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298 results about "Phase-contrast imaging" patented technology

Phase-contrast imaging is a method of imaging that has a range of different applications. It exploits differences in the refractive index of different materials to differentiate between structures under analysis. In conventional light microscopy, phase contrast can be employed to distinguish between structures of similar transparency, and to examine crystals on the basis of their double refraction. This has uses in biological, medical and geological science. In X-ray tomography, the same physical principles can be used to increase image contrast by highlighting small details of differing refractive index within structures that are otherwise uniform. In transmission electron microscopy (TEM), phase contrast enables very high resolution (HR) imaging, making it possible to distinguish features a few Angstrom apart (at this point highest resolution is 60 pm).

System and method for phase-contrast imaging by use of X-ray gratings

ActiveCN101532969AReduce production difficulty requirementsLower application thresholdComputerised tomographsTomographyGratingRefractive index
The application relates to a system and a method for the phase-contrast imaging by use of X-ray gratings. The system comprises an X-ray device, a first absorption grating, a second absorption grating, a detection unit, a data processing unit and an imaging unit, wherein the X-ray device transmits an X-ray bundle to a detected object; the first and second absorption gratings are positioned in the direction of the X-ray bundle; the X-ray refracted by the detected object forms an X-ray signal with variable intensity through the first absorption grating and/or the second absorption grating; the detection unit receives and converts the X-ray with variable intensity into an electrical signal; the data processing unit processes and extracts refraction-angle information in the electrical signal, and utilizes the refraction-angle information to figure out pixel information; and the imaging unit constructs images of the object. In addition, the system and the method can also realize CT imaging by using a rotating structure to rotate the object so as to obtain refraction angles in a plurality of projection directions and the corresponding images, and use CT reconstruction algorithm to figureout refraction-index fault images of the detected object. According to the invention, the phase-contrast imaging of approximate decimeter-magnitude viewing fields under incoherent conditions can be realized by use of common X-ray machines or multi-seam collimator such as source gratings, as well as two absorption gratings.
Owner:NUCTECH CO LTD +1

Apparatus for phase-contrast imaging comprising a displaceable x-ray detector element and method

The present invention relates to X-ray image acquisition technology in general. Employing phase-contrast imaging for X-ray image acquisition may significantly enhance the quality and information content of images acquired. However, phase-contrast information may only be obtainable in a small detector region, possibly being too small for a sufficient field of rotation view for specialized X-ray imaging applications. Accordingly, an apparatus for phase-contrast imaging is provided that may allow the acquisition of an enlarged field of view. According to the present invention an apparatus (1) for phase-contrast imaging is provided, comprising an X-ray source (2), an X-ray detector (12) element having a detector size, a beam splitter grating (8) and an analyzer grating (10). An object (6) is arrangeable between the X-ray source (2) and the X-ray detector (12). The beam splitter grating (8) and the analyzer grating (10) are arrangeable between the X-ray source (2) and the X-ray detector (12). X-ray source (2), the beam splitter grating (8), the analyzer grating (10) and the X-ray detector (12) are operatively coupled such that a phase-contrast image of the object (6) is obtainable. The apparatus (1) is adapted for acquiring a phase-contrast image having a field of view larger than the detector size. The X-ray detector element (12) is displaceable and by the displacement of the X-ray detector (12) a phase-contrast image of the field of view is obtainable.
Owner:KONINKLIJKE PHILIPS ELECTRONICS NV
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