398results about "Scanning probe techniques" patented technology

A transmission electron microscope sample rod (100) and a sample testing method. The transmission electron microscope sample rod (100) comprises a heating element (10) and a testing mechanism (20), wherein the heating element (10) is configured to heat a sample, the testing mechanism (20) is constructed with a plurality of connecting arms (21) which are arranged at intervals in a circumferential direction of the testing mechanism (20), an accommodating space (23) is defined by means of the plurality of connecting arms (21), one side of each connecting arm (21) facing the accommodating space is defined as an output end (202), the plurality of output ends (202) jointly clamp the sample, each connecting arm (21) can extend and retract in an extension direction of the output end (202), and each connecting arm (21) is connected to the heating element (10).

The invention discloses a multi-dimensional piezoelectric motor of a single piezoelectric device and a control method. The piezoelectric motor comprises a two-dimensional moving platform, a sliding rod mechanism and a scanning tube mechanism. The sliding rod mechanism is elastically fixed in the scanning tube mechanism, and the two-dimensional moving platform is fixed at the top of the sliding rod mechanism; wherein the two-dimensional moving platform comprises a sample table, an x-axis sliding block, a blade block and a y-axis sliding block from top to bottom; the winding device further comprises a winding pile. The blade block is a block with a central through hole, the upper surface is provided with two blades which are parallel along the x axis and are centrosymmetric, and the lower surface is provided with two blades which are parallel along the y axis and are centrosymmetric; the upper surface of the x-axis sliding block is attached to the plane of the sample table, the lower surface of the x-axis sliding block is tangent to blades on the two sides of the upper surface of the blade block, and a through inverted-T-shaped hole is formed in the x-axis sliding block. The upper surface of the y-axis sliding block is tangent to blades on two sides of the lower surface of the blade block, and a through convex hole is formed in the y-axis sliding block; the winding pile is in the shape of a tube with outer steps at the upper end and the lower end and is coaxially arranged in the inverted convex hole of the x-axis sliding block. According to the invention, the robot walks along the specific double-edge guide rail in different dimensions, so that the displacement deviation can be effectively reduced, and the positioning precision is improved.

Provided are systems and methods for analyte detection and analysis. A system can comprise an open substrate configured to rotate. The open substrate can comprise an array of immobilized analytes. A solution comprising a plurality of probes may be directed, via centrifugal force, across the array during rotation of the substrate, to couple at least one of the plurality of probes with at least one of the analytes to form a bound probe. A detector can be configured to detect a signal from the bound probe via continuous rotational area scanning of the substrate.

The invention relates to the technical field of electron microscope sample pretreatment, and discloses a critical point drying control method and device based on online near-infrared monitoring, and the method comprises the steps: obtaining infrared spectrum data, and unmixing the spectrum data to obtain a feature data set of a solvent; outputting a to-be-corrected signal according to the feature data set, correcting the to-be-corrected signal with preset data, and determining a signal feature of the solvent; carrying out dynamic correction on the signal characteristics and a preset characteristic matrix, outputting concentration time sequence data of the solvent, carrying out steady state judgment by combining a preset convergence threshold value, and determining a critical state of the solvent; acquiring control strategy data according to the critical state, analyzing the control strategy data into execution response characteristics, performing multi-channel mapping and correction processing, and outputting a process control signal; and performing control gain correction on the process control signal to finish closed-loop feedback control of the final drying process. The method is based on multi-solvent spectrum sensing and concentration dynamic analysis, and self-adaptive closed-loop control of the critical point drying process is achieved.

The invention belongs to the technical field of semiconductor detection, and particularly relates to a semiconductor detection system and a dark field lighting device thereof. The dark field lighting device comprises a light source, an objective lens, a light beam conversion unit and a light path adjusting unit. The light source emits a first beam; the objective lens forms a dark field light path channel; the light beam conversion unit is used for converting the first light beam into a second light beam, and the light beam intensity in the second light beam is sequentially increased from the light beam center to the outer edge; the light path adjusting unit is used for transmitting at least part of light beams, close to the outer edge, in the second light beams to the dark field light path channel. In the dark field illumination device, part of the light beam entering the dark field light path channel through the light path adjusting unit is the outer edge part with high light beam intensity in the second light beam, so that the dark field illumination efficiency is improved, and the detection precision is improved. Certainly, the semiconductor detection system with the dark field illumination device has high dark field illumination efficiency.

A method and apparatus for scanning probe-based surface characterization is disclosed which allows high scanning velocities and data throughput and is suitable for large samples. A combination of rotational and linear translation is used for scanning the probe by concentric circle or spiral trajectories in overlapping ring patterns. A method and apparatus for rapid control of tilt-related probe-sample separation distance and suitable for such scanning pattern is described.

Provided herein are systems and methods for imaging using a microscope system comprising removeable or replaceable component parts. Such systems and methods employ semi-kinetic coupling for easy, tool-free attachment of the microscope system to a baseplate. Systems and methods provided herein may comprise simultaneous imaging and stimulation using a microscope system. The microscope system can have a relatively small size compared to an average microscope system.

The disclosure relates to air transfer free of solid state batteries and electrical testing of solid state batteries in scanning electron microscopes. In one embodiment, an apparatus includes a sample stage including a base member and a sample support assembly coupled to the base member, where the sample support assembly includes a bracket having opposing first and second bracket portions, the first holder portion and the second holder portion are configured to compress a sample within the holder receiving portion, wherein the base member is configured to engage a sample stage within a microscope chamber. A method includes securing a sample stage in a microscope chamber and charging and / or discharging the sample at least partially through an electrical coupling in the chamber.

The invention provides a nanoscale metal tip intelligent detector and a use and analysis method thereof. The device integrates a high-precision imaging and positioning module, an intelligent analysis module, an intelligent control interaction module and an automatic execution mechanism. The imaging and positioning module is composed of an optical microscope, a high-resolution CCD camera and a three-axis precision objective table and supports nanoscale morphology feature capture and micron-scale positioning precision. The intelligent analysis module can automatically extract the curvature radius, the taper angle, the surface roughness and other key parameters. The control interaction module is coupled with the automatic execution mechanism, so that automatic control of the detection process and remote storage and optimization of process data can be realized. The device can automatically complete the detection and intelligent analysis of the morphology of the nanoscale metal tip, is compatible with application scenes such as single nanopore / pore channel preparation, scanning probe tip morphology characterization and nano device detection, and remarkably improves the operation efficiency while maintaining high-precision detection.

Methods are provided for operating a scanning probe microscope in which a first method comprises identifying the location of a measurement spot on the surface of the cantilever using a photodetector assembly and executing a calibration procedure to identify a target region for positioning the measurement spot on the surface of the cantilever. A second method comprises identifying the cantilever, retrieving a target region for a measurement spot on the surface of the cantilever from memory based on the identified cantilever; and positioning the measurement spot in the target region.

The invention provides a method and a device for in-situ determination of quartz oxygen isotope in shale, and relates to the technical field of geological prospecting, the method comprises the following steps: crushing or cutting a shale core sample to obtain a core square block, embedding the core square block into a metal target, and pre-treating to obtain a shale sample; scanning and photographing the surface of the shale sample according to a preset mode, splicing a reflected light panoramic image, judging quartz attribute characteristics and cause types of a test target through observation, and delineating the position of the test target; positioning the position of a test target according to the morphology characteristics of the test target and different surrounding reference objects in combination with the reflected light panoramic image, and performing in-situ oxygen isotope test on the test target by using a nanoscale secondary ion probe mass spectrometer to obtain in-situ oxygen isotope test data; and checking each in-situ oxygen isotope measuring point pit position of the shale sample, performing quality control on in-situ oxygen isotope test data according to a checking result, and determining an in-situ oxygen isotope measuring result.

The invention provides a TEM sample back-cutting sample preparation method. The method comprises the following steps: providing a sample structure; bombarding a marking groove on each of the upper and lower sides of the target sample; placing the sample table at a 0-degree position to perform J-shaped cutting on the bottom of the target sample so as to cut off one of the left side and the right side of the target sample; an eay-lift needle is inserted into the first needle head and the second needle head; carrying out first welding on the easy-lift needle and the target sample, and cutting and breaking the unbroken side of the left side and the right side of the target sample; upwards moving the target sample along the inclined surface of one of the marking grooves by using an easy-lift needle; the easy-lift needle and the target sample are fractured at the welding position, and the easy-lift needle is moved to the edge of the target sample so that the target sample can be flatly placed on the surface of the wafer; welding the easy-lift needle and the target sample for the second time, and moving the easy-lift needle to the grid to be welded with the grid; and turning over the grating by 90 degrees, and then carrying out TEM sample back-cutting preparation. According to the invention, the problem of long time consumption of the existing back-cutting sample preparation is solved.

A system for emulating an over-the-air environment for testing a Frequency-modulated Continuous Wave (FMCW) light detection and ranging (LiDAR) unit under test (UUT). The system includes an optical lens system that receives an FMCW laser signal from the LiDAR UUT, and provides the signals to one or more optical fibers. A slope, chirp timing and intensity of the FMCW laser signal is determined using digital signal processing, and a modulation waveform is determined to emulate an over-the-air (OTA) environment based at least in part on the slope, chirp timing, and intensity. An in-phase quadrature phase (IQ) modulator modulates the FMCW laser signal using the modulation waveform and provides the modulated laser signal back through the optical lens system to the LiDAR UUT.

Provided are systems and methods for analyte detection and analysis. A system can comprise an open substrate configured to rotate. The open substrate can comprise an array of immobilized analytes. A solution comprising a plurality of probes may be directed, via centrifugal force, across the array during rotation of the substrate, to couple at least one of the plurality of probes with at least one of the analytes to form a bound probe. A detector can be configured to detect a signal from the bound probe via continuous rotational area scanning of the substrate.

The invention provides a cryoelectron microscope liquid nitrogen sample automatic extraction mechanical arm, and relates to the technical field of mechanical arms with special purposes, the cryoelectron microscope liquid nitrogen sample automatic extraction mechanical arm comprises a lower ring beam, a plurality of lifting rods are arranged on the lower ring beam, the lifting rods vertically penetrate through the lower ring beam and are in sliding connection with the lower ring beam, the bottom of each lifting rod is provided with a storage bin, and the storage bins are used for storing a plurality of copper mesh samples; the cover body is fixedly connected with the lower ring beam and used for being connected with a liquid nitrogen tank, and the cover body and the liquid nitrogen tank form a sealing structure; the manipulator is arranged at the top of the lower ring beam through a bracket and is used for sampling, and the manipulator lifts the corresponding lifting rod and enables the storage bin to be close to the position of the cover body of the liquid nitrogen tank. The device has the beneficial effects that through the structures of the lower ring beam, the lifting rod and the storage bin, copper wire mesh samples are convenient to find and take; due to the annular and multi-layer storage bin structure, the number of stored copper wire mesh samples can be greatly increased; due to the structure that the sampling opening is connected with the storage bin cavity, the copper wire mesh sample is prevented from falling off during sampling; the joint mechanical arm and the lifting type mechanical arm can automatically take out copper wire mesh samples, and the test efficiency is improved.

The utility model provides a sample fixing mould for a scanning probe microscope, which comprises a supporting surface for bearing a sample, the supporting surface is provided with a plurality of clamping pieces which can be opened and closed on the supporting surface and are used for pressing the sample on the supporting surface, and the mould is used for fixing the sample when the sample is tested by using the scanning probe microscope. And the sample is simple and easy to mount, fix, dismount and replace. Preferably, the mold is provided with a reflective mirror, a light guide groove and a groove capable of containing a heating piece and / or a magnetic field applying piece, multi-mode sample microscopic testing of the sample under illumination, heat and magnetization adjustment can be achieved, application scenes of the scanning probe microscope under different testing conditions are expanded, and the mold has good application prospects.

The invention discloses a sample preparation method for Micro-LED cross section surface potential test and application of the sample preparation method. The Micro-LED cross section active region surface potential testing method comprises the following steps: preparing a Micro-LED cross section sample, and polishing the cross section of the sample by using an argon ion beam polishing process to form a test sample with the surface roughness of nanoscale; a Kelvin probe microscope (KPFM) is used for testing the surface potential of the test sample, and the KPFM not only can represent the surface appearance of the sample, but also can obtain the electrical property-surface potential of the surface of the sample by manufacturing a section sample and simulating the etching process, so that the difference of the surface potential of different areas can be compared more intuitively. Furthermore, the work function of the semiconductor material can be measured and calculated, and meanwhile, an energy band model can be established to analyze the transport condition of carriers on the surface.

The invention provides a three-dimensional reconstruction method for a porous Ni-YSZ electrode of a solid oxide battery. The three-dimensional reconstruction method comprises the following steps: S1, vacuum cold embedding; s2, argon ion polishing; s3, sample pretreatment and fixation; s4, FIB continuous slicing and In-lens and SE2 dual-channel image acquisition are carried out; and S5, carrying out deep learning analysis. The three-dimensional reconstruction method for the porous Ni-YSZ electrode of the solid oxide battery has the beneficial effects that accurate analysis of a multi-phase material structure is realized by integrating in-situ characterization and intelligent image analysis technologies, and the method has the advantages of high sample preparation stability, good three-dimensional reconstruction precision, high phase identification automation degree and the like. The method is especially suitable for microstructure evolution research of an electrode / electrolyte interface of a solid oxide fuel cell, and has an important value for revealing a material performance attenuation mechanism under high-temperature complex working conditions.

Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry (SIMS) are disclosed. In an example, a secondary ion mass spectrometry (SIMS) system includes a sample stage. A primary ion beam is directed to the sample stage. An extraction lens is directed at the sample stage. The extraction lens is configured to provide a low extraction field for secondary ions emitted from a sample on the sample stage. A magnetic sector spectrograph is coupled to the extraction lens along an optical path of the SIMS system. The magnetic sector spectrograph includes an electrostatic analyzer (ESA) coupled to a magnetic sector analyzer (MSA).

A method of examining a sample in an atomic force microscope including at least one probe, each probe including at least one cantilever and at least one tip includes carrying out a negative setpoint setting procedure, wherein the negative setpoint SCD is set as a negative real number, an approaching procedure including: above at least one point of the sample, performing an approach including reducing the tip-to-sample distance and recording cantilever deflection as a function of the tip-to-sample distance, while applying the standard sign convention with cantilever deflection considered negative for attractive forces and positive for repulsive forces, until at least one of critical criteria is achieved, and pausing or stopping of the approach after performing the approaching procedures.

A lithium secondary battery according to the present invention includes a positive electrode and a negative electrode disposed opposite the positive electrode. The slip step difference of the positive electrode is 20 nm or less. The slip segment difference is defined in such a manner that, in a line scan pattern obtained by measuring the surface of the positive electrode in a fully discharged state after 500 times of charging and discharging of the battery using an atomic force microscope (AFM), the distance between a pair of parallel lines in which the slope of the observed mountain shape is not zero may include two or more.

The present invention provides a method for placing the tip (106) of a probe (1106) of a nanomanipulator (104) onto a sample (102, 1102), particularly in a vacuum. The probe (1106) includes a cantilever (108) and a tip (106) attached thereto. The nanomanipulator (104) further includes an excitation unit (1110), the probe (1106) being mechanically coupled to the excitation unit (1110). The method includes the following steps: - when the tip (106) is not in contact with the sample (102), by providing a harmonic... A resonant drive signal (1010) is used to oscillate the probe (1106); - during a first approach phase, the first distance along the z-direction between the tip (106) and the sample (102) is reduced until at least one of a first set of stop conditions is met, wherein the first set of stop conditions includes detecting a shift in the frequency of the resonant drive signal (1010) used during the first approach phase; and - the first approach phase is terminated when the at least one of the first set of stop conditions is met, and the resonant drive signal (1010) is deactivated.

The utility model relates to the technical field of scanning probe microscopes, and particularly discloses a scanning probe microscope independent scanner low in cost and easy to process, which comprises a probe and a needle cylinder, the probe is coaxially arranged in the needle cylinder, one end of the needle cylinder is fixedly bonded with an insulating bottom cover, one end of the insulating bottom cover, which is deviated from the needle cylinder, is fixedly bonded with a piezoelectric scanning tube, and the piezoelectric scanning tube is connected with the needle cylinder. An insulating top cover is fixedly adhered to one end, deviating from the insulating bottom cover, of the piezoelectric scanning tube; and an internal sleeve is sleeved outside the insulating top cover and the external piezoelectric scanning tube. The utility model has the advantages of simple structure and low cost, is suitable for batch production, and the imaging effect is not easily influenced.

Systems / techniques are provided for facilitating large language model assistance for charged-particle microscope operation. In various embodiments, a system can access a natural language instruction associated with a charged-particle microscope, where the natural language instruction can request that the charged-particle microscope undergo a configurable settings adjustment or perform an automated task. In various aspects, the system can cause, in response to the natural language instruction, the charged-particle microscope to capture, according to a default microscopy protocol, an image or an energy spectrum of a specimen that is currently loaded on a stage of the charged-particle microscope. In various instances, the system can execute a large language model on both the natural language instruction and the image or energy spectrum of the specimen, thereby yielding a natural language response that indicates how implementing the natural language instruction would affect the specimen.

The application discloses a vacuum sample clamp device combined with femtosecond laser sample preparation and atomic force microscope (AFM), and relates to the technical field of clamps.The vacuum sample clamp device combined with femtosecond laser sample preparation and atomic force microscope (AFM) comprises an outer shell, a supporting table, a sample table and a position recorder, the outer shell is provided with an inner cavity, a laser inlet and a communication hole, the laser inlet and the communication hole are communicated with the inner cavity respectively, the laser inlet is used for allowing sample preparation laser to enter, and the communication hole is used for being communicated with a vacuum device; the supporting table is movably connected to the inner cavity; the sample table is placed on the supporting table, the sample table is provided with a placing position and a mounting cavity, the placing position is located above the mounting cavity, and the placing position is used for placing a sample; and the position recorder is mounted in the mounting cavity and is used for recording displacement coordinates in a laser sample preparation process after the sample is placed in the placing position. The technical scheme provided by the application can realize fast transfer between a femtosecond laser sample preparation processing environment and an AFM test environment without repositioning.

The embodiment of the invention discloses a mudstone and shale reservoir type identification method and device, equipment and a medium. The method comprises the following steps: acquiring a target proportion of a target pore in a storage space of a test sample; the test sample is made according to a rock sample, the rock sample is obtained from a target stratum, the target stratum is a mudstone or shale reservoir, and the target pores are organic pores, inorganic pores and cracks; determining a target area corresponding to the target proportion of the target pore in a triangular chart; different areas in the triangular chart correspond to different proportions of target pores, and different areas correspond to different reservoir types; and determining the reservoir type corresponding to the target area as the reservoir type of the target stratum. According to the technical scheme, after the reservoir types are quantitatively divided, the reservoir types of the target stratum can be accurately recognized, and guidance and reference are provided for quantitative evaluation, exploration and development of oil and gas reservoirs.

The invention discloses a vacuum transfer device and a sample vacuum transfer method. The vacuum transfer device comprises a vacuum cup main body; the inner part is provided with a sample cavity, the sample cavity is used for containing a sample, the inner part is movably arranged in the vacuum cup main body, a cavity is defined between the vacuum cup main body and the inner part, and the elastic part is used for providing elastic force needed for opening the inner part relative to the vacuum cup main body; the one-way valve is arranged on the vacuum cup main body or the internal part and is communicated with the cavity and the outside so as to allow gas in the cavity to flow out from the one-way valve; the chamber switch is arranged on the vacuum cup main body or the internal part and is communicated with the chamber and the outside so as to close or open the chamber; the vacuum transfer device has a closed state and an open state; the device has the advantages of high stability, convenience in operation, portability, wide sample application range, multiple observation modes and the like, and can be used for deeply exploring multi-mode in-situ observation of various inert samples.

An equipment mount for an x-ray apparatus is disclosed. The mount comprises a main shield element, a peripheral shield element and a secondary shield element arranged to permit a mounting element to pass through the main shield element in a shielded manner. A support apparatus for an x-ray apparatus is also disclosed. The support apparatus comprises a separable bearing for translating a support part between a first position and a second position and an elevator mechanism for translating the support part from the second position to a third position, thereby separating the bearing. A manipulator stage for an x-ray apparatus is also disclosed. The stage comprises a first support structure arranged to support a sample stage and supported at first and second positions either side of the sample stage by second and third support structures, the second and third support structures being configured to allow the first support structure to raise and lower while remaining supported at both ends.

The present invention relates to the field of image recognition, and proposes a transmission electron microscopy identification method and system for the separation process of exosomes in gastric cancer tumor tissues. By using a clustering algorithm to divide the suspected structures in the target lens image, a primary evaluation of the exosome manifestation degree at the edge is carried out based on the edge differentiation degree and the degree of darkness outside the edge of the suspected structure. Then, a secondary evaluation is combined with the background staining change state of the suspected structure, avoiding the influence that the contour of the background impurities is relatively deep in the prior art, resulting in low differentiation between impurities and exosomes, and improving the accuracy of identification. Furthermore, the morphological matching degree of exosomes is calculated according to the internal depression characteristics of the suspected structure, avoiding the problem that the accuracy of the identification result is affected by the difference in the facing situation of different structures in the lens image and the observation perspective, and realizing the auxiliary analysis of the depression characteristics of exosomes under different facing situations of the perspective. The present invention improves the accuracy of transmission electron microscopy identification in the separation process of exosomes in gastric cancer tumor tissues.

A probe microscope system includes a probe including a cantilever mount, a cantilever extending from the cantilever mount to a free end, and a probe tip carried by the free end of the cantilever; a drive system configured to drive the probe toward and away from a training sample; a measurement system configured to acquire probe data in a measurement period in which the probe tip interacts with the training sample, where the measurement period comprises in succession a first driving phase in which the probe is driven towards the training sample and a second driving phase in which the probe is driven towards the training sample. A second driving phase in which the probe is driven away from the training sample and the probe data is acquired by measuring a parameter of the probe; a machine learning model; and a training module configured to input the probe data as training data into the machine learning model to train the machine learning model by machine learning, where the training data includes a data set of a plurality of measurements of the parameter of the probe, and each measurement in the data set is acquired in the same measurement period.