246 results about "Microscope imaging" patented technology

The invention discloses a cell image segmentation method, and relates to the technical field of cell analysis, and the method comprises the following steps: S1, image acquisition; s2, processing optical artifacts generated by imaging of the phase contrast microscope; s3, processing interference of impurities and debris in the cell image; in the method, a phase contrast microscope and an optical coherence tomography microscope are combined to obtain a cell image, three-dimensional structure information of an OCT image is utilized to assist in correcting artifacts generated by imaging of the phase contrast microscope, and the artifacts are processed based on phase recovery and filtering and texture feature matching and repairing. According to the method, the interference of impurities and debris is removed by applying a diffusion and repair method based on a partial differential equation and a machine learning classification and reconstruction method, so that the cell image quality is effectively improved, the interference of artifacts and impurities on subsequent analysis is reduced, and a reliable image data basis is provided for cell image segmentation and cell morphology analysis.

The invention relates to the technical field of femtosecond laser, and discloses a multifunctional ophthalmology femtosecond device and a use method, and the device comprises a scanning imaging module which is used for emitting a detection light beam and carrying out OCT imaging; the femtosecond laser scanning module is used for receiving the detection light beam and irradiating the detection light beam to the target tissue; the femtosecond laser scanning module is also used for generating femtosecond laser and focusing the femtosecond laser to the target tissue; the operating microscope module is used for receiving the detection light beam and irradiating the detection light beam to a target tissue; the operating microscope module is also used for carrying out microscope imaging. According to the method, the optical coherence tomography technology is fused, more imaging information is added on the basis of an original visible light image, the re-alignment precision can be effectively improved, and the problem that a separation hook enters a wrong corneal lens layer is avoided.

The invention belongs to the technical field of medical instruments, particularly relates to a microscope imaging device for an ophthalmologic operation, and aims to overcome the defects that in the prior art, when an operation is carried out on a patient, an eye operation area of the patient cannot be marked, and when the operation is carried out on the patient, eyelids of the patient are inconvenient to open. A vertical electric guide rail is installed on the base, a transverse electric guide rail is installed on the vertical electric guide rail, an arc-shaped electric guide rail is installed on the transverse electric guide rail, and an installation rod is fixedly installed on the arc-shaped electric guide rail. According to the eyelid distraction device, eyelids of a patient can be conveniently distraction, meanwhile, eyeball affected parts of the patient can be marked, so that when the patient is subjected to an operation, the accuracy of the operation can be effectively improved, and good convenience can be provided for a doctor.

The invention relates to the technical field of biomedical engineering, and discloses a hyperspectral microscope combined HE staining section identification method, which comprises a data acquisition module, a data analysis module, an abnormal data processing module, a data management module and a control module, the data analysis module calculates an automatic dyeing control index Q1, a microscope imaging stability coefficient S1 and an image quality evaluation score G1, and the abnormal data processing module identifies dyeing abnormal data in an automatic dyeing process and abnormal data in a microscope imaging process according to calculated numerical values and judges whether the final imaging quality reaches the standard or not; the data management module carries out data correction and fault diagnosis on dyeing abnormal data in the automatic dyeing process and abnormal data in the microscope imaging process according to the abnormal data automatically recognized by the abnormal data processing module and sends corrected parameters and fault diagnosis information to the control module at the same time, and the control module issues a repair instruction.

The present disclosure relates generally to an autonomous cell imaging and modeling platform, and more specifically to machine-learning techniques for using microscopy imaging data to continuously study live biological cells. The autonomous cell imaging and modeling platform can be applied to evaluate various cellular processes, such as cellular differentiation, optimization of cell culture (e.g., in-plate cytometry), disease modeling, histopathology imaging, and genetic and chemical screening, using a dynamic universal imaging system. In some embodiments, the platform comprises a set of label-free computational imaging techniques, self-supervised learning models, and robotic devices configured in an autonomous imaging system to study positional and morphological characteristics in particular cellular substructures of a cell culture in an efficient and non-destructive manner over time.

A weak light signal data acquisition system for a laser confocal eyelid microscope comprises a photoelectric signal conversion amplification module, a data acquisition module, an upper computer program module and a signal modulation processing module. The photoelectric signal conversion and amplification module captures weak light signals with the wavelength of 200-900 nm through a high-sensitivity photoelectric detector, converts the weak light signals into electric signals and then amplifies the electric signals through a cross-group amplifier, so that the integrity and stability of the signals are ensured. The signal modulation circuit further improves the signal-to-noise ratio through an operational amplifier and an RC filter network, and eliminates the noise of a high-frequency system through the design of a wave trap. The data acquisition module acquires voltage signals, and the upper computer program module controls the data acquisition process in real time through graphical programming. And the signal modulation processing module filters, fits and arranges the digital signals, and optimizes the imaging quality. According to the system design, the definition and accuracy of laser confocal microscope imaging are effectively improved, and the requirement of ophthalmology medical high-precision imaging is met.

The utility model relates to the technical field of microscopes, in particular to confocal microscope imaging equipment, which comprises a base and a confocal microscope body arranged on the upper surface of the base, a mounting plate is fixedly arranged on the side surface of the base, and a protection mechanism for protecting the confocal microscope body is arranged on the side surface of the mounting plate; the protection mechanism comprises a transparent protection cover slidably arranged on the side face of the mounting plate, a rectangular groove is formed in the side face of the mounting plate, and threaded columns are rotationally arranged on the inner top wall and the inner bottom wall of the rectangular groove. According to the confocal microscope imaging equipment, through the arrangement of the protection mechanism, after the confocal microscope body of the confocal microscope imaging equipment is used, the transparent protection cover can be driven to move downwards through the rotation of the driving motor, so that the confocal microscope body is effectively protected; therefore, the defect that the used confocal scanning microscope cannot be effectively protected in the prior art is effectively overcome.

The invention discloses an intelligent quantitative detection method based on a neural network algorithm and related equipment. The method comprises the following steps: acquiring a tumor immunohistochemical staining image through a microscope imaging system; extracting key feature information in the tumor immunohistochemical staining image through a target neural network analysis model, wherein the key feature information comprises at least one of form, color and distribution information of positive cells; and the model automatically identifies and classifies the positive cells according to the marked training data, calculates the number and the distribution condition of the cells according to a preset rule, and generates an interpretation report. The method can solve the problem that a traditional interpretation method requires a pathologist to carefully observe a staining section under a microscope, evaluate staining quality, positive signal distribution and morphological characteristics, and count and classify the staining quality, the positive signal distribution and the morphological characteristics. And the process is long in time consumption and is easily influenced by factors such as experience of doctors, fatigue degree and visual field selection, so that the interpretation result is subjective and inconsistent.

The invention relates to an edge enhancement imaging system. The system comprises a point light source; the object side polarization filtering unit is arranged on the light emitting side of the point light source and modulates the light into specific polarized light to irradiate a sample; the imaging unit is arranged on the light emitting side of the object side polarization filtering unit and is used for transmitting the input light field to an imaging surface; the spatial variable polarization modulation element is arranged on a conjugate surface of the point light source relative to the imaging unit and is used for performing spatial variable polarization modulation to obtain a modulated light field; and the image space polarization filtering unit is arranged between the space variable polarization modulation element and the imaging surface and is used for screening the modulated light field to obtain a light field in a specific polarization direction, and the light field in the specific polarization direction forms an edge enhanced imaging light field on the imaging surface. The invention also relates to a preparation method of the edge enhancement imaging system. The device has the advantages that the imaging effect of edge enhancement in any direction or all directions is achieved, a common microscope imaging system can be compatible, phase modulation is achieved through polarization state transformation, and sensitivity to wavelength is reduced.

The invention discloses a method for generating an enhanced image of a bright-field microscope, and the method comprises the steps: simulating an optical imaging model of optical Zernike phase contrast microscope imaging through a computer system based on the optical imaging principle of a conventional optical Zernike phase contrast microscope; extra hardware such as an annular diaphragm and an annular phase plate does not need to be added in an illumination light path and an imaging light path of the bright-field microscope, enhancement of the phase contrast of a bright-field digital microscopic image is achieved, energy loss of an illumination optical system is avoided, and the design and manufacturing cost of the microscopic optical system is greatly reduced; the optical Zernike phase contrast microscope can be universally used for different bright field microscopes, halo artifacts caused by interference effects in a traditional optical Zernike phase contrast microscope do not exist, finer structural features in biological cells can be distinguished, the resolution of the optical Zernike phase contrast microscope can be close to the resolution limit of objective lens design, and the technical requirements for users are greatly reduced.

A system and method for generating a three-dimensional image of a sample. The system comprises a platform configured to support the sample, a laser source configured to output a laser beam to remove material from the sample, a microscope imaging system, and a controller communicatively coupled to the laser source and the microscope imaging system. The controller is configured to (a) acquire height data of a surface of the sample with the microscope imaging system, (b) generate a mask based on the height data of the surface of the sample, the mask providing a laser cutting pattern for the sample, (c) acquire an image and a height map of the surface of the sample with the microscope imaging system, (d) activate the laser source to generate a laser beam to delayer the sample based on the mask, and repeat steps (a)-(d) to generate a three-dimensional image of the sample.

SOLUTION: An apparatus includes a microscopy imaging module, a curved light sheet lighting module, and a sample scanning module. The curved light sheet lighting module generates a curvature-adjustable curved light sheet and operates in conjunction with a wide-field microscopy imaging apparatus having a field curvature, thereby enabling the entire imaging field to be maintained in focus. By integrating with the sample scanning module, high-throughput microscopy imaging of a centimeter-scale transparent sample is achieved without the need for field-of-view stitching.EFFECT: An apparatus and method are useful for solving the technical problems associated with existing light sheet microscopy technology, which suffers from low throughput and requires field-of-view stitching when imaging a centimeter-scale transparent sample. They also contribute to addressing a field curvature issue in microscope objective lens design, thereby enabling reduced design complexity and production cost for a high-throughput objective lens.SELECTED DRAWING: Figure 1

The invention discloses a method for performing three-dimensional positioning by using a light field microscope, which belongs to the field of light field microscope imaging, and comprises the following steps of: S1, performing light field imaging of an object by using the light field microscope, calibrating an observed original light field image and decoding the original light field image into a biplane parameterized four-dimensional format, therefore, a real polar plane image, namely a real EPI, is formed; s2, wave light forward direction models of spherical volumes located at different depths are used for simulating a set of light fields, a depth perception dictionary is constructed, and each atom is a synthetic polar plane image related to the specific depth, namely a synthetic EPI; s3, implementing three-dimensional positioning by executing a convolutional sparse coding model based on a depth perception dictionary and a dry friction inertial near-end gradient algorithm (IPGDF) on the observed polar plane image; according to the invention, the positioning precision and the positioning speed of three-dimensional positioning under the light field microscope are improved.

The present invention relates to a coherent scanning interferometer surface reconstruction method based on the three-dimensional transfer function of the instrument, wherein the device includes an illumination system, an interference microscopic imaging system and an objective lens scanning system; the method includes the following steps: (1) obtaining a three-dimensional interference signal of the coherent scanning interferometer; (2) performing a three-dimensional Fourier transform on the signal to obtain a three-dimensional spectrum of the interference signal; (3) dividing the three-dimensional spectrum by the three-dimensional transfer function of the system to obtain the spectrum of the surface film model; (4) performing a three-dimensional Fourier inverse transform on the spectrum of the surface film model to obtain a reconstructed surface film model; (5) calculating the surface height by the position and phase of the reconstructed surface film model. The present invention utilizes the three-dimensional imaging theory of the coherent scanning interferometer to restore the surface film model of the surface to be measured in three-dimensional space and obtain the surface height, thereby achieving a microscopic surface morphology reconstruction capability with higher precision than traditional methods.

The invention provides an immunofluorescence detection method and system for dynamically detecting mouse uterus structure development based on multiple time points, and immunofluorescence staining comprises the steps of sheet unfolding, dewaxing, repairing, cell membrane punching, sealing, primary antibody treatment and secondary antibody treatment. The system comprises a sample pretreatment control module, a multi-channel confocal microscope imaging module and a data analysis module integrating fluorescence intensity calculation, Pearson co-localization analysis and a Western blot data integration algorithm. Through a multi-time-point and multi-index immunofluorescence detection method, dynamic and systematic data support is provided for mouse uterus development mechanism research, and an application basis is provided for fundamental research of reproductive biology and construction of related disease models.

The application provides a differential-based white light lensless single-frame weakly conjugate reconstruction method, which can realize weakly conjugate image reduction and improve single-frame imaging resolution in a white light lensless imaging system without using additional elements and complex algorithms. The method comprises the following steps: step one, obtaining spectral distribution information of a system light source by using a spectrometer and performing differential processing to obtain a reconstruction wavelength; step two, performing preprocessing on a collected single-frame image by using a hologram average value reduction method; step three, generating light intensity diagrams of different defocusing surfaces by using an angular spectrum propagation formula, and determining a defocusing distance range based on a definition discrimination factor; and step four, calculating differential distribution on different focal planes in the distance range obtained in step three based on numerical differentiation, and obtaining a final result by selection. The application can reduce the requirement of spectral width of a traditional lensless microscope, effectively reduce the cost of the system, improve the imaging resolution of the white light lensless microscope, and reduce the weakly conjugate image in the case of single-frame image collection.

Methods and systems for correcting intensity variations in a raw image acquired via a microscope imaging system are provided. In one example, a method comprises acquiring a reference image and developing an intensity model based on the reference image, wherein the intensity model comprises a predetermined number of a plurality of model parameters obtained by curve fitting of a single analytical function or a linear combination of a plurality of analytical functions; embedding model parameters of the intensity model of the reference image into the raw image for subsequent image processing; and correcting the raw image on demand based on the intensity model of the reference image.In another example, a method involves using the multitude of parameters of the intensity model as a hardware signature to indicate whether a multitude of parameters of the optical system is maintained.

To provide a technique of the above charged particle beam apparatus, a technique that can prevent the lowering of apparatus performance due to the influence of vibration and noise by an air blower (fan). The charged particle beam apparatus includes a body device that is provided in a body cover, a plurality of air blowers that are provided on the body cover, and a controller that controls the plurality of air blowers. The body device has a stage on which a sample is placed, and a microscope that images the sample. The controller obtains an image obtained by imaging the sample by the microscope, obtains vibration information from the image, compares the vibration information and a specification value, and on the basis of the result of the comparison, controls the numbers of rotations of the plurality of air blowers. The controller decreases the number of rotations of at least one first air blower among the plurality of air blowers, and increases the number of rotations of at least one different second air blower among the plurality of air blowers.

This invention discloses a method for correcting image distortion in a miniature microscope based on optical simulation and displacement field driving, comprising the following steps: establishing an optical model of the miniature microscope, performing field curvature analysis, and generating a grid distortion map; extracting distortion data from sampling points and converting coordinate values ​​to pixel units according to the pixel size of the CMOS sensor; constructing a continuous displacement field covering the entire image using an interpolation algorithm based on the discrete sampling point data; performing geometric correction on the distorted image based on the displacement field, specifically including: correcting the original distorted image to a geometrically correct image based on the displacement field, employing an inverse mapping strategy, for each pixel position in the corrected image, querying its corresponding position in the original distorted image, and resampling; and evaluating and visualizing the correction results. This invention improves the accuracy of image distortion correction and enhances the imaging quality of the miniature microscope.

The application provides an adaptive atomic force microscope (AFM) imaging method based on block compressed sensing, and comprises the following steps: step S1: a plurality of sub-blocks with the same size are divided on the surface of an AFM sample by using an overlapping block mode; step S2: each sub-block is pre-scanned, a row direction is taken as a fast scanning direction, a lower left corner is taken as a starting point of pre-scanning, and a pre-scanning sampling rate is calculated; step S3: a BP neural network is used to train a sample database, a relationship between a characteristic parameter and a required minimum sampling rate is obtained, and a suitable total sampling rate of each sub-block is adaptively obtained; step S4: a required number of sampling points are randomly selected on the surface of a current sub-block, and adaptive scanning is performed by using a continuous random scanning mode; and step S5: after all sampling points of a sub-block are collected, TVAL3 reconstruction algorithm is combined to perform reconstruction, and finally, all reconstructed sub-blocks are combined together; and the block effect is eliminated by using the overlapping block mode, so that each sample can obtain high and uniform imaging quality.

The present invention relates to a method for correcting a spherochromatic aberration that occurs when examining a sample with a microscope. The microscope comprises an objective lens and a corrective device arranged in a beam path of the microscope for correcting a spherical aberration. According to the method, data for describing the spherical aberration as a function of a wavelength of light imaged by the microscope are provided. A sample is examined with the microscope, and at least one spectral range of the light imaged by the microscope is determined.A control parameter of the correction device is determined based on the provided data describing the spherical aberration as a function of wavelength for the at least one determined spectral range, in order to minimize the spherical aberration for the at least one determined spectral range. The correction device is then set to the determined control parameter. The invention further relates to a microscope, which is in particular a light microscope.

A method for generating an image (100) for a microscope, comprises receiving (102) a first image (210) and receiving (104) a second image (220). The method further comprises generating (106) a processed second image (240, 214) based on the second image (220) and generating the image (204) using the first image (210) and the processed second image (240, 214).

The present invention provides a high-spectral fluorescence lifetime imaging system and method based on a streak camera, which solves the problems of slow acquisition speed, low spectral resolution, or data acquisition time in the order of minutes or even hours, and limited number of spectral resolution channels in the existing spectral fluorescence lifetime imaging technology. The system includes a pulse light source module, a pulse light coupling module, a pulse light encoding module, a coding pattern coupling module, a beam splitter, a microscope and a signal processing unit and a synchronization control module arranged on two output light paths of the beam splitter; the pulse light generated by the pulse light source module is imaged on the sample surface through the pulse light coupling module, the pulse light encoding module, the coding pattern coupling module, the beam splitter, and the microscope, and the fluorescence signal generated by the sample after excitation enters the signal processing unit through the microscope and the beam splitter; the signal processing unit includes a signal focusing module, a spectral light splitting module, a streak camera and a data processing module arranged in sequence on the output light path of the beam splitter.

An embodiment of the present specification provides an electron microscope imaging method, the method comprising: placing a sample holder carrying at least two samples at an imaging position of the electron microscope, the at least two samples comprising a first sample and at least one second sample; adjusting imaging parameters of the electron microscope based on the first sample; and performing imaging operations on the at least one second sample based on the imaging parameters.

A visual bright field microscopic imaging device of a light source array comprises an object carrying platform; the light source assembly comprises an annular light source and a light leakage plate, the annular light source is arranged on a first light leakage hole of the light leakage plate, and the light leakage plate is located on the object carrying platform; the four first light leakage holes are arranged relative to the side face of the object to be imaged. The four light source reflection assemblies are located between the light leakage plate and an object to be imaged on the object carrying platform. The light source reflection assembly comprises a light source reflection box body with a reflection surface, and the reflection surface has a first preset angle and a second preset angle relative to the first light leakage holes and an object to be imaged, so that light emitted by the annular light source sequentially passes through each first light leakage hole and the corresponding reflection surface to be reflected to the corresponding side surface of the object to be imaged; the camera assembly comprises a camera and a microscope lens, and the camera, the microscope lens and the annular light source are coaxially connected. The four side faces of a cubic object to be imaged can be evenly illuminated and imaged at the same time, and the requirement for multi-face imaging integrity is met.

The invention discloses a microscope imaging definition detection method based on threshold selection, and relates to the technical field of computer vision and image recognition. Comprising the following steps: S1, synchronizing field areas and magnification times of an electronic eyepiece and an optical eyepiece; s2, constructing a discrete coding space of an acquisition condition in an electronic eyepiece image acquisition process; s3, synchronous observation and definition detection of the electronic eyepiece and the optical eyepiece based on the discretized coding space parameter condition; and S4, a variable distribution sample microscope imaging definition judgment method of the time sequence image. According to the invention, definition detection errors caused by field-of-view difference between the electronic eyepiece and the optical eyepiece are reduced; image definition evaluation can be conveniently carried out on different microscopic sample images under the same condition, and a reference quantitative basis is provided for definition judgment of microscopic images under different quantitative conditions; and an overall evaluation strategy based on clustering is given for the condition that the definition is not uniformly distributed in the microscopic image region.

The invention relates to the technical field of microscopes, in particular to a light processing device, a fluorescent wide-field microscope, an imaging method, a medium and equipment, the light processing device comprises a first polarization beam splitter used for splitting incident light into first polarized light and second polarized light, the polarization directions of the first polarized light and the second polarized light are perpendicular to each other, the first polarized light enters a first light path, and the second polarized light enters a second light path; the second polarized light enters a second light path different from the first light path; the grating is positioned on the first light path, so that the first polarized light is modulated into structured light after passing through the grating; the second polarization beam splitter is used for combining the first polarized light modulated by the grating and the second polarized light not modulated by the grating to an emergent light path; and the polarized light selection assembly is positioned on the emergent light path and is used for selectively allowing the first polarized light or the second polarized light to pass through.

The application provides a kind of primary neuron cell golgi staining method and application based on lipid, comprising the following steps: 1) extracting, culturing and fixing primary neuron cell;2) selecting one kind of lipid in phosphatidylcholine, phosphatidylethanolamine, sphingomyelin, cholesterol, lecithin;3) the selected lipid is evenly covered on the cell surface, and Golgi staining solution is added for staining;4) remove Golgi staining solution, and use reducing agent for developing reaction;5) optical microscope imaging observation and / or simultaneous radiation X-ray imaging observation;6) the imaging data is analyzed and processed using data processing software.The application successfully stains primary neuron cell, and under the simultaneous radiation X-ray imaging technology, neuron dendrite and morphology can be observed, which lays a good research foundation for using simultaneous radiation X-ray to quantitatively study neuron complete three-dimensional structure and complete three-dimensional fine structure of neuron.

The present application relates to the field of microscope imaging processing technology, and specifically to a two-photon microscope and related microscopic imaging method, the method comprising: obtaining tomographic images taken by a twin microscope at various focal lengths; obtaining the plane frequency of each pixel in the tomographic image according to the local grayscale change of the tomographic image; obtaining the high-frequency interpolation weight between corresponding pixels in adjacent tomographic images according to the local grayscale change of the image composed of pixels in the same row and column in all tomographic images; obtaining the interpolation control weight to weight the grayscale value of each pixel according to the spatial distribution characteristics and high-frequency interpolation weight of all edge pixels in two adjacent tomographic images, and obtaining an interpolation image between two adjacent tomographic images; obtaining the microscopic imaging result of the twin microscope according to all tomographic images and interpolation images. The present application can improve the imaging quality of a two-photon microscope.

The invention belongs to the technical field of numerical control machine tool detection, and particularly relates to a numerical control machine tool spindle surface defect laser detection device and method. According to the numerical control machine tool spindle surface defect laser detection device, after the laser beams emitted by the laser device pass through the beam expander, parallel laser beams with large diameters are obtained, the laser beams are incident to the surface of the numerical control machine tool electric spindle through the first total reflection reflector, and then the propagation direction is changed through the second total reflection reflector; then a camera is adopted to shoot a numerical control machine tool motorized spindle surface picture imaged by the microscope, and a computer is adopted to record the surface state of the numerical control machine tool motorized spindle in a normal working state, so that the health state monitoring of the surface of the numerical control machine tool motorized spindle is realized. The laser detection method is adopted to carry out rapid, real-time, dynamic and high-precision monitoring on the health state of the surface of the electric spindle of the numerical control machine tool, and the method has the advantages of non-contact, visualization and high spatial resolution.