37 results about "Atomic force microscopy" patented technology

The invention discloses a mixing parameter regulation and control method and system for an SBS-T modified asphalt mixture and a terminal. The method comprises the following steps: analyzing a modification mechanism through a scanning electron microscope and X-ray photoelectron spectroscopy combined technology, dividing three stages of rapid melting and the like, and establishing a temperature-viscosity model; constructing a multi-scale capture system by using an atomic force microscope, a Fourier transform infrared spectrum and a dynamic shear rheometer; designing a five-factor three-level test matrix by adopting a response surface method, and establishing a road performance prediction model in combination with a BP neural network; mixing parameters are optimized in a multi-objective mode based on a genetic algorithm, and dynamic correction is achieved through an Internet of Things sensor and Kalman filtering. The system comprises a mechanism analysis module, a multi-scale detection module, a terminal integrated storage unit, a processing unit and a man-machine interaction unit. According to the scheme, the limitation of traditional single-factor analysis is broken through, microscopic and macroscopic collaborative optimization and dynamic parameter regulation and control are achieved, and the construction adaptability and precision are improved.

The invention relates to the technical field of traditional Chinese medicine component detection and discloses a rapid detection method for traditional Chinese medicine compound components. The method comprises the following steps: performing Raman spectrum scanning on a traditional Chinese medicine compound sample to generate component spectrum distribution information, and performing fitting by adopting a partial least square algorithm to determine a local component anomaly risk area; meanwhile, atomic force microscopic imaging is carried out, a microstructure distribution map is generated, and a potential component mismatch feature region is marked through texture feature extraction and pattern recognition. And generating a detection optimization adjustment region based on the space coordinates of the region, analyzing the gradient change in the molecular arrangement direction of the region to evaluate the component distribution offset state, and analyzing the interface bonding state of the active component and the auxiliary material to evaluate the component interaction coupling strength. And finally, on the basis of an evaluation result, whether the real-time parameter calibration is started in the detection optimization adjustment area is judged through a dual-channel decision-making mechanism. According to the method, correlation analysis of component spectrums and microtopographies is realized, and the accuracy and pertinence of traditional Chinese medicine compound component detection are improved.

The embodiment of the invention discloses a scanning NV probe microscope which comprises an atomic force microscopy system used for detecting surface topography information of a sample and an optical detection magnetic resonance system used for detecting surface magnetic field distribution information of the sample, and the atomic force microscopy system comprises a vibration arm and a diamond probe. The optical detection magnetic resonance system comprises an NV color center, a transition excitation light path and a fluorescence detection light path; a sample to be scanned and the transition excitation light path are respectively positioned on two opposite sides of the diamond probe, and the transition excitation light path and the fluorescence detection light path are positioned on the same side of the diamond probe; a first metal coating film is arranged on one side, close to the sample, of the diamond probe and is used for blocking surface fluorescence of the sample. According to the scanning NV probe microscope provided by the embodiment of the invention, the metal coating is arranged at the bottom of the diamond probe to block stray fluorescence from the surface of the sample, so that the problems of low magnetic field imaging signal-to-noise ratio and limited measurement precision of the existing scanning NV probe microscope are solved.

This disclosure provides an electronic control readout system and method for quantum diamond atomic force microscopy. The system includes: a system control readout module, a magnetic measurement algorithm module, and a magnetic measurement control and readout module. The magnetic measurement control and readout module is used to respond to the control signal of the system control readout module by emitting a laser pulse sequence and a microwave pulse sequence of a preset frequency to the quantum diamond probe located at the i-th pixel position of the sample to be tested, and then acquiring the analog fluorescence signal of the quantum diamond probe at the i-th pixel position and outputting the digital fluorescence signal of the i-th pixel. The magnetic measurement algorithm module is used to respond to the control signal of the system control readout module by obtaining the resonance frequency at the i-th pixel position and the preset frequency at the i+1-th pixel position according to the fluorescence photon number of the i-th pixel corresponding to the digital fluorescence signal of the i-th pixel, the resonance frequency at the (i-1)-th pixel position, and a microwave frequency lookup table.

The invention provides a method for predicting fiber yield stress based on monomolecular mechanics, and relates to the technical field of monomolecular level determination of interaction among chain tracks, lacing molecules and chains in fibers, the method comprises the steps of preparing a fiber sample, preparing a functionalized atomic force microscope probe, and testing atomic force microscope (AFM) imaging and monomolecular force spectrum (SMFS). The method comprises the following steps of: verifying a single molecule signal, reconstructing a fiber medium chain track by utilizing a force-distance curve of a single molecule, quantifying the interaction between fiber medium chains, establishing a quantitative relationship between the single molecule and macromechanics, carrying out a static tensile experiment of polymer fibers, and verifying the quantitative relationship by utilizing the dependency of the molecular density and the utilization rate of a lace on tensile orientation. According to the method, the chain track in the fiber can be reconstructed, the molecular density of the lace and the strength of interaction between the chains are quantified, then the ultimate yield stress (sigma SMFS) of the fiber is calculated, and the quantitative relation between single molecules and macromechanics is established.

The invention relates to the technical field of biomedical imaging and terahertz detection, in particular to a terahertz near-field imaging quality analysis system and method. According to the technical scheme, the system comprises an atomic force microscope system, a terahertz source, an image acquisition module, an image scoring module and a data processing module, and the atomic force microscope system adopts a tapping mode based on the terahertz scattering type scanning near-field optical microscope technology and comprises a Z voltage control unit used for adjusting the probe insertion depth; the terahertz source is used for providing terahertz waves required by imaging, and the terahertz source and the probe module of the atomic force microscope system are coaxially arranged. By quantifying the association rule of the probe insertion depth and the imaging quality, the core pain points of blind parameter adjustment and unstable quality in terahertz near-field imaging are solved at one stroke, the imaging consistency is greatly improved, the detection process and the quality evaluation system are exclusive, the method is particularly suitable for undyed paraffin sections, and the detection accuracy is improved. And the pathological characteristics of papillary carcinoma cells can be clearly presented.

Exemplary embodiments of the present disclosure can include, for example, an atomic force microscopy (AFM) system, including a cantilever(s), an optical pickup unit(s) (OPU(s)) including a laser positioned over the cantilever(s), and a power source providing noise with a noise level that is below 300 Picometers. The noise level of the power source can be below 200 Picometers. A digitizing arrangement can be included which can be associated with the OPU. The digitizing arrangement(s) can have a bandwidth of about 2 MHZ. The OPU(s) can have a detection bandwidth of at least 80 MHZ. The exemplary apparatus can be combined with a chemical protocol and statistical signal processing and image analysis procedures to map DNA at high speed and accuracy.

The invention discloses a method for rapidly detecting aspergillus conidia in a label-free manner through terahertz near-field imaging, and belongs to the technical field of microbiological detection. The method comprises the following steps: synchronously acquiring atomic force microscope morphology images and terahertz near-field signals of spores through a scattering type terahertz time-domain spectrum near-field scanning system, and jointly extracting morphology features, multi-order harmonic signal intensity and a local near-field amplitude spectrum peak value after phase-locked amplification and demodulation processing; and combining into a feature set for spore type identification. The method provided by the invention solves the problem that high-resolution, label-free and rapid detection cannot be realized at the same time in the prior art, and is mainly used for rapid label-free accurate detection and type identification of the aspergillus conidia.

A method of evaluating a region of interest of a sample with a sample evaluation tool that includes a focused ion beam (FIB) column, a scanning electron microscope (SEM) column, and an atomic force microscope (AFM) instrument, the method comprising: transferring the sample into in a vacuum chamber of the sample evaluation tool; acquiring a plurality of two-dimensional images of the region of interest over a plurality of iterations of a delayering process by: (a) positioning the region of interest under a field of view of the FIB column; (b) milling a layer of material from the region of interest with the FIB column; (c) moving the region of interest under a field of view of the SEM column; (d) imaging the region of interest with the SEM column and measuring a depth of the milled layer in the region of interest with the AFM instrument; and repeating steps (a)-(d) a plurality of times without removing the sample from the vacuum chamber.

The present invention discloses an atomic force microscope in-situ electrolytic cell device for measuring the molecular force spectrum of a solid-liquid interface. The structure includes a working electrode, a reference electrode, a counter electrode, and an electrolytic cell. The cell body is sequentially composed of an optical glass window, a flange top cover, a Teflon substrate, a sealing ring, a metal sample support sheet, a central through-hole Teflon support sheet, a magnetic coil plate, a spring gasket, and a flange base from top to bottom. The center of the Teflon substrate is provided with an opening, and the top is sequentially fixed with a flange top cover and an optical glass window from bottom to top. The bottom is respectively composed of a sealing ring, a metal sample support sheet, a central through-hole Teflon support sheet, a magnetic coil plate, and a flange base from top to bottom. An external signal source drives the magnetic coil, and the interaction between the magnetic probe and the molecular / ion clusters inside the interface double layer is used to realize sub-nanometer real-space imaging of the solid-liquid interface structure in the electrochemical process. The present invention can assist in the needs of material electrochemical testing and atomic force microscope data acquisition.

The invention provides an extreme ultraviolet collection mirror grating hybrid measurement system and method, and relates to the technical field of extreme ultraviolet (EUV) lithography and nanometer metrology, and the system comprises an atomic force microscopic module which is in communication connection with a data processing module and is used for carrying out high-resolution morphology detection on an abnormal morphology according to position information, and obtaining image data; the shared precision positioning platform module is connected with the optical scattering measurement module and the atomic force microscopy module and used for controlling movement of the optical scattering measurement module and the atomic force microscopy module so that the atomic force microscopy module can accurately move to the position where the abnormal morphology is located; wherein the data processing module is also used for generating a comprehensive detection report based on the geometric structure parameters reconstructed by the optical scattering measurement module and the image data acquired by the atomic force microscopic module. According to the invention, high-precision, high-efficiency, cross-scale and lossless comprehensive characterization of the grating on the surface of the EUV collecting mirror can be realized.

This application provides an atomic force microscopy system, relating to the field of optical detection. In the atomic force microscopy system provided by this application, the focusing lens structure and the reflective surface of the cantilever constitute a tilt-invariant retroreflection system, adjusting the reflected beams from the cantilever at different tilt angles to be spatially staggered but along the same direction. Therefore, when detecting this reflected beam, the relevant sensors can be set based on the modulated direction of the reflected beam, enabling the sensors to receive the beam reflected from the cantilever at a stable angle, reducing the detection difficulty for the sensors. Furthermore, to avoid multiple reflections of the resulting beam between the reflective interface and the reflective surface affecting the detection results of the position-sensitive detector, the atomic force microscopy system provided by this application also includes an anti-interference structure. This anti-interference structure introduces additional deflection into the resulting beam, ensuring the detection accuracy of the position-sensitive detector.

The invention discloses a self-adaptive scanning method of a scanning probe microscope, and belongs to the technical field of atomic force microscopes. The invention aims to solve the problem that the scanning operation mode cannot be adjusted according to real-time requirements in the existing probe scanning method. Comprising the following steps: in a scanning process, triggering monitoring after completing signal acquisition of each pixel point so as to obtain a current concerned signal; setting a trigger condition of the current concerned signal, and executing a preset trigger operation under the condition that the trigger condition is met; and then signal acquisition of a next pixel point is carried out. According to the invention, the self-adaptability and efficiency of AFM scanning can be improved.

A method for inspecting and reviewing defects in a substrate using a scanning probe microscope comprising a plurality of scanning heads and a substrate carrier, wherein each of the plurality of scanning heads comprises a probe including a probe tip positioned for scanning the substrate surface, the method comprising: - providing a substrate on a substrate carrier, wherein the substrate carrier is positioned to position the substrate for at least one of the plurality of scanning heads; - scanning the substrate surface in a first scanning mode using at least one first scanning head of the plurality of scanning heads; - scanning the substrate surface in a second scanning mode using at least one second scanning head of the plurality of scanning heads, wherein at least one first scanning head and at least one second scanning head are different scanning heads of the plurality of scanning heads, the method for inspecting and reviewing defects, wherein the first scanning mode has a lower scanning resolution than the second scanning mode.

The invention provides a micro-cantilever, a probe and an atomic force microscopy, the micro-cantilever is applied to the atomic force microscopy, the micro-cantilever comprises a first area, a second area and a third area, the first area and the third area are respectively arranged at two ends of the micro-cantilever, the second area is arranged between the first area and the third area, the first area is used for fixing one end of the micro-cantilever, a needle point used for detecting a detected sample is arranged in the third area, and the second area comprises more than two micro-channels. In the embodiment of the invention, the second region of the micro-cantilever comprises at least one micro-channel so as to divide the micro-cantilever into smaller cantilevers, each cantilever has respective resonant frequency, and the superposition of the at least two smaller cantilevers can reduce the overall Q value of the micro-cantilever, so that the micro-cantilever has a wider frequency amplitude peak and responds to a wider-frequency signal, and therefore, the overall performance of the micro-cantilever is improved. Therefore, the requirement of detecting vibration signals with different frequencies can be met.

The invention discloses a high-sensitivity positioning atomic force microscope detection device and method. The high-sensitivity positioning atomic force microscope detection device comprises a dark field oblique incidence light source module, an open atomic force scanning module, a microscopic imaging system and a high-precision motion platform for placing a sample, the dark field oblique incidence light source module provides a multi-angle oblique incidence light source for a sample to form a dark field effect, so that scattered light of micro-nano defects on the surface of the sample is captured by a microscopic imaging system, and high-sensitivity positioning is realized; the atomic force scanning module comprises a radio frequency modulation laser, a probe assembly and a photoelectric detector; the laser output by the laser irradiates the probe assembly and then is reflected into the photoelectric detector; the sample is a transparent element, and the relationship among the incident angle of the dark field oblique incidence light source module, the refractive index of the sample and the numerical aperture NA of the microscopic imaging system is constrained, so that the imaging of the center and the edge of the sample meets the dark field condition. By utilizing the method, the micro-nano scale surface defect can be accurately positioned in the AFM detection process.

The invention is suitable for the technical field of image processing and biomedical analysis, and provides an atomic force microscope chromosome image fusion and detection method and system, and the system comprises an image loading module which is used for loading a chromosome image file scanned by an atomic force microscope from a specified folder; and the image splicing module is used for splicing the loaded image files into a panoramic image and comprises an automatic splicing sub-module and a manual splicing sub-module. According to the method, automatic splicing and intelligent detection of chromosome images can be realized, the stability and accuracy of image processing are greatly improved, high-quality panoramic image construction can still be realized in a complex scene, the image utilization rate is improved, a chromosome extraction result is more accurate and reliable, the whole scheme is high in automation degree and strong in robustness, manual intervention can be reduced, and the efficiency is improved. The method improves the processing efficiency and detection accuracy of the chromosome image of the atomic force microscope, and has a remarkable practical value.

The application belongs to the technical field of traditional Chinese medicine polysaccharide development, and particularly relates to an active polysaccharide CWP-3 extracted from medicinal materials of Coptis deltoidea or residues after extraction of volatile oil, and a preparation method and application thereof. The homogeneous polysaccharide CWP-3 obtained by the application is a heteropolysaccharide, monosaccharide composition includes rhamnose (Rha), galacturonic acid (GalA), galactose (Gal) and arabinose (Ara), the molecular weight is 400-1000 kDa, the types and connection modes of sugar residues are determined by using HPLC, FTIR, GC-MS and NMR and other analysis technologies, and the atomic force microscope (AFM) analysis shows that the CWP-3 has a clear three-strand helical structure. In addition, the pharmacological experiments show that the CWP or CWP-3 has good antioxidant and treatment effects on blood stasis syndrome, cardiovascular diseases, dysmenorrhea and functional constipation.

The invention is applicable to the technical field of microbiomechanics, and provides a bacterial probe as well as a preparation method and application thereof, microspheres are placed in a bacterial adhesion enhancing modifier for surface modification for not less than 4 hours; adding a bacterial suspension into the microspheres subjected to surface modification, carrying out cultivation and growth treatment so as to enable bacteria to uniformly grow on the surfaces of the microspheres, and carrying out centrifugal cleaning, so as to obtain bacterial microspheres; and oscillating and dispersing the bacterial microspheres, and contacting the bacterial microspheres with the probe cantilever beam of the atomic force microscope adhered with the glue, so that the bacterial microspheres are adhered to the probe cantilever beam of the atomic force microscope to obtain the bacterial probe. The bacterial probe with low pollution, high activity and strong adhesion is prepared by an innovative two-step method, and the problems of low survival rate, uncontrollable position, complex operation, cantilever pollution and the like in the preparation of the existing AFM bacterial probe are successfully solved. The bacterial probe prepared by the invention is good in wrapping property, has high biological activity and test stability, can be prepared in batches, and can remarkably prolong the test time and the repeated utilization rate of a single probe.

To provide a microscopic analysis system and a method of observing a sample, which are excellent in resolution and which can accurately measure spatial information for the inside of a sample.SOLUTION: A microscopic analysis system includes: an AFM microscope 101 which has a cantilever 3 for scanning a sample 6, and which detects a behavior of the cantilever 3 to measure a shape of the sample 6; and an optical microscope 102 for irradiating the sample 6 with illumination light and measuring associated reflection light to visualize the sample 6. The optical microscope 102 further visualizes the sample 6 when at least one of a dynamic external stimulus by the cantilever 3 and a photochemical external stimulus by the illumination light is being applied to the sample 6.SELECTED DRAWING: Figure 1

The invention discloses a nucleic acid detection method based on patterning, and belongs to the technical field of molecular diagnosis and biosensing. According to the method, a spatial position coded DNA framework is used as a detection carrier, specific capture probes are fixed at a plurality of pre-designed independent sites, a compound formed by target nucleic acid and a biotinylation report chain is subjected to specific hybridization capture, and then a recognizable signal is formed through combination of streptavidin; and the synchronous digital detection of multiple target nucleic acids is realized by reading patterned signals through an atomic force microscope. The position programmability and the single molecule detection sensitivity of the DNA nanotechnology are combined, the multiple detection capacity is only limited by the number of independent sites of a DNA frame, the expandability is extremely high, and the method is suitable for high-specificity detection of multiple nucleic acids in complex biological samples.

Methods and apparatus for spectroscopy from nanoscale to millimeter scale and imaging techniques, including atomic force microscopy, infrared spectroscopy, confocal microscopy, Raman spectroscopy, and mass spectroscopy. For infrared spectroscopy, the sample is illuminated with infrared light and the resulting sample deformation is read out with a focused UV / visible beam and / or AFM tip. The combination of the two techniques provides fast and large area measurement scans using the UV / visible light and high resolution measurements using the AFM tip. The methods and apparatus also include the ability to analyze the light reflected / scattered from the sample by a Raman spectrometer for supplemental analysis by Raman spectroscopy.

This invention discloses a method, apparatus, and system for processing probe response frequency domain data. The method includes: acquiring driving signal data, wherein the driving signal data includes multiple discrete swept frequency signal data, and the frequencies of the multiple discrete swept frequency signal data are different; acquiring probe response signal data generated by the probe microscopy device under the excitation of the driving signal data; representing the driving signal data and the probe response signal data at multiple frequencies in matrix form to obtain a driving signal matrix and a probe response signal matrix respectively; and determining the probe response frequency domain data of the probe microscopy device under the excitation of the multiple discrete swept frequency signal data based on the driving signal matrix and the probe response signal matrix and performing matrix operations. This invention extracts more important frequency domain data through matrix operations, significantly improving the efficiency of high-throughput atomic force microscopy characterization technology.

The invention relates to the technical field of test and measurement, and discloses a scanning adjustment method of an atomic force microscope, which comprises the following steps: in response to a control instruction for scanning a sample, executing an initial scanning operation to obtain initial scanning data of the sample; wherein the initial scanning data comprises initial morphology data, forward scanning data and reverse scanning data; performing hysteresis calculation according to the forward scanning data and the reverse scanning data so as to adjust the forward scanning range, the reverse scanning range and the scanning resolution in the first direction and / or the second direction; wherein the first direction and the second direction are orthogonal along the surface of the sample; and predicting the height of the to-be-measured morphology according to the initial morphology data so as to adjust the scanning range in the height direction between the probe and the surface of the sample. And optimization is performed according to different scanning requirements, so that mutual interference of adjustment of scanning ranges in different directions is reduced, and scanning is more efficient and accurate. The invention further discloses a scanning adjustment device of the atomic force microscope, the atomic force microscope and a computer readable storage medium.

1. Name of the product in this design: Microscope base (Atomic Mechanics). 2. Purpose of this design: This design is intended for use as an accessory on a microscope. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: 3D view 1.

An apparatus (2) is disclosed for automatically unloading AFM probes (10) from a probe package (1) and loading the probes into a probe cassette (3) for use by an AFM device after they have been individually characterized. The apparatus includes a cantilever characterization station (21) for characterizing the cantilevers of the individual probes, a tip characterization station (22) for characterizing the tips of the individual probes, and a probe manipulator (23) for transferring the AFM probes from the probe package (1) to the probe cassette (3).

The invention discloses a method for measuring a cell nucleus modulus based on an AFM (atomic force microscope). The method comprises the following steps: extracting a cell nucleus sample, obtaining a needle insertion curve formula by combining a Sneddon contact model and a Maxwell viscoelastic model, measuring separated cell nucleuses by using an atomic force microscope, and processing experimental data by using Matlab. The method has the beneficial effects that a force-distance curve is obtained by measuring separated cell nucleuses by using a probe, and then in combination with a Sneddon contact model and a Maxwell viscoelasticity model, the influence of cell nucleus viscoelasticity and cytoskeleton on cell nucleus modulus and the relationship between the radius of the needle tip and the indentation depth are considered, so that the accuracy of the cell nucleus modulus is improved. According to the method, a formula suitable for measuring the cell nucleus modulus is deduced, the mechanical parameters of the cell nucleus are obtained by using Matlab fitting experimental data, the influence of a cytoskeleton and other organelles on the viscoelastic parameters of the cell nucleus can be avoided in the measurement process by using the measured and separated cell nucleus, and the measurement result is closer to the real parameters of the cell nucleus.

Anode material, preparation method thereof, and battery. Anode material includes graphite and carbon layer located on at least part of surface of graphite. Particle surface and particle section of anode material are respectively tested by Raman spectroscopy, peak area ratio of D characteristic peak within range of 1300 cm−1 to 1350 cm−1 to G characteristic peak within range of 1500 cm−1 to 1580 cm−1 is ID / IG, ratio of ID / IG measured on the particle surface is A, and ratio of ID / IG measured on particle section is B, and 1.22<A-B≤2.10. Particle surface of anode material is tested by adopting atomic force microscopy, 1 μm×1 μm test region is randomly selected on particle surface of anode material, arithmetic average value of height deviation absolute values relative to reference surface in test region is S nm, where 15 nm≤S≤60 nm. Anode material improves lithium-ion transport kinetics, initial Coulombic efficiency, and cycle performance.

This application provides a method for characterizing polarization switching in multi-mode memory devices based on atomic force microscopy (AFM), applicable to the technical field of multi-mode memory device detection. The method includes: acquiring amplitude and phase signals; the amplitude and phase signals are acquired during the application of electrical scanning pulse signals to a predetermined region of the multi-mode memory device under test using an AFM, the electrical scanning pulse signals including multiple voltage signals; determining an amplitude curve based on the amplitude and electrical scanning pulse signals; determining a phase curve based on the phase and electrical scanning pulse signals; and extracting key parameters of polarization switching in the multi-mode memory device under test based on the amplitude and phase curves; the key parameters include amplitude peak characteristics and phase change characteristics. The embodiments of this application can provide intuitive and quantitative analysis of polarization switching in multi-mode memory devices, providing direct experimental basis for optimizing device design and performance evaluation.

1. Name of the designed product: microscope stand (atomic force microscopy). 2. Use of the designed product: the designed product is used as an accessory for a microscope. 3. Design points of the designed product: in shape. 4. Picture or photo best indicating the design points: perspective view 1.