6 results about "Magnetic force microscope" patented technology

The invention discloses a magnetic field device for a magnetic microscope, and relates to the technical field of magnetic field devices. Comprising a table body; a turntable is rotationally arranged on the table body; a sample clamp is arranged on the turntable; a first magnetic field mechanism is arranged on the table body; a second magnetic field mechanism is arranged in the table body, and a driving mechanism for driving the turntable to rotate is arranged in the table body; and a stress loading mechanism is also arranged in the table body. By arranging the driving mechanism and the turntable, angle adjustment of the sample is realized; the size and the direction of the magnetic field in the horizontal direction of the first magnetic field mechanism are adjusted, so that the possibility of comprehensively characterizing the anisotropy of the magnetic material is expanded; by arranging the stress loading mechanism, upward stress of different sizes is applied to the sample, and deep research on magnetic domain change under the stress influence is improved; by arranging the second magnetic field mechanism, the size and direction of the magnetic field in the vertical direction are adjusted, and the possibility of comprehensive representation of the magnetic material in different magnetic field environments is widened.

The application provides a sample transmission device and method for an ultrahigh vacuum magnetic force microscope, which comprises a working box, a transition box, a sample feeding assembly, a sample transmission assembly, a sample storage assembly and a switch structure. The working box can be pumped to a set vacuum degree, and has a test position, a transfer position and a temporary storage position. The test position is used for placing a sample holder and a needle tip holder, the transfer position is used for the sample transmission assembly to take and place the sample holder and the needle tip holder on the sample feeding assembly and the sample storage assembly, and the temporary storage position is used for temporarily storing the sample holder and the needle tip holder. Compared with the operation of frequently opening the working box in the prior art, the vacuum degree of the working box is not affected during the whole working process, the established ultrahigh vacuum environment is not damaged, the whole operation process is simple and fast, and the sample transmission is facilitated. The replacement of different sample holders or needle tip holders at the test position can be completed in the working box, the working box does not need to be opened, and the stability of the vacuum degree of the working box during the sample transmission process is ensured.

The invention discloses a reference sample suitable for magnetic force microscope probe tip calibration and a calibration method. The reference sample is formed on the surface of a substrate material, is made of a magnetic material, is provided with at least one group of magnetic micro-nano structures consisting of a plurality of substructures, and can generate a magnetic field with specific spatial distribution on the surface of the sample. The reference sample is used for calibrating the magnetic needle point of the magnetic force microscope. According to the invention, the substrate material is a silicon-containing or sapphire film growth substrate, the magnetic material is a single-layer or multi-layer film with perpendicular magnetic anisotropy, and the magnetization direction is perpendicular to the base surface of the substrate material. The magnetic material forms a magnetic micro-nano structure containing various spatial feature size patterns, and a stable magnetic field with specific spatial distribution can be generated on the surface of a sample. According to the invention, the spatial frequency range of magnetic probe calibration can be widened, and quantitative measurement of the magnetic force microscope on the surface magnetic fields of different magnetic micro-nano structures can be realized.

According to the magnetic field control device and the magnetic field control method for the magnetic force microscope provided by the invention, the distance between a magnet and a sample table is adjusted through a lifting mechanism between a displacement table base and a piezoelectric table; the lifting mechanism comprises a connecting base, and the connecting base comprises a connecting plate connected with the displacement table base, a boss arranged on the connecting plate and extending into the piezoelectric station, and a containing cavity formed in the boss. A screw rod is rotationally arranged between the connecting plate and the boss, a belt wheel is arranged at one end of the screw rod, the other end of the screw rod is connected with a moving block, and the moving block is slidably arranged in the containing cavity; a belt wheel drives a screw rod and drives a moving block to lift, a driving source is allowed to be arranged on the side face, a boss extends into a piezoelectric station, the requirement for the height of a displacement table is lowered, and the structure is compact; and the screw rod is rotatably arranged between the connecting plate and the boss, so that sealing at the rotary connecting position is facilitated, and a magnet box does not need to be arranged.

Provided is a magnetic recording medium having a high linear recording density.　This magnetic recording medium is a tape-like magnetic recording medium, and comprises a base and a magnetic layer containing magnetic particles. The average thickness of the magnetic recording medium is 5.30 μm or less. The average particle volume of the magnetic particles is 1.50 × 103 nm3 or less. When a signal is recorded in the magnetic layer at a recording wavelength of 739.2 nm, the sum (σ1 + σ2) of a peak variation σ1 at a magnetization reversal position, the peak variation being obtained by measuring a recorded portion of the signal by a magnetic force microscope, and a peak interval variation σ2 is 18.5 nm or less.

The utility model discloses a kind of magnetic field devices for magnetic force microscope, it is related to magnetic field device technical field. Including table body;Rotatably arranged carousel on table body;Sample clamp is arranged on carousel;First magnetic field mechanism is arranged on table body;Second magnetic field mechanism is arranged in table body, driving mechanism for driving carousel rotation is arranged in table body;Stress loading mechanism is further arranged in table body. The utility model is by setting driving mechanism and carousel, the angle adjustment of sample is realized;By setting the size and direction adjustment of first magnetic field mechanism horizontal direction magnetic field, the possibility of comprehensive characterization to the anisotropy of magnetic material is widened;By setting stress loading mechanism, different size stress is exerted to sample upwards, the in-depth study of magnetic domain change under stress influence is improved;By setting second magnetic field mechanism, the size and direction adjustment of magnetic field vertical direction is realized, the possibility of comprehensive characterization to magnetic material under different magnetic field environment is widened.