895results about How to "Shorten inspection time" patented technology

The present invention discloses an object image detection method, which uses a coarse-to-fine strategy to detect objects. The method of the present invention comprises steps: acquiring an image and pre-processing the image to achieve dimensional reduction and information fusion; using a trained filter to screen features; and sequentially using a coarse-level MLP verifier and a fine-level MLP verifier to perform a neural network image detection to determine whether the features of the image match the features of the image of a target object. The present invention simultaneously uses three mainstream image detection methods, including the statistic method, neural network method and adaboost method, to perform image detection. Therefore, the present invention has the advantages of the rapidity of the adaboost method and the accuracy of the neural network method at the same time.

A method of determining a presence of items of interest within a cargo container is disclosed. The method includes obtaining information from an initial radiation scan of at least one of the cargo container and contents therein, identifying a target portion of the cargo container in response to the information obtained, transmitting a target radiation beam along the target portion of the cargo container, and detecting radiation received in response to the transmitting. The method further includes analyzing the detected radiation for a presence of items of interest, and in response to the analyzing, generating a first signal indicative of the presence of the items of interest, or generating a second signal indicative of an absence of the items of interest.

Systems and methods for detecting false code in web pages linked to a web site are provided. One system includes a web server for administering the web site and a surveillance server for collecting generated or updated web pages from among the web pages linked to the web site, selecting tags of a given tag type included in the collected web pages, determining whether the selected tags comprise false code, and providing the determination result to an administrator terminal such that an administrator can check the determination result. One method includes collecting web pages that were generated or updated within a set time period from among the web pages linked to the web site, determining whether tags included in the collected web pages comprise false code, and providing the determination result to an administrator terminal such that an administrator can check the determination result.

A semiconductor device includes a first semiconductor element; a first thick plate portion that is electrically connected to an electrode on a lower surface side of the first semiconductor element, and is formed by a conductor; a second semiconductor element that is arranged such that a main surface of the second semiconductor element faces a main surface of the first semiconductor element; a second thick plate portion that is electrically connected to an electrode on a lower surface side of the second semiconductor element, and is formed by a conductor; a third thick plate portion that is electrically connected to an electrode on an upper surface side of the first semiconductor element, and is formed by a conductor; a fourth thick plate portion that is electrically connected to an electrode on an upper surface side of the second semiconductor element, and is formed by a conductor; a first thin plate portion that is provided on the second thick plate portion, is formed by a conductor, and is thinner than the second thick plate portion; and a second thin plate portion that is provided on the third thick plate portion, is formed by a conductor, and is thinner than the third thick plate portion. The first thin plate portion and the second thin plate portion are fixed together and electrically connected.

An optically scanning apparatus and defect inspection system able to detect a defect with a high resolution and able to greatly shorten the inspection time. An radiation beam generated from a light source is converted to a light beam array of an m×n matrix by a two-dimensional diffraction grating. The light beams of the light beam array are focused into micro spots by an objective lens and projected on a sample. Therefore, a two-dimensional light spot array of an m×n matrix is formed on a sample. The sample stage rotates and moves rectilinearly in an r direction, so the sample surface is scanned by the m×n matrix of light spots. As a result, the sample surface is spirally scanned by a light beam of a belt shape of the scan width, so can be scanned at a high speed. Further, the beams reflected by the sample surface are received by light receiving elements separated by light blocking members, so a confocal optical system is formed and as a result the resolution of detection of defects becomes much higher.

An electron beam (area beam) having a fixed area is irradiated onto the surface of a semiconductor sample, and reflected electrons from the sample surface are imaged by the imaging lens, and images of a plurality of regions of the surface of the semiconductor sample are obtained and stored in the image storage unit, and the stored images of the plurality of regions are compared with each other, and the existence of a defect in the regions and the defect position are measured. By doing this, in an apparatus for testing a pattern defect of the same design, foreign substances, and residuals on a wafer in the manufacturing process of a semiconductor apparatus by an electron beam, speeding-up of the test can be realized.

A plurality of subsets of ultrasonic transducers in an array of ultrasonic transducers are configured to transmit ultrasonic waves at various angles simultaneously toward a test object so that an anomaly of any orientation in the test object can be detected efficiently.

The invention provides a crystal direction finder for directly measuring deflecting angle in crystal orientation, which is characterized in that one side of an objective table is connected with an X-ray generator, and the other side is connected with an X-ray detector, and an objective table is provided with a horizontal revolving bench, and the horizontal revolving stage can revolve a crystal to be measured parallely to the light propagation surface, and the center of the horizontal revolving bench is fixed with a vertical revolving stage, and the vertical revolving stage can revolve the crystal to be measured on the plane which is perpendicular to the light propagation surface; the crystal direction finder is used for directly finding the intersection line of the machined surface and the crystal face, and an angle measuring instrument of the objective table can be used for directly reading the deflecting angle beta in crystal orientation. The invention overcomes the defects that the present X-ray crystal direction finder has a complex operating method, wherein, the measurement process needs multiple times of rotations, dismountings and fixations of the detected crystal with low measurement efficiency, which is easy to induce cumulative errors and X-ray leakage.

The invention provides a code inspection method and device. The code inspection method comprises the following steps: obtaining a file list with to-be-modified codes; and carrying out error inspection, alarm inspection and prompt inspection on the file list with the to-be-modified codes according to a preset code analysis rule, generating an inspection result and outputting the same. By adoption of the code inspection method provided by the invention, all codes in the file list with the to-be-modified codes can be scanned to inspect the codes not satisfying a development rule, bad editing habits of online banking developers in a development process can be corrected, and the online banking developers can follow the standard encoding rule so as to improve the code quality, improve the code inspection efficiency and shorten the code inspection time. In addition, the code inspection device provided by the embodiment of the invention adopts an Eclipse plug-in development mode, thereby being less in investment, fast to become effective, customizable, open in code sources and capable of satisfying the online banking code review requirements at present and in the future.

This invention discloses a medical image transmission and 3-D visual system and a realizing method, which develops an iconography diagnosis system operated by stand-alones and single persons to expand the image data process function of a radiation section or an image working station to computer terminals of hospitals, so that, doctors in hospitals can get the image data of patients directly from the terminals in their offices to carry out 3-D display interaction operations.

A reactor service manipulator delivery system supported on a remotely operated trolley that travels on top of a track attached to the steam dam of a BWR shroud. The trolley has a mast and pulley system designed to manipulate a TV camera for inspection of various reactor components inboard and outboard of the shroud at the same time that fuel is being moved within the core during a refueling operation so that refueling can be performed in parallel with the inspection.

A pattern inspection apparatus has a setting unit of a plurality of cell areas A and B of different cell comparison pitches and inspects the plurality of cell areas of the different cell comparison pitches in accordance with settings of the setting unit. As information to read out image data for an inspection image and a reference image from an image memory, in addition to position information of a defective image, identification information showing either a cell comparison or a die comparison and relative position information of the reference image can be set. The apparatus also has a unit for setting a plurality of inspection threshold values every inspection area and inspects a plurality of inspection areas by the plurality of inspection threshold values.

Because a mirror electron imaging type inspection apparatus for obtaining an inspection object image with mirror electrons has been difficult to optimize inspection conditions, since the image forming principles of the apparatus are different from those of conventional SEM type inspection apparatuses. In order to solve the above conventional problem, the present invention has made it possible for the user to examine such conditions as inspection speed, inspection sensitivity, etc. intuitively by displaying the relationship among the values of inspection speed S, inspection object digital signal image pixel size D, inspection object image size L, and image signal acquisition cycle P with use of a time delay integration method as a graph on an operation screen. The user can thus determine a set of values of a pixel size, an inspection image width, and a TDI sensor operation cycle easily with reference to the displayed graph.

While an image obtained by a general electron microscope is affected by the shape and material of an object specimen, an image obtained from mirror electrons is affected by the shape of an equipotential surface on which the mirror electrons are reflected, thereby the image interpretation is complicated. A mirror electron microscope of the present invention is provided with the following means for controlling a reflecting plane of the mirror electrons according to the structure of an object pattern to be measured or a concerned defect.1) Means for controlling a potential difference between a specimen and an electron source equivalent to a height of a reflecting plane of a mirror electron beam according to a type, an operation condition of an electron source, and a type of a pattern on a specimen.2) Means for controlling an energy distribution of an illuminating beam with an energy filter 9 disposed in an illuminating system.It is thus possible to inspect a specimen according to a size and a potential of a pattern, which are distinguished from others.

An ultrasonic diagnostic apparatus of the present invention capable of operation with a three-dimensional ultrasonic image performs a scan with a 3D probe for a predetermined time to acquire 3D volume data, and displays a plurality of sections of a heart on a monitor display, in conducting a functional diagnosis of the motion of the heart walls of a specimen before and after the application of a load. Then, the ultrasonic diagnostic apparatus displays a positional relation between the probe and the heart so that display angles of the sections of the heart displayed on the monitor display may be constant.

A data management equipment connected with a general inspection system for detecting a defect candidate on a wafer and acquiring a location thereof, a design data server for storing a design data for a semiconductor circuit and a defect review system for acquiring a defect data image on the basis of the location and comparing the defect candidate image with a defect-free reference image to identify a defect. The data management equipment includes a first detecting unit for finding that the general inspection system is acquiring a location, a storage controlling unit responsive to the finding to start to store the location from the general inspection system in a storage unit and a defect-circumferential design data acquiring unit for acquiring from a portion of the design data a defect-circumferential design data such that a reference image including the location can be produced from the defect-circumferential design data.

Provided are a method and apparatus for inspecting a defect on a plane, such as a surface or a section, of an object to be inspected. The object is, for instance, a silicon wafer. A whole area of a plane of the object is first imaged by an optical system to gain image signals. Then, a particular region on the plane is positionally detected from the image signals. The particular region includes a blot and a defect and has a higher luminance than a remaining region on the plane. A blot is distinguishably detected from the particular region. A specified region on the plane is then subjected to a detailed inspection under a microscope. The region is set to avoid the blot even if the blot is on the region. The detailed inspection under the microscope is performed toward only the region with no blot.

A reactor service manipulator delivery system supported on a remotely operated trolley that travels on top of a track attached to the steam dam of a BWR shroud. The trolley has a mast and pulley system designed to manipulate a TV camera for inspection of various reactor components inboard and outboard of the shroud at the same time that fuel is being moved within the core during a refueling operation so that refueling can be performed in parallel with the inspection.

Provided is a sample observing method allowing for a detailed observation of a sample by using one and the same electron beam apparatus. The method uses an electron beam apparatus 1 comprising a primary optical system 10 serving for irradiating the electron beam onto the sample surface and a secondary optical system 30 serving for detecting secondary electrons emanating from said sample surface to form an image of the sample surface. The inspection is carried out on the sample surface, S, by irradiating the electron beam to the sample surface, and after the extraction of a defective region in the sample based on the inspection, the extracted defective region is once again applied with the irradiation of the electron beam so as to provide a magnification or a detailed observation of the defective region.

The invention provides a method for rebuilding an image of positron emission tomography. The method includes that a probability model of scattering photon example projection described by appointed model parameters is established according to the operating principle of scattering photon example projection of Compton scattering; a spread function of scattering photon example dot is established according to the probability model of scattering photon example projection; a spread function of non-scattering photon example dot is established according to the probability model of scattering photon example projection and the spread function of scattering photon example dot; and by means of iterative reconstruction algorithm, a PET (positron emission tomography) image is rebuilt by scattering photon example and non-scattering photon example according to the spread function of scattering photon example dot and the spread function of non-scattering photon example dot. According to the method, detection efficiency can be improved, in clinical application, the radiation dosage bore by a detected object and an operator is substantially reduced, detection time is shortened, using efficiency is improved, data sampling is perfected, detector structure is simplified, and cost of the detector is reduced.

A system is provided for remotely detecting and locating damaged conductors. The system includes at least one slave controller disposed proximate at least one load and electrically connected to the loads via at least one conductor. The slave controller includes at least one solid-state switch capable of controllably altering the input current to the loads, as well as at least one measuring element for measuring at least one parameter associated with the loads and the solid-state switches. The solid-state switch can controllably alter the input current to the loads according to the parameters. The system also includes at least one damaged wire detector electrically connected to the conductors between the slave controller and the loads. The damaged wire detector is capable of detecting and / or locating at least one damaged conductor.

The embodiment of the invention discloses an inspection method, installation, device and storage medium for vehicle automatic driving algorithm. The method comprises the following steps of: acquiringrelative physical information of the self-driving vehicle and other reference objects in the driving scene, and determining a destination driving state parameter of the self-driving vehicle accordingto the relative physical information, inputting the relative physical information into the automatic driving algorithm to obtain the driving control parameters output by the automatic driving algorithm. The driving control parameters include the direction to be traveled and the speed to be traveled; when the deviation value of the to-be-traveled direction and the destination traveling direction isless than or equal to the direction deviation threshold and the difference between the to-be-traveled speed and the target traveling speed is less than or equal to the speed difference threshold, theautomatic driving algorithm passes the inspection. The method performs an algorithm level test on the automatic driving algorithm, effectively checks whether the automatic driving algorithm is qualified, and reduces the inspection cost.

The present invention discloses an object image detection method, which uses a coarse-to-fine strategy to detect objects. The method of the present invention comprises steps: acquiring an image and pre-processing the image to achieve dimensional reduction and information fusion; using a trained filter to screen features; and sequentially using a coarse-level MLP verifier and a fine-level MLP verifier to perform a neural network image detection to determine whether the features of the image match the features of the image of a target object. The present invention simultaneously uses three mainstream image detection methods, including the statistic method, neural network method and adaboost method, to perform image detection. Therefore, the present invention has the advantages of the rapidity of the adaboost method and the accuracy of the neural network method at the same time.

An electron beam apparatus including a table which mounts a specimen and is movable in three dimensional directions, an electron beam optical system irradiating an electron beam onto a specimen and for detecting a secondary electron emanated from the specimen by the irradiation of the electron beam, and a surface height detection system for detecting height of the surface of the specimen mounted on the table. A focus control system controls a relative position between a focus position of the electron optical system and the table in accordance with information of the height, and an image processing system obtains an image from the detected secondary electron and processes the obtained image to detect a defect on the surface of the specimen.

The invention discloses a fixed-wing unmanned plane fixed-point shooting system and a method for troubleshooting transmission lines thereof. The system comprises a fixed-wing unmanned plane (1) and a ground station (4) where a ground measurement and control system is built; the fixed-wing unmanned plane is provided with a controllable cloud platform (5) for installing a video camera or a high-definition camera (5a), a flight control system (2) and a fixed-point system (3) which are connected through a serial port are installed inside a cabin; the flight control system is connected with an IMU (Inertial Measurement Unit) system (6), a GPS (Global Positioning System) (7) and an air pressure sensor (8) through an I2C bus and used for obtaining state parameters of the fixed-wing unmanned plane and outputting a control signal to a flying rudder to control the fight of the fixed-wing unmanned plane; the flight control system communicates with the fixed-point system through the serial port and obtains current state information of the fixed-wing unmanned plane and a PID (Proportional-Integral-Derivative) parameter of the fixed-wing unmanned plane; and the fixed-point system is connected with a cloud platform sensor (9) through the I2C bus and outputs the control signal to the cloud platform (5) through a control circuit (10). According to the invention, the patrolling intensity and danger of the inspectors can be reduced, the patrolling time can be shortened, all types of emergent faults can be found rapidly and positioned accurately, the fault finding response time can be accelerated, and the maintenance cost and lost can be reduced.

Inspection method, apparatus, and system for a circuit pattern, in which when various conditions which are necessary in case of inspecting a fine circuit pattern by using an image formed by irradiating white light, a laser beam, or a charged particle beam are set, its operating efficiency can be improved. An inspection target region of an inspection-subject substrate is displayed, and a designated map picture plane and an image of an optical microscope or an electron beam microscope of a designated region are displayed in parallel, thereby enabling a defect distribution and a defect image to be simultaneously seen. Item names of inspecting conditions and a picture plane to display, input, or instruct the contents of the inspecting conditions are integrated, those contents are overlapped to the picture plane and layer-displayed, and all of the item names are displayed in parallel in a tab format in the upper portion of the picture plane of the contents. When a desired item name is clicked, the picture plane is switched and the contents corresponding to the clicked item name are displayed.

The invention relates to a method and inspection system for non-destructive inspection of a colony of stress corrosion cracks in a pipe or a vessel. The method comprises mapping the colony of stress corrosion cracks, identifying at least one individual crack to be sized within the colony, and sizing the at least one individual crack to be sized.