829 results about "Design information" patented technology

Image processing enhances display quality by controlling both the image modulator and the light sources to produce the best possible visual images. The image processing system utilizes a combination of user inputs, system configuration, design information, sensor feedback, pixel modulation information, and lighting control information to characterize the display environment on a per pixel basis. This per pixel characterization information is combined with one or more frames of the incoming real time display data. The image processing system processes each incoming pixel and produces a modified corresponding output pixel. Each pixel of each frame is processed accordingly. In addition to producing modified output pixels, the image processing system produces control information for the light sources. The light source control information can control individual lamps, tubes or LEDs, or can control a block or subset of the light sources. The resulting display has improved image consistency, enhanced color gamut, higher dynamic range and is better able to portray high motion content.

A system and method for managing energy consumption of a building system includes a source of actual energy consumption data, a source of actual weather data, and a database correlating discrete weather data values with expected energy consumption values for at least one component of the building system. A computer accesses the actual weather data, actual energy consumption data and database, wherein the computer compares the expected energy consumption values with actual energy consumption data and generates an output based on the comparison. The expected energy consumption values are generated for the discrete weather data values using an energy consumption model that functionally relates discrete weather data values and design information for the building system component.

The present invention relates generally to effectively design a wiring of a semiconductor package, etc., in a short time. A wiring design software (SW) reads in design information indicating disposition of pads on a chip, disposition of pins on a package, and relationship of correspondence between the pads and the pins, analyzes it to prepare a wiring problem, classifies the pads and the pins into source and sink elements, and assigns consecutive identification numbers to the pads and the pins with a same identification number being assigned to a pad and a pin which are connected each other (S102, . . . , S108). The wiring design SW generates a virtual triangle having a source / sink element as an apex by applying Delaunay triangulation to the source and the sink elements (S110). The wiring design SW level classifies the pins using the generated triangle (S200). The wiring design SW determines whether or not an edge of the triangle crosses a wiring and connects the edges which are determined to cross each other to derive a route of wiring (S220), outputting the result of wiring design (S118).

Methods and systems for generating simulated images from design information are provided. One system includes one or more computer subsystems and one or more components executed by the computer subsystem(s), which include a generative model. The generative model includes two or more encoder layers configured for determining features of design information for a specimen. The generative model also includes two or more decoder layers configured for generating one or more simulated images from the determined features. The simulated image(s) illustrate how the design information formed on the specimen appears in one or more actual images of the specimen generated by an imaging system.

A rule-based design consultant and analysis method for an integrated circuit (“IC”) layout design compares an IC design against a list of rules. The IC design information may be included in a set of databases, including a database containing physical implementation and technology specific timing and area information. The consultant and method can be used with a graphical user interface that displays a report of the rules run on the IC design. Cross-probing may be incorporated to display at least one diagram of an object that is not compliant with a particular rule, as well as relevant source code for the object.

A Virtual Design Module (VDM) used in a networked design environment generates manufactured product designs that are near optimal in terms of cost and production cycle time by using design data files containing alternative parts and manufacturers information. Numerous product design alternatives are considered and evaluated in terms of design-manufacturing-parts-supplier feasibility and real-time information on cost and production cycle time for realization. The VDM generates a population of new designs with appropriate board design information to allow for design-manufacturer-supplier decision making and determines the feasibility of each member of the current generation of designs and rejects designs that are not feasible. The VDM triggers Mobile Software Agents (MSA) that obtain data for parts availability, cost, lead time and manufacturer data for manufacturing availability, cost and lead time for each feasible member of the current generation of designs and return the data. In one application for printed circuit board design, the VDM evaluates each member of the current generation of designs by calculating cost, lead-time and value using a J function. The VDM then improves board designs through selection and use of board design modifiers. The process continues until optimized designs are obtained. Optimized board designs are output as results to an operator.

A design system is accessible to a designer and a plurality of manufacturers. The design system comprises a first user interface configured to receive design information for a component from the designer. The design system further comprises a second user interface configured to receive manufacturing information from the plurality of manufacturers. The manufacturing information comprises at least process cost information. The design system further comprises a database comprising the manufacturing information associated with each of the plurality of manufacturers. The design system further comprises a cost estimation module. The cost estimation module is configured to generate a cost estimate for producing the component for each of the plurality of manufacturers. The cost estimate is at least partially based on the process cost information. The cost estimation module is further configured to output the cost estimate for one or more of the plurality of manufacturers to the first user interface.

A method of generating drillstring design information in response to input data which includes wellbore geometry and wellbore trajectory requirements, comprises the step of generating a summary of a drillstring in each hole section of a wellbore in response to the input data.

Image processing enhances display quality by controlling both the image modulator and the light sources.The image processing system utilizes a combination of user inputs, system configuration, design information, sensor feedback, pixel modulation information, and lighting control information to characterize the display environment on a per pixel basis. This per pixel characterization information is combined with one or more frames of the incoming real time display data. The image processing system processes each incoming pixel and produces a modified corresponding output pixel. Each pixel of each frame is processed accordingly.The image processing system also produces control information for the light sources. The light source control information can control individual lamps, tubes or LEDs, or can control a block or subset of the light sources. The resulting display has improved image consistency, enhanced color gamut, higher dynamic range and is better able to portray high motion content.

A cache management method disclosed herein enables optimal cache space settings to be provided on a storage device in a computer system where database management systems (DBMSs) run. Through the disclosed method, cache space partitions to be used per data set are set, based on information about processes to be executed by the DBMSs, which is given as design information. For example, based on estimated rerun time of processes required after DBMS abnormal termination, cache space is adjusted to serve the needs of logs to be output from the DBMS. In another example, initial cache space allocations for table and index data is optimized, based on process types and approximate access characteristics of data. In yet another example, from a combination of results of pre-analysis of processes and cache operating statistics information, a change in process execution time by cache space tuning is estimated and a cache effect is enhanced.

An integrated circuit (IC) device fabrication process may be monitored by processing product wafers to fabricate product IC devices, collecting process tool data from tools used to fabricate the product IC devices, and testing the product IC devices. To predict and monitor yield, the process tool data collected during processing and the defectivity data from testing the product IC devices may be input to a yield model that also takes into account design information particular to the product devices. The design information may comprise layout attributes of the product devices. The yield model may be generated from a defectivity model created by processing test wafers to fabricate test structures, collecting process tool data from tools used to fabricate the test structures, and testing the test structures. The test structures may have varying layout attributes to cover a design space allowed by design rules for particular product IC devices.

The invention relates to a custom shoe system based on a network platform and a method thereof. The system comprises a foot type data acquisition unit used for acquiring foot type characteristic parameters of a user, a foot type data store unit used for storing the foot type characteristic parameters, a custom information acquisition unit used for acquiring shoe pattern chosen by the user and the individuation design information of the shoe pattern, a shoe tree data store unit used for storing the shoe tree data corresponding to different shoe patterns and a data processing unit used for transferring the shoe tree data corresponding to the shoe pattern chosen by the user in the shoe tree data store unit, transferring the foot type characteristic parameters of the user to modify the shoe tree data in the foot type data store unit and generating a shoe tree processing code of the custom shoes of the user, meanwhile, according to the individuation design information of the shoe pattern, generating custom shoe material selecting information and a custom shoe process flow information for processing. The custom shoe system and the method lead the user to customize the shoe pattern suited for the foot type of the user without going out, and can customize the shoe pattern with the individuation design according to personal preference.

A cache management method disclosed herein enables optimal cache space settings to be provided on a storage device in a computer system where database management systems (DBMSs) run. Through the disclosed method, cache space partitions to be used per data set are set, based on information about processes to be executed by the DBMSs, which is given as design information. For example, based on estimated rerun time of processes required after DBMS abnormal termination, cache space is adjusted to serve the needs of logs to be output from the DBMS. In another example, initial cache space allocations for table and index data is optimized, based on process types and approximate access characteristics of data. In yet another example, from a combination of results of pre-analysis of processes and cache operating statistics information, a change in process execution time by cache space tuning is estimated and a cache effect is enhanced.

The invention discloses a planning big data management and control system of a smart power distribution network and a method. The system comprises that a data layer constructs a global power network planning model; a basic data dictionary containing power network devices, graph standards and power network operation information is built; an application layer carries out statistic analysis and real time load actual measurement analysis to the power network devices and power network operation states in a set region; automatic filling of power network load data graphs, intelligent operation of planning data, intelligent verification of the planning data and intelligent statistics and summary of the planning data are realized; a service layer selects planning power network schemes; a display layer carries out centralized display, share and information issue to the planning and design achievement. According to the system and the method of the invention, through taking multi-source massive data such as basic geographic information, power network space and attribute thematic information and power network operation real time information as cores, planning and design data resources in the system are effectively integrated, a power network planning and design integrated information platform is built, and power network planning and design information-based foundation is tamped.

A metrology target design may be optimized using inputs including metrology target design information, substrate information, process information, and metrology system information. Acquisition of a metrology signal with a metrology system may be modeled using the inputs to generate one or more optical characteristics of the metrology target. A metrology algorithm may be applied to the characteristics to determine a predicted accuracy and precision of measurements of the metrology target made by the metrology system. Part of the information relating to the metrology target design may be modified and the signal modeling and metrology algorithm may be repeated to optimize the accuracy and precision of the one or more measurements. The metrology target design may be displayed or stored after the accuracy and precision are optimized.

A design system is accessible to a designer and a plurality of manufacturers. The design system comprises a first user interface configured to receive design information for a component from the designer. The design system further comprises a second user interface configured to receive manufacturing information from the plurality of manufacturers. The manufacturing information comprises at least process cost information. The design system further comprises a database comprising the manufacturing information associated with each of the plurality of manufacturers. The design system further comprises a cost estimation module. The cost estimation module is configured to generate a cost estimate for producing the component for each of the plurality of manufacturers. The cost estimate is at least partially based on the process cost information. The cost estimation module is further configured to output the cost estimate for one or more of the plurality of manufacturers to the first user interface.

An operator-free and fully automated semiconductor inspection system with high throughput is realized. All conditions required for capturing and inspection are generated from design information such as CAD data. In order to perform actual inspection under the conditions, a semiconductor inspection system is composed of a navigation system for generating all the conditions required for capturing and inspection from the design information and a scanning electron microscope system for actually performing capturing and inspection. Moreover, in the case of performing a matching process between designed data and a SEM image, deformed parts are corrected by use of edge information in accordance with multiple directions and smoothing thereof. Furthermore, a SEM image corresponding to a detected position is re-registered as a template, and the matching process is thereby performed.

A guidance control system is configured to control the positioning and spatial orientation of a digging implement mounted on a frame of an trenching machine for working a subsurface of earth to a desired trench profile. The position of a dynamic cutting edge of the digging implement is monitored and then controlled so that the sensed dynamic cutting edge position is equal substantially to the calculated dynamic cutting edge position. The guidance control system includes sensors, a processor, and accessible memory providing digital design information regarding the desired trench profile.

A method for manufacture of application specific solar cells includes providing and processing custom design information to determine at least a cell size and a cell shape. The method includes providing a transparent substrate having a back surface region, a front surface region, and one or more grid-line regions overlying the front side surface region. The one or more grid regions provide one or more unit cells having the cell size and the cell shape. The method further includes forming a layered structure including photovoltaic materials overlying the front surface region. Additionally, the method includes aligning a laser beam from the back surface region to illuminate a first region within the one or more grid-line regions, subjecting a first portion of the layered structure overlying the first region to the laser beam to separate the first portion of the layered structure from the first region, and scanning the laser beam along the one or more grid-line regions to cause formation of one or more unit cells having the cell size and cell shape. The method further includes transferring the one or more unit cells.

A method and system is provided that allows for the extraction of design templates and other design information from an existing website through a visual point-and-click interface, requiring no programming knowledge; the detection and application of these templates across a plurality of existing web pages; as well as the application of these templates to newly generated content and newly generated or existing software.

A CAD system having a plurality of clients connected by a network enables simulations to be run that reflect design information from other client CADs. A server 100 causes a computing unit 101 to reflect in a three-dimensional model generated based on design according to any given client 110-140 design data according to any other client 110-140. Then, using that three-dimensional model, the server carries out an operating simulation and transmits the simulation results to the requesting client. The client that receives the simulation results from the server 100 then displays those simulation results on a design screen.

An operator-free and fully automated semiconductor inspection system with high throughput is realized. All conditions required for capturing and inspection are generated from design information such as CAD data. In order to perform actual inspection under the conditions, a semiconductor inspection system is composed of a navigation system for generating all the conditions required for capturing and inspection from the design information and a scanning electron microscope system for actually performing capturing and inspection. Moreover, in the case of performing a matching process between designed data and a SEM image, deformed parts are corrected by use of edge information in accordance with multiple directions and smoothing thereof. Furthermore, a SEM image corresponding to a detected position is re-registered as a template, and the matching process is thereby performed.

Defects observed by imaging tools may be classified by automatic comparison of features observed in a defect image with design information relating to corresponding portions of the image. Defect information may be generated from a defect image from a defect imaging tool. Design information relating to one or more structures to be formed on the substrate in a vicinity of the defect may be retrieved. The defect may be classified based on a combination of the defect information from the defect image and design information relating to one or more structures to be formed on the substrate in the vicinity of the defect.

For the purpose of reducing a false report and shortening inspection time, an area to be inspected is locally inspected under optimum inspection conditions. In order to avoid the number of detected defects from increasing explosively, and thereby to facilitate control of a critical defect, general-purpose layout data, which is used for producing a mask of a semiconductor wafer, is accumulated in a design information server 2. With reference to the layout data, an area to be inspected, which is inspected by a pattern inspecting apparatus 1, is divided into partial inspection areas including a cell portion and a non-cell portion. Inspection parameters are set for each of the partial inspection areas. In addition, the defect reviewing apparatus 8 obtains an inspection result of the pattern inspecting apparatus 1. When obtaining a defect image, the defect reviewing apparatus 8 identifies a position, where the defect occurred, from among a cell portion, a non-cell portion, a pattern dense portion, and the like according to layout data. Moreover, the defect reviewing apparatus 8 sets inspection parameters, such as pickup magnification of this defect, in response to a result of the identification to set a control criterion of criticality.

The invention discloses a highway tunnel designing method based on BIM. The highway tunnel designing method based on the BIM includes the steps that 1, according to mapping and reconnaissance data, aterrain model and a geologic model are built, and tunnel surrounding rock grades are determined; 2, a tunnel texture feature library is defined, and a tunnel cross section model library is establishedthrough calculation; 3, according to a project overall design scheme, a tunnel three-dimensional path and cross aisle and inclined shaft space curve model is built; 4, according to design kilometersof all tunnel cross sections, a tunnel main cave subsection model is built; 5, an inclined shaft model, a cross-aisle model and a tunnel portal structure model are built; 6, other tunnel auxiliary engineering measure components including reinforcing steel bars, steel shotcrete, steel frames and electromechanical parts are built; 7, tunneling work amount accounting is conducted, and a BIM model isapplied. According to the highway tunnel designing method based on the BIM, the terrain model and the geologic model are fused with a tunnel main body, three-dimensional paths can be modified in realtime, related drawings are automatically modified, therefore, the purpose is achieved that engineering design information is completely reflected in the BIM model, and model information transfer and application in the later period are facilitated.

The invention is concerned with the electricity surge protector with proper motion monitoring, includes the SPD body, the signal collector, the processer and the memory cell, there into, the memory cell on the in or outside of the processer can protect the standard configuration of the SPD; the processer, connecting the signal convertor to process the SPD state from the collector to obtain the operating state data, and it can compare the data and the standard configuration with the advanced designed information, at the last, to analyze the result and give remain to the users and / or control the action of the SPD.

A topology design information generator which, based on design information storing setting information, which is set in each communication instrument in order to enable the communication, on a layer-by-layer basis, generates layer-by-layer topology design information of the network. A topology information generator which collects the layer-by-layer setting information actually set in each communication instrument and, based on the collected setting information, generates layer-by-layer topology information of the actually constructed network. And a topology information comparator which compares the topology design information generated by the topology design information generator, and the topology information generated by the topology information generator, on the layer-by-layer basis.

This invention presents a framework for applying artificial intelligence to aid with product design, mission or retail planning. The invention outlines a novel approach for applying predictive analytics to the training of a system model for product design, assimilates the definition of meta-data for design containers to that of labels for books in a library, and represents customers, requirements, components and assemblies in the form of database objects with relational dependence. Design information can be harvested, for the purpose of improving decision fidelity for new designs, by providing such database representation of the design content. Further, a retrieval model, that operates on the archived design containers, and yields results that are likely to satisfy user queries, is presented. This model, which is based on latent semantic analysis, predicts the degree of relevance between accessible design information and a query, and presents the most relevant previous design information to the user.

The present invention discloses a system that provides automated guidance for making architectural decisions when designing information services in a service-oriented architecture (SOA). Such a system can include a requirements manager, a reusable asset repository, and an asset advisory tool. The requirements manager can be configured to capture non-functional requirements for information services. The reusable asset repository can be configured to store design assets. The design assets can be stored according to a unique data model that associates each design asset with a non-functional requirement. The asset advisory tool can be configured to determine a list of recommended design assets for a user-selected non-functional requirement and document the architectural decision made from the list of recommended design assets.

In a system that provides CAD layout-design information, by having the user acquire information such as circuit design or CAD layout data registered in a database, the user can analyze the acquired information, so there is a possibility that circuit-design or circuit-board-design know-how could be leaked. With this invention, a characteristic-parameter-extraction means extracts characteristic parameters from a position where there is a possibility of the occurrence of poor electrical characteristics due to an influence of the CAD layout of the input CAD layout data. A correction-determination means determines whether or not it is necessary to correct the layout by comparing the characteristic parameters and correction-determination standards that correspond to poor electrical characteristics read from a database. This makes it possible to check the electrical characteristics of the CAD layout without making available to the user the correction-determination standards or determination method.