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8 results about "Electrical resonance" patented technology

Electrical resonance occurs in an electric circuit at a particular resonant frequency when the impedances or admittances of circuit elements cancel each other. In some circuits, this happens when the impedance between the input and output of the circuit is almost zero and the transfer function is close to one.

Electromagnetic voltage transformer global state sensing system and method

The invention relates to the technical field of electromagnetic measurement and state monitoring, and discloses a global state sensing system and method for an electromagnetic voltage transformer. The technical problems that in the prior art, data robustness is insufficient and actual working condition changes of a power grid are difficult to adapt due to the fact that accurate resonance circuit parameters are depended and a single calculation path is adopted are solved. According to the method, ferromagnetic resonance phenomena under various faults are simulated based on electromagnetic transient simulation, phenomenon data are obtained, and influence factors are analyzed to obtain influence rule data. And taking the rule data as input, and adopting a comprehensive solving method combining programming calculation, system structure chart calculation and electromagnetic transient software simulation to obtain a high-reliability state quantity time sequence. Based on the time sequence, a nonlinear model which takes loss into account and does not depend on precise resonant circuit parameters is derived, and explicit mathematical functions of primary current and transient overvoltage of the voltage transformer are obtained.
Owner:ELECTRIC POWER RES INST STATE GRID SHANXI ELECTRIC POWER

A method for measuring superconducting current density, a control system, a storage medium and an electronic device

ActiveCN119555988BCurrent density measurementsSuperconductor elements usageControl systemResonance
The application discloses a superconducting current density measurement method, a control system, a storage medium and an electronic device, and comprises the following steps: determining the corresponding relationship between the superconducting current density of a to-be-measured sample and a dynamic inductance, and connecting the to-be-measured sample to a resonance circuit; obtaining the dynamic inductance, and determining the resonance frequency according to the dynamic inductance; monitoring the resonance frequency, determining the change of the dynamic inductance according to the change of the resonance frequency, and then obtaining the superconducting current density corresponding to the resonance frequency according to the corresponding relationship; the measurement method designed in the application is not limited by the size of the volume of the to-be-measured sample, the change of the superconducting current density can be directly monitored by monitoring the change of the resonance frequency temperature or the magnetic field, the accurate measurement of the superconducting current density on the mesoscopic scale (micro-nanometer level) sample can be carried out, and the problem of inaccurate measurement caused by weak signals in the prior art is overcome.
Owner:YANGTZE DELTA IND INNOVATION CENT OF QUANTUM SCI & TECH

Measuring setup and method for detecting a specific type of battery damage

The invention relates to a measuring arrangement (10) for detecting a specific damage (B) to a battery caused by an external force (K) applied by an object (31) to a protective plate (30) arranged below the battery (38), wherein the measuring arrangement (10) comprises a measuring device (12) and a control device (14) coupled thereto, which is designed to determine the specific damage (B) as a function of a measurement signal (A1, A2) detected by means of the measuring device (12).The measuring device (12) comprises an electrical resonant circuit (16) arranged on the top (30a) of the protective plate (30), with an inductive resonant circuit part (16a) and a capacitive resonant circuit part (16b), and an excitation unit (22) coupled to the resonant circuit (16) for exciting the resonant circuit (16) and for detecting a response signal (A1, A2), wherein the control device (14) is designed to determine a resonance frequency (FR) of the resonant circuit (16) depending on the detected response signal (A1, A2) and to detect the specific damage (B) depending on the determined resonance frequency (FR).
Owner:AUDI AG

Resonant circuit quality factor measuring method and measuring system

The invention relates to a resonant circuit. The invention discloses a resonant circuit quality factor measurement method and a measurement system, overcomes the defects that a traditional measurement method is large in measured quality factor error, complex in calculation, large in coupling structure limitation and the like under the high-frequency condition, and can rapidly and efficiently measure the resonant circuit quality factor. According to the invention, the S11 parameter of the system is measured by using a vector network analyzer, the on-load quality factor Qe and the coupling coefficient kappa of the resonance circuit are obtained, and finally the no-load quality factor Q0 of the resonance circuit is obtained through calculation: Q0 = (1 + kappa) Qe. According to the resonant circuit quality factor measurement method, the influence of a coupling structure on measurement is eliminated, and the design of the coupling structure is more free and simpler. According to the measurement method, the resonator does not need to be directly connected into the circuit, so that the measurement is more convenient, and the system cost is reduced.
Owner:CHENGDU GALLIUM SILICON MICROSUN ELECTRONIC TECH CO LTD

Method for adjusting a measuring device for non-contact detection of electrically conductive parts

Method for adjusting a measuring device for the non-contact detection of electrically conductive parts (3), wherein the electrically conductive parts (3) are guided through a conveying line (2) which is enclosed by a ring coil (5) which interacts with a capacitor (6) as a resonant circuit within an oscillator circuit (7), wherein the electrically conductive parts (3) cause a detuning of the resonant circuit within the oscillator circuit (7) and thereby events (21, 22) in the form of frequency and / or amplitude peaks, and wherein an evaluation circuit (8) is provided for detecting the events (21, 22) in an output signal of the oscillator circuit (7), wherein the evaluation circuit (8) detects the magnitude of the frequency and / or amplitude peak.compares with at least one switching threshold and, using a first signal generator (9), outputs a signal depending on whether a highest switching threshold has been exceeded, and the first signal generator (9) can assume different states (18, 28, 29, 30, 31) and indicates how reliably one of the parts (3) to be detected was detected when passing through the ring coil (5), characterized in that, after a switch-on signal (17), the measuring device initially assumes an operational state and the first signal generator (9) outputs a standby signal (18), and for signal evaluation, a measurement (19) and an evaluation of the frequency and / or the amplitude of the oscillator circuit (7) are continuously carried out by a microprocessor of the evaluation circuit (8), wherein a first comparison (23a) of a first event (21) with the value of a lower switching threshold (24) is carried out and, if the lower switching threshold (24) is not exceeded,the measurement (19) is continued, otherwise a classification as an event (22) is performed, wherein a second comparison (23b) of the classified event (22) is made with a second switching threshold (32), which is a sum of the lower switching threshold (24) and a potentiometer offset (25), and wherein, in the case that the second switching threshold (32) is exceeded, it is recognized as part (3), otherwise it is classified as a minor event (28), wherein, in the case of the detection of a significant frequency and / or amplitude peak, and thus as part (3), a difference between the measurement (19) and a mean rest signal (20) is stored, wherein a third comparison (23c) of the classified event (22) is made with a first switching threshold, which is a sum of the second switching threshold (32) and a switching reserve offset (26),and wherein the potentiometer offset (25) can be influenced by means of a first potentiometer (11) and / or the switching reserve offset (26) can be influenced by means of a second potentiometer, wherein the first signal generator (9) continuously displays the last detected part (3) and the display of the first signal generator (9) also changes to match the last detected part (3) when the first potentiometer (11) is actuated.
Owner:WENGLOR SENSORIC ELEKTRONISCHE GERATE

Superconducting current density measurement method, control system, storage medium, and electronic device

PCT designated stageWO2026108987A1Current density measurementsSuperconductor elements usageControl systemHemt circuits
Disclosed in the present invention are a superconducting current density measurement method, a control system, a storage medium, and an electronic device. The method comprises: determining a correspondence between a superconducting current density and a dynamic inductance of a sample under test, and connecting the sample under test to a resonant circuit; obtaining the dynamic inductance, and determining a resonant frequency on the basis of the dynamic inductance; and monitoring the resonant frequency, determining the change in the dynamic inductance on the basis of the change in the resonant frequency, and then obtaining, on the basis of the correspondence, the superconducting current density corresponding to the resonant frequency. The measurement method designed in the present application is not limited by the volume of the sample under test, and by monitoring the change in the resonant frequency with temperature or magnetic field, the change of the superconducting current density can be directly detected, thereby achieving accurate measurement of superconducting current densities of mesoscopic-scale (micro-nano level) samples and overcoming the problem of inaccurate measurement caused by weak signals in the conventional technology.
Owner:YANGTZE DELTA IND INNOVATION CENT OF QUANTUM SCI & TECH

Temperature-stabilized sensor unit for distance determination

Temperature-compensated sensor unit (1) for determining the distance to an electrically conductive object, comprising an LC resonant circuit (2) with a coil (3) and a capacitor (4), control means (5) which are designed such that the LC resonant circuit (2) can be excited by an oscillation, in particular a current and / or a voltage, evaluation means (6) which are designed such that a parameter change of the LC resonant circuit (2) caused by the electrically conductive object can be detected and / or evaluated, an auxiliary resistor (7) which is electrically connected to the coil (3) at a common contact (12), a printed circuit board (8) as well as an amplifier unit (9) with an input contact (10) and an output contact (11), wherein the input contact (10) is connected to the common contact (12) of the coil (3) and the auxiliary resistor (7) and the output contact (11), in particular single-pole, is connected to the capacitor (4), wherein the amplifier unit (9) is arranged such that the voltage drop across the auxiliary resistor (7) can be amplified and output at the output contact (11), characterized by that the coil (3) in the circuit board (8) is formed by a first conductor track section (13) which forms a first conductor track resistance (14) and that the auxiliary resistance (7) in the circuit board (8) is formed by a second conductor section (15) which forms the auxiliary resistance (7) as a second conductor resistance (16) and wherein the first conductor section (13) and the second conductor section (15) are thermally coupled and magnetically decoupled.
Owner:BAUMER ELECTRIC AG

LLC eleven-mode time-domain analysis method considering semiconductor junction capacitance size

The present application relates to LLC resonant circuit analysis technical field, specifically to a kind of LLC eleven mode time domain analysis method considering the size of semiconductor junction capacitance;The present scheme is based on the design of resonant parameters suitable for the constraint conditions such as resonant capacitance voltage and current value, considers non-ideal factors such as stray capacitance, analyzes the resonance in dead time, i.e. in a switching cycle including dead time, divides the whole process into eleven modes for analysis;In the LLC converter, the present scheme fully considers the adverse effects of parasitic capacitance on the normal operation of the circuit, and compares and analyzes the circuit model under different modes, which has greater reference value for the design of actual circuit, and the method is clearer and simpler, suitable for practical engineering.
Owner:BEIJING JIAOTONG UNIV