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Magnetic force microscopy (MFM) is a variety of atomic force microscopy, in which a sharp magnetized tip scans a magnetic sample; the tip-sample magnetic interactions are detected and used to reconstruct the magnetic structure of the sample surface. Many kinds of magnetic interactions are measured by MFM, including magnetic dipole–dipole interaction. MFM scanning often uses non-contact AFM (NC-AFM) mode.
Magnetic field device for magnetic force microscopy
The utility model discloses a kind of magnetic field devices for magnetic force microscope, it is related to magnetic field device technical field. Including table body;Rotatably arranged carousel on table body;Sample clamp is arranged on carousel;First magnetic field mechanism is arranged on table body;Second magnetic field mechanism is arranged in table body, driving mechanism for driving carousel rotation is arranged in table body;Stress loading mechanism is further arranged in table body. The utility model is by setting driving mechanism and carousel, the angle adjustment of sample is realized;By setting the size and direction adjustment of first magnetic field mechanism horizontal direction magnetic field, the possibility of comprehensive characterization to the anisotropy of magnetic material is widened;By setting stress loading mechanism, different size stress is exerted to sample upwards, the in-depth study of magnetic domain change under stress influence is improved;By setting second magnetic field mechanism, the size and direction adjustment of magnetic field vertical direction is realized, the possibility of comprehensive characterization to magnetic material under different magnetic field environment is widened.
Owner:CHINA JILIANG UNIV