement of the sample inside the measurement integrating sphere. The computer controls the spectrometer and provides measurement parameters calculated from the physical parameters of the measured sample, including, but not limited to, shape, dimensions, refractive index, intensity of fluorescence and cut grade. The computer then calculates the spectral reflectance and calorimetric data, and determines an average color grade by checking a look-up-table that represents the relationship between the CIELAB coordinate and the average color grade. The computer also determines a true color grade based upon the average color grade and the physical parameters, using mathematical analyses and algorithms.
Owner:LIU YAN

Device for testing life of semiconductor laser

The invention discloses a device for testing life of a semiconductor laser, comprising an optical platform, wherein the optical platform is provided with parallel guide rails and a laser water cooling array; the parallel guide rails are provided with electric translation tables; an integrating sphere and a PD (Power Detector) are fixed on the electric translation tables; the integrating sphere isconnected with a spectrograph through an optical fiber; the spectrograph is connected to an industrial personal computer; the PD is connected with the industrial personal computer through a collecting card; a temperature collecting module is arranged at the side of the laser water cooling array and connected with the industrial personal computer; the electric translation tables are connected witha translation table controller through controlling a cable; and the translation table controller is connected to the industrial personal computer. By the system, automatic parameter tests can be carried out on laser products with different packaging types, powers and numbers. The power and the spectral information of the laser products are automatically collected and recorded in the processing ofworking, the report printing data can be automatically carried out to form a test report, and therefore, the basis for failure analysis and research of the laser products is provided.
Owner:FOCUSLIGHT TECH

Quick multi-wavelength tissue optical parameter measuring device and trans-construction method

The invention belongs to the field of optical parameter measurement in tissue optics research, and relates to a multi-wavelength tissue optical parameter trans-construction method based on a neural network. The method comprises: using double integrating sphere technology and a high-sensitivity photoelectric detector to collect reflected light and transmitted light on the surface of a tested sample, and using a method of relative measurement to obtain the reflectivity, diffuse transmittance and collimation transmittance of the sample; using a Monte Carlo method to establish a mapping model of a tissue optical parameter (mua, mus and g) to a measurement amount (Rd, Td and Tc); establishing a BP neural network containing two buried layers, and adopting a gradient descent weight learning function to train a BP network; and predicting the optical parameter of the measured sample through the (Rd, Td and Tc) obtained by measurement in real time, wherein an input signal of the neural network is (Rd, Td and Tc), and an output signal is (mua, mus and g). The invention provides a device adopted by the method at the same time. The method provided by the invention can quickly and accurately measure the tissue optical parameters under multi-wavelength.
Owner:TIANJIN UNIV

Integrating Sphere Having Means For Temperature Control

The present invention relates to an integrating sphere for measuring a light-emitting property of a light source, and more particularly, to an integrating sphere having a means for controlling temperature inside the integrating sphere. An integrating sphere for measuring an optical property of a light source according to the present invention has a substantially spherical hollow space formed therein; a first through-hole provided such that a wire for supplying electric power to the light source installed inside the hollow space of the integrating sphere passes therethrough; and a second through-hole provided such that temperature-controlled air is supplied into the hollow space of the integrating sphere therethrough. A light source support, which has one end disposed at the center of the hollow space of the integrating sphere and the other end fixed to an inner peripheral surface so as to hermetically seal the first through-hole of the integrating sphere, is installed within the hollow space. The integrating sphere includes an air supply tube fixed to an outer peripheral surface of the integrating sphere where the second through-hole is formed, so that air can be supplied to the interior of the integrating sphere through the second through-hole; an air supply means for supplying air to the air supply tube; a temperature control means for controlling the temperature of air being supplied from the air supply means and passing through the air supply tube; and a shielding plate installed to be spaced apart by a predetermined distance from the second through-hole.
Owner:JANG MIN JUN

Device and method for testing performance of blue light-emitting diode (LED) excitation fluorescent powder

ActiveCN103308499AAvoid wastingImprove the ability to capture lightFluorescence/phosphorescenceTest performanceSpectrograph
The invention discloses a device and method for testing performance of blue light-emitting diode (LED) excitation fluorescent powder and relates to fluorescent powder. The invention provides a device and method for testing performance of blue LED excitation fluorescent powder based on an integrating sphere. The testing device is provided with a fixing base, an integrating sphere, a light outlet barrel, a blue LED light source, a TEC temperature control clamp, a constant current source, a cosine collector, a spectrograph, a computer, a baffle and a standard white board. An LED with the advantages of adjustable spectrum parameters and stable illumination serves as the excitation light source, the light rays reflected by the fluorescent powder are completely collected through the characteristic that the integrating sphere device is closed, a set of fluorescent powder performance measurement system with high applicability is provided, and important luminous performance indexes, such a luminous efficacy, external quantum efficiency and light conversion efficiency, of the fluorescent powder under the actual working conditions can be conveniently and accurately measured and analyzed; meanwhile, the LED excitation light source can be flexibly replaced in the system so as to meet the requirements of different fluorescent powder on different excitation light sources, and the system has good extension performance.
Owner:XIAMEN UNIV

Measurement device and measurement method of optical parameters of dielectric film

The invention discloses a measurement device and a measurement method of optical parameters of a dielectric film. The measurement device comprises a sample platform assembly for placing a sample, a refractive index and thickness measurement assembly, a transmissivity and refractive index measurement assembly and a controller, wherein the refractive index and thickness measurement assembly is formed by a laser light source assembly, a polarizer, a semi-permeability and semi-reflection mirror, a circular hole diaphragm, an automatic-collimation detector and a measurement detector; and the transmissivity and refractive index measurement assembly is formed by a white-light light source, a collimation lens set which is connected with the white-light light source and is used for a collimation light path, an integrating sphere which is used for collecting light transmitted or reflected by the sample placed on the sample platform assembly, and a spectrograph connected with the integrating sphere. The measurement device disclosed by the invention has the advantages that the refractive index and thickness measurement assembly can measure the reflective index and the thickness of the sample, and the transmissivity and refractive index measurement assembly can measure the transmissivity and the refractive index of the sample, so that the measurement of various optical parameters is realized and the measurement precision is high.
Owner:NINGBO UNIV

Spectrum programmable light source system applied to hyper-spectrum calibration

The invention discloses a spectrum programmable light source system applied to hyper-spectrum calibration. The spectrum programmable light source system applied to hyper-spectrum calibration comprises a light source. An optical filter, a collimation system, a cylindrical lens coupled system, a slit, a collimation objective and a dispersion element are sequentially placed on a light path in front of the light source, an imaging system and a digital micromirror device are sequentially arranged on a light path in front of the dispersion element, a light collection lens and an optical fiber coupler are arranged on a light path of useful light modulated by the digital micromirror device, wherein the optical fiber coupler is connected with a integrating sphere, a light splitting radiometer is arranged on the integrating sphere, and feedback control is conducted and target spectrums are simulated through a spectrum simulation program and monitoring the light splitting radiometer. A focusing system and a garbage light collector are sequentially arranged on a light path of garbage light modulated by the digital micromirror device, and the garbage light is eliminated. The spectrum programmable light source system applied to hyper-spectrum calibration can simulate accurately the target spectrums and reduce the effect of inconsistence of calibration light source spectrums and the target spectrums to a calibration result. The spectrum programmable light source system applied to hyper-spectrum calibration accurately measures radiation quantity, and is favorable to improving optical radiation calibration accuracy of a sensor.
Owner:合肥中科九衡科技有限公司

Absolute spectral radiance luminance responsivity calibrating system utilizing wide tunable laser

The invention relates to an absolute spectral radiance luminance responsivity calibrating system utilizing a wide tunable laser, which comprises a two-dimensional moving platform, wherein the two-dimensional moving platform is controlled by a computer through a stepping motor control box; a standard detector and a detector to be calibrated are arranged on the two-dimensional moving platform. The absolute spectral radiance luminance responsivity calibrating system also comprises a calibrating light source, wherein the calibrating light source comprises an integrating sphere and a tunable lasersystem; the emitting light of the tunable laser is guided into the integrating sphere and emitted at a light outlet of the integrating sphere to form the calibrating light source; the standard detector and the detector to be calibrated are sequentially aligned to the center of the light outlet of the integrating sphere to detect by the motion of the two-dimensional moving platform; the standard detector calibrates the absolute spectral radiance luminance of the light source of the integrating sphere, and a response signal of the detector to be calibrated is divided by the absolute spectral radiance luminance of the light source of the integrating sphere to obtain the absolute spectral radiance luminance responsivity. The invention can carry out whole machine calibration on a wave band typeradiance luminance detector, the calibrating parameter comprises the absolute spectral radiance luminance responsivity, and the stability and the linearity of the responsivity, and the calibrating precision of the spectral radiance luminance responsivity is effectively improved.
Owner:ANHUI INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI

Spectrum scaling apparatus used for spectrum imager

The invention discloses a spectrum scaling apparatus used for a spectrum imager. The apparatus is characterized in that: a light beam which is emitted by a broadband light source (1) goes through a diaphragm (2) and a collimating lens (3) and irradiates a wavelength tuning optical filter (4), a plurality of narrowband optical signals which are distributed in a comb-shaped mode and have different wavelengths are outputted, after light intensity adjusting by a broadband bandpass optical filter (5), the signals enter into an integrating sphere (9) from an integrating sphere incident light hole (6) for depolarization and space uniformity processing, and an integrating sphere light extraction hole (8) outputs a surface light source. A spectrum imager to be measured is placed on the light extraction hole (8) for spectrum scaling. According to the apparatus, a birefringence crystal is utilized to carry out light transmission rate modulation, a passband peak value position and a bandwidth size can be adjusted, a plurality of narrowband light intensity signals changing with a wavelength are provided in a broadband range, wavelength scanning is not needed when carrying out spectrum scaling on the spectrum imager, wavelength scaling with one-time imaging is realized, and the apparatus is suitable for scaling a large field of view and large caliber spectrum imager.
Owner:SUZHOU UNIV +1

Middle/high-temperature infrared emissivity testing device

The invention discloses a middle/high-temperature infrared emissivity testing device. The middle/high-temperature infrared emissivity testing device comprises an infrared reflectivity testing system, a sample heating control system and a microcomputer data processing system. The infrared reflectivity testing system comprises an infrared source, an interferometer, an intermediate infrared integrating sphere, an infrared detector, an A/D convertor and a liquid nitrogen cooling device. The sample heating control system comprises a sample heating table, a communication convertor, a temperature controller, a silicon-controlled voltage regulator, a sample heater and an indicator light, wherein the communication convertor, the temperature controller, the silicon-controlled voltage regulator, the sample heater and the indicator light are orderly connected. The temperature controller is connected to a precision thermocouple. The microcomputer data processing system is used for inputting preset parameters and acquiring and treating data. The middle/high-temperature infrared emissivity testing device is simple, can be used conveniently, can realize fast and accurate measurement of infrared emissivity of a material in a middle/high-temperature range of 20 to 600 DEG C, and can be used for the field of key development of middle/high-temperature solar photo-thermal coatings.
Owner:NINGBO INST OF MATERIALS TECH & ENG CHINESE ACADEMY OF SCI

Automatic assembly production line of bulb lamps

The invention relates to an automatic assembly production line of bulb lamps. The automatic assembly production line comprises a control system, a rack arranged beside the control system, a lamp holder cup assembling machine and an automatic lamp source connecting plate loading and unloading machine, wherein an indexing plate, a four-axis robot and an automatic cup overturning machine are arranged on the rack; an automatic lampshade assembling mechanism, an integrating sphere tester and an automatic lamp source assembling mechanism are arranged beside the rack; an automatic rivet assembling mechanism, an automatic lamp holder assembling mechanism and an automatic cup assembling mechanism are assembled beside the lamp holder cup assembling mechanism; a carrying tray is arranged on the automatic lamp source connecting plate loading and unloading machine; a waste transferring mechanism is arranged beside the integrating sphere tester; a riveting machine is arranged beside the waste transferring mechanism. The automatic assembly production line has the advantages that the manufacturing time of LED (Light Emitting Diode) products is shortened in the process of manufacturing the LED products, the production efficiency is improved, and further, the cost of the products is reduced; the automatic assembly production line can be used for conveniently producing the LED products in an industrial assembly line manner and in a large scale.
Owner:滕州天一光电科技有限公司

LED (light emitting diode) service life test system and test method thereof

The invention discloses an LED (light emitting diode) service life test system, which comprises refrigerators, aluminum printed circuit boards (PCBs), a cold and hot two-region temperature box and an integrating sphere. An electric refrigerating plate and a subpanel of the refrigerator are fixedly installed on a radiator and the electric refrigerating plate is embedded into an opening of the subpanel. The aluminum PCB is fixed on the surface of the electric refrigerating plate. The cold and hot two-region temperature box comprises cold and hot boxes isolated by an insulation board. The insulation board and the integrating sphere are provided with installation holes for installing the refrigerators. When the refrigerators are respectively installed on the installation holes of the temperature box and the integrating sphere, the radiators are respectively placed outside the cold box and the integrating sphere while the aluminum PCBs are respectively placed inside the hot box and the integrating sphere. The refrigerators provided by the invention can move integrally without disassembling the LED, which facilitates the LED service life test greatly. In addition, each LED can be independently lighted by connecting a lead wire at the connection solder joint of the aluminum PCB to a switching circuit, thereby achieving the aim of testing the parameters of light, color and electricity of each LED independently.
Owner:常州市产品质量监督检验所 +1

Near-infrared spectrometer

The invention provides a near-infrared spectrograph, which belongs to the technical field of photoelectric test. The invention is characterized in that a near infrared light source and a collimating lens are matched up to constitute an illuminant system. The back position of the collimating lens is suitably provided with a light intensity modulation disc and an optical filter, and then is suitably provided with a dual-light path changer consisting of a dual-light path episcotister and a reflector. The dual-light path changer is connected with an integrating sphere light path arranged on the front part. A rotary sample cell and a photodetector connected with a signal processor are suitably arranged on an integrating sphere. The invention has simple structure, and the cost is low. Like a continuous wavelength type spectrograph when used, the invention makes use of a scaling method based on continuous spectrum to analyze a special ingredient, and the characteristic wavelength of the instrument does not need determining at the phase of research and development of the instrument. The invention makes use of the characteristics of large band width of the optical filter-type one, and the structures of the integrating sphere, the dual light paths, the rotary sample cell and so on to achieve the technical effects of a quasicontinuous wavelength type spectrograph, thus significantly improving the signal to noise ratio, the stability and the versatility.
Owner:CHINA JILIANG UNIV

Platform for testing performance of camera based on EMVA1288 standard

The invention relates to a platform for testing performance of a camera based on an EMVA1288 standard. The method is used for testing the performance of the camera to be tested. The platform comprises an integrating sphere, a camera obscure, an optical power meter arranged in the camera obscure, a computer control system and a bracket, wherein a light inlet hole is formed in the camera obscure; the light inlet hole is matched with a light outlet hole of the integrating sphere; a double-dick filtering component and the camera to be tested are sequentially arranged in the camera obscure along an optical shaft direction of the light outlet hole of the integrating sphere; the double-dick filtering component comprises an optical filter and an attenuation sheet; the optical power meter is positioned between the double-dick filtering component and the camera to be tested and is far away from the optical shaft; the optical filter, the attenuation sheet, the optical power meter and the camera to be tested are arranged on the bracket and are connected with the computer control system; the computer control system calculates and processes attenuation values of light intensity and brightness, and the light power data monitored in real time so as to obtain the performance parameters of the camera to be tested specified in the EMVA1288 standard. The testing platform can test all the parameters specified in the EMVA1288 standard, and is simple in structure and low in cost.
Owner:深圳市凌云视迅科技有限责任公司
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