381 results about "Afm atomic force microscopy" patented technology

The magnetic recording medium comprises a magnetic layer comprising a ferromagnetic powder and a binder on a nonmagnetic support. In the magnetic recording medium, a number of protrusions equal to or greater than 10 nm in height on the magnetic layer surface, as measured by an atomic force microscope, ranges from 50 to 500/1,600 μm², the binder comprises a polyurethane resin with a weight average molecular weight ranging from 100,000 to 200,000, and the magnetic layer further comprises a carbonic ester having a molecular weight ranging from 360 to 460.

Systems and methods are described for laser ablation of an analyte from a specimen and capturing of the analyte in a dispensed solvent to form a testing solution. A solvent dispensing and extraction system can form a liquid microjunction with the specimen. The solvent dispensing and extraction system can include a surface sampling probe. The laser beam can be directed through the surface sampling probe. The surface sampling probe can also serve as an atomic force microscopy probe. The surface sampling probe can form a seal with the specimen. The testing solution including the analyte can then be analyzed using an analytical instrument or undergo further processing.

A diffraction grating having a transparent supporting substrate; and a cured resin layer which is stacked on the transparent supporting substrate and which has concavities and convexities formed on a surface thereof, wherein when a Fourier-transformed image is obtained by performing two-dimensional fast Fourier transform processing on a concavity and convexity analysis image obtained by analyzing a shape of the concavities and convexities formed on the surface of the cured resin layer by use of an atomic force microscope, the Fourier-transformed image shows a circular or annular pattern substantially centered at an origin at which an absolute value of wavenumber is 0 μm⁻¹, and the circular or annular pattern is present within a region where an absolute value of wavenumber is within a range of 10 μm⁻¹ or less.

Smooth silicon films having low compressive stress and smooth tensile silicon films are deposited by plasma enhanced chemical vapor deposition (PECVD) using a process gas comprising a silicon-containing precursor (e.g., silane), argon, and a second gas, such as helium, hydrogen, or a combination of helium and hydrogen. Doped smooth silicon films and smooth silicon germanium films can be obtained by adding a source of dopant or a germanium-containing precursor to the process gas. In some embodiments dual frequency plasma comprising high frequency (HF) and low frequency (LF) components is used during deposition, resulting in improved film roughness. The films are characterized by roughness (Ra) of less than about 7 Å, such as less than about 5 Å as measured by atomic force microscopy (AFM), and a compressive stress of less than about 500 MPa in absolute value. In some embodiments smooth tensile silicon films are obtained.

The problem addressed by this invention is to provide an aromatic polyamide porous film excellent in the capability of being thinned and capable of easily exhibiting stable porosity properties even if it is used for a long period of time at high temperature. This invention can be achieved by an aromatic polyamide porous film that contains an aromatic polyamide as a main component and is such that when an atomic force microscope is used to measure a range of S μm² at least on one surface, the sectional area S(10) μm² obtained at a depth of 10 nm from the surface and the sectional area S(20) μm² obtained at a depth of 20 nm from the surface satisfy the following formulae simultaneously.

0.01≦S(10)/S≦0.3

5≦S(20)/S(10)≦20

The invention belongs to the field of atomic force microscopes and relates to a graphene-clad atomic force microscope probe and a manufacturing method and application thereof. The graphene-clad atomic force microscope probe comprises a probe base, a cantilever arm and a tip; the cantilever arm and the tip are provided with a metal layer; the tip is further provided with a graphene layer. The manufacturing method includes the steps of 1, preparing graphene solution, to be specific, adding 5-10mg of graphene to 1mL of water, and performing ultrasonic dispersion for 10min with an ultrasonic cleaner to obtain 5-10mg/mL graphene solution; and 2, preparing the graphene-clad atomic force microscope probe, to be specific, dipping the tip of the atomic force microscope probe with the metal layer on the cantilever arm and the tip, into the graphene solution of the step 1, and performing mechanical stirring for 30-60s before extracting the probe to allow natural airing.

The invention is a method for manufacturing nano tube probe tip; the pin applies to various mode of atom microscope. At first, the method decorates hydrophobe single layer film on the surface of various silicon probe pin, then it uses electrical field to eliminate the film or oxides the film into hydrophile film, it calculates the size of the activated area through the action that the pin acts onthe standard sample surface, then it fixed catalyst particles in the hydrophile area on the surface of the pin, finally, puts the pin which carries catalyst nano particles in the nano reactor and forms into nano tube.

A light extraction transparent substrate for an organic EL element includes a transparent supporting substrate; a diffraction grating having a first concavity and convexity layer having first concavities and convexities formed on a surface thereof, which is located on a surface of the transparent supporting substrate, and a microlens having a second concavity and convexity layer having second concavities and convexities formed on a surface thereof, which is located on a surface of the transparent supporting substrate. When a Fourier-transformed image is obtained by performing two-dimensional fast Fourier transform processing on a concavity and convexity analysis image obtained by analyzing the shape of each of the first and second concavities and convexities by use of an atomic force microscope, the Fourier-transformed image shows a circular or annular pattern substantially centered at an origin at which an absolute value of wavenumber is 0 μm⁻¹.

The invention relates to a low-temperature environmentally-friendly preparation method of nitrogen edge doped graphene, and belongs to the field of novel carbon nano-materials. The preparation method is characterized in that graphite powder and a nitrogen-containing polymer solid are mixed and subjected to continuous ball milling at a certain ball milling speed under the normal temperature and normal pressure so as to obtain a nitrogen edge doped graphene nanosheet, wherein no liquid agents are added during preparation. By analyzing through a scanning electron microscope and an atomic force microscope, the product is a lamellar structure which is uniform in dispersion and less than 1 nanometer in thickness. The analysis result of an X-ray photoelectron spectroscopy shows that the prepared product contains nitrogen, carbon, oxygen and other elements, and therefore, that the nitrogen edge doped graphene nanosheet is successfully prepared can be verified.

The invention relates to a method for observing the dislocation type of a heteroepitaxial growth material of gallium nitride (GaN) and measuring the dislocation density. The method is characterized by directly observing the dislocation type of the surface of a gallium nitride epitaxial film by using etching of molten potassium hydroxide and a potassium hydroxide and magnesia eutectic mixture in combination with a scanning electron microscope and an atomic force microscope, analyzing and researching the characteristics and the distribution of dislocations of different types and calculating the dislocation density. The method is convenient and fast and is suitable for analytical testing of nitrides which grow through different processes. The characteristics of dislocations of different types in different nitride samples can be researched to obtain the distribution of various dislocations on the surface, and the densities and the total dislocation density of the dislocations of various types can be accurately calculated.

The invention relates to a 2D micro-positioning platform for an atomic force microscope and a measuring method of mechanical parameters. The 2D micro-positioning platform is characterized in that the center of the 2D micro-positioning platform is provided with a hole for equipping a PZT scanning tube, wherein an X position and a Y position perpendicular to each other are provided with two adjusting knobs respectively, the two adjusting knobs are connected with two drive rods which are connected with the PZT scanning tube, and the 2D micro-positioning platform is fixed on a base. The moving range of the 2D micro-positioning platform of the invention is 3*3 square mm in the horizontal direction; and the maximum scanning shift of the PZT scanning tube is 20Mum. By utilizing an AFM microscope with the improved 2D micro-positioning platform, the mechanical parameters of a fixed point on a microstructure can be tested, the mechanical-displacement function test of micro point-to-point and the continuous elastic coefficient test in a micro area can be carried out, and all the tests produce good consistency results.

We describe a new technique, standing wave axial nanometry (SWAN), to image the axial location of a single nanoscale fluorescent object with sub-nanometer accuracy and 3.7 nm precision. A standing wave, generated by positing an atomic force microscope tip over a focused laser beam, is used to excite fluorescence; axial position is determined from the phase of the mission intensity.

A semiconductor device having a polymer layer and a method of fabricating the same is provided. A two-step plasma treatment for a surface of the polymer layer includes a first plasma process to roughen the surface of the polymer layer and loosen contaminants, and a second plasma process to make the polymer layer smoother or make the polymer layer less rough. An etch process may be used between the first plasma process and the second plasma process to remove the contaminants loosened by the first plasma process. In an embodiment, the polymer layer exhibits a surface roughness between about 1% and about 8% as measured by Atomic Force Microscopy (AFM) with the index of surface area difference percentage (SADP) and/or has surface contaminants of less than about 1% of Ti, less than about 1% of F, less than about 1.5% Sn, and less than about 0.4% of Pb.

The invention discloses a preparation method for an asphalt sample for AFM (Atomic Force Microscopy) observation. The preparation method comprises the following steps of putting asphalt samples to be observed into a constant temperature oven and heating the asphalt samples to be observed to be melted; putting a clean sample holding vessel into an oven in the same temperature, taking out and putting the sample holding vessel on a horizontal table top, rapidly taking out the asphalt samples to be observed and evenly stirring, fetching appropriate asphalt samples to be observed to be injected into the sample holding vessel in one time, enabling the height of the asphalt samples to be slightly lower than the edge of the sample holding vessel, covering a cover and observing the sample holding vessel after the room temperature is cooled. The invention also discloses the sample holding vessel for the above method. The sample holding vessel comprises a vessel body (1) and a cover (2) which is matched with the vessel body (1); the cover (2) covers the vessel body (1). The preparation method is simple in operation and easy to operate, the asphalt samples form into smooth surfaces due to natural flow forming, shapes and thickness of the asphalt samples are effectively controlled through the size of the sample holding vessel, and AFM observation requirements for the flatness and the thickness of the samples are satisfied.

An apparatus and method of analyzing a sample to be scanned within a hermetically sealed housing of an atomic force microscope (AFM) while the interior of the housing is maintained at one of a number of various environmental conditions. The AFM includes an XYZ stage assembly on which a sample holder supporting the sample may be releasably positioned. The stage assembly allows for the manipulation of the sample and sample holder in the X, Y and Z axes without disturbing any environmental condition present within the chamber due to the hermetic seal maintained between the stage assembly and the AFM during the motion of the stage assembly. The ability of the stage assembly to manipulate the sample in each of the three directions while the sample is enclosed within the AFM also allows the AFM to compensate for non-parallel scanning planes and for drift in all three directions occurring in the sample because of the different environmental conditions in which the sample may be scanned. The scan is performed by the AFM using a scanning tube sealingly disposed within the housing and capable of moving small distances in the X, Y and Z axes. Fine adjustments to the position of the tube in order to accurately scan the sample are accomplished by the inclusion of sectioned piezoelectric elements within the tube which are capable of adjusting the position of a probe or cantilever attached to the end of the tube in small, highly accurate distances in each of the X, Y and Z directions.

The invention provides probe induction surface plasmon resonance lithographic equipment and a photoetching method thereof. The device consists of a surface plasma excitation device, a probe control device, a sample platform, a probe state detection device, an optical microscope and a control system. The device has the characteristics that the needed laser power is low, the photoetching distinguishability is high, the probe is not easy to be damaged, and the photoetching film is simple; in addition, the device has the function of an atomic force microscope.

The invention discloses a method for evaluating water damage resistance of an asphalt mixture based on molecular dynamics. The method is mainly characterized in that an asphalt-aggregate two-phase interface model and an asphalt-water-aggregate three-phase interface model are constructed by means of a molecular dynamic theory and simulation calculation software; the adhesion strength of asphalt andaggregate in the asphalt mixture is judged by calculating the adhesion work of the asphalt and the aggregate; and the water damage resistance of the asphalt mixture is quantitatively evaluated by calculating the ratio of the adhesion work of the asphalt mixture in a water-free state to the adhesion work of the asphalt mixture in a water-containing state, and the larger the ratio is, the strongerthe water damage resistance of the asphalt is. The method overcomes the defects that a water immersion method can only realize qualitative and experimental evaluation, cannot realize quantification and is greatly influenced by human subjective factors; and a surface energy method and an atomic force microscope method are complex in operation, high in technical requirements, long in consumed time,high in manufacturing cost, difficult to control experimental conditions and the like. The method can provide a basis and a foundation for material selection of the asphalt mixture, and thus has goodapplication prospects.

The invention relates to a method for preparing an antitumor drug carrier by using a rolling circle amplification technology. An amplification primer DNA is assembled on the surface of a nano-mateiral, a circular DNA amplification template and other amplification mixtures are added and then rolling circle amplification is performed, and the prepared product is a long single-stranded DNA antitumor drug carrier obtained by extension from the surface of nano-gold. The primer DNA is extended to a microsize scale by means of room temperature amplification and can be in comparison with a non-amplified gold-DNA control group by means of agarose electrophoresis; after amplification, the DNA becomes longer, resulting in delay in the electrophoresis experiment. Besides, in an atomic force microscopy image, the amplified long-chain DNA extending from the surface of the nano-material can be intuitively observed. The nano-scale biological composite structure constructed by the rolling circle amplification technology can be used for the researches on novel antitumor drug carriers.