607 results about "Ic devices" patented technology

For testing electrical properties of packaged IC devices, there is provided an apparatus which includes a test board which is located at a testing station and provided with a plural number of contacting sockets for connecting individual IC devices to an IC tester separately and independently of each other, a loader which is located at a loading station and adapted to feed untested IC devices toward the test board, an unloader which is located at an unloading station and adapted to discharge tested IC devices from the test board at the testing station, and a device transfer mechanism which is movable across the testing station to transfer untested IC devices from the loader to the test board and also to transfer tested IC devices from the test board to the unloader. Upon detecting completion of a test on one of IC devices in one socket of the test board, a fresh untested IC device is transferred to the testing station to replace the tested IC device. As soon as the fresh IC device is set in position in that socket, execution of a test program is started with respect to that socket on the test board.

A method provides electrical connections to a stack of contact levels of an interconnect region for a 3-D stacked IC device. Each contact level comprises conductive and insulation layers. A portion of any upper layer is removed to expose a first contact level and create contact openings for each contact level. A set of N masks is used to etch the contact openings up to and including 2N contact levels. Each mask is used to etch effectively half of the contact openings. When N is 3, a first mask etches one contact level, a second mask etches two contact levels, and a third mask etches four contact levels. A dielectric layer may be formed on the sidewalls of the contact openings. Electrical conductors may be formed through the contact openings with the dielectric layers electrically insulating the electrical conductors from the sidewalls.

An integrated circuit interconnect module for reducing interconnections between integrated circuit chips MOUNTED ON a support substrate. At least one primary integrated circuit (IC) device chip and a plurality of interacting peripheral integrated chip devices. The interconnect module including a plurality of interface pins, each integrated circuit device having a plurality of interface ports. At least one interface port of which is connected to another one of said plurality of integrated circuit devices, at least one of said integrated circuit devices having an interface port connected to an interface pin whereby the majority of nodes on the interacting peripheral devices are adapted to interface with nodes of the primary IC devices in such a way as to condense the number of nets so that the total number of nodes connected to external pins is minimized.

The present invention relates to one kind of protection device and IC manufacturing process. The protection device includes one NMOS / PMOS pair with a dynamic initial voltage, and the NMOS and the PMOS have separate grids coupled to the semiconductor in the channel area. Cooperating with proper metal connection, the said structure can protect IC in manufacture from plasma and charge damage and protect IC in operation from abnormal voltage.