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54 results about "Atomic resolution" patented technology

Preparation method of lead titanate-strontium titanate monocrystal nanometer material with core-shell structure

The invention relates to a preparation method of a perovskite phase lead titanate-strontium titanate monocrystal nanometer material with a core-shell structure. The preparation method comprises the steps of taking a monocrystal single-domain perovskite phase lead titanate nanosheet as a template and a raw material, taking tetrabutyl titanate as a titanium source, taking strontium nitrate as a strontium source, taking sodium hydroxide as a precipitant and a mineralizing agent, and preparing precursor mixed turbid liquid for a hydrothermal reaction under the condition of magnetic stirring; sealing the precursor mixed turbid liquid into a stainless steel reaction still having a teflon liner, and obtaining a core-shell structure perovskite phase lead titanate-strontium titanate monocrystal nanometer composite structure through subjecting to hydro-thermal treatment at the temperature of 160 to 220 DEG C for 4 to 24 hours. The preparation method provided by the invention is simple in technical process, easy to control, free of pollution, low in cost, and easy for mass production. The prepared perovskite phase lead titanate-strontium titanate monocrystal nanometer composite structure has a clear core-shell structure, and has an interface with atomic resolution.
Owner:ZHEJIANG UNIV

Independent low-return-difference and high-rescanning probe microscope scanner

The invention discloses an independent low-return-difference and high-rescanning probe microscope scanner, and relates to a scanning structure of a scanning probe microscope. The independent low-return-difference and high-rescanning probe microscope scanner comprises an XYZ piezoelectric scanning tube, a guide rail rack, a sliding rod and a spring piece, wherein the XYZ piezoelectric scanning tube and the sliding rod are coaxial and mutually fixed at one end, the outer wall of the sliding rod is pressed on a guide rail of the guide rail rack in parallel by the spring piece, and both the two ends of the sliding rod stretch beyond the length of the guide rail of the guide rail rack. The independent low-return-difference and high-rescanning probe microscope scanner has the advantages of being simple in structure, stable in working height and extremely small in return difference. With the independent low-return-difference and high-rescanning probe microscope scanner, the scanning probe microscope which can perform scanning imaging at a low voltage by only using the small-size XYZ piezoelectric scanning tube is manufactured for the first time, and the problem that in the prior art, the two favorable conditions can not be taken into consideration is solved. Besides, by using the independent low-return-difference and high-rescanning probe microscope scanner, the scanning probe microscope which can display the same high quality atomic resolution images as well in the absence of sound insulation and vibration reduction can be manufactured.
Owner:UNIV OF SCI & TECH OF CHINA

Double-end clamping piezoelectric motor for utilizing opposite-direction rubs to reduce friction force and control method

The invention discloses a double-end clamping piezoelectric motor for utilizing opposite-direction rubs to reduce friction force and a control method. The double-end clamping piezoelectric motor comprises two piezoelectric transducers, a pedestal and a slide bar, wherein the two piezoelectric transducers are arranged in parallel in the telescopic direction and fixed on the pedestal side by side; the slide bar is in sliding fit with the two piezoelectric transducers in the telescopic direction; positive pressure is applied to be perpendicular to the telescopic direction of the two piezoelectric transducers, enables the sliding bar and the free ends of the two piezoelectric transducers to be pressed with each other, and enables the sliding bar and the pedestal to be pressed with each other; the three kinds of positive pressures meet the requirements that the sum of the maximum static friction force between the free ends of the two piezoelectric transducers and the sliding bar is larger than that between the pedestal and the sliding bar, and the total dynamic friction force generated by that the free ends of the two piezoelectric transducers oppositely rub on the sliding bar to the sliding bar is smaller than the maximum static friction force between the pedestal and the sliding bar. The double-end clamping piezoelectric motor is small in size, large in thrust, strong in rigidity, easy to meet the friction force conditions, and suitable for a rough approximation motor of a high-sensitivity atom resolution scanning probe microscope and extreme conditions.
Owner:UNIV OF SCI & TECH OF CHINA

Nanomaterial in-situ photoelectric test chip of transmission electron microscope, chip fabrication method and application of chip

The invention discloses a nanomaterial in-situ photoelectric test chip of a transmission electron microscope, a chip fabrication method and application of the chip, belonging to the technical field of in-situ test of the performance of a nanomaterial. The chip comprises a silicon substrate, insulation layers, metal electrodes, a thin-film window and a light emitting diode, wherein the insulation layers are grown on the two surfaces of the silicon substrate; the metal electrodes are grown on the insulation layer on the front surface of the chip and can be electrically connected with a sample; and the thin-film window is arranged at the center of the chip, an electron beam transmission groove or an electron beam transmission hole is formed in a region of the thin-film window, and the light emitting diode is welded on the pair of metal electrodes in front of the thin-film window. By the chip, controllable illumination can be simultaneously carried out on the samples, an electrical effect can be applied or electrical signals of the samples are received, and thus, photoelectric in-situ measurement on the transmission electron microscope sample under the atomic resolution can be achieved.
Owner:NANJING UNIV

Strong three-friction stepper driven by two piezoelectrics side by side

The invention provides a strong three-friction stepper driven by two piezoelectrics side by side. The stepper comprises two piezoelectrics, a base and a slide rod, wherein the two piezoelectrics are arranged in parallel in a stretching direction and fixedly stand on the base side by side to form a double-piezoelectric structure. The stepper also comprises a bridging piece, wherein the left and right ends of the bridging piece are respectively fixed to free ends of the two piezoelectrics; the slide rod is arranged to be in sliding fit with the two piezoelectrics in the stretching direction; positive pressures for pressing the slide rod to the left and right ends of the bridging piece and a positive pressure for pressing the slide rod to the base are arranged in the direction perpendicular to the stretching direction of the two piezoelectrics; and in the maximal static frictions to the slide rod generated by the three positive pressures, any maximal static friction is smaller than the sum of the other two maximal static frictions. The strong three-friction stepper driven by the two piezoelectrics side by side is simple in structure and high in rigidity, friction condition and optimal friction condition are easy to met, and the stepper can be used as coarse approximate motor in extreme conditions and of a high-sensitivity atom resolution scanning probe microscope.
Owner:UNIV OF SCI & TECH OF CHINA
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