29 results about "Phase-contrast imaging" patented technology

The invention belongs to the technical field of optical imaging, and discloses a multifunctional image edge enhancement device based on spiral phase contrast imaging, which comprises a light source system, an optical imaging system and an edge enhancement detection system which are arranged in sequence, the light source system is used for generating collimated linear polarization laser; the optical imaging system comprises a first 4-f system and a round hole diaphragm which are sequentially arranged on a light path; a sample to be tested is arranged between the light source system and the first 4-f system; the edge enhancement detection system comprises a first lens, a vortex wave plate, a second lens and an imaging unit which are sequentially arranged on a light path; the first lens and the second lens form a second 4-f system; linearly polarized laser output by the light source system is transmitted by a to-be-detected sample, enters the first lens after passing through the first 4-f system and the round hole diaphragm, and then is imaged on the imaging unit after passing through the vortex wave plate and the second lens in sequence. According to the invention, edge enhancement can be realized, and the contrast and resolution of the image are improved.

To provide an X-ray phase imaging apparatus and an image processing method for improving contrast and visibility of an image photographed by a phase contrast method.SOLUTION: According to an aspect of the present invention, there is provided an X-ray phase imaging apparatus comprising an X-ray source, a detector configured to detect X-rays emitted from the X-ray source to a subject, and an image processing unit configured to generate an image of the subject, the image processing unit includes a storage unit in which a plurality of noise correction images for correcting a luminance variation between pixels are stored separately for brightness and darkness, and an image generation unit that generates a luminance image of the subject by irradiating the subject with X-rays, generates a plurality of corrected images of the subject by correcting the luminance image according to the noise correction image, and generates one subject image by selecting the plurality of corrected images according to a threshold value.SELECTED DRAWING: Figure 5

The invention provides an X-ray single projection imaging wood type intelligent identification method and system and a medium, and the method comprises the steps: carrying out the multi-time translation through an X-ray phase contrast imaging system, and obtaining single projection images of different positions of a wood sample, and taking the single projection images as an image data set; preprocessing the single projection image to obtain a preprocessed image data set; training a deep learning model by using the preprocessed image data set; the deep learning model is an improved OfficientNetV2 model, and the depth learning model is an improved EfficientNetV2 model; and obtaining a to-be-tested sample, shooting a single projection image, preprocessing the single projection image, and inputting the preprocessed image into the trained deep learning model for sample classification. According to the invention, based on phase contrast X-ray single projection imaging, through improving a deep learning network model, high-accuracy and high-efficiency intelligent identification of a wood sample is realized.

A quantitative phase contrast imaging system comprises a light source configured to generate light and to direct the light to a sample, wherein the light comprises nonlinearly polarized light; a first lens configured to receive light from the sample; a phase filter, wherein the first lens is configured to focus the light from the sample onto the phase filter, and the phase filter is configured to modulate multiple components of the nonlinearly polarized light simultaneously (e.g., geometric phase interferometry); a second lens configured to receive light from the phase filter; and a polarized camera, wherein the second lens is configured to collimate the light beam from the phase filter to the polarized camera and the polarized camera is configured to image the sample in response to the light from the phase filter. In absence of the second lens, the camera can be placed at the image plane.

The present disclosure provides example embodiments for automatically or semi-automatically classifying cells in microscopic images of biological samples. These embodiments include methods of selecting training sets for the development of a classifier model. The disclosed selection embodiments can allow for retraining of a classifier model using training examples that have undergone the same or similar culture conditions as a target sample. These selection embodiments can reduce the human effort required to specify the training examples. The disclosed embodiments also include classifying individual cells based on metrics determined for the cells using phase contrast imaging and out-of-focus brightfield imaging. These metrics can include size, shape, texture, and intensity-based metrics. These metrics are determined based on segmentation of the underlying imagery. In some embodiments, the segmentation is based on phase contrast imaging and / or out-of-focus brightfield imaging of the biological sample.

A system for analyzing biological components in a biological sample, wherein the system comprises a planar surface, and wherein the system is configured to perform a procedure comprising: (a) arranging a spatially connected biological sample adjacent to the planar surface, wherein: the spatially connected biological sample comprises a tissue sample, the tissue sample comprises a plurality of cells, the planar surface comprises glass, plastic, or a combination thereof, the planar surface further comprises a plurality of binding sites, the plurality of binding sites is arranged in a two-dimensional pattern on the planar surface, the planar surface comprises at least 10⁵ binding sites, each of the plurality of binding sites comprises a plurality of single-stranded oligonucleotides, and the plurality of single-stranded oligonucleotides is coupled to the planar surface.at least one subset of the plurality of single-stranded oligonucleotides comprises: (i) a binding sequence comprising a plurality of thymine bases configured to bind to poly-A sequences, (ii) a unique molecular identifier, (iii) a barcode associated with a position on the planar surface, and (iv) a sequencing primer, and each oligonucleotide of the subset of the plurality of single-stranded oligonucleotides comprises at least 50 nucleotides; (b) imaging at least a portion of the spatially linked biological sample, wherein the imaging comprises bright-field imaging, phase-contrast imaging, fluorescence imaging, or a combination thereof; (c) releasing nucleic acids from the spatially linked biological sample; and (d) capturing at least one subset of the nucleic acids on at least the subset of single-stranded oligonucleotides, thereby recovering the captured nucleic acids.the captured nucleic acids are immobilized on the flat surface.

This invention belongs to the field of micro / nano fabrication and optical testing technology, specifically relating to a high-resolution test card for dielectric materials in the EUV and soft X-ray bands. The test card includes a substrate and a Siemens star test pattern formed thereon. The test card uses silsesquioxane (HSQ) as the structural material and is fabricated using electron beam lithography. The structural height can reach 500 nm with a minimum linewidth of 10 nm. This invention utilizes the dual absorption and strong phase modulation capabilities of HSQ in the EUV / soft X-ray bands, making it suitable for both absorption contrast and phase contrast imaging modes in system resolution calibration and performance evaluation. This test card offers advantages such as standardized patterns, high resolution, adjustable contrast, and good fabrication consistency, providing crucial metrological support for the performance testing of high-end EUV / soft X-ray optical imaging and lithography systems.

This invention provides a method for charged particle beam (CPB) phase contrast imaging. [Solution] In a CPB system, the phase contrast image is obtained by directing a sample-modulated CPB to the phase plate so that it has a diffraction plane displaced from the phase plate. Based on the interference fringes of the image, the lateral displacement of the CPB relative to the phase plate can be estimated and adjusted.

According to the method, a programmable LED lamp is installed on a microscope condenser, a light source is adjusted to the height of a sample table, then four inclined illumination modes including the upper, the lower, the left and the right are switched, part of coherent light is obliquely incident to a sample, at the moment, emergent light waves carry amplitude and phase information of the sample, and the sample can be observed in a high-resolution non-destructive mode. The sample is collected by the high magnification objective lens, the corresponding intensity image is collected by the CCD camera, and the collected original image is subjected to deconvolution by using the differential phase contrast imaging principle to obtain the biological information such as the thickness and the dry mass of the sample. A programmable annular LED is adopted as an illumination light source to enhance the phase contrast of a low-frequency space and reduce noise interference, and the illumination light source forms an angle of 15 degrees with a sample platform and directly irradiates a sample to generate a uniform illumination light source. The submicron organelle can be dynamically observed in real time through the high numerical aperture objective lens, and organelle edge extraction and 3D form reconstruction are obtained by using a deconvolution reconstruction algorithm.

The present application belongs to the field of micro-nano processing and X-ray optical testing technology, and particularly relates to a high-resolution test card in hard X-ray band and a preparation method thereof. The test card adopts electron beam lithography combined with proximity effect correction technology to prepare an HSQ template pattern, forms a Siemens star structure with a minimum line width of 10 nm and a height of 500 nm, and then covers a metal working layer on the template surface through atomic layer deposition technology. The HSQ template pattern has a duty cycle less than 1, effectively improving the aspect ratio of the pattern. The covering of the metal working layer doubles the line density of the final pattern. The present application breaks through the resolution limit of the traditional test card, solves the problem of preparation of high-aspect-ratio nano structures, and has simple and reliable process, and is suitable for resolution calibration of absorption contrast and phase contrast imaging systems in hard X-ray band, thereby providing key technical support for performance evaluation of high-end X-ray optical systems.

The invention relates to the technical field of microscopic detection, in particular to a microscopic imaging system with bright field imaging and phase difference imaging, which comprises an imaging module, a bright field imaging illumination module, a focusing module, a phase difference imaging illumination light source module and a control module. The problems that in the prior art, the switching time is long, the definition degree of images is prone to being affected in the switching process, the target form of bright field image and phase difference image shooting is changed, and result contrastive analysis is not facilitated are solved.

The present invention discloses an oblique phase contrast imaging device for an inverted biological microscope, belonging to the field of optical microscopic imaging technology. The device comprises an oblique phase contrast imaging plate disposed below the condenser of the inverted biological microscope, and an oblique phase contrast light source disposed on a frame support surface below the stage of the inverted biological microscope. The light beam emitted by the oblique phase contrast light source is emitted onto the oblique phase contrast imaging plate via a wave plate on the stage of the inverted biological microscope. The present invention solves the problem of poor performance and complex operation when observing brightfield fluorescence using an inverted biological microscope.

The invention relates to an automobile power battery shell micropore nondestructive testing method based on synchrotron radiation X-ray phase imaging, and relates to the technical field of photoelectric detection / image recognition / nondestructive testing. The method comprises the following steps: constructing a uniform irradiation field and acquiring data; phase inversion and electron cloud density reconstruction; feature fusion and abnormal region identification; performing defect classification and risk assessment; and performing parameter feedback and system optimization. According to the automobile power battery shell micro-pore nondestructive testing method based on synchrotron radiation X-ray phase imaging, phase change caused by electron cloud density disturbance is imaged by utilizing high coherence of synchrotron radiation X-rays and a phase contrast imaging principle; the sensitivity to the internal microstructure of the low-atomic-number material is several orders of magnitude higher than that of absorption imaging, micropores which cannot be seen by a traditional method can be clearly recognized, and the detection sensitivity is improved.

A mask for use in a speckle-based x-ray or neutron phase contrast imaging system and methods of making the mask are disclosed. The mask may either absorb or change the phase of the incident x-ray or neutron beam. The mask in various embodiments has consistent statistics across the mask, is locally unique (thereby avoiding ambiguous correlations), has a speckle size on the order of the imaging system's resolution, has a speckle pattern that is visible through the sample being imaged, and / or is matched to the energy level of the imaging system and the sample density. These mask attributes are controlled by the method and materials used in the fabrication of the mask. Various embodiments use a pseudo-random binary array for generating the required speckle pattern.

The invention provides an X-ray single projection imaging seed intelligent classification method and system and a medium, and the method comprises the steps: obtaining projection images of different seed samples at different angles through an X-ray phase contrast imaging system, and taking the projection images as an image data set; pre-processing the projection image to obtain a pre-processed image data set; training a deep learning model by using the preprocessed image data set; the deep learning model adopts an Inception-ResNet-V2 network architecture, and the depth learning model adopts a depth learning model; and obtaining a sample to be tested, shooting a single projection image at any angle, preprocessing the single projection image, and inputting the preprocessed image into the trained deep learning model for classifying the seed sample. According to the method, through collaborative innovation of non-destructive and efficient phase contrast X-ray single projection imaging and deep learning, the internal texture of the seeds is obtained, and accurate classification of the seeds can be losslessly and efficiently achieved only through a single X-ray projection image.

Real-space optical signal processing is provided by optical angular filters that act on amplitude and / or phase of zero order light passing through a resonant diffractive optical device. One application is to phase contrast microscopy, where the diffractive optical device can be configured to have an amplitude and phase response suitable for phase contrast microscopy. For example, 60% or more intensity attenuation of the zero order light, combined with a phase shift of the zero order light by + / −90 degrees.

The phase contrast imaging simulation method comprises the steps that a light source, an imaged object, an object plane and an image plane are sequentially arranged in a simulation environment in the photon emission direction, and the object plane is divided into a plurality of object plane sub-areas; the interaction between the photons and the imaged object in the process of penetrating through the imaged object is simulated; for each object plane sub-region in the plurality of object plane sub-regions, determining the energy and phase distribution of a wave surface corresponding to the object plane sub-region based on the energy and phase of all photons penetrating through the imaged object to reach the object plane sub-region; based on the energy and phase distribution of each wave surface corresponding to each object plane sub-region, determining the energy distribution of all wave surfaces reaching the image plane; and generating a simulated image of the imaged object based on the energy distribution from the wave surfaces corresponding to the plurality of object plane sub-regions to the image plane. According to the invention, while phase contrast imaging is accurately simulated, time and computing resources required by simulation operation can be reduced.

This invention discloses an aberration correction and quantitative phase imaging method based on a physically driven neural field. The method constructs a physical forward model for differential phase-contrast imaging under partially coherent illumination conditions and implicitly represents the sample's complex transmission function and optical aberrations using a neural field. By jointly optimizing sample information and optical aberrations through a differentiable operator, it achieves an inversion solution from intensity information to the sample's phase distribution. This method overcomes the limitations of weak object approximation, achieving self-calibration of optical aberrations and high-precision phase recovery without additional calibration data or acquisition overhead. It is suitable for quantitative phase imaging of biological samples or micro / nanostructured samples.

A debugging method for a grating phase contrast imaging system based on an X-ray array target light source comprises: placing a laser emitting mechanism on a guide rail so that the laser emitting mechanism emits a vertical beam and a horizontal beam; placing the X-ray array target light source and an X-ray detector on the guide rail; aligning the center of a light spot formed by the X-rays with a target position of the X-ray detector; adjusting an analyzing grating so that the intersection of the vertical beam and the horizontal beam passes through the center of a first diffraction fringe; adjusting a beam splitting grating so that the intersection of the vertical beam and the horizontal beam passes through the center of a second diffraction fringe; adjusting the relative positions of the X-ray array target light source, the beam splitting grating, the analyzing grating and the X-ray detector to obtain moiré patterns; synchronously rotating and adjusting the beam splitting grating and the analyzing grating to make the moiré patterns vertical; individually adjusting the beam splitting grating and the analyzing grating to maximize the visibility of the moiré patterns, and moving the beam splitting grating along the optical axis to obtain a roughly uniformly distributed light field on the X-ray detector.

A method (100) for manufacturing a microstructure for selective transmission of electromagnetic radiation comprises the steps of: a) irradiating (110) one or more regions of a substrate (14) according to a predefined geometry of the microstructure with a first laser radiation (12) to cause a structural modification of a material in the irradiated one or more regions, the one or more regions are irradiated such that once the substrate is subjected to etching, the etching occurs at a higher rate at the one or more regions that are irradiated than at regions that are not irradiated; b) performing (120) the etching to form a plurality of first openings (16) in the substrate having the predefined geometry of the microstructures; c) filling (130) the first opening (16) with at least one radiation opaque material (18) having a desired radiation attenuation spectrum to form a radiation absorbing diaphragm wall structure of the microstructure; and d) irradiating (140) one or more non-irradiated regions according to the predefined geometry of the microstructure with a second laser radiation, and performing an etching to form a plurality of second openings (20) between the plurality of first openings, where the second openings (20) are not filled with any radiation opaque material, and where the second openings (20) are not filled with any radiation opaque material. Thereby the second opening is radiation transparent. The proposed method can cope with increased requirements for mass, area uniformity, robustness and / or cost reduction, which is required to achieve new medical imaging methods (e.g., spectral X-ray imaging and phase contrast imaging).

In general, the technology disclosed herein relates object inspection utilizing radiation imaging, more specifically, edge illumination phase contrast X-ray imaging. The apparatus and methods described in the present disclosure can be applied for inspection of various objects in different industrial settings, such as manufacturing, food, agriculture, aerospace, automotive, electronics, healthcare, transport, logistics, security, and others. An aspect of the present invention relates to a mask assembly for radiation phase contrast imaging apparatus, comprising a first mask comprising a plurality of X-ray absorbing element and apertures arranged in a manner that gradually diverges from one portion to an opposite portion of the body, resulting in a variable pitch perpendicular to the optical axis direction; and a mask alignment mechanism configured to adjust a position and / or orientation of the first mask to align the variable pitch of the first mask for phase contrast imaging.

A system for analyzing biological components in a biological sample, wherein the system comprises a planar surface, and wherein the system is configured to perform a procedure comprising: (a) arranging a spatially connected biological sample adjacent to the planar surface, wherein: the spatially connected biological sample comprises a tissue sample, the tissue sample comprises a plurality of cells, the planar surface comprises glass, plastic, or a combination thereof, the planar surface further comprises a plurality of binding sites, the plurality of binding sites is arranged in a two-dimensional pattern on the planar surface, one of the numerous binding sites has a dimension of about 1 micrometer to about 20 micrometers, each of the numerous binding sites comprises a plurality of single-stranded oligonucleotides, and the plurality of single-stranded oligonucleotides is coupled to the planar surface.wherein at least one subset of the plurality of single-stranded oligonucleotides comprises: (i) a binding sequence comprising a plurality of thymine bases configured to bind to poly-A sequences, (ii) a unique molecular identifier, (iii) a barcode associated with a position on the planar surface, and (iv) a sequencing primer, and each oligonucleotide of the subset of the plurality of single-stranded oligonucleotides comprises at least 50 nucleotides; (b) imaging at least a portion of the spatially linked biological sample, wherein the imaging comprises bright-field imaging, phase-contrast imaging, fluorescence imaging, or a combination thereof; (c) releasing nucleic acids from the spatially linked biological sample; and (d) capturing at least one subset of the nucleic acids on at least the subset of single-stranded oligonucleotides, thereby recovering the captured nucleic acids.the captured nucleic acids are immobilized on the flat surface.

The present disclosure is directed to an inspection system for registration metrology and defect detection using darkfield and phase contrast imaging optical systems. The present system includes a transmitted light mode and diffracted light mode to enable imaging of low contrast features on blank EUV masks and semiconductor wafers. In an aspect, this system combines the optics for darkfield and phase contrast imaging, and may also include the optics for brightfield imaging, to provide analyzed data on registration errors and surface defects.

Provided is an in-situ testing apparatus for a material mechanical behavior under neutron and X-ray fusion imaging, belonging to that technical field of material mechanical behavior testing. The in-situ testing apparatus includes a mechanical loading test module, a positioning support module, a variable temperature loading module, an X-ray phase contrast imaging module, and a neutron imaging module. The imaging sensitivity is high by adopting X-ray phase contrast imaging. A moving base can drive spatial positions of modules such as a test cassette and a neutron imaging module. A neutron receiver and a neutron upstream emitter can be matched to the same axis, thus solving the problem that the neutron imaging module and the X-ray imaging are difficult to be integrated into one system.

The application discloses a differential interference phase contrast imaging system and method and a time-difference incubator equipment, and belongs to the technical field of optical imaging and medical instruments. The system comprises an illumination light source module, a microscopic imaging module, a polarization interference module and a quantitative phase image reconstruction module. The polarizer, the polarization beam splitter and other polarization interference components are all arranged on the image side of the microscopic imaging module, so that the imaging light beam does not need to pass through the plastic culture dish before passing through the polarization element, thereby completely avoiding the interference of the plastic birefringence on the imaging, and realizing high-quality observation on the samples in the fields of cell biology or material science in the plastic culture dish. Meanwhile, the system synchronously acquires multiple phase shift interference images by single exposure of the polarization camera, and combines the quantitative phase reconstruction algorithm to realize high-speed and high-precision quantitative phase imaging, and overcome the defects of slow speed and easy motion artifacts of the traditional mechanical phase shift method. In addition, the imaging system can be integrated in the time-difference incubator.

The application discloses an imaging system based on uniform light oblique irradiation, wherein a light generation module is used to form parallel light with uniform light energy distribution from light emitted by a light source and to make the parallel light obliquely irradiate a sample; an imaging module comprises a lens assembly and a light wave modulation element, the lens assembly collects light transmitted through the sample and performs imaging based on the light transmitted through the sample, and the light wave modulation element is used to make a zero-order light or / and diffracted light transmitted through the sample and entering the lens assembly generate an intensity change amount and a phase change amount, and the zero-order light and the diffracted light entering the lens assembly interfere after transmitting through the light wave modulation element, so that imaging of the sample is realized. The application generates the parallel light with uniform light energy distribution through the light generation module, and makes the parallel light obliquely irradiate the sample, compared with the existing phase contrast imaging method, and can weaken the halo phenomenon.

The application provides a kind of middle infrared real-time imaging system, including visible-near infrared light source, frequency doubler, first light splitting component, middle infrared illumination light generating component, first optical delay line, vortex beam generator, first light parametric amplifier, first imaging component, second imaging component and CCD camera.The first light parametric amplifier uses strong femtosecond vortex pulse laser as pump light, and converts middle infrared signal light of middle infrared wave band carrying object information into visible light for detection and recording with high gain.The strong femtosecond vortex pulse laser as pump light provides high optical gain and large spatial frequency bandwidth in imaging, the high gain provides conditions for realizing extremely high sensitivity of photon order, and the large spatial frequency bandwidth ensures micron-level spatial resolution.In addition, vortex pump light realizes vortex phase contrast imaging, further improving image contrast.