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5 results about "Reflection spectroscopy" patented technology

In brief, spectroscopy is the study of the electromagnetic spectrum as emitted or reflected by various materials. Reflectance spectroscopy focuses on the radiation reflected by different materials. Anyone with a little familiarity with rocks can at a glance recognize a piece of basalt or limestone.

Paper type determination method

PendingJP2026028371AMaterial analysis by optical meansPaper recyclingReflection spectroscopyPaperboard
To provide a method for easily determining the type of paper.SOLUTION: A method for determining a type of paper, the method comprising: performing reflection spectroscopy measurement using a terahertz wave. The step is a step of evaluating a ratio of a peak area based on a reflection spectrum obtained by the reflection spectrometry, or a step of evaluating a ratio of a reflectance at a specific frequency based on the reflection spectrum obtained by the reflection spectrometry, and the ratio of the peak area is based on a peak area of a corrugated cardboard, and the ratio of the reflectance is based on a reflectance of the corrugated cardboard.SELECTED DRAWING: None
Owner:OJI HLDG CORP

Portable moisture sensing device for rapid determination of seed moisture content and seed harvest timing

PendingUS20260016404A1Material analysis by optical meansThreshersReflection spectroscopyPhotodetector
Described herein is a portable seed moisture content measuring system based on infrared reflection spectroscopy. The system comprises a portable SMC readout console and a portable seed threshing apparatus. The portable SMC readout console is a handheld device comprising a near-infrared sensor fixture. The sensor fixture comprises a base plate, one or more light emitting diodes (LEDs) on the base plate and oriented obliquely, The LEDs are configured to emit a beam of near infrared light to a seed sample and a photodetector disposed at a center of the base plate receives the reflected light. The portable seed threshing apparatus provides clean seeds for the SMC readout console.
Owner:THE STATE OF OREGON ACTING BY & THROUGH THE OREGON STATE BOARD OF HIGHER EDUCATION ON BEHALF OF OREGON STATE UNIV

Method for measuring backside excitation-frontside detection tr and thin film longitudinal diffusion coefficient

The application discloses a back excitation-front detection TR and thin film longitudinal diffusion coefficient measurement method, is a kind of perovskite thin film longitudinal diffusion coefficient transient reflection measurement method, belong to test method field.The application utilizes the transient reflection spectroscopy technology of back excitation-front detection, realizes the direct observation of perovskite thin film longitudinal carrier diffusion dynamics, it is a new transient reflection spectroscopy means, for the problem of carrier longitudinal diffusion.Respectively, back excitation-front detection TR can realize the direct observation of longitudinal carrier diffusion in thin film, for the perovskite thin film with the thickness of 1.2um, it can be seen that the rising edge of TR signal is about 2000ps, represents that carrier diffuses from excitation surface to detection surface.The diffusion coefficient D obtained by fitting the experimental results of back excitation-front detection TR of independent exploration is 1.47cm 2 / s, close to the diffusion coefficient of single crystal, consistent with the single grain in longitudinal direction shown by SEM.
Owner:DALIAN INSTITUTE OF CHEMICAL PHYSICS CHINESE ACADEMY OF SCIENCES

Procedure for measuring ink absorption in overlay printing using reflection spectroscopy

PendingVN8008UReflection spectroscopyEngineering
The invention relates to a process for measuring ink absorption in printing technology to overcome the inaccuracies and slow response of traditional filter-based density measurement methods. The technical solution is based on using single-ink and paper reflectance spectral data to construct a model for calculating the reflectance spectrum and CIE L*a*b* color values ​​of an “ideal” overlapping color swatch. The process involves comparing this ideal value with actual measured data through color difference parameters (ΔE) to accurately determine ink absorption. The invention enhances accuracy and responsiveness in evaluating the quality of color overlay printing, conforming to current international standards such as ISO 13655.
Owner:TRUONG AI HOC BACH KHOA AI HOC QUOC GIA THANH PHO HO CHI MINH

Method and system for detecting at least one hazardous substance

ActiveDE102018132033B4Spectrum investigationFuel testingReflection spectroscopyMiddle infrared
Method for detecting at least one hazardous substance, in particular an explosive, in a sample (26), in particular in a spatial detection area (18), wherein a first optical spectrum of the sample (26) is recorded using a first optical spectroscopy method during a first spectrum acquisition time window (106) and a second optical spectroscopy method is used to record a second optical spectrum of the sample (26) during a second spectrum acquisition time window (108), wherein the first and the second optical spectroscopy methods differ, wherein the first optical spectrum and the second optical spectrum are compared with provided reference spectra of the at least one hazardous substance to determine whether the at least one hazardous substance is present in the sample (26) or not, wherein the first optical spectroscopy method is infrared spectroscopy, in particular MIR reflection spectroscopy.and that an infrared spectrum is recorded as the first spectrum of the sample (26), that the second optical spectroscopy method is Raman spectroscopy, in particular UV Raman spectroscopy, and that a Raman spectrum is recorded as the second spectrum of the sample (26), characterized in that the first spectrum recording time window (106) and the second spectrum recording time window (108) overlap at least partially in time, in particular completely, that to record the first optical spectrum the sample (26) is exposed to first pulsed electromagnetic radiation (50) and that an intensity of first scattered radiation (60) backscattered from the sample (26) is detected, that to record the second optical spectrum the sample is exposed to second pulsed electromagnetic radiation (76) and that an intensity of second scattered radiation (86) backscattered from the sample (26) is detected with spectral resolution.
Owner:DEUTSCHES ZENTRUM FÜR LUFT UND RAUMFAHRT E V