Patents

Literature

Patsnap Eureka AI that helps you search prior art, draft patents, and assess FTO risks, powered by patent and scientific literature data.

14 results about "Ellipsometry" patented technology

Filter

Efficacy Topic

Property

Owner

Technical Advancement

Application Domain

Technology Topic

Technology Field Word

Patent Country/Region

Patent Type

Patent Status

Application Year

Inventor

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry measures the change of polarization upon reflection or transmission and compares it to a model.