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148 results about "Micrograph" patented technology

A micrograph or photomicrograph is a photograph or digital image taken through a microscope or similar device to show a magnified image of an object. This is opposed to a macrograph or photomacrograph, an image which is also taken on a microscope but is only slightly magnified, usually less than 10 times. Micrography is the practice or art of using microscopes to make photographs.

Method for evaluating porosity of mud shale at objective layer segment

The invention relates to a method for evaluating the porosity of mud shale at an objective layer segment, and belongs to the technical field of exploration and development of petroleum, geology and mining industry. The method can be used for evaluating the total porosity, the organic porosity and the inorganic porosity of the mud shale at the objective layer segment in a shale gas well. The method comprises the following steps: (1) determining the mass of various ingredients in a mud shale sample skeleton in unit mass at each depth point of the objective layer segment and the density of each dried sample block body and calculating the total porosity of the mud shale in all the depth points via the combination of the actual density of various minerals; (2) calculating the organic porosity (Phi organic') formed by the hydrocarbon generation of the mud shale at the objective layer segment by utilizing chemical kinetics; (3) seeking a solution of the organic porosity (Phi organic) according to scanning electron micrographs of multiple argon ion polishing samples in the same depth point; (4) calibrating the organic porosity (Phi organic') calculated according to the chemical kinetics by utilizing the organic porosity (Phi organic); and (5) seeking a solution of the inorganic porosity by utilizing a difference value of the total porosity and the calibrated organic porosity.
Owner:CHINA UNIV OF PETROLEUM (EAST CHINA)

Automatic measurement method for separated-out particles in steel and morphology classification method thereof

The invention discloses an automatic measuring and morphological classification method for particles precipitated from steel, comprising the steps as follows: firstly, the electron micrographs of the target particles precipitated from steel are subjected to image binary segmentation so as to obtain the binary images of the particles; the binary images of the target particles are denoised by a morphological filtering method, a seed filling method is adopted to fill holes, and the particles to be separated are determined by the domain value determined by experience criterion and the separation of agglomerate particles is carried out; the particles after separation are subjected to region labeling; finally, the neural network morphological classification models of the target particles precipitated from steel are established; and results are displayed and output in the form of graph files. The method can obtain ideal measuring and classification effect without omission inspection and re-inspection; the measurement accuracy of particle size can reach plus or minus 2 microns, the particle size distribution anastomotic rate can be more than 91.7 percent, and the anastomotic rate of morphological classification can be more than 90.5 percent; the particle measuring and classification of one view field cost only a few minutes; and the method has excellent universality and can be used in all the particle measuring and classification works with complex backgrounds and morphologies in the material field and biological field.
Owner:JIANGSU UNIV

Minitype model for simulating oil reservoir and method for conducting petroleum displacement experiment by using minitype model

The invention discloses a minitype model for simulating an oil reservoir and a method for carrying out a petroleum displacement experiment by using the minitype model. A micrograph of a rock of the oil reservoir is processed to obtain an oil reservoir structure picture capable of being edited and copied, preparing a photomask or mould from the oil reservoir structure picture; reproducing the structure of the rock of the oil reservoir on the model through the photomask or mould, bonding, sealing, and preparing the minitype model capable of simulating the structure of the oil reservoir. By injecting different types of crude oil into the model, the condition of oil storage of the oil reservoir is simulated on a certain degree, different oil displacement agents are injected into the model to have the petroleum displacement experiment, the oil displacement effect is observed, and the rock core experiment based substitution of the traditional rock core is realized on a certain degree. The model used in the method accurately copies the structure of the oil reservoir, the processing process is simple, the manufacturing efficiency is high, the processing cost is low, the use level of the experiment agent is low, the experimental period is short, and the size of used equipment is small.
Owner:BEIJING UNIV OF CHEM TECH

Rapid cross section manufacture and sub-surface micro-crack detection method of single crystal semiconductor substrate

The invention relates to a rapid cross section manufacture and sub-surface micro-crack detection method of a single crystal semiconductor substrate. The method comprises the steps of cleaning the single crystal semiconductor substrate; processing one micro-groove or more micro-grooves on the single crystal semiconductor substrate along the direction of the same straight line of the surface to be detected; applying pressure onto the crack of the back(s) of the more micro-groove(s) of the single crystal semiconductor substrate, and enabling the single crystal semiconductor substrate to be broken into two along the direction(s) of the micro-groove(s) under the action of the force to complete sample preparation of the cross section of the single crystal semiconductor substrate; horizontally putting the detected cross section of the broken single crystal semiconductor substrate under an optical microscope and observing; moving the single crystal semiconductor substrate to enable the boundary between the surface to be detected and the detected cross section to appear in a visual area; adjusting the multiplying power of a lens of the optical microscope, and shooting the optical micrograph of a target area on the cross section; and measuring the maximum distance between the crack on the detected cross section and the boundary between the surface to be detected and the detected cross section to complete the sub-surface micro-crack detection work of the single crystal semiconductor substrate. The rapid cross section manufacture and sub-surface micro-crack detection method is feasible and dependable in detection result.
Owner:GUANGDONG UNIV OF TECH

Clay scanning electron micrograph segmentation method based on porosity

The invention provides a clay scanning electron micrograph segmentation method based on porosity. The clay scanning electron micrograph segmentation method comprises the following steps: adopting a conventional experimental method in soil mechanics to measure dry density of a clay sample and figuring out two thirds power of the dry density; preparing a microstructural sample of the clay sample in a laboratory; adopting a ZD-A3 freeze-dryer to freeze-drying the prepared sample, vacuumizing the sample, scanning the electron microscope when vacuum degree reaches 10-6Pa, observing a microstructure of the sample to obtain a scanning photograph; adopting image analysis software to extract binaryzation data corresponding to two thresholds; comparing parameter features of granule and porosity extracted under the two thresholds and figuring out area ratio of pore bodies; and stopping approaching when the area ratio equals to the two thirds power of the dry density and considering the threshold as picture segmentation threshold corresponding to the dry density. The beneficial effects of the clay scanning electron micrograph segmentation method provided by the invention are as follows: scientific change from three-dimensional parameters to two-dimensional parameters is realized, interference by man-made subjective factors is eliminated, and study for the microstructure of a soil body is more accurate.
Owner:TIANJIN URBAN CONSTR COLLEGE

Method for quantitatively evaluating orientation degree of short fiber reinforced composite fibers

The invention relates to a method for quantitatively evaluating orientation degree of short fiber reinforced composite fibers, which is characterized by selecting and determining a sectioning surface and sectioning a composite sample; acquiring a micrograph via an optical microscope or a scanning electron microscope; repainting the elliptic fiber section in the micrograph in graphic image software; extracting the lengths of long axis and short axis and an angle between the elliptic long axis and a coordinate axis in the repainted picture; calculating the direction vectors of the fibers corresponding to the ellipses according to the extracted parameters of the elliptic section; and calculating the parameters of the orientation degree of the composite along a specific direction. According to the method, the proper sectioning surface is selected so as to eliminate the calculation errors caused by condition that the same elliptic section corresponds to two fiber directions. In addition, a calculated mode given by the method considers the probability of sectioning the fibers, and the calculating result is more accurate in comparison with the calculated mode which does not consider the probability of sectioning the fibers.
Owner:NORTHWESTERN POLYTECHNICAL UNIV

Material for producing slab of semiconductor chip, preparation method and application thereof

The invention relates to a material for producing a slab of semiconductor chip, a preparation method and an application thereof. The material for producing the slab of semiconductor chip disclosed in the invention has s sandwich structure, wherein, a middle layer of the sandwich structure is composed of a semiconductor chip to be examined, layers at two sides of the sandwich structure are composed of Si substrate wafers, a binder used for binding inorganic nonmetallic materials is adopted to bind the middle layer and the layers at two sides of the sandwich structure. The invention further provides the preparation method for preparing the material for producing a slab of semiconductor chip, and the application of the material for producing a slab of semiconductor chip in producing the slab of semiconductor chip. The material for producing the slab of semiconductor chip prepared by the method disclosed in the invention has good observation effect of electron micrographs, and can be prepared without mold or resins. Because section area of grinding and polishing is small, the consumption of materials in grinding and polishing is reduced, the production time of a sample is short, the production cost of the sample is low, and wastes in the preparing process can be minimized.
Owner:PEKING UNIV FOUNDER GRP CO LTD +1
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