Universal photoelectric test system for tera-hertz spectra

A photoelectric test, terahertz technology, applied in the direction of measuring electricity, measuring devices, spectrum investigation, etc., can solve problems such as single function, poor user customizability, complex equipment, etc.

Inactive Publication Date: 2010-07-21
SUZHOU INST OF NANO TECH & NANO BIONICS CHINESE ACEDEMY OF SCI
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Problems solved by technology

[0004] In order to overcome the disadvantages of complex equipment, high cost, single function, and poor customizability in the prior art, the purpose of the present invention is to provide a general-purpose terahertz spectrum photoelectric test system, which can flexibly use a variety of different light source and detector combinations , It can be applied to the test and analysis of terahertz photoelectric characteristics of a wide range of materials and devices

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  • Universal photoelectric test system for tera-hertz spectra
  • Universal photoelectric test system for tera-hertz spectra

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Embodiment Construction

[0027] The present invention designs a device that can meet the common requirements involved in the testing and analysis of terahertz light sources, detectors and other core devices, terahertz band materials and structures, and adopts an optimized spectrum and photoelectric response test system to control the optical path, circuit and computer Integration enables the present invention to form a large, medium, small, or even miniature terahertz photoelectric testing system. The system can scan to obtain the optical and electrical spectra of samples and analyze the terahertz photoelectric properties of devices and samples. The system can use any existing terahertz light source (such as SiC Glowbar, high-pressure mercury lamp, Gunn submillimeter wave signal source, return wave tube, etc.) and terahertz detector (such as pyroelectric, Golay Cell, silicon radiation heat gauge, etc.). The invention designs compact and reasonable optical, mechanical and vacuum cavity structures, and...

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Abstract

The invention discloses a tera-hertz photoelectric characteristic test system capable of realizing multiple test functions on photoelectric characteristics and the like of Fourier spectra, transmittance spectra, reflection spectra and tera-hertz electronic devices by combination of various customized light sources and detectors, light path components selected by a user, and addition of peripheral auxiliary equipment. The tera-hertz photoelectric characteristic test system has the advantages of high signal-to-noise ratio, high resolution, strong expandability, low cost and the like, and can be widely suitable for tera-hertz technical research, new material research, environmental detection and biomedical analysis. In the tera-hertz photoelectric characteristic test system, the light paths, circuits and control of the spectra and photoelectric response test system are subjected to design optimization and systematic integration; compact and reasonable optical, mechanical and vacuum cavity structures are designed; computer controlled accurate mechanical scanning and data acquisition are adopted; and finally the aim of testing and analyzing tera-hertz photoelectric characteristics of materials and core devices such as tera-hertz light sources and detectors by using combination of various light sources and detectors can be fulfilled.

Description

technical field [0001] The present invention relates to a photoelectric test system, in particular to a system for testing terahertz spectrum and capable of testing various terahertz photoelectric characteristics by customizing the combination of light sources and detectors, selecting optical path components by the user, and adding peripheral auxiliary equipment. The invention is widely applicable to terahertz technology research, new material research, environmental detection and biomedical analysis. Background technique [0002] Terahertz wave is an electromagnetic wave with a frequency of 0.3THz-30THz (wavelength about 10μm-1mm, photon energy about 1.2meV-120meV), which is between infrared waves and millimeter waves, and is a very important band in the electromagnetic spectrum. The blackbody radiation at room temperature, the background electromagnetic radiation of the universe, and the vibration and rotation characteristic frequencies of many organic macromolecules in na...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/28G01N21/59G01R31/00
Inventor 秦华刘宏欣张志鹏张宝顺
Owner SUZHOU INST OF NANO TECH & NANO BIONICS CHINESE ACEDEMY OF SCI
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