4results about How to "Exclude influence" patented technology

A first radiance meter (21) is directed toward an object to be measured, radiance is measured through a space where dust is present with the use of at least two wavelengths by the first radiance meter (21), second radiance meters (22) which are equal in number to one or more objects (51) having temperatures different from that of the object to be measured (50) are directed toward the objects, radiances are measured through the space with the use of at least two wavelengths by the second radiance meters (22) respectively, and a temperature of the object to be measured (50), a temperature of the dust, and concentration of the dust are measured from the radiances measured by the first radiance meter (21) and the second radiance meters (22).

The application relates to the technical field of IMD (in-mold decoration) injection technology, and particularly relates to an IMD in-mold injection film removing device based on display panel production, which comprises a workbench for supporting a film-coated panel, the workbench is provided with vacuum suction cups for sucking the hard plate of the film-coated panel and a moving module for driving the vacuum suction cups to move linearly, the middle part of the workbench is provided with a lifting support, the lifting support is rotatably provided with symmetrically-arranged sleeves, and the sleeves are provided with clamping pieces for clamping the transparent film of the film-coated panel. After the transparent film of the film-coated panel is clamped by the clamping pieces and rotated, the hard plate of the film-coated panel is horizontally moved by the vacuum suction cups. When a part of the transparent film is still adhered to the hard plate, the clamping pieces and the vacuum suction cups are reset. Finally, only the hard plate is moved to one end of the workbench by the vacuum suction cups, the transparent film is completely torn from the hard plate by the clamping pieces, and the transparent film is not wound on the clamping pieces.

The application discloses a classroom intelligent lighting system based on indoor dim light collection, which comprises three subsystems, namely, an energy collection subsystem, an environment monitoring subsystem, a light control subsystem and a data processing unit. The energy collection subsystem comprises an amorphous silicon solar cell, a power management module and an energy storage module, and supplies power for monitoring nodes of the environment monitoring subsystem; the environment monitoring subsystem comprises a plurality of wireless monitoring nodes, a coordinator and a server; and the light control subsystem comprises a plurality of light control nodes composed of a control module and a communication module, a control panel and an electric power detection sensor. The application is developed from the aspects of eye health, energy saving and environmental protection, monitors indoor lighting, and establishes a dynamic model of indoor light environment by taking the collection and transmission of more data as a target and energy balance as a constraint point, so that the indoor light environment is automatically adjusted according to human health indexes and energy saving requirements, the eye muscles are relaxed, the eye fatigue is reduced, and a comfortable environment is created.

This application discloses a method and apparatus of detecting a fusion width of a T-type electron beam weld. The method includes the following steps. A preset reference block is detected using an ultrasonic scanning detection system to determine a weld fusion boundary. A first scanning signal corresponding to the to-be-detected piece is acquired by the ultrasonic scanning detection system. A first scanning image of reflected waves from surfaces of multiple welds is generated according to the first scanning signal. The reflected wave signals in the first scanning signal are normalized according to the first scanning image to obtain a second scanning signal. A second scanning image is generated according to the second scanning signal. This application enables the rapid and precise detection of fusion width of a T-type electron beam weld.