The invention discloses a spinneret plate microscopic examination instrument which is provided with a base, a support, a suspension arm, a coaxial
microscope, a working bench, a working bench regulating device and a
light source, wherein the working bench is provided with a base plate, a supporting plate and a bench plate; the working bench regulating device comprises a regulating shaft, a hollow shaft, a front rotary knob, a rear rotary knob, a left rotary knob, a right rotary knob, a front gear rack pair, a rear gear rack pair, a left gear rack pair and a right gear rack pair, thus the bench plate can move two-dimensionally; a spray
pipe frame is fixed on the suspension arm; a spray
pipe of a
spray nozzle is fixedly arranged on the spray
pipe frame positioned dead ahead the coaxial
microscope; a spacing element is fixed on the front end of the guide rail; and the
light source is arranged on a
light hole of the base. According to the invention, manual operation is adopted, the structure is simple and compact; the instrument is small in volume; the manufacturing cost is low; and after a hole is examined, if the hole is found to be a fault hole, the fault hole can be dredged, and the working efficiency is improved greatly.