322 results about "Afm atomic force microscopy" patented technology

The invention discloses a biological scaffold viscoelasticity evaluation method and related equipment, and aims to overcome the defects of an existing biological scaffold viscoelasticity test method and biological tissue suitability quantitative evaluation. The method comprises the following steps: determining a target implantation part, and acquiring force relaxation experimental data of a biological scaffold by using an atomic force microscope; judging a contact point of the probe and the bracket based on the data; determining the moment when the force signal is stable after the support is compressed to the preset deformation according to the contact point as a force relaxation starting point; calculating the characteristic time when the force value is attenuated to half by taking the starting point as a timing starting point as a microscopic viscoelasticity index; and finally, realizing quantitative evaluation of viscoelasticity suitability by comparing the characteristic time of the stent and the target tissue.

The invention relates to the field of atomic force microscope probe cleaning, and provides a method for cleaning an atomic force microscope probe and detecting the cleaning effect, and the method for cleaning the atomic force microscope probe comprises the steps: providing a cleaning object with a tip, and the diameter of the tip of the cleaning object is not greater than the diameter of the tip of the probe of an atomic force microscope; starting the atomic force microscope, enabling the probe and the cleaning object to move relatively, enabling the tip of the cleaning object to face the tip of the probe, and enabling the tip of the cleaning object and the tip of the probe to interact with each other so as to remove pollutants at the tip of the probe. The method can be used for efficiently and conveniently cleaning pollutants at the tip of the probe of the atomic force microscope, so that the service life of the probe can be prolonged, and various measurement performance indexes related to the probe can be improved; and the probe can be more conveniently and widely applied to scanning of various samples, and the application value is high.

The invention provides a myopia grading method driven by coupling of mechanical and morphological characteristics of corneal cells, and belongs to the technical field of myopia eye disease diagnosis and occurrence and development mechanisms based on artificial intelligence. The surface topography, Young modulus, adhesive power and other mechanical characteristics of corneal cells of patients with low, medium and high myopia are measured, corneal cell surface topography images obtained by an atomic force microscope are used as a cytoskeleton quantitative analysis data set, and edge extraction, brightness detection and multi-scale image segmentation methods are utilized to determine the surface topography of the corneal cells of the patients with low, medium and high myopia. The overall cytoskeleton distribution characteristics are quantified through the cytoskeleton region average complexity and cytoskeleton region average similarity, the method does not depend on dyeing, the tissue structure of the cytoskeleton can be evaluated more comprehensively, the method is suitable for more diversified cytoskeleton structures including complex clusters, a myopia grading model is established, and the myopia grading efficiency is improved. And a more direct cellular-level experimental basis is provided for the research on the occurrence and development mechanism of myopia.

An apparatus and method directed to sample characterization with an AFM using a pulsed IR laser in force volume mode, i.e., force volume mode combined with AFM-IR, referred to herein as FV AFM-IR. In this way, lateral forces are suppressed during probe positioning, and precise force control allows adjusting the tip-sample interaction force, including keeping the tip-sample interaction force constant or exerting pulling forces. Nano-spectroscopic measurements with sub-20 nm, and even sub-10 nm resolution can be acquired together with nano-mechanical and other property measurements. Notably, probe resonance shifts can be compensated with frequency tracking methods, and signal normalization by the Q-factor can be used to ensure that the extracted light-induced surface pulse force is substantially independent of damping.

The invention relates to a high-order transverse mode compression state preparation device based on optical parameter resonant cavity mode selection, and belongs to the technical field of quantum state light field generation. Fundamental frequency light and pump light output by the laser source generate a high-order transverse mode light field through the mode conversion module, and then the high-order transverse mode light field enters the optical parametric resonant cavity to be subjected to parametric down-conversion with the nonlinear crystal. The cavity length of the optical parametric resonant cavity is locked at the optimal pumping mode position corresponding to the high-order transverse mode compression state, so that resonance of an impurity mode in the optical parametric resonant cavity can be avoided, and the compression level of a high-order transverse mode light field is improved. Under injection of high-order transverse mode pump light, the pump mode is purified through the optical parametric resonant cavity of the annular structure, the compression level of a high-order transverse mode light field is enhanced, adjustment is easy, practicability is high, productization is easy, and wide application prospects are achieved in the fields of quantum space measurement, biological measurement, atomic force microscope detection and the like.

The invention relates to an alkali metal gas chamber anti-relaxation self-assembly molecular coating adsorption energy quantification method, which finally realizes the physical quantification of the anti-relaxation coating adsorption energy by establishing a contact angle and surface topography collaborative characterization model and combining an adsorption-desorption dynamic formula, and is characterized by comprising the following steps: 1) establishing a contact angle and surface topography collaborative characterization model; depositing organosilane on a gas chamber glass substrate by adopting a liquid phase self-assembly method to form an anti-relaxation coating sample; step 2, selecting a plurality of measuring points on the anti-relaxation coating sample, dropping a 1 [mu] L ultrapure water liquid drop on each measuring point, determining a polarization retention angle of each measuring point according to the liquid drop height and the liquid drop substrate radius obtained by a contact angle measuring instrument, and scanning a local area of the corresponding measuring point by using an atomic force microscope (AFM), extracting an arithmetic mean value Ra of the surface roughness parameter and a root-mean-square value Rq of the surface roughness parameter as quantitative indexes of the polarization maintaining cross section; and step 3, taking free energy formed by the molecular layer of the coating as coating adsorption energy delta G.

The invention relates to a terahertz near-field imaging light path calibration device and a terahertz near-field imaging light path calibration method. The device comprises a first visible light source, a second visible light source, a first collimation visible light source, a second collimation visible light source, a first light path collimation system, a second light path collimation system, a light path adjusting system, a circular reflector, a terahertz quantum cascade laser, a thermal detection array, a terahertz quantum well detector and an atomic force microscope platform. The THz laser source and the detector are simulated through the divergent visible light source, the lifting position point of the light path is calculated, light beams can be accurately coupled to the position of the needle point after being focused, errors caused by improper light path adjustment are reduced, meanwhile, the overlapping effect of light spots at the needle point is calibrated through the circular reflector and the thermal detection array, and the detection accuracy is improved. And the thermal detection array is used for observing the convergence effect of THz reflection light spots at the position of the detector, so that the effective focusing and coupling efficiency of THz waves in a near-field region of a probe sample can be improved.

The invention relates to a method for measuring wafer surface energy in hybrid bonding based on a chemically modified probe. The method comprises the following steps: carrying out surface pretreatment on an atomic force microscope probe and a wafer sample; constructing same functional group modification layers on the surfaces of the microscope probe and the wafer sample; the bending sensitivity, the elastic coefficient and the curvature radius of the probe are calibrated; acquiring a force-distance curve based on interaction between the probe covered by the functional group modification layer and the surface of the wafer sample, and calculating initial adhesion work based on the force-distance curve; and performing error correction on the initial adhesion work by using the surface energy measured by a contact angle method of a standard wafer sample, and establishing a quantitative mapping relation between the corrected adhesion work and the bonding strength. Compared with the prior art, the method has the advantages that the probe is subjected to functional group modification, the adhesive force of the surface of the sample is measured through the functionalized probe, and the surface energy of the wafer sample in mixed bonding is calculated in mixed bonding, so that the subsequent bonding strength of the sample is estimated.

The invention discloses a dust-sticking roll dust removal effect detection device, which comprises a detection box and a test box, an atomic force microscope is installed on the detection box, a lifting mechanism is installed at the upper end of the test box, and the lower end of the lifting mechanism penetrates through the side wall of the test box and extends into the test box. The lower end of the lifting mechanism is connected with an angle adjusting mechanism, the lower end of the angle adjusting mechanism is connected with a rotating frame, and a reciprocating motion mechanism is installed in the rotating frame. An artificial intelligence algorithm and a real-time dynamic monitoring technology are introduced, errors caused by manual subjective judgment are avoided, the dust removal effect of the sticky roll can be evaluated more accurately, meanwhile, the detection efficiency is greatly improved through the automatic detection process, the requirement of large-scale production is met, the adsorption mechanism and the dust removal effect of the sticky roll can be deeply known, and the dust removal efficiency is improved. Important reference basis is provided for research, development and improvement of the sticky roll, the production process and formula can be adjusted according to the detection result, and the product quality and performance are improved.

To provide a laminate that can suppress a decrease in gas barrier property after retort processing when used in a packaging bag for a retort pouch or the like.SOLUTION: Provided is a laminate comprising at least: a barrier film in which a substrate, an inorganic oxide layer, and a coating layer with a barrier property are layered in this order; an adhesive agent layer; and a sealant layer, wherein the substrate comprises a stretched substrate that includes polypropylene as the primary component thereof, the sealant layer includes polypropylene as the primary component thereof, the barrier film is positioned such that the coating layer faces the adhesive agent layer side, the elastic modulus of a cross-section of the adhesive agent layer in the laminate is 100.0 MPa or less as measured using an atomic force microscope (AFM), and the indentation hardness from a cross-section of the coating layer in the laminate is 0.9 GPa to 1.7 GPa as measured using a nano-indentation method.SELECTED DRAWING: Figure 1

The invention relates to the field of atomic force microscopes, and provides a method for detecting the pollution degree of an atomic force microscope probe and cleaning pollutants of the atomic force microscope probe, and the detection method comprises the steps: obtaining a first fluorescence signal of a probe insertion section when the probe is inserted, and obtaining a second fluorescence signal of a termination section; and comparing the first fluorescence signal with the second fluorescence signal, and determining the pollution degree of the probe. According to the detection method, the pollution degree of the atomic force microscope probe can be accurately judged, the pollution degree of the probe can be known only by inserting the probe once, the efficiency is high, quantitative comparison is facilitated, the method can be used for real-time monitoring of the pollution degree of the probe, and the detection accuracy is improved. Therefore, the cleaning opportunity of the probe is automatically judged, and the end point of the probe cleaning operation is automatically judged.

The invention belongs to the technical field of rivet-free bonding, discloses a CNN-Transform-based mechanical property prediction method for a rivet-free bonded joint, and aims to solve the problems that the existing mechanical property detection of the rivet-free bonded joint needs a destructive test, the prediction efficiency is low, and the prediction precision is insufficient. The method comprises the following steps: firstly, acquiring micron-scale and nano-scale morphology images of an upper plate and a lower plate of a rivet-free bonded joint through a white light interference microscope and an atomic force microscope, and completing standardized pretreatment; feature re-calibration is completed through a double-plate cross-scale interaction attention enhancement module, depth features are extracted through a four-branch CNN, and global association is established through cross-plate interaction Transformer; and finally, predicting the maximum peak load and failure displacement of the joint under the tensile shear working condition through the multi-regression head optimized by the same variance uncertainty loss. The method has the advantages of low prediction cost, high prediction efficiency, accurate precision and the like.

The invention discloses a sample stage and an atomic force microscope with the same, and relates to the technical field of NV microscopes. The sample table comprises a mounting base and a circuit board, the mounting base defines a containing groove, the circuit board is detachably arranged in the containing groove and used for bearing a sample, in the first direction, one end of the containing groove is an open end, the circuit board can be moved into or out of the containing groove through the open end in the first direction, and the first direction is perpendicular to the thickness direction of the circuit board; the circuit board has a microwave antenna adapted to radiate microwaves to the sample. Therefore, the circuit board can be moved into or out of the accommodating groove from the open end of the accommodating groove along the first direction, so that the circuit board can be conveniently detached from the mounting seat, a sample can be conveniently taken and placed outside the sample table, the sample taking and placing difficulty can be favorably reduced, a to-be-measured part of the sample can be conveniently and accurately corresponding to the microwave antenna, and the measurement accuracy is improved. The placement position and posture of the sample can be accurately controlled, the test efficiency and the test precision can be improved, the operation is simple, and the implementation is easy.

The invention relates to a low-stress chemical mechanical etching process suitable for fragile materials, which belongs to the technical field of etching processing of fragile materials and comprises a precise chemical mechanical polishing machine, a polishing pad, a polishing solution conveying and managing system and end point detection equipment. The precise chemical mechanical polishing machine comprises a multi-zone pressure controllable polishing head, a high-precision rotating speed control system and a real-time thickness measuring system, a polishing pad is a polishing disc made of porous polyurethane materials, and the polishing liquid conveying and managing system comprises a multi-channel metering pump system and a stirring and temperature control unit. And the end point detection equipment comprises a surface profilometer, an atomic force microscope and a transmission electron microscope. According to the method, through fine cooperation of chemical reaction and mechanical grinding, microcrack initiation and propagation in the polishing process are effectively inhibited, surface and subsurface damage of the fragile material is remarkably reduced, the machined surface which is ultrahigh in smoothness and free of damage is obtained, and meanwhile the high material removal rate is kept.

The invention relates to an all-solid-state battery thin-layer electrode device for multi-mode in-situ interface research. The all-solid-state battery thin-layer electrode device comprises the following components: a solid electrolyte substrate; the functional thin layer is arranged on the surface of the solid electrolyte substrate; the functional thin layer has conductivity; the functionalized thin layer allows a detection signal of an in-situ characterization technology to effectively penetrate or be reflected from the surface of the functionalized thin layer; the in-situ characterization techniques include atomic force microscopes, optical microscopes, and Raman spectroscopy, X-ray photoelectron spectroscopy, infrared spectroscopy, or X-ray diffraction. The invention provides a universal thin-layer electrode design and system and a thin-layer electrode in-situ imaging and spectroscopic characterization method for all-solid-state battery interface reaction. The objective of the invention is to expose a solid electrolyte-electrode interface reaction process which is difficult to observe in an effective detection range of various characterization technologies so as to realize real-time and in-situ visualization and accurate analysis of a dynamic evolution process of an internal interface of an all-solid-state battery.

Provided are an apparatus and a method for identifying a target position in an atomic microscope. An apparatus is configured to acquire result data identifying the cantilever from an image using an identification model learned to identify the cantilever based on the image photographed by a photographing unit, and calculate a target position from the cantilever using the acquired result data, in which the result data include at least one of bounding box data representing a bounding box including a boundary of the cantilever and segmentation data obtained by segmenting the cantilever and an object other than the cantilever.

The invention discloses a nanoscale anti-oxidation film thickness measuring method, and relates to the technical field of nanoscale film thickness measurement, and the nanoscale anti-oxidation film thickness measuring method comprises the following operation steps: soaking a metal foil containing a nanoscale anti-oxidation film in a hydrochloric acid solution, recording the residual liquid as an extraction liquid, and recording the volume of the extraction liquid as V1; diluting the extract, and recording the dilution rate as a; carrying out ultrasonic treatment on the diluted extraction liquid, taking the liquid, titrating the liquid on a polished silicon wafer, and recording the volume of the taken liquid as V2; carrying out heating treatment under a protective atmosphere, measuring the wetting and spreading area, and recording the wetting area as S2; performing multi-point measurement on the film thickness of the obtained sample through an atomic force microscope, and calculating the average film thickness which is the minimum fragment film thickness h2; analyzing the proportion of black spots in the measured picture through pixel points, and recording the proportion of the black spots as b; and substituting into a formula h1 = a * S2 * V1 * b * h2 / (V2 * S1) to calculate the film thickness h1 of the nanoscale anti-oxidation film.

The magnetic tape includes a non-magnetic support, and a magnetic layer containing a ferromagnetic powder. A rate of change in an area ratio of a protrusion having a height of 5 nm or more and 10 nm or less, which is obtained by measuring a measurement region of 5 μm×5 μm on a surface of the magnetic layer before and after 1000 reciprocating slides with respect to an LTO 8 head at a head tilt angle of 15° in an environment of a temperature of 35° C. and a relative humidity of 80%, with an atomic force microscope, is 10.0% or less.

To provide a conductive member that is excellent in color streak generation prevention properties.SOLUTION: A conductive member has a particulate conductive part having an area ratio of 15 area% or more, which is measured when a conductive point on its surface is measured using a current simultaneous measurement atomic force microscope. The conductive member has the particulate conductive part having an average area of 0.05 μm2 or more, which is measured when the conductive point on its surface is measured using the current simultaneous measurement atomic force microscope.SELECTED DRAWING: Figure 1

The present invention relates to a sulfide-based solid electrolyte containing lithium (Li), phosphorus (P), sulfur (S), boron (B), and a plurality of halogen elements and having an argyrodite-type crystal structure, wherein the sulfide-based solid electrolyte satisfies formula 1. [Formula 1] 3.6 ≤ (CxB) / A ≤ 5.5 In formula 1, A is Dmax measured by a laser diffraction and particle size distribution measurement method, B is D50, and C is an elastic modulus measured using an atomic force microscope (AFM).

A lithium secondary battery according to the present invention includes a positive electrode and a negative electrode disposed opposite the positive electrode. The slip step difference of the positive electrode is 20 nm or less. The slip segment difference is defined in such a manner that, in a line scan pattern obtained by measuring the surface of the positive electrode in a fully discharged state after 500 times of charging and discharging of the battery using an atomic force microscope (AFM), the distance between a pair of parallel lines in which the slope of the observed mountain shape is not zero may include two or more.

The present invention discloses a tunable pump terahertz broadband near-field imaging and spectroscopy device and its usage method, which relates to the field of terahertz near-field microscopes. The device includes: a first fiber laser oscillator, a second fiber laser oscillator, an optical fiber beam splitter, a first delay line, a second delay line, a third delay line, a fourth delay line, a transmitting antenna, a first parabolic mirror, a second parabolic mirror, an atomic force microscope, a receiving antenna, a processor, a synchronous phase-locked loop, a first energy adjustment module, a second energy adjustment module, a first reflector and a second reflector; the present invention realizes the advantages of high pump light energy and tunable pump wavelength in a terahertz near-field microscope.

The application discloses a vacuum sample clamp device combined with femtosecond laser sample preparation and atomic force microscope (AFM), and relates to the technical field of clamps.The vacuum sample clamp device combined with femtosecond laser sample preparation and atomic force microscope (AFM) comprises an outer shell, a supporting table, a sample table and a position recorder, the outer shell is provided with an inner cavity, a laser inlet and a communication hole, the laser inlet and the communication hole are communicated with the inner cavity respectively, the laser inlet is used for allowing sample preparation laser to enter, and the communication hole is used for being communicated with a vacuum device; the supporting table is movably connected to the inner cavity; the sample table is placed on the supporting table, the sample table is provided with a placing position and a mounting cavity, the placing position is located above the mounting cavity, and the placing position is used for placing a sample; and the position recorder is mounted in the mounting cavity and is used for recording displacement coordinates in a laser sample preparation process after the sample is placed in the placing position. The technical scheme provided by the application can realize fast transfer between a femtosecond laser sample preparation processing environment and an AFM test environment without repositioning.

The present invention discloses an atomic force microscope low-temperature probe, which is used to be placed in a low-temperature dewar and includes: a low-temperature objective lens barrel; a sample stage, which is located below the low-temperature objective lens barrel and is provided with a sample placement groove, which is used to place the sample, and the sample placement groove is suitable for moving relative to the low-temperature objective lens barrel; a sample displacement assembly, which is used to install the sample stage and to drive the sample stage to move in space; a probe displacement assembly, which is equipped with an NV probe, which is used to drive the NV probe to move in space, and the NV probe is suitable for moving above the sample placement groove, and the probe displacement assembly and the sample displacement assembly are arranged side by side. The atomic force microscope low-temperature probe of the present invention can ensure that the probe is completely placed in a low temperature, improve the accuracy of sample observation, and the sample placement groove can quickly disassemble and replace the sample during the movement of the low-temperature objective lens barrel.

The utility model is suitable for the technical field of microscope probe boxes, and provides an atomic force microscope probe box convenient for taking and placing a probe. The groove is formed in the center of the top of the box body; the containing groove is formed in the bottom of the interior of the groove; the rotating plate rotates at the central position of the inner wall of one side of the accommodating groove; the supporting plate is fixed to the position, close to the lower side of the rotating plate, of the inner side wall of the containing groove. The sliding table slides on the inner wall of the side, adjacent to the rotating plate, of the containing groove; the fixed table is fixed on the inner wall of the other side, adjacent to the rotating plate, of the storage groove through a bolt; one side end of the rotating plate rotates downwards when the linkage pressing rod is pressed downwards according to the lever principle, the other side end of the rotating plate tilts upwards, a probe on the rotating plate is in the state that one side of the probe is low and the other side of the probe is high, the rotating plate is shorter than the probe, the upward side end of the probe is not blocked, the probe can be directly taken conveniently, and the taking operation of the probe is convenient.

The purpose of the present invention is to provide a laminate excellent in light resistance without being provided with a flattening layer, and a manufacturing method capable of efficiently manufacturing the laminate. The present invention relates to a laminate having a dye-containing resin layer and an inorganic compound layer on both surfaces of the dye-containing resin layer, wherein the arithmetic average roughness Ra1 of both surfaces of the dye-containing resin layer as measured with an atomic force microscope is 2.5 nm or less, or the arithmetic average roughness Ra2 of the surfaces of the two inorganic compound layers as measured with an atomic force microscope is 2.3 nm or less.

The utility model belongs to the field of atomic force microscopes, and particularly relates to a modular atomic force microscope, which solves the problem that a sample holder of a traditional atomic force microscope in the prior art needs to fix a sample manually and is inconvenient to operate, and comprises a base, and a laser transmitter module and a reflector are mounted on the upper surface of the base. An optical microscope module, a CCD camera module and a monitor module are installed on the right side of the upper surface of the base, a fixing module is arranged in the middle of the upper surface of the base and comprises a cavity formed in the base, a servo motor is fixedly connected to the back face of the base, and an output rotating shaft of the servo motor penetrates through the base and extends into the base. An output rotating shaft of the servo motor is fixedly connected with a positive and negative threaded rod, two threaded surfaces of the positive and negative threaded rod are in threaded connection with threaded rings, and the outer surface of each threaded ring is fixedly connected with two movable plates, so that a sample can be automatically fixed on the whole, and the whole device has a relatively good fixing effect.

A single crystal positive electrode material, a preparation method therefor, and a lithium-ion battery. The size distribution B90=(P90-P10) / P50 of single crystal particles of the single crystal positive electrode material satisfies: 0.9≤B90≤1.4; and the Young's modulus E of the positive electrode material measured by means of an atomic force microscope satisfies: 100 GPa≤E≤200 GPa. The single crystal particles of the single crystal positive electrode material have a specific particle size distribution, which enables the single crystal positive electrode material to have high compaction density and have a high Young's modulus, so that the single crystal positive electrode material can bear higher rolling force in a battery preparation process, thereby increasing the volumetric energy density of a lithium-ion battery containing the positive electrode material.

The invention relates to the field of wafer detection, in particular to a wafer detection device and method, the device comprises a scanning electron microscope, an atomic force microscope and piezoelectric ceramics, the scanning electron microscope comprises a lens cone, an objective lens and a sample chamber, the objective lens is arranged in the sample chamber, and a sample table for bearing a wafer to be detected is arranged in the sample chamber; the objective lens is used for acquiring a two-dimensional morphology image of the surface of the wafer to be detected; the atomic force microscope is arranged in the sample chamber, the atomic force microscope is not in contact with the sample table, the atomic force microscope comprises a cantilever and a probe installed at the end of the cantilever, the probe is used for obtaining the three-dimensional structure of a wafer to be detected, and the piezoelectric ceramic is arranged at the end, away from the probe, of the cantilever; and the piezoelectric ceramic pressure realizes fine adjustment of the probe in horizontal and height directions through directional deformation. Vibration of the sample table and transmission of heat to the atomic force microscope are effectively isolated, and measurement errors caused by mismatch of vibration noise and thermal expansion are reduced. Precise control of the position of the probe is realized through piezoelectric ceramics.

The application provides a feature region identification method and system based on an atomic force microscope (AFM) topography, and the method comprises the following steps: acquiring an AFM topography data matrix of a nano preparation region; dividing the AFM topography data matrix into a plurality of sub-regions corresponding to preparation structures according to the number of the preparation structures; performing a region positioning step on each sub-region to determine the start and end ranges of a feature region representing a nano structure in a vertical direction in each sub-region; performing a center line fitting step in the start and end ranges of the feature region, fitting feature points in multiple rows of data to obtain a feature center line representing an extension direction of the nano structure; and performing a row-by-row identification operation on multiple rows of topography data in the feature region along the feature center line to identify feature region boundary points in each row of data. The technical scheme provided by the application realizes batch, automatic and high-precision identification of a plurality of nano structure feature regions in a complex AFM topography.