Device for testing life of semiconductor laser

Abstract

The invention discloses a device for testing life of a semiconductor laser, comprising an optical platform, wherein the optical platform is provided with parallel guide rails and a laser water cooling array; the parallel guide rails are provided with electric translation tables; an integrating sphere and a PD (Power Detector) are fixed on the electric translation tables; the integrating sphere isconnected with a spectrograph through an optical fiber; the spectrograph is connected to an industrial personal computer; the PD is connected with the industrial personal computer through a collecting card; a temperature collecting module is arranged at the side of the laser water cooling array and connected with the industrial personal computer; the electric translation tables are connected witha translation table controller through controlling a cable; and the translation table controller is connected to the industrial personal computer. By the system, automatic parameter tests can be carried out on laser products with different packaging types, powers and numbers. The power and the spectral information of the laser products are automatically collected and recorded in the processing ofworking, the report printing data can be automatically carried out to form a test report, and therefore, the basis for failure analysis and research of the laser products is provided.

Description

technical field [0001] The invention belongs to the technical field of laser testing, and relates to a laser testing device, in particular to a device for testing the life of a high-power semiconductor laser. Background technique [0002] High-power semiconductor lasers are widely used in communication, military, medical and many other fields. As an important index to measure laser products, its reliability has been paid more and more attention by people. This is mainly due to: [0003] (1) Through the reliability research of semiconductor lasers, the failure mechanism of semiconductor lasers can be accurately judged. [0004] (2) Test the actual working life time of the semiconductor laser. [0005] (3) Provide a basis for the aging research of semiconductor lasers. [0006] (4) To improve device design and process technology to improve the reliability of semiconductor lasers. [0007] However, since the life test of high-power semiconductor lasers often requires regul...

AI Technical Summary

Problems solved by technology

[0008] However, the existing laser life test systems generally have a low test power range for lasers, and most of the laser life test systems developed in China focus on manual measurement or theoretical derivation

This method is difficult to guarantee the accuracy and stability of the test, especially for high-power laser testing, the data is difficult to reflect the real life of the laser working process

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