2 results about "Magnetic force microscope" patented technology

The application provides a sample transmission device and method for an ultrahigh vacuum magnetic force microscope, which comprises a working box, a transition box, a sample feeding assembly, a sample transmission assembly, a sample storage assembly and a switch structure. The working box can be pumped to a set vacuum degree, and has a test position, a transfer position and a temporary storage position. The test position is used for placing a sample holder and a needle tip holder, the transfer position is used for the sample transmission assembly to take and place the sample holder and the needle tip holder on the sample feeding assembly and the sample storage assembly, and the temporary storage position is used for temporarily storing the sample holder and the needle tip holder. Compared with the operation of frequently opening the working box in the prior art, the vacuum degree of the working box is not affected during the whole working process, the established ultrahigh vacuum environment is not damaged, the whole operation process is simple and fast, and the sample transmission is facilitated. The replacement of different sample holders or needle tip holders at the test position can be completed in the working box, the working box does not need to be opened, and the stability of the vacuum degree of the working box during the sample transmission process is ensured.

The utility model discloses a kind of magnetic field devices for magnetic force microscope, it is related to magnetic field device technical field. Including table body;Rotatably arranged carousel on table body;Sample clamp is arranged on carousel;First magnetic field mechanism is arranged on table body;Second magnetic field mechanism is arranged in table body, driving mechanism for driving carousel rotation is arranged in table body;Stress loading mechanism is further arranged in table body. The utility model is by setting driving mechanism and carousel, the angle adjustment of sample is realized;By setting the size and direction adjustment of first magnetic field mechanism horizontal direction magnetic field, the possibility of comprehensive characterization to the anisotropy of magnetic material is widened;By setting stress loading mechanism, different size stress is exerted to sample upwards, the in-depth study of magnetic domain change under stress influence is improved;By setting second magnetic field mechanism, the size and direction adjustment of magnetic field vertical direction is realized, the possibility of comprehensive characterization to magnetic material under different magnetic field environment is widened.