27 results about "Image Inspection" patented technology

An image inspection apparatus (100) that compares a read image generated by reading a recording medium on which an image is formed with a reference image to detect misregistration of an image formation position on the recording medium, the apparatus including a controller (81) that: aligns an image included in the read image and an image included in the reference image; and detects the misregistration of the image formation position based on a deviation between a reference position in the read image and a reference position in the reference image in an aligned state. The controller selects a reference position used for detecting the misregistration from reference positions included in the read image and the reference image based on a position of an area in which an image is formed on the recording medium.

The disclosure provides an image management method, server and image capture device. The method performs image inspection operations on uninspected second images among multiple first images arranged in chronological order. The operations include: identifying target objects and determining their orientations; evaluating the completeness of various parts of the target objects based on their orientations; and generating corresponding completeness codes. Finally, the image with the highest completeness code is selected as the target image for output. This method effectively filters out the most suitable images for person re-identification, thereby enhancing overall system performance.

An image inspection apparatus capable of detecting fine defects without excessively increasing the resolution of an image input to a machine learning segmentation model. The image inspection apparatus includes an information generation unit that generates defect information based on an annotation that specifies a defect region in a training image, a training execution unit that trains a machine learning segmentation model, and an inspection execution unit that executes the trained machine learning model. The training execution unit determines whether to divide the training image according to a detection sensitivity setting of the defect region, and when division is required, the training execution unit divides the training image in a predetermined batch size and inputs the divided training image to the machine learning model.

An image inspection apparatus (100) including a controller (81) that detects a misregistration of an image formation position on a recording medium on which an image is formed by an image forming section (40). The controller has: a first detection mode in which the misregistration is detected based on a formation position of a position detection image formed at a predetermined position on the recording medium by the image forming section; and a second detection mode in which the misregistration is detected without the position detection image being formed by the image forming section.

This invention provides an image inspection system and method for improving inspection accuracy. One embodiment of the image inspection system includes an illumination condition determination unit, an optical system, and a determination unit. The illumination condition determination unit determines illumination conditions, including the wavelength spectrum of light illuminating the object and the illumination angle, based on the object to be inspected. The optical system is configured to irradiate the object with light having a wavelength spectrum corresponding to the illumination conditions at an angle corresponding to the illumination conditions. The determination unit determines whether the shape of the object is acceptable based on image data of the object captured using light irradiated by the optical system.

A machine vision inspection system (1) has digital data processors (25) linked with an articulated arm robot (15) supporting a camera and illuminator head (10) for capturing images form a scene over a machine bed (3). The head also includes a system-on-module with a GPU as an inspection processor located adjacent the camera sensor (120), but in a different chamber (109) of the head, separated by a chamber wall (123) from a camera chamber (108). The object may be three dimensional components in a manufacturing line, or product labels. The processors move the robot to pre-set camera positions and control image acquisition and scene illumination for each of a plurality of inspection points. During setup, the processors capture a pre-set robot position, preset camera settings, preset illumination parameters, and a natural language prompt for each of the plurality of inspection points. During runtime, for each inspection point the processors cause the robot (15) to move to the pre-set position for the inspection point when an object is in the camera scene (3) and activate the camera illuminator head to illuminate the scene and capture an image of the object. The inspection processor (140) then executes artificial intelligence code to analyse the image and determine results for the scene, generate an output for the inspection point in a format determined by the prompt associated with the inspection point during setup.

This invention discloses a method and apparatus for quality inspection of polarizers on liquid crystal glass substrates based on image processing, belonging to the field of image inspection technology. The method includes: firstly, structural identification and region modeling of the liquid crystal glass substrate under test are performed, and a detection benchmark is established; then, multi-condition images of the same detection area are acquired under different detection states, and a reference image set and a detection image set are constructed; subsequently, spatial registration, background decoupling, defect enhancement, and layer discrimination are performed on the images; finally, quality evaluation results and process feedback are output based on defect type, layer position, and location information. This scheme can distinguish and detect surface defects, bonding interface defects, conductive layer-related anomalies, and liquid crystal functional anomalies, improving detection accuracy, evaluation consistency, and defect traceability in the manufacturing process, while also adapting to the differentiated detection needs of the central optical region, edge bonding region, conductive connection region, and partition boundary region.

Improve detection accuracy. [Solution] The image inspection system according to the embodiment includes: an illumination condition determination unit that determines illumination conditions, including the wavelength spectrum and irradiation angle of the light to be irradiated onto the object to be inspected, according to the object to be inspected; an optical system configured to irradiate the object to be inspected with light having a wavelength spectrum corresponding to the illumination conditions at an angle corresponding to the illumination conditions; and a determination unit that determines whether the shape of the object to be inspected is good or bad based on imaging data of the object to be inspected captured by the light irradiated from the optical system.

This invention provides an image inspection apparatus, an image forming apparatus, an image inspection method, and a computer program product that can detect positional offsets in the image forming position even without using a position detection image. The image forming apparatus (image inspection apparatus) includes a control unit that detects positional offsets in the image forming position within a recording medium after an image is formed by the image forming unit. The control unit has a first detection mode and a second detection mode. In the first detection mode (first positional offset detection process, step S3), the positional offset is detected based on the formation position of a guideline (position detection image) formed by the image forming unit at a predetermined position on the recording medium. In the second detection mode (second positional offset detection process, step S4), the positional offset is detected without the image forming unit forming a guideline.

This invention provides an image inspection apparatus, an image forming apparatus, an image inspection method, and a computer program product, improving the accuracy of positional offset detection. The image forming apparatus (image inspection apparatus) compares a readout image generated by reading a recording medium on which an image has been formed with a reference image, and detects a positional offset of the image forming position in the recording medium. The control unit of the image forming apparatus aligns the image contained in the readout image with the image contained in the reference image. While aligned, it detects the positional offset of the image forming position based on the offset between the reference position in the readout image and the reference position in the reference image. The control unit selects a reference position for detecting the positional offset from the reference positions contained in the readout image and the reference image, based on the position of the area on the recording medium where the image is formed.

This reduces the time required for processing, from generating reference images to image inspection. [Solution] The image inspection device 100 includes a reference image generation unit 311 that generates a reference image used for inspecting an image formed on a recording medium, an image inspection unit 312 that inspects the image formed on the recording medium based on the reference image, and a reception unit 115 that receives a specification for the timing of the generation of the reference image.

The present invention provides an image inspection device that can avoid over-detection of printing misalignment and other issues without relaxing inspection conditions. [Solution] The image inspection device 10 comprises an imaging device 12, a control device 13, and a display device 16. The control device 13 comprises an image acquisition unit 20, a reference image memory, a difference processing unit, and a detection processing unit. The reference image is a pre-image, and the reference image is updated at predetermined timings. The control device 13 uses a pre-image inspection function in which the detection processing unit determines whether or not an image is defective using the difference between the pre-image and the image captured by the imaging device. With this configuration, defects that change sequentially and do not actually need to be judged as defects, such as printing misalignment, will not be judged as defects. In other words, over-detection, which detects defects that do not actually need to be judged as defects, can be avoided, and inspection accuracy is improved.

An image inspection apparatus including a hardware processor that detects, based on a reference image, presence or absence of an abnormality in a read image generated by reading, by a reader, a recording medium on which an image is formed. The hardware processor detects a color material drop in the read image.

This utility model discloses a three-coordinate moving lens device for an image inspection machine, belonging to the field of PCB board processing. The three-coordinate moving lens device for an image inspection machine includes a first moving platform mounted on a base, a second moving platform fixedly connected to the connecting end of the first moving platform, a placement plate fixedly connected to the connecting end of the second moving platform, a fixing plate fixedly connected to the side wall of the placement plate, and a limit plate slidably connected to the placement plate, with the planes of the limit plate and the fixing plate parallel. A third moving platform is mounted on the base, and a detection head is mounted on the connecting end of the third moving platform, with the detection end of the detection head facing the surface of the placement plate. This utility model can realize the three-coordinate position movement of the detection head, satisfying the condition of detecting the hole depth of the PCB circuit board at different positions, and can also adjust the distance between the fixing plate and the limit plate, allowing it to be adaptively adjusted according to the size of the PCB circuit board, improving the versatility of the device.

This disclosure relates to an image forming apparatus, its control method, and a computer program product. The object of the present invention is to provide an image forming apparatus capable of performing processing corresponding to areas where inspection errors have occurred, thereby suppressing the consumption of consumables such as printing paper caused by, for example, useless reprinting or removal. The image forming apparatus includes: an image reading unit for acquiring a read image by reading an image of a printed document; an inspection determination unit for comparing the read image read by the image reading unit with a correct image to determine if an inspection has occurred; a first inspection post-processing unit for performing first inspection post-processing on inspection errors in a first area of ​​the read image; and a second inspection post-processing unit for performing a second inspection post-processing on inspection errors in a second area of ​​the read image, different from the first inspection post-processing.

Provided is a substrate processing method and apparatus. The substrate processing method includes: a substrate processing operation of discharging a liquid to a substrate loaded into an inner space of a liquid treating chamber to liquid-treat the substrate; after the substrate processing operation, a chamber cleaning operation of unloading the substrate from the inner space of the liquid treating chamber and cleaning the liquid treating chamber; and an inspection operation of inspecting a degree of contamination of the liquid treating chamber after the chamber cleaning operation, in which the inspection operation includes acquiring an image by photographing the inner space with a camera in a state where first light of a wavelength band in an ultraviolet ray region to the inner space of the liquid treating chamber, and inspecting the degree of contamination of the liquid treating chamber based on the image.

The application discloses a total knee replacement surgery image inspection method and device. A CT image of a professional DCM, i.e. a CT image with a metal rod, is read in, maximum and minimum gray scale values of the image are obtained, and more than 75% of the gray scale values are taken, which include the metal rod and some scattered points. A maximum connected threshold is used to extract and remove points other than the metal rod. At this time, the image only has the metal rod. The image is binarized, the number of layers of the image, the height of the image and the space height of a layer are obtained, the number of layers of the image within 10 mm is calculated, a center point is taken every 10 mm of the total number of layers, the vectors of adjacent points are calculated, the error is obtained by subtracting the adjacent vectors, a reasonable range is defined, all errors within the range are qualified, and otherwise, the errors are unqualified. Therefore, the error rate of planning and bone cutting navigation according to unqualified pictures in the later stage can be reduced, the leg bone of the picture is consistent with the leg bone of the patient, and the time of manual judgment is reduced.

The present invention provides an image inspection device, an image inspection method, and a program capable of detecting large stains such as colorant spills. [Solution] An image inspection device (image reading device 40) is provided with a control unit (reading control unit 41) that detects whether or not there is an abnormality in a read image generated when a recording medium on which an image has been formed is read by a reading unit 42 based on a reference image. The control unit detects color blotting in the read image. Specifically, the control unit reduces the resolution of the reference image and the read image, and detects color blotting based on the reduced-resolution reference image and the read image.

According to one embodiment, an image inspection system includes: a lighting condition determination unit configured to determine, based on an inspection target, a lighting condition including a wavelength spectrum and an irradiation angle of light with which the inspection target is irradiated; an optical system configured to irradiate the inspection target with the light having the wavelength spectrum corresponding to the lighting condition at the angle corresponding to the lighting condition; and a determination unit configured to determine whether a shape of the inspection target is good or defective based on imaging data of the inspection target imaged by the light emitted from the optical system.

This disclosure proposes an image-based material inspection method and apparatus, relating to the field of image inspection technology. The method includes: acquiring a first image of the material to be inspected; determining first feature points in the first image based on a first threshold; determining a first center position and a first centroid position of the first feature points; dividing the first image into multiple regions based on the first center position and the first centroid position, and sampling each region to obtain first pixels; determining a first number of first feature points contained in the first pixels; and determining whether the material to be inspected is qualified based on the first number and a pixel number threshold. This disclosure determines the first threshold by referring to the pixel histogram of the material, which can accurately extract feature points from the first image without manual adjustment. This disclosure also divides and samples the first image based on the center and centroid positions of the feature points, eliminating the need for full pixel detection and improving computational speed.

A system and method for generating models from digital images in an interactive environment comprising a memory and a processor in communication with the memory. The processor captures or derives metadata for one or more digital images. The processor derives transforms from the metadata to align the digital images with one or more three-dimensional (“3D”) models of objects / structures represented in the digital image. The processor generates an interactive environment which allows a user to view a contextual model of each of the objects / structures in two dimensional (“2D”) and 3D views.

An image inspection apparatus including a hardware processor that detects a misregistration of an image formation position on a recording medium on which an image is formed by an image former. The hardware processor has: a first detection mode in which the misregistration is detected based on a formation position of a position detection image formed at a predetermined position on the recording medium by the image former; and a second detection mode in which the misregistration is detected without the position detection image being formed by the image former.

An optical inspection device includes a light source module, a container structure, a first polarizer, a first electrode, a second polarizer, a second electrode and an image inspection module. The container structure can accommodate a liquid crystal material. The image inspection module is disposed adjacent to the container structure. The first polarizer and the first electrode are disposed between the light source module and the container structure. The second polarizer and the second electrode are disposed between the container structure and the image inspection module. Thereby, when the light-transmitting substrate is disposed within a liquid crystal material of the container structure, the light source module can generate light beams projected onto the light-transmitting substrate, and the image inspection module is configured to inspect the light beams that pass through the light-transmitting substrate or are reflected by the light-transmitting substrate.

This invention discloses a device and method for inspecting and repairing iron tower fall arrestor rails. The device includes a motion platform, a repair mechanism, and an image inspection module. The motion platform is movably connected to the fall arrestor rail to enable the device to move on the rail. The image inspection module is located on the forward side of the motion platform and is used to identify defective parts of the fall arrestor rail. The repair mechanism is located between the motion platform and the image inspection module. The repair mechanism includes a rust removal component, a cleaning component, and a spraying component. The cleaning component is located between the rust removal component and the motion platform. The rust removal component is used to remove rust and grind the defective parts. The cleaning component is used to clean the waste generated during rust removal on the surface of the fall arrestor rail. The spraying component is used to spray and repair the defective parts after rust removal. This embodiment achieves efficient and reliable repair operations, shortens the repair cycle, eliminates the need for manual repair, and reduces the repair costs of large-scale high-altitude operations.

This document provides a method for detecting product defects using a VLM (Vision Language Model) agent. [Solution] The method involves obtaining a text prompt regarding the product defect judgment criteria and an image of the product to be judged captured by a camera. The VLM agent then refers to the image to be judged to check whether the product has a defect, generates an inspection task to inspect for defects, and transmits the inspection results, which are the result of executing the inspection tool according to the inspection task. By obtaining the inspection results and checking whether the defect meets the defect judgment criteria, the VLM determines whether the product is defective and generates a product defect determination result.

This invention relates to the field of image inspection technology, specifically a visual inspection device and a method for inspecting the appearance of plastic products. The method includes: transferring a fixed plastic product to a position directly below an industrial camera via a slide rail on a plastic product inspection platform, obtaining the plastic product to be inspected; capturing an image of the plastic product to be inspected using the industrial camera, obtaining an image of the plastic product to be inspected; dividing the image of the plastic product to be inspected into inspection regions, obtaining a target plastic image; constructing a target filter; using the target filter to enhance defects in the target plastic image, obtaining a defect response image; and dividing the defect response image into defect regions, obtaining a defect response dataset. This invention can improve the automation level of plastic product appearance inspection and the ability to identify complex defects.