562 results about "Test power" patented technology

The invention provides a chip power consumption measurement system and method.The chip power consumption measurement system comprises a test board, a power consumption collection module and a control module, the control module sends task instructions to a chip to be tested, and the task instructions comprise any one or more of a voltage instruction, a frequency instruction and an operation core instruction; when the chip to be tested executes a task instruction, the power consumption acquisition module acquires voltage information of each test resistor and transmits the voltage information to the control module; the control module determines the test power consumption of the to-be-tested chip according to the voltage information. According to the technical scheme, the task instruction can be sent to the to-be-tested chip, any one or more of the working frequency, the working voltage and the number of the running cores of the to-be-tested chip can be changed, different use scenes can be simulated, power consumption measurement of the to-be-tested chip can be completed in different scenes, and the test power consumption of the to-be-tested chip can be accurately and rapidly obtained.

The invention provides a real-time stability test platform and method for data acquisition of a power distribution control chip. The real-time stability test platform comprises a test power grid, an acquisition system, a to-be-tested control chip, a high-low temperature alternating box, an upper computer and a clock module, the upper computer is used for storing a plurality of test programs, controlling the high and low temperature alternating box and the test power grid to obtain different working conditions, calling the corresponding test programs according to the different working conditions, sending out corresponding control instructions, and performing stability analysis on the control chip to be tested according to the first test data and the second test data; and obtaining a stability test result. The problem that in the prior art, a single parameter testing method is difficult to comprehensively evaluate the stability of a control chip in an actual complex environment in real time is solved; according to the invention, the stability of the control chip is efficiently tested in real time, and the problems of difficult simulation of complex working conditions and multi-parameter coupling influence can be solved.

The invention is suitable for the technical field of communication, and particularly relates to a method for detecting mismatched harmonic waves of a power amplifier. The method comprises the steps that a first power detection unit is connected with a coupler through a control unit, the standing-wave ratio of a to-be-detected power amplifier chip is adjusted to be 1: 1 through a tuner, and the power of an input signal of a vector signal generator is adjusted till the target power of the to-be-detected power amplifier chip is reached; the second power detection unit is connected with the coupler through the control unit, the output standing-wave ratio of the to-be-detected power amplifier chip is adjusted to a preset specific value through the tuner, and when the tuner modulates phases at intervals of preset degrees, the harmonic power of the to-be-detected power amplifier chip in each phase is recorded through the second power detection unit. Compared with the prior art, the method can accurately test and evaluate the harmonic wave of the to-be-tested power amplifier chip under the mismatched standing wave condition, thereby evaluating the harmonic wave index of the to-be-tested power amplifier chip.

The invention discloses a broadband oscillation characterization platform of a multi-chip power module and a near-field characteristic evaluation method, and belongs to the technical field of power electronics. The continuous operation condition of the power converter is decoupled into a series of discrete switching points, transient near-field radiation data of a to-be-tested power module under the discrete switching points are obtained through a double-pulse test, and near-magnetic field radiation signals are reconstructed; performing time-frequency analysis on the reconstructed near magnetic field radiation signal to generate a two-dimensional time-frequency matrix; and calculating a radiation energy entropy value based on the two-dimensional time-frequency matrix, fusing the radiation energy entropy value with the peak amplitude in the two-dimensional time-frequency matrix to generate a comprehensive EMI index for evaluating the broadband oscillation electromagnetic interference risk, and triggering EMI risk early warning when the comprehensive EMI index exceeds a threshold value. According to the method, the spectrum complexity is quantified through the radiation energy entropy, the multi-dimensional EMI risk assessment is carried out by fusing the peak amplitude of the time-frequency matrix, and the broadband oscillation in the multi-chip parallel power module can be accurately and efficiently represented.

The invention discloses a high-power alternating-current impedance excitation circuit, a control method thereof and an electrolysis test system, and belongs to the technical field of power supplies and power electronics, the circuit is used as an alternating-current power supply in a high-capacity electrolysis test power supply, and the circuit is controlled by a controller to output an alternating-current signal so as to carry out an impedance test on an electrolytic bath. Compared with a full-bridge circuit, the alternating-current impedance excitation circuit adopts the multi-level converter, so that the output current harmonic content is low, the electrolysis efficiency is improved, the equipment loss is reduced, the economical efficiency of an electrolysis system is improved, stable operation of an electrolytic bath is ensured, and electrolysis interruption or faults caused by voltage fluctuation are reduced.

The invention discloses a fault detection method and system for an SVF multi-stage full-bridge sub-module in an SLCC, and the method comprises the steps: constructing a converter valve test model which comprises a converter valve, a valve control unit and a low-pressure pressurization unit; wherein the converter valve comprises a full-bridge sub-module; based on a valve tower structure, wiring complexity and test voltage safety, performing number optimization on series connection and parallel connection of full-bridge sub-modules, and setting test power supply voltage; and based on the topological structure of the full-bridge sub-modules, performing low-voltage pressurization test on the full-bridge sub-modules by using a low-voltage pressurization unit to obtain the working states of the full-bridge sub-modules, judging faults of the full-bridge sub-modules connected in series, and positioning fault positions. According to the method, the detection efficiency of the multi-stage full-bridge sub-module is improved, all the full-bridge sub-modules of the valve tower can be rapidly and accurately detected and diagnosed only through one-time wiring, the field handover test time is shortened, and SLCC direct-current power transmission project construction is supported.

The invention relates to the field of power supply testing, in particular to a power supply aging test system which comprises a power supply aging test system and a power supply aging test method. The system comprises an industrial control computer, an aging rack, an energy recovery module, an electronic load module and a closed test cabin, the industrial control computer controls aging test parameters and data acquisition, the multi-channel electronic load module is arranged in the aging rack, the energy recovery module converts electric energy into energy which can be stored or fed back to a power grid, and the closed test cabin is integrated with a temperature and humidity control unit. The test method comprises the steps of connecting a to-be-tested power supply to equipment, setting related parameters, starting a test, monitoring data, performing anomaly detection, generating a test report and the like. The technical effects of multi-channel synchronous test, energy recovery, accurate temperature and humidity control, accurate anomaly detection, detailed test report generation, remote monitoring support and the like are achieved.

The invention provides a leakage current detection circuit and detection equipment, and belongs to the technical field of semiconductor testing, and the leakage current detection circuit comprises a pulse output circuit, a power supply circuit, a detection circuit and a protection circuit. Wherein the output end of the pulse output circuit is used for connecting the control end of a to-be-tested power semiconductor, the first voltage end of the power supply circuit is used for connecting the first controlled end of the to-be-tested power semiconductor, and the second voltage end of the power supply circuit is connected with the first end of the detection circuit; the second end of the detection circuit is used for connecting a second controlled end of the to-be-detected power semiconductor, the first end of the protection circuit is connected with the first end of the detection circuit, and the second end of the protection circuit is connected with the second end of the detection circuit. According to the embodiment of the invention, the protection circuit provides a low-impedance path for the current peak generated by the high-speed switch of the power semiconductor to be tested, so that the dynamic change data of the leakage current can be accurately and completely obtained during the dynamic reverse bias stress test.

The invention provides a power device failure positioning method and system based on multi-physics field coupling, and the method comprises the steps: applying dynamic electric stress to a tested power device, and synchronously collecting the thermal field data, electric field data and mechanical field data of the tested power device; wherein the thermal field data is used for representing the surface temperature distribution of the to-be-measured power device, the electric field data is used for representing the electrical parameters of the to-be-measured power device, and the mechanical field data is used for representing the internal morphology of the to-be-measured power device; synchronizing the thermal field data, the electric field data and the mechanical field data through timestamps, and aligning in a preset three-dimensional coordinate system to obtain multi-dimensional alignment data; and generating a failure probability distribution diagram according to the multi-dimensional alignment data so as to determine corresponding failure point coordinates. Through multi-physics field data coupling analysis, the problem of failure point fuzzy positioning in a complex packaging structure is solved, and the detection sensitivity under a dynamic working condition is improved.

The invention belongs to the field of unit control, and provides an APS automatic start-stop control method and system for a test power station verification unit. The APS automatic start-stop control method of the test power station verification unit comprises the steps that an APS unit start control command is received, preparation function group start operation is executed, after all preparation function groups are started, furnace sequential control, gas turbine sequential control and steam turbine sequential control commands are started in sequence, the APS unit start process is ended, and the APS unit is put into coordinated control; and receiving a shutdown control command of the APS unit, and sequentially executing sequential control commands of stopping a denitration system, stopping a steam turbine, stopping the gas turbine, stopping a vacuum shaft seal and stopping a boiler auxiliary machine after reducing the load of the gas turbine to a set load, so that the APS unit starts from the current load to stopping of a waste heat boiler and finally stopping of a condensed water system.

The invention discloses a power supply test method and system, a test fixture and a storage medium, and relates to the technical field of testing, and the method comprises the steps: responding to a received test instruction, generating a test control signal corresponding to the test instruction through a main controller, generating a load simulation signal according to the test power and the input voltage of the test fixture, and transmitting the load simulation signal to a test module; and in response to the load analog signal, adjusting the load of the power controller through a load analog module according to the load analog signal and a feedback signal of the load of the power controller so as to update the feedback signal until the voltage difference between the voltage value indicated by the load analog signal and the voltage value indicated by the feedback signal is within a specified voltage difference range, the problem of low accuracy of the test result of the power supply test in the prior art is solved, and the accuracy and reliability of the power supply test are improved.

The invention relates to a multi-path power supply parallel automatic test system and a test method. The multi-path power supply parallel automatic test system comprises a main control module, an instruction scheduling module, a test instrument group and a plurality of test fixtures, each test fixture is used as an independent test channel with self-defined configuration; a request signal input end of the main control module is connected with a request signal output end of the independent test channel, a test signal input end of the main control module is connected with a test signal output end of the test instrument group, and a control signal output end of the main control module is connected with a control signal input end of the instruction scheduling module; the signal output end of the instruction scheduling module is connected with the signal input end of the test instrument group, and the test instrument group is used for executing corresponding test operation on the to-be-tested power supply according to the control signal; the testing efficiency is remarkably improved, manual operation is reduced, and the basic capability of automatic parallel testing of multiple power supplies is achieved.

The invention discloses a load matching method of a tested power supply and related equipment. The method comprises the following steps: acquiring rated voltage, rated current and rated power of a tested power supply, drawing a power supply parameter curve based on the group of parameters, and determining a current turning point from the power supply parameter curve; according to the magnitude relationship between the actual output voltage of the tested power supply and the voltage corresponding to the current turning point, the rated current or rated power is flexibly selected as a reference basis to determine the resistance value of each load in the load box; and finally, selecting a plurality of loads connected in parallel from the load box as test loads according to the actual output voltage, and ensuring that the actual output current of the tested power supply reaches the rated current or the actual output power reaches the rated power. The rated current or the rated power is dynamically switched through the current turning point to serve as a reference basis, the load requirements of the tested power supply in different voltage intervals are accurately adapted, and the adaptability of load matching is greatly improved.

The invention discloses a withstand voltage test method and device for transformer production and a medium, and belongs to the technical field of transformer tests.The method specifically comprises the steps that firstly, a frequency conversion test power source is connected to the input end of a to-be-tested transformer and connected with a high-precision non-inductive shunt in series, and an environment monitoring unit is started to lock temperature and humidity in real time; the control power supply outputs a standard sine test voltage with a preset frequency; then, a high-frequency broadband acquisition card is used for synchronously obtaining instantaneous waveform data of voltage and total leakage current of the transformer, and analog signals are converted into discrete digital signals; performing second-order difference on the total leakage current signal to position a high-frequency abrupt change point, and reconstructing a smooth waveform through Lagrange interpolation; a current phase difference is calculated by taking a voltage zero crossing point as a phase reference, a complex plane coordinate system is constructed, and resistive and capacitive current components are calculated through waveform amplitude projection; and finally, according to the temperature and the humidity, a correction coefficient is called to normalize the resistive current, and a quality inspection result is output by comparing an insulation safety threshold.

The invention relates to a two-way current smooth switching system and method without crossover distortion and a double-quadrant power supply, and the system comprises a signal setting unit, a dynamic bias ClassAB push-pull output unit, a feedback sampling unit and a control processing unit. According to the dynamic bias ClassAB push-pull output unit, static micro-conduction bias is provided for N-type and P-type power tubes in a push-pull output subunit through an internal bias subunit, and closed-loop control is combined, so that continuous and smooth transition can be realized when system output current is switched at a zero crossing point in the positive and negative directions, and the system stability is improved. And the problems of crossover distortion and switching dead zone existing in the traditional bidirectional power supply are thoroughly eliminated. According to the invention, high-efficiency, high-speed and distortionless bidirectional current output is realized, the system structure is simplified, and the system can be widely applied to the fields of high-precision test power supplies, battery simulators, servo drivers and the like.

The invention discloses a processor chip power consumption test method and test system, and belongs to the technical field of processor chips, and the method comprises the steps: collecting and processing the real-time test data of a processor chip, and determining the feature test data of the processor chip; training a processor chip power consumption test prediction model, analyzing the processor chip feature test data, predicting processor chip power consumption, and determining a processor chip power consumption prediction result; and displaying the power consumption test condition of the processor chip in a visual form, managing and controlling the processor chip, and adjusting the set dynamic power consumption threshold value by using the dynamic adjustment coefficient. The problem that the power consumption test effect of the processor chip is poor due to the fact that the power consumption characteristic of the processor chip cannot be comprehensively evaluated and the processor chip cannot be effectively controlled in the prior art is solved. The power consumption characteristic of the processor chip can be comprehensively evaluated, the processor chip can be effectively controlled, and the power consumption test effect of the processor chip can be improved.

The invention discloses a current slope control method, device and system, electronic equipment and a storage medium, applied to an electronic load system, the electronic load system comprises a first electronic load and a second electronic load which are connected in parallel, the first electronic load and the second electronic load are both connected with a tested power supply, the output current slope of the first electronic load is adjustable, and the output current slope of the second electronic load is adjustable. The output current slope of the second electronic load is non-adjustable. The method comprises the following steps: acquiring a target current slope; controlling a second electronic load to output a first current; acquiring the slope of the first current; determining a compensation current slope based on the target current slope and the slope of the first current; and controlling the first electronic load to output the second current at the compensation current slope, so that the output current slope of the electronic load system reaches the target current slope.

The invention provides a testing device of a power semiconductor device and a testing method based on the testing device, and relates to the field of semiconductors, and the testing device comprises a first probe loop which comprises a first probe which can be separated from or electrically contacted with a tested power semiconductor device; when the first probe is in electric contact with the tested power semiconductor device, the dynamic voltage change rate applying circuit applies dynamic voltage to the tested power semiconductor device through the first probe loop; the second probe loop comprises a second probe which is electrically contacted with the tested power semiconductor device; when the first probe is separated from the tested power semiconductor device, the parameter measuring circuit measures the electrical parameters of the tested power semiconductor device through the second probe loop; and the first stray inductance of the first probe loop is smaller than the second stray inductance of the second probe loop, so that the electrical parameters of the power semiconductor device can be accurately extracted under the condition that high dV / dt dynamic voltage is applied to the power semiconductor device.

The application discloses a local discharge signal processing method and device under high-frequency square wave voltage, wherein the method comprises the following steps: filtering low-frequency noise signals of a test power supply by using a high-pass filter with a preset cutoff frequency, wherein the test power supply is a high-frequency square wave power supply for local discharge test of an insulation sample; obtaining a local discharge starting voltage of the insulation sample, collecting a local discharge signal when a test voltage is the local discharge starting voltage, obtaining a characteristic frequency band of local discharge of the insulation sample according to the local discharge signal, and the test voltage is a high-frequency square wave voltage of the test power supply; performing modal decomposition on the local discharge signal of the characteristic frequency band to obtain a plurality of modal components, selecting a plurality of modal components satisfying a preset condition to perform noise reduction processing and signal reconstruction, and obtaining a denoised local discharge signal of the insulation sample under the high-frequency square wave voltage. The application can avoid interference of the high-frequency square wave power supply on the local discharge signal, and obtain a local discharge signal with high signal-to-noise ratio under the high-frequency square wave voltage.

The present invention discloses a dual-pulse test system, which is configured to include: a load inductor, a test power supply is connected to a power device under test through the load inductor; a first freewheeling device, after the power device under test is tested, it forms a freewheeling loop with the load inductor; a pulse generator, which is used to provide the dual pulses required for testing the power device under test; and a failure protection circuit, when the power device under test is in a failure state, it cuts off the test power supply and constructs a freewheeling loop to make the loop current no longer increase. The present invention is configured with a failure protection circuit, which can timely cut off the power supply when the power device under test is in a failure state, and can form a freewheeling loop to realize that the loop current no longer increases, preventing the device from being burned out due to the failure of the power device under test, and playing a protective role.

The invention provides double-layer soft package battery normal temperature capacity grading power supply built-in all-in-one machine equipment, which comprises a rack assembly, a battery tray probe assembly and a power supply unit layer, and is characterized in that the battery tray probe assembly comprises a bottom plate, a fire-fighting spraying part, a fan heat dissipation part, a battery tray, a tray clamping and positioning toggle clamp and a probe clamp part; the device has the beneficial effects that the test fixture and the charge and discharge test power supply are integrated, the device integration degree is high, the occupied space is small, the device is divided into two layers to independently control the flexible test battery, the degree is high, the efficiency is high, the device appearance is attractive, operation and maintenance are simple, and particularly, exposed maintenance of a large number of channel lines is avoided; and the device can be widely applied to various large battery plant laboratories and scientific research institutions, and is suitable for being maturely popularized to the market in a large scale.

The invention relates to a method and a circuit for identifying capacitive and resistive load short circuits in an alternating current load. The circuit comprises a current detection unit A, an MOS (Metal Oxide Semiconductor) tube switch unit B, a residual current sampling unit E, a live wire / zero line load short circuit detection unit C, a test power supply control unit D, a live wire / live wire short circuit detection unit F, an MCU (Microprogrammed Control Unit) operation control unit G and a power supply unit H, according to the method, short circuits between a zero line and a live line, between a live line and a ground line and between live lines can be identified independently or simultaneously; the method is a rapid identification method considering capacitive load false short circuit and resistive short circuit (true short circuit) current, the short circuit protection time is less than or equal to 150 microseconds, the identification period time is less than or equal to 10 milliseconds, and through the circuit technology, the identification error phenomenon caused by the fact that a load output end protected by an MOS tube electronic switch is connected with the capacitive load can be reduced.

The application discloses a kind of ship generator set reactive power testing device, method and computer program product, wherein the device includes: at least two adjustable reactors and control unit;The control unit includes at least two switch units and busbar;The adjustable reactor is connected in parallel by one the switch unit and accesses the busbar;The control end of the control unit is connected to each the adjustable reactor;The control unit is used to control the on-off state of the switch unit, and the reactive power regulation of the adjustable reactor and the adjustable reactor in ship generator power test.The technical scheme provided by the embodiment of the application can avoid the problem of repeated wiring under different test power, adapt to the test requirements of multiple power changes, and improve the test efficiency.

The invention discloses a current output control method, device and system, electronic equipment and a storage medium, the current output control method, device and system are applied to an electronic load system, the electronic load system comprises a consumption type electronic load and a feedback type electronic load which are connected in parallel, the consumption type electronic load and the feedback type electronic load are both connected with a tested power supply, and the method comprises the following steps: obtaining a target current value; based on the target current value, controlling the feedback type electronic load to output at a first output current; based on the target current value and the first output current, controlling the consumable electronic load to output with a second output current; the rising speed of the second output current is greater than that of the first output current; and under the condition that the output current of the electronic load system is the target current value, the consumption type electronic load is controlled to output a third output current, so that the output current of the electronic load system is kept at the target current value until the output current of the feedback type electronic load reaches the target current value and the third output current keeps a descending trend.

The present application relates to a kind of switching loading system for rock test equipment, steel frame (11) and base (12) are connected to form loading frame, steel frame (11) is to U type structure, its two side wings and base (12) are connected, normal stroke piston (15) is from top to bottom through the top plate of steel frame (11), can be applied from the normal pressure of steel frame (11) upper direction to lower;Tangential fixed piston (16) is from left through the left side wing of steel frame (11), its position can be adjusted by hand wheel, for jacking test equipment;Tangential stroke piston (17) one end is from right through the right side wing of steel frame (11), the other end is driven by oil pressure pump to provide test power for test equipment;Loading platform (13) is placed on base (12), and cantilever crane (14) of free rotation is installed on the top of steel frame (11), and the lower end of cantilever crane (14) is higher than the topmost of normal stroke piston (15).

This application provides an automated testing method and integrated testing system for spaceborne SAR, comprising: a test host reading a test configuration file corresponding to the spaceborne SAR under test, generating a test command package based on the test configuration file and sending it to the spaceborne SAR under test; the spaceborne SAR under test powering on according to the test command package, generating a microwave signal corresponding to the test command package and transmitting it to the echo reflection simulation module, receiving the echo signal fed back from the echo reflection simulation module and feeding it back to the test host; and the test host analyzing the echo signal and generating a target test report. By pre-uploading the test configuration file corresponding to the spaceborne SAR to the test host, fully automated testing of different types of spaceborne SARs is achieved, improving testing efficiency, reducing testing costs, and improving the accuracy and reliability of test results.

The invention provides 4680 cylindrical battery normal temperature formation and capacity grading test power supply built-in all-in-one machine equipment, which comprises a rack assembly, a test clamp assembly and a power supply unit layer, and is characterized in that the rack assembly comprises a rack, a clamp mounting plate, an operation panel part, a wire slot cover plate and a wire slot; the equipment has the beneficial effects that the equipment is manufactured according to the hot 4680 cylindrical battery formation and capacity grading charge and discharge requirements in the new energy power battery industry, the test fixture and the charge and discharge test power supply are integrated, the equipment is high in integration level and small in occupied space, the equipment is divided into two layers, four independent control fixtures are arranged, the flexible battery test degree is high, the efficiency is high, and the cost is low. The device is beautiful in appearance and simple to operate and maintain, especially avoids the bare maintenance of a large number of channel lines, reduces the maintenance cost of manual training, is widely applied to various large battery plant laboratories and scientific research institutions, and is suitable for large-scale mature popularization in the market.

The invention discloses a triode array reliability test method and a test circuit thereof, and belongs to the technical field of transistor test. The test method comprises a triode working point confirmation method, a reliability test power confirmation method, a reliability test circuit setting method, a reliability test circuit state monitoring method and a reliability test circuit anti-interference protection method. The test circuit comprises an NPN triode, a B pole voltage reference circuit, a B pole / voltage source constant current bias circuit, a B pole reverse breakdown prevention protection circuit, an E pole constant current bias circuit, an open circuit / poor contact display circuit, a short circuit display circuit and an anti-interference protection circuit. The problems that in the prior art, whether the aging power of the triodes reaches the standard or not cannot be judged, open-circuit or short-circuit triodes cannot be screened out in time, the total aging current is large when batch products are aged under the same power source, and the direct-current aging power of the products fluctuates due to external noise interference or crosstalk between the products are solved. The method is widely applied to reliability test technologies of transistors and transistor arrays.

A power end integral crimping device for power module test equipment comprises an upper pressing rod and a lower pressing rod which are parallel to each other, are bow-shaped and are used for accommodating a to-be-tested power component; the first pusher and the second pusher are controlled to drive the first mechanical execution mechanism and the second mechanical execution mechanism, so that the upper pressing rod and the lower pressing rod are driven to move relatively, and the power terminal of the to-be-tested power component between the upper pressing rod and the lower pressing rod is subjected to integral crimping. According to the utility model, integral crimping is adopted, so that uniform stress of the power terminal in the crimping process is ensured, local stress concentration is avoided, and the reliability of connection is enhanced.

The invention belongs to the technical field of component measurement, and particularly relates to a device capable of switching components in a closed box body outside the box body to carry out an electrical test, which comprises a measurement button, a controller, a relay, a driving module of the relay and a component fixing clamp, the measuring button, the controller, the relay and the driving module of the relay are sequentially connected, and the controller receives a control instruction sent by the measuring button and drives the relay and the driving module of the relay to switch electrical connection of components in the closed box body according to the control instruction; the component fixing clamp is used for installing a component to be tested, and a port is reserved in the component fixing clamp and used for being connected with a test power source. According to the invention, components in the closed box body are switched to carry out an electrical test under the condition that the closed box body is not opened, and the change of a test environment caused by opening the closed box body to replace the components is avoided, so that the influence on an electrical test result of the components is avoided, and the time for readjusting the test environment to be stable is saved.