678 results about "Micro imaging" patented technology

The invention belongs to the technical field of optical precision measurement, and particularly relates to a wafer defect detection system based on dual-channel optical imaging. According to the invention, dark field scattering and diffraction phase microscopy are combined as two optical imaging channels; optical paths of the two imaging modes are compatible and synchronized; through optical system calibration and optimization, high-precision acquisition and alignment of multi-modal images are realized; calibrating the sensitivity and resolution of the system by using a standard sample to ensure that the detection performance meets a preset requirement; carrying out dual-channel synchronous imaging on the wafer sample to be detected, and respectively obtaining a dark field scattering image and a diffraction phase image; carrying out conjoint analysis on the multi-modal data through an image algorithm, extracting size, depth and structure information of defects, and generating a high-precision defect detection report; the system specifically comprises a dark field scattering imaging module, a diffraction phase microscopic imaging module and an image processing unit. According to the invention, the defect of a single imaging mode can be effectively overcome, and the detection precision and robustness of the system are remarkably improved.

The invention relates to the field of microscopic imaging, and discloses a miniature microscopic system optical precision improvement and image calibration error optimization method, which comprises the following steps: establishing an optical distortion model and a mechanical disturbance model, and respectively describing a static error and a dynamic error; constructing a joint dynamic error model, and uniformly expressing a coupling relationship between optical distortion and mechanical disturbance; decoupling and separating the joint error through a space-time separation method to obtain a static error component and a dynamic error component; performing iterative optimization on the optical distortion parameter and the mechanical disturbance parameter based on an optimization algorithm to minimize a system calibration error; a real-time sensor is utilized to obtain dynamic disturbance data, and real-time dynamic compensation is performed on an image calibration error in combination with an optimization result, so that a high-precision calibration result is obtained. The method can effectively improve the calibration precision of the microscopic system in a dynamic environment, remarkably improves the imaging quality of the system, and has a wide application prospect.

The invention relates to the technical field of optics, and discloses a microscopic imaging system. The system comprises a light source module used for generating a laser beam; the radio frequency drive generation module is used for generating radio frequency drive signals with various frequencies; the heterodyne interference light path module is used for respectively performing optical heterodyne interference processing on the laser beams according to the radio frequency driving signals with various frequencies, respectively forming a light spot array and a reference light source and then combining the light spots and the reference light source, and generating combined light beams to be incident on a sample to be detected; wherein different light spots in the light spot array correspond to different light frequencies; the spectral data receiving module is used for collecting light data generated after the combined light beam is reflected by the to-be-detected sample; wherein the to-be-detected sample is subjected to fluorescence labeling in advance; and the image inversion module is used for receiving the optical data and carrying out image inversion processing on the optical data to generate imaging data of the sample to be detected. According to the scheme, the microscopic imaging response speed is increased, the efficiency is high, and the accuracy is good.

The invention discloses a method for improving the axial resolution of photoacoustic microscopic imaging obtained based on a single-pixel frequency domain. The method comprises the following steps: 1) creating a Fourier substrate pattern with the spatial frequency of k in the axial direction; 2) respectively irradiating four Fourier substrate patterns with the spatial frequency of k and the initial phases of # imgabs0 #, # imgabs1 #, # imgabs2 # and # imgabs3 # to an imaging object, carrying out photoacoustic microscopic imaging, and acquiring data by using an ultrasonic transducer to obtain a response value of the ultrasonic transducer; 3) according to the obtained response value of the ultrasonic transducer, adopting a four-step phase shift method to obtain a Fourier coefficient corresponding to the spatial frequency k; and 4) gradually increasing the spatial frequency of the Fourier substrate pattern to the cut-off frequency of the objective lens, further obtaining Fourier coefficients corresponding to all spatial frequencies, obtaining a complete Fourier spectrum, and performing inverse Fourier transform to obtain a photoacoustic microscopic image after the axial resolution is increased. The method disclosed by the invention is expected to promote wider application of photoacoustic microscopic imaging in living cell and tissue imaging.

The invention discloses an all-optical three-dimensional scanning confocal fluorescent microscopic imaging device and an implementation method thereof. According to the invention, through a deep learning driven adaptive regulation and control method, CNN is adopted to process spatial distribution data and dynamically regulate and control a phase hologram and the light intensity and phase compensation of a laser, so that the focal point of exciting light is subjected to aberration-free axial displacement, a bidirectional parallel optical scanning track of a two-dimensional scanning system is optimized, and all-optical three-dimensional scanning is realized; lSTM and TCN are combined to obtain a time sequence dependency relationship, a laser light source, an adjustable diaphragm, an electric focus-adjustable lens and a photoelectric detector are integrally controlled, efficient synchronization and automatic operation and high-speed axial focusing adjustment are realized, errors and time sequence mismatch are eliminated, optical characteristics of different samples and environmental interference are automatically adapted, and high-quality imaging is kept. The robustness and the applicable scene range of the system are improved; the method is used for model biological embryo real-time tracking, intracellular signal molecule dynamic visualization, cell membrane protein migration and aggregation observation and intracellular organelle interaction tracking.

The invention discloses a multi-mode nonlinear optical microscopic imaging device and system, and the device achieves the two-photon and three-photon excitation imaging of a sample through an integrated light source module, a dispersion compensation module, a scanning light path module, a fluorescence obtaining module, a synchronous control module and a signal processing module. Fluorescence intensity imaging and fluorescence lifetime imaging can be supported at the same time; wherein the scanning light path module is driven by the random mask to realize sparse scanning, so that scanning point locations are effectively reduced, and the exciting light dosage is reduced; the synchronous control module performs time window screening and processing on the fluorescence signal based on the pulse synchronous signal and the position code, so that the signal acquisition efficiency is improved; the signal processing module adopts an FPGA (Field Programmable Gate Array) to carry out real-time image reconstruction and life calculation, so that the imaging speed and quality are ensured; and the master control PC can also perform high-fidelity reconstruction on the sparse sampling image through a deep learning model, so that high-speed, low-light-dose and high-resolution nonlinear fluorescence intensity and life imaging is realized.

The invention relates to the technical field of peanut plant growth state intelligent monitoring, in particular to a peanut plant growth state intelligent monitoring method and system and electronic equipment. The method comprises the following steps: respectively acquiring visible light and near-infrared images, laser radar point cloud data, near-infrared spectra and microscopic images of peanut plants by using a multispectral camera, a laser radar, a near-infrared camera and a microscopic imager carried by a field robot; carrying out de-atomization and color correction on the image by adopting a self-adaptive illumination compensation algorithm; a laser radar point cloud is fused to construct a plant three-dimensional point cloud model; segmenting an overlapped leaf area based on a graph neural network, and extracting morphological characteristics of a single plant; the nitrogen content and the moisture content of the leaves are analyzed through near infrared spectroscopy, and early scabs are recognized in combination with microscopic imaging; and inputting the morphological characteristics and the physiological parameters into a growth state evaluation model, and outputting growth indexes and disease and pest early warning. According to the invention, automatic and refined monitoring and growth state comprehensive evaluation of peanut plant morphology and physiological parameters are realized.

A brain organoid containing optic vesicles generated based on H9 induction and an eye-brain fusion culture method thereof are provided. H9 embryonic stem cell induction is used to generate a brain organoid containing optic vesicles with primitive visual field. Based on an established optic vesicle brain organoid culture system, microscopic imaging is combined with specific marker antibodies related to early retinal development and photoreceptor cell maturation to structurally and functionally identify the brain organoid containing optic vesicles.

The utility model discloses a scanning lens light spot shift microscopic imaging system, which comprises a laser beam combining module, a microscopic imaging module and a spectrum detection analysis module, a laser generates two lasers with the same wavelength, the two lasers are combined through the laser beam combining module, the position of a certain laser focusing sample is changed through a scanning lens, and the light spot shift of the scanning lens is detected through the spectrum detection analysis module. And through the microscopic imaging module and the spectrum detection and analysis module, excitation spectrum detection is simultaneously carried out on different area positions of the sample by two lasers with the same wavelength, and the transmission efficiency of the optical waveguide is observed. According to the utility model, the scanning lens is adopted to realize large-range movement of a laser focusing spot in a sample area, and dual-wavelength common excitation acts on different areas of a sample so as to detect an excitation spectrum and test the optical waveguide transmission efficiency of the sample.

The invention discloses a carrier three-dimensional diffusion microscopic imaging system based on two-photon excitation, and belongs to the technical field of microscopic imaging. The light is transmitted according to the light transmission sequence; the device is composed of a wavelength-adjustable femtosecond optical device, a full-automatic optical parameter amplifier, a first achromatic lens, a pinhole, a second achromatic lens, a first diaphragm, a first fully-polished reflector, a two-dimensional galvanometer, a scanning lens, a sleeve lens, a dichroscope, an objective lens, a piezoelectric displacement sample table, a focused white light source, a second diaphragm, a beam splitter, a third achromatic lens and a second diaphragm. The device is composed of a first achromatic lens, a second achromatic lens, a third achromatic lens, a fourth achromatic lens, a camera and a detector, and the MAPbI3 or MAPbBr3 crystal is placed on a high-precision piezoelectric displacement sample table as a semiconductor sample. The position of the excitation light beam on the surface of the sample is continuously changed by rotating the galvanometer, and the fluorescence emitted from the same position on the surface of the sample can be detected by using the detector, so that the three-dimensional diffusion process information of closure elements in the sample under the action of the excitation light beam is obtained, and the diffusion rule of the sample is revealed.

The utility model discloses a shooting device for fiber component analysis. The shooting device comprises a supporting base, an X-axis and Y-axis moving table, a Z-axis driving assembly, a carrying plate connected to the X-axis and Y-axis moving table and a microscopic imaging assembly connected to the Z-axis driving assembly and located above the carrying plate. A slide is arranged on the loading plate, and a first light source capable of irradiating to the slide is arranged in the microscopic imaging assembly. Wherein a first groove is formed in the upper surface of the carrying plate, a through light guide hole is formed in the first groove, and the slide covers the first groove; the lower surface of the carrying plate is connected with the XY-axis moving table through a connecting block, a second groove is formed in the position, corresponding to the light guide hole, of the connecting block, and a second light source is arranged in the second groove; a double-sided mirror is assembled at the bottom of the first groove and covers the light guide hole. According to the shooting device, the definition of the fiber sample image can be improved, the stereoscopic impression of the fiber sample image is also improved, and the loss of detail structures in the fiber sample image is also reduced.

A deep learning-based super-resolution fluorescence lifetime imaging microscopy (SR-FLIM) method includes the steps of: S1, performing fluorescence microscopic imaging on a sample to obtain confocal intensity images and stimulated emission depletion (STED) intensity images at a same location; S2, co-registering the acquired confocal and STED intensity images; S3, pairing the co-registered confocal and STED intensity images as input (Input) and ground truth (GT) to assemble a dataset; S4, partitioning the dataset into training and validation sets following a predefined ratio; and S5, constructing a network, and selecting hyperparameters and an optimizer. This method may achieve SR-FLIM within a conventional confocal FLIM system, surpassing spatial resolution limitations of FLIM, breaking through resolution barriers of conventional optical microscopy, while preserving normal fluorescence lifetime characteristics of fluorescent probes.

The invention discloses a step refractive index fiber endoscopic bending microscopic imaging loss recovery method and device. The method comprises the following steps: s1, searching and removing an image loss part in a step refractive index fiber endoscope scanning image; s2, image restoration: carrying out feature matching on the two displacement pictures processed in the step s1 to calculate x-direction and y-direction displacements of the two images, and then aligning and fusing the two images in a Poisson fusion mode to repair image loss parts; and s3, background denoising: estimating transmissivity by calculating a dark channel and a background illumination value, and denoising the image according to the transmissivity to obtain a denoised image. According to the method, through frequency domain low-pass filtering and feature matching fusion, lost image center information is successfully recovered, image center details are effectively recovered, and image recovery can be realized through processing of an imaged image.

The invention discloses a confocal polarization microscopic imaging device and method based on a functional small hole, and belongs to the technical field of optical microscopic imaging. In the device, an illumination module is used for providing laser in a fixed polarization state; the sample scanning module is used for placing different areas of the to-be-tested sample at the laser focus according to the designed S-shaped moving route; the scattered light collection module is used for collecting scattered light of the to-be-detected sample The functional pinhole module is used for focusing scattered light of the sample to be detected and projecting the scattered light to four spatially separated focuses with different polarization directions in a polarization manner; the light intensity detection module is used for collecting focus light spots polarized and focused by the functional small hole module and calculating intensity to draw a scanning graph. According to the device and the method, the full Stokes parameter metasurface is used as a functional small hole of a confocal imaging system for polarization imaging, and the device and the method have the characteristics of high imaging resolution, high polarization sensitivity, compact structure, good compatibility and the like.

The invention provides a super-resolution fluorescence microscopic imaging method and product based on deep learning, and the method comprises the steps: carrying out the feature extraction and image reconstruction of an actual fluorescence microscopic image based on a trained super-resolution fluorescence microscopic imaging model, and obtaining a super-resolution fluorescence microscopic image result; wherein the super-resolution fluorescence microscopic imaging model is constructed on the basis of an encoder-decoder architecture fused with a residual network, a channel attention mechanism and a self-attention module, and the trained super-resolution fluorescence microscopic imaging model is obtained through pre-training-fine tuning dual-stage training. According to the invention, based on the encoder-decoder architecture, the residual network, the channel attention mechanism and the self-attention module construction are fused, and the pre-training and fine-tuning dual-stage training strategy is combined, so that the cross-modal super-resolution migration capability under the single-sample condition is realized, the bottleneck that the traditional deep learning depends on a large amount of data repeated training is broken through, and the super-resolution migration capability is improved. When different imaging samples and systems are replaced for super-resolution reconstruction, resource consumption can be remarkably reduced.

The invention relates to a short-wave infrared microscopic imaging lens for an optical transfer function measuring instrument, and relates to the technical field of optical testing. The short-wave infrared microscopic imaging lens comprises a first positive lens, a first negative lens, a second positive lens, a second negative lens, a third positive lens and a third negative lens which are sequentially arranged along a light path propagation direction, an aperture diaphragm is arranged on the incident plane of the first positive lens; the first positive lens and the first negative lens are glued through a first lens gluing surface to form a first lens, the second positive lens and the second negative lens are glued through a second lens gluing surface to form a second lens, and the third positive lens and the third negative lens are glued through a third lens gluing surface to form a third lens. According to the short-wave infrared microscopic imaging lens for the optical transfer function measuring instrument, the imaging performance of short-wave microscopic imaging is excellent; tolerance capacity is loose, and processing and adjustment are easy; the method is high in testing efficiency, low in cost and suitable for practical application.

The invention presents a lensless Fourier ptychographic diffraction tomography microscopy imaging method based on wavelength scanning. The technique uses only a wavelength-tunable light source for illumination on a lensless microscope experimental system to collect a series of coaxial holograms. Then, the three-dimensional scattering potential spectrum is filled using an iterative Fourier ptychographic method to restore the three-dimensional refractive index distribution of the sample directly. The present invention does not require complex modifications to traditional lensless on-chip microscopes. It can endow lensless on-chip microscopes with the ability of pixel super-resolution three-dimensional tomographic imaging.

The invention discloses a signal enhancement system and method based on passive high-frequency opto-acoustic / ultrasonic microscopic imaging. The system comprises a laser excitation module, an ultrasonic excitation detection module and a signal processing control module. According to the invention, the required target laser is excited through the laser excitation module, so that a good light source condition is provided for microscopic imaging; the method comprises the following steps: under ultrasonic microscopic imaging, exciting high-frequency ultrasonic waves through an opto-acoustic transducer, and gathering and enhancing the ultrasonic waves in an acoustic wave transmission space of the opto-acoustic transducer and a sample to be detected by utilizing an energy gathering device; under photoacoustic microscopic imaging, ultrasonic waves are excited on a detected sample by means of laser, and the laser and sound waves are reflected, focused and enhanced by an energy concentrator, so that the sensitivity and the signal-to-noise ratio of microscopic imaging are improved, and the detection efficiency of microscopic imaging is improved; and the signal processing control module controls the three-dimensional mobile platform to scan the tested sample through the controller to realize the integrity of ultrasonic signal acquisition of the tested sample, so that an ultrasonic image of the tested sample is generated.

The invention provides a linear optical tweezer astigmatism field regulation and control method based on an optical transmission matrix. The design method comprises the following steps: establishing a 4 * 4 optical matrix for generating a linear optical tweezer astigmatism field and a transmission equation; analyzing the regulation and control rule of the parameters of the optical element on the astigmatism characteristics; collecting a fluorescence slice image of the initial astigmatic light field through an axial tomography scanning method; reconstructing the spatial distribution of the initial image light field; judging whether the light field accords with a preset astigmatism characteristic or not, if not, determining the astigmatism characteristic to be optimized, and adjusting element parameters according to a regulation and control rule; and acquiring the adjusted image of the astigmatism light field again, reconstructing the image, and continuously performing judgment iteration until the image accords with the preset astigmatism characteristic, thereby realizing regulation and control of the astigmatism light field. Matrix optics is used in optimization of a linear optical tweezer image dispersion light field optical system, the limitation of traditional trial and error design is avoided, the method can be applied to the fields of light control technology, light sheet fluorescence microscopic imaging and the like, and the performance of the optical system is improved.

The invention discloses a scanning structured light microscopic imaging method and system, and the method comprises the steps: generating a vortex structured light field with spiral phase distribution according to the three-dimensional morphology characteristics of a target sample, synchronously collecting a reflection signal and a fluorescence signal, and obtaining a multi-mode excitation light field data set; performing multi-modal signal fusion processing according to the multi-modal excitation light field data set to generate a multi-dimensional fusion feature map; and according to the multi-dimensional fusion feature map, performing three-dimensional image reconstruction processing by adopting a physical model constrained compressed sensing reconstruction algorithm and combining prior topological information of the sample, and inhibiting motion artifacts and optical diffraction noise through a dynamic sparse base optimization technology to obtain an artifact-inhibited high-resolution microscopic image. According to the embodiment of the invention, motion artifacts and optical diffraction noise can be effectively inhibited, and high-resolution microscopic images can be obtained.

The invention relates to an ultrafast electron microscopic imaging device and an imaging method thereof, in particular to a multi-mode multi-dimensional ultrafast electron microscopic imaging device and an imaging method thereof, and solves the problem that the existing electron microscopic imaging technical scheme is difficult to simultaneously meet the measurement requirements of high time-space-energy-momentum resolution and material diversification. The device comprises a sample cabin, an electron gun, a laser generation module, a secondary electron detector, an STEM detector, an in-cabin plug-in detection assembly, a plug-in camera and an energy filtering electron microscope assembly which are arranged below the sample cabin, and a vacuum system, a hollow sample table is arranged in the sample cabin, and at least two ultrafast pumping laser introduction windows are arranged on the cabin wall of the sample cabin; an ultrafast detection laser introduction window is arranged on the electronic gun shell; the secondary electron detector is arranged obliquely above the sample table; the STEM detector is arranged on the side cabin wall of the sample cabin and is positioned below the sample table; and the in-cabin plug-in detection assembly is arranged below the STEM detector.

The invention discloses a burning metal particle three-dimensional surface panoramic microscopic imaging measurement method. The method comprises the following steps: collecting a dynamic panoramic microscopic image of burning metal particles; the collected panoramic microscopic image is preprocessed, the combustion metal particles are cut out independently from the panoramic microscopic image, and a binary image of the combustion metal particles and a binary image of surface oxides of the combustion metal particles are obtained; modeling combustion metal particles by using a long ellipsoid geometric model to obtain a mapping relation between the three-dimensional surface of the combustion metal particles and the two-dimensional information of the collected panoramic microscopic image; and calculating the three-dimensional surface areas of the combustion metal particles and the surface oxides thereof according to the binary image of the combustion metal particles, the binary image of the surface oxides thereof and the mapping relation. According to the measurement method, the three-dimensional surface reconstruction of the combustion metal particles can be realized, the areas of the combustion metal particles and oxides thereof can be quantitatively obtained, and the dynamic process of oxide fragments on the surfaces of the combustion metal particles can be visualized.

The invention relates to the technical field of laser control, in particular to a laser compatible control system based on an STM32 microcontroller platform, which comprises a core control unit, a digital signal processing module, an analog signal processing module and a heat dissipation management module. The core control unit adopts an STM32 series microcontroller and interacts with all the modules through an SPI bus, the digital signal processing module adopts a shift register cascade architecture, the analog signal processing module shares the SPI bus through a plurality of digital-to-analog conversion chips, and the heat dissipation management module achieves temperature collection, fan driving and rotating speed feedback. The system supports RS232, RS485 and differential signal communication, and is adapted to various lasers. According to the invention, IO resource occupation can be reduced, data transmission efficiency and response speed can be improved, accurate temperature control and intelligent speed regulation can be realized, system compatibility can be enhanced, and complex industrial scene requirements of multi-wavelength microscopic imaging and the like can be satisfied.

The invention discloses a microscopic imaging barrel lens and an imaging system. The microscopic imaging barrel lens specifically comprises a first balsaming lens and a second balsaming lens which are arranged along a main optical axis from an entrance pupil to an image plane; the first balsaming lens has positive focal power, and the second balsaming lens has negative focal power; the optical interval between the first balsaming lens and the second balsaming lens is 0.1 mm to 1 mm; the focal length of the first bonding lens is f1, the focal length of the second bonding lens is f2, and f2 / f1 is larger than or equal to 6 and smaller than or equal to 8. The two groups of bonding lenses are adopted, and the focal power types, the optical interval and the focal length proportion range of the two groups of bonding lenses are set, so that the Petzval sum of the whole barrel lens structure approaches to zero, the field curvature is reduced, the propagation path of light entering the barrel lens is effectively improved, and distortion is reduced. And meanwhile, only two groups of bonding lenses are arranged, so that the efficiency of the barrel lens is improved, and the processing and assembling difficulty of the barrel lens is reduced.

The invention discloses a coaxial laser confocal processing and measurement integrated system and an in-situ morphology measurement method thereof, and belongs to the technical field of ultrafast laser precision processing and in-situ measurement. The system comprises a laser confocal morphology measurement module, an ultrafast laser scanning processing module, a CCD (Charge Coupled Device) microscopic imaging module, a beam splitter prism, a low-pass dichroscope, a long-working-distance achromatic laser processing objective lens and a combined three-axis precision displacement table, the laser confocal morphology measurement module generates a measurement light beam to realize morphology measurement of a sample; the ultrafast laser scanning processing module generates a processing light beam to scan and process the surface of the sample; the CCD microscopic imaging module generates an illumination light beam to realize illumination of a processing position and acquisition of image information of a sample surface; a measurement light beam, a processing light beam and an illumination light beam form coaxial light beams through a low-pass dichroscope, the coaxial light beams are focused at the same position of the surface of a sample through a long-working-distance achromatic laser processing objective lens, and the coaxial in-situ measurement condition is achieved.

The invention discloses a spore microscopic imaging automatic focusing method and system based on a target recognition algorithm, and the method comprises the steps: analyzing the image focusing effect of spore images collected under different object distances in the process of changing the object distance of a microscope, and determining the optimal positive focus object distance based on the object distance corresponding to the spore image with the optimal image focusing effect; the image focusing effect is cooperatively determined based on the number of spores which can be recognized by using a target recognition algorithm in the image and a focusing evaluation value obtained by analyzing the image by using a focusing evaluation function; the image focusing effects of different images are preferentially determined according to the number of the spores which can be recognized; and when the number of the spores is consistent and the image focusing effect difference cannot be determined, further determining the image focusing effects of different images based on the focusing evaluation values of the images. According to the method, the problem of focal plane misjudgment caused by complicated background interference of micro-particle impurities such as pollen and dust in a spore microscopic image is solved.

The invention discloses a rapid high-resolution laser differential confocal Raman-LIBS (laser-induced breakdown spectroscopy) spectral microscopic imaging method and device, which are used for solving the problems of low multispectral focus matching efficiency, limited spatial resolution and the like in the prior art. The method comprises the following steps: establishing a height-position mapping model through a linear sensing interval of a differential confocal axial strength curve, calculating focus offset in real time in a spectrum scanning stage, and driving a sample table to carry out closed-loop fixed-focus compensation; and a Bessel beam modulation technology is combined to compress an excitation light spot to a submicron transverse size and expand the focal depth, so that the spatial resolution and the signal intensity are synchronously improved. The device adopts a common-path structure to integrate a light beam modulation system, a differential confocal detection system, a Raman spectrum detection system, an LIBS spectrum detection system and the like, realizes rapid and high-spatial-resolution imaging of geometrical morphology, Raman molecular information and LIBS elemental components, and is widely applicable to the fields of chemical analysis, biomedical detection, material research, trace substance detection and the like.

The invention provides a Faraday sheet performance measurement and polarization imaging system and method, and relates to the technical field of optical testing. The system comprises a light source system, an optical research platform, a polarizer, a first analyzer, a microscopic imaging system and an image acquisition system, the light source system is used for emitting laser; the optical research platform is used for arranging a to-be-measured Faraday sheet and generating a magnetic field; the microscopic imaging system comprises an eyepiece and an objective lens, and the image acquisition system comprises an image acquisition mechanism; in the first propagation direction of the laser, the light source system, the polarizer, the Faraday piece to be measured, the objective lens, the first polarization analyzer, the eyepiece and the image acquisition mechanism are sequentially arranged. According to the Faraday piece performance measurement and polarized light imaging system, the laser polarization state is accurately controlled, the polarization direction change is accurately detected, and the amplification and focusing functions of a microscopic imaging system are combined, so that the accuracy and comprehensiveness of the performance test of the Faraday piece adopting a magneto-optical film are improved, and the test cost is reduced.

The invention discloses a metal internal characteristic selective extraction method, which comprises the following steps of: (1) scanning a block-shaped metal sample by adopting high-resolution X-ray CT (Computed Tomography), reconstructing characteristics including defect distribution, microstructure, holes and cracks in metal through a three-dimensional reconstruction algorithm, and generating a high-precision three-dimensional model; (2) selecting a required area, calculating voxel resolution according to the distance SDD between a radiation source and a detector and the distance SOD between a sample and the radiation source, displaying a reconstructed three-dimensional image in three-dimensional visual analysis software, and performing threshold segmentation through a computer vision algorithm, and automatically identifying and extracting required features for observation; the whole sample is placed in a square frame in an externally tangent form, and a Cartesian rectangular coordinate system is established. According to the invention, after the internal structure is observed by using the X-ray microscopic imaging technology, an interested area is selected for extraction by using linear cutting according to the three-dimensional structure information, and the internal defect of the sample can be efficiently and accurately positioned and extracted.

The invention provides a synchrotron radiation scanning imaging system which comprises a first support, a second support and a third support, a through hole is formed in the first support so that X-rays input from the outside can penetrate through the through hole, and the first support is provided with a diffraction assembly, a first lens and a second lens, the diffraction assembly is installed on the first support and used for diffracting the X-rays and focusing the X-rays to obtain X-ray focusing light spots; the sample assembly is used for bearing samples; the laser interference assembly is used for emitting emission laser and receiving reflection laser, calculating an optical path difference generated by vibration between the emission laser and the reflection laser, and converting the optical path difference into a first electric signal; the controller is connected with the laser interference assembly and the sample assembly, and the controller is used for controlling the sample assembly to move based on the first electric signal, so that the X-ray focusing light spot is aligned with the sample for radiation, and an X-ray radiation signal is obtained; and the detection assembly is used for performing laminated coherent diffraction imaging or scanning transmission X-ray microscopic imaging on the sample through the X-ray radiation signal.