A computer-aided simulation method for an atomic-resolution scanning Seebeck microscope (SSM) image is provided. In the computer-aided simulation method, a computer may calculate a local thermoelectric voltage for a position of a voltage probe, to acquire an SSM image corresponding to the position, using the following equation:V(r)=Vdiff+Scoh(r)∫∇T(r;r′)·r′-rr′-r33r′in which V(r) denotes the local thermoelectric voltage, Vdiff denotes a thermoelectric voltage drop in a diffusive transport region in a tip and a sample, Scoh(r) denotes a position-dependent Seebeck coefficient, r denotes a distance measured from a point voltage probe, r′ denotes material internal coordinates, ∇T(r;r′) denotes a temperature gradient radially weighted by a factor of 1 / r2, and∫∇T(r;r′)·r′-rr′-r33r′denotes a volume integral of a temperature profile.