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35 results about "Reference wave" patented technology

Synchrotron multi-harmonic bunch trajectory reconstruction method and system

PendingCN122260384AMagnetic resonance acceleratorsX/gamma/cosmic radiation measurmentTime domainBeam trajectory
The application provides a synchronous accelerator multi-harmonic beam trajectory reconstruction method and system, and relates to the technical field of accelerators. The method comprises the following steps: obtaining an accelerating cavity high-frequency signal of the synchronous accelerator, so as to generate a frequency-synchronized reference waveform according to the accelerating cavity high-frequency signal; setting a phase trigger window based on the reference waveform, so as to control the synchronous acquisition of beam signals of a full ring of the synchronous accelerator by a beam diagnosis device of the full ring; performing time domain analysis on the beam signals to obtain an effective beam signal interval, so as to calculate position data of the beam signals based on the effective beam signal interval; and reconstructing the motion trajectory of the beam according to the position data of the beam signals, which can accurately identify and associate the data of the same beam in the multi-harmonic acceleration process.
Owner:INST OF MODERN PHYSICS CHINESE ACADEMY OF SCI

Signal conversion module, control device, motor control circuit, system and vehicle

This application provides a signal conversion module, a control device, a motor control circuit, a system, and a vehicle. The signal conversion module includes a switching circuit, a charging circuit, an energy storage circuit, and a discharging circuit. The switching circuit and the charging circuit are connected in series between the module's input and output terminals. The first terminal of the energy storage circuit is connected to the connection node between the charging circuit and the module's output terminal, and the second terminal of the energy storage circuit is grounded. The first terminal of the discharging circuit is connected to the first terminal of the energy storage circuit, and the second terminal of the discharging circuit is grounded. When the switching circuit receives a step control signal, the signal conversion module outputs a voltage ramp signal, which, together with a reference waveform signal, forms a pulse width modulation (PWM) signal. Using a signal conversion module to replace the microcontroller's output PWM signal effectively reduces costs, eliminates the constraints of control software, and reduces risk.
Owner:GUANGZHOU AUTOMOBILE GROUP CO LTD

Photonic plate with test device

PendingFR3170026A1Coupling light guidesTesting fibre optics/optical waveguide devicesPhotonic ChipReference wave
The invention relates to a photonic plate (PP) comprising at least one motif (MOT), a motif comprising at least one so-called functional photonic chip (PPf) and a test device (DT), the test device (DT) comprising: a first test assembly (E1t) comprising: a first coupler by the test slice (EDC1t), called the first test coupler, a first test light / waveguide coupling device (DC1t), a second coupler by the test slice (EDC2t), called the second test coupler, a second test light / waveguide coupling device (DC2t), the first and second test couplers being arranged symmetrically with respect to a point O, a so-called reference assembly (Er) comprising a reference waveguide (WGr) and a first (DC1r) and a second (DC2r) reference light / waveguide coupling device,The first (DC1t) and second (DC2t) test light / guide coupling devices and the first (DC1r) and second (DC2r) reference light / guide coupling devices are all identical. Figure 4,
Owner:COMMISSARIAT A LENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES

A method, device, medium and product for unmanned aerial vehicle multi-modal image registration

PendingCN122453882ANormalized mutual informationOutlier elimination
The application discloses a UAV multi-modal image registration method and device, medium and product, relates to the technical field of remote sensing image processing and computer vision, and comprises the following steps: calculating the normalized mutual information value of each wave band of the image to be registered and a reference image, selecting a wave band with the maximum value as a reference wave band, solving a global affine transformation matrix by using an enhanced correlation coefficient algorithm, performing global geometric coarse correction, and obtaining the image to be registered after coarse registration; calculating the local principal direction of the image to be registered after coarse registration and the reference image, constructing a Gaussian derivative filter, extracting structural features based on the turning theorem, generating respective structural feature maps and dividing the structural feature maps into regular grids, performing grid-by-grid template matching to obtain a sparse displacement field, performing outlier elimination and interpolation smoothing to generate a dense linear deformation field, performing nonlinear geometric correction and applying the dense linear deformation field to all wave bands of the image to be registered after coarse registration, and obtaining a final registration result. The application realizes high-precision registration of multi-modal images.
Owner:CHINA AGRI UNIV

Power factor correction at a switch mode power supply

Embodiments of a method and an apparatus are disclosed. In one embodiment, a method for power factor correction (PFC) at a switch mode power supply (SMPS) is disclosed. The method involves receiving an input voltage, generating a reference waveform in phase with the input voltage, determining a time value for phase shifting a PFC current signal, scaling the time value with a phase factor to generate a scaled time value, phase shifting the reference waveform according to the scaled time value to generate a phase shifted reference waveform, and generating the PFC current signal based on the phase shifted reference waveform.
Owner:NXP BV

Ultrasonic time-of-flight measurement method, circuit, flow metering method and device

PendingCN122329425ATime deviationWave detection
This application discloses an ultrasonic time-of-flight measurement method, circuit, flow metering method, and apparatus. The method acquires ultrasonic transmitted signals and ultrasonic echo signals; performs first-wave detection on the ultrasonic echo signals and outputs a first-wave detection signal; samples and detects zero-crossing points on the ultrasonic echo signals after the time corresponding to the first-wave detection signal, obtaining echo sampling data and the first zero-crossing detection signal after the first wave; performs time-to-digital conversion on the ultrasonic transmitted signal and the first zero-crossing detection signal, outputting the zero-crossing time of flight; performs cross-correlation calculations based on the echo sampling data, reference wave data, and a local delay search range with the time corresponding to the first zero-crossing detection signal as the time reference, outputting a relative time deviation; corrects the zero-crossing time of flight based on the relative time deviation, and outputs the corrected zero-crossing time of flight as the ultrasonic time of flight. This application can balance time deviation correction with reducing data volume and computational power consumption.
Owner:SUZHOU ANCHAO MICROELECTRONICS CO LTD

Design method and preparation method of chalcogenide glass substrate 8-12 mu m band high transmission film color controllable thin film

This paper provides a method for designing and fabricating a high-transmittance, color-controllable thin film with a chalcogenide glass substrate in the 8-12 μm wavelength range. The design method includes the following steps: Sa, using 550 nm as the reference wavelength for optical thin film design, and applying the film stacking formula: Sub / M0.5(L2HL)^5 0.5(KL)^5 / AIR, both sides are coated with the same film system, Sub is IRG chalcogenide glass, AIR represents air, H represents Ge, L represents ZnS, K represents YbF3, and M represents IDA; Sb, generate the film structure of Sub / IDA / ZnS / Ge / ZnS / Ge / ZnS / YbF3 / ZnS / Air through the film stack formula; Sc, the optimization target is the film color target and the transmittance target. The film color target is one or two adjacent colors of the seven colors of visible light (red, orange, yellow, green, cyan, blue, and violet). To design the film color of a certain color or two adjacent colors, the spectral reflectance peak of the design must be located at the wavelength of the corresponding color; Sd, film thickness optimization, to obtain the optimal film thickness. The optimized film structure achieves the target transmittance and the film color is controllable; Se, the optimal film thickness is input to the coating machine.
Owner:安徽光智科技有限公司

A method and apparatus for wiring verification

This application discloses a wiring verification method and apparatus, belonging to the field of power electronics technology. The wiring verification method includes: charging a submodule of a converter valve; verifying the wiring phase sequence of the first voltage measuring point and the converter transformer based on the voltage phase sequence of the first voltage measuring point, the current phase sequence of the first current measuring point, and the current phase sequence of the second current measuring point; performing open-loop control on the converter valve after unlocking it; comparing the actual voltage of the first voltage measuring point with the control system reference wave to verify the phase sequence of the converter valve and the wiring method of the converter transformer, and obtaining the wiring verification result. The wiring verification method of this application only utilizes the first AC switch, first voltage measuring point, first current measuring point, and second current measuring point inherent in the flexible DC system itself, solving the problem that the phase sequence and wiring method of the converter valve cannot be verified due to the removal of the valve-side switch and valve-side voltage measuring point, thus improving the verification and adaptation capability of the flexible DC system.
Owner:NR ELECTRIC CO LTD +2

Optical alignment system and optical alignment method

PCT designated stageWO2026104685A1Quantum computersUsing optical meansLight beamReference wave
An optical alignment system (20, 300) is configured for receiving at least a first incident laser beam (30) having a first wavelength (λ1), a second incident laser beam (40) having a second wavelength (λ2), and a reference incident laser beam (50) having a reference wavelength (λref) and propagating along a reference direction (X0); and for forming at least first emerging beam (60) and a second emerging beam (65), propagating respectively in a first emerging direction (X1) and a second emerging (X2) direction which are controlled relative to the reference direction (X0), and counter-propagating relative to the reference incident laser beam (50). The optical alignment system (20, 300) comprises a movable alignment unit (70), an actuating unit (75); a splitting unit (80); a detection unit (85), comprising a first optical sensor (150), a second optical sensor (155); and an electronic control device (90), configured for determining the at least one positioning instruction for positioning the alignment unit (80) based on measurement data received from the first and second optical sensors (150, 155), and for transmitting said positioning instruction to the actuating unit, said positioning instruction allowing controlling at least a tilt of the first emerging direction (X1) and a tilt of the second emerging direction (X2) relative to the reference direction (X0).
Owner:PASQAL SAS

Method and apparatus for interferometric measurement of a large warped wafer

ActiveCN122305968BWavefront sensorReference wave
The present application relates to a kind of big warping wafer interference measurement method and device, belong to optical detection and semiconductor measurement technical field.Detection light is converted and diffracted after birefringence, and P light and S light are formed, and P reference light, S silicon light, S reference light and P silicon light are formed respectively;By adjusting the spatial posture of reference mirror and the wafer to be measured, and cooperating with spatial screening of diaphragm, P reference light and S silicon light enter subsequent optical path, while S reference light and P silicon light are blocked;S silicon light forms the measurement wave front carrying the wafer to be measured surface shape information, P reference light is modulated as the modulation reference wave front similar to the measurement wave front by deformable mirror, and the two form analytical interference fringe pattern at camera;Wave front sensor measures deformable mirror surface shape information, and the computing system obtains the surface shape information of the wafer to be measured according to deformable mirror surface shape information and relative surface shape variation amount.The present application can reduce the interference fringe density in the detection of big warping wafer, reduce splicing measurement error, improve detection efficiency and accuracy.
Owner:SHANGHAI HUIZHUO OPTICAL TECHNOLOGY CO LTD +1

Wavefront shaping method, apparatus, computer device and storage medium

The application relates to a wavefront shaping method, device, computer equipment, storage medium and computer program product. An optical parameter of a scattering system is obtained, and a corresponding scattering transfer function is determined from a propagation model according to the optical parameter. The propagation model comprises scattering transfer functions corresponding to scattering systems with different structures. A reference output pattern obtained according to a reference wavefront modulation distribution and the determined scattering transfer function is subjected to output surface constraint to obtain output pattern information. The output pattern information is processed based on the determined scattering transfer function to obtain a wavefront modulation distribution, which is used for wavefront shaping. The wavefront shaping method can not only match scattering systems with different structures, but also guarantee wavefront shaping effect.
Owner:SHENZHEN UNIV

Global compaction degree nondestructive evaluation method, system and device based on multi-machine vibration signal coupling analysis and medium

The application discloses a global compaction degree nondestructive evaluation method, system, device and medium based on multi-machine vibration signal coupling analysis, comprising the following steps: acquiring detection data of a current period; calculating a local reference wave field according to excitation signal information of each rolling device and a first correlation model; integrating the local reference wave field to obtain a global reference wave field of a construction area based on excitation signal information corresponding to an overlapping grid corresponding to a plurality of local reference wave fields; determining listening parameters of excitation waves of other rolling devices listened to by each rolling device; filtering non-designated environment vibration signals to obtain filtered signals based on the listening parameters; determining transmission parameters of vibration waves across the rolling devices, and forming a supplementary wave field according to the transmission parameters; determining an actual compaction distribution map of a rolling grid in the construction area based on the global reference wave field and the supplementary wave field; determining a priority according to the actual compaction distribution map; and planning a rolling route and rolling parameters of each rolling device in a next period.
Owner:CHINA THREE GORGES PROJECTS DEV CO LTD +1

Voltage converter with wide output range

A voltage converter comprises a drive control circuit configured to generate a pair of hysteretic current reference waveforms, generate a comparison signal based on a comparison of an inductor current with a first current reference waveform, and generate an interrupt signal. The drive control circuit is further configured to generate first and second sets of PWM signals configured to control the plurality of controllable switch devices based on one the comparison signal or the interrupt signal, and control the plurality of controllable switch devices based on the first set of PWM signals to generate the inductor current.
Owner:AES GLOBAL HLDG PTE LTD

Foundation pit slope intelligent monitoring method, system and device

PendingCN122358649AFeature vectorSoil science
This invention discloses an intelligent monitoring method for foundation pit slopes, belonging to the field of foundation pit monitoring. The method includes: deploying vibration sensors and reference wells in the stable soil area of ​​the slope; dividing the slope into diagnostic sections and soil layer sub-units; and using a reference slip surface to divide the stable area and the area to be diagnosed. A standard excitation device, in conjunction with vibration sensors, is used to calculate the reference wave velocity of each soil layer and the representative wave velocity of each area to be diagnosed. A feature vector containing representative wave velocity, variance, and soil layer coding is constructed and input into a pre-trained soil parameter model. The equivalent cohesion and internal friction angle of each area are output in real time. Based on the reference slip surface, a limit equilibrium equation considering slope geometry, top load, and slope protection structure design anti-sliding force is established, and the overall safety factor of each diagnostic section is iteratively solved. Finally, based on the comparison between the safety factor and a preset threshold, a graded load control decision is automatically generated, realizing quantitative and intelligent proactive control of foundation pit slope stability.
Owner:CHINA UNIV OF MINING & TECH (BEIJING) +1

Space operating system multi-source signal photon semantic mapping protocol and system

PendingCN122339580APathPingMixed reality
This invention provides a multi-source signal photonic semantic mapping protocol and system for a space operating system, relating to the fields of space computing, mixed reality, space internet, silicon-based photonics, and all-optical transmission. The system organizes space data for the space operating system into a dedicated composite space data structure and constructs protocol objects; it forms objectified photonic execution clusters through photonic semantic mapping; it distributes phase reference waves through a primary coherent source and achieves cross-source physical layer alignment through hardware alignment; it implements path control and priority execution through deterministic scheduling; and it achieves auditing, physical circuit breaking, degraded execution, and black-box traceability through secure execution and circuit breaking. The space data can originate from electrical domain input, radio frequency domain input, quantum domain input, or a combination thereof. This system can improve the consistency, stability, and anti-evasion capabilities in space display, space interaction, space control, and space security processing.
Owner:WUHAN HUACHUANG HIGHLIGHT DIGITAL TECHNOLOGY CO LTD

A water body sediment concentration inversion method and device based on satellite remote sensing images

The application provides a water body sediment concentration inversion method and device based on satellite remote sensing images, and the method comprises the following steps: pre-processing satellite remote sensing images of a measured water body to generate a remote sensing reflectance above water surface; performing optical classification on the measured water body based on the remote sensing reflectance above water surface to generate a first type of water body, a second type of water body, a third type of water body and a fourth type of water body; performing backscattering coefficient inversion on the remote sensing reflectance above water surface to determine the backscattering coefficient of the first type of water body, the backscattering coefficient of the second type of water body, the backscattering coefficient of the third type of water body and the backscattering coefficient of the fourth type of water body; and performing sediment concentration remote sensing inversion on the backscattering coefficient of the first type of water body, the backscattering coefficient of the second type of water body, the backscattering coefficient of the third type of water body and the backscattering coefficient of the fourth type of water body to generate water body sediment concentration. The method effectively realizes high-precision backscattering coefficient inversion at different reference wave bands, and improves the inversion precision.
Owner:CHINA THREE GORGES CORPORATION

On-chip f-2f self-referencing method for a periodic-cone thin-film lithium niobate optical waveguide

PendingCN122260705ANon-linear opticsEngineeringReference wave
The application provides a kind of on-chip f-2f self-referencing method of period taper type thin film lithium niobate optical waveguide, period taper waveguide structure is introduced to widen the phase matching bandwidth of second harmonic, make the broadband dispersion wave of supercontinuum spectrum generated by second harmonic spectrum fully cover, so as to reduce the demand of f-2f self-referencing waveguide device to pump pulse energy. ceo Beat signal; that is, the application can effectively widen the phase matching bandwidth of second harmonic, so that the second harmonic generated and the dispersion wave of supercontinuum process have wideband spectrum overlap, and on-chip f-2f self-referencing can be realized under lower pump energy, which can reduce the energy consumption by nearly 40% compared with traditional straight waveguide device.
Owner:BEIJING INST OF TECH

1. A method for designing and preparing a thin film antireflection coating for a silicon-based lens having a thickness of 8-4 μm.

This paper provides a design and fabrication method for a 1.8-4 μm silicon-based lens antireflection film. The design method includes the following steps: Sa, the film system design uses 550 nm as the reference wavelength for optical film design, and employs the film stack formula: Sub / 0.3M. 0.8N(HL)^3K / AIR, Sub is coated with the same film system on both sides, where Sub is the silicon substrate, AIR represents air. In the film stack formula, H represents 1 / 4 wavelength thick high refractive index material ZnS, L represents 1 / 4 wavelength thick low refractive index material YbF3, M represents 1 / 4 wavelength thick base layer material SiO, N represents 1 / 4 wavelength thick connecting layer material Ge, K represents 1 / 4 wavelength thick protective layer material Al2O3 (alumina), Sb, through the input film stack formula, generates a film structure of Sub / SiO / Ge / ZnS / YbF3 / Al2O3 / Air; Sc, the film thickness is optimized using thin film design software to obtain the optimal film thickness, and the transmittance of the optimized film structure in the 1.8-4μm band meets the requirements; Sd, the optimized film thickness is input into the control computer of the coating machine.
Owner:安徽光智科技有限公司

Intelligent detection method and system for desulfurization strain activity parameters based on hyperspectral image

ActiveCN121982553BReference waveBiology
The present application belongs to the technical field of image processing, and particularly relates to a desulfurization strain activity parameter intelligent detection method and system based on hyperspectral images, which comprises the following steps: extracting the original reflectivity of each pixel point in the desulfurization bacterial liquid hyperspectral image under continuous wave bands; anchoring the local background baseline by using the original reflectivity at the first and second reference wave bands, and determining the metabolic absorption depth in combination with the original reflectivity at the characteristic metabolic wave band; determining the spatial spectral gradient bias based on the original reflectivity difference of each pixel point and its spatial neighborhood pixel points at the structural scattering wave band and the metabolic absorption depth difference between the pixel points; and determining the strain activity evaluation parameter according to the spatial spectral gradient bias and the metabolic absorption depth of all pixel points. The present application can eliminate the interference of background water fluctuation and high-density inactivated bacterial liquid, realize the real characterization of microbial metabolic intensity, and improve the accuracy and stability of the desulfurization system monitoring.
Owner:WUHAN QIANYU TECH CO LTD

An AC-DC conversion circuit for power factor correction

The application relates to the field of power electronics, and discloses an AC-DC conversion circuit for power factor correction, which comprises an input sampling module for collecting an AC input voltage, an input current and a DC bus voltage; a waveform analysis module for dividing an input period interval and determining a reliable interval and an abnormal interval; a reference construction module for constructing a reference waveform skeleton and correcting the abnormal interval; an inheritance correction module for calling historical skeleton information for correction; a constraint control module for generating a partitioned reference current signal; a PWM driving control module for generating a PWM driving signal; and a PFC power conversion module for outputting a target DC bus voltage. The AC input voltage signal is divided into intervals, the reliable interval is determined based on waveform continuity, zero-crossing symmetry and half-cycle consistency, the reference waveform skeleton is constructed and the abnormal interval is corrected, and the accuracy of the generated reference waveform under abnormal input conditions is improved.
Owner:SHANGHAI LEWA MICROELECTRONICS TECHNOLOGY CO LTD

Waveform-analyzing method, waveform-analyzing device and analyzing system

ActiveUS12680991B2Waveform analysisAlgorithm
Provided is a method for analyzing a signal waveform which is a chromatogram or spectrum, including: a model creation step for creating a trained model for locating a peak portion in an input waveform, by machine learning using a plurality of sets of reference waveforms in each of which the position of the peak portion is known; a region estimation step (S11-S14) for dividing an analysis-target waveform into partial waveforms, for determining whether or not each of the partial waveforms is a peak portion by using the trained model, and for estimating different kinds of regions including a peak region and a non-peak region in the analysis-target waveform, based on the determination result; and a detection step (S15) for detecting an incorrect region estimation result by determining whether or not the sequence of the estimated regions along the horizontal axis of the analysis-target waveform conforms to a predetermined regulation.
Owner:SHIMADZU CORP

Distributed Multiple Access System Based on Reconfigurable Holographic Devices and Symbiotic Radio Networks

ActiveCN120675593BRadio networksNoise (radio)
This invention discloses a distributed multiple access system for a symbiotic radio network based on reconfigurable holographic devices, comprising: a background network (BS / UE) and an IoT network consisting of K reconfigurable holographic devices (RHDs) and IoT receivers (IRs); each RHD integrates an antenna, a load modulator, and a reconfigurable holographic surface (RHS), which converts a reference wave carrying IoT information into a target wave and radiates it into free space by activating subwavelength radiating elements, overcoming the size limitations of traditional RIS / phased arrays; the IoT receiver (IR) employs distributed decoding based on random code-based code division multiple access (CDMA), utilizing matched filter (MF) or minimum mean square error (MMSE) receivers combined with asymptotic signal-to-interference-plus-noise ratio (SINNR) theory to eliminate the need for real-time random code feedback; the radiation pattern is optimized based on the weighted minimum mean square error (WMMSE) algorithm to maximize RHD and data rate. The advantages of this invention are: device size supports integration of micro-IoT devices; IoT SINNR is improved by more than 20dB; and it enables massive IoT device access.
Owner:NANKAI UNIV

A method for controlling transient overload test of a soft straight valve section and related device

The present application belongs to the field of flexible straight valve section test, and discloses a kind of transient overload test control method and related device of flexible straight valve section, to fix the reference wave of test side and the reference wave of test side in preset period calculation, combined with reference voltage calculation real-time input half-bridge flexible straight module number, and send input or cut-off command to half-bridge flexible straight module to maintain normal operation of valve section;During the rated operation of valve section, automatically adjust the AC phase of test side and reference voltage, execute test in four stages: the first stage reduces phase to the first target phase and lifts voltage to the first target voltage to realize voltage lifting, the second stage keeps voltage unchanged and lifts phase to the second target phase to realize current lifting and maintains test target, the third stage restores phase to the first target phase while reducing voltage to rated value to restore voltage level, and the fourth stage restores phase to rated phase to return to rated state.Using this method, the safety and stability of the test process are significantly improved.
Owner:XIDIAN POWER RECTIFIER XIAN +1

Wave glider and monocular vision based regional wave measurement system and method

PendingCN122281843AVisual estimationReference wave
This invention provides a regional wave measurement system and method based on a wave glider and monocular vision, belonging to the field of ocean wave observation technology. The method includes the following steps: installing an airborne sensor, an airborne computing unit, a monocular camera, and a single-point wave measurement unit on a wave glider platform; calculating single-point reference wave parameters; performing monocular vision-based sea surface image preprocessing and feature analysis; based on the single-point reference wave parameters, calibrating and scaling the amplitude and spectrum of the local sea surface wave field image information; fusing the single-point wave measurement and visual estimation results; and calculating the wave height, wave direction, wave period, and directional spectrum within the fused local sea surface wave field. This invention, based on a wave glider platform, combines high-precision single-point wave measurement with sea surface images acquired through monocular vision to achieve high-precision measurement of wave parameters within a certain area around the wave glider.
Owner:SANYA YAZHOU BAY INST OF DEEP SEA SCI & TECH SHANGHAI JIAOTONG UNIV

A Shack-Hartmann wavefront reconstruction method and system based on displacement identification

This invention discloses a Shakhartmann wavefront reconstruction method and system based on displacement identifiers. It includes: under reference wavefront conditions, acquiring two spot images—one unloaded and one loaded with preset phase modulation—using a Shakhartmann detector unit, recording the displacement of the spot within each sub-aperture before and after modulation, and establishing a displacement identifier library; under the wavefront condition to be measured, acquiring two spot images before and after modulation with the same preset phase, calculating the displacement of each spot as the measured displacement; matching the measured displacement with the displacements in the displacement identifier library, and identifying the sub-aperture of each spot based on the matching results; calculating the local wavefront slope of each sub-aperture based on the identified spot position, and reconstructing the wavefront. This invention establishes a distinguishable displacement identifier for each sub-aperture through a preset phase, and uses displacement matching instead of absolute position identification, enabling accurate identification when the spot crosses boundaries or there is crosstalk between sub-apertures, significantly improving the dynamic range of the Shakhartmann sensor.
Owner:ZHEJIANG UNIV

Method for detecting adhesion penetration of corrugated board based on multispectral imaging

PendingCN122345554ASignal wavePaperboard
The application relates to the corrugated paperboard production technical field and discloses a corrugated paperboard adhesion permeability detection method based on multispectral imaging, which comprises the following steps: S1, acquiring the diffuse reflection intensity of different pixel points of corrugated paperboard under signal wavelengths and reference wavelengths, the signal wavelengths being in a strong absorption wave band of glue, and the reference wavelengths being in a weak absorption wave band of glue; S2, performing preliminary screening on the pixel points according to the diffuse reflection intensity under the signal wavelengths and the reference wavelengths; when the preliminary screening fails, calculating the glue permeation depth of the pixel points, and performing fine screening on the pixel points according to the glue permeation depth; and S3, performing process abnormality diagnosis according to the positions and the glue permeation depths of all fine screening failed pixel points. The diffuse reflection intensity of the corrugated paperboard under the double-wavelength spectrum is acquired, the adhesion state can be judged, the abnormal pixel points are integrated and comprehensively judged, and the adhesion failure problem can be traced.
Owner:HUAINAN RUI TECHNOLOGY CO LTD

A multi-parameter intelligent diagnosis algorithm for aircraft power quality assessment

The application relates to the field of avionics fault diagnosis, and discloses a multi-parameter intelligent diagnosis algorithm for evaluating the quality of an aircraft power supply, which receives loop voltage and current and bus control instruction data in parallel, constructs time-aligned heterogeneous data streams based on a clock, and locks key load action events by using double trigger logic. By calculating equivalent Thevenin source impedance and constructing a background noise model, the adaptive reference waveform is generated by correcting the load standard model. The measured and reference waveforms are aligned by using dynamic time warping, the deformation cost is output, and the energy spectrum entropy is extracted by performing wavelet packet decomposition on the differential residual. The multi-dimensional feature vector is constructed by comprehensively considering impedance drift, deformation cost and energy spectrum entropy, and the mechanical fault, electrical contact degradation and line aging are decoupled by using hierarchical logic. The application effectively eliminates background interference and time jitter, and realizes accurate evaluation of the state of the power supply system.
Owner:BEIJING POLYTECHNIC

Single-frame ramp interferometer

ActiveCN116507877BSave on testing logisticsSave measurement timeInterferometersReflective surface testingReference waveWavelength
An interferometer (10) is provided for measuring the surface (108) or optical thickness of an optically smoothed test object (122), wherein the interferometer (10) is configured to simultaneously illuminate the optically smoothed test object with multiple object waves (14.1, 14.2, 14.3) having different wavelengths from each other, and to superimpose the object waves (14.1, 14.2, 14.3) deformed by the illuminated test object onto a coherent reference wave on an image capturing device (K), and to decompose the spectrum of the superimposed interferogram into wavelength-specific partial interferograms.
Owner:UNIVERSITAT STUTTGART

A method and analyzer for analyzing color saturation of high wear-resistant water-based decorative paper

PendingCN122345580AAttenuation coefficientTest sample
The present application relates to the field of color saturation analysis, and relates to a high-wear-resistance water-based decorative paper color saturation analysis method and analyzer. The present application carries out color zoning on the to-be-tested sample through the standard design drawing of the to-be-tested sample, selects multiple collection points, obtains the glossiness of each collection point through double-plane optical measurement, dynamically adjusts the light trap absorption area of the spectrophotometer, respectively collects the first reflection spectrum and the second reflection spectrum of each collection point, identifies the fluorescence interference wavelength point in combination with the system calibration deviation rate, determines the fluorescence decay coefficient in combination with the glossiness of the collection point, obtains the fluorescence correction reflectivity of each wavelength point, and thus obtains the color saturation. Based on the color saturation and the distribution position of each collection point, the saturation abnormal points are identified. Based on the effective fluorescence interference amount of the fluorescence characteristic band and the reference band, the fluorescence spectrum characteristics of each saturation abnormal point are analyzed, the abnormal reasons of the saturation abnormal points are analyzed, and the efficiency of production quality control is improved.
Owner:LINYI HUATE DECORATIVE MATERIALS CO LTD

Design method and preparation method of germanium substrate 2-5.9 mu m wave band cut-off 6.3-14 mu m high-transmittance optical filter film

A design method and a preparation method of a germanium substrate 2-5.9 μm wave band cut 6.3-14 μm high-transmittance optical filter film are provided. The design method comprises the following steps: taking 550 nm as a reference wavelength of 1 / 4 wavelength thickness of optical film design, using: Sub / S1 surface 2.1(L2HL)^10, 2.8(L2HL)^10, 3.6(L2HL)^9, 4.5(L2HL)^9 / S2 surface.42(L2HLKL)^3,.59(K2LK)^1AIR, Sub is a germanium substrate, AIR represents air, H represents Ge, L represents ZnSe, and K represents YbF3; generating 75 layers of S1 surface and 12 layers of S2 surface, the S1 surface is bottomed with ZnSe, the outermost is ZnSe, and the intermediate is Ge and ZnSe alternately, and the S2 surface is Ge / ZnSe / Ge / ZnSe / Ge / ZnSe / YbF3 / ZnSe / Ge / ZnSe / YbF3 / ZnSe; optimization is performed to obtain the best film layer thickness; and a coating machine is input.
Owner:安徽光智科技有限公司