311results about "Scanning probe techniques" patented technology

The invention relates to the technical field of electron microscope sample pretreatment, and discloses a critical point drying control method and device based on online near-infrared monitoring, and the method comprises the steps: obtaining infrared spectrum data, and unmixing the spectrum data to obtain a feature data set of a solvent; outputting a to-be-corrected signal according to the feature data set, correcting the to-be-corrected signal with preset data, and determining a signal feature of the solvent; carrying out dynamic correction on the signal characteristics and a preset characteristic matrix, outputting concentration time sequence data of the solvent, carrying out steady state judgment by combining a preset convergence threshold value, and determining a critical state of the solvent; acquiring control strategy data according to the critical state, analyzing the control strategy data into execution response characteristics, performing multi-channel mapping and correction processing, and outputting a process control signal; and performing control gain correction on the process control signal to finish closed-loop feedback control of the final drying process. The method is based on multi-solvent spectrum sensing and concentration dynamic analysis, and self-adaptive closed-loop control of the critical point drying process is achieved.

A method and apparatus for scanning probe-based surface characterization is disclosed which allows high scanning velocities and data throughput and is suitable for large samples. A combination of rotational and linear translation is used for scanning the probe by concentric circle or spiral trajectories in overlapping ring patterns. A method and apparatus for rapid control of tilt-related probe-sample separation distance and suitable for such scanning pattern is described.

The disclosure relates to air transfer free of solid state batteries and electrical testing of solid state batteries in scanning electron microscopes. In one embodiment, an apparatus includes a sample stage including a base member and a sample support assembly coupled to the base member, where the sample support assembly includes a bracket having opposing first and second bracket portions, the first holder portion and the second holder portion are configured to compress a sample within the holder receiving portion, wherein the base member is configured to engage a sample stage within a microscope chamber. A method includes securing a sample stage in a microscope chamber and charging and / or discharging the sample at least partially through an electrical coupling in the chamber.

The invention provides a nanoscale metal tip intelligent detector and a use and analysis method thereof. The device integrates a high-precision imaging and positioning module, an intelligent analysis module, an intelligent control interaction module and an automatic execution mechanism. The imaging and positioning module is composed of an optical microscope, a high-resolution CCD camera and a three-axis precision objective table and supports nanoscale morphology feature capture and micron-scale positioning precision. The intelligent analysis module can automatically extract the curvature radius, the taper angle, the surface roughness and other key parameters. The control interaction module is coupled with the automatic execution mechanism, so that automatic control of the detection process and remote storage and optimization of process data can be realized. The device can automatically complete the detection and intelligent analysis of the morphology of the nanoscale metal tip, is compatible with application scenes such as single nanopore / pore channel preparation, scanning probe tip morphology characterization and nano device detection, and remarkably improves the operation efficiency while maintaining high-precision detection.

Methods are provided for operating a scanning probe microscope in which a first method comprises identifying the location of a measurement spot on the surface of the cantilever using a photodetector assembly and executing a calibration procedure to identify a target region for positioning the measurement spot on the surface of the cantilever. A second method comprises identifying the cantilever, retrieving a target region for a measurement spot on the surface of the cantilever from memory based on the identified cantilever; and positioning the measurement spot in the target region.

The invention provides a method and a device for in-situ determination of quartz oxygen isotope in shale, and relates to the technical field of geological prospecting, the method comprises the following steps: crushing or cutting a shale core sample to obtain a core square block, embedding the core square block into a metal target, and pre-treating to obtain a shale sample; scanning and photographing the surface of the shale sample according to a preset mode, splicing a reflected light panoramic image, judging quartz attribute characteristics and cause types of a test target through observation, and delineating the position of the test target; positioning the position of a test target according to the morphology characteristics of the test target and different surrounding reference objects in combination with the reflected light panoramic image, and performing in-situ oxygen isotope test on the test target by using a nanoscale secondary ion probe mass spectrometer to obtain in-situ oxygen isotope test data; and checking each in-situ oxygen isotope measuring point pit position of the shale sample, performing quality control on in-situ oxygen isotope test data according to a checking result, and determining an in-situ oxygen isotope measuring result.

The invention provides a TEM sample back-cutting sample preparation method. The method comprises the following steps: providing a sample structure; bombarding a marking groove on each of the upper and lower sides of the target sample; placing the sample table at a 0-degree position to perform J-shaped cutting on the bottom of the target sample so as to cut off one of the left side and the right side of the target sample; an eay-lift needle is inserted into the first needle head and the second needle head; carrying out first welding on the easy-lift needle and the target sample, and cutting and breaking the unbroken side of the left side and the right side of the target sample; upwards moving the target sample along the inclined surface of one of the marking grooves by using an easy-lift needle; the easy-lift needle and the target sample are fractured at the welding position, and the easy-lift needle is moved to the edge of the target sample so that the target sample can be flatly placed on the surface of the wafer; welding the easy-lift needle and the target sample for the second time, and moving the easy-lift needle to the grid to be welded with the grid; and turning over the grating by 90 degrees, and then carrying out TEM sample back-cutting preparation. According to the invention, the problem of long time consumption of the existing back-cutting sample preparation is solved.

A system for emulating an over-the-air environment for testing a Frequency-modulated Continuous Wave (FMCW) light detection and ranging (LiDAR) unit under test (UUT). The system includes an optical lens system that receives an FMCW laser signal from the LiDAR UUT, and provides the signals to one or more optical fibers. A slope, chirp timing and intensity of the FMCW laser signal is determined using digital signal processing, and a modulation waveform is determined to emulate an over-the-air (OTA) environment based at least in part on the slope, chirp timing, and intensity. An in-phase quadrature phase (IQ) modulator modulates the FMCW laser signal using the modulation waveform and provides the modulated laser signal back through the optical lens system to the LiDAR UUT.

The invention provides a three-dimensional reconstruction method for a porous Ni-YSZ electrode of a solid oxide battery. The three-dimensional reconstruction method comprises the following steps: S1, vacuum cold embedding; s2, argon ion polishing; s3, sample pretreatment and fixation; s4, FIB continuous slicing and In-lens and SE2 dual-channel image acquisition are carried out; and S5, carrying out deep learning analysis. The three-dimensional reconstruction method for the porous Ni-YSZ electrode of the solid oxide battery has the beneficial effects that accurate analysis of a multi-phase material structure is realized by integrating in-situ characterization and intelligent image analysis technologies, and the method has the advantages of high sample preparation stability, good three-dimensional reconstruction precision, high phase identification automation degree and the like. The method is especially suitable for microstructure evolution research of an electrode / electrolyte interface of a solid oxide fuel cell, and has an important value for revealing a material performance attenuation mechanism under high-temperature complex working conditions.

Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry (SIMS) are disclosed. In an example, a secondary ion mass spectrometry (SIMS) system includes a sample stage. A primary ion beam is directed to the sample stage. An extraction lens is directed at the sample stage. The extraction lens is configured to provide a low extraction field for secondary ions emitted from a sample on the sample stage. A magnetic sector spectrograph is coupled to the extraction lens along an optical path of the SIMS system. The magnetic sector spectrograph includes an electrostatic analyzer (ESA) coupled to a magnetic sector analyzer (MSA).

A lithium secondary battery according to the present invention includes a positive electrode and a negative electrode disposed opposite the positive electrode. The slip step difference of the positive electrode is 20 nm or less. The slip segment difference is defined in such a manner that, in a line scan pattern obtained by measuring the surface of the positive electrode in a fully discharged state after 500 times of charging and discharging of the battery using an atomic force microscope (AFM), the distance between a pair of parallel lines in which the slope of the observed mountain shape is not zero may include two or more.

The present invention provides a method for placing the tip (106) of a probe (1106) of a nanomanipulator (104) onto a sample (102, 1102), particularly in a vacuum. The probe (1106) includes a cantilever (108) and a tip (106) attached thereto. The nanomanipulator (104) further includes an excitation unit (1110), the probe (1106) being mechanically coupled to the excitation unit (1110). The method includes the following steps: - when the tip (106) is not in contact with the sample (102), by providing a harmonic... A resonant drive signal (1010) is used to oscillate the probe (1106); - during a first approach phase, the first distance along the z-direction between the tip (106) and the sample (102) is reduced until at least one of a first set of stop conditions is met, wherein the first set of stop conditions includes detecting a shift in the frequency of the resonant drive signal (1010) used during the first approach phase; and - the first approach phase is terminated when the at least one of the first set of stop conditions is met, and the resonant drive signal (1010) is deactivated.

The utility model relates to the technical field of scanning probe microscopes, and particularly discloses a scanning probe microscope independent scanner low in cost and easy to process, which comprises a probe and a needle cylinder, the probe is coaxially arranged in the needle cylinder, one end of the needle cylinder is fixedly bonded with an insulating bottom cover, one end of the insulating bottom cover, which is deviated from the needle cylinder, is fixedly bonded with a piezoelectric scanning tube, and the piezoelectric scanning tube is connected with the needle cylinder. An insulating top cover is fixedly adhered to one end, deviating from the insulating bottom cover, of the piezoelectric scanning tube; and an internal sleeve is sleeved outside the insulating top cover and the external piezoelectric scanning tube. The utility model has the advantages of simple structure and low cost, is suitable for batch production, and the imaging effect is not easily influenced.

Systems / techniques are provided for facilitating large language model assistance for charged-particle microscope operation. In various embodiments, a system can access a natural language instruction associated with a charged-particle microscope, where the natural language instruction can request that the charged-particle microscope undergo a configurable settings adjustment or perform an automated task. In various aspects, the system can cause, in response to the natural language instruction, the charged-particle microscope to capture, according to a default microscopy protocol, an image or an energy spectrum of a specimen that is currently loaded on a stage of the charged-particle microscope. In various instances, the system can execute a large language model on both the natural language instruction and the image or energy spectrum of the specimen, thereby yielding a natural language response that indicates how implementing the natural language instruction would affect the specimen.

The application discloses a vacuum sample clamp device combined with femtosecond laser sample preparation and atomic force microscope (AFM), and relates to the technical field of clamps.The vacuum sample clamp device combined with femtosecond laser sample preparation and atomic force microscope (AFM) comprises an outer shell, a supporting table, a sample table and a position recorder, the outer shell is provided with an inner cavity, a laser inlet and a communication hole, the laser inlet and the communication hole are communicated with the inner cavity respectively, the laser inlet is used for allowing sample preparation laser to enter, and the communication hole is used for being communicated with a vacuum device; the supporting table is movably connected to the inner cavity; the sample table is placed on the supporting table, the sample table is provided with a placing position and a mounting cavity, the placing position is located above the mounting cavity, and the placing position is used for placing a sample; and the position recorder is mounted in the mounting cavity and is used for recording displacement coordinates in a laser sample preparation process after the sample is placed in the placing position. The technical scheme provided by the application can realize fast transfer between a femtosecond laser sample preparation processing environment and an AFM test environment without repositioning.

The embodiment of the invention discloses a mudstone and shale reservoir type identification method and device, equipment and a medium. The method comprises the following steps: acquiring a target proportion of a target pore in a storage space of a test sample; the test sample is made according to a rock sample, the rock sample is obtained from a target stratum, the target stratum is a mudstone or shale reservoir, and the target pores are organic pores, inorganic pores and cracks; determining a target area corresponding to the target proportion of the target pore in a triangular chart; different areas in the triangular chart correspond to different proportions of target pores, and different areas correspond to different reservoir types; and determining the reservoir type corresponding to the target area as the reservoir type of the target stratum. According to the technical scheme, after the reservoir types are quantitatively divided, the reservoir types of the target stratum can be accurately recognized, and guidance and reference are provided for quantitative evaluation, exploration and development of oil and gas reservoirs.

The invention discloses a vacuum transfer device and a sample vacuum transfer method. The vacuum transfer device comprises a vacuum cup main body; the inner part is provided with a sample cavity, the sample cavity is used for containing a sample, the inner part is movably arranged in the vacuum cup main body, a cavity is defined between the vacuum cup main body and the inner part, and the elastic part is used for providing elastic force needed for opening the inner part relative to the vacuum cup main body; the one-way valve is arranged on the vacuum cup main body or the internal part and is communicated with the cavity and the outside so as to allow gas in the cavity to flow out from the one-way valve; the chamber switch is arranged on the vacuum cup main body or the internal part and is communicated with the chamber and the outside so as to close or open the chamber; the vacuum transfer device has a closed state and an open state; the device has the advantages of high stability, convenience in operation, portability, wide sample application range, multiple observation modes and the like, and can be used for deeply exploring multi-mode in-situ observation of various inert samples.

An equipment mount for an x-ray apparatus is disclosed. The mount comprises a main shield element, a peripheral shield element and a secondary shield element arranged to permit a mounting element to pass through the main shield element in a shielded manner. A support apparatus for an x-ray apparatus is also disclosed. The support apparatus comprises a separable bearing for translating a support part between a first position and a second position and an elevator mechanism for translating the support part from the second position to a third position, thereby separating the bearing. A manipulator stage for an x-ray apparatus is also disclosed. The stage comprises a first support structure arranged to support a sample stage and supported at first and second positions either side of the sample stage by second and third support structures, the second and third support structures being configured to allow the first support structure to raise and lower while remaining supported at both ends.

The present invention relates to the field of image recognition, and proposes a transmission electron microscopy identification method and system for the separation process of exosomes in gastric cancer tumor tissues. By using a clustering algorithm to divide the suspected structures in the target lens image, a primary evaluation of the exosome manifestation degree at the edge is carried out based on the edge differentiation degree and the degree of darkness outside the edge of the suspected structure. Then, a secondary evaluation is combined with the background staining change state of the suspected structure, avoiding the influence that the contour of the background impurities is relatively deep in the prior art, resulting in low differentiation between impurities and exosomes, and improving the accuracy of identification. Furthermore, the morphological matching degree of exosomes is calculated according to the internal depression characteristics of the suspected structure, avoiding the problem that the accuracy of the identification result is affected by the difference in the facing situation of different structures in the lens image and the observation perspective, and realizing the auxiliary analysis of the depression characteristics of exosomes under different facing situations of the perspective. The present invention improves the accuracy of transmission electron microscopy identification in the separation process of exosomes in gastric cancer tumor tissues.

A probe microscope system includes a probe including a cantilever mount, a cantilever extending from the cantilever mount to a free end, and a probe tip carried by the free end of the cantilever; a drive system configured to drive the probe toward and away from a training sample; a measurement system configured to acquire probe data in a measurement period in which the probe tip interacts with the training sample, where the measurement period comprises in succession a first driving phase in which the probe is driven towards the training sample and a second driving phase in which the probe is driven towards the training sample. A second driving phase in which the probe is driven away from the training sample and the probe data is acquired by measuring a parameter of the probe; a machine learning model; and a training module configured to input the probe data as training data into the machine learning model to train the machine learning model by machine learning, where the training data includes a data set of a plurality of measurements of the parameter of the probe, and each measurement in the data set is acquired in the same measurement period.

The present application relates to the technical field of scanning electron microscopy, and discloses a working distance calibration method and system for a scanning electron microscope, the scanning electron microscope and a medium. The method comprises the following steps: placing an elevation sample on a sample stage of a scanning electron microscope to be calibrated, adjusting objective lens excitation, changing the focal length of the objective lens, and obtaining objective lens excitation under different accelerating voltages; under the same working distance, fitting different accelerating voltages and corresponding objective lens excitation by using a first fitting model to determine first, second, third, fourth and fifth calibration parameters of the first fitting model; under the same accelerating voltage, fitting different working distances and corresponding objective lens excitation by using a second fitting model to determine the third, fourth and fifth calibration parameters of the second fitting model; and calibrating the scanning electron microscope to be calibrated by using the five calibration parameters. The present application determines multiple calibration parameters by using two fitting models, thereby improving the accuracy of calibration of key parameters of the scanning electron microscope before delivery.

A positioning device for an analytical instrument (e.g., an atom probe microscope or other nanoscale microscope) includes a primary carriage translatable relative to a vacuum chamber wall, and a secondary carriage connected to the primary carriage by a plurality of spaced actuators that allow the secondary carriage to translate and / or tilt relative to the primary carriage. An arm then extends from the secondary carriage through the vacuum chamber wall and connects to the instrument. The instrument may be rapidly extended or retracted within the vacuum chamber via its connection to the primary carriage, and may be more finely translated and / or tilted via its connection to the secondary carriage. A damping arrangement isolates the instrument from vibrations.

Systems and methods for simultaneous phase-contrast imaging and electron energy loss spectroscopy. The method and system for imaging a sample with charged particles include guiding charged particles toward the sample along a principal axis, and simultaneously detecting a first portion and a second portion of the charged particles transmitted through the sample using a first detector and a second detector, respectively. The second detector is positioned downstream of the first detector. Each of the transmitted charged particles exits the sample at an exit angle between the direction of the transmitted charged particle and the principal axis. The exit angle of the first portion of the transmitted charged particle overlaps with the exit angle of the second portion of the transmitted charged particle. In this way, complementary information, such as structural and compositional information, can be obtained simultaneously.

To reduce the work load on a user generated when a probe is brought in contact with the surface of a sample and the measurement environment of a scan type probe microscope for measuring the shape of the surface of the sample is changed.SOLUTION: A scan type probe microscope 100 is a scan type probe microscope for measuring the surface of a sample S by using a probe 109. The scan type probe microscope 100 includes: a microscope body part 10 having a probe 109; a controller 11 for controlling a microscope body part 10; an anti-vibration table 12 for supporting the microscope body part 10 arranged in a region R1; a housing 13 for containing the microscope body part 10, the controller 11, and the anti-vibration table 12; and a movement mechanism 14 used to move the housing 13.SELECTED DRAWING: Figure 2

The utility model discloses a constant-temperature timing sodium hyaluronate solubility detection device, and relates to the technical field of sodium hyaluronate detection, the top of an operation table is fixedly connected with a detection bin, the top of the detection bin is provided with a liquid injection port, the outer side of the liquid injection port is connected with a liquid conveying mechanism, the outer side of the detection bin is connected with a flow guide mechanism, and the flow guide mechanism is connected with a liquid outlet. A heating box and a liquid storage bin are arranged at the top of the operation table, the detection bin is connected with the liquid storage bin through a liquid conveying mechanism, and the detection bin is connected with the heating box through a flow guide mechanism; a driving motor is arranged at the top of the operating table, and the top of the driving motor is connected with the diversion mechanism. Through forward rotation of a driving motor, the driving motor can drive a flow guide mechanism and a liquid conveying mechanism to operate at the same time, so that when the liquid conveying mechanism conveys sodium hyaluronate to a detection bin for detection, hot air in a heating box is conveyed into the detection bin through the flow guide mechanism, and the heating box continuously conveys the hot air into the detection bin; therefore, the detection bin is in a constant-temperature state.

A laser diode device is provided, comprising a laser diode, a driver (EPS) for supplying AC power to the laser diode, a first feedback component (FB1), and a second feedback component (FB2). The first feedback component (FB1) is configured to detect an optical output of the laser diode and controls a first waveform characteristic of the AC power to adjust the detected optical output (P M ) as the first target value (P D ) The second feedback component (FB2) controls the temperature (T EST ) and controlling a second waveform characteristic of the AC power, which is different from the first waveform characteristic, to estimate the estimated temperature (T EST ) to the second target value (T OPT ) configured to maintain the temperature at or near the

The invention relates to a tactile sensor device 100, 200, 300 for bringing two elements into contact with (1) a positioning unit 110, 210, 310, which is configured to position a first element E1 linearly along a probing direction, wherein the positioning unit comprises: an end effector 112, 212, 312, which is connected to the first element, and a position sensor 213, which is configured to detect at least a change in the position of the end effector, and (2) a controller 120, 220, wherein the controller is configured to regulate the position of the end effector to a predefined setpoint, to determine a difference between an actual value and the predefined setpoint of the position of the end effector,to determine a change in the difference or a quantity dependent on the difference and, based on the change in the difference or the quantity dependent on the difference, to determine a force exerted by a second element on the first element connected to the end effector.

The utility model discloses a novel special sample table for a freezing scanning electron microscope, and relates to the technical field of experimental equipment, in particular to a novel special sample table for a freezing scanning electron microscope, which comprises a base and a sample table body, a square sample groove is arranged on the upper surface of the sample table body, and an adjusting sliding plate is slidably connected in the square sample groove. An adjusting bin is formed in the sample table body, a supporting shaft rod is arranged in the adjusting bin, an adjusting gear is rotationally connected to the outer surface of the supporting shaft rod, an adjusting rack is meshed with the outer surface of the adjusting gear, a connecting plate is arranged at one end of the adjusting rack, and one end of the connecting plate is arranged on the outer surface of an adjusting sliding plate. According to the novel special sample table for the freezing scanning electron microscope, the square sample groove, the adjusting sliding plate, the circular sample groove, the first adjusting ring and the second adjusting ring are arranged in a matched mode, so that the novel special sample table for the freezing scanning electron microscope has the effect that samples of different sizes and types can be conveniently tested.