2 results about "Atomic force microscopy" patented technology

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. This capability resulted in the discovery in 1997, of a new cellular structure at the plasma membrane named porosome, the universal secretory machinery in cells, thereby establishing a new field in biology, nanocellbiology.