The application provides a COB display module full-dimension detection
system and method based on nanoprobes and
quantum dot spectrum fusion, and belongs to the technical field of COB display module detection; the
system comprises a hardware layer and a
software layer, wherein the hardware layer comprises a
motion control module, a detection module, an environment control module and an
edge computing unit; the
software layer comprises a COB special AI
algorithm library for identifying continuous
tin defects on a COB display module, analyzing the brightness and
chrominance of the COB display module and predicting the service life of the COB display module, an
edge computing and
data management architecture and an HMI human-computer
interaction interface; the application integrates an atomic force
microscope probe,
quantum dot
spectrum imaging, a
Transformer defect recognition and light-heat-
electricity coupling analysis, is suitable for novel display technologies such as Micro LED and
OLED, and can realize full-dimension high-precision detection of
chip-level
electrical performance, micron-level continuous
tin defects, multi-view optical performance and thermal management.