178 results about "Microscope imaging" patented technology

The invention discloses a cell image segmentation method, and relates to the technical field of cell analysis, and the method comprises the following steps: S1, image acquisition; s2, processing optical artifacts generated by imaging of the phase contrast microscope; s3, processing interference of impurities and debris in the cell image; in the method, a phase contrast microscope and an optical coherence tomography microscope are combined to obtain a cell image, three-dimensional structure information of an OCT image is utilized to assist in correcting artifacts generated by imaging of the phase contrast microscope, and the artifacts are processed based on phase recovery and filtering and texture feature matching and repairing. According to the method, the interference of impurities and debris is removed by applying a diffusion and repair method based on a partial differential equation and a machine learning classification and reconstruction method, so that the cell image quality is effectively improved, the interference of artifacts and impurities on subsequent analysis is reduced, and a reliable image data basis is provided for cell image segmentation and cell morphology analysis.

The invention relates to the technical field of femtosecond laser, and discloses a multifunctional ophthalmology femtosecond device and a use method, and the device comprises a scanning imaging module which is used for emitting a detection light beam and carrying out OCT imaging; the femtosecond laser scanning module is used for receiving the detection light beam and irradiating the detection light beam to the target tissue; the femtosecond laser scanning module is also used for generating femtosecond laser and focusing the femtosecond laser to the target tissue; the operating microscope module is used for receiving the detection light beam and irradiating the detection light beam to a target tissue; the operating microscope module is also used for carrying out microscope imaging. According to the method, the optical coherence tomography technology is fused, more imaging information is added on the basis of an original visible light image, the re-alignment precision can be effectively improved, and the problem that a separation hook enters a wrong corneal lens layer is avoided.

The invention belongs to the technical field of medical instruments, particularly relates to a microscope imaging device for an ophthalmologic operation, and aims to overcome the defects that in the prior art, when an operation is carried out on a patient, an eye operation area of the patient cannot be marked, and when the operation is carried out on the patient, eyelids of the patient are inconvenient to open. A vertical electric guide rail is installed on the base, a transverse electric guide rail is installed on the vertical electric guide rail, an arc-shaped electric guide rail is installed on the transverse electric guide rail, and an installation rod is fixedly installed on the arc-shaped electric guide rail. According to the eyelid distraction device, eyelids of a patient can be conveniently distraction, meanwhile, eyeball affected parts of the patient can be marked, so that when the patient is subjected to an operation, the accuracy of the operation can be effectively improved, and good convenience can be provided for a doctor.

A weak light signal data acquisition system for a laser confocal eyelid microscope comprises a photoelectric signal conversion amplification module, a data acquisition module, an upper computer program module and a signal modulation processing module. The photoelectric signal conversion and amplification module captures weak light signals with the wavelength of 200-900 nm through a high-sensitivity photoelectric detector, converts the weak light signals into electric signals and then amplifies the electric signals through a cross-group amplifier, so that the integrity and stability of the signals are ensured. The signal modulation circuit further improves the signal-to-noise ratio through an operational amplifier and an RC filter network, and eliminates the noise of a high-frequency system through the design of a wave trap. The data acquisition module acquires voltage signals, and the upper computer program module controls the data acquisition process in real time through graphical programming. And the signal modulation processing module filters, fits and arranges the digital signals, and optimizes the imaging quality. According to the system design, the definition and accuracy of laser confocal microscope imaging are effectively improved, and the requirement of ophthalmology medical high-precision imaging is met.

The invention discloses an intelligent quantitative detection method based on a neural network algorithm and related equipment. The method comprises the following steps: acquiring a tumor immunohistochemical staining image through a microscope imaging system; extracting key feature information in the tumor immunohistochemical staining image through a target neural network analysis model, wherein the key feature information comprises at least one of form, color and distribution information of positive cells; and the model automatically identifies and classifies the positive cells according to the marked training data, calculates the number and the distribution condition of the cells according to a preset rule, and generates an interpretation report. The method can solve the problem that a traditional interpretation method requires a pathologist to carefully observe a staining section under a microscope, evaluate staining quality, positive signal distribution and morphological characteristics, and count and classify the staining quality, the positive signal distribution and the morphological characteristics. And the process is long in time consumption and is easily influenced by factors such as experience of doctors, fatigue degree and visual field selection, so that the interpretation result is subjective and inconsistent.

The invention relates to an edge enhancement imaging system. The system comprises a point light source; the object side polarization filtering unit is arranged on the light emitting side of the point light source and modulates the light into specific polarized light to irradiate a sample; the imaging unit is arranged on the light emitting side of the object side polarization filtering unit and is used for transmitting the input light field to an imaging surface; the spatial variable polarization modulation element is arranged on a conjugate surface of the point light source relative to the imaging unit and is used for performing spatial variable polarization modulation to obtain a modulated light field; and the image space polarization filtering unit is arranged between the space variable polarization modulation element and the imaging surface and is used for screening the modulated light field to obtain a light field in a specific polarization direction, and the light field in the specific polarization direction forms an edge enhanced imaging light field on the imaging surface. The invention also relates to a preparation method of the edge enhancement imaging system. The device has the advantages that the imaging effect of edge enhancement in any direction or all directions is achieved, a common microscope imaging system can be compatible, phase modulation is achieved through polarization state transformation, and sensitivity to wavelength is reduced.

The invention discloses a method for generating an enhanced image of a bright-field microscope, and the method comprises the steps: simulating an optical imaging model of optical Zernike phase contrast microscope imaging through a computer system based on the optical imaging principle of a conventional optical Zernike phase contrast microscope; extra hardware such as an annular diaphragm and an annular phase plate does not need to be added in an illumination light path and an imaging light path of the bright-field microscope, enhancement of the phase contrast of a bright-field digital microscopic image is achieved, energy loss of an illumination optical system is avoided, and the design and manufacturing cost of the microscopic optical system is greatly reduced; the optical Zernike phase contrast microscope can be universally used for different bright field microscopes, halo artifacts caused by interference effects in a traditional optical Zernike phase contrast microscope do not exist, finer structural features in biological cells can be distinguished, the resolution of the optical Zernike phase contrast microscope can be close to the resolution limit of objective lens design, and the technical requirements for users are greatly reduced.

SOLUTION: An apparatus includes a microscopy imaging module, a curved light sheet lighting module, and a sample scanning module. The curved light sheet lighting module generates a curvature-adjustable curved light sheet and operates in conjunction with a wide-field microscopy imaging apparatus having a field curvature, thereby enabling the entire imaging field to be maintained in focus. By integrating with the sample scanning module, high-throughput microscopy imaging of a centimeter-scale transparent sample is achieved without the need for field-of-view stitching.EFFECT: An apparatus and method are useful for solving the technical problems associated with existing light sheet microscopy technology, which suffers from low throughput and requires field-of-view stitching when imaging a centimeter-scale transparent sample. They also contribute to addressing a field curvature issue in microscope objective lens design, thereby enabling reduced design complexity and production cost for a high-throughput objective lens.SELECTED DRAWING: Figure 1

The invention discloses a method for performing three-dimensional positioning by using a light field microscope, which belongs to the field of light field microscope imaging, and comprises the following steps of: S1, performing light field imaging of an object by using the light field microscope, calibrating an observed original light field image and decoding the original light field image into a biplane parameterized four-dimensional format, therefore, a real polar plane image, namely a real EPI, is formed; s2, wave light forward direction models of spherical volumes located at different depths are used for simulating a set of light fields, a depth perception dictionary is constructed, and each atom is a synthetic polar plane image related to the specific depth, namely a synthetic EPI; s3, implementing three-dimensional positioning by executing a convolutional sparse coding model based on a depth perception dictionary and a dry friction inertial near-end gradient algorithm (IPGDF) on the observed polar plane image; according to the invention, the positioning precision and the positioning speed of three-dimensional positioning under the light field microscope are improved.

The invention provides an immunofluorescence detection method and system for dynamically detecting mouse uterus structure development based on multiple time points, and immunofluorescence staining comprises the steps of sheet unfolding, dewaxing, repairing, cell membrane punching, sealing, primary antibody treatment and secondary antibody treatment. The system comprises a sample pretreatment control module, a multi-channel confocal microscope imaging module and a data analysis module integrating fluorescence intensity calculation, Pearson co-localization analysis and a Western blot data integration algorithm. Through a multi-time-point and multi-index immunofluorescence detection method, dynamic and systematic data support is provided for mouse uterus development mechanism research, and an application basis is provided for fundamental research of reproductive biology and construction of related disease models.

The application provides a differential-based white light lensless single-frame weakly conjugate reconstruction method, which can realize weakly conjugate image reduction and improve single-frame imaging resolution in a white light lensless imaging system without using additional elements and complex algorithms. The method comprises the following steps: step one, obtaining spectral distribution information of a system light source by using a spectrometer and performing differential processing to obtain a reconstruction wavelength; step two, performing preprocessing on a collected single-frame image by using a hologram average value reduction method; step three, generating light intensity diagrams of different defocusing surfaces by using an angular spectrum propagation formula, and determining a defocusing distance range based on a definition discrimination factor; and step four, calculating differential distribution on different focal planes in the distance range obtained in step three based on numerical differentiation, and obtaining a final result by selection. The application can reduce the requirement of spectral width of a traditional lensless microscope, effectively reduce the cost of the system, improve the imaging resolution of the white light lensless microscope, and reduce the weakly conjugate image in the case of single-frame image collection.

Methods and systems for correcting intensity variations in a raw image acquired via a microscope imaging system are provided. In one example, a method comprises acquiring a reference image and developing an intensity model based on the reference image, wherein the intensity model comprises a predetermined number of a plurality of model parameters obtained by curve fitting of a single analytical function or a linear combination of a plurality of analytical functions; embedding model parameters of the intensity model of the reference image into the raw image for subsequent image processing; and correcting the raw image on demand based on the intensity model of the reference image.In another example, a method involves using the multitude of parameters of the intensity model as a hardware signature to indicate whether a multitude of parameters of the optical system is maintained.

To provide a technique of the above charged particle beam apparatus, a technique that can prevent the lowering of apparatus performance due to the influence of vibration and noise by an air blower (fan). The charged particle beam apparatus includes a body device that is provided in a body cover, a plurality of air blowers that are provided on the body cover, and a controller that controls the plurality of air blowers. The body device has a stage on which a sample is placed, and a microscope that images the sample. The controller obtains an image obtained by imaging the sample by the microscope, obtains vibration information from the image, compares the vibration information and a specification value, and on the basis of the result of the comparison, controls the numbers of rotations of the plurality of air blowers. The controller decreases the number of rotations of at least one first air blower among the plurality of air blowers, and increases the number of rotations of at least one different second air blower among the plurality of air blowers.

This invention discloses a method for correcting image distortion in a miniature microscope based on optical simulation and displacement field driving, comprising the following steps: establishing an optical model of the miniature microscope, performing field curvature analysis, and generating a grid distortion map; extracting distortion data from sampling points and converting coordinate values ​​to pixel units according to the pixel size of the CMOS sensor; constructing a continuous displacement field covering the entire image using an interpolation algorithm based on the discrete sampling point data; performing geometric correction on the distorted image based on the displacement field, specifically including: correcting the original distorted image to a geometrically correct image based on the displacement field, employing an inverse mapping strategy, for each pixel position in the corrected image, querying its corresponding position in the original distorted image, and resampling; and evaluating and visualizing the correction results. This invention improves the accuracy of image distortion correction and enhances the imaging quality of the miniature microscope.

The application provides an adaptive atomic force microscope (AFM) imaging method based on block compressed sensing, and comprises the following steps: step S1: a plurality of sub-blocks with the same size are divided on the surface of an AFM sample by using an overlapping block mode; step S2: each sub-block is pre-scanned, a row direction is taken as a fast scanning direction, a lower left corner is taken as a starting point of pre-scanning, and a pre-scanning sampling rate is calculated; step S3: a BP neural network is used to train a sample database, a relationship between a characteristic parameter and a required minimum sampling rate is obtained, and a suitable total sampling rate of each sub-block is adaptively obtained; step S4: a required number of sampling points are randomly selected on the surface of a current sub-block, and adaptive scanning is performed by using a continuous random scanning mode; and step S5: after all sampling points of a sub-block are collected, TVAL3 reconstruction algorithm is combined to perform reconstruction, and finally, all reconstructed sub-blocks are combined together; and the block effect is eliminated by using the overlapping block mode, so that each sample can obtain high and uniform imaging quality.

The present invention relates to a method for correcting a spherochromatic aberration that occurs when examining a sample with a microscope. The microscope comprises an objective lens and a corrective device arranged in a beam path of the microscope for correcting a spherical aberration. According to the method, data for describing the spherical aberration as a function of a wavelength of light imaged by the microscope are provided. A sample is examined with the microscope, and at least one spectral range of the light imaged by the microscope is determined.A control parameter of the correction device is determined based on the provided data describing the spherical aberration as a function of wavelength for the at least one determined spectral range, in order to minimize the spherical aberration for the at least one determined spectral range. The correction device is then set to the determined control parameter. The invention further relates to a microscope, which is in particular a light microscope.

A method for generating an image (100) for a microscope, comprises receiving (102) a first image (210) and receiving (104) a second image (220). The method further comprises generating (106) a processed second image (240, 214) based on the second image (220) and generating the image (204) using the first image (210) and the processed second image (240, 214).

An embodiment of the present specification provides an electron microscope imaging method, the method comprising: placing a sample holder carrying at least two samples at an imaging position of the electron microscope, the at least two samples comprising a first sample and at least one second sample; adjusting imaging parameters of the electron microscope based on the first sample; and performing imaging operations on the at least one second sample based on the imaging parameters.

A visual bright field microscopic imaging device of a light source array comprises an object carrying platform; the light source assembly comprises an annular light source and a light leakage plate, the annular light source is arranged on a first light leakage hole of the light leakage plate, and the light leakage plate is located on the object carrying platform; the four first light leakage holes are arranged relative to the side face of the object to be imaged. The four light source reflection assemblies are located between the light leakage plate and an object to be imaged on the object carrying platform. The light source reflection assembly comprises a light source reflection box body with a reflection surface, and the reflection surface has a first preset angle and a second preset angle relative to the first light leakage holes and an object to be imaged, so that light emitted by the annular light source sequentially passes through each first light leakage hole and the corresponding reflection surface to be reflected to the corresponding side surface of the object to be imaged; the camera assembly comprises a camera and a microscope lens, and the camera, the microscope lens and the annular light source are coaxially connected. The four side faces of a cubic object to be imaged can be evenly illuminated and imaged at the same time, and the requirement for multi-face imaging integrity is met.

The invention discloses a microscope imaging definition detection method based on threshold selection, and relates to the technical field of computer vision and image recognition. Comprising the following steps: S1, synchronizing field areas and magnification times of an electronic eyepiece and an optical eyepiece; s2, constructing a discrete coding space of an acquisition condition in an electronic eyepiece image acquisition process; s3, synchronous observation and definition detection of the electronic eyepiece and the optical eyepiece based on the discretized coding space parameter condition; and S4, a variable distribution sample microscope imaging definition judgment method of the time sequence image. According to the invention, definition detection errors caused by field-of-view difference between the electronic eyepiece and the optical eyepiece are reduced; image definition evaluation can be conveniently carried out on different microscopic sample images under the same condition, and a reference quantitative basis is provided for definition judgment of microscopic images under different quantitative conditions; and an overall evaluation strategy based on clustering is given for the condition that the definition is not uniformly distributed in the microscopic image region.

The invention relates to the technical field of microscopes, in particular to a light processing device, a fluorescent wide-field microscope, an imaging method, a medium and equipment, the light processing device comprises a first polarization beam splitter used for splitting incident light into first polarized light and second polarized light, the polarization directions of the first polarized light and the second polarized light are perpendicular to each other, the first polarized light enters a first light path, and the second polarized light enters a second light path; the second polarized light enters a second light path different from the first light path; the grating is positioned on the first light path, so that the first polarized light is modulated into structured light after passing through the grating; the second polarization beam splitter is used for combining the first polarized light modulated by the grating and the second polarized light not modulated by the grating to an emergent light path; and the polarized light selection assembly is positioned on the emergent light path and is used for selectively allowing the first polarized light or the second polarized light to pass through.

The application provides a kind of primary neuron cell golgi staining method and application based on lipid, comprising the following steps: 1) extracting, culturing and fixing primary neuron cell;2) selecting one kind of lipid in phosphatidylcholine, phosphatidylethanolamine, sphingomyelin, cholesterol, lecithin;3) the selected lipid is evenly covered on the cell surface, and Golgi staining solution is added for staining;4) remove Golgi staining solution, and use reducing agent for developing reaction;5) optical microscope imaging observation and / or simultaneous radiation X-ray imaging observation;6) the imaging data is analyzed and processed using data processing software.The application successfully stains primary neuron cell, and under the simultaneous radiation X-ray imaging technology, neuron dendrite and morphology can be observed, which lays a good research foundation for using simultaneous radiation X-ray to quantitatively study neuron complete three-dimensional structure and complete three-dimensional fine structure of neuron.

The present application relates to the field of microscope imaging processing technology, and specifically to a two-photon microscope and related microscopic imaging method, the method comprising: obtaining tomographic images taken by a twin microscope at various focal lengths; obtaining the plane frequency of each pixel in the tomographic image according to the local grayscale change of the tomographic image; obtaining the high-frequency interpolation weight between corresponding pixels in adjacent tomographic images according to the local grayscale change of the image composed of pixels in the same row and column in all tomographic images; obtaining the interpolation control weight to weight the grayscale value of each pixel according to the spatial distribution characteristics and high-frequency interpolation weight of all edge pixels in two adjacent tomographic images, and obtaining an interpolation image between two adjacent tomographic images; obtaining the microscopic imaging result of the twin microscope according to all tomographic images and interpolation images. The present application can improve the imaging quality of a two-photon microscope.

The invention belongs to the technical field of numerical control machine tool detection, and particularly relates to a numerical control machine tool spindle surface defect laser detection device and method. According to the numerical control machine tool spindle surface defect laser detection device, after the laser beams emitted by the laser device pass through the beam expander, parallel laser beams with large diameters are obtained, the laser beams are incident to the surface of the numerical control machine tool electric spindle through the first total reflection reflector, and then the propagation direction is changed through the second total reflection reflector; then a camera is adopted to shoot a numerical control machine tool motorized spindle surface picture imaged by the microscope, and a computer is adopted to record the surface state of the numerical control machine tool motorized spindle in a normal working state, so that the health state monitoring of the surface of the numerical control machine tool motorized spindle is realized. The laser detection method is adopted to carry out rapid, real-time, dynamic and high-precision monitoring on the health state of the surface of the electric spindle of the numerical control machine tool, and the method has the advantages of non-contact, visualization and high spatial resolution.

The invention relates to an automatic focus following method for a microscope, relates to the technical field of microscope imaging, and aims to construct a defocus distance prediction model by taking focusing as a regression problem so as to directly predict a defocus distance based on a picture. In the initial stage of focusing search, a gradient estimation algorithm without global scanning is provided based on a defocus distance prediction model, and the optimal focal plane is quickly converged through the adjustment steps of detecting a current area, predicting a focusing position, jumping to the focusing position and using the least imaging times and the least camera height, so that the focusing time is remarkably shortened, and the focusing efficiency is improved. The technical problems that an existing focusing algorithm is large in operand, and focusing to a wrong position is prone to occurring are solved.

The utility model discloses an optical microscope imaging module, and belongs to the technical field of bio-photonics. The module comprises a bright field imaging module and a bright field module shell or a fluorescence imaging module and a fluorescence imaging module shell. The problem that an existing traditional optical microscope is poor in adaptability and fixed in structure in diversified experiment requirements is solved. According to the optical microscope imaging module, the flexibility and adaptability of a microscope system are greatly improved. Through modular arrangement, scientific researchers can quickly replace or carry various functional modules according to different experiment requirements, so that the microscope can more accurately meet the requirements of specific experiments.

The invention discloses a nanoparticle high signal-to-noise ratio dark field scattering microscopic imaging method, including: using a reference light with a fixed frequency difference with the scattered light to form beat frequency interference, and selecting the appropriate moment in the time stack to form a constructive interference with the maximum scattering contrast; building a nanoparticle dark field scattering microscope imaging system based on heterodyne interference, performing time-resolved sampling of the image by the sensor of the system to obtain a data cube with system noise, using the discrete Fourier transform analysis of the sampled data along the time superposition to extract the scattered light information at the heterodyne frequency in the frequency superposition, after Fourier filtering, traversing each spatial position, using autocorrelation to calculate the delay between the scattered signal and the reference signal, applying the delay to the phase compensation of the iso-differential interference image, and realizing space-time imaging. The present invention can greatly improve the imaging quality of nanoparticles, and has broad application prospects in many fields such as nanotechnology.

The invention belongs to the technical field of two-photon microscope imaging, and specifically discloses an auxiliary device for a water immersion lens of a two-photon microscope, comprising a water replenishing bucket, a cooling interlayer and a liquid supply component; the water replenishing bucket is used to be placed on an observation window and forms a water containing cavity with the observation window, and the water containing cavity is used to place the water immersion lens of the two-photon microscope; the cooling interlayer is arranged around the outer side of the water replenishing bucket and is located at the lower half of the water replenishing bucket, and its bottom surface is located at the same horizontal plane as the bottom surface of the water replenishing bucket and forms a fitting surface, and the fitting surface is used to be in close contact with the observation window; the invention forms a water immersion lens placing container with a cooling function through the water replenishing bucket and the cooling interlayer, and cooperates with the two containers to realize continuous water replenishment of the water immersion lens, and can effectively reduce the temperature around the water immersion lens, can keep the water immersion lens always immersed in water during use, cool the lens at the same time, and prevent excessive water as immersion liquid from flowing to the periphery.

The invention discloses a camera scanning method and device for optical element surface defect detection, and relates to the technical field of optical detection.The method comprises the steps that based on the dark field microscopic imaging principle, a CMOS microscope camera is controlled to conduct overall scanning based on a preset coarse scanning path on a to-be-detected optical element in a coarse scanning mode with the magnification factor being 1; acquiring a sub-aperture image acquired by the CMOS microscope camera at each first sub-aperture position of the preset coarse scanning path, and extracting defect feature information in the sub-aperture image; determining target defect points based on the defect feature information, and clustering the target defect points to obtain a defect point clustering result; performing path planning on class centers of all defect point classes by taking the shortest scanning path as a target to obtain a fine scanning path; and controlling the CMOS microscope camera to scan the optical element to be detected based on the fine scanning path in a fine scanning mode with the magnification times greater than 1. According to the invention, the scanning time and the data storage amount can be reduced, and the later image splicing error is reduced.

The invention relates to the technical field of microscope imaging, in particular to an adjustable phase-contrast microscopic imaging method, device and equipment and a storage medium, and the adjustable phase-contrast microscopic imaging method comprises the following steps: obtaining the thickness of a to-be-imaged sample, and generating a corresponding number of cell depth positions according to the thickness of the to-be-imaged sample; triggering a corresponding phase-symmetry imaging instruction according to the cell depth position, and triggering a refraction adjusting voltage according to the phase-symmetry imaging instruction to adjust the liquid crystal refractive index so as to obtain the adjusted liquid crystal refractive index; according to the liquid crystal refractive index, calculating to obtain a depth-symmetrical image corresponding to each cell depth position, and extracting a light position image from each depth-symmetrical image to obtain a corresponding depth cell image; and synthesizing the depth cell images according to the sequence of the depth positions of the cells to obtain a three-dimensional image of the sample. The method has the effect of forming thick sample imaging or three-dimensional imaging.