142 results about "Afm atomic force microscopy" patented technology

The invention discloses a biological scaffold viscoelasticity evaluation method and related equipment, and aims to overcome the defects of an existing biological scaffold viscoelasticity test method and biological tissue suitability quantitative evaluation. The method comprises the following steps: determining a target implantation part, and acquiring force relaxation experimental data of a biological scaffold by using an atomic force microscope; judging a contact point of the probe and the bracket based on the data; determining the moment when the force signal is stable after the support is compressed to the preset deformation according to the contact point as a force relaxation starting point; calculating the characteristic time when the force value is attenuated to half by taking the starting point as a timing starting point as a microscopic viscoelasticity index; and finally, realizing quantitative evaluation of viscoelasticity suitability by comparing the characteristic time of the stent and the target tissue.

The invention belongs to the technical field of rivet-free bonding, discloses a CNN-Transform-based mechanical property prediction method for a rivet-free bonded joint, and aims to solve the problems that the existing mechanical property detection of the rivet-free bonded joint needs a destructive test, the prediction efficiency is low, and the prediction precision is insufficient. The method comprises the following steps: firstly, acquiring micron-scale and nano-scale morphology images of an upper plate and a lower plate of a rivet-free bonded joint through a white light interference microscope and an atomic force microscope, and completing standardized pretreatment; feature re-calibration is completed through a double-plate cross-scale interaction attention enhancement module, depth features are extracted through a four-branch CNN, and global association is established through cross-plate interaction Transformer; and finally, predicting the maximum peak load and failure displacement of the joint under the tensile shear working condition through the multi-regression head optimized by the same variance uncertainty loss. The method has the advantages of low prediction cost, high prediction efficiency, accurate precision and the like.

The invention relates to an all-solid-state battery thin-layer electrode device for multi-mode in-situ interface research. The all-solid-state battery thin-layer electrode device comprises the following components: a solid electrolyte substrate; the functional thin layer is arranged on the surface of the solid electrolyte substrate; the functional thin layer has conductivity; the functionalized thin layer allows a detection signal of an in-situ characterization technology to effectively penetrate or be reflected from the surface of the functionalized thin layer; the in-situ characterization techniques include atomic force microscopes, optical microscopes, and Raman spectroscopy, X-ray photoelectron spectroscopy, infrared spectroscopy, or X-ray diffraction. The invention provides a universal thin-layer electrode design and system and a thin-layer electrode in-situ imaging and spectroscopic characterization method for all-solid-state battery interface reaction. The objective of the invention is to expose a solid electrolyte-electrode interface reaction process which is difficult to observe in an effective detection range of various characterization technologies so as to realize real-time and in-situ visualization and accurate analysis of a dynamic evolution process of an internal interface of an all-solid-state battery.

Provided are an apparatus and a method for identifying a target position in an atomic microscope. An apparatus is configured to acquire result data identifying the cantilever from an image using an identification model learned to identify the cantilever based on the image photographed by a photographing unit, and calculate a target position from the cantilever using the acquired result data, in which the result data include at least one of bounding box data representing a bounding box including a boundary of the cantilever and segmentation data obtained by segmenting the cantilever and an object other than the cantilever.

The magnetic tape includes a non-magnetic support, and a magnetic layer containing a ferromagnetic powder. A rate of change in an area ratio of a protrusion having a height of 5 nm or more and 10 nm or less, which is obtained by measuring a measurement region of 5 μm×5 μm on a surface of the magnetic layer before and after 1000 reciprocating slides with respect to an LTO 8 head at a head tilt angle of 15° in an environment of a temperature of 35° C. and a relative humidity of 80%, with an atomic force microscope, is 10.0% or less.

The present invention relates to a sulfide-based solid electrolyte containing lithium (Li), phosphorus (P), sulfur (S), boron (B), and a plurality of halogen elements and having an argyrodite-type crystal structure, wherein the sulfide-based solid electrolyte satisfies formula 1. [Formula 1] 3.6 ≤ (CxB) / A ≤ 5.5 In formula 1, A is Dmax measured by a laser diffraction and particle size distribution measurement method, B is D50, and C is an elastic modulus measured using an atomic force microscope (AFM).

A lithium secondary battery according to the present invention includes a positive electrode and a negative electrode disposed opposite the positive electrode. The slip step difference of the positive electrode is 20 nm or less. The slip segment difference is defined in such a manner that, in a line scan pattern obtained by measuring the surface of the positive electrode in a fully discharged state after 500 times of charging and discharging of the battery using an atomic force microscope (AFM), the distance between a pair of parallel lines in which the slope of the observed mountain shape is not zero may include two or more.

The application discloses a vacuum sample clamp device combined with femtosecond laser sample preparation and atomic force microscope (AFM), and relates to the technical field of clamps.The vacuum sample clamp device combined with femtosecond laser sample preparation and atomic force microscope (AFM) comprises an outer shell, a supporting table, a sample table and a position recorder, the outer shell is provided with an inner cavity, a laser inlet and a communication hole, the laser inlet and the communication hole are communicated with the inner cavity respectively, the laser inlet is used for allowing sample preparation laser to enter, and the communication hole is used for being communicated with a vacuum device; the supporting table is movably connected to the inner cavity; the sample table is placed on the supporting table, the sample table is provided with a placing position and a mounting cavity, the placing position is located above the mounting cavity, and the placing position is used for placing a sample; and the position recorder is mounted in the mounting cavity and is used for recording displacement coordinates in a laser sample preparation process after the sample is placed in the placing position. The technical scheme provided by the application can realize fast transfer between a femtosecond laser sample preparation processing environment and an AFM test environment without repositioning.

The utility model is suitable for the technical field of microscope probe boxes, and provides an atomic force microscope probe box convenient for taking and placing a probe. The groove is formed in the center of the top of the box body; the containing groove is formed in the bottom of the interior of the groove; the rotating plate rotates at the central position of the inner wall of one side of the accommodating groove; the supporting plate is fixed to the position, close to the lower side of the rotating plate, of the inner side wall of the containing groove. The sliding table slides on the inner wall of the side, adjacent to the rotating plate, of the containing groove; the fixed table is fixed on the inner wall of the other side, adjacent to the rotating plate, of the storage groove through a bolt; one side end of the rotating plate rotates downwards when the linkage pressing rod is pressed downwards according to the lever principle, the other side end of the rotating plate tilts upwards, a probe on the rotating plate is in the state that one side of the probe is low and the other side of the probe is high, the rotating plate is shorter than the probe, the upward side end of the probe is not blocked, the probe can be directly taken conveniently, and the taking operation of the probe is convenient.

The purpose of the present invention is to provide a laminate excellent in light resistance without being provided with a flattening layer, and a manufacturing method capable of efficiently manufacturing the laminate. The present invention relates to a laminate having a dye-containing resin layer and an inorganic compound layer on both surfaces of the dye-containing resin layer, wherein the arithmetic average roughness Ra1 of both surfaces of the dye-containing resin layer as measured with an atomic force microscope is 2.5 nm or less, or the arithmetic average roughness Ra2 of the surfaces of the two inorganic compound layers as measured with an atomic force microscope is 2.3 nm or less.

The invention relates to the field of wafer detection, in particular to a wafer detection device and method, the device comprises a scanning electron microscope, an atomic force microscope and piezoelectric ceramics, the scanning electron microscope comprises a lens cone, an objective lens and a sample chamber, the objective lens is arranged in the sample chamber, and a sample table for bearing a wafer to be detected is arranged in the sample chamber; the objective lens is used for acquiring a two-dimensional morphology image of the surface of the wafer to be detected; the atomic force microscope is arranged in the sample chamber, the atomic force microscope is not in contact with the sample table, the atomic force microscope comprises a cantilever and a probe installed at the end of the cantilever, the probe is used for obtaining the three-dimensional structure of a wafer to be detected, and the piezoelectric ceramic is arranged at the end, away from the probe, of the cantilever; and the piezoelectric ceramic pressure realizes fine adjustment of the probe in horizontal and height directions through directional deformation. Vibration of the sample table and transmission of heat to the atomic force microscope are effectively isolated, and measurement errors caused by mismatch of vibration noise and thermal expansion are reduced. Precise control of the position of the probe is realized through piezoelectric ceramics.

The application provides a feature region identification method and system based on an atomic force microscope (AFM) topography, and the method comprises the following steps: acquiring an AFM topography data matrix of a nano preparation region; dividing the AFM topography data matrix into a plurality of sub-regions corresponding to preparation structures according to the number of the preparation structures; performing a region positioning step on each sub-region to determine the start and end ranges of a feature region representing a nano structure in a vertical direction in each sub-region; performing a center line fitting step in the start and end ranges of the feature region, fitting feature points in multiple rows of data to obtain a feature center line representing an extension direction of the nano structure; and performing a row-by-row identification operation on multiple rows of topography data in the feature region along the feature center line to identify feature region boundary points in each row of data. The technical scheme provided by the application realizes batch, automatic and high-precision identification of a plurality of nano structure feature regions in a complex AFM topography.

The invention discloses an AFM (atomic force microscope) and a piezoelectric ceramic driving method applied to high-speed feedback of an AFM (atomic force microscope) system, interaction force borne by a probe is enabled to be the same as preset interaction force by controlling the motion depth of piezoelectric ceramic, and the motion depth change of hardness detection piezoelectric ceramic is controlled to accord with a sine curve. Therefore, the movement depth change of the probe is a superposition waveform curve of the movement depth change of the two piezoelectric ceramics. Therefore, surface fluctuation detection and hardness detection of the to-be-detected surface are realized. According to the invention, the motion depth changes of the two piezoelectric ceramics are controlled to be non-interfering motion depth changes, so that the motion depth change (i.e., sinusoidal vibration) for detecting the viscosity of the surface to be detected and the motion depth change for feedback tracking of the appearance of the surface to be detected are two non-interfering motion depth changes. And the stroke of feedback tracking of the to-be-measured surface topography is ensured. Therefore, under the condition that the scanning speed of the atomic force microscope is high, a sample with large surface fluctuation can be measured.

The present application provides a kind of micro-cantilever, probe and atomic force microscope, the micro-cantilever is applied to atomic force microscope, the micro-cantilever includes first area, second area and third area, the first area and the third area are respectively arranged in two ends of the micro-cantilever, the second area is between the first area and the third area, the first area is used to fix one end of the micro-cantilever, the third area is provided with needle tip for detecting sample to be measured, and the second area includes at least one micro channel.The embodiment of the present application includes at least one micro channel in the second area of micro-cantilever, to divide the micro-cantilever into smaller cantilever, each cantilever has a respective resonance frequency, the superposition of at least two smaller cantilevers can reduce the Q value of the whole micro-cantilever, so that the micro-cantilever has wider frequency amplitude peak, responds to the signal of wider frequency, and then the requirement of detecting different frequency vibration signal can be met.

This invention provides solid substrates for promoting cell or tissue growth or restored function, which solid substrate is characterized by a specific fluid uptake capacity value of at least 75%, which specific fluid uptake capacity value is determined by establishing a spontaneous fluid uptake value divided by a total fluid uptake value. This invention also provides solid substrates for promoting cell or tissue growth or restored function, which solid substrate is characterized by having a contact angle value of less than 60 degrees, when in contact with a fluid. This invention also provides solid substrates for promoting cell or tissue growth or restored function, which said substrate is characterized by a substantial surface roughness (Ra) as measured by scanning electron microscopy or atomic force microscopy. The invention also provides for processes for selection of an optimized coral-based solid substrate for promoting cell or tissue growth or restored function and applications of the same.

The present invention provides a conductive roller that can reduce frictional force without drastically increasing the hardness of the surface layer. [Solution] The present invention provides a conductive roller 1 comprising a shaft 2, an elastic layer 3 provided on the outer circumference of the shaft 2, and a surface layer 4 provided on the outer circumference of the elastic layer 3, wherein the surface layer 4 has an area ratio of 40% or more of the histogram portion where the adhesion force to the entire histogram measured using an atomic force microscope is 6 nN or less, and an area ratio of 30% or more of the histogram portion where the adhesion force to the entire histogram is 8 nN or more.

The application discloses a sea fennel composite intelligent microcapsule based on sequential cross-linking, a preparation method and application, and belongs to the technical field of biomedicine.The application provides the sea fennel composite intelligent microcapsule based on sequential cross-linking, aiming at the problems of chemical instability, low transdermal rate, lack of environmental responsiveness of sea fennel extract, and loose capsule wall structure of existing microencapsulation technology, and incapability of precise control.Through integration of high-controllable technologies such as microfluidic layer-by-layer self-assembly, isothermal titration calorimetry monitoring cross-linking and atomic force microscope-nano indentation characterization, three-step sequential cross-linking is adopted to construct the intelligent microcapsule which is uniform in structure, excellent in mechanical performance, has a precise pH response threshold, realizes mild and efficient encapsulation of active substances, actively senses the skin barrier state and precisely controls the release, and synergistically enhances the mechanical strength and processing resistance, thereby providing a carrier solution with high technical barriers for high-end functional cosmetics.

The present application relates to nozzle structure design and liquid film separation optimization technical field, specifically, the present application relates to a kind of nozzle structure optimization method of methanol direct injection engine, the present application aims at solving the problem that the fixed radius of chamfer of the outlet of the orifice of traditional nozzle cannot be adjusted dynamically with the inherent surface roughness of the outlet edge, which leads to the real-time viscosity fluctuation of methanol, and affects the power performance of engine.The surface roughness of the outlet of the orifice is quantified by atomic force microscope nanoscale scanning, combined with the viscosity of methanol under different working temperature, a dynamic mapping table is constructed by numerical simulation to match the correction coefficient of liquid film contact angle, the viscosity of methanol is determined according to real-time temperature and the correction coefficient is queried, the liquid film adhesion compensation value is calculated by algorithm model, the design size of the chamfer radius of the outlet of the orifice is adjusted dynamically, the chamfer radius control is realized by using pulse laser ablation technology combined with real-time monitoring, the viscosity and roughness change are adapted, the uniformity of liquid film separation is improved, and the combustion efficiency is optimized.

The present application belongs to the technical field of rivetless bonding, and discloses a rivetless bonding joint mechanical property prediction method based on CNN-Transformer, aiming to solve the problems of destructive test, low prediction efficiency and insufficient prediction accuracy in the mechanical property detection of the existing rivetless bonding joint. First, the micron and nanometer double-scale topography images of the upper and lower plates of the rivetless bonding joint are collected by a white light interference microscope and an atomic force microscope, and standardized preprocessing is completed. Then, the feature re-labeling is completed by a double-plate cross-scale interactive attention enhancement module, and the global correlation is established by a four-branch CNN to extract deep features and a cross-plate interactive Transformer. Finally, the maximum peak load and failure displacement under the tensile shear working condition of the joint are predicted by a multi-regression head optimized by homoscedastic uncertainty loss. The present application has the advantages of low prediction cost, high prediction efficiency and accurate accuracy.

A post-CMP cleaning composition and a post-CMP cleaning method are provided that can more effectively reduce impurities remaining on the surface of a polished object. [Solution] A post-CMP cleaning composition used to clean a polished object that has been subjected to chemical mechanical polishing (CMP), contains water, a water-soluble polymer, and a surfactant; when the surface of the polished object is covered with the post-CMP cleaning composition, when observed with an atomic force microscope, the restoring adhesion force, which is the force acting between the surfactant and a probe of the atomic force microscope having a tip curvature radius of 2 nm or more and 12 nm or less, is greater than 0 N / m and not greater than 0.07 N / m; and the surface roughness of the adsorption layer formed by adsorption of the surfactant on the surface of the polished object is greater than 0 nm and not greater than 0.4 nm.

The utility model discloses a needle point frame used for an atomic force microscope, comprising a detachable support, the bottom surface of the detachable support is provided with an installation pedestal, the bottom surface of the installation pedestal is provided with an inclined installation surface, the inclined installation surface is provided with a positioning installation groove, the positioning installation groove is internally provided with a probe, and the probe is arranged on the installation pedestal. The probe is pressed and fixed in the positioning installation groove through a pressing sheet, one end, with a needle point, of the probe extends out of the positioning installation groove and is suspended, the pressing sheet is connected with the detachable support through a screw, and an avoiding hole is formed in the position, corresponding to the needle point part of the probe, of the detachable support. The probe is convenient to install and replace, the operation difficulty is low, and the use is convenient and reliable.

The negative electrode includes a negative electrode active material layer containing a negative electrode active material, a binder, a first conductive agent, and a second conductive agent. In the negative electrode, a number average length of the first conductive agent measured by atomic force microscopy (AFM) is 0.7 μm to 6.0 μm, an ACA is 0.5 to 5.0, and a CA is 0.1 to 8.0, the ACA being defined using a BET specific surface area and a weight % of each of the negative electrode active material, the first conductive agent, and the second conductive agent as factors, the CA being defined using a BET specific surface area and a weight % of each of the first conductive agent and the second conductive agent as factors.

An atomic force microscope-based nanoscale photothermal ion in-situ characterization device, comprising: an atomic force microscope module comprising an AFM conductive probe in contact with a to-be-measured region of a to-be-measured sample; a nanometer infrared photothermal excitation module for emitting pulsed mid-infrared laser to the to-be-measured region to cause the micro-cantilever of the AFM conductive probe to deform; a photothermal ion signal detection module comprising a signal detection unit and a data processing and display unit in communication, the signal detection unit being used to acquire the micro-cantilever signal of the AFM conductive probe; wherein the data processing and display unit acquires the photothermal ion second-harmonic signal of the to-be-measured region based on the micro-cantilever signal of the AFM conductive probe to display the image of the ion transport micro-region surface distribution of the to-be-measured region.

The invention is applicable to the technical field of asphalt performance testing of road or airport engineering, and provides an asphalt oil source identification method based on an AFM (atomic force microscope) bee-shaped structure chart, which takes the bee-shaped structure chart obtained by scanning a known asphalt sample as a standard, takes the roughness index of the bee-shaped structure chart as a core discrimination index, and identifies the asphalt oil source based on the AFM bee-shaped structure chart. AFM bee-shaped structure diagrams of asphalt of different oil sources are collected and processed, roughness indexes are calculated, the corresponding relation between the roughness indexes and the asphalt oil sources is established, and then accurate recognition of the asphalt of the unknown oil source is achieved. The method solves the problems that a traditional asphalt oil source recognition method is complex in operation, low in recognition precision, large in damage to samples and the like, has the advantages of being easy and convenient to operate, high in recognition efficiency, high in accuracy, non-destructive and the like, and can be widely applied to the fields of road petroleum asphalt quality detection, oil source discrimination and the like.

The application discloses a kind of based on two-dimensional material's repeatable read-write method, belong to information storage technical field, this method includes that raw material is prepared into microcosmic flat two-dimensional material;The friction of two-dimensional material is characterized by the contact mode of atomic force microscope, obtain the initial friction of nanometer blackboard and scanning area;The surface contact mass of nanometer blackboard is changed under the condition that the topography of two-dimensional material is not changed by the knocking mode of atomic force microscope, realize pattern engraving, and obtain the nanometer blackboard after engraving;The engraved nanometer blackboard is scanned using the contact mode of atomic force microscope, realize pattern reading;The friction of scanning area is restored to initial friction by the lateral force mode of atomic force microscope, realize repeatable read-write.The application realizes the repeatable read-write engraving of two-dimensional material, and shows binary pattern or specific image information entry, reading and erasing on two-dimensional material, and the storage density on graphene reaches 1600GB / m 2 .

Atomic force microscopes (AFMs) and methods for operating AFMs use a light source on a cantilever having a tip to induce cantilever oscillation and measure the cantilever motion. A drive system is used to modulate the light source so that the cantilever oscillates and the light source can measure the cantilever motion.

Polycrystalline diamond films and related methods for polished coated substrates are described herein. The article comprises a polycrystalline substrate. The article comprises a polycrystalline diamond film located on the polycrystalline substrate. The polycrystalline diamond film has an average grain size that is smaller than an average grain size of the polycrystalline substrate. The polycrystalline diamond film has an average surface roughness Ra of 50 nm or less as measured by atomic force microscopy (AFM).

This invention discloses an N-P homojunction all-inorganic perovskite solar cell for indoor photovoltaic applications. This invention provides a method to overcome the efficiency limit of indoor photovoltaics. By treating the interface of an all-inorganic perovskite (CsPbI3) thin film with a surface-modified material (sodium dodecyl sulfate: SDS), a CsPbI3 perovskite thin film with an N-P homojunction is prepared in a glove box. The formation of PbS on the surface is observed using scanning electron microscopy (SEM), and the formation of the N-P homojunction is verified using atomic force microscopy (KPFM). The formation of the N-P homojunction on the CsPbI3 thin film surface solves the bandgap matching problem between the CsPbI3 perovskite thin film and the charge transport layer. Most importantly, J sc Significant improvements have been made, which enhances the performance of all-inorganic perovskite indoor photovoltaics. sc This provides an effective strategy.

The single-crystal granules of the single-crystal cathode material have a specific granule size distribution, the single-crystal cathode material has a high pressure density, and in addition, a high Young's modulus, which allows it to withstand higher rolling pressure during battery manufacturing, thereby increasing the volumetric energy density of the lithium-ion battery equipped with the cathode material. The present invention relates to the technical field of sodium-ion batteries, and more particularly to a single-crystal cathode material, a method for manufacturing the same, and a sodium-ion battery. Size distribution of single-crystal granules of the single-crystal cathode material B 90 =(P 90 -P 10 ) / P 50 However, 0.9 ≤ B 90 The condition ≤ 1.4 is satisfied. The Young's modulus E of the positive electrode material, measured using an atomic force microscope, satisfies the condition 100 GPa ≤ E ≤ 200 GPa.

The invention provides an embedded miniature stretching platform for an atomic force microscope in-situ test, and relates to the technical field of material stretching, the embedded miniature stretching platform comprises a base, a transmission case, a transmission unit, a first displacement block, a second displacement block, a third fixed block, a fine tuning block, a fine tuning rod, a force sensor, a temperature control base, a scanning head and the like, and all the parts cooperate to support sample stretching and testing. The motor drives the lead screw to rotate in the same direction through the transmission unit, and the two displacement blocks are driven to move reversely by means of the opposite internal threads of the two lead screw nuts to achieve sample stretching; the first fine-tuning knob drives the fine-tuning rod, the fine-tuning block and the fourth fixing block to move in a small range to adjust the stretching amount, the second fine-tuning knob fixes the fine-tuning effect, and the high-precision in-situ test requirement is met in cooperation with temperature regulation and control and the scanning head.