Method for testing power type LED thermal resistance and special purpose chip thereof
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- FOSHAN NATIONSTAR OPTOELECTRONICS CO LTD
- Publication Date
- 2004-11-10
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention relates to a technique for accurately measuring the thermal resistance characteristics of a power LED device during the process of designing or improving the power LED. Background technique
[0002] Power LED, that is, power light-emitting diode, its input power is several times, tens of times, or even hundreds or even thousands of times that of ordinary LEDs. In order to dissipate the heat generated by power LEDs in a timely manner, ensure The working temperature of the power LED is within the allowable range, so that the power LED can work with high efficiency and high reliability for a long time, and the power LED device is required to have a small thermal resistance, which requires the design or improvement of the power LED package In the process of structure, packaging material, and packaging process, the thermal resistance of power LEDs is continuously measured, and the impact of new designs or improvements on thermal resistance is ...