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99 results about "Terahertz detector" patented technology

Terahertz-Raman integrated detection system and method

The invention relates to a terahertz-Raman integrated detection system and method. The detection system comprises a fusion mainframe box and an integrated probe arranged at a sample detection end on the fusion mainframe box, a Raman spectrum module, a terahertz spectrum module, a terahertz optical module and a data analysis module are arranged in the fusion mainframe box; the Raman spectrum module is composed of a Raman laser, a Raman light filter, a Raman grating and a Raman detector which are sequentially connected through a light path; the terahertz spectrum module is composed of a terahertz femtosecond laser, a transmitting photoconductive antenna, a receiving photoconductive antenna and a terahertz detector which are sequentially connected through a light path; the data analysis module is in communication connection with the Raman detector and the terahertz detector and is used for synchronously processing data transmitted by the Raman detector and the terahertz detector. Compared with the prior art, the integrated probe synchronously collects two kinds of spectral data and carries out fusion processing on the two kinds of spectral data through the data analysis module, and the device has the remarkable effects that the device integration degree is high, the detection efficiency and accuracy are greatly improved, and the application range is wide.
Owner:SHANGHAI RES INST OF CHEM IND CO LTD +1

Terahertz detector based on circular metasurface and graphene composite structure and method

The invention discloses a terahertz detector based on a circular metasurface and graphene composite structure and a method, and belongs to the technical field of semiconductor devices and micro-nano machining. The device comprises a substrate, a graphene layer, a circular metasurface layer, a first electrode and a second electrode, the graphene layer is arranged on the substrate; the first electrode and the second electrode are oppositely arranged on two side ends of the graphene layer; the circular metasurface layer is arranged on the graphene layer and located between the first electrode and the second electrode. According to the invention, the local field enhancement effect of the metasurface structure is combined with the photoelectric response of graphene, the frequency selective absorption of terahertz waves is realized, the signal-to-noise ratio and selectivity of the detector are improved, and the sensitivity and response speed of the detector are improved at the same time.
Owner:DAZHOU IND TECHNOLOGY RESEARCH INSTITUTE +1

Terahertz detector linearity calibration device and method

The invention discloses a terahertz detector linearity calibration device and method. The terahertz detector linearity calibration device comprises a terahertz radiation source, a monitoring detector, a baffle, a terahertz film attenuator, a diaphragm, a standard terahertz detector, a digital multimeter, a computer and measurement and control software. The terahertz radiation source is used for radiating parallel or divergent terahertz wave beams; the monitoring detector is used for monitoring the fluctuation condition of the terahertz radiation source; the baffle plate is used for being inserted into a terahertz light path when the noise of the detector is detected so as to play a role in cutting off the terahertz light path; the terahertz thin film attenuator is used for carrying out quantitative attenuation on terahertz power without changing the transmission state of a wave beam; the digital multimeter is used for measuring an electric signal output by the detected terahertz detector, and the electric signal is collected by the computer and sent to the data processing software, and then the linearity is calculated according to the linearity. According to the invention, the interference of the attenuator on beam transmission characteristics can be effectively reduced, so that the calibration precision is improved.
Owner:THE 41ST INST OF CHINA ELECTRONICS TECH GRP

Contact type terahertz characteristic parameter test system and test error correction method

The invention discloses a contact-type terahertz characteristic parameter test system and a test error correction method, and belongs to the technical field of tests.The test system is based on a 110GHz vector network analyzer, adopts a coaxial waveguide converter for frequency bands below 110GHz, and facilitates system integration; for frequency bands above 110 GHz, 110 GHz signals are used as excitation, the link size of the terahertz module is greatly reduced, the signal quality is remarkably improved, and the terahertz module has the characteristics of large dynamic state, high stability and the like by being matched with a material characteristic testing device, and can realize high signal-to-noise ratio acquisition of original signals; according to the test method provided by the invention, while the test precision is ensured, the operation complexity of the test system is reduced, automatic test of characteristic parameters can be realized, and the test precision can reach + / -1%; the power-adjustable terahertz receiving and transmitting integrated module can meet the test requirements of samples with different attenuation characteristics by adjusting the signal power; by using the terahertz detector, the complexity of a traditional test system is reduced, and the test dynamic state of the system is improved.
Owner:CHINA ELECTRONIS TECH INSTR CO LTD

Multi-mode nanometer measurement system and method based on terahertz scattering type scanning near-field optical microscopy and multi-frequency electrostatic force microscopy

The invention discloses a multi-mode nanometer measurement system and method based on terahertz scattering type scanning near-field optical microscopy and multi-frequency electrostatic force microscopy, and belongs to the technical field of near-field imaging, the measurement system comprises an AFM main body, a terahertz source, an optical path system, a terahertz detector, a multi-frequency signal generator and two phase-locked amplifiers; terahertz waves emitted by the terahertz source reach the terahertz detector through the optical path system, and near-field optical signals are obtained. The AFM comprises a metal coating probe; the multi-frequency signal generator generates sinusoidal signals with frequencies of omega1 and omega2; a sample is placed on the scanner, and the cantilever beam is controlled to vibrate at the frequency omega 1; an alternating voltage with the frequency of omega 2 is applied to a metal coating probe arranged at the top end of the cantilever beam; laser emitted by the laser is reflected to the light spot position detector through the cantilever beam, and morphology and electrostatic force signals are obtained through the two lock-in amplifiers respectively. According to the invention, a morphology signal, an optical signal and an electrostatic force signal can be synchronously obtained through single scanning.
Owner:INST OF ENERGY HEFEI COMPREHENSIVE NAT SCI CENT (ANHUI ENERGY LAB)

Portable terahertz security inspection equipment

A portable terahertz security inspection device is disclosed, comprising: a carrier body; a terahertz transmitting device, which is arranged on the carrier body and comprises a terahertz signal source and a transmitting unit connected to the terahertz signal source for transmitting terahertz waves; a terahertz detector, which is arranged on the carrier body and is used to receive terahertz waves reflected by an object to be inspected; a data acquisition and processing system, which is arranged on the carrier body and is connected to the terahertz detector to receive scanning data of the object to be inspected from the terahertz detector and generate a terahertz image; and a display device, which is connected to the data acquisition and processing system and is used to receive and display the terahertz image from the data acquisition and processing system. The portable terahertz security inspection device does not need to be equipped with a mechanical scanning system, so that the volume and weight of the terahertz security inspection device can be greatly reduced, so that the security personnel can manually move the device to complete the scanning of the imaging area.
Owner:NUCTECH CO LTD +1

A readout circuit for a terahertz detector array

The present application relates to the technical field of electronic circuit, and especially relates to a readout circuit of a terahertz detection array, which comprises: a readout link at least comprising a current feedback instrumentation amplifier, a programmable gain amplifier and an incremental analog-to-digital converter connected in sequence; the current feedback instrumentation amplifier amplifies the signal output by the detector and outputs a first-stage amplified signal, the current feedback instrumentation amplifier comprises an instrumentation amplifier body and a first ripple suppression module, the first ripple suppression module comprises a first redundant segmented current steering DAC and a first DAC code register; the programmable gain amplifier further amplifies the first-stage amplified signal, the programmable gain amplifier comprises a gain amplifier body and a second ripple suppression module, and the second ripple suppression module comprises a second redundant segmented current steering DAC and a second DAC code register. The present application effectively reduces the chip area and power consumption while ensuring that the readout circuit of the terahertz detection array has high gain, low noise and low offset.
Owner:SUZHOU INST OF NANO TECH & NANO BIONICS CHINESE ACEDEMY OF SCI

Method of Forming Bismuth Chalcogenide Film, Terahertz Detector Having Such a Film and Method of Forming Such a Detector

A method of forming a bismuth chalcogenide film is disclosed including the steps of (a) forming at least one bismuth (Bi) elemental layer on a substrate, (b) forming at least one selenium (Se) or tellurium (Te) elemental layer on the substrate, and (c) after steps (a) and (b), heating the substrate to form a bismuth chalcogenide film.
Owner:CITY UNIVERSITY OF HONG KONG

Signal measurement method for terahertz wave transmission system

The invention relates to the technical field of terahertz detection, in particular to a signal measurement method for a terahertz wave transmission system. According to the technical scheme, the method comprises the following steps that a terahertz source is used for emitting terahertz waves, and after the terahertz waves are transmitted through one or more optical assemblies, stable transmission light beams are formed; an image of the transmission light beam is collected through a terahertz detector, and an original gray level image is obtained; and carrying out image processing on the original grayscale image, and extracting a light spot area. A complete two-dimensional light spot image is obtained at a time through the area array detector, an effective light spot area is automatically extracted in combination with an image processing algorithm, coordinate mapping is carried out, and efficient and stable measurement of terahertz wave energy distribution is achieved; by calculating light spot center energy and comparing energy changes under different optical assembly configurations, the transmission loss of the assembly can be quantitatively analyzed, and a reliable and quantifiable measurement means is provided for terahertz system debugging, assembly performance evaluation and multi-scene application.
Owner:INST OF ENERGY HEFEI COMPREHENSIVE NAT SCI CENT (ANHUI ENERGY LAB)

Terahertz broadband high-sensitivity sensor chip based on local field enhancement and its manufacturing method

ActiveCN118310992Befficient couplingincrease the degree of interactionFinal product manufactureMaterial analysis by optical meansLocal field enhancementVivaldi antenna
The present invention provides a terahertz broadband high-sensitivity sensor chip based on local field enhancement and a manufacturing method thereof, which includes a Vivaldi antenna, an artificial surface plasmon waveguide with a metal groove structure, a terahertz wave is input through an input end waveguide, and the Vivaldi antenna at one end couples the terahertz wave to the artificial surface plasmon waveguide, and the terahertz wave is transmitted in the waveguide under the constraint of the artificial surface plasmon waveguide, and the terahertz wave on the waveguide is coupled back to the free space by the Vivaldi antenna at the other end and is received by the terahertz detector; a circular metal area is provided at the inner edge of the artificial surface plasmon waveguide to increase the effective working bandwidth of the sensor chip. The present invention has high sensing sensitivity and high effective working bandwidth, can reduce reflection, and improve coupling efficiency, thereby solving the resonance peak generated by the metamaterial sensor due to its special structural design, has a simple preparation process, and has low equipment price, and can be applied on a large scale.
Owner:BEIJING NORMAL UNIV AT ZHUHAI

Sensing System and Measurement Method Based on Multi-Order Resonant All-Dielectric Terahertz Metamaterials

The present invention relates to a sensing system and a measurement method based on a multi-order resonance all-dielectric terahertz metamaterial, which includes a terahertz emitter, a sensing device, a terahertz detector, and a post-processing system. The sensing device is composed of a multi-order resonance all-dielectric terahertz metamaterial with grooves and through holes etched on a silicon wafer. The terahertz emitter and the terahertz detector are respectively arranged above and below the sensing device for emitting and receiving terahertz signals. The terahertz detector is connected to the post-processing system to perform real-time processing and display of the detected terahertz signals. The measurement method of this system is as follows: Detect the terahertz signals without a sample, detect the terahertz signals of the multi-order resonance all-dielectric terahertz metamaterial when not loaded and loaded with a sample, and then calculate the sensitivity of the multi-order resonance all-dielectric terahertz metamaterial. This technical solution has multi-order resonance, a high quality factor, and sensing sensitivity, and can quickly and accurately perform terahertz sensing detection on samples.
Owner:FUZHOU UNIV

Terahertz detector based on Dirac semimetal nanowire structure

The invention discloses a terahertz detector based on a Dirac semimetal nanowire structure, and particularly relates to the terahertz field, the terahertz detector comprises a gold reflecting layer, a dielectric layer and a Dirac semimetal material layer, the dielectric layer is arranged on the top of the gold reflecting layer, and the Dirac semimetal material layer is arranged on the top of the dielectric layer; and the Dirac semi-metal material layer is a Dirac semi-metal nanowire array layer. A Dirac semimetal-silicon dioxide-gold three-layer structure is adopted, Fano resonance and F-P resonance are excited to be coupled through a nanowire array, high absorption (99.02% at most) of seven frequency bands within the range of 0-14.5 THz is achieved, dynamic tuning is achieved by adjusting the Fermi level of Dirac semimetal, the sensitivity reaches 5421.43 GHz / RIU, the quality factor is 35.204 (1 / RIU), and the device is stable in structure, easy to process and suitable for large-scale production. The device is suitable for the fields of terahertz detection, imaging, biosensing and the like.
Owner:SOUTHWEAT UNIV OF SCI & TECH

Integrated cross-band reference source based on quantum frequency-selecting two-color laser and implementation method

The invention discloses an integrated cross-frequency-band reference source based on quantum frequency selection double-color laser and an implementation method. The integrated cross-frequency-band reference source comprises a potassium atom Faraday laser, an atomic spectrum frequency stabilization system, a PDH frequency stabilization system, an optical frequency comb system and a terahertz detector. Two-color laser generated by the potassium atom Faraday laser is input into the first polarization beam splitter and then is divided into two beams, one beam is input into the atomic spectrum frequency stabilization system, and the other beam sequentially passes through the acousto-optic modulator and the small-hole diaphragm to enter the second polarization beam splitter; the second polarization beam splitter divides the incident light beam into two beams, one beam enters the third polarization beam splitter, and the other beam is input into the PDH frequency stabilization system; the atomic spectrum frequency stabilization system and the PDH frequency stabilization system are used for stabilizing the frequency of the double-color laser; the third polarization beam splitter divides the incident beam into two beams, one beam serves as an optical frequency signal to be output, the other beam is subjected to frequency down-conversion through an optical frequency comb system to obtain a microwave signal, and the remaining optical frequency signal is mixed by a terahertz detector to obtain a terahertz signal.
Owner:PEKING UNIV +1

Metal-optical Tamm enhanced terahertz detector

A metal-optical Tamm enhanced terahertz detector provided by the present invention is characterized in that a metal-optical Tamm resonant cavity comprises an upper Bragg reflector, a lower Bragg reflector, a substrate and a metal reflector, the upper Bragg reflector is formed by permutation and combination of double-period high-resistance silicon and an air medium, a single-period structure is that an air cavity is wrapped in the high-resistance silicon, and the lower Bragg reflector is formed by permutation and combination of the high-resistance silicon and the air cavity; the air cavity covers the terahertz detector, and the periphery of the air cavity is of a high-resistance silicon supporting structure and is used for combining to form an upper Bragg reflector; the lower Bragg reflector is of an air-high-resistance silicon-air sandwich structure, the upper portion and the lower portion of high-resistance silicon wrap an air cavity, and a high-resistance silicon supporting structure is arranged on the periphery of the air cavity and used for forming and fixing the lower Bragg reflector. According to the terahertz detector, the high quality factor and low loss characteristics of the resonant cavity are utilized, the resonant filtering function of terahertz signals is achieved, meanwhile, the interaction between the terahertz signals and the sensitive element of the detector is improved, and efficient detection of the terahertz signals is achieved.
Owner:NANJING UNIV

A planar superlens for a spaceborne terahertz detector

This invention relates to a planar superlens for spaceborne terahertz detectors. The planar superlens comprises an independent aluminum foil, on which an array of resonant units arranged in concentric rings is disposed. The resonant unit array includes various C-shaped resonant units with different structural parameters, each C-shaped resonant unit being a C-shaped hole structure etched into the aluminum foil. C-shaped resonant units with the same structural parameters are arranged at equal intervals on a ring band with the same arrangement radius, forming, from the inside out, a paraxial fine control module, a mid-ring band phase compensation module, a mid-to-far ring band phase modulation module, and an edge region phase coverage module. Compared with existing technologies, the superlens proposed in this invention has outstanding features such as large depth of focal length, tight focusing, lightweight, low cost, and resistance to space environments. It is particularly suitable for integration into terahertz detection payloads of meteorological satellites, which are extremely sensitive to weight and volume, and can be used for remote sensing missions such as ice cloud detection and atmospheric composition spectral line observation.
Owner:SHANGHAI NORMAL UNIVERSITY

High-resolution near-field terahertz time-domain spectroscopy system and high-precision tomography method

The application provides a high-resolution near-field terahertz time-domain spectroscopy system and a high-precision tomography method, which comprises: a first terahertz source and a second terahertz source for generating a first terahertz pulse and a second terahertz pulse under the triggering of a first pulsed laser and a second pulsed laser respectively; a terahertz detector for receiving a third terahertz pulse and a fourth terahertz pulse generated by the radiation of a sample under the triggering of a third pulsed laser; the third terahertz pulse and the fourth terahertz pulse are generated by the radiation of the sample to the first terahertz pulse and the second terahertz pulse respectively; a pulsed laser light path for transmitting the first pulsed laser, the second pulsed laser and the third pulsed laser; the distance between the sample and the first terahertz source, the distance between the sample and the second terahertz source and the distance between the sample and the terahertz detector are all less than the terahertz wavelength. The application simultaneously utilizes near-field radiation technology and near-field detection technology to improve the resolution of the system and reduce the terahertz transmission loss.
Owner:BEIHANG UNIV

A tellurium-based room temperature terahertz detector device

The invention discloses a tellurium-based room temperature terahertz detector device, which has a metal-semiconductor-metal structure, a tellurium nanosheet material for the semiconductor, and titanium and gold for the metal electrodes. The Te terahertz detector has a chopping frequency of 1kHz at room temperature, a response time of only 9.7μs at an operating frequency of 172GHz, a response rate of up to 600kV / W, and a NEP of less than 0.1pW / Hz at a 1V bias and 1kHz modulation frequency. 0 . 5 After the detector was heated to 200℃ for 20 minutes and then cooled twice, the response remained basically unchanged. Te terahertz detector has the following advantages: 1. Simple structure; 2. Can work at room temperature; 3. High device sensitivity; 4. Fast response speed; 5. Good stability.
Owner:SHANGHAI INSTITUTE OF TECHNICAL PHYSICS CHINESE ACADEMY OF SCIENCES

Terahertz detector antenna integration method

The invention discloses a terahertz detector antenna integration method, which adopts photosensitive polyimide as a dielectric layer, integrates an antenna and a field effect transistor to different planes to form an antenna-photosensitive polyimide-field effect transistor terahertz detector structure, and connects the antenna and the field effect transistor through a feeder line. The antenna transmits the received terahertz signal to the field effect transistor through the feeder line, and then the terahertz signal is read out through the drain end of the field effect transistor. Photosensitive polyimide is used as the dielectric layer between the terahertz detector antenna and the field effect transistor, so that the antenna and the transistor are located in different planes, electromagnetic interference and noise coupling are reduced, the spatial layout and the integration degree are optimized, and the reliability of the terahertz detector is improved. And meanwhile, the dielectric loss is reduced by adjusting the thickness of the photosensitive polyimide dielectric, and the radiation efficiency and gain of the antenna are improved, so that the overall performance of the terahertz detector is improved.
Owner:SUZHOU INST OF NANO TECH & NANO BIONICS CHINESE ACEDEMY OF SCI

Plug-in terahertz digital holographic device based on waveguide

The invention discloses a waveguide-based pluggable terahertz digital holographic device, and belongs to the field of terahertz digital holographic imaging. The device comprises a terahertz radiation source, a terahertz waveguide tube, a terahertz semi-transparent and semi-reflecting mirror, a terahertz focusing lens, a terahertz beam expanding collimator, an imaging sample, a terahertz detector, a metal reflecting mirror and a computer. According to the terahertz digital holographic device, the terahertz waveguide is used for replacing a traditional terahertz digital holographic space light path, discrete devices in the traditional light path are integrated into the waveguide, the terahertz digital holographic device is compact in integration, and the problems that an existing terahertz digital holographic device is complex in structure and large in size are solved; through the design, the terahertz source can be directly aligned with the terahertz waveguide tube for insertion and extraction, and the problem that the existing terahertz digital holographic optical path is time-consuming in installation and adjustment and difficult in alignment due to the fact that terahertz waves are invisible is solved. The digital holographic imaging of the sample is conveniently realized, the quantitative holographic data of the sample including the amplitude and the phase are obtained, and the defect of terahertz wave intensity imaging is overcome, so that the digital holographic imaging method has wide application prospects in the fields of terahertz wave nondestructive testing, biomedical imaging, safety inspection and the like.
Owner:NANKAI UNIV

Terahertz transmitting and receiving channel system and method based on optical ellipsometry principle

The invention discloses a terahertz receiving and transmitting channel system and method based on an optical ellipsometry principle, and the system comprises a waveform generator which is configured to generate a modulation waveform changing with time; the terahertz emitter is configured to generate a terahertz radio-frequency signal, modulate the terahertz radio-frequency signal based on a modulation waveform, and then emit the terahertz radio-frequency signal to an object to be measured at a preset incident angle; the polarized light path is configured to perform polarization on the terahertz radio-frequency signal emitted by the terahertz emitter and perform polarization on the terahertz radio-frequency signal reflected by the object to be measured; and the terahertz detector is configured to receive the terahertz radio frequency signal which is reflected by the object to be measured and is polarized by the polarized light path so as to measure the thickness of the object to be measured. According to the invention, terahertz nondestructive testing imaging can be realized, faster and better imaging quality can be obtained, high-precision thickness measurement can be realized, and the method is especially suitable for in-situ nondestructive testing and thickness measurement systems for special coatings and structural members.
Owner:10TH RES INST OF CETC

Terahertz detector based on microcavity enhanced non-degenerate two-photon absorption

The invention belongs to the technical field of infrared / terahertz detection, provides a terahertz detector based on microcavity enhanced non-degenerate two-photon absorption, solves the problem that a traditional high-sensitivity terahertz detector needs ultralow-temperature refrigeration, and adopts the technical scheme that the input end of a polarization controller is connected with a pump laser used for generating pump light; the input end of the optical fiber taper is connected with the output end of a polarization controller for adjusting the polarization characteristic of the pump light; the surface of the echo wall mode microcavity is coated with a fluorescent material of quantum dot perovskite, and a terahertz signal to be detected is focused on the fluorescent material through a terahertz focusing lens used for gathering field energy; optically coupling the optical fiber taper and the echo wall mode microcavity; the input end of the optical filter is connected with the output end of the optical fiber taper, and the output end of the optical filter after the non-fluorescent wave band is filtered is connected with a photoelectric detector used for converting light field intensity information generated by fluorescent light waves into electric signals. Terahertz high-sensitivity detection at normal temperature becomes possible.
Owner:NAT INNOVATION INST OF DEFENSE TECH PLA ACAD OF MILITARY SCI

Machine learning assisted terahertz tobacco non-destructive detection device and method

PendingCN122448785ABeam splitterAlgorithm
The application discloses a kind of based on machine learning auxiliary terahertz tobacco nondestructive testing device and method, belong to nondestructive testing technical field.The device of the present application includes laser generation module, beam splitter, terahertz transmitter, dual-function switchable workbench, detection light path module, terahertz detector and control and processing module, control and processing module inlay integration is the machine learning model specially designed for tobacco sample, for the terahertz time-domain spectroscopy data of sample to be detected is handled, obtains complete terahertz time-domain signal, simultaneously, can synchronous realization tobacco precision determination and moisture content rapid prediction.The present application has the advantages of miniaturization, low cost, high efficiency and high accuracy, is suitable for the nondestructive, real-time quality monitoring of whole process of tobacco production.
Owner:HANGZHOU INTERNATIONAL INNOVATION INSTITUTE OF BEIHANG UNIVERSITY

System and method for terahertz frequency object and crop contamination and constituent detection and handling

An agricultural system with an agricultural harvester has a terahertz sensor. The terahertz sensor includes at least one a terahertz source disposed to direct electromagnetic radiation toward a harvest material of the agricultural harvester. A terahertz detector is disposed to detect the terahertz electromagnetic radiation after the terahertz electromagnetic radiation interacts with the harvest material. A controller is operably coupled to the terahertz detector and is configured to detect a harvest-related parameter based on a signal from the terahertz detector and to perform an action based on a detected parameter.
Owner:DEERE & CO

Terahertz detector and preparation method of terahertz detector

The application discloses a ternary transition metal chalcogenide and application thereof in a terahertz detector, and realizes high-speed, high-sensitivity and room-temperature wide-spectrum terahertz detection under the driving of a strong topological surface state of the ternary transition metal chalcogenide.
Owner:SUZHOU INST OF NANO TECH & NANO BIONICS CHINESE ACEDEMY OF SCI

Novel terahertz spectrum measuring instrument and method

The invention provides a novel terahertz spectrometer. The device mainly comprises a terahertz complex color light source system, a collimation module, a long-wave-pass optical filter, a terahertz tunable filter, a voltage supply module, a chopper, a controller, a to-be-detected sample, a focusing module, a terahertz detector, a data collector and a measurement and control system. The terahertz complex-color light source system is used for generating complex-color terahertz light beams, the collimation system is used for generating parallel light, the long-wave-pass optical filter is used for filtering long-wave-band components in the light source, the terahertz tunable filter and the voltage supply module are used for converting the complex-color light beams into monochromatic light beams, and the chopper and the controller are used for reducing measurement noise. The focusing module, the terahertz detector and the data collector are used for measuring the intensity of terahertz light beams, and the measurement and control system is used for controlling the whole system. Compared with an existing common terahertz spectrometer, the novel terahertz spectrometer has the advantages of being low in cost, high in vertical coordinate measurement accuracy (about 0.5%), high in measurement speed (about second magnitude) and the like. The novel terahertz spectrometer can provide a new scheme for the terahertz spectrum measurement field, the new scheme and an existing terahertz spectrum measurement method can form an angle potential, and a better terahertz spectrum measurement selection can be provided for many application scenes; and meanwhile, a novel terahertz time-resolved spectrum technology, a novel terahertz spectrum pumping detection technology and a novel terahertz spectrum imaging technology are expected to be created.
Owner:HUBEI IND VOCATIONAL & TECH COLLEGE

A receiving antenna integrated with a low-impedance terahertz detector

The application discloses a receiving antenna integrated with a low-impedance terahertz detector, which comprises a low-impedance terahertz detector located at the center, one crab claw-shaped metal sheet on each side, crab claw connecting arm metal sheets located between the terahertz detector and the two crab claw-shaped metal sheets and serving as connecting arms, and the overall structure is symmetric about the center. The application realizes effective integration of the on-chip low-impedance antenna and the low-impedance terahertz detector, realizes different working modes in different frequency bands, works in a resonant mode in a low frequency band and works in a traveling wave mode in a high frequency band, and realizes different working bandwidths in different frequency bands, that is, narrowband in the low frequency band and wideband in the high frequency band.
Owner:NANTONG UNIV

Terahertz microcavity area array detector based on bias plasma

An existing terahertz detector is slow in response speed and narrow in response spectrum. The terahertz micro-cavity area array detector based on the bias plasma comprises a window and a photosensitive element, the photosensitive element comprises a first micro-cavity plate, a gas cavity layer and a second micro-cavity plate which are connected in sequence, the first micro-cavity plate is provided with a gas filling pipe, the gas filling pipe penetrates through the first micro-cavity plate, and the gas filling pipe is provided with a gas outlet. The gas filling pipe is communicated with the gas cavity layer, a discharge electrode is arranged on the second microcavity plate, the gas cavity layer is connected with a driving circuit through the discharge electrode, and the gas filling pipe is connected with a gas filling device. The terahertz detector has a spectral imaging function, adopts the principle that terahertz enters a gas cavity layer and the state of plasma changes, realizes detection of terahertz waves, can obtain information such as polarization and intensity of the terahertz waves, can solve the problems that an existing terahertz detector is low in response speed and narrow in response spectrum, is used for hidden target imaging, and has a wide application prospect.
Owner:西安应用光学研究所

A terahertz mueller matrix ellipsometer and a method of measuring a thin film sample

The application discloses a terahertz Mueller matrix ellipsometer and a measuring method for a thin film sample, and belongs to the technical field of ellipsometric measurement. The application discloses a terahertz Mueller matrix ellipsometer, the included angle between the polarizing support and the vertical direction is θ0 degrees, the terahertz emission source, the first collimating lens, the first hollow rotating motor and the first focusing lens are sequentially arranged on the polarizing support and gradually close to the sample placing table, the second collimating lens, the second hollow rotating motor, the second focusing lens and the terahertz detector are sequentially arranged on the detecting support and gradually far away from the sample placing table, the first wave plate and the second wave plate are single-frequency quarter-wave plates and are respectively fixedly arranged in the corresponding hollow rotating motor, the signal acquisition and processing system records the light intensity signals received by the terahertz detector under different angles, and the Mueller matrix of the measured thin film sample is obtained according to the multiple sets of light intensity signal data, and the thickness and the refractive index of the measured thin film sample are obtained through inversion.
Owner:HUAZHONG UNIV OF SCI & TECH