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447 results about "Scanning plane" patented technology

Lateral-scanning interferometer with tilted optical axis

An interferometer scans the sample surface laterally with respect to the optical axis of the interferometric objective. The objective is tilted, so that the sample surface is placed at an angle with respect to the maximum coherence plane of the instrument. By moving the sample stage laterally, at an angle, through a point at a set distance from the objective on the objective's optical axis, rather than vertically along the optical axis, different parts of the object intersect the maximum coherence plane at different times as the surface passes through the coherence plane, the precise time depending on the profile of the surface. When the OPD of a point on the object's surface is greater than the coherence length of the light source, the intensity of light reflected from this point does not produce interference fringes. Therefore, the intensity registered by the detector is approximately constant. However, when the object point enters the zone of coherence, the interference effects modulate the intensity the same way as in a regular VSI procedure. As the object moves along the scanning direction, it also has a relative vertical speed with respect to the objective because of the tilt of the objective's optical axis with respect to the scanning plane; therefore, the lateral scanning motion produces an OPD variation as the vertical scan in a conventional system. As a result, light intensity data are acquired continuously as the test surface is scanned, thus elimination the need for stitching multiple sub-sets of data.
Owner:BRUKER NANO INC

Motion tracking system for real time adaptive imaging and spectroscopy

Current MRI technologies require subjects to remain largely motionless for achieving high quality magnetic resonance (MR) scans, typically for 5-10 minutes at a time. However, lying absolutely still inside the tight MR imager (MRI) tunnel is a difficult task, especially for children, very sick patients, or the mentally ill. Even motion ranging less than 1 mm or 1 degree can corrupt a scan. This invention involves a system that adaptively compensates for subject motion in real-time. An object orientation marker, preferably a retro-grate reflector (RGR), is placed on a patients' head or other body organ of interest during MRI. The RGR makes it possible to measure the six degrees of freedom (x, y, and z-translations, and pitch, yaw, and roll), or “pose”, required to track the organ of interest. A camera-based tracking system observes the marker and continuously extracts its pose. The pose from the tracking system is sent to the MR scanner via an interface, allowing for continuous correction of scan planes and position in real-time. The RGR-based motion correction system has significant advantages over other approaches, including faster tracking speed, better stability, automatic calibration, lack of interference with the MR measurement process, improved ease of use, and long-term stability. RGR-based motion tracking can also be used to correct for motion from awake animals, or in conjunction with other in vivo imaging techniques, such as computer tomography, positron emission tomography (PET), etc.
Owner:UNIV OF HAWAII +3

Voltage contrast test structure

A method for electrically testing a semiconductor wafer during integrated-circuit fabrication process, the method including: (i) providing a scanning charged-particle microscope (SCPM), having a defined scanning plane and operative, while in any one mechanical state, to scan a surface in the scanning plane within a two-dimensional scanning window, which has a given maximum size; (ii) providing in association with any layer of the wafer, it being a test layer, one or more test structures, each test structure including normally conductive areas within a normally non-conductive background in one or more layers, which include said test layer, the conductive areas formed as one or more patterns; the patterns in said test layer include one or more clusters of mutually isolated pads; each pad is conductively connected with a corresponding distinct point on the patterns and all the pads in any one cluster are sized and arranged so that at least a significant portion of each pad falls within a common window whose size does not exceed said maximum size of said scanning window; (iii) with said test layer forming the top surface of the wafer, placing the wafer on the SCPM and adjusting the mechanical state of the SCPM so that at least a significant portion of each pad in any one of said clusters is within said scanning window; (iv) causing the SCPM, while in said mechanical state, to scan all of the pads of said one cluster and thereby to provide information about the electrical state of the respective test structure.
Owner:APPL MATERIALS ISRAEL LTD

Calibration method of correlation between single line laser radar and CCD (Charge Coupled Device) camera

The invention discloses a calibration method of correlation between a single line laser radar and a CCD (Charge Coupled Device) camera, which is based on the condition that the CCD camera can carry out weak imaging on an infrared light source used by the single line laser radar. The calibration method comprises the steps of: firstly, extracting a virtual control point in a scanning plane under the assistance of a cubic calibration key; and then filtering visible light by using an infrared filter to image infrared light only, carrying out enhancement, binarization treatment and Hough transformation on an infrared image with scanning line information, and extracting two laser scanning lines, wherein the intersection point of the two scanning lines is the image coordinate of the virtual control point in the image. After acquiring multiple groups of corresponding points through the steps, a correlation parameter between the laser radar and the camera can be solved by adopting an optimization method for minimizing a reprojection error. Because the invention acquires the information of the corresponding points directly, the calibration process becomes simpler and the precision is greatly improved with a calibrated angle error smaller than 0.3 degree and a position error smaller than 0.5cm.
Owner:NAT UNIV OF DEFENSE TECH

Phased array antenna unit characteristic near-field measurement method

ActiveCN103926474AEliminate coupling interferenceSolve the technical problem of coupling interferenceAntenna radiation diagramsMeasurement pointArray element
The invention provides a phased array antenna unit characteristic near-field measurement method. The near-field measurement method can measure directional diagrams and opening surface near fields of independent units when all the units work at the same time. According to the technical scheme, the method comprises the steps of selecting a measured phased array antenna AUT, and using a vector network analysis meter PNA connected with a PC and a controller and a near-field scanning frame probe respectively connected with the PNA and the controller to form a near-field measuring system for detecting the antenna unit amplitude phase characteristics. The AUT is used as a transmitting antenna, the probe is used as a receiving antenna, and the scanning frame probe is arranged in front of the opening face of a measuring antenna. Devices are connected according to a near-field measuring method, when the magnitude-phase characteristic am of the mth unit of the phased-array antenna is measured, a vector average method is adopted by each measuring point in a near-field scanning plane, a T/R component, an array element and the magnitude-phase characteristic H m<n>=a<m> S m<n>, n=1,...N from the array element to a measuring point space link assembly of the mth unit are measured and calculated, and the magnitude-phase characteristic am of the phased-array measuring unit is calculated.
Owner:10TH RES INST OF CETC

Automatic-mobile robot walking scope restriction system and restriction method thereof

An automatic-mobile robot walking scope restriction system and a restriction method thereof are provided; the restriction system comprises the following structures: a boundary mark (300) used for determining restriction boundary positions of a work space (100), and the boundary mark comprises regression reflection material; an automatic-mobile robot (1) walking and working in the work space, and the robot comprises a scan range finder (12) sending and receiving light signals so as to form a scanning plane, thereby carrying out range finding and scanning process to the work space; the robot also comprises a control device (11) used for receiving scan and range finding signals of the scan range finder and setting up a coordinate chart of the work space. The control device receives the scan and range finding signals reflected from the boundary mark by the scan range finder, so the positions of the boundary mark are determined; the coordinates of the restricted boundary are determined according to the positions of the boundary mark, so the automatic-mobile robot can be controlled to work in an area in the restricted boundary. The automatic-mobile robot walking scope restriction system and the restriction method thereof can save energy, are long in effective work time, high in sensitivity and low in cost.
Owner:ECOVACS ROBOTICS (SUZHOU ) CO LTD
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